CONDUCTOR CORRECTION MODULE AND MEASURING SYSTEM

Abstract

The present disclosure shows a conductor correction module for the continuous or time-discrete detection of properties of a conductor for electrical signal transmission, wherein the conductor correction module has a bidirectional optical interface that can be coupled to at least one optical conductor of the conductor, an optical splitter that has an input interface, a bidirectional test signal interface, and an output interface, and a property measurement unit that is coupled to the output interface of the optical splitter. The bidirectional test signal interface of the optical splitter is coupled to the bidirectional optical interface, and the optical splitter is configured to receive an optical test signal via the input interface and to output a first part of the test signal via the bidirectional test signal interface and a second part of the test signal via the output interface.The bidirectional optical interface is configured to forward the received first part of the test signal into the optical conductor and to receive a reflected optical signal from the optical conductor and forward it to the bidirectional test signal interface. The optical splitter is further configured to output the received reflected optical signal via the output interface, wherein the property measurement unit is configured to determine at least one physical property of the conductor based on the second part of the test signal and the received reflected optical signal. Furthermore, the present disclosure shows a corresponding measurement system.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to a conductor correction module and a corresponding metrology system. TECHNICAL BACKGROUND

[0002] The present disclosure is described below primarily in connection with devices for metrology applications. It is understood that the disclosure is not limited to such devices and can be used in any system or application that includes at least one of the following functions: acquiring measured values ​​or signals, transmitting measured values ​​or signals, or generating measured values ​​or signals.

[0003] Especially when acquiring measured values ​​in electronic systems that utilize high signal frequencies, a precise determination of the properties of the measuring system is necessary. This applies to all components of the measuring system, such as the measuring devices, but also to the transmission paths, such as conductors.

[0004] Document CN 1 17 607 521 A shows a current measuring system with an optical ring placed around a conductor. Document DE 10 2014 116 908 A1 shows an electrical cable with a fiber that is at least partially coupled to the cable with respect to movement, in particular vibration. A partial discharge along the cable can be detected via a local discharge-induced movement, such as a vibration of the cable, which is detected by influencing the light in the fiber. Document DE 10 2022 132 120 B3 shows a versatile RF control system for generating an RF signal for manipulating optical signals or controlling quantum systems. SUMMARY

[0005] One object of the disclosure is therefore to enable accurate detection of the properties of conductors in measuring systems and other signal processing systems.

[0006] The problem is solved by the subject matter of the independent claims.

[0007] It is revealed: A conductor correction module for the continuous or time-discrete detection of properties of a conductor for electrical signal transmission, wherein the conductor correction module has a bidirectional optical interface which can be coupled to at least one optical conductor of the conductor, an optical splitter which has an input interface, a bidirectional test signal interface, and an output interface, and a property measuring unit which is coupled to the output interface of the optical splitter. The bidirectional test signal interface of the optical splitter is coupled to the bidirectional optical interface, and the optical splitter is designed to receive an optical test signal via the input interface and to transmit a first part of the test signal via the bidirectional test signal interface, in particular to the bidirectional optical interface ordirectly to the bidirectional optical interface, and to output a second part of the test signal via the output interface. The bidirectional optical interface is designed to forward the received first part of the test signal into the optical conductor of the conductor, and to receive a reflected optical signal from the optical conductor and forward it to the bidirectional test signal interface. The optical splitter is further designed to output the received reflected optical signal via the output interface, in particular to the property measuring unit or directly to the property measuring unit, wherein the property measuring unit is designed to determine at least one physical property of the conductor based on the second part of the test signal and the received reflected optical signal.

[0008] It is further disclosed: A metrology system comprising a conductor correction module according to one of the embodiments disclosed herein, a conductor comprising an electrical conductor and an optical conductor, wherein at least the optical conductor of the conductor is coupled to the conductor correction module, and a metrology device coupled directly or indirectly via the conductor correction module to the electrical conductor of the conductor, wherein the metrology device is configured to adapt signal processing based on at least one physical property of the conductor determined by the conductor correction module.

[0009] The present disclosure is based on the finding that conductors in metrology applications can have a significant influence on the quality of signal measurement or signal generation. In particular, conductors in such applications can exhibit time-varying properties. For example, a change in the ambient temperature, and thus in the conductor temperature, can lead to a change in the length of the conductor. Furthermore, the properties can also be changed, for example, by the position or bending of the conductor.

[0010] The present disclosure takes this finding into account and makes it possible to continuously monitor or determine changing physical properties of a conductor. "Continuously" in the context of this disclosure can mean that the physical properties of a conductor are recorded over the entire duration of use of the conductor correction module. This can occur continuously, i.e., without interruptions, or cyclically at predetermined time intervals, e.g., several times per second, several times per minute, or several times per hour, or at other time intervals, i.e., discretely.

[0011] The physical properties of a conductor can be determined without the use of external calibration aids. This allows the physical properties of a conductor to be determined during measurement, i.e., when the conductor is being used to measure a test specimen.

[0012] In the context of the present disclosure, the term "conductor" generally refers to any type of electrical conductor capable of conducting electrical signals. Such conductors may, for example, comprise a wire or stranded conductor, or multiple wires or strands, which may, for example, be surrounded by a dielectric. Conductors may also be coaxial cables or conductors. Conductors according to the present disclosure may also comprise waveguides through which electrical waves can be transmitted.

[0013] It is understood that the present invention is not limited to metrology applications. Rather, it can also be used in other applications, such as radar or other RF applications.

[0014] For this purpose, the present disclosure provides the conductor correction module or the measuring system with the conductor correction module and a corresponding measuring device.

[0015] The conductor correction module has an optical splitter that receives an optical test signal via an input interface. The optical splitter splits the optical test signal and transmits a first portion of the optical test signal via its bidirectional output interface to a bidirectional optical interface of the conductor correction module. A second portion of the optical test signal is transmitted from the optical splitter via its output interface to a property measurement unit of the conductor correction module.

[0016] The bidirectional optical interface can be coupled externally to an optical conductor of the cable to be tested or monitored.

[0017] The conductor correction module is designed to be used with conductors that are used to conduct electrical signals via an electrical signal path and that also have an optical signal path. Furthermore, such conductors have a corresponding reflector at the end of the optical signal path or optical conductor, which reflects a test signal fed in at the other end. Such conductors are described, for example, in EP 24 189 361.9, the content of which is incorporated herein by reference. Corresponding conductors can have an optical signal path in addition to an RF signal path. The optical signal path is used for the parallel transmission of an optical signal that is not used for data transmission or for transmitting measurement signals or measuring a DUT. Rather, the optical signal is used to measure properties of the conductor.The optical signal path can be provided with a single fiber optic cable for the outgoing and return signals. However, the optical signal path can also have one fiber optic cable for the outgoing signal and one for the return signal.

[0018] If the conductor correction module is connected to such a conductor or to the optical conductor of such a conductor, the first transmitted part of the optical test signal is reflected at the other end of the conductor and received in the bidirectional optical interface as a reflected optical signal.

[0019] The bidirectional optical interface transmits this reflected optical signal to the bidirectional test signal interface of the optical splitter. The reflected optical signal is then transmitted from the optical splitter to the property measurement unit via the output interface.

[0020] The property measuring unit determines at least one physical property of the conductor based on the second part of the optical test signal and the reflected optical signal.

[0021] The at least one physical property can be any property that can result from external influences on the conductor and which can be determined directly or indirectly by comparing the second part of the test signal with the reflected optical signal. An indirect determination also includes the determination of a difference between the second part of the test signal and the reflected optical signal. In such an embodiment, the at least one physical property is determined only indirectly, e.g. as a phase difference or as an amplitude difference. For example, a change in length, a change in bending or radius, or a change in temperature of the conductor can be determined as a physical property directly or, for example, from the phase difference or the amplitude difference.

[0022] Furthermore, in the conductor correction module or a measurement device of the measurement system, e.g., a measuring device or a signal generation device, further physical properties can be determined or calculated based on the data previously determined by the conductor correction module. Such properties can, for example, relate to the indirectly determined properties mentioned above, or to an impedance or impedance change of the conductor.

[0023] The conductor correction module can simply be coupled to the optical conductor of the conductor and transmit the determined physical properties to a corresponding measuring device.

[0024] In embodiments, the conductor correction module can further comprise an electrical signal path or an RF signal path, which enables the transmission of electrical signals from a measurement device to another element of the measurement system. Such another element can be another measurement device or a so-called DUT (Device Under Test). The electrical signal path can comprise corresponding connectors or contacts that are electrically or galvanically coupled to one another.

[0025] The electrical signal path can, for example, be arranged together with the optical signal path in a common housing or connector. Such a housing can, for example, be designed to be directly coupled to a corresponding interface of a measuring device. Such an interface can, for example, be a so-called "smart probe" or "active probe" interface, which combines electrical signal transmission of the measuring signal with digital data transmission.

[0026] In embodiments, the conductor correction module can have multiple parallel optical signal paths, optionally with corresponding electrical signal paths. Such a conductor correction module can be used to monitor multiple conductors simultaneously.

[0027] The metrology system according to the present disclosure may include one or more conductor correction modules coupled to one or more corresponding conductors and metrology devices.

[0028] A metrology device according to the present disclosure may include any device used in a metrology application to acquire an input signal or generate an output signal, or perform additional or supporting functions in a metrology application. A metrology device may also be implemented as a program or software application that runs as a metrology application on a computer or processor and can communicate with other metrology devices to perform a metrology task. A metrology application, also referred to as a measurement or test setup, may, for example, include at least one or more different metrology devices used for electrical, magnetic, or electromagnetic measurements, in particular on individual devices under test, also called DUTs.A measurement device according to the present disclosure can be configured to perform such electrical, magnetic, or electromagnetic measurements or signal generation on a test object, for example, in a measurement laboratory or in a production facility on the respective production line. An exemplary measurement setup can be used to qualify the individual test objects, i.e., to verify the proper electrical function of the respective test objects.

[0029] For this purpose, measurement devices can comprise at least one signal receiving part for detecting electrical, magnetic, or electromagnetic signals from the device under test and / or at least one signal generating part for generating electrical, magnetic, or electromagnetic signals that can be fed to the device under test. Such a signal receiving part can, for example, but not limited to, contain a front-end stage for detecting, filtering, attenuating, or amplifying electrical signals. The signal generating part can, for example, but not limited to, comprise corresponding signal generators, amplifiers, and filters. In embodiments, the signal is detected via the signal receiving part in a wired or contact-based manner. For this purpose, a corresponding measuring probe (also called a sample) can be connected to the measurement device via a corresponding conductor.Likewise, in some embodiments, the signal generation and output via the signal generation section is carried out in a wired or contact-based manner. For this purpose, a corresponding signal output probe can be connected to the measuring device via a corresponding conductor, or the signal can be output directly via the conductor, e.g., to a test object.

[0030] Furthermore, measurement devices for signal acquisition may include a signal processing unit that processes the acquired signals. This processing may include converting the acquired signals from analog to digital signals and any other type of digital signal processing, for example, converting time-domain signals to frequency-domain signals.

[0031] The measurement devices may also have a user interface to display the acquired signals to the user and allow the user to control the measurement devices. Of course, a housing enclosing the elements of the measurement device may be provided. It is understood that additional elements such as a power supply circuit and communication interfaces may be provided.

[0032] A measurement device can be a standalone device that can be operated without any additional elements in a measurement application to perform tests on a device under test. Of course, communication capabilities can also be provided to connect the measurement device to other measurement devices.

[0033] A measurement device can, for example, be a signal recording device such as an oscilloscope, in particular a digital oscilloscope, a spectrum analyzer, a signal analyzer, or a vector network analyzer. A measurement device can also include a signal generation device, e.g., a signal generator, in particular an arbitrary signal generator, also referred to as an arbitrary waveform generator, or a vector signal generator. Other possible measurement devices include devices such as calibration standards or measuring probe tips.

[0034] Of course, at least some of the possible functions, such as signal recording and signal generation, can be combined in a single measuring device.

[0035] In embodiments, the measurement device may comprise pure data acquisition devices capable of acquiring an input signal and transmitting the acquired input signal as a digital input signal to a corresponding data storage or application server. Such pure data acquisition devices do not necessarily have a user interface or a display. Instead, such pure data acquisition devices may be remotely controlled, e.g., via an appropriate data connection such as a network interface or a USB interface. The same applies to pure signal generation devices capable of generating an output signal without having a user interface or configuration input devices. Instead, such signal generation devices may be remotely controlled via a data connection.

[0036] Typically, measurement systems are calibrated and de-embedding before starting operation, i.e., before a measurement or signal generation begins. Calibration and de-embedding capture the properties of the signal paths in the measurement system and take them into account during operation.

[0037] The subject matter of the present disclosure now makes it possible to use time-varying correction terms in measuring devices instead of simple or static correction terms, into which the results of determining the physical properties are incorporated. For example, the changing physical properties can be included as an additional, variable parameter in the corresponding correction terms. Conventional types of calibration or system error correction, such as a 1-port calibration, a 7-term calibration, or other methods, can continue to be used, since they only need to be supplemented by an additional parameter whose value can change.

[0038] The measuring devices can thus correct signals accordingly, e.g. with regard to the phase or the time base.

[0039] With the conductor correction module and the measuring system according to the present disclosure, it is possible to detect changing properties of conductors during operation of the measuring system in real time, so to speak, and to take them into account accordingly in the measuring devices.

[0040] Consequently, the accuracy of the measurement system can be improved or kept stable over the operating period.

[0041] Further embodiments and developments emerge from the dependent claims and from the description with reference to the figures. In particular, all embodiments mentioned herein can be combined with one another in any order or number, unless individual features are mutually exclusive. In particular, the dependent claims of one claim category can also be developed according to another claim category. For example, the conductor correction module in the metrology system can be designed according to any of the embodiments explicitly specified herein for the conductor correction module.

[0042] In an embodiment which can be combined with all embodiments mentioned herein, the bidirectional test signal interface of the optical splitter can have a single signal port, in particular exactly one signal port, which is designed to transmit the first part of the test signal and to receive the reflected optical signal.

[0043] This design makes it possible to use the conductor correction module with conductors that have only a single optical conductor that transmits the first part of the test signal and the reflected optical signal.

[0044] In another embodiment, which can be combined with all embodiments mentioned herein, the bidirectional test signal interface of the optical splitter can have a first signal port and a second signal port, wherein the first signal port is configured to transmit the first part of the test signal and the second signal port is configured to receive the reflected optical signal.

[0045] In such an embodiment, the first part of the test signal is transmitted to the conductor via the first signal port and the reflected optical signal is received via the second signal port.

[0046] This configuration allows the conductor correction module to be used with conductors having two optical conductors, one of the conductors transmitting the first part of the test signal and the other conductor transmitting the reflected optical signal.

[0047] In yet another embodiment, which can be combined with all embodiments mentioned herein, the output interface of the optical splitter can have a single signal port configured to output the second part of the test signal and to output the reflected optical signal.

[0048] In such an embodiment, the second part of the test signal is superimposed on the reflected optical signal and the superimposed signals are transmitted to the property measuring unit.

[0049] In an embodiment which can be combined with all embodiments mentioned herein, the output interface of the optical splitter can have a first signal port and a second signal port, wherein the first signal port is configured to output the second part of the test signal and the second signal port is configured to output the reflected optical signal.

[0050] In such an embodiment, the second part of the test signal is transmitted to the property measuring unit via the first signal port and the reflected optical signal is transmitted to the property measuring unit via the second signal port.

[0051] The superimposed transmission and the separate transmission of the second part of the test signal and the reflected optical signal can each enable different evaluations.

[0052] In another embodiment, which can be combined with all embodiments mentioned herein, the property measuring unit can have a digital data interface and be designed to output the determined physical properties via the digital data interface.

[0053] As explained above, the property measurement unit can determine the physical properties directly or indirectly. The property measurement unit can therefore determine values ​​that directly characterize the physical properties or from which the magnitudes of the physical properties can be calculated.

[0054] The digital data interface enables the transmission of specific data on the physical properties to, for example, a measuring device, which can use this data to correct measured values. If the physical properties are determined indirectly, the measuring device can determine the corresponding values ​​based on the transmitted data.

[0055] The digital data interface can also be used to transmit electrical energy to power the property measurement unit or other components of the conductor correction module. Alternatively, a corresponding power transfer interface can be provided. Such a power transfer interface can be combined with the data interface, as is common with USB interfaces, for example.

[0056] Other possible types of digital data interfaces may include, for example, any type of wired and wireless communication interfaces, such as a network interface, in particular an Ethernet, WLAN or WIFI interface, a USB interface, a Bluetooth interface, an NFC interface, a visible or non-visible light-based interface, in particular an infrared interface.

[0057] In yet another embodiment, which can be combined with all embodiments mentioned herein, the property measuring unit can be configured to perform at least one of the following functions: to determine a phase difference between the second part of the test signal and the reflected optical signal, to determine a time difference between the second part of the test signal and the reflected optical signal, to determine correlation information between the second part of the test signal and the reflected optical signal, and to determine amplitude information for the second part of the test signal and the reflected optical signal.

[0058] The phase difference can be used, for example, for a periodic optical test signal to determine propagation time changes in the conductor.

[0059] A time difference can be used, for example, in the analysis of pulsed or non-periodic signals to determine a propagation time change in the conductor.

[0060] The correlation information can be calculated, for example, if the temporal offset between the second part of the test signal and the reflected signal becomes too large. In the context of the present disclosure, the term "correlation information" refers in particular to the correlation coefficient between the two signals. This can, for example, be determined section by section over specific time intervals. A time interval can be the sampling time of the measuring device.

[0061] Amplitude information, also called amplitude, can be determined to determine the attenuation of the conductor.

[0062] It is understood that the property measuring unit can determine individual or any combination of these parameters, e.g. phase difference and time difference, phase difference and correlation information, phase difference and amplitude information, time difference and correlation information, time difference and amplitude information, correlation information and amplitude information, phase difference and time difference and correlation information, phase difference and time difference and amplitude information, and time difference and correlation information and amplitude information.

[0063] The determined quantities or data can, for example, be transmitted to a measuring device via the aforementioned digital data interface. It is understood that the properties of the optical conductor are determined, and from these, the properties of the electrical conductor are inferred. For example, the measuring device can determine the changes in the physical properties of the conductor from the determined quantities. In further embodiments, the property measuring unit itself can determine the changes in the physical properties of the conductor from the determined quantities and transmit them to the measuring device. For this purpose, the property measuring unit can, for example, be provided with a corresponding computing unit.

[0064] In another embodiment, which can be combined with all embodiments mentioned herein, the property measuring unit can comprise at least one photodetector and at least one analog-to-digital converter coupled to at least one photodetector.

[0065] With a combination of photodetector and analog-to-digital converter (ADC), optical signals can be processed reliably and with minimal components. Furthermore, the digital output signals of the ADCs can be easily forwarded or further processed.

[0066] Exactly one ADC can be provided for each of the photodetectors. Alternatively, an ADC can be coupled to multiple photodetectors and capture a superimposed signal.

[0067] Several photodetectors can also be designed together as a so-called “balanced photodetector”.

[0068] In an embodiment that can be combined with all embodiments mentioned herein, the property measuring unit can comprise: a first photodetector configured to detect the second part of the optical test signal and output a first electrical signal, a second photodetector configured to detect the reflected optical signal and output a second electrical signal, a combiner coupled to the first photodetector and the second photodetector and configured to combine the first electrical signal with the second electrical signal, and an analog-to-digital converter coupled to the combiner and configured to convert the combined electrical signal into a digital signal and output it.

[0069] In such an embodiment, a combiner for two analog electrical signals is used to combine the two output signals of the photodetectors and transmit them to a single analog-to-digital converter.

[0070] A photodiode, for example, can serve as the photodetector in each of the embodiments presented here. When using two photodetectors, a so-called balanced photodetector can also be used.

[0071] The electrical combiner can be used, for example, to determine a phase difference from the two electrical signals. Such a combiner can, for example, comprise an analog phase detector, an analog mixer, a digital phase detector / mixer, or a lock-in amplifier.

[0072] In another embodiment, which can be combined with all embodiments mentioned herein, the property measuring unit can comprise: an optical combiner which is designed to combine the second part of the optical test signal with the reflected optical signal, a photodetector which is coupled to the optical combiner and which is designed to detect the combined optical signal and output a corresponding electrical signal, and an analog-to-digital converter which is coupled to the photodetector and is designed to convert the electrical signal into a digital signal and output it.

[0073] In such a configuration, an optical combiner is used, and only a combined optical signal is fed to a single photodetector. Such an embodiment can be used, in particular, with a phase- or frequency-modulated test signal.

[0074] A fiber-based power splitter, such as one produced by splicing, can be used as an optical combiner, also called an optical coupler. Optical couplers can be implemented using fibers or, as in electronics, in the semiconductor substrate, such as silicon on insulator (SOI). Superposition of the free beam using a mirror and beam splitter or PBS (polarizing beam splitter) is also possible.

[0075] In yet another embodiment, which can be combined with all embodiments mentioned herein, the optical splitter can be configured to output the second part of the optical test signal and the reflected optical signal as a combined optical signal to the property measuring unit, wherein the property measuring unit can comprise: a photodetector configured to detect the combined optical signal and output a corresponding electrical signal, and an analog-to-digital converter coupled to the photodetector and configured to convert the electrical signal into a digital signal and output it.

[0076] In such embodiments, the second part of the optical test signal and the reflected optical signal can already be combined in the optical splitter and fed to the property measuring unit as a combined optical signal.

[0077] In another embodiment, which can be combined with all embodiments mentioned herein, the property measuring unit can comprise: a first photodetector, which is designed to detect the second part of the optical test signal and to output a first electrical signal, a second photodetector, which is designed to detect the reflected optical signal and to output a second electrical signal, a first analog-to-digital converter, which is coupled to the first photodetector and is designed to convert the first electrical signal into a first digital signal, a second analog-to-digital converter, which is coupled to the second photodetector and is designed to convert the second electrical signal into a second digital signal, and a combiner, which is coupled to the first analog-to-digital converter and the second analog-to-digital converter, and which is designedto combine the first digital signal with the second digital signal and output it.

[0078] The combination of the first digital signal with the second digital signal can be understood here as the actual measurement process by which the signal to be captured and output with the measurement is generated. In particular, a phase difference or an amplitude difference can be determined by the combination. This explanation applies analogously to the combiners already disclosed above, which can be, for example, digital or optical combiners.

[0079] In such a configuration, the second part of the optical test signal and the reflected optical signal are routed separately until they are available as digital data. A digital combiner can then combine the two digital data sets or streams into a single digital signal. Such a combiner can be implemented, for example, as an algorithm in a DSP or ASIC.

[0080] In yet another embodiment, which can be combined with all embodiments mentioned herein, the conductor correction module can further comprise an optical signal source which is coupled to the input interface of the optical splitter and is configured to generate the optical test signal and to transmit it to the optical splitter.

[0081] In such embodiments, the conductor correction module itself can comprise an optical signal source that generates the optical test signal and transmits it to the optical splitter. This allows the conductor correction module to be provided as a self-contained unit that requires no additional external components. The optical signal source can be, for example, a modulatable laser source. In particular, direct modulation of the laser diode can be used at low frequencies. At higher frequencies, this is not always possible. In such applications, an electro-absorptive modulator or Mach-Zehnder modulator can be combined with a cw laser.

[0082] In an embodiment that can be combined with all embodiments mentioned herein, the conductor correction module can further comprise an optical input interface that is coupled to the input interface of the optical splitter and is configured to receive the optical test signal and transmit it to the optical splitter.

[0083] In such embodiments, the conductor correction module can be designed without its own optical signal source. This allows the conductor correction module to be flexibly coupled to external optical signal sources.

[0084] In embodiments, the conductor correction module may also combine an internal optical signal source with an interface for an external optical signal source.

[0085] In embodiments, several of the above-mentioned architectures can also be arranged in the conductor correction module. Furthermore, a switch can be provided, for example, with which switching between the individual architectures can be performed. Such a switch can be controlled manually by a user or via the digital data interface.

[0086] In another embodiment, which can be combined with all embodiments mentioned herein, the optical test signal can comprise at least one of the following optical signals: a periodically modulated signal, an amplitude modulated signal, a phase modulated signal, a frequency modulated signal, a chirp modulated signal, and a pulse modulated signal.

[0087] The optical test signal can be flexibly selected to optimally support the respective application. Depending on the physical parameters to be determined, a suitable modulation type can be selected.

[0088] In an embodiment, which can be combined with all embodiments mentioned herein, the property measuring unit can be configured to determine a change in an absolute length of the conductor based on the second part of the test signal and the received reflected optical signal.

[0089] The property measurement unit can comprise, for example, a processor or configurable logic device, e.g. a CPLD, or FPGA, or an ASIC, which can determine the absolute change in length of the conductor.

[0090] In particular, the property measuring unit can measure the absolute length of the conductor at the beginning of operation and then continuously determine the change in length of the conductor.

[0091] With such a conductor correction module, for example, the absolute length difference between several conductors connected to a measuring device, radio direction finder, etc., can be determined and their temporal changes can be determined in real time. This is particularly necessary when, for example, when taking direction with multiple antennas, the absolute propagation times and phases of several used conductors and their changes need to be monitored.

[0092] The term "absolute length" also means that, for example, a broken conductor can be detected by comparing the measured length with a known nominal length. If the measured length deviates from the nominal length by more than a specified threshold, a broken conductor can be detected.

[0093] In another embodiment, which can be combined with all embodiments mentioned herein, the conductor correction module can further comprise a memory which is designed to store the length of the conductor in a reference state.

[0094] The term "reference state" refers to a conductor state in which the conductor has a defined length. This state can occur, for example, at the end of the conductor's production run. The conductor's length can be determined, for example, in a so-called end-of-line test.

[0095] The property measurement unit can then determine a change in length during operation. Determining only the change in length requires less complex operations than determining the absolute length.

[0096] In addition to the absolute length of the conductor, further information such as a type of conductor or an identifier of the conductor can be stored in the memory.

[0097] The conductor correction module may further comprise an identification interface, e.g. an RFID interface, via which the conductor can be identified in order to read the corresponding data from the memory.

[0098] Alternatively, the absolute length of the conductor can also be read from a data storage device in the conductor via this interface. In further embodiments, the absolute length can also be communicated to the property measurement unit via the digital data interface. For example, a measuring device can retrieve this information from a corresponding server using knowledge of the conductor's serial number.

[0099] In an embodiment that can be combined with all embodiments mentioned herein, the conductor correction module can further comprise a timer that is coupled to the property measuring unit and is configured to output a time signal, wherein the property measuring unit can be configured to determine an absolute propagation time of the first part of the optical test signal in the conductor based on the time signal.

[0100] Alternatively, the timer can be integrated into the measuring device. The timer can also be arranged as a dedicated unit within the measuring system. The time signal can be transmitted from the measuring device or dedicated unit to the conductor correction module via a corresponding interface.

[0101] The timer may include a corresponding timer component, e.g., an oscillator. Other possible embodiments of the timer may include, for example, a GPS receiver that receives a GPS signal, or other radio receivers.

[0102] By determining the absolute propagation time of the first part of the optical test signal in the fiber, the absolute length of the fiber can be determined directly. It is therefore not necessary to communicate the absolute length to the fiber correction module or to store it in memory.

[0103] In another embodiment of the measuring system, which can be combined with all embodiments mentioned herein, the conductor correction module can be arranged in the measuring device. Alternatively, the conductor correction module can be arranged between the measuring device and the conductor, external to the measuring device and the conductor. Furthermore, the conductor correction module can be arranged in the conductor. TABLE OF CONTENTS OF THE DRAWINGS

[0104] The present disclosure is explained in more detail below with reference to the exemplary embodiments shown in the schematic figures of the drawings. Fig. 1 shows a block diagram of a possible embodiment of a conductor correction module according to the present disclosure; Fig. 2 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; Fig. 3 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; Fig. 4 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; Fig. 5 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; Fig. 6 shows a block diagram of a possible embodiment of a property measuring unit according to the present disclosure; Fig. 7 shows a block diagram of another possible embodiment of a property measuring unit according to the present disclosure; Fig. 8 shows a block diagram of another possible embodiment of a property measuring unit according to the present disclosure; Fig. 9 shows a block diagram of another possible embodiment of a property measuring unit according to the present disclosure; Fig. 10 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; Fig. 11 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; Fig. 12 shows a block diagram of another possible embodiment of a conductor correction module according to the present disclosure; and Fig. 13 shows a block diagram of a possible embodiment of a metrology system according to the present disclosure.

[0105] In all figures, identical or functionally identical elements and devices have been provided with the same reference numerals, unless otherwise stated. DETAILED DESCRIPTION OF THE FIGURES

[0106] Fig. 1 shows a fiber correction module 100. The fiber correction module 100 includes a bidirectional optical interface 101, an optical splitter 102, and a property measurement unit 106. The optical splitter 102 has an input interface 103, a bidirectional test signal interface 104, and an output interface 105. The bidirectional optical interface 101 can be coupled to at least one optical fiber of a fiber. The bidirectional test signal interface 104 of the optical splitter 102 is coupled to the bidirectional optical interface 101, and the output interface 105 of the optical splitter 102 is coupled to the property measurement unit 106.

[0107] The optical splitter 102 receives an optical test signal 108 via the input interface 103 and outputs a first portion 109 of the test signal 108 via the bidirectional test signal interface 104. At the same time, the optical splitter 102 outputs a second portion 110 of the test signal 108 via the output interface 105 to the property measurement unit 106. The first portion 109 and the second portion 110 are each to be understood as signal components, in particular identical or identical except for the amplitude, of the test signal 108, which can be generated, for example, by means of an optical splitter, e.g., a semi-transparent mirror.

[0108] The bidirectional optical interface 101 transmits the first portion 109 of the test signal 108 into the optical fiber and receives a reflected optical signal 111 from the optical fiber. The bidirectional optical interface 101 returns the received reflected optical signal 111 to the bidirectional test signal interface 104. The optical splitter 102 also forwards the received reflected optical signal 111 to the property measurement unit 106 via the output interface 105.

[0109] The property measurement unit 106 determines at least one physical property 112 of the conductor based on the second part 110 of the test signal 108 and the received reflected optical signal 111. The determined at least one physical property 112 can then be forwarded to, for example, a corresponding measuring device.

[0110] The conductor correction module 100 further includes an optional RF signal path 113 through which an RF signal can be routed from a source into an RF conductor of the conductor or vice versa.

[0111] It is understood that all elements of the conductor correction module 100 can be arranged in a common housing and corresponding connectors can be provided to contact the conductor correction module 100.

[0112] It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 100 mutatis mutandis.

[0113] Fig. Figure 2 shows a conductor correction module 200. The conductor correction module 200 is based on the conductor correction module 100. Consequently, the conductor correction module 200 comprises a bidirectional optical interface 201, an optical splitter 202, and a property measurement unit 206. The optical splitter 202 has an input interface 203, a bidirectional test signal interface 204, and an output interface 205. The bidirectional optical interface 201 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 204 of the optical splitter 202 is coupled to the bidirectional optical interface 201, and the output interface 205 of the optical splitter 202 is coupled to the property measurement unit 206. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 200 mutatis mutandis.

[0114] In the conductor correction module 200, the bidirectional test signal interface 204 of the optical splitter 202 has a single signal port 215. This port can transmit the first part 209 of the test signal 208 and also receive the reflected optical signal 211.

[0115] Fig. 3 shows a conductor correction module 300. The conductor correction module 300 is based on the conductor correction module 100. Consequently, the conductor correction module 300 comprises a bidirectional optical interface 301, an optical splitter 302, and a property measurement unit 306. The optical splitter 302 has an input interface 303, a bidirectional test signal interface 304, and an output interface 305. The bidirectional optical interface 301 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 304 of the optical splitter 302 is coupled to the bidirectional optical interface 301, and the output interface 305 of the optical splitter 302 is coupled to the property measurement unit 306. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 300 mutatis mutandis.

[0116] The bidirectional test signal interface 304 of the optical splitter 302 has a first signal port 315-1 and a second signal port 315-2. The first signal port 315-1 is configured to transmit the first part 309 of the test signal 308, and the second signal port 315-2 is configured to receive the reflected optical signal 311.

[0117] The first signal port 315-1 and the second signal port 315-2 can be used in particular with conductors that have two optical fibers, as already explained above.

[0118] Fig. 4 shows a conductor correction module 400. The conductor correction module 400 is based on the conductor correction module 100. Consequently, the conductor correction module 400 comprises a bidirectional optical interface 401, an optical splitter 402, and a property measurement unit 406. The optical splitter 402 has an input interface 403, a bidirectional test signal interface 404, and an output interface 405. The bidirectional optical interface 401 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 404 of the optical splitter 402 is coupled to the bidirectional optical interface 401, and the output interface 405 of the optical splitter 402 is coupled to the property measurement unit 406. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 400 mutatis mutandis.

[0119] The output interface 405 of the optical splitter 402 has a single signal port 416 that outputs the second part 410 of the test signal 408 and the reflected optical signal 411.

[0120] Although not shown separately, the signal port 416 or the optical splitter 402 may include a corresponding optical mixer to mix the second portion 410 of the test signal 408 and the reflected optical signal 411 and output them via the single signal port 416.

[0121] Fig. 5 shows a conductor correction module 500. The conductor correction module 500 is based on the conductor correction module 100. Consequently, the conductor correction module 500 comprises a bidirectional optical interface 501, an optical splitter 502, and a property measurement unit 506. The optical splitter 502 has an input interface 503, a bidirectional test signal interface 504, and an output interface 505. The bidirectional optical interface 501 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 504 of the optical splitter 502 is coupled to the bidirectional optical interface 501, and the output interface 505 of the optical splitter 502 is coupled to the property measurement unit 506. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 500 mutatis mutandis.

[0122] The output interface 505 of the optical splitter 502 has a first signal port 516-1 and a second signal port 516-2. The first signal port 516-1 outputs the second portion 510 of the test signal 508, and the second signal port 516-2 outputs the reflected optical signal 511.

[0123] The property measuring unit 506 therefore receives two separate signals for further processing.

[0124] Fig. 6 shows a property measurement unit 606. The property measurement unit 606 has an input interface 620 coupled to at least one photodetector 622, which is coupled to at least one analog-to-digital converter 623. The at least one analog-to-digital converter 623 is coupled to a digital data interface 621.

[0125] The input interface 620 receives the second part of the test signal and the reflected optical signal and forwards them to the photodetector 622, which generates electrical signals from the two optical signals and forwards them to the analog-to-digital converter 623. The analog-to-digital converter 623 outputs a corresponding digital signal via the data interface 621, which has the at least one physical property 612.

[0126] It is understood that the explanations regarding other embodiments of the property measuring unit described herein apply to the property measuring unit 606 mutatis mutandis.

[0127] In the embodiment shown, the optical splitter can, for example, output the second part of the optical test signal and the reflected optical signal as a combined optical signal to the property measuring unit.

[0128] The property measurement unit 606 can, for example, determine a phase difference between the second part of the test signal and the reflected optical signal, or determine a time difference between the second part of the test signal and the reflected optical signal, or determine correlation information between the second part of the test signal and the reflected optical signal, or determine amplitude information for the second part of the test signal and the reflected optical signal. The property measurement unit 606 can further determine a change in an absolute length of the conductor based on the second part of the test signal and the received reflected optical signal.

[0129] It is understood that any embodiment of the property measurement unit described herein may be used in any embodiment of the conductor correction module.

[0130] Fig. 7 shows a property measuring unit 706. It is understood that the explanations regarding other embodiments of the property measuring unit described herein apply to the property measuring unit 706 mutatis mutandis.

[0131] The property measurement unit 706 receives the second part of the test signal and the reflected optical signal and is coupled to a first photodetector 722-1 and a second photodetector 722-2.

[0132] The first photodetector 722-1 detects the second portion of the optical test signal and outputs a first electrical signal. The second photodetector 722-2 detects the reflected optical signal and outputs a second electrical signal.

[0133] The two electrical signals are combined into a single electrical signal by a combiner 725 and fed to an analog-to-digital converter 723, which converts the combined electrical signal into a digital signal and outputs it as a physical property 712 via the data interface 721.

[0134] Fig. 8 shows a property measuring unit 806. It is understood that the explanations regarding other embodiments of the property measuring unit described herein apply to the property measuring unit 806 mutatis mutandis.

[0135] The property measurement unit 806 has an input interface 820, which receives the second part of the test signal and the reflected optical signal. Furthermore, the property measurement unit 806 is coupled to an optical combiner 826, which combines the second part of the optical test signal with the reflected optical signal. The optical combiner 826 is coupled to the photodetector 822, which detects the combined optical signal and outputs a corresponding electrical signal. Analog-to-digital converter 823 converts the electrical signal into a digital signal and outputs it as physical property 812.

[0136] Fig. 9 shows a property measuring unit 906. It is understood that the explanations regarding other embodiments of the property measuring unit described herein apply to the property measuring unit 906 mutatis mutandis.

[0137] The property measurement unit 906 has an input interface 920 which receives the second part of the test signal and the reflected optical signal separately.

[0138] The input interface 920 is coupled to a first photodetector 922-1 and a second photodetector 922-2.

[0139] The first photodetector 922-1 detects the second portion of the optical test signal and outputs a first electrical signal to a first analog-to-digital converter 923-1. The second photodetector 922-2 detects the reflected optical signal and outputs a second electrical signal to a second analog-to-digital converter 923-2.

[0140] The first analog-to-digital converter 923-1 converts the first electrical signal into a first digital signal. The second analog-to-digital converter 923-2 converts the second electrical signal into a second digital signal. A combiner 927 combines the first digital signal with the second digital signal and outputs it as a physical property 912 via the data interface 921.

[0141] Fig. 10 shows a conductor correction module 1000. The conductor correction module 1000 is based on the conductor correction module 1000. Consequently, the conductor correction module 1000 comprises a bidirectional optical interface 1001, an optical splitter 1002, and a property measurement unit 1006. The optical splitter 1002 has an input interface 1003, a bidirectional test signal interface 1004, and an output interface 1005. The bidirectional optical interface 1001 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 1004 of the optical splitter 1002 is coupled to the bidirectional optical interface 1001, and the output interface 1005 of the optical splitter 1002 is coupled to the property measurement unit 1006. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 1000 mutatis mutandis.

[0142] The conductor correction module 1000 further includes an optical signal source 1030 and an optical input interface 1031. It is understood that the conductor correction module 1000 may also include only the optical signal source 1030 or the optical input interface 1031.

[0143] The optical signal source 1030 is coupled to the input interface 1003 of the optical splitter 1002 and outputs the optical test signal 1008 to the optical splitter 1002.

[0144] The optical input interface 1031 is coupled to the input interface 1003 of the optical splitter 1002 and receives the optical test signal 1008 to transmit it to the optical splitter 1002.

[0145] The optical test signal 1008 can be, for example, a periodically modulated signal, an amplitude modulated signal, a phase modulated signal, a frequency modulated signal, a chirp modulated signal, or a pulse modulated signal.

[0146] Fig. 11 shows a conductor correction module 1100. The conductor correction module 1100 is based on the conductor correction module 1100. Consequently, the conductor correction module 1100 comprises a bidirectional optical interface 1101, an optical splitter 1102, and a property measurement unit 1106. The optical splitter 1102 has an input interface 1103, a bidirectional test signal interface 1104, and an output interface 1105. The bidirectional optical interface 1101 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 1104 of the optical splitter 1102 is coupled to the bidirectional optical interface 1101, and the output interface 1105 of the optical splitter 1102 is coupled to the property measurement unit 1106. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 1100 mutatis mutandis.

[0147] The conductor correction module 1100 further includes a memory 1135. The memory 1135 can store the length of the conductor 1341 in a reference state. This length can be recorded, for example, during production of the conductor and stored in the memory 1135 together with a serial number of the conductor.

[0148] Alternatively, the length can be measured, for example. The length of the conductor can also be read wirelessly, e.g., via an RFID interface, or via contact, from a memory in the conductor. For this purpose, the conductor correction module 1100 can, for example, have a corresponding interface. The length of the conductor can also be transmitted to the conductor correction module 1100 from a corresponding measuring device, for example.

[0149] Fig. 12 shows a conductor correction module 1200. The conductor correction module 1200 is based on the conductor correction module 1200. Consequently, the conductor correction module 1200 comprises a bidirectional optical interface 1201, an optical splitter 1202, and a property measurement unit 1206. The optical splitter 1202 has an input interface 1203, a bidirectional test signal interface 1204, and an output interface 1205. The bidirectional optical interface 1201 can be coupled to at least one optical conductor of a conductor. The bidirectional test signal interface 1204 of the optical splitter 1202 is coupled to the bidirectional optical interface 1201, and the output interface 1205 of the optical splitter 1202 is coupled to the property measurement unit 1206. It is understood that the explanations regarding other embodiments of the ladder correction module described herein apply to the ladder correction module 1200 mutatis mutandis.

[0150] The conductor correction module 1200 further includes a timer 1238. The timer 1238 is coupled to the property measurement unit 1206 and is configured to output a time signal.

[0151] Based on the time signal, the property measurement unit 1206 can determine an absolute propagation time of the first part 1209 of the optical test signal 1208 in the conductor. Based on the absolute propagation time, for example, the absolute length of the conductor can be determined.

[0152] Fig.13 shows a block diagram of a measurement system 1339. The measurement system 1339 comprises a measurement device, for example an oscilloscope 1340, which has four measurement inputs 1345-1, 1345-2, 1345-3, 1345-4. One of the measurement inputs 1345-1, 1345-2, 1345-3, 1345-4 is electrically coupled to an RF conductor 1342 of a conductor 1341. Furthermore, a conductor correction module 1300 is coupled to an optical conductor 1343 of the conductor 1341 and to a processor 1346 of the oscilloscope 1340.

[0153] It is understood that the conductor correction module 1300 may have an RF signal path and the corresponding one of the measurement inputs 1345-1, 1345-2, 1345-3, 1345-4 may be coupled to the RF conductor 1342 via the conductor correction module 1300.

[0154] The conductor correction module 1300 can also be arranged in the measuring device 1340 or in the conductor 1341 in some embodiments.

[0155] Since the devices and methods described in detail above are exemplary embodiments, they can be modified widely by those skilled in the art without departing from the scope of the disclosure. In particular, the mechanical arrangements and the relative sizes of the individual elements are merely exemplary. LIST OF REFERENCE SYMBOLS 100, 200, 300, 400, 500, 1000 conductor correction module 1100, 1200, 1300 conductor correction module 101, 201, 301, 401, 501, 1001 bidirectional optical interface 101, 201, 301, 401, 501, 1001 bidirectional optical interface 102, 202, 302, 402, 502, 1002 optical splitter 1102, 1202 optical splitter 103, 203, 303, 403, 503, 1003 input interface 1103, 1203 input interface 104, 204, 304, 404, 504, 1004 bidirectional test signal interface 1104, 1204 bidirectional test signal interface 105, 205, 305, 405, 505, 1005 output interface 1105, 1205 output interface 106, 206, 306, 406, 506, 606, 706, 806 property measurement unit 906, 1006, 1106, 1206 property measurement unit 108, 208, 308, 408, 508, 1008 optical test signal 1108, 1208 optical test signal 109, 209, 309, 409, 509, 1009 first part 1109, 1209 first part 110, 210, 310, 410, 510, 1010 second part 1110, 1210 second part 111, 211, 311, 411, 511, 1011 reflected optical signal 1111, 1211 reflected optical signal 112, 212, 312, 412, 512, 612, 712, 812 physical property 912, 1012, 1112, 1212 physical property 113 RF signal path 215, 315-1, 315-2 signal port 416, 516-1, 516-2 signal port 620, 720, 820, 920 input interface 621, 721, 821, 921 digital data interface 622, 722-1, 722-2, 822, 922-1, 922-2 photodetector 623, 723, 823, 923-1, 923-2 analog-to-digital converters 725 electric combiner 826 optical combiner 927 digital combiner 1030 optical signal source 1031 optical input interface 1135 storage 1238 timers 1339 metrological system 1340 measuring device 1341 ladder 1342 RF conductors 1343 optical conductor 1345-1, 1345-2, 1345-3, 1345-4 measuring input 1346 processor 1347 Display

Claims

[1] A conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) for the continuous or time-discrete detection of properties of a conductor (1341) for electrical signal transmission, wherein the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) comprises: a bidirectional optical interface (101, 201, 301, 401, 501, 1001) which can be coupled to at least one optical conductor (1343) of the conductor (1341); an optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) having an input interface (103, 203, 303, 403, 503, 1003, 1103, 1203), a bidirectional test signal interface (104, 204, 304, 404, 504, 1004, 1104, 1204), and an output interface (105, 205, 305, 405, 505, 1005, 1105, 1205); a property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) coupled to the output interface (105, 205, 305, 405, 505, 1005, 1105, 1205) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202); wherein the bidirectional test signal interface (104, 204, 304, 404, 504, 1004, 1104, 1204) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) is coupled to the bidirectional optical interface (101, 201, 301, 401, 501, 1001); wherein the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) is designed to receive an optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) via the input interface (103, 203, 303, 403, 503, 1003, 1103, 1203) and to divide a first part (109, 209, 309, 409, 509, 1009, 1109, 1209) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) via the bidirectional test signal interface (104, 204, 304, 404, 504, 1004, 1104, 1204) and a second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) via the output interface (105, 205, 305, 405, 505, 1005, 1105, 1205); wherein the bidirectional optical interface (101, 201, 301, 401, 501, 1001) is designed to forward the received first part (109, 209, 309, 409, 509, 1009, 1109, 1209) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) into the optical conductor, and to receive a reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211) from the optical conductor and to forward it to the bidirectional test signal interface (104, 204, 304, 404, 504, 1004, 1104, 1204); wherein the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) is further configured to output the received reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211) via the output interface (105, 205, 305, 405, 505, 1005, 1105, 1205); and wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) is designed to measure at least one physical property (112, 212, 312, 412, 512, 612, 712, 812, 912, 1012, 1112, 1212) of the conductor (1341) based on the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the received reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [2] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to claim 1, wherein the bidirectional test signal interface (104, 204, 304, 404, 504, 1004, 1104, 1204) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) has a single signal port (215) which is designed to receive the first part (109, 209, 309, 409, 509, 1009, 1109, 1209) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and receive the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [3] The fiber correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to claim 1, wherein the bidirectional test signal interface (104, 204, 304, 404, 504, 1004, 1104, 1204) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) has a first signal port (315-1) and a second signal port (315-2); wherein the first signal port (315-1) is configured to transmit the first part (109, 209, 309, 409, 509, 1009, 1109, 1209) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208), and the second signal port (315-2) is configured to receive the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [4] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the output interface (105, 205, 305, 405, 505, 1005, 1105, 1205) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) has a single signal port (416) which is designed to output the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and output the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [5] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims 1 to 3, wherein the output interface (105, 205, 305, 405, 505, 1005, 1105, 1205) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) has a first signal port (516-1) and a second signal port (516-2); wherein the first signal port (516-1) is configured to output the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208), and the second signal port (516-2) is configured to output the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [6] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) has a digital data interface (621, 721, 821, 921) and is designed to measure the specific physical properties (112, 212, 312, 412, 512, 612, 712, 812, 912, 1012, 1112, 1212) via the digital data interface (621, 721, 821, 921). [7] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) is designed to perform at least one of the following functions: to determine a phase difference between the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211); to determine a time difference between the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211); to determine correlation information between the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211); and To determine amplitude information for the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [8] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) comprises at least one photodetector (622, 722-1, 722-2, 822, 922-1, 922-2) and at least one analog-to-digital converter (623, 723, 823, 923-1, 923-2) which is connected to at least one photodetector (622, 722-1, 722-2, 822, 922-1, 922-2). [9] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to any one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) comprises: a first photodetector (722-1) configured to detect the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and output a first electrical signal; a second photodetector (722-2) configured to detect the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211) and output a second electrical signal; a combiner (725) coupled to the first photodetector (722-1) and the second photodetector (722-2) and configured to combine the first electrical signal with the second electrical signal; and an analog-to-digital converter (723) coupled to the combiner (725) and configured to convert and output the combined electrical signal into a digital signal. [10] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to any one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) comprises: an optical combiner (826) configured to combine the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) with the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211); a photodetector (822) coupled to the optical combiner (826) and configured to detect the combined optical signal and output a corresponding electrical signal; and an analog-to-digital converter (823) coupled to the photodetector (822) and configured to convert and output the electrical signal into a digital signal. [11] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) is designed to separate the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211) as a combined optical signal to the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206), wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) comprises: a photodetector (622, 822) configured to detect the combined optical signal and output a corresponding electrical signal; and an analog-to-digital converter (623, 823) coupled to the photodetector (622, 822) and configured to convert and output the electrical signal into a digital signal. [12] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to any one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) comprises: a first photodetector (922-1) configured to detect the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and output a first electrical signal; a second photodetector (922-2) configured to detect the reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211) and output a second electrical signal; a first analog-to-digital converter (923-1) coupled to the first photodetector (922-1) and configured to convert the first electrical signal into a first digital signal; a second analog-to-digital converter (923-2) coupled to the second photodetector (922-2) and configured to convert the second electrical signal into a second digital signal; and a combiner (927) coupled to the first analog-to-digital converter (923-1) and the second analog-to-digital converter (923-2), and configured to combine and output the first digital signal with the second digital signal. [13] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, further comprising an optical signal source (1030) which is coupled to the input interface (103, 203, 303, 403, 503, 1003, 1103, 1203) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) and is designed to generate the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and to supply it to the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202). [14] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, further comprising an optical input interface (1031) which is coupled to the input interface (103, 203, 303, 403, 503, 1003, 1103, 1203) of the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202) and is designed to receive the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and to transmit it to the optical splitter (102, 202, 302, 402, 502, 1002, 1102, 1202). [15] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) comprises at least one of the following optical signals: a periodically modulated signal; an amplitude-modulated signal; a phase-modulated signal; a frequency-modulated signal; a chirp-modulated signal; and a pulse-modulated signal. [16] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims, wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) is designed to determine a change in an absolute length of the conductor (1341) based on the second part (110, 210, 310, 410, 510, 1010, 1110, 1210) of the test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) and the received reflected optical signal (111, 211, 311, 411, 511, 1011, 1111, 1211). [17] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to claim 16, further comprising a memory (1135) configured to store the length of the conductor (1341) in a reference state. [18] The conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of claims 16 and 17, further comprising a timer (1238) coupled to the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) and configured to output a time signal; wherein the property measuring unit (106, 206, 306, 406, 506, 606, 706, 806, 906, 1006, 1106, 1206) is designed to determine an absolute propagation time of the first part (109, 209, 309, 409, 509, 1009, 1109, 1209) of the optical test signal (108, 208, 308, 408, 508, 1008, 1108, 1208) in the conductor (1341) on the basis of the time signal. [19] A metrological system (1339) comprising: a conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) according to one of the preceding claims; a conductor (1341) comprising an electrical conductor (1342) and an optical conductor (1343), wherein at least the optical conductor (1343) of the conductor (1341) is coupled to the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300); and a measuring device (1340) which is coupled directly or indirectly via the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) to the electrical conductor (1342) of the conductor (1341); wherein the measuring device (1340) is designed to adapt a signal processing based on at least one physical property (112, 212, 312, 412, 512, 612, 712, 812, 912, 1012, 1112, 1212) of the conductor (1341) determined by the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300). [20] The metrological system (1339) according to claim 19: wherein the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) is arranged in the measuring device (1340); or wherein the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) is arranged between the measuring device (1340) and the conductor (1341) external to the measuring device (1340) and the conductor (1341); or wherein the conductor correction module (100, 200, 300, 400, 500, 1000, 1100, 1200, 1300) is arranged in the conductor (1341).

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