Earthquake resistance determination system, earthquake resistance determination device, earthquake resistance determination method and earthquake resistance determination program
The seismic resistance determination system addresses the complexity and cost issues of existing systems by using ceiling surface images and a single vibration sensor, enabling accurate and efficient seismic resistance assessment.
Patent Information
- Application Number
- JP2024176807
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-10-10
- Filing Date
- 2024-10-08
- Publication Date
- 2025-04-22
AI Technical Summary
Existing seismic resistance determination systems require complex configurations with time-synchronized acceleration sensors on each floor, increasing costs and installation time.
A system that uses an image of the ceiling surface, a floor-mounted sensor to measure vibrations, and an information processing device to calculate interlayer displacement and generate correspondence information between displacement and sensor data, eliminating the need for multiple acceleration sensors.
This solution simplifies the system configuration, reduces costs and installation time, and improves the accuracy of interlayer displacement calculation compared to integrating acceleration data from multiple sensors.
Smart Images

Figure 2025066083000001_ABST
Abstract
Description
[Technical field]
[0001] The present invention relates to an earthquake resistance assessment system, an earthquake resistance assessment device, an earthquake resistance assessment method, and an earthquake resistance assessment program. [Background technology]
[0002] For example, there is a system (hereinafter also referred to as a seismic resistance assessment system) that assesses the earthquake resistance of structures such as houses and buildings (hereinafter also referred to simply as structures) by measuring the inter-story displacement of the structures during an earthquake (see Patent Document 1). [Prior art documents] [Patent documents]
[0003] [Patent Document 1] Patent Publication No. 2021-169983 [Non-patent literature]
[0004] [Non-Patent Document 1] https: / / www.jstage.jst.go.jp / article / aijt / 26 / 64 / 26_957 / _article / -char / ja / [Non-Patent Document 2] https: / / onlinelibrary.wiley.com / doi / full / 10.1002 / 2475-8876.1010 [Non-Patent Document 3] https: / / www.jstage.jst.go.jp / article / jscejseee / 65 / 1 / 65_1_680 / _article / -char / ja / [Non-Patent Document 4] https: / / www.coronasha.co.jp / np / isbn / 9784339052725 / [Non-Patent Document 5] https: / / www.jstage.jst.go.jp / article / aijs / 68 / 569 / 68_KJ00004089258 / _article / -char / ja / [Non-Patent Document 6] https: / / ascelibrary.org / doi / 10.1061 / %28ASCE%29ST.1943-541X.0000255 Summary of the Invention [Problem to be solved by the invention]
[0005] In the earthquake resistance assessment system as described above, for example, the earthquake resistance of a structure is assessed by using acceleration data measured by multiple acceleration sensors (hereinafter simply referred to as multiple acceleration sensors) placed on each floor of the structure.
[0006] However, in an earthquake resistance assessment system such as that described above, for example, a configuration capable of time-synchronizing multiple acceleration sensors (e.g., wired connections between each acceleration sensor) is required, and the cost and time required to build the system within a structure may be high.
[0007] Therefore, an object of the present invention is to provide an earthquake resistance assessment system, an earthquake resistance assessment device, an earthquake resistance assessment method, and an earthquake resistance assessment program that enable easy assessment of the earthquake resistance of a structure. [Means for solving the problem]
[0008] In order to achieve the above-mentioned object, the earthquake resistance assessment system of the present invention is an earthquake resistance assessment system having an imaging device installed on a floor surface inside a structure and photographing the ceiling surface inside the room, a sensor installed on the floor surface and outputting a signal indicating the degree of vibration of the structure, and an information processing device that assesses the earthquake resistance of the structure, wherein the information processing device has a displacement calculation unit that calculates the displacement between the floor surface and the ceiling surface from multiple image data of the ceiling surface photographed by the imaging device, an information generation unit that generates correspondence information indicating the correspondence between the displacement and the signal from the displacement calculated by the displacement calculation unit and the signal output by the sensor, and an information output unit that outputs the generated correspondence information. Effect of the Invention
[0009] According to the earthquake resistance assessment system, earthquake resistance assessment device, earthquake resistance assessment method, and earthquake resistance assessment program of the present invention, it is possible to easily assess the earthquake resistance of a structure. [Brief description of the drawings]
[0010] [Figure 1] FIG. 1 is a diagram showing an example of the configuration of an earthquake resistance determination system 10 according to the first embodiment. [Diagram 2] FIG. 2 is a diagram showing an example of the configuration of the earthquake resistance determination system 10 according to the first embodiment. [Diagram 3] FIG. 3 is a diagram showing an example of a configuration of the information processing device 11 according to the first embodiment. [Figure 4] FIG. 4 is a diagram for explaining an overview of the earthquake resistance determination process in the first embodiment. [Diagram 5] FIG. 5 is a diagram for explaining an overview of the earthquake resistance determination process in the first embodiment. [Figure 6] FIG. 6 is a flowchart illustrating the earthquake resistance determination process in the first embodiment. [Figure 7] FIG. 7 is a flowchart illustrating the earthquake resistance determination process in the first embodiment. [Figure 8] FIG. 8 is a flowchart illustrating the earthquake resistance determination process in the first embodiment. [Figure 9] FIG. 9 is a diagram for explaining the validity of the earthquake resistance determination process in the first embodiment. [Figure 10] FIG. 10 is a diagram for explaining the validity of the earthquake resistance determination process in the first embodiment. [Figure 11] FIG. 11 is a flow chart illustrating the earthquake resistance determination process in the first modified example. [Figure 12] FIG. 12 is a flow chart illustrating the earthquake resistance determination process in the first modified example. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0011] Hereinafter, the embodiments of the present disclosure will be described with reference to the drawings. However, such description should not be interpreted in a limiting sense, and does not limit the subject matter described in the claims. In addition, various changes, substitutions, and modifications can be made without departing from the spirit and scope of the present disclosure. In addition, different embodiments can be appropriately combined.
[0012] [Example of configuration of earthquake resistance determination system 10 according to the first embodiment] First, a configuration example of an earthquake resistance determination system 10 according to the first embodiment will be described. Fig. 1 and Fig. 2 are diagrams showing a configuration example of an earthquake resistance determination system 10 according to the first embodiment.
[0013] 1, the earthquake resistance assessment system 10 includes, for example, an information processing device 11 (hereinafter also referred to as earthquake resistance assessment device 11), a camera 12 (hereinafter also referred to as image capture device 12), and a sensor 13 capable of measuring acceleration (hereinafter also simply referred to as acceleration sensor 13). The earthquake resistance assessment system 10 is disposed, for example, on a floor surface 21 (surface on the Z2 direction side) in a room 20a of a structure 20 (hereinafter also simply referred to as structure 20). The room 20a may be, for example, a room on the first floor of the structure 20.
[0014] The camera 12 is, for example, a device connected by wire to the information processing device 11, and is a device that captures an image of a range R (hereinafter also referred to as a target range R) from the floor surface 21 to the ceiling surface 22 (the surface on the Z1 direction side) of the room 20a. It is preferable that the range R is a range that includes a characteristic position (hereinafter also simply referred to as a characteristic position), such as a position where a beam is arranged on the ceiling surface 22. The frame rate of the camera 12 may be, for example, 60 (fps).
[0015] The acceleration sensor 13 is, for example, a device connected to the information processing device 11 by wire, and is a sensor capable of measuring the degree of vibration on the floor surface 21 (acceleration data on the floor surface 21). In other words, the acceleration sensor 13 is a sensor that measures the energy input from the ground to the structure 20 when an earthquake occurs, for example.
[0016] Specifically, the acceleration sensor 13 may measure acceleration data on the floor surface 21 at the same timing as when the camera 12 captures an image of the ceiling surface 22, for example.
[0017] The information processing device 11 is, for example, a computer device that performs a process of determining the earthquake resistance of a structure 20 (hereinafter also referred to as earthquake resistance determination process) based on multiple image data of a ceiling surface 22 photographed by a camera 12 and multiple acceleration data measured by an acceleration sensor 13.
[0018] Specifically, as shown in Fig. 2, the information processing device 11 calculates an inter-story displacement D (hereinafter also simply referred to as displacement D), which is a time function of the relative displacement between the floor surface 21 and the ceiling surface 22, from a plurality of image data of the ceiling surface 22 photographed by the camera 12 when an earthquake occurs. More specifically, the information processing device 11 calculates an inter-story displacement D between the floor surface 21 and the ceiling surface 22, from the positions of a range R (for example, a characteristic position included in the range R) captured in each of the plurality of image data photographed by the camera 12 when an earthquake occurs.
[0019] Then, the information processing device 11 generates information indicating the correspondence between the inter-story displacement D and the acceleration data (hereinafter also referred to as correspondence information) from, for example, the calculated inter-story displacement D and a plurality of acceleration data measured by the acceleration sensor 13. The correspondence information is, for example, a performance curve (restoring force characteristics) indicating the correspondence between the inter-story displacement D and the acceleration data. After that, the information processing device 11 outputs, for example, the generated correspondence information.
[0020] That is, the information processing device 11 in this embodiment calculates the inter-story displacement D between the floor surface 21 and the ceiling surface 22 by using image data of the ceiling surface 22 photographed by the camera 12, for example.
[0021] As a result, in the earthquake resistance determination system 10 of this embodiment, for example, it is not necessary to place an acceleration sensor on each floor of the structure 20. Also, in the earthquake resistance determination system 10, for example, it is not necessary to have a system configuration for the purpose of time synchronization of each acceleration sensor (for example, wired connection between each acceleration sensor). Therefore, in the earthquake resistance determination system 10, for example, it is possible to simplify the system configuration, and it is possible to reduce the cost and time required to build the system.
[0022] In the following, a description will be given of a case where each component of the earthquake resistance assessment system 10 (information processing device 11, camera 12, and acceleration sensor 13) is included in a single device, but this is not limited to this. Specifically, each component of the earthquake resistance assessment system 10 may be a separate device, for example, within a range where time synchronization is possible between the camera 12 and the acceleration sensor 13. In addition, in the following, a description will be given of a case where the structure 20 is a two-story house (for example, a wooden house), but this is not limited to this. Specifically, the structure 20 may be, for example, a house or building with three or more stories.
[0023] [Example of configuration of information processing device 11 in the first embodiment] Next, a description will be given of a configuration example of the information processing device 11. Fig. 3 is a diagram showing a configuration example of the information processing device 11 in the first embodiment.
[0024] 3, the information processing device 11 includes, for example, a CPU 101 which is a processor, a memory 102, a communication device 103, a storage medium 104, and an output device 105. Each unit is connected to each other via a bus 106.
[0025] The storage medium 104 has, for example, a program storage area (not shown) for storing a program 110 for performing earthquake resistance determination processing.
[0026] The storage medium 104 also includes a storage unit 130 (hereinafter also referred to as an information storage area 130) that stores information used when performing the earthquake resistance determination process. The storage medium 104 may be, for example, a hard disk drive (HDD) or a solid state drive (SSD).
[0027] The CPU 101 executes, for example, a program 110 loaded from the storage medium 104 to the memory 102 to perform the earthquake resistance determination process.
[0028] The communication device 103 communicates with, for example, the camera 12 and the acceleration sensor 13 by making a wired connection. Also, the communication device 103 communicates with other information processing devices (not shown) arranged on a cloud via a network (not shown) such as the Internet by making a wireless connection with, for example, an access point (not shown).
[0029] The output device 105 is, for example, a device such as a display, and outputs information indicating the results of the earthquake resistance determination process.
[0030] Hereinafter, a case will be described in which the information processing device 11 is disposed on the floor surface 21 as a part of the earthquake resistance assessment system 10, but the present invention is not limited to this. Specifically, the information processing device 11 may be disposed outside the structure 20 or on the cloud within a range in which time synchronization between the camera 12 and the acceleration sensor 13 is possible. Furthermore, the information processing device 11 may be a mobile terminal (e.g., a smartphone, etc.) that wirelessly connects to each of the camera 12 and the acceleration sensor 13, as long as time synchronization between the camera 12 and the acceleration sensor 13 is possible.
[0031] [Outline of earthquake resistance determination process in the first embodiment] Next, an overview of the earthquake resistance determination process in the first embodiment will be described below. Figures 4 and 5 are diagrams for explaining the overview of the earthquake resistance determination process in the first embodiment.
[0032] As shown in FIG. 4, the information processing device 11 realizes various functions including, for example, an equipment control unit 111, an image acquisition unit 112, an acceleration acquisition unit 113, a displacement calculation unit 114, an acceleration calculation unit 115, an information generation unit 116, a seismic resistance assessment unit 117, and an information output unit 118.
[0033] 5, for example, image data 131, acceleration data 132 (hereinafter also referred to as first acceleration data 132), acceleration data 133 (hereinafter also referred to as second acceleration data 133), acceleration data 134, and correspondence information 135 are stored in information storage area 130. Note that acceleration data 132 is, for example, acceleration data on floor surface 21, and is acceleration data measured by acceleration sensor 13. Also, acceleration data 134 is, for example, acceleration data on ceiling surface 22, and is acceleration data calculated by acceleration calculation unit 115, as described later.
[0034] The device control unit 111, for example, issues an instruction (hereinafter also referred to as a first instruction) to the camera 12 to start capturing image data 131. Also, the device control unit 111 issues an instruction (hereinafter also referred to as a second instruction) to the acceleration sensor 13 to start measuring acceleration data 132, for example.
[0035] Specifically, when the device control unit 111 receives, for example, information indicating that an earthquake has occurred or information indicating that an earthquake may occur from another information processing device, it issues a first instruction to the camera 12 and a second instruction to the acceleration sensor 13.
[0036] Furthermore, the device control unit 111 issues, for example, an instruction (hereinafter also referred to as a third instruction) to the camera 12 to end capturing the image data 131. Furthermore, the device control unit 111 issues, for example, an instruction (hereinafter also referred to as a fourth instruction) to the acceleration sensor 13 to end measuring the acceleration data 132.
[0037] Specifically, for example, when the device control unit 111 receives information from another information processing device indicating that the earthquake that occurred has subsided, it issues a third instruction to the camera 12 and a fourth instruction to the acceleration sensor 13.
[0038] It should be noted that the device control unit 111 may be, for example, a unit that autonomously detects the occurrence of an earthquake. And, for example, when the device control unit 111 detects the occurrence of an earthquake, it may be a unit that issues a first instruction to the camera 12 and a second instruction to the acceleration sensor 13. And, for example, when the device control unit 111 detects that the earthquake that occurred has subsided, it may be a unit that issues a third instruction to the camera 12 and a fourth instruction to the acceleration sensor 13.
[0039] Also, the camera 12 may be, for example, a device that autonomously detects the occurrence of an earthquake. And, for example, when the camera 12 detects the occurrence of an earthquake, the camera 12 may be a device that starts photographing the ceiling surface 22. And, for example, when the camera 12 detects that the earthquake that has occurred has subsided, the camera 12 may be a device that stops photographing the ceiling surface 22.
[0040] Similarly, the acceleration sensor 13 may be, for example, a sensor that automatically detects the occurrence of an earthquake. Then, when the acceleration sensor 13 detects the occurrence of an earthquake, it may start measuring the acceleration data 132 on the floor surface 21. Also, when the acceleration sensor 13 detects that the earthquake has subsided, it may end measuring the acceleration data 132 on the floor surface 21.
[0041] The camera 12 may be, for example, a device that constantly captures an image of the ceiling surface 22. Similarly, the acceleration sensor 13 may be, for example, a device that constantly measures acceleration data 132 on the floor surface 21.
[0042] The image acquisition unit 112 acquires, for example, a plurality of image data 131 of the ceiling surface 22 photographed by the camera 12 from the camera 12. Specifically, the image acquisition unit 112 acquires, for example, a plurality of image data 131 of the ceiling surface 22 photographed at the time of the occurrence of an earthquake. After that, the image acquisition unit 112 stores, for example, the acquired plurality of image data 131 in the information storage area 130.
[0043] The acceleration acquiring unit 113 acquires, for example, a plurality of pieces of acceleration data 132 measured by the acceleration sensor 13. Specifically, the acceleration acquiring unit 113 acquires, for example, a plurality of pieces of acceleration data 132 measured when an earthquake occurs. After that, the acceleration acquiring unit 113 stores, for example, the acquired plurality of pieces of acceleration data 132 in the information storage area 130.
[0044] The displacement calculation unit 114 calculates the inter-story displacement D between the floor surface 21 and the ceiling surface 22 from a plurality of image data 131 stored in the information storage area 130, for example.
[0045] Specifically, the displacement calculation unit 114 calculates the inter-layer displacement D between the floor surface 21 and the ceiling surface 22, for example, from the position of the range R reflected in the multiple image data 131 stored in the information storage area 130 and the distance between the floor surface 21 and the ceiling surface 22.
[0046] The distance between the floor surface 21 and the ceiling surface 22 may be, for example, input by an operator, or may be measured by a distance measuring sensor (not shown).
[0047] In addition, the calculation of the interlayer displacement D by the displacement calculation unit 114 may be performed, for example, after the image acquisition unit 112 has completed acquisition of the image data 131, or may be performed in parallel with the image acquisition unit 112 acquiring the image data 131.
[0048] The acceleration calculation unit 115 calculates a plurality of acceleration data 134 on the ceiling surface 22 from a plurality of acceleration data 132 stored in the information storage area 130, for example.
[0049] Specifically, the acceleration calculation unit 115 calculates a time function (hereinafter also referred to as an acceleration function) of the relative acceleration of the ceiling surface 22 with respect to the floor surface 21, for example, by performing second-order differentiation of the inter-story displacement D calculated by the displacement calculation unit 114. Then, the acceleration calculation unit 115 calculates relative acceleration data 133 of the ceiling surface 22 with respect to the floor surface 21 at each measurement timing, for example, by using the calculated acceleration function for each measurement timing of the multiple acceleration data 132 stored in the information storage area 130. After that, the acceleration calculation unit 115 calculates acceleration data 134 by adding each acceleration data 132 and the acceleration data 133 corresponding to each acceleration data 132, for example, for each of the multiple acceleration data 132 stored in the information storage area 130.
[0050] For example, when the acquisition timing of image data 131 acquired by image acquisition unit 112 is not synchronized with the acquisition timing of acceleration data 132 acquired by acceleration acquisition unit 113, acceleration calculation unit 115 may perform a process of matching the acquisition timing of one of image data 131 and acceleration data 132 to the acquisition timing of the other, and then calculate acceleration data 134.
[0051] In addition, the calculation of the acceleration data 134 by the acceleration calculation unit 115 may be performed, for example, after the acceleration acquisition unit 113 has completed acquisition of the acceleration data 132, or may be performed in parallel with the acquisition of the acceleration data 132 by the acceleration acquisition unit 113.
[0052] The information generating unit 116 generates, for example, correspondence information 135 indicating the correspondence between the inter-story displacement D calculated by the displacement calculating unit 114 and the plurality of acceleration data 134 calculated by the acceleration calculating unit 115. The correspondence information 135 is, for example, a performance curve (hereinafter also simply referred to as a performance curve or a skeleton curve) indicating the correspondence between the inter-story displacement D and the plurality of acceleration data 134. Then, the information generating unit 116 stores the generated correspondence information 135 in the information storage area 130, for example.
[0053] The earthquake resistance determining unit 117 determines the earthquake resistance of the structure 20, for example, by referring to the correspondence information 135 stored in the information storage area .
[0054] Specifically, the earthquake resistance determining unit 117 determines the earthquake resistance of the structure 20 according to, for example, the magnitude of the displacement from the yield displacement in the performance curve.
[0055] The information output unit 118 outputs, for example, the result of the determination made by the earthquake resistance determination unit 117 (hereinafter, also simply referred to as the determination result) to the output device 105.
[0056] The information generating unit 116 may calculate the natural frequency and stiffness of the structure 20 in addition to the inter-story displacement D, for example, by using the inter-story displacement D calculated by the displacement calculating unit 114 and the multiple acceleration data 134 calculated by the acceleration calculating unit 115. The earthquake resistance determining unit 117 may determine the earthquake resistance of the structure 20 by referring to the natural frequency and stiffness calculated by the information generating unit 116, for example.
[0057] In addition, the information output unit 118 may output, for example, at least one of the inter-story displacement D, the multiple acceleration data 132, the multiple acceleration data 134, and the corresponding information 135, in addition to or instead of the judgment result by the seismic resistance judgment unit 117.
[0058] Furthermore, the information output unit 118 may transmit, for example, the determination result by the earthquake resistance determination unit 117 to another information processing device arranged on the cloud. That is, the information processing device 11 may accumulate, for example, the determination result by the earthquake resistance determination unit 117 in the other information processing device.
[0059] [Flowchart of earthquake resistance determination processing in the first embodiment] Next, a description will be given of the earthquake resistance determination process in the first embodiment. Figures 6 to 8 are flow charts illustrating the earthquake resistance determination process in the first embodiment.
[0060] [Start acquisition process] First, a process of instructing the camera 12 and the acceleration sensor 13 to start acquiring necessary information (hereinafter, also referred to as acquisition start process) in the earthquake resistance determination process will be described. Fig. 6 is a flow chart for explaining the acquisition start process.
[0061] 6, the device control unit 111 waits until the first device control timing comes (NO in S11). The first device control timing may be, for example, the timing when information indicating that an earthquake has occurred or information indicating that an earthquake may occur is received from another information processing device. The first device control timing may also be, for example, the timing when the information processing device 11 spontaneously detects that an earthquake has occurred.
[0062] Then, when the first device control timing arrives (YES in S11), the device control section 111 issues, for example, an instruction (first instruction) to the camera 12 to start capturing an image of the ceiling surface 22 (S12).
[0063] In this case, the device control section 111 also issues, for example, an instruction (second instruction) to the acceleration sensor 13 to start measuring the acceleration data 132 on the floor surface 21 (S13).
[0064] [End of acquisition process] Next, a process of instructing the camera 12 and the acceleration sensor 13 to end acquisition of necessary information (hereinafter, also referred to as acquisition end process) in the earthquake resistance determination process will be described. Fig. 7 is a flow chart for explaining the acquisition end process.
[0065] 7, the device control unit 111 waits until the second device control timing, for example (NO in S21). The second device control timing may be, for example, the timing when information indicating that the earthquake has subsided is received from another information processing device. The second device control timing may also be, for example, the timing when the information processing device 11 spontaneously detects that the earthquake has subsided. In other words, the second device control timing may be, for example, a timing several seconds to several minutes after the first device control timing.
[0066] Then, when the second device control timing arrives (YES in S21), the device control section 111 issues, for example, an instruction (third instruction) to the camera 12 to end capturing the image of the ceiling surface 22 (S22).
[0067] In this case, the device control section 111 issues, for example, an instruction (fourth instruction) to the acceleration sensor 13 to end the measurement of the acceleration data 132 on the floor surface 21 (S23).
[0068] [Main processing] Next, the main processing of the earthquake resistance determination processing (hereinafter, simply referred to as the main processing) will be described with reference to FIG 8.
[0069] 8, the image acquisition unit 112 waits until it is time to determine earthquake resistance (NO in S31), for example. The earthquake resistance determination timing may be, for example, the timing when an operator inputs information to the information processing device 11 to determine the earthquake resistance of the structure 20. In addition, the earthquake resistance determination timing may be, for example, the timing immediately after the acquisition end process is performed.
[0070] Then, when the time for earthquake resistance determination arrives (YES in S31), the image acquisition unit 112 acquires, for example, a plurality of image data 131 of the ceiling surface 22 photographed by the camera 12 from the camera 12 (S32).
[0071] Specifically, the image acquisition unit 112 acquires a plurality of image data 131 of the ceiling surface 22 captured at the time of the occurrence of an earthquake, for example. After that, the image acquisition unit 112 stores the acquired plurality of image data 131 in the information storage area 130, for example.
[0072] In this case, the acceleration acquisition unit 113 also acquires, for example, a plurality of acceleration data 132 measured by the acceleration sensor 13 (S33).
[0073] Specifically, the acceleration acquiring unit 113 acquires, for example, a plurality of pieces of acceleration data 132 measured when an earthquake occurs. Then, the acceleration acquiring unit 113 stores, for example, the acquired plurality of pieces of acceleration data 132 in the information storage area 130.
[0074] Next, the displacement calculation unit 114 calculates the inter-story displacement D between the floor surface 21 and the ceiling surface 22, for example, from the multiple image data 131 acquired in the process of S32 (S34).
[0075] Specifically, the displacement calculation unit 114 tracks a range R (e.g., a characteristic position included in the range R) captured in each of the multiple image data 131, for example, by using a KCF (Kernelized Correlation Filter). Then, the displacement calculation unit 114 calculates an inter-story displacement D between the floor surface 21 and the ceiling surface 22, for example, from the tracking result of the range R and the distance between the floor surface 21 and the ceiling surface 22.
[0076] Furthermore, the acceleration calculation section 115 calculates acceleration data 134 on the ceiling surface 22 from the plurality of acceleration data 132 acquired in the process of S33 (S35).
[0077] Specifically, the acceleration calculation unit 115 calculates an acceleration function for the relative acceleration of the ceiling surface 22 with respect to the floor surface 21, for example, by performing second-order differentiation of the inter-story displacement D calculated by the displacement calculation unit 114. Then, the acceleration calculation unit 115 calculates relative acceleration data 133 of the ceiling surface 22 with respect to the floor surface 21 at each measurement timing, for example, by using the calculated acceleration function for each measurement timing of the multiple acceleration data 132 stored in the information storage area 130. After that, the acceleration calculation unit 115 calculates acceleration data 134 by adding each acceleration data 132 and the acceleration data 133 corresponding to each acceleration data 132, for example, for each of the multiple acceleration data 132 stored in the information storage area 130.
[0078] In this case, the acceleration calculation unit 115 may calculate an acceleration function of the ceiling surface 22 relative to the floor surface 21, for example, by performing a central difference second differentiation of the inter-story displacement D calculated by the displacement calculation unit 114.
[0079] Next, the information generation unit 116 generates correspondence information 135 indicating the correspondence between, for example, the inter-story displacement D calculated by the displacement calculation unit 114 and the multiple acceleration data 134 calculated by the acceleration calculation unit 115 (S36).
[0080] Specifically, the information generating unit 116 generates, for example, a hysteresis curve indicating the correspondence relationship between the inter-story displacement D and the plurality of acceleration data 134, and further generates a performance curve from the generated hysteresis curve. Then, the information generating unit 116 stores, for example, the generated performance curve in the information storage area 130 as the correspondence information 135.
[0081] Thereafter, the earthquake resistance determining unit 117, for example, refers to the correspondence information 135 generated in the process of S36, and determines the earthquake resistance of the structure 20 (S37).
[0082] Specifically, the earthquake resistance determining unit 117 determines the earthquake resistance of the structure 20 according to the magnitude of the displacement from the yield displacement in the performance curve generated in the process of S36, for example.
[0083] Then, the information output unit 118 outputs, for example, the determination result in the process of S37 to the output device 105 (S38).
[0084] That is, the information processing device 11 in this embodiment calculates the inter-story displacement D by using image data of the ceiling surface 22 photographed by the camera 12, for example.
[0085] As a result, in the earthquake resistance assessment system 10 of this embodiment, for example, it is not necessary to place an acceleration sensor on each floor of the structure 20. Also, in the earthquake resistance assessment system 10, for example, it is not necessary to have a system configuration for the purpose of time synchronization of each acceleration sensor. Therefore, in the earthquake resistance assessment system 10, for example, it is possible to simplify the system configuration, and it is possible to reduce the cost and time required to build the system.
[0086] Furthermore, when calculating the inter-story displacement D by integrating acceleration data measured by an acceleration sensor arranged on each floor, it is difficult to measure the residual displacement, and measurement errors for non-linear vibrations in the structure 20 become large. In contrast, the earthquake resistance assessment system 10 of this embodiment calculates the inter-story displacement D using, for example, image data of the ceiling surface 22 photographed by the camera 12, thereby eliminating the need to integrate the acceleration measured by the acceleration sensor arranged on each floor. Therefore, the earthquake resistance assessment system 10 can improve the calculation accuracy of the inter-story displacement D compared to, for example, calculating the inter-story displacement D by integrating acceleration data.
[0087] Furthermore, as explained in FIG. 2 etc., for example, when the earthquake resistance assessment system 10 is a single device and the information processing device 11 is a small device such as an MCU (Micro Control Unit), an operator can easily install the earthquake resistance assessment system 10 within the structure 20.
[0088] The space between the first and second floors of the structure 20 is a location where a large load is applied when an earthquake occurs, for example. Therefore, the earthquake resistance assessment system 10 in this embodiment is particularly effective when it is placed on the floor surface 21 of the first floor of the structure 20 and measures the inter-story displacement D between the first and second floors of the structure 20 to assess the earthquake resistance of the structure 20.
[0089] Furthermore, the results of earthquake resistance assessment by the earthquake resistance assessment system 10 in this embodiment can be used not only for diagnosing the earthquake resistance of the structure 20, but also for other purposes such as calculating the asset value of the structure 20.
[0090] [Validity of earthquake resistance determination process in the first embodiment] Next, the validity of the earthquake resistance determination process in the first embodiment will be described. Figures 9 and 10 are diagrams for explaining the validity of the earthquake resistance determination process in the first embodiment. Specifically, Figure 9 is a graph showing a hysteresis curve C1 and a skeleton curve C2 in the X-axis direction of the structure 20. Also, Figure 10 is a graph showing a hysteresis curve C1 and a skeleton curve C2 in the Y-axis direction of the structure 20.
[0091] Specifically, in the example shown in Fig. 9 and Fig. 10, the hysteresis curve C1 is, for example, a hysteresis curve generated in the earthquake resistance judgment process (S36) in the first embodiment, and is a hysteresis curve showing the time series relationship between the response displacement (Displacement) and the response acceleration (Acceleration) in the structure 20. In addition, in the example shown in Fig. 9 and Fig. 10, the skeleton curve C2 is, for example, a skeleton curve generated in the earthquake resistance judgment process (S36) in the first embodiment, and is a curve obtained by extracting the points of maximum deformation up to each timing in the hysteresis curve C1 on the positive side and the negative side of the hysteresis curve C1. Furthermore, in the example shown in Fig. 9 and Fig. 10, the straight line L1 is, for example, a straight line showing the slope (slope of the restoring force characteristic) of the skeleton curve (hereinafter also referred to as the reference skeleton curve) generated from the natural frequency of the structure 20.
[0092] 9 and 10, it can be determined that the slope of the skeleton curve C2 and the slope of the reference skeleton curve are approximately the same. Also, in the examples shown in Fig. 9 and 10, it can be determined that the skeleton curve C2 captures the nonlinearity of the skeleton curve in the structure 20 such as a wooden house, or the reduction in rigidity in the structure 20.
[0093] Therefore, it can be determined that the earthquake resistance determination process in this embodiment is a process that allows for appropriate determination (appropriate measurement) of the earthquake resistance of the structure 20.
[0094] [Modification of the earthquake resistance determination process in the first embodiment] Next, a modified example of the earthquake resistance determination process in the first embodiment (hereinafter, also referred to as the first modified example) will be described. Figures 11 and 12 are flow charts for explaining the earthquake resistance determination process in the first modified example. Specifically, Figures 11 and 12 are modified examples of the process of S34 described in Figure 8. Note that the following describes a case where the displacement calculation unit 114 tracks the range R reflected in each image data 131 by using KCF.
[0095] As shown in FIG. 11, the displacement calculation unit 114, for example, identifies a plurality of image data 131 (hereinafter also referred to as a plurality of first image data 131) captured by the camera 12 at an earlier timing among a plurality of image data 131 (a plurality of image data 131 acquired in the processing of S32) stored in the information storage area 130 (S41).
[0096] Then, the displacement calculation unit 114 acquires, for example, one piece of first image data 131 from the multiple pieces of first image data 131 identified in the process of S41, and generates a model (hereinafter also simply referred to as a model) by using the acquired first image data 131 (S42). The model is, for example, a model for a range R that can be compared with each piece of image data 131. In other words, the model is, for example, a model used to track the range R in each piece of image data 131. Specifically, the displacement calculation unit 114 acquires, for example, one piece of first image data 131 that was captured by the camera 12 at the earliest timing, and generates a model by using the acquired first image data 131.
[0097] Next, the displacement calculation unit 114 acquires one piece of first image data 131 from the plurality of first image data 131 identified in the process of S41 and not acquired in the process of S42 (S43). Specifically, the displacement calculation unit 114 acquires one piece of first image data 131 in ascending order of the timing of shooting by the camera 12, for example.
[0098] Next, the displacement calculation unit 114, for example, identifies the position of the range R in the first image data 131 acquired in the process of S43 (S44). Then, the displacement calculation unit 114 stores the identified position in the information storage area 130, for example.
[0099] The displacement calculation unit 114 also calculates, for example, a degree of match between the first image data 131 acquired in the process of S43 and the model generated (updated) in the process of S42 or in the process of S46 described later (S45). Then, the displacement calculation unit 114 stores, for example, the calculated degree of match in the information storage area 130.
[0100] Then, the displacement calculation unit 114 updates the model by using, for example, the first image data 131 acquired in the process of S43 (S46).
[0101] After that, the displacement calculation unit 114 determines whether or not all of the multiple first image data 131 have been acquired in the process of S43 (S47).
[0102] As a result, when it is determined in the process of S43 that all of the plurality of first image data 131 have not been acquired (NO in S47), the displacement calculation unit 114 performs, for example, the processes from S43 onwards again.
[0103] On the other hand, when it is determined in the process of S43 that all of the multiple first image data 131 have been acquired (YES in S47), the displacement calculation unit 114 calculates, for example, an average value (hereinafter also referred to as a threshold value) of the degrees of agreement calculated in the process of S45 (S48). Then, the displacement calculation unit 114 stores, for example, the calculated threshold value in the information storage area 130.
[0104] Next, as shown in FIG. 12, the displacement calculation unit 114 identifies, for example, a plurality of image data 131 (hereinafter also referred to as a plurality of second image data 131) stored in the information storage area 130 (S51).
[0105] Specifically, the displacement calculation unit 114 may, for example, identify a plurality of image data 131 other than the plurality of first image data 131 identified in the processing of S41 from among the plurality of image data 131 stored in the information storage area 130.
[0106] Then, the displacement calculation unit 114 acquires, for example, one piece of second image data 131 from the plurality of second image data 131 identified in the process of S51 (S52). Specifically, the displacement calculation unit 114 acquires, for example, one piece of second image data 131 in order of the earliest capture timing by the camera 12.
[0107] Next, the displacement calculation unit 114, for example, identifies the position of the range R in the second image data 131 acquired in the process of S52 (S53). Then, the displacement calculation unit 114 stores the identified position in the information storage area 130, for example.
[0108] The displacement calculation unit 114 also calculates the degree of match between the second image data 131 acquired in the process of S52 and the model updated in the process of S46 or the process of S56 described later (S54). Then, the displacement calculation unit 114 stores the calculated degree of match in the information storage area 130, for example.
[0109] Thereafter, the displacement calculation unit 114 determines whether or not the degree of match calculated in the process of S54 is equal to or greater than the threshold value stored in the information storage area 130 (the threshold value calculated in the process of S48) (S55).
[0110] As a result, if it is determined that the degree of match calculated in the processing of S54 is equal to or greater than the threshold value (YES in S55), the displacement calculation unit 114 updates the model, for example, by using the second image data 131 acquired in the processing of S52 (S56).
[0111] On the other hand, if it is determined that the degree of match calculated in the process of S54 is less than the threshold value (NO in S55), the displacement calculation unit 114 does not perform the process of S56, for example.
[0112] Then, after the processing of S56 has been performed, or if it is determined that the degree of similarity calculated in the processing of S55 is less than a threshold value (NO in S55), the displacement calculation unit 114 determines, for example, whether or not all of the multiple second image data 131 have been acquired in the processing of S52 (S57).
[0113] As a result, when it is determined in the process of S52 that all of the plurality of second image data 131 have not been acquired (NO in S57), the displacement calculation unit 114 performs, for example, the processes from S52 onwards again.
[0114] On the other hand, if it is determined in the processing of S52 that all of the multiple second image data 131 have been acquired (YES in S57), the displacement calculation unit 114 calculates the inter-layer displacement D between the floor surface 21 and the ceiling surface 22, for example, from each of the positions of the range R stored in the information storage area 130 (each of the positions identified in the processing of S44 and the processing of S53) and the distance between the floor surface 21 and the ceiling surface 22 (S58).
[0115] That is, the second image data 131 with a low degree of match calculated in the process of S55 can be determined to be, for example, second image data 131 with a large blur when photographed by the camera 12. If such second image data 131 is also used for updating the model, the information processing device 11 may, for example, be unable to generate (update) the model with high accuracy, and may be unable to calculate the inter-story displacement D with high accuracy.
[0116] Therefore, the information processing device 11 in this modified example generates (updates) a model without using the second image data 131 for which it has been determined that the degree of match calculated in the process of S54 is not equal to or greater than the threshold.
[0117] This enables the information processing device 11 to, for example, generate (update) a model with high accuracy, and to calculate the inter-story displacement D between the floor surface 21 and the ceiling surface 22 with high accuracy. [Explanation of symbols]
[0118] 1: Information processing device 2: Operation terminal 10: Information processing systems 20: Structure 101:CPU 102: Memory 103: Communication equipment 104:Storage medium 105: Output device 106: Bus 110: Program 111: Equipment control unit 112: Image acquisition unit 113: Acceleration acquisition section 114: Displacement calculation unit 115: Acceleration calculation unit 116: Information generation section 117:Earthquake resistance determination section 118: Information output section 130: Information storage area 131: Image data 132: Acceleration data 133: Acceleration data 134: Target information
Claims
1. An imaging device that is installed on a floor surface inside a room of the structure and captures an image of a ceiling surface inside the room; a sensor that is installed on the floor surface and outputs a signal that indicates a degree of vibration of the structure; An information processing device for determining the earthquake resistance of the structure, The information processing device includes: a displacement calculation unit that calculates a displacement between the floor surface and the ceiling surface from a plurality of image data of the ceiling surface captured by the imaging device; an information generating unit that generates correspondence information indicating a correspondence relationship between the displacement calculated by the displacement calculating unit and a signal output by the sensor, based on the displacement and the signal; and an information output unit that outputs the generated correspondence information. The earthquake resistance assessment system is characterized by:
2. Further, a seismic resistance determination unit that determines the seismic resistance of the structure based on the correspondence information generated by the information generation unit, The information output unit outputs a result of the determination by the earthquake resistance determination unit.
2. The earthquake resistance determination system according to claim 1 .
3. the sensor is an acceleration sensor that measures and outputs a first acceleration on the floor surface, and an acceleration calculation unit that calculates a second acceleration on the ceiling surface by adding a value calculated by performing a second differentiation of the displacement calculated by the displacement calculation unit and the first acceleration output by the acceleration sensor, The information generation unit generates the correspondence information indicating a correspondence relationship between the displacement calculated by the displacement calculation unit and the second acceleration calculated by the acceleration calculation unit.
2. The earthquake resistance determination system according to claim 1 .
4. The displacement calculation unit calculating a degree of coincidence between each of the plurality of image data and a specific image data among the plurality of image data; calculating the displacement by using a model generated from image data, among the plurality of image data, whose degree of coincidence is equal to or greater than a threshold value; 2. The earthquake resistance determination system according to claim 1 .
5. The structure is a two-storey structure; The floor surface is a floor surface of a first floor of the structure, The ceiling surface is a ceiling surface of the first floor and a floor surface of the second floor of the structure, 2. The earthquake resistance determination system according to claim 1 .
6. a displacement calculation unit that calculates a displacement between the floor surface and the ceiling surface from a plurality of image data of the ceiling surface captured by an imaging device that is installed on a floor surface in a room of a structure and captures an image of the ceiling surface in the room; an information generating unit that generates correspondence information indicating a correspondence relationship between the displacement calculated by the displacement calculating unit and a signal output by a sensor that is installed on the floor surface and outputs a signal indicating a degree of vibration of the structure, based on the displacement calculated by the displacement calculating unit and the signal; and an information output unit that outputs the generated correspondence information. The earthquake resistance assessment device is characterized by the above.
7. Calculating a displacement between the floor surface and the ceiling surface from a plurality of image data of the ceiling surface captured by an imaging device installed on a floor surface in a room of a structure and capturing an image of the ceiling surface in the room; generating correspondence information indicating a correspondence relationship between the calculated displacement and a signal output by a sensor that is installed on the floor surface and outputs a signal indicating a degree of vibration of the structure; outputting the generated correspondence information; A method for judging earthquake resistance, characterized in that the processing is executed by a computer.
8. Calculating a displacement between the floor surface and the ceiling surface from a plurality of image data of the ceiling surface captured by an imaging device installed on a floor surface in a room of a structure and capturing an image of the ceiling surface in the room; generating correspondence information indicating a correspondence relationship between the calculated displacement and a signal output by a sensor that is installed on the floor surface and outputs a signal indicating a degree of vibration of the structure; outputting the generated correspondence information; A seismic resistance assessment program for causing a computer to execute processing.
Citation Information
Patent Citations
Interlayer displacement measuring system
JP2021169983A