Long-lasting probe
CN309935250SActive Publication Date: 2026-04-21HEFEI GUOWEI ELECTRONICS
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- HEFEI GUOWEI ELECTRONICS
- Filing Date
- 2025-10-15
- Publication Date
- 2026-04-21
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Long-lasting probe. 2. Applications of this design: Real-time intelligent monitoring of microseismic events, earthquake background noise imaging, etc. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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