Appearance inspection dedusting device

CN309652891SActive Publication Date: 2025-12-05JIANWEI SEMICONDUCTOR (SHENZHEN) CO LTD
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Patent Information

Application Number
CN202530138750.4
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-03-20
Publication Date
2025-12-05
Estimated Expiration
2040-03-20

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Abstract

1. The name of the design product: appearance inspection dust removal equipment. 2. The use of the design product: the design product is used for detecting and cleaning dust of semiconductor wafers. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.
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