Inspection device

Abstract

To provide an inspection device for contributing to an increase in working efficiency of adjustment of a position and a direction of a reflection surface for changing a direction of an optical path from an illumination section to an imaging section.SOLUTION: An inspection device includes: a conveyance section for conveying an inspection object as a packaging body in a fixed direction; an X-ray irradiation section for irradiating an inspection object with X rays; an X-ray detection section for detecting X rays through an inspection object and outputting X-ray detection data; an illumination section for illuminating an inspection object with light; an imaging section for imaging an optical image at the back of an inspection object irradiated with light and outputting optical image data; a reflection member that is provided in the middle of an optical path from the illumination section to the imaging section and has a reflection surface for changing the direction of the optical path; a reflection direction adjustment section for adjusting a position and / or a direction of a reflection surface while mounting the reflection member; an image generation section for generating an X-ray transmission image on the basis of X-ray detection data and generating an optical image on the basis of optical image data; and an inspection section for locating a position of a content in an inspection object on the basis of an X-ray transmission image and an optical image.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to an inspection device that performs inspections such as checking for pinched seals from X-ray transmission images and optical images of inspection objects, which are packages. [Background technology]

[0002] When the package being inspected is irradiated with electromagnetic waves such as X-rays, which have a high penetrating power, and the transmitted electromagnetic waves are detected, the distribution of the intensity of the transmitted light corresponding to the state of the inside of the package can be obtained. By generating a two-dimensional image (electromagnetic transmission image) that expresses this distribution of intensity using pixel color tones (tones such as brightness, shading, and intensity of colors), it is possible to visualize the state of the inside of the package, which cannot be known from the outside.

[0003] However, in inspections using X-rays, etc., the nature of the inspection is that the inside of the package is visualized by looking through the package, so it is difficult to distinguish the package itself in the image. Therefore, for example, it is difficult to identify where the contents or their fragments are located inside the package, and furthermore, whether the position has hit the sealed part of the package and caused it to become stuck.

[0004] Patent Document 1, for example, discloses an inspection device that irradiates one side of a package with light that has low transparency to objects, such as visible light or near-infrared light, and captures an image from the other side to obtain an optical image in which the position and outline shape of the package is represented as parts of the package that are darker than the surrounding area.By comparing this with an electromagnetic wave transmission image, the position of the contents etc. within the package can be identified, and it can be inspected to see if the identified position hits the seal, i.e., whether there is any entrapment.

[0005] FIG. 2 shows an excerpt of a portion of the inspection device 100 disclosed in Patent Document 1 that is relevant to the present invention.

[0006] The inspection device 100 includes at least a conveying unit 110, an X-ray irradiation unit 120, an X-ray detection unit 130, an illumination unit 140, an imaging unit 150, a reflecting member 160, and a data processing unit 170. Of these components, at least the X-ray irradiation unit 120, the X-ray detection unit 130, the illumination unit 140, the imaging unit 150, and the reflecting member 160 are housed in a housing (not shown). An inspection target W is any package, which is placed on the conveying unit 110 that penetrates the housing, carried into the housing through an inlet provided in the housing, and after inspection, is carried out of the housing through an outlet provided in the housing.

[0007] The transport unit 110 is a belt conveyor that has a width in the X-axis direction in the three-dimensional Cartesian coordinate system of the X-axis, Y-axis, and Z-axis shown in FIG. 2, and by moving the belt in the Y-axis direction, the inspection object W placed on the belt is moved in the Y-axis direction.

[0008] The conveying section 110 is separated into an upstream conveying section 110a and a downstream conveying section 110b, which have the same conveying speed, and a gap section 110c is provided between the upstream conveying section 110a and the downstream conveying section 110b, which is a gap large enough to allow the conveying to be continued without the inspection object W falling.

[0009] The X-ray irradiation unit 120 irradiates the inspection object W being transported by the transport unit 110 with X-rays.

[0010] The X-ray detection unit 130 periodically detects transmitted X-rays, which are X-rays that have passed through the inspection object W, among the X-rays irradiated from the X-ray irradiation unit 120 to the inspection object W, and outputs X-ray detection data. The X-ray detection unit 130 is an X-ray line sensor in which multiple X-ray detection elements are linearly arranged in the X-axis direction, and periodically detects transmitted X-rays while moving the inspection object W, and sequentially collects linear X-ray detection data over the entire width of the inspection object W to obtain X-ray detection data for the entire inspection object W.

[0011] The X-ray irradiation unit 120 and the X-ray detection unit 130 are disposed opposite each other on one side and the other side in the Z-axis direction, with a gap 110c therebetween.

[0012] The illumination unit 140 irradiates light onto the inspection target W being transported by the transport unit 110.

[0013] The imaging unit 150 periodically captures optical images behind the light-irradiated inspection object W and outputs optical image data. The imaging unit 150 is an optical line sensor in which a plurality of photodetection elements are linearly arranged in the X-axis direction, and periodically captures optical images while moving the inspection object W, and sequentially collects linear optical image data over the entire width of the inspection object W to obtain optical image data of the entire inspection object W.

[0014] The illumination section 140 and the imaging section 150 are disposed on one side and the other side of the gap 110c in the Z-axis direction, respectively.

[0015] The X-ray irradiation unit 120, the X-ray detection unit 130, the illumination unit 140, and the imaging unit 150 are arranged such that an optical path L1 from the X-ray irradiation unit 120 to the X-ray detection unit 130 and an optical path L2 from the illumination unit 140 to the imaging unit 150 pass parallel to each other in the Z-axis direction in the gap 110c as shown in Fig. 2. In addition, the X-ray irradiation unit 120 and the imaging unit 150 are arranged on one side of the transport unit 110 in the Z-axis direction, and the X-ray detection unit 130 and the illumination unit 140 are arranged on the other side.

[0016] In addition, on the side where the X-ray irradiation unit 120 is provided, a reflecting member 160 having a reflecting surface inclined at 45 degrees with respect to the XZ plane is provided in the optical path L2 to change the direction of the optical path L2 from the Z-axis direction to the Y-axis direction, and the imaging unit 150 is disposed at the extension point of the optical path L2 whose direction has been changed. That is, the light irradiated from the illumination unit 140 is irradiated toward the inspection target W passing over the gap 110c, and is further reflected in a different direction by the reflecting surface of the reflecting member 160 to reach the imaging unit 150.

[0017] The data processing unit 170 generates an X-ray transmission image of the inspection object W based on the X-ray detection data collected by the X-ray detection unit 130, and generates an optical image of the inspection object W based on the optical image data collected by the imaging unit 150. Then, based on the contour of the inspection object W, which is a package, grasped from the optical image, the data processing unit 170 specifies the position of the contents, etc., within the inspection object W, and inspects whether the specified position hits the seal portion, i.e., whether entrapment has occurred. [Prior art documents] [Patent documents]

[0018] [Patent Document 1] Patent No. 5884145 Summary of the Invention [Problem to be solved by the invention]

[0019] In the case of the inspection device 100 shown in FIG. 2, the position and orientation of the reflecting surface of the reflecting member 160 are adjusted before shipment so that the optical image is appropriately captured by the imaging unit 150. However, due to circumstances after shipment, such as vibration during transportation, vibration at the installation site, and loosening of the fixing of the reflecting member 160, a deviation in position or orientation may occur, and a normal image may not be obtained. As a method for dealing with the deviation, for example, a method of compensating for the deviation by software using image processing can be given. However, if the deviation is large, it cannot be sufficiently compensated by image processing, so it is necessary to adjust the position and orientation of the reflecting surface. However, since the reflecting member is generally fixed by screws or the like, in order to adjust it, it is necessary to remove the screws or the like to release the fixing, adjust the position and orientation, and then fix it again by screws or the like, which requires skill and effort and causes a problem in workability.

[0020] An object of the present invention is to provide an inspection device that contributes to improving the workability of adjusting the position and orientation of a reflecting surface that changes the direction of an optical path from an illumination unit to an imaging unit. [Means for solving the problem]

[0021] The inspection device of the present invention comprises a transport unit which transports the inspection object, which is a package, in a certain direction; an X-ray irradiation unit which irradiates X-rays onto the inspection object; an X-ray detection unit which detects X-rays that have passed through the inspection object and output X-ray detection data; an illumination unit which irradiates light onto the inspection object; an imaging unit which takes an optical image behind the inspection object irradiated with light and outputs optical image data; a reflective member which is provided midway along the optical path from the illumination unit to the imaging unit and has a reflective surface which changes the direction of the optical path; a reflection direction adjustment unit to which the reflective member is attached and which adjusts the position and / or direction of the reflective surface; an image generation unit which generates an X-ray transmission image of the inspection object based on the X-ray detection data and generates an optical image of the inspection object based on the optical image data; and an inspection unit which identifies the position of the contents within the inspection object based on the X-ray transmission image and the optical image.

[0022] The X-ray irradiation unit, the imaging unit and the reflecting member may be arranged on one side of the transport unit, and the X-ray detection unit and the illumination unit may be arranged on the other side.

[0023] The imaging apparatus may further include an image adjustment unit that corrects the optical image and / or the X-ray transmission image by image processing. Effect of the Invention

[0024] According to the present invention, the position and inclination of the reflecting surface can be easily changed without removing the reflecting member, thereby improving the ease of adjustment. [Brief description of the drawings]

[0025] [Figure 1] FIG. 1 is a diagram showing an example of the configuration of an inspection device 200 according to the present invention. [Diagram 2] FIG. 1 is a diagram showing an example of the configuration of a conventional inspection device 100. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0026] Hereinafter, each embodiment of the present invention will be described with reference to the drawings. In the following description and drawings, the same functional parts are denoted by the same reference numerals, and the description of the functional parts that have already been described will be omitted or will be described only to the extent necessary.

[0027] 1 is a diagram showing an example of the configuration of an inspection device 200 of the present invention. The inspection device 100 includes a transport unit 110, an X-ray irradiation unit 120, an X-ray detection unit 130, an illumination unit 140, an imaging unit 150, a reflecting member 160, a reflection direction adjustment unit 210, and a data processing unit 270.

[0028] Among these components, at least the X-ray irradiation unit 120, the X-ray detection unit 130, the illumination unit 140, the imaging unit 150, the reflecting member 160, and the reflection direction adjustment unit 210 are housed in a housing (not shown). The inspection object W is placed on the transport unit 110 that penetrates the housing, and is carried into the housing through an entrance provided in the housing, and after inspection, is carried out of the housing through an exit provided in the housing. The inspection object W is any package, and examples of the contents include food and various products, and it is also assumed that foreign matter may be mixed in.

[0029] The conveying unit 110 is a type of conveyor capable of continuously conveying the placed inspection object W in a certain direction. The conveying unit 110 has a width in the X-axis direction in a three-dimensional orthogonal coordinate system of the X-axis, Y-axis, and Z-axis shown in FIG. 1, and moves the placed inspection object W in the Y-axis positive direction by moving the placement surface, which is an XY plane, in the Y-axis positive direction. The placement surface of the conveying unit 110 may be a real surface that moves the placed inspection object W along with it, such as a belt conveyor, by moving in a planar manner, or may be a virtual surface in the sense that the placed inspection object W is moved in a planar manner by applying power to the placed inspection object W, such as a drive roller conveyor. The conveying speed depends on the detection cycle of the detection element, and is generally about several m / min to several hundred m / min in the inspection of packages.

[0030] The conveying section 110 is separated into an upstream conveying section 110a and a downstream conveying section 110b, which have the same conveying speed, and a gap section 110c is provided between the upstream conveying section 110a and the downstream conveying section 110b, which is a gap large enough to allow the conveying to be continued without the inspection object W falling.

[0031] The X-ray irradiation unit 120 irradiates the inspection object W being transported by the transport unit 110 with X-rays.

[0032] The X-ray detection unit 130 periodically detects transmitted X-rays, which are X-rays that have passed through the inspection object W, among the X-rays irradiated from the X-ray irradiation unit 120 to the inspection object W, and outputs X-ray detection data. The X-ray detection unit 130 is an X-ray line sensor in which multiple X-ray detection elements are linearly arranged in the X-axis direction. The X-ray line sensor may be one in a single row, or one in multiple rows arranged in the Y-axis direction.

[0033] The X-ray irradiation unit 120 and the X-ray detection unit 130 are disposed facing each other on one side and the other side in the Z-axis direction, sandwiching the gap 110c therebetween. With this, while transporting the inspection object W in the positive direction of the Y-axis, the transmitted X-rays are periodically detected until the entire width passes over the gap 110c, thereby obtaining a plurality of X-ray detection data linearly slicing the inspection object W in the X-axis direction, and by arranging these in chronological order, X-ray detection data for the entire inspection object W can be obtained.

[0034] It should be noted that the irradiation and detection do not necessarily have to be X-rays, and any electromagnetic wave that has a relatively high permeability to the packaging of the object to be inspected and a relatively low permeability to the contents or foreign matter can be applied. In this case, it is sufficient to configure an irradiation unit and a detection unit that are compatible with the selected electromagnetic wave.

[0035] The illumination unit 140 irradiates light onto the inspection target W being transported by the transport unit 110. The illumination unit 140 is, for example, a line illumination in which a plurality of light-emitting elements are linearly arranged in the X-axis direction. The line illumination may be a single row, or may be multiple rows arranged in the Y-axis direction. Examples of the light-emitting elements include light-emitting diodes that emit visible light or near-infrared light.

[0036] The imaging unit 150 periodically captures optical images behind the light-irradiated inspection target W, and outputs optical image data. The imaging unit 150 is an optical line sensor in which a plurality of photodetection elements are linearly arranged in the X-axis direction. The optical line sensor may be arranged in a single row, or in multiple rows in the Y-axis direction.

[0037] The illumination unit 140 and the imaging unit 150 are disposed on one side and the other side of the gap 110c in the Z-axis direction. As a result, while transporting the inspection object W in the positive direction of the Y-axis, the light that reaches the inspection object W is periodically imaged until the entire width passes over the gap 110c, thereby obtaining a plurality of optical image data in which the inspection object W is linearly sliced ​​in the X-axis direction, and by arranging these in chronological order, optical image data of the entire inspection object W can be obtained.

[0038] The X-ray irradiation unit 120, the X-ray detection unit 130, the illumination unit 140, and the imaging unit 150 are arranged such that an optical path L1 from the X-ray irradiation unit 120 to the X-ray detection unit 130 and an optical path L2 from the illumination unit 140 to the imaging unit 150 pass parallel to each other in the Z-axis direction in the gap 110c, as shown in Fig. 1. This makes it possible to acquire X-ray detection data and optical image data under the same conditions when the inspection target W passes through the gap 110c.

[0039] In order to obtain X-ray detection data and optical image data of the inspection target W passing through the gap 110c under the same conditions, it is desirable to make the optical path L1 and the optical path L2 as close as possible in the gap 110c. However, if the X-ray irradiation unit 120 and the illumination unit 140 are arranged on one side in the Z-axis direction and the X-ray detection unit 130 and the imaging unit 150 are arranged on the other side across the gap 110c, the X-rays irradiated from the X-ray irradiation unit 120 may enter the imaging unit 150, or the light irradiated from the illumination unit 140 may enter the X-ray detection unit 130, causing problems in the inspection. Therefore, as shown in FIG. 1, the X-ray irradiation unit 120 and the imaging unit 150 may be arranged on one side in the Z-axis direction and the X-ray detection unit 130 and the illumination unit 140 may be arranged on the other side.

[0040] In addition, since the X-ray irradiation unit 120 generally has a large volume, it is not easy to arrange other functional units in the vicinity of the limited housing space. Therefore, the proximity arrangement may be avoided by changing the direction of the optical path L2 from the illumination unit 140 toward the imaging unit 150 on the side where the X-ray irradiation unit 120 is provided. For example, as shown in FIG. 1, on the side where the X-ray irradiation unit 120 is provided, a reflecting member 160 having a reflecting surface inclined at 45 degrees with respect to the XZ plane may be provided on the optical path L2 to change the direction of the optical path L2 from the Z-axis direction to the Y-axis direction, and the imaging unit 150 may be arranged at the extension point of the optical path L2 whose direction has been changed. That is, the light irradiated from the illumination unit 140 is irradiated toward the inspection target W passing over the gap 110c, and is further reflected in a different direction by the reflecting surface of the reflecting member 160 to reach the imaging unit 150.

[0041] The reflection direction adjustment unit 210 is a mechanism to which a reflective member 160 is attached, and which adjusts the reflection direction of light incident from the illumination unit 140 by changing the position and / or orientation of the reflective surface manually or automatically based on an instruction input from an arbitrary input unit not shown to an actuator not shown.

[0042] As the reflection direction adjustment unit 210, for example, a well-known positioning stage may be used according to the form in which the position or orientation of the reflection surface is to be changed. In this case, the reflection member 160 is attached to the positioning stage, and the reflection surface is positioned before shipment. After shipment, when the position or orientation of the reflection surface is shifted, the positioning stage is operated manually or automatically to perform adjustment. When it is desired to make the position of the reflection surface changeable, for example, a linear sliding type positioning stage that can slide in the positive and negative directions of each axis of a three-dimensional orthogonal coordinate system may be used. When it is desired to make the orientation of the reflection surface changeable, for example, an inclined type positioning stage that can rotate around each axis of a three-dimensional orthogonal coordinate system or a tilting type positioning stage that can tilt in each direction of 360 degrees may be used. Also, different types of positioning stages may be used in combination. For example, when it is desired to make both the position and orientation of the reflection surface changeable, a tilting type positioning stage may be attached to a linear sliding type positioning stage, and the reflection member 160 may be attached to this tilting type positioning stage.

[0043] The data processing unit 270 includes an image generating unit 271 and an inspecting unit 272 .

[0044] The image generation unit 271 generates an X-ray transmission image of the inspection object W based on the X-ray detection data collected by the X-ray detection unit 130, and generates an optical image of the inspection object W based on the optical image data collected by the imaging unit 150.

[0045] The inspection unit 272 inspects the contents of the inspection object W for jamming into the seal, etc., based on the X-ray transmission image and the optical image generated by the image generation unit 271. The X-ray transmission image shows the presence of the contents and debris of the inspection object W, and the optical image shows the outline of the inspection object W, which is a package. Both images are generated based on data collected under the same conditions. Therefore, by aligning and superimposing the positions of both images, it is possible to identify the position of the contents, etc., in the inspection object W, and to inspect whether the identified position corresponds to the seal, i.e., whether jamming has occurred.

[0046] According to the inspection device 200 configured as above, the position and orientation of the reflecting surface can be easily changed without removing the reflecting member, thereby improving the workability of adjustment.

[0047] The data processing unit 270 may further include an image adjustment unit 273 that corrects the optical image generated by the image generation unit 271 by image processing so as to enable more detailed adjustment of image abnormalities caused by deviations in the position or orientation of the reflection surface. In addition, since it is assumed that alignment or superposition with the X-ray transmission image cannot be performed well by correcting only the optical image, or alignment or superposition of both images is easier to perform by correcting the X-ray transmission image than by correcting the optical image, the image adjustment unit 273 may have a function of correcting the X-ray transmission image generated by the image generation unit 271 by image processing.

[0048] The image processing in the image adjustment unit 273 may include, for example, linear transformation of position and size, or shear transformation. The image processing may be performed automatically based on a predetermined rule, or may be performed based on various parameters input by an operator.

[0049] The functions of the data processing unit 270 may be implemented by being written in a program and executed by a CPU of a computer.

[0050] The present invention is not limited to the above-mentioned embodiments. The above-mentioned embodiments are merely examples, and anything that has substantially the same configuration as the technical idea described in the claims of the present invention and exhibits similar effects is included in the technical scope of the present invention. In other words, appropriate modifications are possible within the scope of the technical idea expressed in the present invention, and forms with such modifications and improvements are also included in the technical scope of the present invention. [Explanation of symbols]

[0051] 100, 200...Inspection equipment 110...Transportation section 110a...Upstream conveying section 110b...downstream conveying section 110c...Gap part 120...X-ray irradiation section 130…X-ray detector 140…Lighting section 150…Imaging unit 160...Reflective member 170, 270...data processing unit 210...Reflection direction adjustment section 271...Image generation unit 272…Inspection Department 273…Image adjustment section L1, L2…light path W: Inspection object

Claims

1. a conveying unit that conveys the inspection object, which is a package, in a fixed direction; an X-ray irradiation unit that irradiates the inspection object with X-rays; an X-ray detection unit that detects the X-rays transmitted through the inspection object and outputs X-ray detection data; An illumination unit that irradiates the inspection object with light; an imaging unit that captures an optical image behind the inspection object irradiated with the light and outputs the optical image data; a reflecting member provided in the middle of an optical path from the illumination unit to the imaging unit and having a reflecting surface that changes the direction of the optical path; a reflection direction adjustment unit to which the reflection member is attached and which adjusts the position and / or orientation of the reflection surface; an image generating unit that generates an X-ray transmission image of the inspection object based on the X-ray detection data, and generates an optical image of the inspection object based on the optical image data; an inspection unit that identifies a position of a content within the inspection object based on the X-ray transmission image and the optical image; An inspection device comprising:

2. 2. The inspection device according to claim 1, wherein the X-ray irradiation unit, the imaging unit and the reflecting member are on one side of the transport unit, and the X-ray detection unit and the illumination unit are on the other side of the transport unit.

3. The inspection apparatus according to claim 1 or 2, further comprising an image adjustment unit that corrects the optical image and / or the X-ray transmission image by image processing.

Images