Micro-nano industrial CT inspection equipment
CN309925481SActive Publication Date: 2026-04-17HENAN HUATAN TESTING TECH CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- HENAN HUATAN TESTING TECH CO LTD
- Filing Date
- 2025-10-10
- Publication Date
- 2026-04-17
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Micro-nano Industrial CT Inspection Equipment. 2. Purpose of this design: For CT scanning imaging of products in industrial CT. 3. The key design features of this product are the combination of shape and pattern. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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