High and low temperature test chamber (double layer explosion-proof type)
CN309701591SActive Publication Date: 2025-12-26READ MICROELECTRONICS TECH (SHANDONG) CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202530235197.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-27
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2040-04-27
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: high and low temperature test chamber (explosion-proof double-layer type). 2. The use of the design product: the explosion-proof double-layer high and low temperature test chamber of the design is mainly used for high and low temperature test special equipment of power battery, energy storage battery, battery cell, module, etc. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
Need to check novelty before this filing date? Find Prior Art