Test equipment
CN309701682SActive Publication Date: 2025-12-26SHENZHEN JINGZHIDA SEMICONDUCTOR TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202530337899.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-12
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2040-06-12
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Figure 000007_ABST
Abstract
1. Name of the designed product: test equipment. 2. Use of the designed product: the designed product is used as semiconductor device test equipment. 3. Design points of the designed product: the shape of the product. 4. Picture or photo best indicating the design points: perspective view 1. 5. Other circumstances needing explanation: the cable in the designed product is of indefinite length, and the length is drawn by omitting.
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