Testing device and testing method for the energy cell production industry, and method for producing a testing device

Abstract

Disclosed is a testing device (1) for the energy cell production industry, wherein the testing device (1) is designed for testing planar elements (2) that are suitable for forming a cell stack, wherein - the testing device (1) comprises multiple testing units (4) that are movable relative to a static part (5) of the testing device (1) by a conveying means (3), wherein - the testing units (4) each comprise at least two contact surfaces (6, 7, 8) for making electrical and / or signal-transmitting contact with a planar element (2) that is to be tested, wherein - the testing units (4) each comprise a carrier (9) which has electrically insulating properties and by means of which the contact surfaces (6, 7, 8) of the relevant testing unit (4) are supported in a predefined position and orientation with respect to one another, wherein - the carriers (9) of the testing units (4) are fastened to the conveying device (3).

Description

[0001] Test device and test method for the energy cell producing industry as well as manufacturing method for a test device

[0002] The present invention relates to a testing device for the energy cell production industry, which is designed to test flat elements suitable for forming a cell stack. Furthermore, the invention relates to a corresponding testing method and a manufacturing method for producing a testing device.

[0003] Energy cells or energy storage cells, such as battery cells, are used for galvanic accumulators, for example in motor vehicles, other land vehicles, ships, and aircraft, where a significant amount of energy must be stored and available for long periods of time. For this purpose, such energy cells have a structure consisting of a large number of flat elements stacked together to form a stack, referred to as cell stacks. These flat elements are formed, for example, by monocells. Monocells consist of alternating anode sheets and cathode sheets, also known as electrodes, which are separated from one another by separator sheets. A monocell therefore typically has the following layer sequence: separator - electrode (e.g., anode) - separator - electrode (e.g., cathode).

[0004] The flat elements are pre-cut during the manufacturing process and then stacked on top of each other in a predetermined order to form cell stacks and bonded together, for example, by lamination. Devices for producing battery cells are known, for example, from WO 2016 / 041713 A1 and DE 10 2017 216 213 A1.

[0005] It can happen that the flat elements become damaged during the manufacturing process. For example, with flat elements in the form of monocells, the separator may be damaged during production. If a monocell with a damaged separator is used to form the cell stack, this can negatively impact the functionality and service life of the cell stack.

[0006] Energy cells can also be fuel cells or solar cells, for example, where flat elements can also be damaged during production.

[0007] It is therefore known in principle from the state of the art to check flat elements before the stacking process and, if necessary, to remove them from the production process so that only flawless flat elements are used to form a cell stack.

[0008] Such testing procedures must be carried out taking into account the production output and conveyor speed of today's production facilities. Therefore, it is generally known from the state of the art to provide test equipment that travels alongside the flat elements during the production process and tests the flat elements alternately. To do this, the test equipment actively contacts so-called conductor flags, which are part of the electrodes of the flat elements. However, with such testing procedures, the machine's performance is limited due to the discontinuous movements. Furthermore, the flat elements can be damaged when contacting the conductor flags.

[0009] The object of the present application is to provide an improved testing device for testing flat elements, a corresponding testing method and a manufacturing method for a testing device.

[0010] The object is achieved by the features of the independent claims. Further preferred embodiments of the invention can be found in the dependent claims, the figures, and the associated description.

[0011] According to a first aspect of this application, a testing device for the energy cell producing industry is proposed to solve the problem, wherein the testing device is designed to test flat elements that are suitable for forming a cell stack, wherein the testing device comprises a plurality of testing units that are movable relative to a stationary part of the testing device by means of a conveyor device, wherein the testing units each comprise at least two contact surfaces for electrically and / or signal-technical contacting a flat element to be tested, wherein the testing units each comprise a carrier with electrically insulating properties, by means of which the contact surfaces of the respective testing unit are mounted relative to one another in a predefined position and orientation, wherein the carriers of the testing units are fastened to the conveyor device.

[0012] By positioning the contact surfaces using the carrier, they can be easily attached to the conveyor system. Furthermore, the contact surfaces of each test unit are electrically insulated from one another due to the insulating properties of the carrier, so that a flat element can be tested without interference from contact with the contact surfaces of a test unit. For this purpose, the contact surfaces are preferably connected or connectable to a measuring device. Furthermore, the contact surfaces are electrically insulated from the conveyor system by the carrier, so that, for example, the conveyor system can be designed to be electrically conductive. The carrier element can, for example, be formed only partially from an electrically insulating material, for example only on the surface. Preferably, however, the carrier consists entirely of an electrically insulating material such as plastic.

[0013] Preferably, the flat elements to be tested are monocells.

[0014] Preferably, the number of supports attached to the conveyor is a multiple of three or four. In particular, exactly 12 supports have proven advantageous because this number represents an ideal compromise between parallel measurement on the one hand, and a still acceptable number of measuring devices on the other.

[0015] Preferably, the conveying device is formed by a rotatably mounted drum, to whose radially outer surface the test units are attached. This allows the flat elements to be measured while they are moving along a circular path; this allows measurements to be performed particularly easily and efficiently during a conveying movement of the flat elements. In such a case, the testing device can also be referred to as a test drum.

[0016] It is further proposed that the test units each comprise a first and a second contact surface which are designed to electrically and / or signal-technically contact two electrodes of a planar element when the planar element rests against the test unit, wherein the test units each comprise a third contact surface for electrically and / or signal-technically contacting a separator of the planar element resting against the test unit.

[0017] This arrangement of the three contact surfaces of a test unit on the carrier advantageously allows the separators of a monocell to be tested separately from one another without having to remove the monocell from the test unit. The third contact surface thus serves as a temporary electrode assigned to the test device, by means of which an external separator of the planar element can be tested. The disclosure content of this application is also explicitly intended to include the proposed test device, including one or more planar elements, for example in the form of monocells, which are mounted in the test units.

[0018] Preferably, the contact surfaces are each formed by a metal sheet. In practice, it has proven advantageous to use metal sheets because they can be easily formed into the desired shape and, at the same time, provide a flat and thus gentle support for the conductor lugs. The metal sheets are preferably made of materials with very good electrical conductivity, such as copper, gold, silver, nickel, aluminum, or steel. It is also conceivable to use refined metal sheets, such as metal sheets with a nickel and / or gold coating.

[0019] The contact surfaces are preferably attached to the carrier by a material-to-material or form-fitting connection. An adhesive connection, for example, can be considered as a material-to-material connection. In the case of a form-fitting connection, this can be formed, for example, by a screw connection. It has proven advantageous to screw the corresponding screws to the contact surfaces from the side of the conveyor device; this ensures that the flat elements rest against the contact surface during the testing process without the disruptive influences of a screw connection. If the conveyor device is formed by a rotatably mounted drum, the contact surfaces are screwed to the carrier accordingly from the radial inside.

[0020] The carrier is preferably formed by a, preferably one-piece, removable carrier element, which is attached to the conveyor device by means of a fastening means. The fastening means is preferably formed by a fastening means that can be removed using a tool. Further preferably, the fastening means is formed by countersunk screws, so that the screw head does not protrude from the top side of the carrier element, to which the contact surfaces are also attached. A screw connection also offers the advantage that individual test units can be replaced with little effort as needed, for example in the event of damage or for maintenance measures. The test units thus form modules that can be replaced as a whole.The contact surfaces can be mounted on the carrier before the carrier is attached to the conveyor; this reduces the downtime of the test fixture during assembly or maintenance work.

[0021] The carrier is preferably formed by a dielectric structure, for example, the carrier is formed by a plastic part. Furthermore, for example, the carrier can be a cast part or a 3D-printed part.

[0022] If the conveyor device is formed by a drum, different geometries can be considered for the carrier: If the drum has a cylindrical outer surface, the carrier preferably has a concave surface with a radius corresponding to the drum on its underside facing the drum. If the outer surface has a plurality of flat surfaces, the carrier preferably has a flat surface on its underside facing the drum. Depending on the design of the contact surfaces, the upper side of the carrier facing the contact surfaces can be flat or convex. In a first embodiment, the surface of the contact surfaces is convex, so that the contact surface formed by a metal sheet is bent such that it lies flat on the convex upper side of the carrier. In this way, the side of the contact surface facing the flat element is also concave.In a second embodiment, the sheet metal forming the contact surface is thicker than in the first embodiment. It can thus lie flat on the flat upper side of the support. The concave shape of the side of the contact surface against which the flat element rests during operation can be created, for example, by machining. When reference is made in this application to convex or concave surfaces of the support or contact surface, this geometry refers to a corresponding sectional surface of the mounted supports or contact surfaces that runs orthogonally to a rotational axis of the drum.

[0023] As an alternative to the carrier being a removable support element, the carrier can also be formed by an adhesive layer. The adhesive layer then also has electrically insulating properties. The adhesive electrically insulates the contact surfaces from each other and from the conveyor system. Furthermore, the adhesive can be used to easily determine the alignment and arrangement of the contact surfaces of a test unit relative to each other.

[0024] It is further proposed that recesses be provided on the upper side of the carrier, which are designed to correspond in shape to the contact surfaces. These recesses ensure more reliable alignment of the contact surfaces.

[0025] The carrier preferably has a plurality of air ducts which fluidically connect an underside of the carrier with an upper side of the carrier. The air ducts can, for example, be connected to a line system of the conveyor device and can be subjected to a negative pressure via it. Preferably, at least one of the contact surfaces per test unit has at least one flow-through region which is operatively connected to at least one of the air ducts of the respective carrier. In this way, the flow-through region of the contact surfaces can also be subjected to a negative pressure so that the flat element to be tested is sucked towards the contact surfaces. Preferably, the flow cross-section of the air duct on the upper side of the carrier is smaller than the flow cross-section of the flow-through region of the contact surface which is operatively connected to it.In this way, the holding force acting on the flat elements due to the negative pressure can be distributed over a larger area, allowing for gentle contact with the flat element by the test unit. The smaller flow cross-sections of the air channels of the support element increase the stability of the support element and create sufficient space for fastening devices, both for attaching the support to the conveyor system and for attaching the contact surfaces to the support.

[0026] The flat elements, in particular the conductor flags, can be held particularly gently using negative pressure because grippers and / or clamps, which could damage the conductor flags, can be dispensed with. The flow-through area can be provided on the first, second and / or third contact surface. The flow-through area can be formed, for example, by one or more holding holes or by the pores of an air-permeable, porous material. Such a porous material can be produced, for example, by manufacturing the carrier using a 3D printing process; this is achieved, for example, by reducing the material density in the flow-through area. The porosity of the material must be selected such that the flat element can be sucked in.

[0027] Alternatively, it is also possible for the flat elements to be held to the test units by mechanical means, for example by belts or rollers.

[0028] The carrier preferably comprises at least one cable duct in which a cable that is electrically and / or signal-connected to one of the contact surfaces is guided. The cable duct enables predefined routing and storage of the cable so that potential interference can be reduced. The cable is preferably a coaxial cable with the following structure, from radially inside to radially outside: inner conductor, insulation, outer conductor, and protective sheath. The protective sheath preferably does not extend all the way to a soldering point through which the inner conductor is connected to the respective contact surface. By means of a screw, which is screwed to the carrier via its thread, the outer conductor can be pressed against a part of the conveyor device that is connected to ground in a section not covered by the protective sheath; this reduces interference.The contact surfaces are preferably connected to the inner conductor of the cable by means of a soldered connection. To reduce interference as much as possible, the outer conductor, which serves as shielding, preferably extends just before the soldering point. The length of the part of the cable not covered by an outer conductor is preferably less than 1 cm, more preferably less than 0.5 cm, and especially preferably less than 0.1 cm. Each contact surface is preferably connected to a separate cable; each cable is preferably also routed in its own cable duct of the respective carrier.

[0029] The previously proposed recesses, air ducts, and / or cable ducts of the support can be provided not only in the removable support element, but also when the support is formed by an adhesive layer. In such a case, the adhesive can, for example, be poured and / or distributed around designated negative molds. Alternatively, functional units, such as the cables or the contact surfaces, can also themselves form such a negative mold.

[0030] According to a further preferred embodiment, it is proposed that the test units are each configured to receive and transport a planar element. Preferably, the third contact surface simultaneously forms a transport support for the respective planar element or at least part of the transport support. The transport support thus simultaneously assumes both the function of transporting a planar element and the function of electrically or signal-technically connecting a separator of the transported planar element. If, for example, a planar element in the form of a monocell is transported in the test unit, the planar element to be tested preferably rests with one of its separators on the transport support of the respective test unit.The two electrodes of the planar element are then contacted by the first and second contact surfaces by means of the aforementioned conductor tabs, which protrude beyond the base area of ​​the separators.

[0031] According to a further preferred embodiment, a pure transport support can also be provided instead of the third contact surface. In this embodiment, the pure transport support is preferably made of an insulating material, for example to reduce stray capacitances during measurement using the first and second contact surfaces. Preferably, the pure transport support is formed by a surface section of the carrier provided for this purpose. In this way, the flat elements positioned in the test units can be transported by means of the conveyor device, wherein a test of the flat elements can be carried out during the transport process using the contact surfaces. To prevent the flat elements from slipping during transport, the previously described embodiment can be used, in which the contact surfaces can be subjected to negative pressure.

[0032] Preferably, the planar extent of the third contact surface corresponds to the area of ​​the electrodes of the respective planar element without their conductor tabs. Preferably, the planar extent of the third contact surface deviates from the planar extent of the electrodes by less than 100%, preferably less than 50%, more preferably less than 25%, in particular less than 10%. In this way, the third contact surface forms an electrode pair with the nearest electrode of the adjacent planar element, which provides measurement results suitable for quality testing.

[0033] As an alternative to inspection units that are configured to simultaneously receive and transport the planar elements, a transport system can also be provided, for example, for transporting planar elements along a conveyor path from a receiving point to a delivery point. The conveyor system is configured to bring one or more of its inspection units into contact with a planar element while it is being transported by the transport system, wherein contact between the respective inspection unit and the respective planar element is maintained along part of the conveyor path or the entire conveyor path. In this embodiment, the transport system carries out the conveying of the planar elements, while the inspection device carries out the inspection of the planar elements.The testing device is preferably designed to press the testing units with a predefined force against the flat elements transported by the transport system.

[0034] If the transport system consists of a transport drum on whose outer surface the flat elements are moved along a circular path, the conveyor device is configured to guide the test units along at least part of a corresponding circular path. This can be achieved, for example, by the conveyor device moving the test units along a crescent-shaped path that corresponds to the geometry of the transport drum.

[0035] Preferably, at least one measuring device is provided, wherein at least two of the contact surfaces of each of the test units can be connected to the at least one measuring device by means of a switching matrix.

[0036] If the test unit comprises at least two contact surfaces, at least one of the two separators of a monocell can be measured.

[0037] Preferably, the test units each comprise at least three contact surfaces, more preferably exactly three contact surfaces.

[0038] Preferably, the switching matrix is ​​configured to connect the at least two or three contact surfaces of one of the test units differently, so that measurements can be carried out by means of the at least one measuring device in a predetermined electrical circuit or in different electrical circuits.

[0039] The switching matrix in the sense of this application preferably comprises at least one input channel and at least one output channel, preferably a plurality of output channels, wherein the input channel(s) are advantageously interconnectable or interconnected with the output channel(s) in a predefined configuration.

[0040] By connecting the at least two contact surfaces of the test units to the output channels of the switching matrix, they can be interconnected with the at least one measuring device connected to the at least one input channel. In principle, it is also possible to connect the at least one measuring device to the switching matrix via two or more input channels.

[0041] Preferably, all contact surfaces of the test units are connected to the switching matrix on the output channel side. Furthermore, all measuring devices are preferably also connected to the switching matrix on the input channel side.

[0042] It goes without saying that the switching matrix can in principle comprise further input channels and / or further output channels that are not connected to the at least one measuring device or the contact surfaces. For example, further input channels can be provided via which a voltage source is connected to the switching matrix. At least two of the at least three contact surfaces of a test unit can preferably be connected to the measuring device at the same time. In this way, for example, conclusions can be drawn about the system state of the respective planar element based on the measurement of an impedance, an ohmic resistance or the electrical capacitance between two of the at least three contact surfaces. The ohmic resistance can be measured for direct current or as the inverse of the real part of the complex admittance for an alternating voltage, for example with a frequency of 1 kHz, 10 kHz or 1000 kHz.Capacitance can also be measured using alternating voltage. A breakdown measurement can be used, for example, to detect foreign bodies whose diameter or length is smaller than the layer thickness of the separator. For example, if the flat element to be tested is a mono-cell as described above, the electrical resistance between two electrodes can decrease if the separator arranged between these electrodes is damaged.

[0043] The at least three, preferably exactly three, contact surfaces per test unit enable a so-called 3-port measurement of the planar element arranged on the test unit. This has the advantage that the two separators of a monocell can be tested separately and / or together. Thus, not only the separator of the planar element arranged between the first and second electrodes can be tested, but also the outer separator, which is only contacted by an electrode of a neighboring planar element when the cell stack is formed. The corresponding measurements can be performed by intelligently interconnecting the contact surfaces with the at least one measuring device.

[0044] According to a preferred embodiment, multiple measuring devices are provided, with the switching matrix being configured to electrically and / or signal-wise interconnect individual or multiple contact surfaces of each of the test units with different measuring devices. This allows the flat elements to be connected to different measuring devices without being removed from the respective test unit, which allows for the measurement of different parameters in a particularly gentle way. For example, it is also possible to test flat elements that are attached to or mounted on different test units in parallel.

[0045] Preferably, the switching matrix is ​​configured to connect the first and second contact surfaces simultaneously to the same measuring device; to connect the first and third contact surfaces simultaneously to the same measuring device; and / or to connect the second and third contact surfaces simultaneously to the same measuring device. For example, if a planar element in the form of a monocell is connected to a test unit for testing, the three contact surfaces of a test unit contact the inserted planar element as follows:

[0046] The planar element rests on the third contact surface with a first separator; a first electrode adjacent to the first separator, for example in the form of an anode, rests with its conductor tab on the first contact surface; a second electrode separated from the first electrode by a second separator, for example in the form of a cathode, rests with its conductor tab on the second contact surface. If the first and second contact surfaces are simultaneously connected to the at least one measuring device, the second separator arranged between them can be tested.

[0047] If the first and third contact surfaces are connected to at least one measuring device at the same time, then the first separator arranged on the outside of the flat element can be tested.

[0048] If the second and third contact surfaces are connected to a measuring device simultaneously, the first and second separators can be tested simultaneously. Depending on the circuit configuration, the first and second separators are then arranged in a series or parallel circuit between the second and third contact surfaces.

[0049] These switching configurations, which can be adjusted using the switching matrix, enable comprehensive testing of the flat elements to be tested.

[0050] The switching matrix is ​​preferably designed to differently connect the three contact surfaces of each of the test units, so that measurements can be carried out using the at least one measuring device in different electrical circuits. The switching configuration can vary depending on whether, for example, the first or the second separator or both separators of a monocell are to be tested. In this way, a large number of measurements can be carried out on the planar element while it is applied to the test unit. By avoiding the transfer of the planar element to be tested to another testing device, the planar element can be measured in a particularly product-friendly manner. In particular, the extremely sensitive conductor tabs of the electrodes, which were already mentioned at the beginning, do not have to be contacted multiple times.For example, two or more contact surfaces of a test unit can be short-circuited together.

[0051] Preferably, the switching matrix is ​​configured to connect one or more of the contact surfaces of each of the test units to a voltage source and / or to ground. These types of connections enable additional switching configurations, thus expanding the measurement possibilities.

[0052] The switching matrix preferably comprises a plurality of relays for connecting the contact surfaces to one another and / or one or more of the contact surfaces to one or more measuring devices. The relays can be controlled or regulated, for example, by means of a control unit. Due to the large number of switching combinations, it has proven advantageous to operate the switching matrix with relays. The switching matrix and thus also the relays can, for example, be controlled based on the position of the conveyor device relative to the stationary part of the testing device. Of course, alternatively or additionally, further input parameters can be used to control or regulate the switching matrix or the relays. The switching of individual or more contact surfaces to ground and / or the connection to a voltage source is also preferably carried out using the relays.The main advantage of relays is their passive, galvanically isolated switching and their minimally invasive behavior with respect to changes in the measuring path. Furthermore, relays are capable of conducting both direct and alternating current; switching transistors have only limited capabilities in this regard. Furthermore, switching transistors significantly influence the measuring path.

[0053] Preferably, the switching matrix is ​​part of the conveyor system. This allows for efficient wiring on the conveyor system.

[0054] Furthermore, it is advantageous if the at least one measuring device is configured to measure an electrical capacitance and / or ohmic resistance, more generally the real and / or imaginary part of the electrical impedance, and / or to perform a breakdown measurement. By testing the planar elements by measuring the ohmic resistance and / or electrical capacitance, reliable conclusions can be drawn about the system state of the planar elements under test.

[0055] Preferably, the at least one measuring device is part of the stationary part of the testing device. Thus, the at least one measuring device does not need to be moved with the conveyor. This is particularly advantageous when the testing device comprises multiple measuring devices. Furthermore, the measuring devices can also be advantageously connected to the contact surfaces of different test units, thus requiring fewer measuring devices. In principle, however, it is also possible to integrate one or more of the measuring devices into the conveyor.

[0056] According to a further preferred embodiment, it is proposed that the electrical and / or signaling connection of the conveyor device to the stationary part be established by means of a sliding contact device. A sliding contact device has proven advantageous for electrically and / or signaling-related connection of the moving, for example, rotating, conveyor device to the stationary part of the testing device.

[0057] According to a second aspect of this application, a manufacturing method for producing a testing device is proposed to achieve the object, wherein in a method step a) metal sheets are provided with an excess size to form the contact surfaces; in a method step b) the metal sheets are fastened to the conveyor device by means of the carrier; and in a method step c) the metal sheets fastened to the conveyor device by means of the carrier are machined using a cutting tool. By means of the proposed method, in particular, the surface of the contact surfaces can be machined such that they have a predefined surface geometry. For example, by means of cutting, a metal sheet can also be subdivided such that separate contact surfaces of a testing unit are formed from it.Alternatively or additionally, the flow-through areas that can be subjected to negative pressure during operation can also be formed by machining, for example by drilling.

[0058] According to a third aspect of this application, the object is achieved by a method for testing planar elements intended to form a cell stack for the energy cell production industry. The planar elements are tested using a testing device as described above, with the planar elements to be tested each resting against the contact surfaces of one of the testing units. Preferably, the testing of the planar elements takes place during transport of the planar elements, i.e., while the conveyor device is moving relative to the stationary part of the testing device.

[0059] Further preferably, the detection of a damaged or inferior-quality flat element results in its removal from the manufacturing process. This can be done, for example, by the inspection device itself or, alternatively, by a separate device, such as an ejection drum.

[0060] Alternatively or additionally, it is also possible to use the testing device to record quality parameters of the flat elements for later use without necessarily removing them from the process. In this way, for example, the resulting cell stack can be classified into different quality classes.

[0061] With regard to the technical effects and advantages associated with the proposed method, reference is made to the preceding statements in connection with the test device.

[0062] The invention is explained below using preferred embodiments with reference to the accompanying figures.

[0063] Fig. 1 shows a testing device with a conveyor device in the form of a drum without its stationary part;

[0064] Fig. 2 shows a carrier with three contact surfaces; Fig. 3 shows a test unit with a flat element arranged thereon in a first cross-section orthogonal to a rotation axis of the drum;

[0065] Fig. 4 shows a testing unit with a flat element arranged thereon in a first cross section parallel to a rotation axis of the drum;

[0066] Fig. 5 three contact surfaces in a perspective view;

[0067] Fig. 6 shows a carrier in a perspective view with a view of its upper side;

[0068] Fig. 7 shows a carrier in a perspective view with a view of its underside;

[0069] Fig. 8 is a sectional view of a support with a cable laid therein;

[0070] Fig. 9 a view of the front of the conveyor including the cover;

[0071] Fig. 10 shows a first embodiment of a testing unit with a carrier that can be releasably attached to the conveyor device;

[0072] Fig. 11 shows a second embodiment of a testing unit with a support that can be releasably attached to the conveyor; Fig. 12 shows a view of the front side of the conveyor without a cover;

[0073] Fig. 13 is a sectional view of the test device with a first variant of the cabling;

[0074] Fig. 14 is a perspective view of the test device with a second variant of the cabling;

[0075] Fig. 15 is a perspective view of a conveyor device with glued contact surfaces;

[0076] Fig. 16 a sectional view of a conveyor device with glued contact surfaces; and

[0077] Fig. 17 shows another embodiment of the testing device.

[0078] Figure 1 shows a testing device 1 without its stationary part 5, which is illustrated in Figure 13. The testing device 1 comprises a conveyor device 3, which is formed by a drum mounted for rotation about a rotation axis 32. Twelve flat surfaces are provided on a circumferential surface 25 of the conveyor device 3, with a carrier 9 being attached to only every third of these flat surfaces; one of the carriers 9 is hidden in the perspective shown. The fact that not every flat surface is occupied by a carrier 9 serves to improve illustration; in principle, a carrier 9 is attached to all twelve flat surfaces of the conveyor device 3. In principle, the conveyor device can have any number of receiving surfaces for the carriers, whereby for the purpose of parallelization, which will be explained in more detail below, a number that is divisible by three or four is particularly suitable.It can also be seen that a first and a second contact surface 6 and 7, as well as a third contact surface 8 arranged between them, are provided on each of the supports 9. Each support 9 and the contact surfaces 6, 7, and 8 arranged thereon form a modular unit in the form of a test unit 4, which will be explained below with reference to Figure 2. It can also be seen that a switching matrix 26 is provided on one end face of the conveyor device 3, which serves to connect the contact surfaces 6, 7, and 8 to measuring devices 27 (see Figure 13).

[0079] Figure 2 shows the modular unit comprising support 9 and the contact surfaces 6, 7, and 8 arranged thereon. In this exemplary embodiment, the contact surfaces 6, 7, and 8 are glued to the support 9, so that they are positioned in a predefined alignment and arrangement relative to one another by the support 9. Furthermore, through-openings 33 are provided, via which the support 9 can be fastened to the flat surfaces of the conveyor device 3 by means of countersunk screws (not shown). Furthermore, it can be seen that an underside 15 of the support 9 has a flat surface, so that it lies flat against the likewise flat surface of the outer surface 25 of the conveyor device 3 (see Figure 1).

[0080] An upper side 14 of the carrier 9 has a convex curvature, against which the contact surfaces 6, 7, and 8 also rest flat. The contact surfaces 6, 7, and 8, formed from metal sheets, can be adapted to the convex geometry of the carrier 9 and glued thereto without great effort.

[0081] In this embodiment, the carrier 9 is made of an electrically non-conductive plastic. Alternatively, the carrier 9 can also be made of other non-conductive materials. This ensures that the contact surfaces 6, 7, 8 are mounted in an electrically insulated manner from each other and from the conveyor device 3.

[0082] Furthermore, air channels 19 can be seen, which interact with a permeable region 20 of the contact surfaces. The reference numerals of the air channels 19 in Figure 3 are provided only as an example on the third contact surface 8; the first and second contact surfaces 6 and 7 also have a permeable region 20 that is operatively connected to an air channel 19. In this way, the permeable regions 20 of the contact surfaces 6, 7, and 8 can be subjected to a negative pressure, so that a flat element 2 to be tested (see Figures 3 and 4) is sucked onto the contact surfaces 6, 7, and 8.

[0083] Figure 3 shows a schematic sectional view of a flat element 2 arranged on the test unit 4, wherein the section is arranged in a plane orthogonal to the rotation axis 32 (cf. Figure 1) of the conveyor device 3.

[0084] The planar element 2 shown in Figures 3 and 4 has the following layer structure from bottom to top: first separator 10 - first electrode 11 - second separator 12 - second electrode 13. In this embodiment, the first electrode 11 is formed by an anode, and the second electrode 13 by a cathode. In principle, however, the first electrode 11 can also be formed by a cathode and the second electrode 13 by an anode.

[0085] The sectional view in Figure 3 shows one of the test units 4 from Figure 1. In the sectional view shown in Figure 3, it can be seen that the third contact surface 8 is supported by the carrier 9. Since the carrier 9 is made of an electrically non-conductive material, the third contact surface 8 is mounted in an electrically insulated manner with respect to the conveyor device 3. The planar element 2 rests with the first separator 10 on the third contact surface 8, which simultaneously forms a suitable transport support for the planar element 2. It can also be seen that the planar extent of the third contact surface 8 essentially coincides with the base area of ​​the first and second electrodes 11 and 13, without taking into account the conductor lugs 34 and 35 (see Figure 4) not shown here.In this way, the third contact surface 8, together with the first electrode 11 arranged above the first separator 10, can form an electrode pair suitable for testing the first separator 10 arranged therebetween. The first electrode 11 is then contacted by its conductor tab 34 resting against the first contact surface 6.

[0086] Furthermore, Figure 3 shows that the first electrode 11 is followed by the second separator 12 and the second electrode 13. Thus, the first electrode 11 and the second electrode 13 also form an electrode pair suitable for testing the second separator 12 arranged between them.

[0087] Figure 4 shows a further sectional view of the flat element 2 arranged on the test unit 4, wherein the section runs in a plane parallel to the rotation axis 32 (cf. Figure 1) of the conveyor device 3. In this view, it can be seen that the first electrode 11 contacts the first contact surface 6 via its conductor tab 34. Furthermore, it can be seen that the second electrode 13 contacts the second contact surface 7 via its conductor tab 35. To prevent the conductor tabs 34, 35 from bending, the contact surfaces 6, 7 can have a correspondingly adjusted height in the radial direction; the height of the first contact surface 6 is thus lower in the radial direction than the height of the second contact surface 7.

[0088] Figure 5 shows the contact surfaces 6, 7, 8 without the carrier 9. It can be seen that these are formed by metal sheets, for example, made of copper, gold, silver, nickel, aluminum, or steel; furthermore, metal sheets with a coating of nickel and / or gold are also conceivable.

[0089] Figure 6 shows the carrier 9 without the contact surfaces 6, 7, and 8 applied thereto. At the locations where the contact surfaces 6, 7, and 8 of Figure 5 are arranged, recesses 16, 17, and 18 are provided on the upper side 14 of the carrier 9, which correspond to the planar extent of the contact surfaces 6, 7, and 8. The recess 16 serves to position and align the first contact surface 6; the recess 17 serves to position and align the second contact surface 7; the recess 18 serves to position and align the third contact surface 8. The carrier 9 shown in Figure 6 is formed from a one-piece plastic part; such a plastic carrier can, for example, be a cast part or a 3D-printed part. Furthermore, it can be seen in Figure 6 that four of the air channels 19, which are in operative connection with the third contact surface 8, meet the upper side 14 at the groove base of a groove 36.In this way, four of the air ducts 19 can be fluidically connected to one another before they merge into the flow-through regions 20 of the third contact surface 8 (see Figure 5). Figure 7 shows the underside 14 of the support 9, along which the cable ducts 21 run. A first cable duct 21a is configured to guide a cable 22 (see Figures 12 and 13) from an end face 37 of the support 9 to the first contact surface 6, a second cable duct 21b to the second contact surface 7, and a third cable duct 21c to the third contact surface 8 (see Figure 2). The cable ducts 21a, 21b and 21c are open on the underside 15 and are closed by the attachment of the support 9 to the conveyor device 3 through the outer surface 25 of the conveyor device 3 (see Figure 1). Furthermore, it can be seen that the air ducts 19 meet the flat underside 15 of the support 9.These can be subjected to negative pressure via the line system 23 (see Figure 13) of the conveyor device 3 provided for this purpose.

[0090] Figure 8 shows a schematic cross-section through the carrier 9 in a plane parallel to the axis of rotation 32 of the conveyor device 3; see Figure 1. This view shows the cable 22 laid in the cable duct 21c, which is connected to the third contact surface 8. The cable 22 is designed as a coaxial cable: an inner conductor 40 runs radially inward and is soldered to the third contact surface 8. This is followed by an outer conductor 42 serving as a shield, which is separated from the inner conductor 40 by insulation 41. A protective sheath 38 follows radially outward. The cable 22 runs parallel to the axis of rotation 32 (see Figure 1) in the duct 21c until it meets the soldering point at a right angle, i.e., in this case, in the radial direction with respect to the axis of rotation 32. The protective sheath 38 extends until just before the right-angled change in direction, so that in a section of the cable 22, the outer conductor 42 is exposed.By means of a front end 43 of a ground contact screw 39, which is screwed into the carrier 9 by its thread, the outer conductor 42 is pressed against the electrically conductive conveyor device 3 to establish a defined ground contact. The cables 22 leading to the first and second contact surfaces 6 and 7 are laid in the carrier 9 in the same way.

[0091] Figure 9 shows a front view of the conveyor device 3 with the supports 9 mounted thereon. As in Figure 1, only every third support 9 is mounted on the conveyor device 3. It can also be seen that the cable ducts 21 are also closed on the underside 15 of the support 9 by mounting the supports 9 on the conveyor device 3. Furthermore, a cover 44 is provided, which covers the front side of the switching matrix 26 (see Figure 12).

[0092] Figures 10 and 11 show two alternatives to the bonding of contact surfaces 6, 7, and 8 to the carrier 9 shown in Figure 2. In the embodiments of Figures 10 and 11, the contact surfaces 6, 7, and 8 can be individually attached to the carrier 9 using detachable screw connections. This principle is explained below in Figures 10 and 11 using the third contact surface 8; however, the attachment of the first and second contact surfaces 6 and 7 to the carrier 9 can be carried out in an analogous manner.

[0093] Figures 10 and 11 show a flat section of the outer surface 25 of the conveyor device 3 designed as a drum, as already shown in Figure 1. The contact surface 8 can be screwed to the carrier 9 by means of a screw (not shown) which is screwed in from the radial inside. For this purpose, blind holes 58 are provided which completely penetrate the carrier 9 and whose blind hole lies in the third contact surface 8. An internal thread 60, into which the screw (not shown) engages, is arranged in the third contact surface 8. The blind hole 58 has a corresponding countersunk diameter in the carrier, so that the screw head of the countersunk screw (not shown) is completely countersunk in the carrier 9 when screwed in. The top side of the contact surface 8 is not affected by the screwing from the radial inside.The contact surface 8 is screwed to the carrier 9 before the carrier 9 is mounted on the conveyor device 3.

[0094] In the embodiment according to Figure 10, the carrier 9 is attached to the conveyor device 3 by means of a blind hole 57 that completely penetrates both the contact surface 8 and the carrier 9. The blind hole base and an internal thread 62 are arranged in the conveyor device 3. Furthermore, the blind hole 57 has a countersunk bore diameter so that a screw (not shown) does not protrude from the third contact surface 8 in the assembled state, which could lead to damage to the flat element 2 mounted thereon.

[0095] In the embodiment according to Figure 11, the unit comprising contact surfaces 6, 7, and 8 (only contact surface 8 is visible in this plane) is attached to the conveyor device 3 from the radial inside by means of a screw connection. A corresponding blind hole 59 completely penetrates the conveyor device 3, while a blind hole and an internal thread 61 are arranged in the carrier 9. A corresponding countersunk diameter is provided so that a screw head of a screw (not shown) does not protrude from the hole.

[0096] The holes described here do not necessarily have to be produced by machining. Figure 12 shows the electrical and signaling connection of the contact surfaces 6, 7 and 8 of the test units 4 to the switching matrix 26, which in turn is electrically and signaling-connected to measuring devices 27 (see Figure 13). The switching matrix 26 comprises a plurality of relays that are designed to connect the cables 22 to the cables of an input channel cable set 49. In principle, it is possible to use a switching matrix 26 to connect a flat element 2 resting on a specific test unit 4 (see Figures 3 and 4) to any measuring device 27 (see Figure 13). In practice, however, it has proven useful to connect the test units 4 to measuring devices 27 in parallel. This means that a plurality of measuring devices 27 is provided, with each test unit 4 always being assigned the same measuring devices 27.

[0097] Through parallelization, the time available for testing the flat element 2 can be extended. In the embodiment shown in Figure 12, exactly 12 test units 4 are provided on the conveyor system 3.

[0098] If no parallelization were provided, the flat element 2 located in a test unit 4 could only be tested over an angular section of 360712=30°; only a correspondingly short time period would be available.

[0099] With a parallelization factor of 2, the test units 4 would be alternately assigned to a first set of measuring devices 27-A1 and 27-B1, and the second half of the test units would be assigned to a second set of measuring devices 27-A2 and 27-B2. The measuring devices with the letter "A", in this case measuring devices 27-A1 and 27-A2, are designed to measure capacitance. The measuring devices with the letter "B", in this case 27-B1 and 27-B2, are designed to measure ohmic resistance and perform a breakdown measurement. With a parallelization factor of 2, the flat element 2 located in a test unit 4 can be tested over an angular section of (360712)*2=60°; thus, twice the time period is available compared to the previously described case, assuming an identical rotation speed of the conveyor device 3.

[0100] A parallelization with a factor of 3 will now be described in detail using Figures 12 and 13.

[0101] First, Figure 13 shows that, in accordance with the parallelization by a factor of 3, the switching matrix 26 is divided into three electronic units 46, 47, and 48. By means of cables 22, the contact surfaces 6, 7, and 8 of the test units 4-1, 4-4, 4-7, and 4-10 are connected to the first electronic unit 46, via which a connection to the measuring devices 27-A1 and 27-B1 is possible. For example, any two of the three contact surfaces 6, 7, and 8 of a test unit 4 can be connected in pairs to a measuring device 27, so that both separators 10 and 12 of the corresponding planar element 2 (cf. Figures 3 and 4) can be tested.

[0102] Not shown in Figure 12 is the wiring of contact surfaces 6, 7, and 8 of test units 4-2, 4-5, 4-8, and 4-11 to the second electronic unit 47, which connects to measuring devices 27-A2 and 27-B2 (see also Figure 13). Also not shown in Figure 3 is the wiring of contact surfaces 6, 7, and 8 of test units 4-3, 4-6, 4-9, and 4-12 to the third electronic unit 48, which connects to measuring devices 27-A3 and 27-B3 (see also Figure 13).

[0103] For parallelization with a factor of 3, a total of six measuring devices 27-A1 to 27-B3 are required, because different measuring device types (identification letters "A" and "B") are required for measuring capacitance, resistance, and breakdown. Such parallelization makes it possible to test the flat element 2, located in a test unit 4, over an angular section of (360 12)*3=90°. In practice, parallelization with a factor of 3 has proven advantageous because it offers an ideal compromise between a still acceptable number of relatively expensive measuring devices 27-A1 to 27-B3 on the one hand and a sufficiently large measuring section of 90° and the resulting available measuring time on the other.

[0104] Of course, parallelizations by a factor of 4 or 6 are also possible. Due to the divisibility of the number 12 by the values ​​2, 3, 4, and 6, there are basically four possibilities for parallelization.

[0105] In principle, of course, regardless of the parallelization factor, it is possible to add one or more additional measuring device types in order to carry out corresponding measurements.

[0106] The three electronic units 46, 47, and 48 of the switching matrix 26 are mounted on the front side of the drum-shaped conveyor 3. This places the switching matrix 26 relatively close to the test units 4, allowing for better measurement results. Furthermore, the switching matrix 26 is easier to install.

[0107] In the embodiment shown in Figure 12, the 12*3=36 cables 22 are connected to the output channels 53 of the switching matrix 26, which are arranged radially outward relative to the rotation axis 32. The connection to the measuring devices 27-A1 to 27-B3 can then be established via radially inward input channels 52. The input channels 52 and the output channels 53 are interconnected via communication lines and can be interconnected as desired using relays. The input and output channels 52 and 53 each include a coaxial connector for connecting corresponding coaxial cables, for example, SMA screw connectors.

[0108] It goes without saying that the switching matrix 26 can, in principle, be connected to additional lines. For example, with a line used for grounding or switching individual or multiple contact surfaces 6, 7, and / or 8 to ground, or with a control line for controlling the switching matrix 26.

[0109] Figure 13 shows a sectional view of the test device 1, showing the electrical and / or signaling connection of the contact surfaces 6, 7, and 8 of the test units 4 to the measuring devices 27. The cables 22 extending from the test units 4 are connected to the output channels 53 of the switching matrix 26, which is connected in a rotationally fixed manner to the conveyor device 3. Starting from the input channels 52 of the switching matrix 26, an input cable set 49 runs into the interior of the conveyor device 3, which is designed as a drum, as far as a sliding contact device 50 formed by a slip ring. The sliding contact device 50 is located, for example, on a co-rotating hollow shaft 24 inside the drum. In an alternative embodiment, the sliding contact ring can also be mounted outside the shaft 24, for example, on the side of a cover, for example in the area of ​​the stator 55 in Figure 14.In the area of ​​the input channels 52, the input cable set 49 is guided through the hollow shaft 24 and connected via the sliding contact device 50 in the form of a slip ring to a measuring cable set 51 assigned to the stationary part 5 of the test device 1. The measuring cable set 51 is then connected to the measuring devices 27-A1 to 27-B3, which are components of the stationary part 5 of the test device 1.

[0110] The input cable set 49 and the measuring cable set 51 include, in addition to signal cables that can be directly connected to the cables 22, also data and voltage supply cables that are also connected to the switching matrix 26.

[0111] The test device 1 thus comprises three cable sets: A first cable set comprises the cables 22, which connect the contact surfaces 6, 7, and 8 of the test devices 4 to the output channels 53 of the switching matrix 26. An input cable set 49, which is assigned to the rotatable conveyor device 3, connects the input channels 52 of the switching matrix 26 to the sliding contact device 50. The measuring cable set 51, which is assigned to the stationary part 5 of the test unit 4, connects the sliding contact device 50 to the measuring devices 27 or to other devices, such as a control unit or a voltage source. Furthermore, Figure 13 shows the line system 23 of the conveyor device 3, via which the test units 4 can also be subjected to negative pressure.It goes without saying that the line system 23 is designed to apply negative pressure to only a part of the testing devices 4 depending on the angle of rotation of the conveyor device 3 relative to the stationary part 5, so that the flat elements 2 are only sucked onto the contact surfaces 6, 7 and 8 of the testing devices 4 in a specific section (see also Figures 3 and 4).

[0112] Figure 14 shows an alternative embodiment for the cabling compared to the embodiment shown in Figure 13. Otherwise, the test device 1 of Figure 14 is identical to the test device 1 according to Figure 13. In the embodiment according to Figure 14, the input cable set 49 is not led into the interior of the conveyor device 3 designed as a drum, but is connected to a rotor 54, which is arranged in the center of a ring-shaped circuit board of a switching matrix 26. A sliding contact device 50 is used to connect to a stator 55, from which a measuring cable set 51 is connected to the measuring devices 27-A1 to 27-B3. The sliding contact device 50 and the measuring devices 27-A1 to 27-B3 are arranged in front of the front side of the conveyor device 3 in this embodiment.

[0113] Figure 15 shows an embodiment of the testing device 1 in which the carrier 9 is not formed by a removable carrier element, but by an adhesive layer. Here, too, three contact surfaces 6, 7, and 8 are provided per testing unit 4.

[0114] Figure 16 shows the embodiment from Figure 15 in a sectional view, with the section also running orthogonally to a rotation axis. The third contact surfaces 8 visible in this view are each held on the conveyor device 3 by a carrier 9 in the form of an adhesive. Since the adhesive has electrically insulating properties, the contact surfaces 6, 7, and 8 are also electrically insulated from the conveyor device 3 and from each other in this embodiment.

[0115] This embodiment allows subsequent machining of the contact surfaces 6, 7 and 8, so that the contact surfaces 6, 7 and 8 have an ideal roundness, forming partial sections of an imaginary cylindrical surface. In this embodiment, the contact surfaces 6, 7 and 8 shown in Figure 15 are provided in a process step a) in the form of metal sheets with an excess. Subsequently, in a process step b), the metal sheets are fastened to the conveyor device 3 by means of the adhesive carrier 9. The adhesive can be applied separately for each test unit 4 or for each contact surface 6, 7 and 8; alternatively, the adhesive can also be applied first to all test units 4, so that the contact surfaces 6, 7 and 8 can then be placed thereon.In a process step c), the metal sheets fastened to the conveyor device 3 by means of the carrier 9 are then machined by a cutting tool so that the surface of the contact surfaces 6, 7, 8 has the desired geometry. The contact surfaces 6, 7, 8 and the conveyor device 3 can thus easily be manufactured from different metallic materials. Bores for the fluidic connection of the contact surfaces 6, 7 and 8 to the line system 23 of the conveyor device 3 (see Figure 13) can also be subsequently introduced. Of course, machining of the contact surfaces 6, 7 and 8 can also take place if the carrier 9 is formed by a removable carrier element, as shown in Figures 1, 2 and 6-14.

[0116] Figure 17 shows an alternative embodiment in which the planar elements 2 are transported by means of a separate transport system 28 along a conveyor path 29 from a receiving point 30 to a delivery point 31. At the receiving point 30, the planar elements 2 are picked up by a first transport drum 45 and delivered to a delivery point 31 to a second transport drum 56. The conveyor system 3 is configured to contact several of its testing units 4 with the planar elements 2 conveyed by the transport system 28 with a defined pressure while the latter are being transported. The first, exposed separator 10 (see Figures 3 and 4) points in the direction of the testing system 4. Accordingly, the planar elements 2 rest on the transport system 28 with the outer electrode 13.In this embodiment, contact between the respective test unit 4 and the respective flat element 2 is maintained almost along the entire conveyor path 29. For this purpose, the conveyor device 3 moves the test units 4 in a crescent shape around the transport system 28 by means of a continuous track, with the smaller crescent radius, i.e. the inner radius, surrounding a portion of the transport system 28. In this embodiment, the transport system 28 is designed purely as a transport drum, in which the flat elements 2 are held on the outer surface by the effect of a negative pressure. Alternatively, however, it is also possible for the transport system 28 itself to be designed as a test drum, so that the tests of this test drum and the tests performed by the test units 4 of the conveyor device 3 complement each other.

[0117] In another possible embodiment, the conveying device 3 serves only to press the flat elements 2 together, as an alternative or in addition to suction by means of negative pressure, and then does not necessarily have to perform a measurement itself. This has the advantage of a more constant pressure for a reproducible measurement.

[0118] List of reference symbols:

[0119] 1 test device

[0120] 2 flat element

[0121] 3 Conveyor system

[0122] 4 Test unit

[0123] 5 Stationary part

[0124] 6 First contact surface

[0125] 7 Second contact surface

[0126] 8 Third contact surface

[0127] 9 carriers

[0128] 10 Separator

[0129] 11 Electrode

[0130] 12 Separator

[0131] 13 Electrode

[0132] 14 Top of the carrier

[0133] 15 Underside of the carrier

[0134] 16 First recess

[0135] 17 Second recess

[0136] 18 Third recess

[0137] 19 Air duct

[0138] 20 Flow-through area

[0139] 21 cable duct

[0140] 22 cables

[0141] 23 Pipeline system

[0142] 24 hollow shaft

[0143] 25 lateral surface

[0144] 26 Switch matrix

[0145] 27 measuring device

[0146] 28 Transport system

[0147] 29 Support path 30 Reception point

[0148] 31 drop-off point

[0149] 32 rotation axis

[0150] 33 passage opening

[0151] 34 arrester flags

[0152] 35 arrester flags

[0153] 36 grooves

[0154] 37 Front side (of the beam)

[0155] 38 protective sheath

[0156] 39 Ground contact screw

[0157] 40 inner conductors

[0158] 41 Isolation

[0159] 42 outer conductors

[0160] 43 Front side (of the ground contact screw)

[0161] 44 Cover

[0162] 45 First transport drum

[0163] 46 First electronic unit

[0164] 47 Second electronics unit

[0165] 48 Third electronic unit

[0166] 49 Input cable set

[0167] 50 sliding contact device

[0168] 51 measuring cable set

[0169] 52 input channels

[0170] 53 output channels

[0171] 54 Rotor

[0172] 55 Stator

[0173] 56 Second transport drum

[0174] 57 Blind hole drilling

[0175] 58 Blind hole drilling

[0176] 59 Blind hole drilling

[0177] 60 internal thread 61 internal thread

[0178] 62 internal thread

Claims

Claims:

1. Testing device (1) for the energy cell manufacturing industry, wherein the testing device (1) is configured to test planar elements (2) suitable for forming a cell stack, wherein - the test device (1) comprises several test units (4) which are movable relative to a stationary part (5) of the test device (1) by means of a conveying device (3), wherein - the test units (4) each comprise at least two contact surfaces (6, 7, 8) for electrical and / or signal-related contacting of a planar element (2) to be tested, wherein - the test units (4) each comprise a carrier (9) with electrically insulating properties, by which the contact surfaces (6, 7, 8) of the respective test unit (4) are mounted in a predefined position and orientation relative to each other, wherein - the carriers (9) of the test units (4) are attached to the conveying device (3).

2. Test device (1) according to claim 1 , characterized in that - the conveying device (3) is formed by a rotatably mounted drum, to the radially outer surface (25) of which the test units (4) are attached.

3. Test device (1) according to one of the preceding claims, characterized in that - the test units (4) each comprise a first and a second contact surface (6, 7) which are configured to measure two to electrically and / or signal-technically contact electrodes (11, 13) of a planar element (2) when the planar element (2) is in contact with the test unit (4), wherein - the test units (4) each comprise a third contact surface (8) for electrically and / or signal-relatedly contacting a separator (10) of the planar element (2) adjoining the test unit (4). Test device (1) according to one of the preceding claims, characterized in that - the contact surfaces (6, 7, 8) are each formed by a metal sheet. Test device (1) according to one of the preceding claims, characterized in that - the contact surfaces (6, 7, 8) are attached to the carrier (9) by a material-bonded or form-fit connection. Test device (1) according to one of the preceding claims, characterized in that - the support (9) is formed by a, preferably one-piece, demountable support element, which is attached to the conveying device (3) by means of a fastening means. Test device (1) according to one of claims 1 to 5, characterized in that - the carrier (9) is formed by an adhesive layer. Test device (1) according to one of the preceding claims, characterized in that - on one upper surface (14) of the carrier (9) recesses (16, 17, 18) are provided, which are designed to correspond in shape to the contact surfaces (6, 7, 8). Test device (1) according to one of the preceding claims, characterized in that - the support (9) has several air channels (19) which fluidically connect a lower side (15) of the support (9) with a top side (14) of the support (9). Test device (1) according to claim 9, characterized in that - at least one of the contact surfaces (6, 7, 8) per test unit has at least one flowable area (20) which is in operative communication with at least one of the air channels (19) of the respective carrier (9). Test device (1) according to one of the preceding claims, characterized in that - the support (9) comprises at least one cable duct (21) in which a cable (22), which is electrically and / or signal-wise connected to one of the contact surfaces (6, 7, 8), is guided. Test device (1) according to one of the preceding claims, characterized in that - the test units (4) are each configured to receive and transport a planar element (2). Test device (1) according to one of claims 1 to 11, characterized in that - a transport system (28) for transporting flat surfaces elements (2) along a conveying path (29) from a receiving point (30) to a delivery point (31) are provided, wherein - the conveying device (3) is configured to bring one or more of its test units (4) into contact with a planar element (2) while it is being transported by the transport system (28), wherein - the contact between the respective test unit (4) and the respective planar element (2) along a part of the conveying path (29) or the entire conveying path (29) is maintained.

14. Test device (1) according to one of the preceding claims, characterized in that - at least one measuring device (27) is provided, wherein - at least two of the contact surfaces (6, 7, 8) of each of the test units (4) can be connected to the at least one measuring instrument (27) by means of a switching matrix (26).

15. Test device (1) according to claim 14, characterized in that - several measuring instruments (27) are provided, wherein - the switching matrix (26) is designed to electrically and / or signal-technically connect one or more of the contact surfaces (6, 7, 8) of each of the test units (4) with different measuring instruments (27).

16. Test device (1) according to claim 14 or 15 with reference to claim 3, characterized in that - the switching matrix (26) is set up for this purpose, - the first and second contact surfaces (6, 7) simultaneously with to connect to the same measuring instrument (27); - to connect the first and third contact surfaces (6, 8) simultaneously to the same measuring device (27); and / or - to connect the second and third contact surfaces (7, 8) simultaneously to the same measuring device (27).

17. Test device (1) according to one of claims 14 to 16, characterized in that - the switching matrix (26) is configured to connect the three contact surfaces (6, 7, 8) of each of the test units (4) differently, so that measurements can be carried out using the at least one measuring device (27) in different electrical circuits.

18. Test device (1) according to one of claims 14 to 17, characterized in that - that at least one measuring instrument (27) is equipped for measuring the real part and / or the imaginary part of the impedance, for example the electrical capacitance and / or the ohmic resistance, and / or for performing a breakdown measurement.

19. Manufacturing method for producing a test device (1) according to one of the preceding claims, characterized in that - in a process step a) to form the contact surfaces (6, 7, 8) metal sheets with an excess are provided; - in process step b) the metal sheets are attached to the conveying device (3) by means of the supports (9); wherein - in a process step c) the by means of the carrier (9) to The metal sheets attached to the conveyor device (3) are machined by a cutting tool. Testing method for testing planar elements (2) intended for forming a cell stack for the energy cell manufacturing industry, characterized in that the planar elements (2) are tested using a test device (1) according to one of claims 1 to 18, wherein the planar elements (2) to be tested are each in contact with the contact surfaces (6, 7, 8) of one of the test units (4).

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