probe
JP1812938SActive Publication Date: 2025-11-17MESOSCOPE TECHNOLOGY CO LTD
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Patent Information
- Application Number
- JP2024021275D
- Authority / Receiving Office
- JP · JP
- Patent Type
- Designs
- Current Assignee / Owner
- Priority Date
- 2024-08-02
- Filing Date
- 2024-10-11
- Publication Date
- 2025-11-17
- Estimated Expiration
- 2049-10-11
Smart Images
Figure 0001812938000001 
Figure 0001812938000002 
Figure 0001812938000003
Abstract
The article in the present design (hereinafter referred to as "the article") is a probe used to inspect electronic components such as semiconductor wafers, semiconductor chips, and semiconductor elements, and to measure electrical properties such as the presence or absence of conductivity on circuit boards and resistance values.
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