Inspection machine

JP1819859SActive Publication Date: 2026-02-25CHROMA ATE INC
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Patent Information

Application Number
JP2025018221D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Priority Date
2025-03-18
Filing Date
2025-09-10
Publication Date
2026-02-25
Estimated Expiration
2050-09-10

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Abstract

The article is an inspection machine for inspecting semiconductor wafers.
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