Solar silicon wafer automatic detection module
CN309752012SActive Publication Date: 2026-01-27SHANGHAI BERLING TECH CO LTD
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Patent Information
- Application Number
- CN202530362693.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-23
- Publication Date
- 2026-01-27
- Estimated Expiration
- 2040-06-23
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: Automatic detection module for solar silicon wafers. 2. Purpose of this design: This design is used to test the thickness, thickness deviation and resistivity of solar silicon wafers. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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