INSPECTION DEVICE AND INSPECTION PROCEDURE
DE602020053374T2Active Publication Date: 2025-06-25HAMAMATSU PHOTONICS KK
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Patent Information
- Application Number
- DE602020053374
- Authority / Receiving Office
- DE · DE
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2020-01-29
- Publication Date
- 2025-06-25
- Estimated Expiration
- 2040-01-29
AI Technical Summary
Technical Problem
Existing inspection methods for light-emitting elements fail to accurately determine quality due to neglecting fluorescence on the long wavelength side, leading to inaccurate assessments.
Method used
An inspection apparatus and method that utilizes a dichroic mirror to separate fluorescence into long and short wavelength components, using two cameras to image and analyze both, allowing for high-accuracy quality determination by considering both normal and long wavelength fluorescence.
Benefits of technology
Enables precise identification of defects in light-emitting elements by capturing both normal and long wavelength fluorescence, improving determination accuracy and efficiency.
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