Procedure for testing a high-voltage component

Abstract

The invention relates to a method for testing a high-voltage component, in which the high-voltage component undergoes a service life test sequence (102) for imposing a service life equivalent on the high-voltage component and a subsequent high-voltage test sequence (104) for testing the high-voltage safety of the high-voltage component. The high-voltage test sequence (104) comprises climatic conditioning of the high-voltage component to a first conditioning temperature and a first relative conditioning humidity, and the high-voltage test sequence (104) comprises an insulation resistance test performed with a first insulation resistance test voltage and a withstand voltage test performed with a first withstand voltage test voltage. It is proposed that the high-voltage component undergoes a provocation test sequence (106) before the service life test sequence (102).wherein the provocation test sequence (106) comprises climatic conditioning of the high-voltage component to a second conditioning temperature and a second relative conditioning humidity, wherein the second conditioning temperature is 60% to 80% greater than the first conditioning temperature and the second relative conditioning humidity is greater than or equal to the first relative conditioning humidity, and the provocation test sequence (106) comprises an insulation resistance test performed with a second insulation resistance test voltage and a withstand voltage test performed with a second withstand voltage test voltage, wherein the second withstand voltage test voltage is 10% to 30% greater than the first withstand voltage test voltage and wherein the second insulation resistance test voltage is greater than or equal to the first insulation resistance test voltage.

Description

[0001] The invention relates to a method for testing a high-voltage component, in which the high-voltage component undergoes a service life test sequence for imposing a service life equivalent on the high-voltage component and a subsequent high-voltage test sequence for testing the high-voltage safety of the high-voltage component, wherein the high-voltage test sequence comprises climatic conditioning of the high-voltage component to a first conditioning temperature and a first relative conditioning humidity, and wherein the high-voltage test sequence comprises an insulation resistance test carried out with a first insulation resistance test voltage and a withstand voltage test carried out with a first withstand voltage test voltage.

[0002] High-voltage components are validated through so-called climatic-environmental life tests (life test sequences). These tests involve rapid and slow temperature changes, as well as particularly high temperatures. Tests can also be conducted to determine corrosion and vibration of the high-voltage component. The life test is designed to impose a service life equivalent of, for example, 15 years on the high-voltage component. The time required to conduct such a climatic-environmental life test is typically several months.

[0003] After conducting the climatic-environmental life test and determining the equivalent lifetime, it must be checked whether the component can still meet all high-voltage safety requirements. The focus here is on compliance with clearance and creepage distances and on whether the lifetime stress has had any negative impacts on the high-voltage component. For this purpose, insulation and withstand voltage tests (high-voltage test sequences) are performed. If problems become apparent during this process, this requires optimizing the high-voltage component or modifying its design. The climatic-environmental life test must then be performed again.

[0004] EP 3 012 646 B1 discloses a method for thermal testing of electronic devices.

[0005] US 11,175,333 B2 discloses a method for implementing accelerated test conditions for evaluating the high-voltage lifetime of semiconductor power devices.

[0006] The invention is based on the object of providing a method as mentioned above which enables early detection of safety-relevant design problems of the high-voltage component.

[0007] This object is achieved according to the invention in the method mentioned at the outset in that the high-voltage component undergoes a provocation test sequence before the service life test sequence, wherein the provocation test sequence comprises climatic conditioning of the high-voltage component to a second conditioning temperature and a second relative conditioning humidity, wherein the second conditioning temperature is 60% to 80% greater than the first conditioning temperature and the second relative conditioning humidity is greater than or equal to the first relative conditioning humidity, and the provocation test sequence comprises an insulation resistance test carried out with a second insulation resistance test voltage and a withstand voltage test carried out with a second withstand voltage test voltage,wherein the second withstand voltage test voltage is 10% to 30% greater than the first withstand voltage test voltage and wherein the second insulation resistance test voltage is greater than or equal to the first insulation resistance test voltage.,

[0008] The preceding provocation test sequence enables the early detection of weak points in the high-voltage component that are relevant to high-voltage safety during the process. If the provocation test sequence is negative, the structure of the high-voltage component can be optimized to eliminate the weak points before the service life test sequence begins. In this case, the process can be aborted after the negative provocation test sequence and restarted after the high-voltage component has been optimized. The method according to the invention thus enables the design of the high-voltage component to be optimized before the lengthy service life test sequence is carried out. Repeated execution of the service life test sequence is avoided wherever possible. This enables more time-efficient testing of the high-voltage component.

[0009] In particular, it can be provided that the first withstand voltage test voltage is between 2,600 V and 2,800 V, and / or that the second withstand voltage test voltage is between 3,100 V and 3,300 V.

[0010] In particular, it can be provided that the first insulation resistance test voltage is between 900 V and 1,100 V, and / or that the second insulation resistance test voltage is between 900 V and 1,100 V.

[0011] In particular, it can be provided that the first conditioning temperature is between 20°C and 25°C, and / or that the second conditioning temperature is between 35°C and 45°C.

[0012] In particular, it can be provided that the first relative conditioning humidity is between 90% and 95%, and / or that the second relative conditioning humidity is between 90% and 95%.

[0013] It may be advantageous to abort the process after performing the provocation test sequence if it produces a negative result for the high-voltage component. This allows for early optimization of the high-voltage component's design to eliminate any issues related to high-voltage safety. In particular, the process and / or the provocation test sequence are restarted after the high-voltage component's design has been optimized.

[0014] In particular, there may be a stack with a large number of similar high-voltage components, each of which must complete the service life test sequence and the subsequent high-voltage test sequence. For example, a specific high-voltage component is selected from this stack and tested using the method according to the invention. If necessary, ie if the result of the provocation test sequence is negative, the design of this high-voltage component can be optimized within the framework of the provocation test sequence. Once the final design for the selected high-voltage component has been determined, ie if the provocation test sequence is positive, the other high-voltage components in the stack can be adapted and / or designed in the same way in order to then run through the service life test sequence and the high-voltage test sequence.

[0015] The following description, in conjunction with the drawing, serves to explain the invention in more detail.

[0016] It shows: Fig. 1 A flowchart of an embodiment of a method for testing a high-voltage component.

[0017] An embodiment of a method for testing a high-voltage component is described in Fig. 1 is shown schematically in the form of a flow chart and is designated 100.

[0018] The method 100 includes a service life test sequence 102 for imposing a service life equivalent on the high-voltage component. In particular, the service life test sequence 102 is or includes a so-called climatic-environmental service life test of the high-voltage component. After performing the service life test sequence 102, the high-voltage component is configured as if it had been operated in the normal operating state for the duration of the service life equivalent. In particular, the selected service life equivalent is several years, e.g., 15 years.

[0019] The runtime of the lifetime test sequence 102, ie the time required to execute it, is shorter than the lifetime equivalent by a certain factor and is in particular several months, such as 10 months.

[0020] During the service life test sequence 102, the high-voltage component is exposed to temperature-based stresses during operation for a specific period of time. In particular, the high-voltage component is exposed to temperature changes of varying speeds and / or is operated at a test temperature that lies above a maximum operating temperature of the high-voltage component, for which the high-voltage component is designed and which is reached at a maximum in the normal operating state of the high-voltage component. In particular, this maximum operating temperature of the high-voltage component can be present in the normal operating state when cooled in a cooling circuit.

[0021] The test temperature is to be understood in particular as a maximum temperature which is at least temporarily reached when the lifetime test sequence 102 is carried out.

[0022] When performing the endurance test sequence 102, the high-voltage component is preferably operated at maximum power at least temporarily. In particular, the high-voltage component is operated at maximum power while exposed to the test temperature.

[0023] For example, the high-voltage component in the cooling circuit is designed for a maximum operating temperature of 65°C. To achieve a service life equivalent of 15 years, the service life test sequence 102 is operated for a duration of 10 months, for example, with the high-voltage component then being subjected to a maximum test temperature of 85°C as part of the service life test sequence 102.

[0024] After the service life equivalent has been applied to the high-voltage component, it must be checked whether the high-voltage component (still) meets the specified high-voltage safety requirements. For this purpose, the method 100 comprises a high-voltage test sequence 104 for testing the high-voltage safety of the high-voltage component, with the high-voltage test sequence 104 being performed after the service life test sequence 102. In particular, the high-voltage test sequence 104 comprises an insulation resistance test and a withstand voltage test.

[0025] The high-voltage test sequence 104 includes climatic conditioning of the high-voltage component to a specified temperature and relative humidity. The required insulation resistance and withstand voltage tests are then performed on the climatically conditioned high-voltage component.

[0026] For conditioning the high-voltage component, for example, a climate cabinet is used, into which the high-voltage component is placed before or during the insulation resistance and withstand voltage test.

[0027] For example, when performing the high-voltage test sequence 104, the high-voltage component is first conditioned to a first conditioning temperature of 23°C and a first relative conditioning humidity of 93%. The insulation resistance test and withstand voltage test are then performed on the conditioned high-voltage component. The insulation resistance test is performed, for example, with a first insulation resistance test voltage of 1,000 V, and the withstand voltage test is performed, for example, with a first withstand voltage test voltage of 2,700 V.

[0028] In addition to the endurance test sequence 102 and the high-voltage test sequence 104, the method 100 includes a provocation test sequence 106, which is performed before the high-temperature test sequence 102. The provocation test sequence 106 is fundamentally similar to the high-voltage test sequence 106.

[0029] The provocation test sequence 106, analogous to the high-voltage test sequence 104, includes an insulation resistance test and a withstand voltage test, wherein the insulation resistance test is performed with a second insulation resistance test voltage and the withstand voltage test is performed with a second withstand voltage test voltage. Furthermore, the provocation test sequence 106, analogous to the high-voltage test sequence 104, includes climatic conditioning of the high-voltage component, which is performed with a second conditioning temperature and a second conditioning relative humidity.

[0030] The second withstand voltage test voltage is increased compared to the first withstand voltage test voltage of the high-voltage test sequence 104, for example, by 20%. The second withstand voltage test voltage is then, for example, 3,240 V.

[0031] Analogously, the second insulation resistance test voltage can be higher than the first insulation resistance test voltage. However, the second insulation resistance test voltage can also be the same as the first insulation resistance test voltage.

[0032] Furthermore, it is provided that the second conditioning temperature and / or the second relative conditioning humidity are each increased by a certain factor compared to the first conditioning temperature or the first relative conditioning humidity. However, the second relative conditioning humidity can also be the same as the first relative conditioning humidity. For example, the second conditioning temperature is 40°C and the second conditioning humidity is 93%.

[0033] To test the high-voltage component using the method 100, the high-voltage component first runs through the provocation test sequence 106, then the service life test sequence 102 and then the high-voltage test sequence 104. The chronological sequence of the test sequences 102, 104, 106 of the method 100 is shown in the Fig. 1 shown flowchart indicated by arrows.

[0034] By means of the preceding provocation test sequence 106, structural weak points of the high-voltage component can be detected early, in particular before the lengthy service life test sequence 102 is carried out. If weak points are detected during the provocation test sequence 106, the design of the high-voltage component can be optimized based on this, and the method 100 can then be restarted. List of reference symbols 100 procedures 102 Lifetime test sequence 104 High-voltage test sequence 106 Provocation test sequence QUOTES CONTAINED IN THE DESCRIPTION

[0000] This list of documents submitted by the applicant was generated automatically and is included solely for the convenience of the reader. This list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions. Cited patent literature

[0000] EP 3 012 646 B1

[0004] US 11,175,333 B2

[0005]

Claims

[1] A method for testing a high-voltage component, in which the high-voltage component undergoes a service life test sequence (102) for imposing a service life equivalent on the high-voltage component and a subsequent high-voltage test sequence (104) for testing the high-voltage safety of the high-voltage component, wherein the high-voltage test sequence (104) comprises climatic conditioning of the high-voltage component to a first conditioning temperature and a first relative conditioning humidity, and wherein the high-voltage test sequence (104) comprises an insulation resistance test carried out with a first insulation resistance test voltage and a withstand voltage test carried out with a first withstand voltage test voltage, characterized bythat the high-voltage component undergoes a provocation test sequence (106) before the service life test sequence (102), wherein the provocation test sequence (106) comprises climatic conditioning of the high-voltage component to a second conditioning temperature and a second relative conditioning humidity, wherein the second conditioning temperature is 60% to 80% greater than the first conditioning temperature and the second relative conditioning humidity is greater than or equal to the first relative conditioning humidity, and the provocation test sequence (106) comprises an insulation resistance test carried out with a second insulation resistance test voltage and a withstand voltage test carried out with a second withstand voltage test voltage,wherein the second withstand voltage test voltage is 10% to 30% greater than the first withstand voltage test voltage and wherein the second insulation resistance test voltage is greater than or equal to the first insulation resistance test voltage., [2] Method according to claim 1, characterized by that the first withstand voltage test voltage is between 2,600 V and 2,800 V, and / or that the second withstand voltage test voltage is between 3,100 V and 3,300 V. [3] Method according to one of the preceding claims, characterized by that the first insulation resistance test voltage is between 900 V and 1,100 V, and / or that the second insulation resistance test voltage is between 900 V and 1,100 V. [4] Method according to one of the preceding claims, characterized by that the first conditioning temperature is between 20°C and 25°C, and / or that the second conditioning temperature is between 35°C and 45°C. [5] Method according to one of the preceding claims, characterized by that the first relative conditioning humidity is between 90% and 95% and / or that the second relative conditioning humidity is between 90% and 95%. [6] Method according to one of the preceding claims, characterized by that the method is aborted after the provocation test sequence (106) has been carried out if this produces a negative result for the high-voltage component.

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