Environmental test device and environmental test method

Abstract

To propose an environmental test device that can suppress a change of pressure in a laboratory when changing the environment within the laboratory.SOLUTION: An environmental test device 1 that can switch the inside of a laboratory 3 between a high-temperature environment and a low-temperature environment has inside / outside opening and closing means 18 that opens and closes the space between the inside of the laboratory and the outside, and has at least one of first control means that performs first control that sets a time zone in which high-temperature side opening and closing means 10 is closed during high-temperature / low-temperature shift during which the inside of the laboratory is switched from a high-temperature environment to a low-temperature environment, and in which the inside / outside opening and closing means 18 and low-temperature side opening and closing means 11 are open at the same time, and second control means that performs second control that sets a time zone in which the low-temperature side opening and closing means 11 is closed during low-temperature / high-temperature shift during which the inside of the laboratory is switched from the low-temperature environment to the high-temperature environment, and in which the inside / outside opening and closing means 18 and the high-temperature side opening and closing means 10 are open at the same time.SELECTED DRAWING: Figure 3

Description

[Technical field]

[0001] The present invention relates to an environmental test apparatus, and more particularly to an environmental test apparatus capable of performing a thermal shock test or a similar environmental test.The present invention also relates to an environmental test method. [Background technology]

[0002] Thermal shock testing is known, in which a thermal shock is applied to an object under test, such as an electronic component or an electronic device, and the reliability of the object under test is evaluated based on the thermal stress that occurs during the test. One environmental test device for performing thermal shock testing is equipped with a test chamber in which the object under test is placed, a low-temperature chamber in which low-temperature air is generated and stored to cool the test chamber, and a high-temperature chamber in which high-temperature air is generated and stored to heat the test chamber (Patent Document 1).

[0003] In the environmental test device having the above-mentioned configuration, the test subject is placed in the test chamber, and low-temperature air and high-temperature air are alternately sent from the low-temperature chamber and high-temperature chamber into the test chamber to rapidly cool or heat the test subject, thereby applying thermal stress to the test subject. Specifically, in the thermal shock test, the test chamber and the low-temperature chamber are connected to each other to create a low-temperature environment in the test chamber, and low-temperature exposure, in which the test subject is rapidly cooled, and high-temperature exposure, in which the test chamber and the high-temperature chamber are connected to each other to create a high-temperature environment in the test chamber, are alternately performed. In the conventional environmental testing device, when the high temperature exposure is completed, low temperature air is immediately sent into the test chamber to make the test chamber a low temperature environment, and similarly, when the low temperature exposure is completed, high temperature air is immediately sent into the test chamber to make the test chamber a high temperature environment. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 1-274039 Summary of the Invention [Problem to be solved by the invention]

[0005] The volume of air changes depending on the temperature. In the conventional environmental testing device, when the high-temperature exposure is completed, low-temperature air is immediately sent into the test chamber to create a low-temperature environment. This causes the air in the test chamber to thermally contract, and the pressure in the test chamber decreases. Therefore, in the conventional environmental testing device, when the test environment of high-temperature exposure is shifted to the test environment of low-temperature exposure, there is a concern that the test chamber will be pushed by atmospheric pressure and deformed. Similarly, in the conventional environmental testing device, when the low-temperature exposure is completed, high-temperature air is immediately sent into the test chamber to create a high-temperature environment. This causes the air in the test chamber to expand, and the pressure in the test chamber increases. Therefore, in the conventional environmental testing device, when the test environment of low-temperature exposure is shifted to high-temperature exposure, there is a concern that the pressure in the test chamber will rise and overcome the atmospheric pressure, causing the test chamber to deform.

[0006] The present invention focuses on the above-mentioned phenomenon, and aims to propose an environmental test apparatus and an environmental test method capable of suppressing the pressure change in the test chamber when the environment in the test chamber is changed, for example, when transitioning from low-temperature exposure to high-temperature exposure. [Means for solving the problem]

[0007] An aspect for solving the above-mentioned problems is an environmental testing device comprising a low-temperature air generating section, a high-temperature air generating section, a test chamber, low-temperature side opening and closing means for opening and closing between the low-temperature air generating section and the test chamber, and high-temperature side opening and closing means for opening and closing between the high-temperature air generating section and the test chamber, and capable of switching the inside of the test chamber between a high-temperature environment and a low-temperature environment by switching the opening and closing of the low-temperature side opening and closing means and the high-temperature side opening and closing means. The environmental testing device further comprises an inside and outside opening and closing means for opening and closing between the test chamber and the outside, and a controller for controlling the low-temperature side opening and closing means, the high-temperature side opening and closing means, and the inside and outside opening and closing means. The control device has at least one of a first control means for performing a first control in which the high-temperature side opening / closing means is closed and the inside / outside opening / closing means and the low-temperature side opening / closing means are simultaneously open during a high-temperature / low-temperature transition in which the inside of the test chamber is switched from a high-temperature environment to a low-temperature environment, and a second control means for performing a second control in which the low-temperature side opening / closing means is closed and the inside / outside opening / closing means and the high-temperature side opening / closing means are simultaneously open during a low-temperature / high-temperature transition in which the inside of the test chamber is switched from a low-temperature environment to a high-temperature environment.

[0008] The environmental testing device of this aspect has a low-temperature air generating unit, a high-temperature air generating unit, and a test chamber. The environmental testing device of this aspect also includes a low-temperature side opening and closing means for opening and closing between the low-temperature air generating unit and the test chamber, and a high-temperature side opening and closing means for opening and closing between the high-temperature air generating unit and the test chamber, and is capable of switching the inside of the test chamber between a high-temperature environment and a low-temperature environment by switching between opening and closing the low-temperature side opening and closing means and the high-temperature side opening and closing means. That is, the environmental testing apparatus of this embodiment can close the high-temperature side opening / closing means to cut off communication between the test chamber and the high-temperature air generating unit, and open the low-temperature side opening / closing means to introduce low-temperature air from the low-temperature air generating unit into the test chamber, creating a low-temperature environment in the test chamber. The environmental testing apparatus of this embodiment can also close the low-temperature side opening / closing means to cut off communication between the test chamber and the low-temperature air generating unit, and open the high-temperature side opening / closing means to introduce high-temperature air from the high-temperature air generating unit into the test chamber, creating a high-temperature environment in the test chamber. The environmental testing apparatus of this embodiment has an inside / outside opening / closing means in addition to the above-mentioned low-temperature side opening / closing means and high-temperature side opening / closing means. The inside / outside opening / closing means opens and closes between the test chamber and the outside, and by opening the inside / outside opening / closing means, the test chamber can be communicated with the outside of the environmental testing apparatus. The environmental testing equipment of this embodiment has a control device, which has at least one of a first control means that performs a first control to set a time period during which the inside / outside opening / closing means and the low-temperature side opening / closing means are open simultaneously, and a second control means that performs a second control to set a time period during which the low-temperature side opening / closing means is closed and the inside / outside opening / closing means and the high-temperature side opening / closing means are open simultaneously during a low-temperature / high-temperature transition when the inside of the test chamber is switched from a low-temperature environment to a high-temperature environment. The low-temperature side opening / closing means, the high-temperature side opening / closing means, and the inside / outside opening / closing means are controlled by the control device. In the environmental testing device of this aspect, at least one of the first control and the second control is performed by the first control means and the second control means of the control device. The first control performed by the first control means is implemented during high-temperature to low-temperature transition when the inside of the test chamber is switched from a high-temperature environment to a low-temperature environment, and is a control that sets a time period during which the high-temperature side opening / closing means is closed and the inside / outside opening / closing means and the low-temperature side opening / closing means are simultaneously open. By performing the first control, the test chamber is temporarily connected to the outside of the device during the high-temperature to low-temperature transition, and pressure drops are mitigated. Also, by performing the first control, outside air at room temperature is mixed into the test chamber. This suppresses a sudden drop in pressure in the test chamber. The second control performed by the second control means is implemented during low-temperature-high temperature transition when the inside of the test chamber is switched from a low-temperature environment to a high-temperature environment, and is a control that sets a time period during which the low-temperature side opening / closing means is closed and the inside / outside opening / closing means and the high-temperature side opening / closing means are simultaneously open. By performing the second control, the test chamber is temporarily connected to the outside of the device during low-temperature-high temperature transition, and pressure rise is mitigated. Also, by performing the second control, air in the test chamber is exhausted to the outside during low-temperature-high temperature transition. This suppresses a sudden pressure rise in the test chamber.

[0009] In the above-mentioned aspect, it is desirable that the control device further has a third control means for performing a third control that sets a time period during which the high temperature side opening / closing means and the low temperature side opening / closing means are closed and the inner / outer opening / closing means are open during the high temperature / low temperature transition and / or the low temperature / high temperature transition.

[0010] In the environmental testing device of this embodiment, a time period is provided in which the high temperature side opening / closing means and the low temperature side opening / closing means are closed during a high temperature-low temperature transition or a low temperature-high temperature transition, and only the inside / outside opening / closing means is opened. According to this embodiment, the third control means opens only the inside / outside opening / closing means, temporarily connecting the test chamber to the outside of the device, thereby mitigating pressure fluctuations. Furthermore, the third control means opens only the inside / outside opening / closing means, temporarily introducing room temperature air into the test chamber, and then introducing low temperature air or high temperature air into the test chamber. In the environmental testing device of this embodiment, the pressure in the test chamber approaches atmospheric pressure once during the aforementioned time period. In the environmental testing device of this embodiment, the pressure in the test chamber approaches atmospheric pressure once, and then the temperature in the test chamber changes significantly. Therefore, the pressure change in the test chamber is a change from a pressure close to atmospheric pressure, and the total pressure change from the start of switching to the end of switching during high-temperature / low-temperature transition or low-temperature / high-temperature transition is small.

[0011] In each of the above-mentioned aspects, it is desirable that the control device further has a fourth control means for performing a fourth control that sets a time period during which the high temperature side opening / closing means, the low temperature side opening / closing means, and the inner / outer opening / closing means are closed during the high temperature / low temperature transition and / or the low temperature / high temperature transition.

[0012] According to this embodiment, there are time periods during which the high temperature side opening / closing means, the low temperature side opening / closing means, and the inside / outside opening / closing means are closed, so that the test chamber becomes accustomed to the pressure and stress concentration is alleviated.

[0013] In each of the above-mentioned aspects, it is desirable that the control device performs a fourth control to set a time period during the high temperature-low temperature transition during which the high temperature side opening / closing means, the low temperature side opening / closing means, and the inside / outside opening / closing means are closed, and following the fourth control, performs a third control to set a time period during the high temperature-low temperature transition during which the high temperature side opening / closing means and the low temperature side opening / closing means are closed and the inside / outside opening / closing means is open, and performs the first control following the third control.

[0014] According to this embodiment, a sudden pressure drop in the test chamber during a high-temperature / low-temperature transition is suppressed.

[0015] In each of the above-mentioned aspects, it is desirable that the control device performs a fourth control during the low-temperature-high temperature transition, which sets a time period during which the high-temperature side opening / closing means, the low-temperature side opening / closing means, and the inside / outside opening / closing means are closed, and following the fourth control, performs a third control during the low-temperature-high temperature transition, which sets a time period during which the high-temperature side opening / closing means and the low-temperature side opening / closing means are closed and the inside / outside opening / closing means is open, and performs the second control following the third control.

[0016] According to this embodiment, a sudden pressure rise in the test chamber during low-temperature / high-temperature transition is suppressed.

[0017] An aspect of the environmental testing method is an environmental testing method that performs a high-temperature test in which heated air is generated in a high-temperature chamber, low-temperature air is generated in a low-temperature chamber, a test specimen is placed in a test chamber, and the air from the high-temperature chamber is introduced into the test chamber to expose the test specimen to a high-temperature environment, and a low-temperature test in which the air from the low-temperature chamber is introduced into the test chamber to expose the test specimen to a low-temperature environment, characterized in that, when transitioning from the high-temperature test to the low-temperature test, the introduction of the air from the high-temperature chamber into the test chamber is stopped, and the test chamber is opened to the outside while the air from the low-temperature chamber is introduced into the test chamber, and / or, when transitioning from the low-temperature test to the high-temperature test, the introduction of the air from the low-temperature chamber into the test chamber is stopped, and the test chamber is opened to the outside while the air from the high-temperature chamber is introduced into the test chamber.

[0018] In the environmental testing method of this aspect, when switching from a high-temperature test to a low-temperature test or from a low-temperature test to a high-temperature test, the test chamber is temporarily opened to the atmosphere, so that a sudden change in pressure due to a sudden change in temperature in the test chamber is mitigated. Effect of the Invention

[0019] According to the environmental testing device of the present invention, it is possible to suppress changes in pressure in the test chamber when the environment in the test chamber is changed. [Brief description of the drawings]

[0020] [Figure 1] FIG. 2 is a conceptual diagram of an environmental testing device according to an embodiment of the present invention, showing the air flow during high temperature exposure. [Diagram 2] FIG. 2 is a conceptual diagram of the environmental test apparatus of FIG. 1, showing the air flow during low-temperature exposure. [Diagram 3] 2A to 2E are conceptual diagrams of the environmental testing apparatus of FIG. 1, showing the air flow when transitioning from high-temperature exposure to low-temperature exposure, where (b) shows the first stage (first time period), (c) shows the second stage (second time period), and (d) shows the third stage (third time period). [Figure 4] 2A to 2E are conceptual diagrams of the environmental testing apparatus of FIG. 1, showing the air flow during the transition from low-temperature exposure to high-temperature exposure, where (b) shows the first stage (fourth time period), (c) shows the second stage (fifth time period), and (d) shows the third stage (sixth time period). [Diagram 5] FIG. 2 is a block diagram of a control device of the environmental testing apparatus of FIG. [Figure 6] 4 is a time chart showing the timing of opening and closing of each damper (opening and closing means) and the pressure in the test chamber when the test chamber of the environmental test apparatus in FIG. 1 is shifted (switched) from a high temperature environment to a low temperature environment. [Figure 7] 4 is a time chart showing the timing of opening and closing of each damper (opening and closing means) and the pressure in the test chamber when the test chamber of the environmental test apparatus in FIG. 1 is shifted (switched) from a low temperature environment to a high temperature environment. [Figure 8] 2 is a flowchart showing the operation of the environmental testing device of FIG. 1. [Figure 9] 13A and 13B are time charts showing the timing of opening and closing of each damper (opening and closing means) and the pressure in the test chamber when the test chamber of an environmental testing device of another embodiment of the present invention is switched from a high temperature environment to a low temperature environment. [Figure 10] 13A and 13B are time charts showing the timing of opening and closing of each damper (opening and closing means) and the pressure in the test chamber when the test chamber of an environmental testing device of another embodiment of the present invention is switched from a low temperature environment to a high temperature environment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0021] Hereinafter, an embodiment of the present invention will be described. The environmental test device 1 of this embodiment is for carrying out a thermal shock test. The mechanical structure of the environmental test device 1 is a three-chamber type thermal shock test device. As shown in Figs. 1 and 2, the environmental test device 1 has a heat-insulated housing 2 inside which is divided into three rooms. Specifically, the environmental test device 1 has a test chamber 3 inside the heat-insulated housing 2 in which the test subject W is placed, a high-temperature chamber (high-temperature air generating section) 5 which generates high-temperature air and sends the hot air to the test chamber 3, and a low-temperature chamber (low-temperature air generating section) 6 which generates low-temperature air and sends the cold air to the test chamber 3. In the example shown in Figs. 1 and 2, the high-temperature chamber 5 is located at the top and the low-temperature chamber 6 is located at the bottom of the test chamber 3.

[0022] In addition, between the test chamber 3 and the high temperature chamber 5, there are provided vents 7a and 7b which communicate between the test chamber 3 and the high temperature chamber 5. Similarly, between the test chamber 3 and the low temperature chamber 6, there are provided vents 8a and 8b which communicate between the test chamber 3 and the low temperature chamber 6. Furthermore, between the test chamber 3 and the outside, there are provided vents 13a and 13b. The vents 7, 8, 13 are provided with dampers (high temperature side opening / closing means, low temperature side opening / closing means, inside / outside opening / closing means) 10, 11, 18, respectively, for restricting the flow of air. In the environmental testing device 1, a series of high-temperature side air circulation paths are formed between the test chamber 3 and the high-temperature chamber 5, and high-temperature side dampers (high-temperature side opening and closing means) 10a, 10b open and close the high-temperature side air circulation path. Similarly, a series of low-temperature side air circulation paths are formed between the test chamber 3 and the low-temperature chamber 6, and low-temperature side dampers (low-temperature side opening / closing means) 11a and 11b open and close the low-temperature side air circulation path. In addition, the vents 13a and 13b that communicate between the inside and outside of the test chamber 3 are provided with room temperature side dampers (inside / outside opening / closing means) 18a and 18b. The vents 13a, 13b and the room temperature side dampers 18a, 18b provide natural ventilation for the test chamber 3, and in the environmental testing device 1 of this embodiment, the vents 13a, 13b do not have forced ventilation means such as a blower. In this embodiment, as described above, the ventilation openings 13a and 13b do not have a means for forcibly ventilating the test chamber 3, but this does not deny the provision of a forced ventilation means.

[0023] The test chamber 3 is a portion where high temperature and low temperature environments are repeatedly created, and has a test chamber side temperature sensor 12 that detects the atmospheric temperature within the test chamber 3 .

[0024] The high-temperature chamber (high-temperature air generating section) 5 is a space that heats the air (gas) inside to a preset high-temperature side temperature (preheating target temperature) and stores the heated air. The high-temperature chamber 5 also has a function of circulating high-temperature air between the high-temperature chamber 5 and the test chamber 3. The high-temperature chamber 5 has a heater 15 for heating the air, a high-temperature side blower 16 for circulating the air, and a high-temperature chamber side temperature sensor 17 for detecting the atmospheric temperature inside the high-temperature chamber 5 .

[0025] The low temperature chamber (low temperature air generating section) 6 is a space that functions to cool the air (gas) therein to a predetermined temperature and store the cooled air. The low temperature chamber 6 has a function of circulating low temperature air between the low temperature chamber 6 and the test chamber 3 . The low-temperature chamber 6 has a cooler 20 that cools the air, a low-temperature side blower 21 that circulates the air, an adjustment heater 23 that finely adjusts the temperature of the cooled air, a cold storage unit 26, and a low-temperature chamber side temperature sensor 25 that detects the atmospheric temperature inside the low-temperature chamber 6. The cooler 20 is an evaporator of a cooling device (not shown). The regenerator 26 is a block of metal such as aluminum, and has a considerable heat capacity.

[0026] The environmental testing device 1 can sequentially operate in a high-temperature exposure mode in which air (gas) adjusted to a high temperature is introduced into the test chamber 3 to perform high-temperature exposure (high-temperature testing) to expose the test object W to a high-temperature atmosphere, and in a low-temperature exposure mode in which air adjusted to a low temperature is introduced into the test chamber 3 to perform low-temperature exposure (low-temperature testing) to expose the test object W to a low-temperature atmosphere, thereby subjecting the test object W to a thermal shock. When operating in the high temperature exposure mode, the high temperature side dampers 10a and 10b are opened to introduce high temperature air from the high temperature chamber 5 into the test chamber 3 as shown in Fig. 1. In the high temperature exposure mode, the low temperature side dampers 11a and 11b are closed, blocking communication between the low temperature chamber 6 and the test chamber 3. The normal temperature side dampers (inside / outside opening / closing means) 18a and 18b are closed. Conversely, when operating in the low-temperature exposure mode, the low-temperature side dampers 11a and 11b are opened to introduce low-temperature air from the low-temperature chamber 6 into the test chamber 3, as shown in Fig. 2. In the low-temperature exposure mode, the high-temperature side dampers 10a and 10b are closed, blocking communication between the high-temperature chamber 5 and the test chamber 3. The normal-temperature side dampers (inside / outside opening / closing means) 18a and 18b are closed.

[0027] When the high temperature exposure mode is being executed, pre-cooling operation is performed in the low temperature compartment 6 in preparation for the next low temperature exposure. Pre-cooling operation is an operation in which air is circulated in the low temperature compartment 6 as shown by the arrows in Figure 1, and the air in the low temperature compartment 6 is adjusted to the set temperature on the low temperature side. On the other hand, when the low temperature exposure mode is being executed, a preheating operation is performed in the high temperature chamber 5 in preparation for the next high temperature exposure. The preheating operation is an operation in which air is circulated in the high temperature chamber 5 as shown by the arrows in Fig. 2, and the air in the high temperature chamber 5 is adjusted to the set temperature on the high temperature side. In this embodiment, the high temperature exposure mode operation creates a high temperature environment in the test chamber 3. Also, in this embodiment, the low temperature exposure mode operation creates a low temperature environment in the test chamber 3.

[0028] As described above, in the environmental test device 1 of this embodiment, the vents 13a and 13b are provided between the test chamber 3 and the outside, and the normal temperature side dampers 18a and 18b are provided in the vents 13a and 13b. The vents 13a and 13b and the normal temperature side dampers 18a and 18b that communicate the inside and outside of the test chamber 3 are provided to temporarily open the test chamber 3 to the atmosphere and to naturally ventilate the test chamber 3, and are not intended to perform a normal temperature exposure test. That is, in the environmental test device 1 of this embodiment, when the normal temperature side dampers 18a and 18b are opened, no control is performed to perform forced ventilation. The normal temperature exposure test referred to here is a test in which the test subject W is exposed to a normal temperature environment by forcibly ventilating the test chamber 3 to bring the test chamber 3 to the outside air temperature. When performing a normal temperature exposure test, forced ventilation means such as a blower provided in the vents 13a and 13b is operated. Of course, this does not mean that it is denied that a room temperature exposure test can be performed using the environmental test apparatus 1 of this embodiment.

[0029] The environmental testing device 1 is controlled by a control device 30 shown in Fig. 5. A detection signal from the high temperature chamber side temperature sensor 17, a signal from the low temperature chamber side temperature sensor 25, and a signal from the test chamber side temperature sensor 12 are input to the control device 30. Further, a high-temperature test target temperature and a low-temperature test target temperature are inputted by the test temperature input means 31. Here, the high-temperature test target temperature is the target temperature of the air in the test chamber 3 when the high-temperature test is carried out. The low-temperature test target temperature is the target temperature of the air in the test chamber 3 when the low-temperature test is carried out. The exposure time setting means 32 sets the time for which the inside of the test chamber 3 is kept at a high temperature for performing high-temperature exposure, and the time for which the inside of the test chamber 3 is kept at a low temperature for performing low-temperature exposure.

[0030] The control device 30 has a built-in CPU, and by means of a built-in computer program, a high temperature chamber temperature control means 33, a low temperature chamber temperature control means 35, and a test chamber temperature control means 38 are realized as shown in FIG. All of these systems use input sensor signals and target values ​​to PID-control the cooling device (cooler) 20, heaters 15, 23, etc., to converge the temperature of each tank to the target value.

[0031] The control device 30 employed in this embodiment exerts a unique function, and functions as high-temperature-low-temperature transition control means (first control means, third control means, fourth control means) 36, and also functions as low-temperature-high-temperature transition control means (second control means, third control means, fourth control means) 37. The control device 30 can cause its internal configuration to function as both the high-temperature-low-temperature transition control means 36 and the low-temperature-high-temperature transition control means. The high temperature / low temperature transition control means 36 controls the opening and closing of each damper (high temperature side opening / closing means, low temperature side opening / closing means, inner / outer opening / closing means) 10, 11, 18 during the period from the end of operation in the high temperature exposure mode for high temperature exposure to the start of operation in the low temperature exposure mode for low temperature exposure.

[0032] In this embodiment, for ease of understanding, it is explained that the environmental testing device 1 has two operating modes, a "high temperature exposure mode" and a "low temperature exposure mode", and that in the transition between the two modes, a high temperature / low temperature transition control means (first control means, third control means, fourth control means) 36 and a low temperature / high temperature transition control means (second control means, third control means, fourth control means) 37 function. This is merely a clear distinction between the cases for ease of understanding, and is not intended to limit the configuration to a clear distinction between the "high temperature exposure mode" and the "low temperature exposure mode" and the operating modes during the transition between them.

[0033] In this embodiment, the fourth control means of the high temperature / low temperature transition control means 36 implements a fourth control that provides a first time period during which all dampers 10, 11, and 18 are closed during the high temperature / low temperature transition. The third control means of the high temperature / low temperature transition control means 36 implements a third control that provides a second time period during which the high temperature side dampers 10a and 10b and the low temperature side dampers 11a and 11b are closed and only the room temperature side dampers 18a and 18b are open during the high temperature / low temperature transition. The first control means of the high temperature / low temperature transition control means 36 implements a first control that provides a third time period during which the high temperature side dampers 10a and 10b are closed and the room temperature side dampers 18a and 18b and the low temperature side dampers 11a and 11b are open during the high temperature / low temperature transition.

[0034] In this embodiment, when the high temperature exposure mode is switched to the low temperature exposure mode, the room temperature side dampers 18a and 18b are opened and the test chamber 3 is opened to the atmosphere, but the room temperature side dampers 18a and 18b are only open for a short time, and the test object W maintains a high temperature state. That is, while the test object W is operating in the high temperature exposure mode, more precisely, when the test object W is operated in the high temperature exposure mode, the test object W is at a high temperature. In this embodiment, when the test object W operates in the high temperature exposure mode, the room temperature side dampers 18a and 18b are temporarily opened during the transition from the high temperature exposure mode to the low temperature exposure mode until the test object W operates in the low temperature exposure mode, but when the test object W is operated in the low temperature exposure mode, the test object W maintains a high temperature state sufficient to cause a thermal shock.

[0035] The low-temperature / high-temperature transition control means 37 controls the opening and closing of each damper (high-temperature side opening / closing means, low-temperature side opening / closing means, inner / outer opening / closing means) 10, 11, 18 during the period from the end of operation in the low-temperature exposure mode for low-temperature exposure to the start of the high-temperature exposure mode for high-temperature exposure. In this embodiment, the fourth control means of the low-temperature / high-temperature transition control means 37 performs a fourth control to provide a fourth time period during which all dampers 10, 11, and 18 are closed during low-temperature / high-temperature transition. The third control means of the low-temperature / high-temperature transition control means 37 performs a third control to provide a fifth time period during which the high-temperature side dampers 10a and 10b and the low-temperature side dampers 11a and 11b are closed and only the room-temperature side dampers 18a and 18b are open during low-temperature / high-temperature transition. The second control means of the low-temperature / high-temperature transition control means 37 performs a second control to provide a sixth time period during which the low-temperature side dampers 11a and 11b are closed and the room-temperature side dampers 18a and 18b and the high-temperature side dampers 10a and 10b are open during low-temperature / high-temperature transition. In this embodiment, when transitioning from low-temperature exposure to high-temperature exposure, the room-temperature side dampers 18a, 18b are opened and the test chamber 3 is opened to the atmosphere, but the room-temperature side dampers 18a, 18b are open for only a short time, and the test subject W maintains a low-temperature state.

[0036] As described above, when operating in the high temperature exposure mode, the high temperature side dampers 10a and 10b are opened to introduce high temperature air from the high temperature chamber 5 into the test chamber 3 as shown in Fig. 1. In the high temperature exposure mode, the low temperature side dampers 11a and 11b are closed, and the low temperature chamber 6 and the test chamber 3 are isolated from each other. That is, the damper opening and closing in the high temperature exposure mode is as follows. (Damper open / close status in high temperature exposure mode) High temperature side dampers 10a, 10b: open Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: closed Conversely, when operating in the low-temperature exposure mode, the low-temperature side dampers 11a and 11b are opened to introduce low-temperature air from the low-temperature chamber 6 into the test chamber 3, as shown in Fig. 2. In the low-temperature exposure mode, the high-temperature side dampers 10a and 10b are closed, and the high-temperature chamber 5 and the test chamber 3 are isolated from each other. That is, the damper opens and closes in the low temperature exposure mode as follows. (Damper open / close status in low temperature exposure mode) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: open Room temperature side dampers 18a, 18b: closed

[0037] In the conventional technology, when the high-temperature exposure mode ended, the high-temperature side dampers 10a, 10b and the low-temperature side dampers 11a, 11b were immediately switched between open and closed states. That is, in the conventional technology, the state was switched from high-temperature side dampers 10a, 10b (open) and low-temperature side dampers 11a, 11b (closed) to high-temperature side dampers 10a, 10b (closed) and low-temperature side dampers 11a, 11b (open). The same applies when switching from low temperature exposure to high temperature exposure, and in the conventional technology, the high temperature side dampers 10a, 10b and the low temperature side dampers 11a, 11b are immediately switched between open and closed. That is, in the conventional technology, the state was switched from high temperature side dampers 10a, 10b (closed) and low temperature side dampers 11a, 11b (open) to high temperature side dampers 10a, 10b (open) and low temperature side dampers 11a, 11b (closed).

[0038] In contrast to this, in this embodiment, the third control means and first control means of the control device 30 (high temperature / low temperature transition control means 36) temporarily open the inside / outside opening / closing means 18 when transitioning from the high temperature exposure mode to the low temperature exposure mode. Also, when transitioning from the high temperature exposure mode to the low temperature exposure mode, the first control means, third control means and fourth control means of the control device 30 open and close the dampers (high temperature side opening / closing means, low temperature side opening / closing means, inside / outside opening / closing means) 10, 11 and 18 in a complex combination. The same applies when transitioning from the low temperature exposure mode to the high temperature exposure mode, and the inside / outside opening / closing means 18 is temporarily opened by the third control means and second control means of the control device 30 (low temperature / high temperature transition control means 37). Also, when transitioning from the low temperature exposure mode to the high temperature exposure mode, the second control means, third control means and fourth control means of the control device 30 open and close the dampers (high temperature side opening / closing means, low temperature side opening / closing means, inside / outside opening / closing means) 10, 11 and 18 in a complex combination.

[0039] The opening and closing states of the dampers (high temperature side opening and closing means, low temperature side opening and closing means, inner and outer opening and closing means) 10, 11, and 18 when shifting from the high temperature exposure mode to the low temperature exposure mode will be described below with reference to the conceptual diagram of FIG. 3 and the time chart of FIG. In this embodiment, when shifting from the high temperature exposure mode to the low temperature exposure mode, the dampers (high temperature side opening / closing means, low temperature side opening / closing means, inner / outer opening / closing means) 10, 11, 18 are switched four times. That is, in this embodiment, the period during which the mode transitions from the high temperature exposure mode to the low temperature exposure mode is divided into a first time zone, a second time zone following the first time zone, and a third time zone following the second time zone, and the opening and closing state of each damper (high temperature side opening and closing means, low temperature side opening and closing means, inner and outer opening and closing means) 10, 11, 18 differs depending on each time zone.

[0040] As described above, the damper is opened and closed in the high temperature exposure mode as follows: Figures 1 and 3(a) show the open and closed states of the damper in the high temperature exposure mode. (Damper open / close status in high temperature exposure mode) High temperature side dampers 10a, 10b: open Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: closed In the high temperature exposure mode, high temperature air heated in the high temperature chamber 5 circulates in the test chamber 3, and the temperature inside the test chamber 3 is high. The pressure inside the test chamber 3 is slightly higher than atmospheric pressure. The test object W has been exposed to a high-temperature environment for a certain period of time and is at a high temperature.

[0041] During the first time period, which is the early stage of the transition from high temperature exposure to low temperature exposure, the fourth control is executed by the fourth control means of the high temperature / low temperature transition control means 36, and all dampers 10, 11, and 18 are closed, as shown in Figures 3(b) and 6. (Damper open / close status during the first time period) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: closed

[0042] In the first time period, the high temperature side dampers 10a, 10b and the low temperature side dampers 11a, 11b are both closed by the fourth control means, so that neither high temperature air nor low temperature air flows into the test chamber 3. The temperature inside the test chamber 3 is high, and the pressure inside the test chamber 3 is maintained at the pressure during the high temperature exposure mode and is slightly higher than atmospheric pressure. In the first time period, the air flow in the test chamber 3 calms down. The temperature inside the test chamber 3 is high, and the test object W is also at a high temperature.

[0043] In the subsequent second time period, the third control is executed by the third control means, and only the room temperature side dampers 18a, 18b are opened, as shown in FIG. 3(c) and FIG. (Damper open / close status during the second time period) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: open

[0044] In the second time period, the room temperature side dampers 18a and 18b are opened by the third control means, the high temperature air in the test chamber 3 is discharged to the outside of the environmental testing device 1, and outside air (air in the room in which the environmental testing device 1 is installed) flows into the test chamber 3. By opening the room temperature side dampers 18a and 18b, the inside of the test chamber 3 is opened to the atmosphere, and the pressure drops and becomes the same as atmospheric pressure. In the environmental testing device 1 of this embodiment, there is no forced ventilation means such as a blower near the room-temperature side dampers 18a and 18b, and the test chamber 3 is naturally ventilated by opening the room-temperature side dampers 18a and 18b. If there is a forced ventilation means such as a fan near the room temperature side dampers 18a and 18b, the fan is stopped. The air temperature in the test chamber 3 also changes in a decreasing direction, but because the air flow has calmed down as described above, the degree of temperature change is small. The air inside the test chamber 3 contracts by the amount that the air temperature in the test chamber 3 drops, but because the normal temperature side dampers 18a and 18b are opened and the test chamber 3 is open to the atmosphere, the pressure inside the test chamber 3 remains at atmospheric pressure. Although the temperature inside the test chamber 3 drops somewhat, the second time period is short, so that the test object W maintains a high temperature.

[0045] In the following third time slot, the first control is executed by the first control means, and the low temperature side dampers 11a and 11b are opened as shown in Fig. 3(d) and Fig. 6. In the third time slot, the room temperature side dampers 18a and 18b are maintained in the open state. (Damper open / close status during the third time period) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: open Room temperature side dampers 18a, 18b: open

[0046] In the third time slot, the low-temperature side dampers 11a, 11b are opened by the first control means, and low-temperature air is introduced from the low-temperature room 6 into the test chamber 3. This causes the temperature in the test chamber 3 to drop rapidly, and the air in the test chamber 3 to contract. However, in the third time slot, the normal-temperature side dampers 18a, 18b are opened by the first control means, and the test chamber 3 is open to the atmosphere, so the pressure in the test chamber 3 remains atmospheric pressure. In other words, as the temperature of the air in the test chamber 3 drops, the air in the test chamber 3 contracts, and as a result, outside air (the air in the environment in which the environmental test device 1 is installed) is introduced into the test chamber 3. Although the temperature inside the test chamber 3 drops, the third time period is short, so the temperature of the test object W drops somewhat but remains at a high temperature.

[0047] After the third time period has elapsed, the mode returns to the same low-temperature exposure mode as in the prior art, that is, as shown in Fig. 3(e) and Fig. 6, the low-temperature side dampers 11a and 11b remain open, and the normal-temperature side dampers 18a and 18b are closed. (Damper open / close status in low temperature exposure mode) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: open Room temperature side dampers 18a, 18b: closed

[0048] In the low-temperature exposure mode, the low-temperature side dampers 11a and 11b are opened, and low-temperature air is introduced from the low-temperature chamber 6 into the test chamber 3. This causes the temperature in the test chamber 3 to drop further, and a thermal shock is applied to the test object W. In the low temperature exposure mode, the room temperature side dampers 18a and 18b are closed, but the pressure inside the test chamber 3 is maintained close to atmospheric pressure. That is, as described above, the pressure inside the test chamber 3 is atmospheric pressure in the third time period. Also, since the temperature inside the test chamber 3 has already dropped in the third time period, the air inside the test chamber 3 contracts only slightly. Therefore, even when the high temperature exposure mode is switched to the low temperature exposure mode, the pressure change in the test chamber 3 is small.

[0049] Next, the opening and closing status of each damper (high temperature side opening and closing means, low temperature side opening and closing means, inner and outer opening and closing means) 10, 11, 18 when transitioning from the low temperature exposure mode to the high temperature exposure mode will be described with reference to the conceptual diagram of FIG. 4 and the time chart of FIG. In this embodiment, the period during which the mode transitions from the low temperature exposure mode to the high temperature exposure mode is divided into a fourth time zone, a fifth time zone following the fourth time zone, and a sixth time zone following the fifth time zone, and the opening and closing state of each damper (high temperature side opening and closing means, low temperature side opening and closing means, inner and outer opening and closing means) 10, 11, 18 differs depending on each time zone.

[0050] As described above, the damper in the low temperature exposure mode of the prior art is opened and closed as follows: Figures 2 and 4(a) show the open and closed states of the damper in the low temperature exposure mode. (Damper open / close status in low temperature exposure mode) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: open Room temperature side dampers 18a, 18b: closed In the low-temperature exposure mode, low-temperature air cooled in the low-temperature chamber 6 is circulated in the test chamber 3, and the temperature inside the test chamber 3 is low. The pressure inside the test chamber 3 is slightly lower than atmospheric pressure. The test object W has been exposed to a low-temperature environment for a certain period of time and is at a low temperature.

[0051] In the fourth time period, the fourth control is executed by the fourth control means, and all the dampers 10, 11, and 18 are closed, as shown in FIG. 4(b) and FIG. (Damper open / close status in the fourth time period) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: closed

[0052] In the fourth time period, the high temperature side dampers 10a, 10b and the low temperature side dampers 11a, 11b are both closed by the fourth control means, so that neither high temperature air nor low temperature air flows into the test chamber 3. The temperature inside the test chamber 3 is low, and the pressure inside the test chamber 3 is maintained at the pressure during the low temperature exposure mode, which is slightly lower than atmospheric pressure. In the fourth time period, the air flow in the test chamber 3 calms down. The temperature inside the test chamber 3 is low, and the test object W is also at a low temperature.

[0053] In the subsequent fifth time slot, the third control is executed by the third control means, and the normal temperature side dampers 18a and 18b are opened, as shown in FIG. 4(c) and FIG. (Damper open / close status during the fifth time period) High temperature side dampers 10a, 10b: closed Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: open

[0054] In the fifth time period, the room temperature side dampers 18a, 18b are opened by the third control means, and outside air (the air in the room in which the environmental testing device 1 is installed) that is at a higher temperature than the air inside the test chamber 3 is introduced into the test chamber 3. The inside of the test chamber 3 is opened to the atmosphere by opening the room temperature side dampers 18a, 18b, and the pressure inside the test chamber 3 rises and becomes the same as atmospheric pressure. In the environmental testing device 1 of this embodiment, there is no forced ventilation means such as a blower near the room-temperature side dampers 18a and 18b, and the test chamber 3 is naturally ventilated by opening the room-temperature side dampers 18a and 18b. If there is a forced ventilation means such as a fan near the room temperature side dampers 18a and 18b, the fan is stopped. The air temperature in the test chamber 3 also changes in an upward direction, but because the air flow is calm as described above, the degree of temperature change is small. The air inside the test chamber 3 expands by the amount of the rise in air temperature in the test chamber 3, but because the normal temperature side dampers 18a and 18b are opened and the test chamber 3 is open to the atmosphere, the pressure inside the test chamber 3 remains at atmospheric pressure. Although the temperature inside the test chamber 3 rises somewhat, since the fifth time period is short, the test object W maintains a low temperature.

[0055] In the following sixth time slot, the second control is executed by the second control means, and the high temperature side dampers 10a, 10b are opened as shown in Fig. 4(d) and Fig. 7. In the sixth time slot, the room temperature side dampers 18a, 18b are maintained in the open state. (Damper open / close status during the 6th time period) High temperature side dampers 10a, 10b: open Low temperature side dampers 11a, 11b: closed Room temperature side dampers 18a, 18b: open

[0056] In the sixth time slot, the high temperature side dampers 10a, 10b are opened by the second control means, and high temperature air is introduced from the high temperature chamber 5 into the test chamber 3. This causes the temperature in the test chamber 3 to rise rapidly, and the air in the test chamber 3 to expand. However, in the sixth time slot, the normal temperature side dampers 18a, 18b are opened by the second control means, and the test chamber 3 is open to the atmosphere, so the pressure in the test chamber 3 remains at atmospheric pressure. In other words, the air in the test chamber 3 expands as the temperature of the air in the test chamber 3 rises, and as a result, the air in the test chamber 3 is exhausted outside the environmental testing device 1 (the environment in which the environmental test chamber 1 is installed). Although the temperature inside the test chamber 3 rises, the sixth time period is short, so although the temperature of the test object W rises somewhat, it remains at a low temperature.

[0057] After the sixth time period has elapsed, the system enters the high temperature exposure mode as in the prior art. That is, as shown in Fig. 4(e) and Fig. 7, the high temperature side dampers 10a and 10b are kept open, and the normal temperature side dampers 18a and 18b are closed. In the high temperature exposure mode, the high temperature side dampers 10a and 10b are opened, and high temperature air is introduced from the high temperature chamber 5 into the test chamber 3. This causes the temperature in the test chamber 3 to rise further, and a thermal shock is applied to the test object W. In the high temperature exposure mode, the room temperature side dampers 18a and 18b are closed, but the pressure inside the test chamber 3 is maintained close to atmospheric pressure. That is, as described above, the pressure inside the test chamber 3 becomes atmospheric pressure in the sixth time period. Also, since the temperature inside the test chamber 3 has already risen in the sixth time period, the air inside the test chamber 3 expands only slightly. Therefore, even when the low-temperature exposure mode is switched to the high-temperature exposure mode, the change in pressure inside the test chamber 3 is small.

[0058] 6, the solid line in the section "Test chamber pressure" indicates the pressure in the test chamber 3 of the environmental testing device 1 when the inside of the test chamber 3 is shifted from a high-temperature environment to a low-temperature environment. Also, the two-dot chain line in the section "Test chamber pressure" indicates the pressure in the test chamber of the conventional environmental testing device when the inside of the test chamber is shifted from a high-temperature environment to a low-temperature environment. In the conventional technology, as shown by the two-dot chain line in FIG. 6, the pressure inside the test chamber 3 dropped significantly when transitioning from a high-temperature environment to a low-temperature environment. In contrast, in this embodiment, the pressure drop is small, as shown by the solid line.

[0059] 7, the solid line in the section "Test chamber pressure" indicates the pressure in the test chamber 3 when the inside of the test chamber 3 of the environmental testing device 1 is shifted from a low-temperature environment to a high-temperature environment. Also, the two-dot chain line in the section "Test chamber pressure" indicates the pressure in the test chamber when the inside of the test chamber of the conventional environmental testing device is shifted from a low-temperature environment to a high-temperature environment. In the prior art, as shown by the two-dot chain line in FIG. 7, the pressure inside the test chamber 3 increased significantly when transitioning from a low temperature environment to a high temperature environment, whereas in this embodiment, the pressure increase is small, as shown by the solid line.

[0060] Next, a series of steps in the thermal shock test will be explained with reference to the flowchart in Figure 8. Note that the control flow shown below is merely conceptual, and the order of the steps may be changed. In particular, the timing at which the timer starts counting is highly arbitrary.

[0061] As a process performed by an operator, a predetermined target value is input to the control device 30. When a start switch (not shown) is turned ON, the process proceeds to step 1, where a pre-cooling operation is started in the low temperature chamber 6, and a pre-heating operation is started in the high temperature chamber 5. Then, the process proceeds to step 2, where timing of the high temperature exposure time is started. Also, the process proceeds to step 3, where the high temperature exposure mode is started. In step 3, the high temperature exposure mode is started, and only the high temperature side dampers 10a and 10b are opened, and the other dampers 11a, 11b, 18a, and 18b are closed. Then, in step 4, the specified high temperature exposure time is awaited.

[0062] When the high temperature exposure mode ends, the process proceeds to step 5, and timing of the first time zone is started. In the following step 6, the fourth control is started by the fourth control means, and the dampers 10, 11, and 18 are controlled to be in the "damper open / closed state in the first time zone" described above. That is, all the dampers 10a, 10b, 11a, 11b, 18a, and 18b are closed by the fourth control means.

[0063] Then, when it is confirmed in step 7 that the first time period has ended, the process proceeds to step 8, where timing of the second time period is started. In the following step 9, the third control is started by the third control means, and the dampers 10, 11, and 18 are controlled to be in the "open / closed state of the dampers in the second time period" described above. That is, the room temperature side dampers 18a and 18b are opened by the third control means, and the test chamber 3 is opened to the atmosphere.

[0064] Then, when it is confirmed in step 10 that the second time period has ended, the process proceeds to step 11, where timing of the third time period is started. In the following step 12, the first control is started by the first control means, and the dampers 10, 11, and 18 are controlled to be in the "damper open / closed state in the third time period" described above. That is, the first control means opens the low-temperature side dampers 11a and 11b, and low-temperature air is introduced into the test chamber 3.

[0065] Then, when it is confirmed in step 13 that the third time period has ended, the process proceeds to step 14, where timing of the low temperature exposure time is started.Then, the process proceeds to step 15, where the low temperature exposure mode is started. That is, only the low temperature side dampers 11a and 11b are opened, and the other dampers 10a, 10b, 18a and 18b are closed. In step 16, a predetermined low temperature exposure time is awaited.

[0066] When the low temperature exposure mode ends, the process proceeds to step 17, and timing of the fourth time zone is started. In the following step 18, the fourth control is started by the fourth control means, and the dampers 10, 11, and 18 are controlled to be in the "open / closed state of the dampers in the fourth time zone" described above. That is, all of the dampers 10a, 10b, 11a, 11b, 18a, and 18b are closed by the fourth control means.

[0067] Then, when it is confirmed in step 19 that the fourth time zone has ended, the process proceeds to step 20, where timing of the fifth time zone is started. In the following step 21, the third control is started by the third control means, and the dampers 10, 11, and 18 are controlled to be in the "open / closed state of the dampers in the fifth time zone" described above. That is, the room temperature side dampers 18a and 18b are opened by the third control means, and the test chamber 3 is opened to the atmosphere.

[0068] Then, when it is confirmed in step 22 that the fifth time slot has ended, the process proceeds to step 23, where timing of the sixth time slot is started. In the following step 24, the second control is started by the second control means, and the dampers 10, 11, 18 are controlled to be in the "damper open / closed state in the sixth time slot" described above. That is, the second control means opens the high temperature side dampers 10a, 10b, and high temperature air is introduced into the test chamber 3.

[0069] Then, in step 25, when it is confirmed that the sixth time period has ended, the process proceeds to step 26, where the number of high-temperature and low-temperature exposures that have been performed is confirmed. If the number of times has been completed, the series of tests ends; if not, the process returns to step 2 and the high-temperature exposure is performed again.

[0070] In this embodiment, as shown in the time chart in Fig. 6, the operation during the high-temperature-low-temperature transition, which switches the inside of the test chamber 3 from a high-temperature environment to a low-temperature environment, is divided into "high-temperature exposure", "high-temperature-low-temperature transition", and "low-temperature exposure", and the "high-temperature-low-temperature transition" includes the operation during the first time period (fourth control), the operation during the second time period (third control), and the operation during the third time period (first control). However, the operation during the high-temperature-low-temperature transition is not limited to the above-mentioned division. In other words, the high-temperature-low-temperature transition may be a period ("high-temperature-low-temperature transition") independent of the "high-temperature exposure" and "low-temperature exposure", or the high-temperature-low-temperature transition may be included as part of the "high-temperature exposure" or "low-temperature exposure". For example, as shown in the time chart of Fig. 9(a), the initial period of "low temperature exposure" may be a high-temperature / low-temperature transition period when switching from a high-temperature environment to a low-temperature environment. That is, the initial period of "low temperature exposure" may include the operation in the first period (fourth control), the operation in the second period (third control), and the operation in the third period (first control). 9(b), the final period of the "high temperature exposure" may be a high temperature-low temperature transition period when switching from a high temperature environment to a low temperature environment. In other words, the final period of the "high temperature exposure" may include the operation in the first period (fourth control), the operation in the second period (third control), and the operation in the third period (first control).

[0071] In this embodiment, as shown in the time chart in FIG. 7, the operation during low-temperature-high-temperature transition, in which the inside of the test chamber 3 is switched from a low-temperature environment to a high-temperature environment, is divided into cases of "low-temperature exposure", "low-temperature-high-temperature transition", and "high-temperature exposure", and the "low-temperature-high-temperature transition" includes the operation in the fourth time slot (fourth control), the operation in the fifth time slot (third control), and the operation in the sixth time slot (second control). However, as with the high-temperature-low-temperature transition, the low-temperature-high-temperature transition is not limited to the above case division. In other words, the low-temperature-high-temperature transition may be a period ("low-temperature-high-temperature transition") independent of the "low-temperature exposure" and "high-temperature exposure", and the low-temperature-high-temperature transition may be included as part of the "low-temperature exposure" or "high-temperature exposure". For example, as shown in the time chart of Fig. 10(a), the initial period of "high temperature exposure" may be a low-temperature-high temperature transition period when switching from a low temperature environment to a high temperature environment. In other words, the initial period of "high temperature exposure" may include the operation in the fourth period (fourth control), the operation in the fifth period (third control), and the operation in the sixth period (second control). 10(b), the final period of the "low temperature exposure" may be a low-temperature-high temperature transition period when the low temperature environment is switched to the high temperature environment. In other words, the final period of the "low temperature exposure" may include the operation in the fourth period (fourth control), the operation in the fifth period (third control), and the operation in the sixth period (second control).

[0072] In the embodiment described above, all of the first to fourth controls are implemented, but the present invention is not limited to this configuration, and it is not necessary to implement all of the first to fourth controls. For example, only the first control may be implemented, which provides a time period during which the high-temperature side opening / closing means is closed and the inside / outside opening / closing means and the low-temperature side opening / closing means are simultaneously open. Also, only the second control may be implemented, which provides a time period during which the low-temperature side opening / closing means is closed and the inside / outside opening / closing means and the high-temperature side opening / closing means are simultaneously open.

[0073] The above-mentioned control device 30 has a first control means for performing the first control, a second control means for performing the second control, a third control means for performing the third control, and a fourth control means for performing the fourth control, but the control device 30 does not necessarily have to have all of these control means. For example, the control device 30 may have only the first control means. Also, the control device 30 may have only the second control means.

[0074] In the embodiment described above, the first control is included when the exposure is shifted from high temperature exposure to low temperature exposure, and the second control is included when the exposure is shifted from low temperature exposure to high temperature exposure, but the present invention is not limited to this. That is, it is sufficient that either the first control or the second control described above is performed. [Explanation of symbols]

[0075] 1 Environmental testing equipment 3. Test Room 5 High temperature room (high temperature air generating section) 6. Low temperature room (low temperature air generating section) 10a, 10b High temperature side damper (high temperature side opening / closing means) 11a, 11b Low temperature side damper (low temperature side opening and closing means) 18a, 18b Room temperature side damper (inner / outer opening / closing means) 30 Control device 36 High and low temperature transition control means 37 Low temperature / high temperature transition control means

Claims

1. An environmental testing device comprising a low-temperature air generating unit, a high-temperature air generating unit, a test chamber, low-temperature side opening / closing means for opening and closing between the low-temperature air generating unit and the test chamber, and high-temperature side opening / closing means for opening and closing between the high-temperature air generating unit and the test chamber, the device being capable of switching between a high-temperature environment and a low-temperature environment by switching between opening and closing of the low-temperature side opening / closing means and the high-temperature side opening / closing means, an inside / outside opening / closing means for opening and closing between the test chamber and the outside, a control device for controlling the low-temperature side opening / closing means, the high-temperature side opening / closing means, and the inside / outside opening / closing means, The control device is an environmental testing device having at least one of a first control means that performs a first control in which the high-temperature side opening / closing means is closed and the inside / outside opening / closing means and the low-temperature side opening / closing means are open simultaneously during a high-temperature / low-temperature transition in which the inside of the test chamber is switched from a high-temperature environment to a low-temperature environment, and a second control means that performs a second control in which the low-temperature side opening / closing means is closed and the inside / outside opening / closing means and the high-temperature side opening / closing means are open simultaneously during a low-temperature / high-temperature transition in which the inside of the test chamber is switched from a low-temperature environment to a high-temperature environment.

2. 2. The environmental testing device according to claim 1, wherein the control device further comprises a third control means for performing a third control in which, during the high temperature / low temperature transition and / or the low temperature / high temperature transition, the high temperature side opening / closing means and the low temperature side opening / closing means are closed and the inside / outside opening / closing means is open.

3. 2. The environmental testing apparatus according to claim 1, wherein the control device further comprises a fourth control means for performing a fourth control in which the high temperature side opening / closing means, the low temperature side opening / closing means, and the inner / outer opening / closing means are closed during the high temperature / low temperature transition and / or the low temperature / high temperature transition.

4. The control device includes: a fourth control is performed to provide a time period during which the high temperature side opening / closing means, the low temperature side opening / closing means, and the inside / outside opening / closing means are closed during the high temperature / low temperature transition; Following the fourth control, a third control is performed during the high temperature / low temperature transition, in which the high temperature side opening / closing means and the low temperature side opening / closing means are closed and the inside / outside opening / closing means is opened; 2. The environmental testing device according to claim 1, wherein the first control is performed subsequent to the third control.

5. The control device includes: a fourth control is performed to provide a time period during which the high temperature side opening and closing means, the low temperature side opening and closing means, and the inside and outside opening and closing means are closed during the low temperature / high temperature transition; Following the fourth control, a third control is performed during the low-temperature / high-temperature transition, in which the high-temperature side opening / closing means and the low-temperature side opening / closing means are closed and the inside / outside opening / closing means is opened; 2. The environmental testing device according to claim 1, wherein the second control is performed subsequent to the third control.

6. Generate heated air in the high temperature room and low temperature air in the low temperature room, place the test object in the test room, In an environmental testing method, a high-temperature test is performed by introducing air from the high-temperature chamber into the test chamber to expose the test object to a high-temperature environment, and a low-temperature test is performed by introducing air from the low-temperature chamber into the test chamber to expose the test object to a low-temperature environment, An environmental testing method in which, when transitioning from the high temperature test to the low temperature test, the introduction of air from the high temperature room into the test room is stopped, and the test room is opened to the outside while the air from the low temperature room is introduced into the test room, and / or, when transitioning from the low temperature test to the high temperature test, the introduction of air from the low temperature room into the test room is stopped, and the test room is opened to the outside while the air from the high temperature room is introduced into the test room.

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