Inspection light source (AOI)
CN309766035SActive Publication Date: 2026-01-30CHENGDU HENGKUN VIDEO OPTOELECTRONICS TECH CO LTD
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Patent Information
- Application Number
- CN202530265096.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-13
- Publication Date
- 2026-01-30
- Estimated Expiration
- 2040-05-13
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: Inspection Light Source (AOI). 2. Purpose of this design: It is mainly used to detect defects in semiconductor silicon wafers, PCBs, FPCBs, glass, aluminum foil, highly reflective printed materials, etc. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1. 5. Other situations requiring explanation: Part P is made of a light-transmitting material, such as transparent or semi-transparent material; Part Q is made of a light-transmitting material, such as transparent or semi-transparent material.
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