test equipment (chip)
CN309799917SActive Publication Date: 2026-02-17SUZHOU JINGSHI INTELLIGENT TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202530384150.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-02
- Publication Date
- 2026-02-17
- Estimated Expiration
- 2040-07-02
Smart Images
Figure 000007_ABST
Abstract
1. Name of the designed product: testing equipment (chip). 2. Use of the designed product: for detecting performance, reliability and behavior of products (semiconductor elements) under various working conditions. 3. Design points of the designed product: in shape. 4. Picture or photo best indicating the design points: perspective view. 5. Other circumstances or explanations: the front view A of the designed product is made of transparent material.
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