Method and apparatus for separating overlapping peaks of spectral confocal thin-film thickness measurement signal

GB202511050D0Pending Publication Date: 2025-08-20HUAZHONG UNIV OF SCI & TECH
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Patent Information

Application Number
GB2025011050
Authority / Receiving Office
GB · GB
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-08-05
Filing Date
2025-07-09
Publication Date
2025-08-20
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