Semiconductor test platform machine
CN309552943SActive Publication Date: 2025-10-21SHAANXI TIANSHILI TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202530123454.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-14
- Publication Date
- 2025-10-21
- Estimated Expiration
- 2040-03-14
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Figure 000001_ABST
Abstract
1. Name of the designed product: semiconductor testing platform machine. 2. Use of the designed product: for testing semiconductor. 3. Design points of the designed product: combination of shape and pattern. 4. Picture or photo best showing the design points: perspective view. 5. Other circumstances or remarks: Part A is transparent material.
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