High temperature sintering in-situ optical characterization analyzer
CN309554478SActive Publication Date: 2025-10-21SUZHOU JIYUAN TECH CO LTD
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Patent Information
- Application Number
- CN202530071301.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-19
- Publication Date
- 2025-10-21
- Estimated Expiration
- 2040-02-19
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Figure 000007_ABST
Abstract
1. The name of the design product: high-temperature sintering in-situ optical characterization analyzer. 2. The use of the design product: including high-temperature sintering assembly and optical observation assembly, for in-situ optical imaging and spectral analysis of material high-temperature phase transition and epitaxial deposition process. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view. 5. Other components that need to be explained: including high-temperature sintering assembly and optical observation assembly, high-temperature sintering assembly is located below the objective lens of the optical observation assembly.
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