High temperature sintering in-situ optical characterization analyzer

CN309554478SActive Publication Date: 2025-10-21SUZHOU JIYUAN TECH CO LTD
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Patent Information

Application Number
CN202530071301.2
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-02-19
Publication Date
2025-10-21
Estimated Expiration
2040-02-19

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Abstract

1. The name of the design product: high-temperature sintering in-situ optical characterization analyzer. 2. The use of the design product: including high-temperature sintering assembly and optical observation assembly, for in-situ optical imaging and spectral analysis of material high-temperature phase transition and epitaxial deposition process. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view. 5. Other components that need to be explained: including high-temperature sintering assembly and optical observation assembly, high-temperature sintering assembly is located below the objective lens of the optical observation assembly.
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