Control device and control method for power supply device

A control device in power supply systems equalizes the lifespan of parallel-connected devices by adjusting output voltage based on temperature-derived life consumption rates, addressing uneven wear and tear.

JP2024176762APending Publication Date: 2024-12-19SHINDENGEN ELECTRIC MANUFACTURING CO LTD
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Patent Information

Application Number
JP2023095547
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-06-09
Publication Date
2024-12-19

AI Technical Summary

Technical Problem

In power supply systems where multiple devices are connected in parallel, an imbalance in current output can lead to uneven temperature distribution, causing accelerated deterioration of components like electrolytic capacitors and reducing the lifespan of specific power supplies.

Method used

A control device that acquires temperature information and calculates a life consumption rate for each power supply device, adjusting the output voltage based on this rate to equalize the lifespan of multiple devices.

Benefits of technology

The solution effectively equalizes the lifespan of power supply devices connected in parallel, reducing the rate of component deterioration and extending the overall system life.

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Abstract

To provide a control device and a control method for a power supply device that make equal the lives of a plurality of power supply devices connected in parallel.SOLUTION: In a power supply system 1000, a control device for a power supply device makes equal the lives of a plurality of power supply devices connected in parallel by controlling output voltages from the power supply devices, and includes: an acquisition unit that acquires temperature information related to the temperature of electronic components mounted in the power supply devices; a calculation unit that calculates a life consumption rate related to the lives of the electronic components on the basis of the temperature information; and an output voltage control unit that controls the output voltages from the power supply devices on the basis of the life consumption rate and an output voltage indication value set in advance.SELECTED DRAWING: Figure 1
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Description

[Technical field]

[0001] The present disclosure relates to a control device and a control method for a power supply device. [Background technology]

[0002] Patent Document 1 discloses a technique for predicting the life of an electrolytic capacitor. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2020-5342 A Summary of the Invention [Problem to be solved by the invention]

[0004] There are power supply systems in which multiple power supplies are connected in parallel and output current to a load. In such a power supply system, if a specific power supply output current is biased toward one particular power supply, the internal temperature of that power supply will rise compared to the other power supplies, and the deterioration of parts with limited life spans, such as electrolytic capacitors, will occur more quickly than in the other power supplies. In this case, the life of one particular power supply among the multiple power supplies connected in parallel may be shortened.

[0005] An object of the present disclosure is to provide a control device and a power supply device control method that can equalize the lives of multiple power supply devices connected in parallel. [Means for solving the problem]

[0006] A control device of one embodiment of the present disclosure includes an acquisition unit that acquires temperature information related to the temperature of an electronic component mounted in a power supply device, a calculation unit that calculates a life consumption rate related to the life of the electronic component based on the temperature information, and an output voltage control unit that controls the output voltage of the power supply device based on a predetermined output voltage instruction value and the life consumption rate.

[0007] In the control device of the present disclosure, the output voltage control unit controls the output voltage of the power supply device based on the life consumption rate and a droop setting value that is set in accordance with the life consumption rate.

[0008] In the control device of the present disclosure, the acquisition unit acquires the temperature information at a predetermined sampling period, and the calculation unit calculates a lifespan reduction rate of the electronic component per sampling period and calculates the lifespan consumption rate based on a result of integrating the lifespan reduction rate over time.

[0009] In the control device of the present disclosure, the output voltage control unit reduces the output voltage of the power supply device as the life consumption rate increases.

[0010] In the control device of the present disclosure, the electronic component is an electrolytic capacitor.

[0011] A method for controlling a power supply device according to one embodiment of the present disclosure includes the steps of acquiring temperature information relating to the temperatures of electronic components mounted in the power supply device, calculating a lifetime consumption rate relating to the lifetime of the electronic components based on the temperature information, and controlling an output voltage of the power supply device based on the lifetime consumption rate. Effect of the Invention

[0012] According to the present disclosure, it is possible to equalize the lives of multiple power supply devices connected in parallel. [Brief description of the drawings]

[0013] [Figure 1] FIG. 1 is a diagram illustrating an example of the configuration of a power supply system according to an embodiment. [Diagram 2] FIG. 2 is a block diagram illustrating an example of the configuration of the control device according to the embodiment. [Diagram 3] FIG. 3 is a flowchart showing the life consumption rate calculation process according to the embodiment. [Figure 4]FIG. 4 is a diagram for explaining a calculation result of a life consumption rate according to a first example of the embodiment. [Diagram 5] FIG. 5 is a diagram for explaining a calculation result of a life consumption rate according to a second example of the embodiment. [Figure 6] FIG. 6 is a diagram for explaining a calculation result of a life consumption rate in the third example according to the embodiment. [Figure 7] FIG. 7 is a flowchart showing a control process of the output voltage of the power supply device according to the embodiment. [Figure 8] FIG. 8 is a diagram for explaining a method for controlling the output voltage according to the embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0014] Hereinafter, an embodiment of the present disclosure will be described in detail with reference to the accompanying drawings. Note that the present disclosure is not limited to this embodiment, and in the following embodiments, the same components are designated by the same reference numerals, and duplicated descriptions will be omitted.

[0015] [Embodiment] (Power System) An example of the configuration of a power supply system according to an embodiment will be described with reference to Fig. 1. Fig. 1 is a diagram showing an example of the configuration of a power supply system according to an embodiment.

[0016] 1, the power supply system 1000 includes a power supply device 100a, a power supply device 100b, and a power supply device 100c. The power supply devices 100a, 100b, and 100c are connected in parallel. The power supply devices 100a to 100c are each configured to output a current to a load 200.

[0017] The power supply device 100a includes a control device 110a, a memory device 120a, and a sensor 130a.

[0018] The control device 110a controls the power supply device 100a. The control device 110a includes, for example, a digital signal processor (DSP), a central processing unit (CPU), and a micro processing unit (MPU).

[0019] The storage device 120a stores various data and programs. For example, the storage device 120a stores temperature information indicating the temperature around a limited-life part mounted in the power supply device 100a detected by the sensor 130a. The storage device 120a is composed of semiconductor memory and the like, and at least a part of the storage device 120a is composed of non-volatile memory so that necessary data is retained even when the power supply device 100a is turned off.

[0020] The sensor 130a is a temperature sensor that detects the temperature inside the power supply device 100a. The sensor 130a detects, for example, the temperature around a limited-life part such as an electrolytic capacitor mounted in the power supply device 100a.

[0021] The power supply device 100b includes a control device 110b, a memory device 120b, and a sensor 130b.

[0022] The control device 110b controls the power supply device 100b. The control device 110b includes, for example, a DSP, a CPU, and an MPU.

[0023] The storage device 120b stores various data and programs. For example, the storage device 120b stores temperature information indicating the temperature around a limited-life part mounted on the power supply device 100b detected by the sensor 130b. The storage device 120b is composed of semiconductor memory and the like, and at least a part of the storage device 120b is composed of non-volatile memory so that necessary data is retained even when the power supply device 100b is turned off.

[0024] The sensor 130b is a temperature sensor that detects the temperature inside the power supply device 100b. The sensor 130b detects, for example, the temperature around a limited-life part such as an electrolytic capacitor mounted in the power supply device 100b.

[0025] The power supply device 100c includes a control device 110c, a memory device 120c, and a sensor 130c.

[0026] The control device 110c controls the power supply device 100c. The control device 110c includes, for example, a DSP, a CPU, and an MPU.

[0027] The storage device 120c stores various data and programs. For example, the storage device 120c stores temperature information indicating the temperature around a limited-life part mounted on the power supply device 100c detected by the sensor 130c. The storage device 120c is composed of a semiconductor memory or the like, and at least a part of the storage device 120c is composed of a non-volatile memory so that necessary data is retained even when the power supply device 100c is turned off.

[0028] The sensor 130c is a temperature sensor that detects the temperature inside the power supply device 100c. The sensor 130c detects the temperature of a limited-life component such as an electrolytic capacitor mounted in the power supply device 100c, for example.

[0029] That is, power supply device 100a to power supply device 100c are each controlled independently. When there is no need to distinguish power supply device 100a from power supply device 100c, they are collectively referred to as power supply device 100. When there is no need to distinguish control device 110a from control device 110c, they are collectively referred to as control device 110. When there is no need to distinguish storage device 120a from storage device 120c, they are collectively referred to as storage device 120. When there is no need to distinguish sensor 130a from sensor 130c, they are collectively referred to as sensor 130.

[0030] The first terminal 1a is an output terminal that outputs an output current. The second terminal 2a is electrically connected to a reference potential. The reference potential is, for example, but not limited to, the ground. An output voltage V1 is applied between the first terminal 1a and the second terminal 2a. The power supply device 100a outputs an output current Io1 from the first terminal 1a to the load 200. The path between the power supply device 100a and the load 200 has a wiring resistance R1.

[0031] The first terminal 1b is an output terminal that outputs an output current. The second terminal 2b is electrically connected to a reference potential. An output voltage V2 is applied between the first terminal 1b and the second terminal 2b. The power supply device 100b outputs an output current Io2 from the first terminal 1b to the load 200. The path between the power supply device 100b and the load 200 has a wiring resistance R2.

[0032] The first terminal 1c is an output terminal that outputs an output current. The second terminal 2c is electrically connected to a reference potential. An output voltage V3 is applied between the first terminal 1c and the second terminal 2c. The power supply device 100c outputs an output current Io3 from the first terminal 1c to the load 200. The path between the power supply device 100c and the load 200 has a wiring resistance R3.

[0033] In the power supply system 1000, the power supply device 100a and the power supply device 100c share the output current to the load 200. In the example shown in FIG. 1, a current of Io1+Io2+Io3 flows through the load 200. Here, the current flowing through the load 200 also varies due to the variation in the output voltage V3 from the output voltage V1 and the variation in the wiring resistance R3 from the wiring resistance R1. In such a case, in the past, for example, only the power supply device 100a always outputs an output current to the load 200, and when the output current to be output to the load 200 is insufficient, the power supply device 100b or the power supply device 100c outputs an output current to the load 200. For this reason, the temperature inside the power supply device 100a rises compared to the power supply devices 100b and 100c, and the deterioration of life-span parts such as electrolytic capacitors mounted on the power supply device 100a is accelerated.

[0034] Generally, the life of the power supply device 100 depends on the life of the electrolytic capacitor, so "life of the electrolytic capacitor ≒ life of the power supply device 100". The life of the electrolytic capacitor is highly temperature-dependent, since according to Arrhenius' law, a drop of 10°C can double the life. Therefore, if the internal temperature of a specific power supply device 100a rises compared to the power supply devices 100b and 100c, the life of the power supply device 100a will be shorter than the power supply devices 100b and 100c. Therefore, in the present disclosure, each power supply device calculates the life consumption rate of the life parts and performs control according to the life consumption rate to equalize the lifespans of multiple power supplies connected in parallel.

[0035] (Control device) A configuration example of the control device according to the embodiment will be described with reference to Fig. 2. Fig. 2 is a block diagram showing a configuration example of the control device according to the embodiment.

[0036] As shown in FIG. 2, the control device 110 includes an acquisition unit 111, a calculation unit 112, and an output voltage control unit 113.

[0037] The acquisition unit 111 controls the sensor 130 to detect the internal temperature of the power supply device 100. For example, the acquisition unit 111 controls the sensor 130 to detect the temperature around a limited-life component (electronic component) such as an electrolytic capacitor mounted inside the power supply device 100. The acquisition unit 111 acquires temperature information indicating the temperature detected by the sensor 130 from the sensor 130. Specifically, the acquisition unit 111 acquires the temperature information from the sensor 130 at every predetermined sampling period. The acquisition unit 111 stores the acquired temperature information in the storage device 120.

[0038] The calculation unit 112 calculates a life consumption rate related to the life of the electronic component based on the temperature information acquired by the acquisition unit 111. The calculation unit 112 will be described in detail later.

[0039] The output voltage control unit 113 controls the output voltage of the power supply device 100 based on a preset output voltage command value and the life consumption rate calculated by the calculation unit 112. The output voltage control unit 113 will be described in detail later.

[0040] (Life consumption rate calculation process) A process for calculating a life consumption rate according to an embodiment will be described with reference to Fig. 3. Fig. 3 is a flowchart showing the process for calculating a life consumption rate according to an embodiment.

[0041] The acquiring unit 111 acquires temperature information indicating the temperature of the life-limited part from the sensor 130 at each predetermined sampling period (step S100), and then proceeds to step S102.

[0042] The calculation unit 112 calculates the lifetime consumption for each sampling period based on the temperature information acquired by the acquisition unit 111 (step S102). Specifically, the calculation unit 112 calculates the lifetime consumption for each sampling period according to the following formula (1).

[0043]

number

[0044] Life_Usage represents the amount of life consumed per sampling period [s (seconds)]. Temp_Speriod represents the sampling period [s]. Life_Amp represents the life amplification rate [%]. C_RefTemp represents the reference temperature [°C] of the environment in which the life part is used. Temp_Current represents the current temperature [°C]. Life_TempDiff represents the temperature difference [°C] relative to the life amplification rate.

[0045] C_LifeTime and C_RefTemp are life calculation parameters that are preset according to the life parts used. C_LifeTime is, for example, 36000000 [s]. C_RefTemp is, for example, 90 [°C].

[0046] Life_TempDiff and Life_Amp are life coefficients of the capacitor that are preset according to the life parts used. Life_TempDiff is, for example, 10[℃]. Life_Amp is, for example, 200%. These indicate that the life doubles when the temperature drops by 10[℃] according to Arrhenius' law.

[0047] Temp_Current and Temp_SPeriod are input values. Temp_SPeriod is, for example, 5000 [s].

[0048] The calculation unit 112 time-integrates the calculated lifetime consumption for each sampling period over the entire period (step S104). Specifically, the calculation unit 112 time-integrates the lifetime consumption for each sampling period over the entire period according to the following formula (2).

[0049]

number

[0050] Life_Integral represents the result of the time integral over the entire period of Life_Usage.

[0051] The calculation unit 112 calculates the lifetime consumption rate based on the result of the time integration of the lifetime consumption amount for each sampling frequency over the entire period (step S106). Specifically, the calculation unit 112 calculates the lifetime consumption rate according to the following formula (3).

[0052]

number

[0053] DDC_Life represents the life consumption rate [%] of the power supply device 100. For example, when C_RefTemp is 90[°C], C_LifeTime is 10000[h (hours)], and Life_Integral is 100[h], the calculation unit 112 calculates that the life of the power supply device 100 has decreased by 1[%], i.e., 100 / 10000=1[%]. For example, when C_RefTemp is 80[°C], C_LifeTime is 10000[h (hours)], and Life_Integral is 100[h], the calculation unit 112 calculates that the life of the power supply device 100 has decreased by 0.5[%], i.e., 100 / 10000×0.5=0.5[%]. This is because the life consumption rate has been halved according to Arrhenius' law, as the operating temperature has dropped by 10[°C] from the reference temperature. That is, the calculation unit 112 calculates the lifetime consumption rate by multiplying the lifetime consumption rate by a coefficient based on the Arrhenius law, based on the reference temperature and the current operating temperature.

[0054] 4 is a diagram for explaining the calculation result of the life consumption rate in the first example according to the embodiment. In Fig. 4, the horizontal axis indicates time [s], the left vertical axis indicates temperature [°C], and the right vertical axis indicates the life consumption rate [%].

[0055] Waveform 301 represents the temperature change around a life-limited part mounted inside power supply device 100. Waveform 302 represents the calculation result of the life consumption rate according to the embodiment. Waveform 303 represents the calculation result of the life consumption rate according to a comparative example. In the comparative example, Life_Amp is set to 400%, and the other parameters are the same as those of the embodiment.

[0056] As shown by waveform 301, in the first example of the embodiment, the temperature around the finite life parts mounted inside the power supply device 100 changes randomly. In such a case, as shown by waveforms 302 and 303, the life consumption rate changes according to the amount of change in the temperature around the finite life parts mounted inside the power supply device 100. Furthermore, when comparing waveforms 302 and 303, the life consumption rate changes more greatly in the comparative example than in the embodiment.

[0057] 5 is a diagram for explaining the calculation result of the life consumption rate in the second example according to the embodiment. In Fig. 5, the horizontal axis indicates time [s], the left vertical axis indicates temperature [°C], and the right vertical axis indicates the life consumption rate [%].

[0058] Waveform 311 represents the temperature change around a life-limited part mounted inside power supply device 100. Waveform 312 represents the calculation result of the life consumption rate according to the embodiment. Waveform 313 represents the calculation result of the life consumption rate according to a comparative example. In the comparative example, Life_Amp is set to 400%, and the other parameters are the same as those of the embodiment.

[0059] As shown by waveform 311, in the second example of the embodiment, the temperature around the finite life parts mounted inside the power supply device 100 is constant. In such a case, as shown by waveforms 312 and 313, the life consumption rate changes linearly. Furthermore, when comparing waveforms 312 and 313, the comparative example shows a larger change in the life consumption rate than the embodiment. Therefore, it can be said that the calculation result of the life consumption rate of the finite life parts using formulas (1) to (3) according to the embodiment is appropriate.

[0060] 6 is a diagram for explaining the calculation result of the life consumption rate in the third example according to the embodiment. In Fig. 6, the horizontal axis indicates time [s], the left vertical axis indicates temperature [°C], and the right vertical axis indicates the life consumption rate [%].

[0061] Waveform 321 represents the temperature change around a life-span part mounted inside power supply device 100. Waveform 322 represents the calculation result of the life-span consumption rate according to the embodiment. Waveform 323 represents the calculation result of the life-span consumption rate according to a comparative example. In the comparative example, Life_Amp is set to 400%, and the other parameters are the same as those of the embodiment.

[0062] As shown by waveform 321, in the third example of the embodiment, the temperature around the finite life parts mounted inside the power supply device 100 increases linearly. In such a case, as shown by waveforms 322 and 323, when the temperature is relatively low, the life consumption rate is small, but as the temperature increases, the life consumption rate increases significantly. Comparing waveforms 322 and 323, the comparative example shows a larger change in the life consumption rate than the embodiment.

[0063] As described above, in this embodiment, the life consumption rate of the power supply device 100 can be appropriately calculated based on the ambient temperature of the limited-life parts mounted inside the power supply device 100.

[0064] (Power supply control process) Next, a control process for the output voltage of the power supply device according to this embodiment will be described. In this embodiment, the control device 110 controls the output voltage of the power supply device 100 based on the life consumption rate of the power supply device 100.

[0065] The control process of the output voltage of the power supply device according to the embodiment will be described with reference to Fig. 7. Fig. 7 is a flowchart showing the control process of the output voltage of the power supply device according to the embodiment.

[0066] The output voltage control unit 113 acquires an output voltage command value that has been set in advance in the power supply device 100 (step S200). For example, the output voltage command value is stored in advance in the storage device 120, and the output voltage control unit 113 acquires the output voltage command value from the storage device 120. Then, the process proceeds to step S202.

[0067] The output voltage control unit 113 acquires a droop setting value (step S202). The droop setting value is a parameter that is set to adjust the balance of the output currents output from the multiple power supply devices 100 connected in parallel. For example, the droop setting value is stored in advance in the storage device 120, and the output voltage control unit 113 acquires the droop value from the storage device 120. Then, the process proceeds to step S204.

[0068] The output voltage control unit 113 calculates the output voltage value of the power supply device 100 (step S204). Specifically, the output voltage control unit 113 calculates the output voltage value of the power supply device 100 according to the following formula (4). Formula (4) is a formula for calculating the output voltage value according to the embodiment. Moreover, the following formula (5) is a formula for calculating the output voltage value according to the comparative example.

[0069]

number

[0070]

number

[0071] Vo represents the output voltage value. Io represents the output current value. RC represents the droop setting value. As shown in formula (5), the comparative example calculates the output voltage value according to the preset droop setting value. Therefore, in the comparative example, a large output voltage value may be set for the power supply device 100 with a large life consumption rate. On the other hand, in the embodiment, since the life consumption rate of the life parts is included in formula (4), the embodiment can calculate the output voltage value according to the life consumption rate. In the embodiment, the larger the life consumption rate of the power supply device 100, the smaller the output voltage value is calculated. For example, the output voltage value of the power supply device 100 with a life consumption rate of 50[%] is smaller than the output voltage value of the power supply device 100 with a life consumption rate of 10[%]. Therefore, the output current value of the power supply device 100 with a life consumption rate of 50[%] is also smaller, and the internal temperature is reduced, so that the temperature of the life parts is reduced. As a result, in the present embodiment, the lifespans of the multiple power supply devices 100 connected in parallel can be equalized, and the product life of the power supply device 100 can be extended.

[0072] The output voltage control unit 113 controls the output voltage of the power supply device 100 (step S206). Fig. 8 is a diagram for explaining a method for controlling the output voltage according to the embodiment. In Fig. 8, the horizontal axis indicates the output current Io [A], and the vertical axis indicates the output voltage Vo [V]. In the example shown in Fig. 8, the output voltage command value is 28 [V], the output current Io is 90 [A], and the droop setting value RC is 0.01 [Ω].

[0073] Line 331 represents the output voltage value of the power supply device 100 when the life consumption rate is 0%. Line 332 represents the output voltage value of the power supply device 100 when the life consumption rate is 20%. Line 333 represents the output voltage value of the power supply device 100 when the life consumption rate is 40%. Line 334 represents the output voltage value of the power supply device 100 when the life consumption rate is 60%. Line 335 represents the output voltage value of the power supply device 100 when the life consumption rate is 80%. Line 336 represents the output voltage value of the power supply device 100 when the life consumption rate is 100%.

[0074] As shown by lines 331 to 336, in this embodiment, the larger the life consumption rate, the smaller the output voltage Vo when the output current Io is the same. For example, when the output current Io is 90 [A], the output voltage Vo of the power supply device 100 with a life consumption rate of 0 [%] is 28 [V], and the output voltage Vo of the power supply device 100 with a life consumption rate of 100 [%] is 27 [V]. As a result, in this embodiment, when multiple power supply devices 100 are connected in parallel and operated, the output voltage Vo of the power supply device 100 with a large life consumption rate is low, so the reduction rate of the life of the life parts is small. Also, the output voltage Vo of the power supply device 100 with a small life consumption rate is high, so the reduction rate of the life of the life parts is large. As a result, this embodiment can equalize the lifespans of multiple power supply devices.

[0075] As described above, in this embodiment, the life consumption rate of the life parts is calculated based on the internal temperature of the power supply device, and the output voltage is adjusted based on the life consumption rate. In this way, when multiple power supply devices are connected in parallel and operated, the present invention can equalize the lifespan of each power supply device.

[0076] [Other embodiments] In the present embodiment, the output voltage is adjusted according to the life consumption rate, but the present disclosure is not limited to this. In the present disclosure, for example, the ripple voltage may be controlled to be smaller according to the life consumption rate within an allowable range. Specifically, the output voltage control unit 113 may reduce the ripple voltage of the power supply device 100 having a larger life consumption rate. This makes it possible to reduce the reduction rate of the life of the power supply device 100 having a larger life consumption rate, thereby making the lifespans of multiple power supply devices uniform.

[0077] Although the embodiments of the present disclosure have been described above, the present disclosure is not limited to the contents of these embodiments. The above-mentioned components include those that a person skilled in the art can easily imagine, those that are substantially the same, and those that are within the so-called equivalent range. Furthermore, the above-mentioned components can be appropriately combined. Furthermore, various omissions, substitutions, or modifications of the components can be made without departing from the gist of the above-mentioned embodiments. [Explanation of symbols]

[0078] 1a,1b,1c 1st terminal 2a,2b,2c 2nd terminal 100,100a,100b,100c power supply 110, 110a, 110b, 110c Control device 111 Acquisition Department 112 Calculation section 113 Output voltage control section 120,120a,120b,120c storage device 130, 130a, 130b, 130c Sensor 200 Load 1000 Power System R1,R2,R3 Wiring resistance

Claims

1. an acquisition unit that acquires temperature information relating to temperatures of electronic components mounted on the power supply device; a calculation unit that calculates a life consumption rate related to a life of the electronic component based on the temperature information; an output voltage control unit that controls an output voltage of the power supply device based on a preset output voltage instruction value and the life consumption rate; A control device comprising:

2. The output voltage control unit controls an output voltage of the power supply device based on the life consumption rate and a droop setting value set in accordance with the life consumption rate. The control device according to claim 1 .

3. The acquisition unit acquires the temperature information at a predetermined sampling period, the calculation unit calculates a life reduction rate of the electronic component per sampling period, and calculates the life consumption rate based on a result of integrating the life reduction rate over time; The control device according to claim 1 or 2.

4. the output voltage control unit reduces the output voltage of the power supply device as the life consumption rate increases, The control device according to claim 1 or 2.

5. The electronic component is an electrolytic capacitor. The control device according to claim 1 or 2.

6. obtaining temperature information relating to temperatures of electronic components mounted on the power supply device; calculating a life consumption rate for a life of the electronic component based on the temperature information; controlling an output voltage of the power supply device based on the life consumption rate; A method for controlling a power supply device, comprising:

Citation Information

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