flaw detector
CN310017675SActive Publication Date: 2026-06-05HENAN HUATAN TESTING TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- HENAN HUATAN TESTING TECH CO LTD
- Filing Date
- 2025-12-16
- Publication Date
- 2026-06-05
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: flaw detector. 2. The use of the design product: X-ray detection of internal defects of components made of metal, non-metal and other materials. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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