Multi-element system for eddy current control of cells in a blower disc

Abstract

Multi-element system for eddy current control of cells in a blower disc. One aspect of the invention relates to an eddy current control device (20) for a cavity in a mechanical part made of electrically conductive material, the cavity opening on one side of said part and comprising an internal surface, the device being adapted to fit at least partially into the cavity, the device comprising a plurality of probes (22) mounted on a support (21), each probe of the plurality of probes being geometrically shaped to at least a portion of the internal surface, and each probe comprising a plurality of coils (23) adapted to be in contact with the portion of the internal surface. Figure to be published with the abbreviation: Figure 2

Description

Title of the invention: Multi-element system for eddy current control of cells in a blower disc. TECHNICAL FIELD OF THE INVENTION

[0001] The technical field of the invention is that of non-destructive testing of parts, particularly in aeronautics.

[0002] In particular, the invention relates to an eddy current control device for a cavity in a mechanical part made of electrically conductive material. TECHNOLOGICAL BACKGROUND OF THE INVENTION

[0003] In aeronautics, the inspection of the condition of cavities, such as the fan disk recesses machined by broaching and used to hold the blades, is conventionally carried out using non-destructive testing approaches. In particular, eddy current (EC) probes are known to be used to detect defects in these cavities. The drawback of these devices is that they do not allow for the inspection of the entire cavity within a reasonable acquisition time while maintaining a high measurement resolution for evaluating, typically, defects on the order of centimeters in size. Furthermore, it is not always possible to precisely quantify the dimensions of defects in these cavities.

[0004] Indeed, due to the complexity of the cavity wall geometry, CF sensors do not allow for the inspection of every part of the cavity, particularly the curved sections of the alveoli, along their entire length in a single acquisition. The probe used is a single-element probe that must be moved several times within the cavity, each time to inspect a different portion of said cavity along its entire length. Moreover, these commonly used probes require calibration, using a reference piece, at each movement to inspect another part of the cavity, typically another curved section.

[0005] Consequently, the time required to acquire signals via the probe across all cavities of a part can reach several hours. These acquisition times are therefore incompatible with a production or maintenance environment, or in the case of processing in workshops.

[0006] Furthermore, since these types of probes require operator intervention to position them from one portion to another, their use generates significant measurement uncertainties due to the operator's intervention. In addition, because the operator must move the probe several times per cavity, typically for each curved section of a socket, the risk of overlooking the inspection of a portion of the cavity is high.

[0007] There is therefore a need to improve CF control of cavities, such as alveoli. Summary of the invention

[0008] The invention offers a solution to the problems mentioned above, by allowing, via a suitable device, the simultaneous inspection of several parts of the internal wall of a cavity.

[0009] One aspect of the invention thus relates to an eddy current control device for a cavity of a mechanical part made of electrically conductive material, the cavity opening on one side of said part and comprising an internal surface, the device being adapted to fit at least partially into the cavity, the device comprising a plurality of probes mounted on a support, each probe of the plurality of probes being geometrically shaped to a part of the internal surface, and each probe comprising a plurality of coils adapted to be in contact with the part of the internal surface.

[0010] The term "cavity" refers to a hollow with a regular geometry machined in the workpiece. This cavity may have a narrow and elongated cross-section, for example, a hole machined by broaching.

[0011] The term “opening” means that the cavity is open on one end of the part being inspected.

[0012] By "geometrically conformed" we mean that the external geometry of a probe is adapted to cooperate with that of the afferent part of the internal surface. There is therefore a coincidence between the shape of the probe and the shape of the portion in question.

[0013] The term "in contact" means that the air gap is zero between the internal surface of the cell and each coil.

[0014] Thanks to this device, it is possible to inspect several parts of a cavity in a mechanical part made of electrically conductive material, for example a metal part, in a single acquisition, in order to detect and characterize defects. This has the advantage of reducing the acquisition time required to inspect the entire cavity, and therefore all the cavities of the part, if applicable. The sensor calibration time is also reduced since the probes can be calibrated simultaneously and no longer successively, as with conventionally used devices.

[0015] Such a device also makes it possible to reduce the sensitivity of the measurement to the human factor, that is to say, to reduce the measurement uncertainty related to the intervention of an operator. "Measurement uncertainty" is understood to be an approximation error in the acquired data due to a set of experimental parameters affecting the accuracy of the measurement.

[0016] Furthermore, this device minimizes the risk of incorrect probe placement since these probes are specifically designed to inspect the relevant part of the component. Therefore, in the case of a cavity with a complex geometry, the risk of mispositioning the probes is significantly reduced. In other words, the positioning of this device has a high degree of repeatability.

[0017] Finally, the use of multi-element eddy current probes, i.e. having several coils, makes it possible to reduce the number of passes and improve the measurement resolution.

[0018] In addition to the characteristics just mentioned, the device according to the invention may have one or more complementary characteristics from among the following, considered individually or according to all technically possible combinations.

[0019] In one embodiment, the portion of the internal surface extends in a longitudinal direction of the cavity.

[0020] The term "longitudinal direction" refers to the direction of the largest dimension of the cavity. In the case of a cavity, this is the direction parallel to the curved parts, in this case parallel to the generatrices, that is to say parallel to the direction of machining of the cavity.

[0021] In one embodiment, each probe of the plurality of probes is mounted on the support via a retaining element, the retaining element being capable of holding each probe in contact with the portion of the surface to which said probe is conformed.

[0022] The contact of the probes with the wall of the cavity is made and maintained by a mechanism adapted for this maintenance, throughout the control and movement of the device in the cavity.

[0023] In one embodiment, the retaining element is a spring or a cylinder.

[0024] In one embodiment, the plurality of coils of each probe is arranged in several parallel rows, each reel in each row of the plurality of rows being spaced a predetermined distance from the adjacent reels within said row, and the reels of two adjacent rows are arranged in a staggered pattern.

[0025] The staggered arrangement increases the measurement resolution and improves the detection and characterization of defects along the cavity wall.

[0026] In one embodiment, the predefined distance is between 0.5 mm and 2 mm.

[0027] Such a distance between the different coils of the same probe makes it possible to achieve a precision on the order of the millimeter, for example between 0.5 and 2 mm, for the detection, localization and characterization of defects.

[0028] In one embodiment, the plurality of coils of each probe of the plurality of probes is arranged in three parallel rows, each row comprising five coils.

[0029] The use of three rows of coils makes it possible to maintain a resolution on the order of the millimeter, thanks to measurement redundancy induced by the proximity of the coils, even if one or two of these coils malfunction or stop working.

[0030] In one embodiment, each probe of the plurality of probes is made of a flexible material.

[0031] The use of a flexible material ensures that the probe geometry conforms to the corresponding part of the inner wall, even in the event of a crevice in said wall or a deviation in the wall geometry where probe conformity could not be guaranteed. Furthermore, it is possible to eliminate the need for a retaining device with probes made of flexible material, since, in this case, the probes can be pressed into the cavity. The natural elasticity of the probe material would then ensure that the probe coils remain in contact with the inner wall of the cavity.

[0032] In one embodiment, the part is a rotating element of a motor, and the cavity is a socket.

[0033] In one embodiment, the cavity is of the dovetail type, and each part of the internal surface is a curved part of the internal wall extending along the longitudinal axis.

[0034] It is therefore possible to use such a device to control fan disk cells of aircraft engines such as the CFM56 and LEAP engines.

[0035] Another aspect of the invention relates to an eddy current control system for a cavity in a part, the system comprising the device and a manipulator adapted to insert and move the device in the cavity.

[0036] Thanks to this system, it is possible to automatically move the device for insertion and guide it throughout the cavity. The manipulator thus provides better guidance of the probes than the current solution for passage through the cavity. The manipulator can be adapted to be inserted at least partially into the cavity.

[0037] In one embodiment, the system further includes an analysis module configured to detect an acquisition error by one of the coils of the plurality of coils of one of the probes of the plurality of probes, and to issue an indication relating to the detected acquisition error.

[0038] It is thus possible to indicate to the operator that a measurement error has occurred. The operator can then repeat the corresponding measurement, possibly correcting the source of the error to complete the cavity check.

[0039] In one embodiment, the cavity is open throughout the part, and the part is raised on one or more wedges, the wedges being adapted to guide the device out of the cavity.

[0040] It is therefore possible to inspect the cavity along its entire length without having to turn the part over during the inspection. The shims are thus manufactured in such a way as to guide the device until it exits the cavity.

[0041] The invention and its various applications will be better understood by reading the following description and examining the accompanying figures. BRIEF DESCRIPTION OF THE FIGURES

[0042] Other features and advantages of the invention will become apparent from the description, which can be read in conjunction with the figures. These figures are provided for illustrative purposes only and are not intended to limit the scope of the invention.

[0043] Fig. 1 represents a dovetail alveolus-type cavity.

[0044] Fig. 2 represents an eddy current control device according to one embodiment.

[0045] Fig. 3 represents a view from below of the device according to Fig. 2.

[0046] Fig. 4 represents an eddy current control device according to another embodiment.

[0047] Fig. 5 represents the control device of Fig. 4 from a different viewpoint.

[0048] Fig. 6 represents the control device of Fig. 4 from a different angle.

[0049] Fig. 7 schematically represents a system comprising the device according to one embodiment.

[0050] Fig. 8 is a schematic illustration of a display of data acquired via a device according to one embodiment of the invention.

[0051] Figure 9 represents another embodiment of the device according to the invention.

[0052] Fig. 10 represents an embodiment of a manipulator for controlling the movement of the device according to Fig. 9.

[0053] Fig. 11 represents a standard part for calibrating the control device according to the invention. DETAILED DESCRIPTION

[0054] The invention relates to an eddy current (EC) testing device adapted for inspecting the internal surface of a cavity machined in a mechanical part made of an electrically conductive material, such as a metal part. The cavity opens on one side of the part. The invention is advantageously suited for inspecting narrow and elongated cavities, that is to say, those with a dimension significantly larger, along a longitudinal direction, than a section of the cavity along a transverse direction, and whose internal geometry is regular, as is the case for alveoli.

[0055] By "regular geometry" we mean that the geometry of the cavity does not include abrupt variations in relation to the dimensions of the cavity, in particular along the longitudinal direction, typically the depth, of the cavity.

[0056] The use of the device according to the invention is illustrated below for the inspection of cavities in a rotating element of an engine, more particularly in a fan disc of an aircraft turbomachine. It may be noted that this device can advantageously be used for other types of cavities besides cavities.

[0057] In order to reduce the acquisition times of CF inspection methods classically used in industry, the proposed device allows several parts of the cavity to be inspected simultaneously, thus avoiding having to reposition the probe used in several places.

[0058] By way of illustration of the problem solved by the invention, the cavity 10 in [Fig. 1] is a dovetail-type cavity 10, schematically simplified. This type of cavity is typically machined on the fan discs in aircraft engines, for example in the CFM56 series engines, such as the CFM56-5B, CFM56-2, and LEAP engines, such as the LEAP1A / 1C + LEAP-1B. Inspecting the various curved sections 11 of the cavity, four in number in the example, requires, using conventional methods, placing a CF probe in contact with the inner wall 12 of the cavity in one of the zones A, B, C, or D, each zone corresponding to one of the curved sections 11, moving the probe along the longitudinal direction of the cavity, and then repeating the inspection for one of the other zones. In contrast, the device according to the invention eliminates these constraints.

[0059] As illustrated in [Fig. 2], the device 20 includes a support 21. This support is used to assemble several probes 22 together. The probes of the plurality of probes are therefore mounted on the support, either directly or via a retaining element, which is described later.

[0060] The device 20 is adapted to be inserted into the cavity 10, at least partially. In other words, the support 21 and the probes 22 are adapted to be inserted, at least partially, into the cavity 10. The device 20, and therefore its components, are also adapted to be moved within the cavity 10 after insertion. The movement is, for example, a sliding or translation of the device 20 within the cavity 10, along its longitudinal direction.

[0061] Each probe 22 is adapted to conform geometrically to a portion of the inner wall 12 of the cavity 10. That is to say, the geometry of the probe coincides with the geometry of the portion of the internal surface 12 to be inspected. In the case of a cavity, the inspection may focus on checking its curved portions 11. Each of the probes is therefore geometrically shaped to one of the curved portions 11 corresponding to one of the zones A, B, C or D. The different portions of the internal surface to be inspected each extend along the longitudinal direction of the cavity.

[0062] In other words, to inspect the four curved parts 11 of the alveolus 10 shown schematically in [Fig.1], the device 20 comprises four probes 22, each having a geometry adapted to coincide with or fit the geometry of the curved part 11 in one of the relevant zones A, B, C or D.

[0063] The probes 22 are also of a sufficiently compact shape to allow the assembly of several probes 22 on the support 21 while ensuring that these probes can be inserted into the cavity 10 and moved along their afferent part of the internal surface 12.

[0064] Each probe 22 of the plurality of probes 22 comprises coils 23, forming a plurality of coils 23. Each probe 22 is therefore a multi-element probe 22. The coils are assembled to be in contact with the internal surface 12 to be inspected. The coils are thus arranged according to the geometry of the probe to fit the portion of the internal surface 12 that they serve to inspect. The coils are, for example, assembled on the external surface of the probes 22.

[0065] In order to achieve a resolution of between 0.5 mm and 2 mm for the control, for example 1 mm, it is possible to arrange the coils 23 on each probe 22 so as to form rows, for example parallel rows. Each row may comprise the same number of coils 23 or a different number of coils 23.

[0066] Within the same row, adjacent coils can be separated by the same predefined distance, for example, between 0.5 mm and 2 mm, such that 1 mm is equal to 1 mm. In other words, each coil in a row is separated from its adjacent coil(s) in the same row by the predefined distance. Therefore, there is a gap equal to the predefined distance between two adjacent coils in the same row of a probe. The predefined distance can be the same for each row.

[0067] A coil is adjacent to another within the same row when there is no other coil between these two coils within said row. An adjacent coil is therefore a coil directly next to the coil in question. An adjacent coil is thus the coil that precedes or follows the coil in question in the coil row.

[0068] It is also possible for the coils of two adjacent rows to be staggered. This results in an offset of each row relative to the other rows along the axis of alignment of the coils within a row. This offset can be, for example, equal to half the predefined distance. In this case, assuming that the rows of reels are all spaced, along an axis perpendicular to the axis of alignment of the reels on a row, by the same distance, each reel is arranged at an equidistance from the two nearest reels of each adjacent row (therefore from the 4 nearest reels located on the two adjacent rows).

[0069] A row is adjacent to another when there is no other row between these two rows. An adjacent row is therefore a row directly adjacent to the row in question. An adjacent row is thus the row that precedes or follows the row in question in the plurality of rows.

[0070] The term "coil alignment axis" means the axis along which the coils are aligned in the same row.

[0071] In one embodiment, the distance between the two nearest coils in two adjacent rows is between 0.5 mm and 2 mm. For example, this distance may be equal to the predefined distance. Thus, there is the same spacing between adjacent coils in the same row and the nearest coils in different rows. Therefore, in this particular embodiment, each coil of a probe is spaced by the predefined distance from all its neighboring coils, whether they are in the same row or a different row.

[0072] By way of example, each probe comprises three rows of five coils.

[0073] On each probe, the coils can be placed at any location on its external surface that is in contact with the portion of the internal surface of the cavity. For example, the coils are located in a central part of the probe, situated between the first third and the second third of the probe's height.

[0074] The coils have, for example, a diameter greater than or equal to 0.5 mm, for example greater than or equal to 1 mm.

[0075] To power the coils, each probe may include a power supply circuit (not shown) inside said probe. The power supply circuit may include a set of cables and / or an electronic board configured to control the coils in transmit and receive and to transfer the measured magnetic field to an analysis module.

[0076] In one embodiment, the power supply circuit transmits the magnetic field measured by each coil to an output cable 26, which is used to connect the circuit of a probe to an analysis module. The output cables 26 are gathered by a housing 25 to form a harness 27 comprising the plurality of output cables 26. The housing 25 can be assembled to the support 21 and thus be integral with the device 20, or be included in a system comprising said device 20. The output cables 26 are also adapted to supply the power supply circuit, in each probe, to power the corresponding coils.

[0077] In one embodiment, the support 21 is partially inserted into the cavity. In other words, only the portion of the support onto which the probes 22 are mounted is inserted into the cavity. For example, in the case of a socket, the support 21 is not fully inserted into the cavity; indeed, a portion protrudes from the socket through the opening 13 of the socket 10. This allows the support to be held manually or by means of a dedicated module in order to move the device 20 along the cavity. For example, the support 21 comprises a front portion 24a that is inserted into the cavity with the probes 22, and a rear portion 24b that is not inserted into the cavity, typically because it protrudes from the socket through its opening.

[0078] In one embodiment, each of the probes 22 is mounted on the support via the retaining element 24, as illustrated in [Fig. 3]. The retaining element 24 is, for example, a spring or a jack and serves to hold each of the probes 22, and therefore the coils 23 it comprises, in contact with the portion of the internal surface to which said probe 22 is conformed. The retaining element thus exerts a compressive force on the probes 22 by bearing against the support 21 to obtain an air gap of zero thickness. The spring can be any type of spring mechanism, for example, a helical spring, a metal spring, a leaf spring, etc.

[0079] Furthermore, the retaining element, such as the spring or the cylinder, can be used to retract the probes 23 onto the support 22, i.e., to reduce the distance between the support and the probes in order to facilitate the insertion of the device into the cavity. Once the device is inserted into the cavity, the retaining element can perform its function of forcibly holding the probes in contact with the inner wall.

[0080] Each retaining element 24 is therefore located between the related probe 22 and the support 21. Furthermore, each retaining element can be located at the height of the coils of said probe, that is to say, be located between the first third and the second third of the height of said probe.

[0081] In one embodiment, one or more of the probes in the plurality of probes are made of an elastically deformable material, for example, a plastic sheet. "Flexible" means a material that deforms elastically under the effect of an external stress or force, commonly known in the prior art. The use of such a material eliminates the need for a retaining element to hold the probes in contact with the inner wall. This effect is achieved by the elastic nature of the material, which is then forced into the cavity to take advantage of its elasticity. However, the retaining element can also be used in this embodiment to, for example, facilitate insertion of the device into the cavity and / or improve control.

[0082] In one embodiment, as illustrated in Figures 4 to 6, which represent different viewpoints of the device 10, each probe 22 of the device 20 includes an end 22a, which is curved from the outer surface of the probe towards the support 21. Such a shape makes it easier to insert and slide the device 20 into the cavity.

[0083] In the example proposed, a probe is also assembled on the support, in particular on the front part 24a, in order to inspect the bottom of the cell.

[0084] In one embodiment, the cavity is open on both sides of the part. The part can then be raised on one or more supports. The geometry of these supports is such that they are adapted to guide the device out of the cavity. In other words, the supports are manufactured to maintain the continuity of the cavity geometry outside the part in order to guide the device as it exits, while ensuring that the contact provided by the retaining element and / or the flexible material of the probes is maintained until it exits the cavity.

[0085] Another aspect of the invention relates to an eddy current control system 30 for the cavity of the part, as illustrated in [Fig. 7]. The system 30 comprises the device 20, as described above, and a manipulator 31. The manipulator 31 serves to automatically insert and move the device 20 within the cavity 10 throughout the acquisition. The manipulator is also adapted to move the device 20 to another cavity 10 to perform the acquisition there. The manipulator 31 and the device 20 are assembled via an assembly element 32, for example, which is adapted to be fixed onto a fixing element 21c of the support 21.

[0086] The system may also include an analysis module 33, such as the one mentioned above. The analysis module 33 is configured to collect the data measured by the probes. It therefore includes instructions, for example in memory, that allow the acquisition and analysis of the data generated by the probe coils when these instructions are implemented, for example, by a processor. This analysis module may include a multiplexer, known per se, for collecting the data generated by the coils.

[0087] The analysis module can also be configured to control the movement of the device by driving the manipulator or by sending movement commands to it. The analysis module therefore also includes instructions for performing this movement and / or generating these movement commands. To this end, the analysis module or the manipulator may include an encoder, known per se, configured to determine the position of the manipulator and / or the device relative to the workpiece. The encoder also makes it possible to associate each measured data point with a position on the workpiece and thus to automatically and precisely locate the position of a defect in the inspected cavity. Alternatively, the encoder is in the system 30 but is external to the analysis module 33 and the manipulator 32.

[0088] The analysis module can also be configured to detect an acquisition error by one of the coils. That is, it can detect that a coil is not working or is malfunctioning, for example, because no data from that coil is being received by the analysis module. The analysis module can then be configured to issue an indication, for example, an alert, to indicate that an acquisition error has occurred or has occurred. The analysis module can therefore include instructions for implementing the detection of the acquisition error and the issuance of the associated indication.

[0089] The analysis module 33 may also include a storage memory configured to retain the acquired data and, optionally, the device positions associated with each data point relative to the part. This improves the traceability of the checks.

[0090] The system 30 may also include a display module, for example a screen, comprising a plurality of pixels. This display module is, for example, included in the analysis module 33. The analysis module can then also be configured to transmit data to be displayed on the display module. The display on the display module can be implemented so as to present the acquired data, as illustrated in [Fig. 8]. In this case, the display can be subdivided into a plurality of portions, each associated with one of the probes 22 of the device 20. In this embodiment, the device comprises four probes whose corresponding display portions are numbered from 1 to 4. Each portion is itself subdivided into a plurality of lines, each line corresponding to several pixels of the display module. Furthermore, each line corresponds to one of the coils of the probe associated with the portion comprising said line.The time axis indicates the different times at which data was acquired via the probe coils. Thus, each pixel on each line corresponds to one of the data points measured by the corresponding coil at a given time. The display on the display module can be updated in real time, allowing for the detection of an acquisition error by the absence of data in one of the lines. Furthermore, the display allows for easy identification and characterization of the presence of a defect. For example, the detection and characterization of a defect 42 of the infinite slot type or defects 41 of the notch type can be performed by reading the display. The display can also include an indication to show the location within the cavity of the part corresponding to each pixel. It is then possible to determine the position of the defect within the cavity.In addition, a portion 43 of the display, comprising several pixels thereof, may correspond to a moment during the acquisition when the device has left the cavity and indicates that there is no more data. acquired. This portion therefore indicates the end of the cavity inspection and that another cavity can be inspected.

[0091] Figure 9 shows another embodiment of the device 20. Figures 9(a), 9(b), and 9(c) present the device 20 from three different viewpoints. This allows for an appreciation of the compactness of the device 20 and the conformity of the probes 23 to the geometry of the curved parts of a blower disc cavity. In this embodiment, the retaining element 24 is a thin arm, i.e., one with a thickness between 1 mm and 2 mm, forming a bend from the support 21 to the probe 22, which it assembles to said support 21. The retaining element 24 is, for example, a metal spring or a leaf spring, known per se. The housing 25 for collecting the output cables 26 is mounted on the support 21 to be at a distance from the probes 22.

[0092] Figure 10 shows another embodiment of the manipulator 31. The support 21, on which the probes 22 are assembled, is mounted on the manipulator 31. In particular, the support 21 and the housing 25 are mounted on a sliding element 31a of the manipulator. This sliding element 31a is the part of the manipulator adapted to insert the device 20 into the cavity 10. In this case, the manipulator 31 shown in Figure 10 is adapted to be placed in contact with an upper part of the workpiece, so that the sliding element can slide in or along the cavity, for example, by means of a rail or guide of the manipulator into which the sliding element is inserted. The sliding element and the rail or guide may have a straight or non-straight shape, for example, curved, in order to adopt a movement path corresponding to the geometry of the cavity. The manipulator shown in the [Fig.

[10] is, for example, suitable for inspecting the cells of a blower disc which have a predefined radius of curvature in the thickness of the part.

[0093] In one embodiment, a standard part 100, as illustrated in [Fig. 11], can be used to calibrate the probe coils on reference cavities 10, for example, recesses, comprising known and calibrated defects at various locations on the internal walls of these cavities, for example, infinite slot defects 14 or notches 15. The device according to the invention is then inserted and moved into one or more of these cavities 10 in order to calibrate the probes before and / or after acquisition on the inspected part. The advantage of such a device is that the calibration is performed in a single pass of the device in the reference cavity, and not once per curved section as is conventionally done.

[0094] By way of illustration, the device 10 according to the invention was used to inspect 24 cells of a blower disc of a CFM56 engine. The total acquisition time to inspect all the curved parts of the cells was approximately 30 minutes. With a conventionally used sensor, the acquisition time is, comparatively, about 6 hours.

Claims

Demands

1. Eddy current control device (20) of a cavity (10) of a mechanical part made of electrically conductive material, the cavity (10) opening on one side of said part and comprising an internal surface (12), the device (20) being adapted to fit at least partially into the cavity (10), the device (20) comprising a plurality of probes (22) mounted on a support (21), each probe (22) of the plurality of probes (22) being geometrically shaped to a part of the internal surface (12), and each probe (22) comprising a plurality of coils (23) adapted to be in contact with the part of the internal surface (12).

2. Device (20) according to claim 1, wherein the portion of the internal surface (12) extends in a longitudinal direction of the cavity (10).

3. Device (20) according to any one of the preceding claims, wherein each probe (22) of the plurality of probes (22) is mounted on the support (21) via a retaining element (24), the retaining element (24) being capable of holding each probe (22) in contact with the portion of the surface to which said probe (22) is conformed.

4. Device (20) according to claim 3, wherein the retaining element (24) is a spring or a cylinder.

5. Device (20) according to any one of the preceding claims, wherein the plurality of coils (23) of each probe (22) is arranged in several parallel rows, each coil (23) of each row of the plurality of rows being spaced a predetermined distance apart from the adjacent coils (23) within said row, and wherein the coils (23) of two adjacent rows are arranged in a staggered pattern.

6. Device (20) according to any one of the preceding claims, wherein each probe (22) of the plurality of probes (22) is made of a flexible material.

7. Eddy current control system (30) of a cavity (10) of a part, the system (30) comprising the device (20) according to any one of the preceding claims and a manipulator (31) adapted to insert and move the device (20) in the cavity (10).

8. System (30) according to the preceding claim, further comprising an analysis module (33) configured to detect an acquisition error by one of the coils (23) of the plurality of coils (23) of one of the probes (22) of the plurality of probes (22), and to issue an indication relating to the detected acquisition error.

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