Epitaxial growth in-situ detection equipment controller

CN309566328SActive Publication Date: 2025-10-28SHANGHAI CHEYITIAN TECH CO LTD
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Patent Information

Application Number
CN202530142642.4
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-03-21
Publication Date
2025-10-28
Estimated Expiration
2040-03-21

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Abstract

1. Name of the product in this design: Controller for in-situ detection equipment for epitaxial growth. 2. Purpose of this design: To collect process parameter information during the semiconductor epitaxial growth process and to process and output detection signals. 3. The key design point of this design product lies in the combination of shape and pattern. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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