System for real-time fault detection and self-reconfiguration in distributed electronic circuit architectures

Abstract

A system for real-time fault detection and self-configuration in distributed electronic circuit architectures, comprising: a plurality of circuit nodes interconnected via conductive signal paths; a plurality of sensor units physically connected to the circuit nodes and configured to measure electrical parameters such as voltage, current, impedance, frequency, and signal timing characteristics; a processing unit operationally connected to the plurality of sensor units and configured to receive digitized parameter data and perform fault detection operations based on adaptive threshold comparison, temporal variation analysis, and pattern correlation; and a storage unit connected to the processing unit that stores data on circuit topology, basic operating profiles, and historical fault signatures.a localization unit electrically connected to the processing unit and configured to determine the fault location within the circuit nodes using a graph-based representation of the connections and signal propagation characteristics; a reconfiguration unit connected to a variety of switching elements embedded in the conductive signal paths and configured to isolate a faulty node and establish alternative signal paths; and a communication interface configured for the exchange of operational data between distributed instances of the system, with the system operating in real time to detect, locate, and correct faults without external intervention.

Description

AREA OF INVENTION The present invention relates generally to the field of electronic circuit development, monitoring, and control, and in particular to a system that is integrated as a physical device into distributed electronic circuit architectures and detects, locates, and autonomously self-configures faults in real time. The invention is applicable to complex, multi-node electronic systems, including embedded systems, industrial control circuits, power distribution networks, and high-performance computing hardware, where reliability, fault tolerance, and operational continuity are of critical importance. BACKGROUND OF THE INVENTION Distributed electronic circuit architectures are widely used in modern systems due to their scalability, modularity, and ability to handle complex computing and control tasks. Such architectures typically consist of multiple interconnected circuit nodes, each performing specific functions and communicating via signal paths or interconnect buses. However, the distributed nature of these systems presents challenges regarding fault detection, isolation, and correction. Faults such as short circuits, open circuits, signal degradation, component aging, thermal stress, and electromagnetic interference can propagate across the nodes, leading to system instability or complete system failure. Conventional fault detection mechanisms rely on periodic diagnostics, redundant fault checking, or centralized monitoring. These approaches often suffer from drawbacks such as delayed fault detection, high computational overhead, or a lack of adaptability to changing fault conditions. Furthermore, existing reconfiguration strategies typically require manual intervention or predefined static redundancy, limiting flexibility and responsiveness. In high-availability environments, such delays and limitations are unacceptable. Therefore, there is a need for a system that is able to continuously monitor the state of distributed circuits, detect faults in real time with high precision, and autonomously reconfigure circuit paths and function assignments to ensure uninterrupted operation without central control or manual input. Distributed electronic circuit architectures have become indispensable in modern technical systems, including industrial automation platforms, aerospace control systems, smart grids, and high-performance computing infrastructures. These architectures typically consist of interconnected circuit nodes that cooperatively perform complex functions, often under stringent timing and reliability requirements. As the size and complexity of such systems increase, so does the likelihood of failures arising from component aging, thermal stress, electromagnetic interference, manufacturing defects, or signal integrity issues. Therefore, ensuring reliable fault detection and correction has become a critical design requirement.Traditional approaches to fault management in distributed circuits were mainly based on centralized diagnostic systems, redundancy-based fault tolerance, and periodic testing methods. Centralized monitoring solutions utilize higher-level control units that collect diagnostic data from various circuit nodes and perform fault analysis centrally. While these approaches provide a unified view of system behavior, they exhibit inherent latency due to data transmission delays and processing bottlenecks. In large distributed systems, the central unit becomes a performance bottleneck and a potential single point of failure. Furthermore, centralized systems often lack the ability to respond to faults in real time, particularly in applications requiring microsecond responses, such as power electronics or safety-critical embedded systems. Redundancy-based methods such as Triple Modular Redundancy (TMR) and N-Modular Redundancy (NMR) are frequently used to improve system reliability. In these methods, multiple identical circuit paths or components operate in parallel, and tuning mechanisms determine the correct output. While these approaches effectively mask faults, they significantly increase hardware costs, power consumption, and system complexity. Furthermore, redundancy systems are typically static, meaning they do not dynamically adapt to changing fault conditions or partial failures. Once redundancy resources are exhausted, the system becomes vulnerable to further failures. Periodic diagnostic and integrated self-test mechanisms represent another class of existing solutions. Here, the system performs scheduled checks to identify faults. While these methods are suitable for detecting latent defects, they are limited in their ability to capture transient or intermittent faults that occur between test intervals. Furthermore, the interruption caused by diagnostic routines can impair system performance, making them unsuitable for continuous operation. In many cases, these techniques rely on predefined fault models, which limits their effectiveness in detecting unexpected or complex fault patterns. Recent advances have led to distributed monitoring approaches that integrate local sensor and processing functions into circuit nodes. While these systems reduce reliance on central control, they often suffer from deficiencies in coordinated decision-making and global system visibility. Consequently, fault detection, while localized, cannot be optimally performed at the system level. Furthermore, existing distributed solutions often rely on fixed thresholds or simple rule-based algorithms, which are inadequate for handling dynamic operating conditions and complex fault interactions. Another limitation of current solutions lies in their inability to autonomously self-configure. Most systems require manual intervention or pre-programmed switching logic to isolate faulty components and reroute signals. Such approaches are inflexible and may not account for real-time conditions, resource availability, or system priorities. Furthermore, reconfiguration mechanisms are often not tightly integrated with fault detection processes, leading to delays and suboptimal recovery measures. Given these limitations, existing fault detection and management systems do not offer a comprehensive, adaptive, real-time solution for distributed electronic circuit architectures. There remains a need for an integrated approach that combines continuous monitoring, intelligent fault analysis, precise localization, and dynamic self-configuration within a unified framework, thereby increasing system stability, reducing downtime, and improving overall operational efficiency. SUMMARY OF THE INVENTION The present invention relates to a system implemented as an integrated device in a distributed electronic circuit architecture, serving for real-time fault detection and self-configuration. The system comprises several sensor units coupled to circuit nodes to acquire electrical parameters such as voltage, current, impedance, and signal propagation time. A processing unit receives the acquired data streams and executes fault detection algorithms based on adaptive thresholding, temporal correlation, and pattern recognition. Once a fault condition is detected, a localization unit uses graph-based mapping and signal propagation analysis to determine the precise location and type of fault within the circuit topology. A reconfiguration unit, connected to the switching elements integrated into the circuit, dynamically modifies signal paths, activates redundant paths, and redistributes functional loads to maintain system continuity. The system also includes a storage unit that stores data on circuit topology, historical fault signatures, and reconfiguration policies, thus enabling predictive fault handling and the optimization of reconfiguration strategies. The device operates decentrally and allows multiple instances within the distributed architecture to collaborate for coordinated fault management. The invention achieves shorter reaction times in the event of disturbances, increased system reliability and adaptive resilience, without the need for external intervention. The present invention aims to provide a system for real-time fault detection and self-configuration in distributed electronic circuit architectures. This system continuously monitors electrical and signal parameters across multiple interconnected circuit nodes and identifies fault conditions with minimal latency. The invention aims to achieve high precision in the detection of both transient and persistent faults through adaptive analysis that takes dynamic operating conditions into account, thereby overcoming the limitations of static, threshold-based detection mechanisms. A further objective of the invention is the precise localization of faults in complex circuit topologies through structured representations of node connections and signal propagation characteristics. This allows the exact position and type of fault to be unambiguously determined. This enables the targeted isolation of faulty components and prevents unnecessary disturbances in unaffected parts of the system. The invention further aims to minimize the propagation of faults between connected nodes by implementing fast isolation strategies that ensure system stability. A further objective of the invention is to provide autonomous self-configuration capability, whereby the system dynamically changes electrical paths, activates alternative circuits, and redistributes functional loads to respond to detected faults without requiring manual intervention or external control. This objective ensures operational continuity in critical applications by maintaining functional equivalence even in the event of component failures or performance degradation. A further objective of the invention is to increase system reliability and fault tolerance by integrating fault detection, localization, and reconfiguration into a single device. This reduces response times and improves coordination between different operating phases. The invention also aims to support distributed operation by enabling multiple devices embedded in different segments of the circuit architecture to cooperate and exchange information. This facilitates scalable and decentralized fault management. A further objective of the invention is the integration of memory-based learning functions for storing historical fault data, circuit behavior patterns, and results of previous reconfigurations. This enables the system to perform predictive analyses and proactively adapt circuit configurations to prevent potential failures before they occur. This contributes to improved long-term performance and reduced maintenance requirements. A further objective of the invention is to ensure compatibility with a wide variety of electronic systems through a compact and integrable hardware structure that can be seamlessly embedded into existing circuit architectures without requiring extensive redesign. The invention also aims to ensure compliance with operational constraints such as power consumption, timing requirements, and safety limits during fault handling. A further objective of the invention is to reduce dependence on central control systems and eliminate single points of failure through decentralized decision-making at the node level. This improves the robustness and fault tolerance of the overall system. With these objectives, the invention offers a comprehensive, efficient, and adaptive solution for fault management in distributed electronic circuits. BRIEF DESCRIPTION OF THE DRAWING These and other features, aspects and advantages of the present invention will be better understood if the following detailed description is read with reference to the accompanying drawing, in which the same symbols represent the same parts: Fig. 1 shows a block diagram of a system for real-time fault detection and self-reconfiguration in distributed electronic circuit architectures. Furthermore, those skilled in the art will recognize that the elements in the drawing are simplified and not necessarily drawn to scale. For example, the flowcharts illustrate the process by highlighting the main steps to facilitate understanding of the present disclosure. With regard to the construction of the device, one or more components may be represented in the drawing by conventional symbols. The drawing may show only those specific details relevant to understanding the embodiments of the present disclosure, so as not to clutter the drawing with details that are already apparent to those skilled in the art from the description contained herein. DETAILED DESCRIPTION OF THE INVENTION To facilitate understanding of the principles of the invention, reference is made below to the embodiment shown in the drawing, which is described using specific terms. It is understood, however, that this does not limit the scope of protection of the invention. Rather, modifications and further developments of the depicted system, as well as further applications of the inventive principles shown therein, are conceivable, insofar as they would normally occur to a person skilled in the art in the field of the invention. It will be clear to those skilled in the art that the foregoing general description and the following detailed description are exemplary and explanatory of the invention and are not to be understood as a limitation of it. References to “an aspect”, “another aspect”, or similar phrases in this description mean that a particular feature, structure, or property described in connection with the embodiment is included in at least one embodiment of the present disclosure. Therefore, phrases such as “in one embodiment”, “in another embodiment”, and similar expressions in this description may, but do not necessarily, all refer to the same embodiment. The terms "includes," "comprehensive," or similar expressions denote non-exclusive inclusion. Thus, a procedure or method containing a list of steps does not only include those steps but may also include further steps not explicitly listed or inherent in the procedure or method. Likewise, the statement "includes..." for one or more devices, subsystems, elements, structures, or components, without further limitations, does not preclude the existence of other devices, subsystems, elements, structures, or components. Unless otherwise defined, all technical and scientific terms used herein have the same meanings generally known to those skilled in the art in the field to which this invention belongs. The systems, methods, and examples described herein serve only for illustration and are not to be understood as limiting. Embodiments of the present disclosure are described in detail below with reference to the attached drawing. Fig. 1 shows a block diagram of a system for real-time fault detection and self-configuration in distributed electronic circuit architectures.The system comprises: several circuit nodes 102, interconnected via conductive signal paths; several sensor units 104, physically connected to the circuit nodes and measuring electrical parameters such as voltage, current, impedance, frequency, and signal propagation characteristics; a processing unit 106, connected to the sensor units, receiving digitized parameter data and performing fault detection operations based on adaptive threshold comparisons, temporal variation analyses, and pattern correlations; a storage unit 108, connected to the processing unit, storing data on circuit topology, basic operating profiles, and historical fault signatures; and a localization unit 110, electrically connected to the processing unit, determining the fault location within the circuit nodes using a graph-based representation of the connections and signal propagation characteristics.a reconfiguration unit 112, which is connected to a variety of switching elements embedded in the conductive signal paths and serves to isolate a faulty node and establish alternative signal paths; and a communication interface 114, which is configured to exchange operational data between distributed instances of the system, the system operating in real time to detect, locate and correct faults without external intervention. In one embodiment, each sensor unit 104 comprises an analog input circuit with a signal conditioning stage, an analog-to-digital converter and a time synchronization circuit configured to capture the temporal characteristics of electrical signals at high resolution. In one embodiment, the processing unit 106 comprises a multi-core microprocessor configured to perform parallel error detection routines, including baseline deviation calculation, rate of change analysis, and cross-node correlation evaluation. In one embodiment, the storage unit 108 comprises a non-volatile storage medium that stores a connectivity matrix representing the electrical connections between the circuit nodes, as well as a set of predefined fault classification patterns corresponding to various electrical anomalies. In one embodiment, the localization unit 110 is configured to calculate the signal propagation delay differences across multiple nodes and to identify the origin of the fault based on deviation gradients and attenuation characteristics along conductive paths. In one embodiment, the plurality of switching elements comprises semiconductor relays and programmable connection matrices configured to selectively open, close, or redirect conductive paths under the control of the reconfiguration unit. In one embodiment, the reconfiguration unit 112 is further configured to redistribute the functional loads between non-faulty circuit nodes by changing the control signal assignments and operating states of the circuit nodes. In one embodiment, the communication interface 114 comprises a bidirectional data link configured to synchronize fault detection information and reconfiguration measures between multiple distributed systems to enable coordinated operation. In one embodiment, the present invention further comprises a synchronization unit 116 configured to coordinate detection intervals, processing cycles and switching operations across the plurality of circuit nodes in order to maintain temporal consistency during fault handling. In one embodiment, the present invention further comprises a protection unit 118 configured to penetrate electrical insulation limits and limit the propagation of faults by automatically disconnecting affected conductor paths upon detection of abnormal parameter thresholds. The described system is implemented entirely through physical electronic circuits and hardware elements integrated into the device architecture. The numerous circuit nodes consist of discrete and interconnected electrical components such as conductive traces, connectors, and functional circuit blocks mounted on a substrate. The sensor units are implemented using analog front-end circuits that include resistive, capacitive, and semiconductor elements for signal conditioning, as well as analog-to-digital converters and clocked timers for precise measurement data acquisition. The processing unit consists of one or more microprocessors or digital processing circuits on semiconductor chips, which are electrically connected to the sensor units via wired communication buses. The memory unit is integrated into the device as non-volatile memory and can store electrical data patterns and topology information.The localization and reconfiguration unit consists of dedicated logic and control circuits that generate electrical control signals to actuate switching elements such as semiconductor relays and programmable interconnects, which physically modify the conductive traces. The communication interface is implemented using transceiver circuits and wired communication connections, enabling the exchange of electrical signals between the distributed devices. The synchronization unit includes clock generation and distribution circuits that ensure coordinated clocking of the components. The protection unit incorporates hardware isolation circuits and current limiting elements that physically interrupt fault propagation. All components are mounted on a printed circuit board or an integrated substrate and interconnected via conductive traces.This creates a complete, hardware-based system that can perform the described operations through direct electrical interactions. The present invention is implemented as a physical device within a distributed electronic circuit architecture comprising multiple interconnected circuit nodes. Each node represents a functional segment of the overall system, such as processing elements, voltage regulators, communication interfaces, or sensor interfaces. The device includes multiple sensors physically connected to conductors and components within each node. These sensors continuously measure electrical parameters such as instantaneous voltage levels, current flow characteristics, frequency response, phase deviation, and impedance changes. The sensors generate digitized parameter streams that are transmitted to a processing unit via internal high-speed communication lines. The processing unit consists of one or more microprocessors or digital signal processors configured to perform real-time analytical calculations. It employs a multi-layered fault detection algorithm that includes baseline profiling, anomaly detection, and time-vary analysis. First, the system establishes a reference operating profile for each circuit node by determining the nominal parameter ranges under normal conditions. During operation, incoming parameter streams are continuously compared to these baseline profiles, using adaptive thresholds that dynamically adjust to environmental and operational changes. In addition to threshold-based fault detection, the processing unit performs a temporal correlation analysis by examining the evolution of signal characteristics over time. This enables the detection of transient faults, intermittent failures, and gradual degradation. Using fault signatures stored in memory, pattern recognition methods are applied, allowing the system to classify faults such as short circuits, open circuits, component drift, or synchronization errors. If a deviation above predefined confidence thresholds is detected, the processing unit activates a localization unit that determines the precise location of the fault within the distributed architecture. The localization unit uses a graph representation of the circuit topology stored in memory, where nodes represent circuit elements and edges represent electrical connections. By analyzing signal propagation times, attenuation patterns, and correlations between nodes, the localization unit identifies the faulty segment with high spatial resolution. After fault localization, a reconfiguration unit is activated. This unit is electrically connected to several switching elements, such as solid-state relays, multiplexers, or programmable interconnect matrices, which are integrated into the circuit architecture. The reconfiguration unit generates control signals to selectively isolate the faulty node or path and establish alternative signal paths via redundant or underutilized circuit paths. If a redistribution of functions is required, the reconfiguration unit distributes computational or control tasks across the available nodes to maintain system functionality. The device's memory stores detailed circuit topology maps, including connection matrices and node dependencies, as well as historical fault data and reconfiguration results. This enables the processing unit to perform predictive fault management by recognizing patterns that indicate impending failures and proactively adjusting circuit configurations. The memory also stores priority rules and constraints to ensure that reconfiguration actions do not violate system requirements such as load balancing, timing constraints, or safety limits. The device operates in a decentralized manner, with multiple units being deployed in different segments of the electronic circuit architecture. Each unit communicates with neighboring units via dedicated communication links, enabling coordinated fault detection and reconfiguration across the entire system. This distributed coordination ensures scalability and eliminates the single points of failure common in centralized control systems. In one embodiment, the device includes a synchronization unit that coordinates the timing of acquisition, processing, and switching operations across all nodes, thus ensuring consistent system behavior during reconfiguration. Additionally, a protection unit is integrated that prevents cascade failures by enforcing isolation boundaries and limiting fault propagation through controlled disconnection mechanisms. The device's physical design comprises a compact hardware structure that houses the sensor units, processing unit, memory unit, localization unit, reconfiguration unit, and associated connections on a printed circuit board or integrated substrate. The device is designed for seamless integration into existing electronic systems with minimal modifications and utilizes standardized electrical interfaces and communication protocols. By combining continuous monitoring, intelligent fault analysis, precise localization and autonomous reconfiguration, the present invention offers a robust solution for maintaining operational safety in distributed electronic circuit architectures under fault conditions. The system for real-time fault detection and self-configuration in distributed electronic circuit architectures operates with a tightly integrated sequence of sensors, data acquisition, analytical calculations, fault localization, and physical reconfiguration, which runs continuously and synchronously. Each circuit node within the distributed architecture is equipped with sensor units that detect electrical parameters such as instantaneous voltage, current, impedance change, signal frequency, and timing characteristics. The sensor units have analog input stages that process the raw signals through amplification, filtering, and noise reduction, and then subject them to high-resolution analog-to-digital conversion.The digitized data is time-stamped using a synchronization circuit to ensure temporal alignment across multiple nodes and thus enable precise cross-node correlation during subsequent processing. The processing unit continuously receives digitized data streams and arranges them into structured time-series datasets, each assigned to a monitored parameter and circuit node. In an initial calibration phase, baseline operating profiles are created by statistically characterizing normal system behavior under various load and environmental conditions. These baseline profiles include means, variance distributions, permissible fluctuation limits, and stability indices. During real-time operation, the processing unit executes an adaptive threshold algorithm, comparing each incoming data point against dynamically updated thresholds derived from the baseline profiles. These thresholds are not fixed but are continuously refined using a sliding window analysis.This allows the system to compensate for gradual changes in operating conditions while maintaining sensitivity to abnormal deviations. In parallel with threshold comparison, the processing unit performs a rate-of-change analysis by calculating the first- and second-order derivatives of the acquired parameters over time. This enables the detection of abrupt transitions, which indicate transient faults such as sudden voltage drops or current spikes, as well as slow degradation patterns associated with component wear or thermal stress. Additionally, a cross-node correlation analysis is performed by evaluating the temporal relationships between signals from different circuit nodes. By creating correlation matrices and assessing phase alignment and amplitude consistency, the system identifies anomalies propagating along interconnected paths, thus distinguishing local faults from systemic disturbances. If a deviation is detected that exceeds predefined confidence thresholds, a fault classification routine is initiated. The processing unit compares the observed anomaly patterns with stored fault signatures in memory. These signatures contain characteristic profiles for conditions such as short circuits, open circuits, impedance mismatches, signal attenuation, and synchronization errors. The pattern comparison is performed using similarity metrics that consider both amplitude and temporal characteristics. This results in a probabilistic classification of the fault type. This classification is supplemented by a confidence score that indicates whether immediate reconfiguration is required or further monitoring is necessary. After fault detection and classification, the localization unit executes a graph-based fault localization algorithm. The circuit topology is represented as a connectivity matrix, where nodes correspond to circuit elements and edges to conductive paths. The localization unit calculates the signal propagation times between nodes by analyzing timestamped data and identifies deviations from the expected propagation characteristics. By evaluating the gradients of signal attenuation and delay across multiple paths, the algorithm isolates the most likely fault source. This process involves iterative refinement, where potential fault locations are checked against the observed data until convergence to a specific node or path segment is achieved. Once the fault location is determined, the reconfiguration unit generates control signals for the switching elements integrated into the circuit. The reconfiguration algorithm evaluates alternative pathways based on the stored topology data and selects an optimal configuration based on criteria such as minimal signal delay, load distribution, and avoidance of previously identified faulty segments. The switching elements, consisting of solid-state relays and programmable interconnect matrices, are activated to isolate the faulty node. This is achieved by opening conductive paths and simultaneously establishing new connections that reroute signals via redundant or underutilized paths.In scenarios where a redistribution of functions is required, the processing unit updates the control assignments so that non-faulty nodes take over the operational tasks of the isolated node, thus ensuring the continuity of system functionality. The algorithm also integrates a predictive component by continuously updating the memory with newly acquired error data and reconfiguration results. Statistical learning methods identify recurring patterns and precursors of errors, enabling the system to anticipate potential failures and initiate preventive reconfigurations. This predictive capability reduces the probability of abrupt system failures and increases long-term reliability. The communication interface allows data exchange between multiple system instances in the distributed architecture, thus enabling coordinated decision-making and global optimization of reconfiguration strategies. Synchronization mechanisms ensure that all acquisition, processing, and switching operations occur within coordinated time windows, preventing inconsistencies during reconfiguration. The protection unit operates in conjunction with the reconfiguration process by enforcing isolation conditions and preventing cascade failures. Upon detecting critical anomalies, the protection unit interrupts normal operation to immediately disconnect affected paths, thus protecting neighboring nodes. The entire system is implemented as an integrated hardware device on a substrate and features standardized electrical connectors, enabling seamless integration into existing circuit architectures. Thanks to this comprehensive algorithmic framework, the system achieves rapid fault detection, precise localization, and efficient self-configuration, ensuring robust and uninterrupted operation of distributed electronic circuits. The drawing and the preceding description illustrate embodiments. Those skilled in the art will recognize that one or more of the described elements can be combined to form a single functional element. Alternatively, certain elements can be divided into several functional elements. Elements of one embodiment can be added to another. For example, the process flows described here can be modified and are not limited to the manner described herein. Furthermore, the actions of a flowchart need not be performed in the sequence shown; nor do all actions necessarily need to be carried out. Actions that do not depend on other actions can be performed in parallel with the other actions. The scope of protection of the embodiments is in no way limited by these specific examples. Numerous variations, whether explicitly stated in the description or not, such as...Differences in structure, dimensions, and materials are possible. The scope of protection of the embodiments is at least as comprehensive as described by the following claims. The advantages, other benefits, and problem solutions have been described above with reference to specific embodiments. However, the advantages, benefits, problem solutions, and any components that can effect or enhance an advantage, benefit, or solution are not to be construed as critical, necessary, or essential features or components of the claims. REFERENCES 100 A block diagram of a system for real-time fault detection and self-reconfiguration in distributed electronic circuit architectures. 102 A multitude of circuit nodes. 104 A multitude of sensor units. 106 Processing unit. 108 Storage unit. 110 Localization unit. 112 Restructuring unit. 114 Communication interface. 116 Synchronization unit. 118 Protection unit.

Claims

A system for real-time fault detection and self-configuration in distributed electronic circuit architectures, comprising: a plurality of circuit nodes interconnected via conductive signal paths; a plurality of sensor units physically connected to the circuit nodes and configured to measure electrical parameters such as voltage, current, impedance, frequency, and signal timing characteristics; a processing unit operationally connected to the plurality of sensor units and configured to receive digitized parameter data and perform fault detection operations based on adaptive threshold comparison, temporal variation analysis, and pattern correlation; and a storage unit connected to the processing unit that stores data on circuit topology, basic operating profiles, and historical fault signatures.a localization unit electrically connected to the processing unit and configured to determine the fault location within the circuit nodes using a graph-based representation of the connections and signal propagation characteristics; a reconfiguration unit connected to a variety of switching elements embedded in the conductive signal paths and configured to isolate a faulty node and establish alternative signal paths; and a communication interface configured for the exchange of operational data between distributed instances of the system, with the system operating in real time to detect, locate, and correct faults without external intervention. System according to claim 1, wherein each sensor unit comprises an analog input stage including a signal conditioning stage, an analog-to-digital converter and a time synchronization circuit for capturing high-resolution temporal characteristics of electrical signals. System according to claim 1, wherein the processing unit comprises a multi-core microprocessor configured to perform parallel error detection routines including baseline deviation calculation, rate of change analysis and cross-node correlation evaluation. System according to claim 1, wherein the storage unit comprises a non-volatile storage medium that stores a connectivity matrix representing the electrical connections between the circuit nodes, as well as a series of predefined fault classification patterns corresponding to various electrical anomalies. System according to claim 1, wherein the localization unit is configured to calculate the signal propagation time differences across multiple nodes and to identify the origin of the error based on deviation gradients and attenuation characteristics along conductive paths. System according to claim 1, wherein the plurality of switching elements comprises semiconductor relays and programmable interconnect matrices configured to selectively open, close or redirect conductive paths under the control of the reconfiguration unit. System according to claim 1, wherein the reconfiguration unit is further configured to redistribute the functional loads between non-faulty circuit nodes by modifying the control signal assignments and operating states of the circuit nodes. System according to claim 1, wherein the communication interface comprises a bidirectional data connection configured to synchronize fault detection information and reconfiguration measures between multiple distributed systems to enable coordinated operation. System according to claim 1, further comprising a synchronization unit configured to coordinate acquisition intervals, processing cycles and switching operations across the plurality of circuit nodes to maintain temporal consistency during fault handling. System according to claim 1, further comprising a protection unit configured to penetrate electrical insulation limits and limit the propagation of faults by automatically disconnecting affected conductor paths upon detection of abnormal parameter thresholds.

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