Test contact device for high current applications

Abstract

The present invention relates to a test contact device (10), in particular a high-current test contact device, for releasably contacting an electrically conductive area of ​​a contact partner (20) with an external retaining element (1) and a test element (2) guided therein at least partially and movable relative to the retaining element (1) at least in the axial direction of the device (10), comprising an end-side contact section (3) for contacting the contact partner (20) with at least one contacting element (4), which is designed to be deformed at least partially and substantially radially from an inner position to a radially outer position when contacting the contact partner (20).

Description

[0001] The present invention relates to a test contact device, in particular for high-current applications for detachable contacting and establishing an electrical connection with a test object.

[0002] Test contact devices for the detachable contacting of a test object are well known in the art. These are used for the electrical and electronic testing of assemblies and / or connections for their proper functioning. The respective test contact pin is detachably contacted with the assembly or test object to be tested via one or more contacts, and, depending on the properties to be tested, is tested with a predefined test program of a test system connected to the contact device.

[0003] It is desirable that contact between the test contact device and the respective test specimen can be established reliably and, if possible, without damaging the specimen. In particular, tolerances in the alignment of the test contact device and the test specimen should be compensated for.

[0004] DE 10 2014 114 141 A1 discloses a test contact device for high-current applications with a contact element in the form of a slotted spring sleeve and a movable pressure element for generating a contact pressure on the contact element such that, when inserted into a test specimen, it can be selectively expanded radially. The pressure element is designed to be actuated by a user by means of a rear rod attached to it, so that, when the test contact device is inserted into a socket of the test specimen, the user can effect a radial expansion of the contact element.

[0005] WO 2019 / 002 522 A1 discloses a high-current contact socket for receiving and establishing an electrical connection with a contact pin. The high-current contact socket comprises a contact piston with a receiving chamber and a radially movable clamping element arranged around the receiving chamber for clamping the contact pin, and a piston guide that partially encloses the piston and allows movement along a longitudinal axis of the piston.

[0006] EP 2 537 039 A1 discloses a test probe as a contact device for high-frequency applications, comprising a sleeve-shaped contact element acting as a conductor and oriented towards a contact partner, which is designed to expand radially with respect to its longitudinal axis, wherein a stop element arranged circumferentially to the contact element and also designed to be conductive is designed to interact with the contact partner in such a way that an axial movement of the stop or activation element causes a radial expansion of the sleeve-shaped contact element.

[0007] DE 10 2019 129 817 A1 discloses a test contact for high-frequency applications, comprising a spreading body as a contact element which has a circumferential support edge which causes the spreading body to expand when a test object is contacted.

[0008] From DE 10 2013 225 513 A1, an arrangement for electrically contacting a contact partner is known, comprising an elastically deflectable contact arm and a counter element displaceable parallel to the contact arm, wherein the counter element is displaced relative to a starting position and the contact arm is deflected when a test object is contacted. The arrangement discloses an end-side contact section for contacting the contact partner, a contacting element, and an activation element axially movable relative to a test element, wherein the activation element has a contact area that can be contacted at its end face by the contact partner.

[0009] In light of the known state of the art, the present invention aims to provide an improved test contact device, particularly for high-current applications, which enables reliable contacting and testing of a test specimen.

[0010] This problem is solved by a test contact device according to claim 1 and the plug connection system with the features of claim 18. The dependent claims describe further advantageous embodiments of the invention.

[0011] In a first aspect, the invention relates to a test contact device, in particular a high-current test contact device for releasably contacting an electrically conductive area of ​​a contact partner with an external retaining element and a test element guided therein at least partially and movable relative to the retaining element at least in the axial direction of the device, comprising an end-side contact section for contacting the contact partner with at least one contacting element, which is designed to be deformed at least partially radially from an inner position to a radially outer position when the contact partner is contacted by an activation element cooperating with it and axially movable relative to the test element, wherein the activation element is arranged radially inside the contacting element and has a bearing area that can be contacted at its end face by the contact partner.

[0012] The test contact device according to the invention enables reliable and automated contacting of a test specimen for high-current applications. The end-face contactable contact area allows for simple, direct, and automated actuation of the contacting element by means of the activation element when contacting a test specimen. In particular, compared to the prior art, no manual interaction with the test contact device is necessary. Simultaneously, the radially internal arrangement of the activation element results in a structurally simple and reliable design of the test contact device.

[0013] In the present context, "high-current applications" shall be understood to encompass both high-current and high-voltage applications. The test contact device according to the invention is therefore suitable for testing purposes in the high-current and high-voltage ranges, or is designed accordingly.

[0014] In this context, deformation from a radially inner position to a radially outer position is understood to mean at least a partial deformation of the contacting element radially outward, i.e., in a direction essentially perpendicular to a longitudinal axis of the device. The contacting element is preferably designed such that its radially outward movement allows contact with a radially inward-facing contact surface of the contact partner. The term "radial" refers in particular to a direction essentially perpendicular to the longitudinal axis of the device or the contact partner and is not limited to circular arrangements or designs of the corresponding components. "Radial outward" is understood to mean a direction away from the central longitudinal axis of the device.

[0015] The test contact device according to the invention can be selectively brought into contact with a contact partner or test object such that an electrical connection is established between the device and the contact partner. The holding element of the device can be attached to a test system by means of fastening elements such as a flange or the like. The test contact device is preferably designed to enable current and / or voltage measurement at the contact partner.

[0016] The test element is preferably at least partially made of electrically conductive material, in particular a metal. The contacting element is preferably electrically connected to the test element or a part thereof. The contacting element is particularly advantageously made of copper beryllium (CuBe). On a section opposite the contacting section, the test element preferably includes a connection area for electrical connection to a test system. The activation element, which is movable relative to the test element, is advantageously made of non-conductive plastic, particularly preferably polyetheretherketone (PEEK).

[0017] In a preferred embodiment, the activation element is arranged centrally on a central longitudinal axis of the test contact device. The activation element is further advantageously designed to be movable along the central longitudinal axis of the test contact device.

[0018] Preferably, the activation element comprises a central receiving section on its end face, which is designed to receive an inner or centrally arranged contact finger of the contact partner. Advantageously, a base surface of the receiving section forms the bearing area of ​​the activation element. In a contacting position of the device, a preferably axially projecting contact finger of the contact partner engages in the receiving section, with one end section of the finger being pressed onto the bearing area. The axial force exerted in this process moves the activation element axially relative to the test element or the device, which in turn causes a radially outward movement of the contacting element. The contacting element can thus be pressed against a radially inwardly directed contact surface of the contact partner.

[0019] The receiving section advantageously includes radially internal centering means, preferably in the form of an inwardly inclined chamfer arranged on the inner circumferential surface. This allows tolerances in the arrangement between the test contact device and the contact partner to be compensated for and an optimized connection to be achieved.

[0020] In a preferred embodiment, the receiving section is preferably rectangular, in particular square. Here, the receiving section has a rectangular or square inner and / or outer contour in axial view.

[0021] The activation element is preferably spring-loaded and axially movable within the test element. In particular, the activation element is designed and arranged such that, upon contact with the contact partner, it is moved from a first non-contact position relative to the test element against a restoring spring force to a second contact position, in which the activation element exerts a radially outward force on the contacting element.

[0022] To interact with the contacting element, the activation element, according to the invention, comprises a contact section arranged on its outer circumferential surface and expanding radially towards the contact section. The contacting element at least partially rests against this contact section or, in a contact position of the device, rests against a contact partner. In a lateral sectional view, the contact section can have a substantially frustoconical shape. The contact section can further advantageously be arranged between an end section facing the contact partner, with an enlarged outer radius or dimensions, and an end section opposite this, which is substantially cylindrical and has a reduced outer radius or dimensions. In a preferred embodiment, the contact section has a rectangular outer contour.The system section comprises, in particular, four external contact surfaces. These contact surfaces are preferably designed to interact with a respective sub-area and, in particular, with respective contact lamellae of the contacting element.

[0023] The activation element is advantageously mounted in the test element so as to be axially movable within predefined limits. The activation element can, in particular in a rearwardly arranged end section, have a longitudinal bore in which a dowel pin, fixed in the test element and arranged orthogonally to the longitudinal axis, engages.

[0024] The contacting element of the device is preferably designed, at least partially, as a radially expanding element in the direction of the contacting section. The contacting element preferably comprises at least one, and more preferably at least two, opposing contact lamellae, which are advantageously designed as flat profiles and extend axially from a base body of the test element into the contacting section. The respective contact lamellae are designed to move radially outwards in conjunction with the activation element, i.e., from a radially inner position to a radially outer position in a direction essentially perpendicular to the longitudinal axis of the device or the contacting element.

[0025] In a preferred embodiment, the contacting element or contact lamellae encompassed by it comprise at least a first proximal and preferably linear section, a second section that widens radially relative to the first, and a third distal and preferably linear section. The second section of the contacting element is arranged at least partially in contact with a bearing area of ​​the activation element, in particular such that, in a contact position of the activation element or the device, the second section of the contacting element is subjected to a radially outward force by the activation element.

[0026] Advantageously, the contacting element on a radially outer surface of a distal section comprises at least one contact body projecting from an outer surface. The contact body can advantageously be formed by a rivet arranged in the contacting element, in particular one made of silver, or comprise at least one rivet.

[0027] In a preferred embodiment, the contacting element comprises at least four and preferably eight contact lamellae, which are arranged circumferentially around the radially inner activation element. The contact lamellae are preferably arranged so that they at least partially abut four mutually perpendicular contact surfaces of a bearing area of ​​the activation element. The contact lamellae are preferably arranged in a rectangular configuration around the activation element in axial plan view.

[0028] The contact section advantageously comprises a sleeve or sleeve section surrounding the contacting element, which is preferably non-conductive. This sleeve is further advantageously designed such that the contacting element does not protrude axially from it, or that the sleeve extends axially over the contacting element. This protects the contact section and, in particular, the contacting element. The sleeve or sleeve section further advantageously includes integrated centering means, preferably an inwardly inclined chamfer arranged circumferentially.

[0029] In a preferred embodiment, the test element is pre-tensioned in a non-contact position within the holding element by means of a spring element. The spring element is preferably arranged circumferentially around the test element, between an outer surface of the test element and an inner surface of the holding element. The spring element can be mounted or arranged between two axially opposing projections and / or recesses of the test element and the holding element, which serve as respective stops or contact surfaces for the spring element. This allows for a particularly compact design of the test device.

[0030] In a further preferred embodiment, the test element is mounted in the holding element such that the latter is mounted to be at least partially radially movable and / or tiltable relative to the holding element. This allows for optimized tolerance compensation when contacting the contact partner to be tested.

[0031] In a further preferred embodiment, the device comprises at least one sense contact element in the form of a temperature and / or voltage sensor. This is advantageously arranged in or extending within the contact section, so that the sense contact element can be brought into contact with the contact partner in a contacting position. For example, the sense contact element can be designed as a contact lamella which is electrically insulated from the other contact lamellae of the contact element in a rearward region. A temperature sensor can advantageously be provided in the distal region of the contact element and, for example, be contacted by means of a separate cable connection. Furthermore, the test contact device can have a central longitudinal bore in the region of the activation element, in which further contact elements can be provided.

[0032] In a further preferred embodiment, the device comprises a cooling opening and / or cooling channel directed towards the contact section for cooling the device and, in particular, the contact section. A cooling opening can be provided in a lateral surface of a sleeve area, on which, for example, a compressed air connection can be arranged. Alternatively or additionally, a cooling channel can be provided extending axially in the device and, in particular, in the activation element. The cooling channel can comprise at least one, preferably two, longitudinal grooves in a lateral surface of the activation element.

[0033] In another aspect, the invention relates to a plug connection system, particularly for high-current applications, comprising a test contact device as described above and a contact partner or test object.

[0034] In a preferred embodiment, the contact partner or test specimen is a contact element suitable for high-current applications, comprising a socket section with contact surfaces formed on an inner surface therein and a centrally arranged, axially extending, and preferably non-conductive contact finger within the socket section. The inner surface of the socket section further preferably has four conductive contact surfaces arranged substantially at right angles to one another. In an axial plan view, the socket section preferably comprises a rectangular inner and outer contour.

[0035] To avoid repetition, reference is made to the features of the device according to the invention described above with regard to the further features of the plug connection system according to the invention, which are to be considered as equally disclosed and claimable for the system according to the invention and vice versa.

[0036] Details, advantageous effects and specifics of the present invention are explained below with reference to the merely exemplary drawings.

[0037] Showing: Fig. 1a: an external view of a test contact device according to a preferred embodiment of the invention; Fig. 1b: a partially cut-away side view of the contact device and in particular of a contact section of the test contact device according to Fig. 1a; Fig. 2a: a sectional view and a side view of the test contact device according to Fig. 1 in a first non-contact position; Fig. 2b a sectional view and a side view of the test contact device according to Fig. 1 in a second contact position contacting a contact partner (without depiction of the contact partner); Fig. 3: the system according to the invention with a partially cut-away side view of the test contact device according to Fig. 2b in a position contacting a contact partner; Fig. 4 a perspective sectional view of a test contact device according to Fig. 1a,b; and Fig. 5 a perspective sectional view of a contact section of the test contact device.

[0038] The Fig. 1a to 2b, as well as Fig. 4 and Fig. Figure 5 shows a preferred embodiment of the test contact device 10 according to the invention. This comprises an outer retaining element 1, which is advantageously designed as a bushing section or bushing-like outer housing, with a flange 1a attached to it for mounting, for example, to a holding device of a test system (not shown). A test element 2 of the device can advantageously be designed as a substantially cylindrical inner housing, which is guided and mounted at least partially in the retaining element 1. The inner test element 2 is axially movable relative to the outer retaining element 1. A spring element 13 is arranged between the retaining element 1 and the test element 2, in particular between an inner surface 1b of the retaining element 1 and an outer surface 2a of the test element 2, which biases the test element 2 towards a contact partner 20.

[0039] The test contact device 10 has a contact section 3 at a first end for contacting a contact partner 20 (see Fig. 3). At an opposite end, the device 10 has a connection area 14 for electrical connection to a test system (not shown). The contact section 3 comprises an outer sleeve section 12, which surrounds a contacting element 4 arranged therein. This can have an inner and outer contour that is rectangular in axial plan view, as shown here. Alternatively, the sleeve section 12 can have a different shape, and in particular a substantially circular inner and outer contour. Advantageously, the sleeve section includes integrated centering means 12a, in particular an inwardly inclined circumferential chamfer.

[0040] The contact section 3 comprises a contacting element 4 extending therein in the axial longitudinal direction L, and an activation element 5 that interacts with it in a position-dependent manner and is arranged to be axially movable relative to the contacting element 4. The activation element 5 is biased in the direction of the contact section 3 by means of a second spring element 15. The activation element 5 is arranged radially inside the contacting element 4 and preferably axially centrally within the test contact device. At an end face or head 5a of the activation element 5 facing the contact partner 20, the activation element 5 comprises a central receiving section 7 formed in the head, which is designed to receive an inner contact finger 21 of the contact partner 20 (see Figure 1). Fig. 3) A base surface of the receiving section 7 forms a bearing area or bearing surface 6 for the contact finger 21. The receiving section 7 further includes a centering chamfer 7a arranged on the inner circumferential surface for simplified contact by the contact partner 20.

[0041] The head 5a of the activation element 5 comprises a contact section 8 that tapers radially away from the contact section 3, against which the contacting element 4 at least partially rests. At a rear end, i.e., at an end facing away from the contact section 3, the activation element 5 comprises a preferably cylindrical or hollow cylindrical neck section 5b, which is axially movably mounted as a guide element in a corresponding guide 17 in the test element 2, preferably an axial bore. To limit the axial movement of the activation element 5 relative to the test element 2, the activation element 5 can have a longitudinal bore or elongated recess 18 into which a dowel or locking pin 19, fixed in the test element 2 and arranged orthogonally to the longitudinal axis, engages.

[0042] The head of the activation element 5, and in particular the contact section 8, is preferably frustoconical or conical in side view. The activation element 5 can have a round or angular outer contour in axial plan view. In a particularly preferred embodiment, the contact section 8 has a rectangular outer contour. Here, the contact section comprises, in particular, four outer contact surfaces 8a (see figure). Fig. 4, Fig. 5), on which the contacting element 4 at least partially rests.

[0043] The contacting element 4 is arranged radially outside the activation element 5 and particularly preferably on the circumference of the activation element. The contacting element 4 is designed to expand radially, at least partially, towards the contacting section 3. The contacting element 4 comprises at least two opposing contact lamellae 4a, which are flat-profile and extend axially from a base body 2a of the test element 2, to which they are preferably electrically connected, into the contacting section 3. In the preferred embodiment shown, the contacting element 4 comprises eight contact lamellae 4a, with two lamellae each being arranged on opposite sides of the activation element 5.

[0044] Each contact lamella 4a comprises a first proximal and preferably linear section 9a, a second section 9b that widens radially relative to the first, and a third distal and preferably linear section 9c. A contact element 11, projecting from an outer surface, is preferably arranged on the latter. This element can be designed, in particular, as a rivet and serves for optimized contacting of a conductive contact on the contact partner 20. The first linear section 9a is conductively connected to the test element 2. The linear section 9a can be clamped or screwed to the test element 2. In particular, the section 9a can be screwed to the test element 2 by means of an L-shaped connecting element 16 arranged at its end.

[0045] The contact lamellae 4a are arranged on the test element 2 and around the activation element 5 such that a second section 9b of the respective contact lamella 4a is arranged in contact with the contact section 8 of the activation element 5. The contact lamellae 4a are at least partially in contact with four mutually perpendicular contact surfaces 8a of the contact section of the activation element 5.

[0046] If the contact partner 20 is now contacted by the test contact device 10, an axial force F acts on the activation element 5 through the contact finger 21 which contacts the support area 6 of the activation element 5 (cf. Fig. 2a). This causes the activation element 5 to move against a preload force of the spring element 15, whereby the axial movement is converted into a radial movement R of the contacting lamellae 4a by the head 5a of the activation element or its conically or frustoconically shaped contact section 8. In this process, these are deformed from a radially inner position to a radially outer position (cf. Fig. 2b). The contacting lamellae 4a can thereby contact one or more contact surfaces 22 arranged on the inner circumferential surface of the contact partner 20. This contact position is in Fig. 3 shown.

[0047] The Fig. The contact partner 20 shown in Figure 3 comprises a bushing section 23 with contact surfaces 22 formed on an inner surface therein. In an axial plan view, the bushing section preferably has a rectangular inner and outer contour. The contact surfaces 22 are preferably configured as four conductive contact surfaces arranged substantially at right angles to each other. Furthermore, the contact partner 20 comprises a preferably non-conductive contact finger 21, which extends axially and centrally within the bushing section 23.

[0048] The test contact device may further have an axial bore 25 in the test element 2, in which further contacting elements (not shown) may be provided.

[0049] The device advantageously further comprises at least one sense contact element in the form of a temperature and / or voltage sensor 26, 27. The voltage sensor can be configured as a contact lamella 27 which is electrically insulated in a rear region from the other contact lamellae 4a of the contacting element 4 by suitable insulating means 27a. The voltage sensor 27 can otherwise have the same structure as the contact lamellae 4a of the contacting element 4. At its rear end, the voltage sensor is electrically contacted by separate connecting means (not shown). A temperature sensor 26 can advantageously be provided in the distal region of the contacting element 4 and, in particular, on one of the contact lamellae 4a and be contacted, for example, by means of a separate cable connection 26a.

[0050] Furthermore, the device can have a cooling opening and / or cooling channel 24a, 24b directed towards the contact section 3 for cooling the device and, in particular, the contact section 3. A cooling opening 24b can be provided in a cylindrical surface of the sleeve area 12, to which a hose for cooling fluid can be connected by means of an advantageously provided connecting element 24c (see Figure 1). Fig. 5) Furthermore or additionally, the device can have a cooling channel 24a which extends axially and connects a rear side of the device to the contact section 3. The cooling channel 24a can comprise at least one and preferably at least two longitudinal grooves in the outer surface of the activation element 5, as shown in Fig. 4 is shown. List of reference symbols 1 retaining element 1a Flange 2 test element 2a Basic body 2b Outer surface 3 Contact section 4 Contact element 4a Contact strips 5 Activation element 5a Head section 5b Neck section 6 printing area 7 Recording section 7a Centering device 8 Plant section 8a Plant area Section 9a-c Contact element 10 Test contact device 11 contact bodies 12 sleeve area 12a Centering device 13 Spring element 14 Connection area 15 second spring element 16 Connecting element lamella 17 Guide in the test element 18 longitudinal bore 19 Safety pin 20 contact partners 21 contact fingers 22 Contact area 23 socket 24a,b Cooling channel, cooling opening 24°C cooling connection 25 central bore test element 26 temperature sensors 26a Cable connection temperature sensor 27 Voltage sensor / contact element 27a Insulating element contact element 30 plug-in system L Longitudinal direction F Axial force R radial force

Claims

[1] Test contact device (10), in particular a high-current test contact device for detachably contacting an electrically conductive region of a contact partner (20) with an outer holding element (1) and a test element (2) guided at least in sections therein and movable relative to the holding element (1) at least in the axial direction of the device (10), comprising an end-side contact section (3) for contacting the contact partner (20) with at least one contacting element (4), which is designed to be deformed at least partially radially from an inner position to a radially outer position upon contacting the contact partner (20) by an activating element (5) cooperating therewith and axially movable relative to the test element (2), wherein the activating element (5) is arranged radially inward of the contacting element (4) and has a support area (6) which can be contacted by the contact partner (20) on the end face,and wherein the activation element (5) has on its outer circumferential surface a contact section (8) which widens radially in the direction of the contact section (3) and against which the contacting element (4) rests at least partially. [2] Test contact device according to claim 1, wherein the activation element (5) is arranged centered on a longitudinal axis of the test contact device (10). [3] Test contact device according to claim 1 or 2, wherein the activation element (5) has a central receiving section (7) on the front side, which is designed to receive an inner contact finger (21) of the contact partner (20) and whose base surface forms the support area (6). [4] Test contact device according to claim 3, wherein the receiving section (7) comprises radially inner centering means (7a), preferably in the form of a centering chamfer arranged on the inner circumferential surface. [5] Test contact device according to one of the preceding claims, wherein the activation element (5) is spring-loaded and arranged to be axially movable in the test element (2) such that when contacting a contact partner (20), the activation element (5) is moved from a first non-contact position relative to the test element (2) against a return spring force into a second contact position in which the activation element (5) exerts a radially outward-acting force on the contacting element (4). [6] Test contact device according to one of the preceding claims, wherein the contacting element (4) is designed to widen radially at least partially in the direction of the contacting section (3). [7] Test contact device according to one of the preceding claims, wherein the contacting element (4) comprises at least one, preferably at least two opposing contact blades (4a), which are designed in the manner of a flat profile and extend axially into the contact section (3) from a base body (2a) of the test element (2), to which they are preferably electrically conductively connected. [8] Test contact device according to one of the preceding claims, wherein the contacting element (4) or contact blades (4a) encompassed thereby comprises at least a first proximal and preferably linear section (9a), a second section (9b) widening radially relative to the latter and a third distal and preferably linear section (9c). [9] Test contact device according to claim 8, wherein the second portion (9b) of the contacting element (4) is arranged at least partially adjacent to a contact portion (8) of the activation element (5) and is subjected to a radially outwardly acting force in a contact position of the activation element (5). [10] Test contact device according to one of the preceding claims, wherein the contacting element (4) has at least one contact body (11) protruding from an outer surface on a radially outer surface of a distal portion (9c). [11] Test contact device according to claim 10, wherein the contact body (11) comprises a rivet arranged in the contacting element (4), in particular consisting of silver. [12] Test contact device according to one of the preceding claims, wherein the contacting element (4) comprises at least four and preferably eight contact blades (4a) which are arranged circumferentially of the radially inner activation element (5). [13] Test contact device according to claim 12, wherein the contact blades (4a) are arranged at least partially in contact with four mutually perpendicular contact surfaces (8a) of a contact section (8) of the activation element (5). [14] Test contact device according to one of the preceding claims, wherein the contact section (3) comprises a sleeve (12) surrounding the contacting element (4), preferably of non-conductive design, with centering means (12a) integrated therein. [15] Test contact device according to one of the preceding claims, wherein the test element (2) is arranged in the holding element (1) prestressed into a non-contacting position by means of a spring element (13). [16] Test contact device according to one of the preceding claims, wherein the test element (2) is mounted in the holding element (1) in such a way that it is mounted at least partially radially movable and / or tiltable relative to the holding element (1). [17] Test contact device according to one of the preceding claims, wherein the device has at least one sense contact element (26, 27) in the form of a temperature and / or voltage sensor. [18] Test contact device according to one of the preceding claims, wherein the device has a cooling opening and / or cooling channel (24a, 24b) directed towards the contact section 3 for cooling the device. [19] Plug connection system, in particular for high-current applications, with a test contact device (10) according to one of the preceding claims and a contact partner (20).

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