Adjustment method, program and measurement device

Abstract

To appropriately adjust a measurement device that measures the moisture content of a target using electromagnetic waves.SOLUTION: An adjustment method for a measurement device 100 that measures the moisture content of a measurement target SA using electromagnetic waves includes the steps of: irradiating a dielectric having a predetermined weight with electromagnetic waves; measuring parameters related to the transmitted electromagnetic waves that have passed through the dielectric; repeating the irradiation of the electromagnetic waves and the measurement of the parameters related to the transmitted electromagnetic waves by changing the weight of the dielectric; calculating an actual measurement function based on the weight of the dielectric and the parameters related to the transmitted electromagnetic waves on the basis of the measurement result of the parameters related to the transmitted electromagnetic waves obtained for the plural weights of the dielectric; and adjusting the measurement device 100 so that the actual measurement function matches a reference function being the reference function based on the weight of the dielectric and the parameters related to the transmitted electromagnetic waves.SELECTED DRAWING: Figure 3

Description

[Technical field]

[0001] The present invention relates to an adjustment method for a measuring device that measures the moisture content of an object using electromagnetic waves, a program for causing a computer to execute the adjustment method, and the measuring device. [Background technology]

[0002] There is known a measuring device that uses electromagnetic waves to measure the moisture content of a given object. In measuring the moisture content using electromagnetic waves, the dielectric constant of the object changes depending on the moisture content. Therefore, this measuring device includes an irradiating unit that irradiates the object with electromagnetic waves and a receiving unit that receives the electromagnetic waves that have passed through the object, and measures the moisture content from the dielectric constant of the object calculated based on the amplitude change of the received electromagnetic waves and the phase delay of the received electromagnetic waves (see, for example, Patent Document 1). [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Patent Publication No. 2021-012128 Summary of the Invention [Problem to be solved by the invention]

[0004] It is being considered to install a moisture content measuring device using electromagnetic waves in a place where various manufacturing processes are carried out, such as a factory, and measure the moisture content of products (e.g., food) produced in the manufacturing process. With this measuring device, errors may occur in the measurement results due to aging of the device, disturbances, etc. Therefore, in order to obtain stable measurement results with this measuring device, it is necessary to adjust the measuring device.

[0005] The locations where measurement devices are installed and various manufacturing processes are carried out are often not environmentally controlled, and various disturbances occur that can affect moisture content measurements. While adjustment of the measurement device is necessary to obtain stable measurement results, it is difficult to adjust the measurement device in an environment where many disturbances occur.

[0006] An object of the present invention is to appropriately adjust a measuring device that measures the moisture content of an object using electromagnetic waves. [Means for solving the problem]

[0007] An adjustment method according to one aspect of the present invention is a method for adjusting a measurement device that measures the moisture content of a measurement object using electromagnetic waves. The adjustment method includes the following steps. A step of irradiating a dielectric body having a predetermined weight with electromagnetic waves. Measuring parameters related to the electromagnetic wave passing through the dielectric. A step of repeatedly changing the weight of the dielectric material and irradiating the electromagnetic wave and measuring parameters related to the passing electromagnetic wave. A step of calculating an actual measurement function based on the weight of the dielectric and the parameters related to the passing electromagnetic wave, based on the measurement results of the parameters related to the passing electromagnetic wave obtained for the multiple weights of the dielectric. A step of adjusting the measuring device so that the measured function coincides with a reference function, which is a reference function based on the weight of the dielectric material and parameters related to the passing electromagnetic wave. Effect of the Invention

[0008] In the above-mentioned method for adjusting a measuring device, electromagnetic waves are irradiated onto a plurality of dielectrics having different weights to obtain parameters related to a plurality of passing electromagnetic waves, an actual measurement function is calculated based on the measurement results, and the measuring device is adjusted so that the calculated actual measurement function coincides with the reference function. In this way, by adjusting the measuring device so that the actual measurement function coincides with the reference function, the measuring device can be appropriately adjusted to a predetermined standard. Furthermore, since a dielectric has a relatively large dielectric constant, even if a function obtained using a dielectric is affected by disturbance, the degree of the effect is small. By adjusting the measuring device using a function obtained using a dielectric that is less affected by disturbance, the measuring device can be accurately adjusted. [Brief description of the drawings]

[0009] [Figure 1] FIG. 2 is a diagram showing a configuration of a measuring device. [Diagram 2] 10 is a flowchart showing a method for adjusting the measurement device. [Diagram 3] 11 is a flowchart showing a phase adjustment method. [Figure 4] FIG. 11 is a diagram illustrating an example of a case where a first actual function does not match a first reference function. [Diagram 5] 13 is a flowchart showing a method for adjusting amplitude. [Figure 6] 13 is a diagram showing an example of a case where a second actual function does not match a second reference function; FIG. [Figure 7] 13A and 13B are diagrams illustrating other examples of the actual measurement function and the reference function. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0010] (1) Measuring device configuration Hereinafter, a moisture content measuring device 100 according to one embodiment will be described with reference to the drawings. The measuring device 100 is a device for measuring the moisture content of a measurement object SA using electromagnetic waves. The measuring device 100 is installed, for example, in a factory that manufactures food. That is, the measuring device 100 can measure, for example, food manufactured in the factory as the measurement object SA for moisture content.

[0011] As shown in Fig. 1, the measuring device 100 includes an irradiation unit 1, a receiving unit 3, an information processing unit 5, and an adjustment sample supply unit 7. Fig. 1 is a diagram showing the configuration of the measuring device 100. The irradiation unit 1 is disposed on top of a transport device 9 that transports a measurement target SA. The transport device 9 is, for example, a belt conveyor. The irradiation unit 1 irradiates electromagnetic waves to the measurement target SA that has been transported by the transport device 9 to the arrangement position of the irradiation unit 1. The irradiation unit 1 is, for example, a horn antenna.

[0012] The receiving unit 3 is disposed at a position facing the irradiating unit 1 and separated by a predetermined distance d across the transport device 9. The receiving unit 3 receives electromagnetic waves (referred to as passed electromagnetic waves) that are irradiated from the irradiating unit 1 and pass through the measurement target SA placed on the transport device 9. The receiving unit 3 is, for example, a horn antenna.

[0013] The irradiation unit 1 is movable in a direction toward or away from the receiving unit 3. That is, the distance d between the irradiation unit 1 and the receiving unit 3 is changeable. The movement of the irradiation unit 1 can be realized by a moving mechanism such as a jack.

[0014] The information processing unit 5 executes control related to the measuring device 100 and various information processing. The information processing unit 5 has an electromagnetic wave measuring unit 51 and an information processing device 53. The electromagnetic wave measuring unit 51 is connected to the irradiating unit 1 and outputs a high-frequency signal for outputting an electromagnetic wave from the irradiating unit 1 to the irradiating unit 1. The electromagnetic wave measuring unit 51 also inputs the electromagnetic wave received by the receiving unit 3 as a high-frequency signal. The electromagnetic wave measuring unit 51 measures the amount of change in the amplitude of the electromagnetic wave received by the receiving unit 3 relative to the amplitude of the electromagnetic wave irradiated from the irradiating unit 1, and the phase delay of the phase of the electromagnetic wave received by the receiving unit 3 relative to the phase of the electromagnetic wave irradiated from the irradiating unit 1. The electromagnetic wave measuring unit 51 is, for example, a vector network analyzer (VNA). The electromagnetic wave irradiated from the irradiating unit 1 has, for example, a frequency on the order of gigahertz.

[0015] The information processing device 53 is a computer system including a CPU, a storage device (RAM, ROM, SSD, hard disk, etc.), various interfaces, and a display device. The information processing device 53 is, for example, a personal computer, a tablet terminal, or a mobile terminal. The information processing device 53 performs various information processing related to the measuring device 100.

[0016] The information processing device 53 is connected to the electromagnetic wave measuring unit 51 and is capable of receiving from the electromagnetic wave measuring unit 51 the above-mentioned amplitude change and phase delay measured by the electromagnetic wave measuring unit 51. The information processing device 53 calculates the moisture content of the measurement object SA based on the amplitude change and phase delay of the received electromagnetic wave relative to the irradiated electromagnetic wave, which are obtained when the measurement object SA is irradiated with electromagnetic waves from the irradiation unit 1. Specifically, the information processing device 53 calculates the moisture content based on the ratio of the amplitude change and phase delay of the electromagnetic wave (amplitude change / phase delay).

[0017] The adjustment sample supplying unit 7 supplies the adjustment sample AJ to the transporting device 9, which then moves the adjustment sample AJ to the arrangement position of the irradiation unit 1 and the receiving unit 3. The adjustment sample AJ is used to acquire data for adjusting the measurement device 100. In other words, the adjustment sample AJ is an "internal standard" provided in the measurement device 100 for adjusting the measurement device 100. The adjustment sample AJ is a dielectric material having a known weight and dielectric constant. There are a plurality of adjustment samples AJ1, AJ2, AJ3, ... with different weights. The types (number) of adjustment samples AJ can be any number.

[0018] The adjustment sample AJ is preferably composed of a dielectric material having a relatively large dielectric constant. An example of a dielectric material that can be used as the adjustment sample AJ is zirconia (ZrO2) (dielectric constant: about 35). In addition, ceramics such as alumina (Al2O3) (dielectric constant: about 10) can also be used as the adjustment sample AJ. Such substances have a relatively large dielectric constant and are chemically stable (i.e., their characteristics are unlikely to change), so they do not require replacement or the frequency of replacement can be reduced, making them suitable for the adjustment sample AJ. In addition, sodium tartrate (dielectric constant: about 4000), pure water, etc. can also be used as the adjustment sample AJ. A mixture of the substances listed above may be used as the adjustment sample AJ.

[0019] The adjustment sample AJ is made of, for example, powder of the above-mentioned dielectric material. When the adjustment sample AJ is made of powder, the powder is filled into a plastic container or the like, or the powder is covered with a plastic sheet to prepare the adjustment sample AJ. This makes it possible to prevent the adjustment sample AJ, which is a powder, from scattering into the atmosphere and contaminating the measurement target SA or the like. Alternatively, the adjustment sample AJ can be made of a plate-shaped member of the above-mentioned material.

[0020] In the measuring device 100, a plurality of adjustment samples AJ1, AJ2, AJ3, ... are arranged one by one between the irradiating unit 1 and the receiving unit 3, an electromagnetic wave is irradiated from the irradiating unit 1 to one of the arranged adjustment samples, the electromagnetic wave that has passed through the adjustment sample (called a passed electromagnetic wave) is received by the receiving unit 3, and the amplitude change amount and phase delay of the passed electromagnetic wave with respect to the irradiated electromagnetic wave are obtained. This is repeatedly performed by changing the adjustment sample arranged between the irradiating unit 1 and the receiving unit 3 (i.e., by changing the weight of the dielectric), and a function based on the weight of the dielectric and the phase delay and a function based on the weight of the dielectric and the amplitude change amount (called a second measured function) are calculated using the multiple amplitude change amounts and phase delays obtained for the multiple adjustment samples (weight of the dielectric). The measuring device 100 is adjusted using the first measured function and the second measured function.

[0021] In this embodiment, the first measured function is a calibration curve (called the first measured calibration curve) that represents the relationship between the weight of the dielectric and the phase delay, and the second measured function is a calibration curve (called the second measured calibration curve) that represents the relationship between the weight of the dielectric and the amount of change in amplitude.

[0022] (2) How to adjust the measuring device A method for adjusting the measuring device 100 will be described below with reference to Fig. 2. Fig. 2 is a flowchart showing the method for adjusting the measuring device 100. In this embodiment, the measuring device 100 is adjusted so that a function based on parameters (i.e., phase, amplitude) of an electromagnetic wave used to measure the moisture content of the measurement target SA coincides with a reference function.

[0023] First, phase adjustment is performed in the measurement device 100 (step S1). The phase adjustment is performed according to the flowchart in FIG. 3. FIG. 3 is a flowchart showing a phase adjustment method. First, an adjustment sample AJ having a predetermined weight of a dielectric is placed between the irradiation unit 1 and the receiving unit 3 (step S11). Specifically, the adjustment sample supply unit 7 supplies one of the multiple adjustment samples AJ1, AJ2, AJ3, ... to the transport device 9. The transport device 9 transports the adjustment sample AJ supplied from the adjustment sample supply unit 7 to between the irradiation unit 1 and the receiving unit 3.

[0024] Next, the electromagnetic wave measuring unit 51 irradiates the adjustment sample AJ with electromagnetic waves from the irradiating unit 1 (step S12). The electromagnetic waves irradiated from the irradiating unit 1 pass through the adjustment sample AJ arranged between the irradiating unit 1 and the receiving unit 3, and are received by the receiving unit 3. The electromagnetic waves received by the receiving unit 3 are the passed electromagnetic waves.

[0025] The electromagnetic wave measuring unit 51 compares the electromagnetic wave irradiated from the irradiating unit 1 with the passing electromagnetic wave, and measures the phase delay of the passing electromagnetic wave received by the receiving unit 3 with respect to the phase of the electromagnetic wave irradiated from the irradiating unit 1 (step S13). Specifically, the difference between the phase of the passing electromagnetic wave and the phase of the electromagnetic wave from the irradiating unit 1 is calculated as the phase delay. In this manner, the phase delay of the passing electromagnetic wave with respect to the electromagnetic wave from the irradiating unit 1 can be measured for one adjustment sample AJ (weight of one type of dielectric). The information processing device 53 stores the phase delay obtained in step S13 in association with the weight of the dielectric when the phase delay was measured in the storage device.

[0026] The phase delay measurement performed in steps S12 and S13 may be repeated multiple times (for example, about five times). In this case, the phase delays measured each time are averaged to calculate the final phase delay result.

[0027] Next, it is determined whether or not to end the measurement of the phase delay (step S14). Specifically, it is determined to end the measurement of the phase delay when a predetermined number or more of combinations of the weight of the dielectric and the phase delay are obtained to such an extent that an accurate first measurement function (a calibration curve representing the relationship between the weight of the dielectric and the measured phase delay) can be generated.

[0028] If a predetermined number or more of combinations of dielectric weight and phase delay have not been obtained and the measurement of the phase delay is to be continued ("No" in step S14), the weight of the dielectric (adjustment sample AJ) to be placed between the irradiation unit 1 and the receiving unit 3 is changed (step S15), i.e., the adjustment sample AJ is changed, and the above steps S11 to S13 are executed again.

[0029] On the other hand, when the measurement of the phase delay is terminated by acquiring a predetermined number or more of combinations of the weights and phase delays of the dielectrics ("Yes" in step S14), the information processing device 53 calculates the first actual measurement function using the acquired combinations of the weights and phase delays of the dielectrics (step S16). Specifically, the information processing device 53 calculates specific values ​​of a1 and b1 by fitting the combinations of the weights and phase delays of the dielectrics obtained by executing steps S11 to S15 to y=a1*x+b1 (x: weight of the dielectric, y: phase delay, a1, b1: constants) representing the first actual measurement function (first actual measurement calibration curve) by the least squares method or the like, thereby calculating the first actual measurement function. The information processing device 53 stores the calculated first actual measurement function in the storage device.

[0030] After calculating the first actual function, the information processing device 53 judges whether or not the first actual function calculated in step S16 coincides with a reference function, which is a reference function based on the weight and phase delay of the dielectric (step S17). The first reference function is, for example, a function based on the weight and phase delay of the dielectric obtained by performing the same processing as in steps S11 to S16 in a reference measuring device that has been appropriately adjusted. Specifically, the first reference function is, for example, a first reference calibration curve that represents the relationship between the weight and phase delay of the dielectric obtained by the reference measuring device. The first reference calibration curve can be expressed, for example, as y=a*x+b (x: weight of dielectric, y: phase delay, a, b: constants).

[0031] The information processing device 53 can determine that the first measured function and the first standard function are consistent, for example, when the difference between the constant a1 of the first measured function and the constant a of the first standard function is less than or equal to a first threshold value, and the difference between the constant b1 of the first measured function and the constant b of the first standard function is less than or equal to a second threshold value.

[0032] If the first actual function and the first reference function match ("Yes" in step S17), the information processing device 53 determines that the phase has been appropriately adjusted in the measurement device 100, and ends the phase adjustment operation.

[0033] On the other hand, if the first actual function and the first reference function do not match ("No" in step S17), the information processing device 53 determines that the phase has not been appropriately adjusted in the measurement device 100. In this case, the phase is adjusted in the measurement device 100 so that the first actual function matches the first reference function (step S18).

[0034] The phase adjustment in the measurement device 100 can be achieved, for example, by adjusting the distance d between the irradiation unit 1 and the receiving unit 3. For example, the phase delay can be reduced by reducing the distance d between the irradiation unit 1 and the receiving unit 3. The phase delay can be increased by increasing the distance d between the irradiation unit 1 and the receiving unit 3. The distance d between the irradiation unit 1 and the receiving unit 3 can be adjusted, for example, by moving the irradiation unit 1 relative to the receiving unit 3 using a moving mechanism.

[0035] For example, as shown in Fig. 4, when the slopes of the first actual measurement function and the first reference function are almost the same (i.e., the difference between the constant a1 of the first actual measurement function and the constant a of the first reference function is equal to or smaller than the first threshold value), but the first actual measurement function is significantly shifted from the first reference function (i.e., the difference between the constant b1 of the first actual measurement function and the constant b of the first reference function is greater than the second threshold value), the first actual measurement function can be shifted by changing the distance d between the irradiation unit 1 and the reception unit 3 to approach the first reference function. Fig. 4 is a diagram showing an example of a case where the first actual measurement function and the first reference function do not match.

[0036] Alternatively, the phase adjustment in the measurement device 100 can be achieved, for example, by adjusting the frequency of the electromagnetic wave output from the irradiation unit 1. Increasing the frequency of the electromagnetic wave shortens the wavelength of the electromagnetic wave, and therefore the phase delay can be increased. In addition, decreasing the frequency of the electromagnetic wave lengthens the wavelength of the electromagnetic wave, and therefore the phase delay can be reduced. The frequency of the electromagnetic wave output from the irradiation unit 1 can be adjusted, for example, by adjusting the settings of the electromagnetic wave measurement unit 51.

[0037] Furthermore, by adjusting both the distance d between the irradiating unit 1 and the receiving unit 3 and the frequency of the electromagnetic wave output from the irradiating unit 1, the phase in the measuring device 100 can also be adjusted.

[0038] After performing the above steps S11 to S18 to adjust the phase in measurement device 100, amplitude adjustment is performed in measurement device 100 (step S2 in FIG. 2). The amplitude adjustment can be performed in the same manner as the above phase adjustment. Specifically, the amplitude adjustment is performed according to the flowchart in FIG. 5. FIG. 5 is a flowchart showing the amplitude adjustment method.

[0039] First, an adjustment sample AJ having a predetermined weight of a dielectric is placed between the irradiation unit 1 and the receiving unit 3 (step S21). The adjustment sample supplying unit 7 supplies one of the multiple adjustment samples AJ1, AJ2, AJ3, ... to the transporting device 9. The transporting device 9 transports the adjustment sample AJ supplied from the adjustment sample supplying unit 7 to between the irradiation unit 1 and the receiving unit 3.

[0040] Next, the electromagnetic wave measuring unit 51 irradiates the adjustment sample AJ with electromagnetic waves from the irradiating unit 1 (step S22). The electromagnetic waves irradiated from the irradiating unit 1 pass through the adjustment sample AJ arranged between the irradiating unit 1 and the receiving unit 3, and are received by the receiving unit 3. The electromagnetic waves received by the receiving unit 3 are the passed electromagnetic waves.

[0041] The electromagnetic wave measuring unit 51 compares the electromagnetic wave irradiated from the irradiating unit 1 with the passing electromagnetic wave, and measures the amount of change in the amplitude of the passing electromagnetic wave received by the receiving unit 3 relative to the amplitude of the electromagnetic wave irradiated from the irradiating unit 1 (step S23). Specifically, the ratio of the amplitude of the passing electromagnetic wave to the amplitude of the electromagnetic wave from the irradiating unit 1 is calculated as the amount of change in amplitude. In this manner, the amount of change in the amplitude of the passing electromagnetic wave relative to the electromagnetic wave from the irradiating unit 1 can be measured for one adjustment sample AJ (weight of one type of dielectric). The information processing device 53 stores the amount of change in amplitude obtained in step S13 in association with the weight of the dielectric when the phase delay is measured in the storage device.

[0042] The measurement of the amount of change in amplitude performed in steps S22 and S23 may be repeated multiple times (for example, about five times). In this case, the amount of change in amplitude measured each time is averaged to calculate the amount of change in amplitude as a final result.

[0043] Next, it is determined whether or not to end the measurement of the amount of change in the amplitude (step S24). Specifically, it is determined to end the measurement of the amount of change in the amplitude when a predetermined number or more of combinations of the weight of the dielectric and the amount of change in the amplitude can be obtained to such an extent that an accurate second actual measurement function (a calibration curve showing the relationship between the weight of the dielectric and the amount of change in the actually measured amplitude) can be generated.

[0044] If a predetermined number or more of combinations of the weight of the dielectric and the amount of change in amplitude have not been obtained and measurement of the amount of change in amplitude is to be continued ("No" in step S24), the weight of the dielectric (adjustment sample AJ) placed between the irradiation unit 1 and the receiving unit 3 is changed (step S25), i.e., the adjustment sample AJ is changed, and the above steps S21 to S23 are executed again.

[0045] On the other hand, when the measurement of the amplitude change is terminated by acquiring a predetermined number or more of combinations of the weight of the dielectric and the amplitude change ("Yes" in step S24), the information processing device 53 calculates the second actual measurement function using the acquired combinations of the weight of the dielectric and the amplitude change (step S26). Specifically, the information processing device 53 can calculate the second actual measurement function by fitting the combinations of the weight of the dielectric and the amplitude change and Y=A2*X+B2 (X: weight of the dielectric, Y: amplitude change, A2, B2: constants) representing the second actual measurement function (second actual measurement calibration curve) by the least squares method or the like to calculate specific values ​​of A2 and B2. The information processing device 53 stores the calculated first actual measurement function in the storage device.

[0046] After calculating the second actual measurement function, the information processing device 53 judges whether or not the second actual measurement function calculated in step S26 coincides with a second reference function, which is a reference function based on the weight of the dielectric and the amount of change in amplitude (step S27). The second reference function is, for example, a function based on the weight of the dielectric and the amount of change in amplitude obtained by performing the same processing as in steps S21 to S26 above in a reference measurement device that has been appropriately adjusted. Specifically, the second reference function is a second reference calibration curve that represents the relationship between the weight of the dielectric and the amount of change in amplitude obtained in the reference measurement device. The second reference calibration curve can be expressed, for example, as Y=A*X+B (X: weight of the dielectric, Y: amount of change in amplitude, A, B: constants).

[0047] The information processing device 53 can determine that the second measured function and the second standard function are consistent, for example, when the difference between the constant A2 of the second measured function and the constant A of the second standard function is less than or equal to a third threshold value, and the difference between the constant B2 of the second measured function and the constant B of the second standard function is less than or equal to a fourth threshold value.

[0048] If the second actual function and the second reference function match ("Yes" in step S27), the information processing device 53 determines that the amplitude has been appropriately adjusted in the measurement device 100, and ends the amplitude adjustment operation.

[0049] On the other hand, if the second actual function and the second reference function do not match ("No" in step S27), the information processing device 53 determines that the amplitude has not been appropriately adjusted in the measurement device 100. In this case, the phase is adjusted in the measurement device 100 so that the second actual function matches the second reference function (step S18).

[0050] The phase adjustment in measurement apparatus 100 is performed, for example, by adjusting constant B2 of the second actual function so that the second actual function coincides with the second reference function.

[0051] For example, as shown in Fig. 6, when the second actual measurement function and the second criterion function have almost the same slope, but the second actual measurement function is significantly shifted from the second criterion function, the second actual measurement function can be shifted by changing the constant B2 to approach the second criterion function. Fig. 6 is a diagram showing an example of a case where the second actual measurement function and the second criterion function do not match.

[0052] As described above, the parameters used when measuring the moisture content of the measurement object SA using the measurement device 100 (the phase delay and the amount of change in amplitude of the electromagnetic wave received by the receiving unit 3 relative to the electromagnetic wave irradiated to the measurement object SA) can be adjusted in the same way as the standard measurement device.

[0053] After adjusting the phase and amplitude in the measuring device 100 as described above, the adjusted measuring device 100 may be used to measure the parameters (ratio of amplitude change to phase delay (amplitude change / phase delay)) used in measuring the moisture content of the measurement target SA for each of a plurality of dielectrics having different weights, calculate an actual measurement function of the weight of the dielectric and the parameter, and evaluate whether or not this actual measurement function matches a reference function that represents a reference relationship between the weight of the dielectric and the parameter used in measuring the moisture content. If the actual measurement function does not match the reference function, the above-mentioned adjustment of the phase and / or amplitude may be performed again.

[0054] In the above-mentioned measuring device 100, electromagnetic waves are irradiated onto a plurality of dielectrics having different weights to obtain measurement results of parameters (phase delay, amount of change in amplitude) related to a plurality of passing electromagnetic waves, an actual measurement function is calculated based on the measurement results, and the measuring device is adjusted so that the calculated actual measurement function coincides with a reference function. In this way, by adjusting the measuring device 100 so that the actual measurement function coincides with the reference function, the measuring device 100 can be appropriately adjusted to a predetermined standard. For example, the measuring device 100 can be adjusted to the same state as a reference measuring device.

[0055] In addition, since the dielectric used as the adjustment sample AJ has a relatively large dielectric constant, the function obtained by using the dielectric is only slightly affected by disturbances, even if the function is affected by disturbances. By adjusting the measurement device 100 by using the function obtained by using the dielectric and less affected by disturbances, the measurement device 100 can be adjusted accurately.

[0056] Although one embodiment of the present invention has been described above, the present invention is not limited to the above embodiment, and various modifications are possible without departing from the gist of the invention.

[0057] The processing order and / or processing contents of each step in the flowcharts shown in FIGS. 4 and 6 can be changed as appropriate without departing from the spirit of the invention.

[0058] The measuring device 100 may include an internal calibration sample that can be placed inside the irradiating unit 1 or the receiving unit 3. The internal calibration sample can be, for example, a member that can be placed inside the irradiating unit 1 or the receiving unit 3 (antenna), such as a small dielectric plate-like member. In this case, the internal calibration sample can be placed inside the irradiating unit 1 or the receiving unit 3 to perform the adjustment or calibration of the measuring device 100 described above. The adjustment or calibration using the internal calibration sample can be performed automatically at predetermined time intervals, or can be performed by a user's operation.

[0059] The measurement device 100 may include both the adjustment sample AJ supplied from the adjustment sample supply unit 7 described above, and an internal calibration sample that can be placed inside the irradiation unit 1 or the reception unit 3.

[0060] The actual measurement function and the reference function are not limited to an equation (calibration curve) in which the parameters related to the passing electromagnetic wave are expressed as a linear equation for the weight of the dielectric. For example, as shown in FIG. 7, the actual measurement function and the reference function may be an equation (calibration curve) in which the parameters related to the passing electromagnetic wave are expressed as a higher-order equation for the weight of the dielectric (for example, y=c1*x+c2*x 2+···+d1 (x: weight of dielectric, y: parameters related to the passing electromagnetic wave, c1, c2, ···, d1: constants). For example, the actual measurement function and the reference function can be expressed as a quadratic expression of the weight of the dielectric with respect to the parameters related to the passing electromagnetic wave. In particular, when the relationship between the weight of the dielectric and the parameters related to the passing electromagnetic wave is nonlinear, using a higher-order expression may enable better matching with the actual measurement value. FIG. 7 shows other examples of the actual measurement function and the reference function.

[0061] Furthermore, the actual measurement function and the reference function based on the weight of the dielectric and the parameters related to the electromagnetic wave passing through are not limited to the above-mentioned calibration curve. For example, a trained model obtained by machine learning (for example, learning by artificial intelligence such as deep learning) based on the weight of the dielectric and the parameters related to the electromagnetic wave passing through can be used as the actual measurement function and the reference function. For example, a trained model in which the input is the weight of the dielectric or the measurement object SA, and the ratio of the change in amplitude and the phase delay of the electromagnetic wave (change in amplitude / phase delay), and the output is the moisture percentage (the moisture percentage calculated from the dielectric constant) can be used as the actual measurement function and the reference function.

[0062] When the actual measurement function and the reference function are used as learned models, parameters such as the area of ​​the dielectric or the measurement target SA, and the temperature of the measurement environment can also be input.

[0063] The distance d between the irradiation unit 1 and the receiving unit 3 can be adjusted by moving the irradiation unit 1 relative to the receiving unit 3, but it may also be adjustable by moving the receiving unit 3 relative to the irradiation unit 1.

[0064] It will be appreciated by those skilled in the art that the exemplary embodiments described above are examples of the following aspects.

[0065] (First aspect) An adjustment method for a measurement device that measures the moisture percentage of a measurement object using electromagnetic waves. The adjustment method includes the following steps. A step of irradiating a dielectric body having a predetermined weight with electromagnetic waves. Measuring parameters related to the electromagnetic wave passing through the dielectric. A step of repeatedly changing the weight of the dielectric material and irradiating the electromagnetic wave and measuring parameters related to the passing electromagnetic wave. A step of calculating an actual measurement function based on the weight of the dielectric and the parameters related to the passing electromagnetic wave, based on the measurement results of the parameters related to the passing electromagnetic wave obtained for the multiple weights of the dielectric. A step of adjusting the measuring device so that the measured function coincides with a reference function, which is a reference function based on the weight of the dielectric material and parameters related to the passing electromagnetic wave.

[0066] In the adjustment method of the first aspect, electromagnetic waves are irradiated onto a plurality of dielectrics having different weights to obtain parameters related to a plurality of passing electromagnetic waves, an actual measurement function is calculated based on the measurement results, and the measurement device is adjusted so that the calculated actual measurement function coincides with the reference function. In this way, by adjusting the measurement device so that the actual measurement function coincides with the reference function, the measurement device can be appropriately adjusted to a predetermined standard. Furthermore, since a dielectric has a relatively large dielectric constant, even if a function obtained using a dielectric is affected by disturbance, the degree of the effect is small. By adjusting the measurement device using a function obtained using a dielectric that is less affected by disturbance, the measurement device can be adjusted accurately.

[0067] (Second Aspect) In the adjustment method of the first aspect, the measurement device may include an irradiation unit that irradiates the dielectric with electromagnetic waves and a receiving unit that receives the electromagnetic waves that have passed through the dielectric. In this case, the step of adjusting the measurement device may include a step of adjusting the distance between the irradiation unit and the receiving unit. In the adjustment method of the second aspect, the measurement device 100 can be adjusted by the simple method of adjusting the distance between the irradiation unit and the receiving unit.

[0068] (Third Aspect) In the adjustment method of the first or second aspect, the step of adjusting the measurement device may include a step of changing the frequency of the electromagnetic wave irradiated to the dielectric. In the adjustment method of the third aspect, the measurement device 100 can be adjusted by a simple method of changing the period of the electromagnetic wave output from the irradiation unit.

[0069] (Fourth Aspect) In the adjustment method of any one of the first to third aspects, the parameter related to the passing electromagnetic wave may be a phase delay of the passing electromagnetic wave with respect to the electromagnetic wave irradiated to the dielectric. In the adjustment method of the fourth aspect, the measurement device can be appropriately adjusted by using the phase delay, which is a parameter used in measuring the moisture content of the measurement object.

[0070] (Fifth Aspect) In the adjustment method of any one of the first to fourth aspects, the parameter related to the passing electromagnetic wave may be the amount of change in amplitude of the passing electromagnetic wave relative to the electromagnetic wave irradiated to the dielectric. In the adjustment method of the fifth aspect, the amount of change in amplitude, which is a parameter used in measuring the moisture content of the measurement object, is used to appropriately adjust the measurement device.

[0071] (Sixth Aspect) In the adjustment method of any one of the first to fifth aspects, the actual measurement function and the reference function may be a calibration curve in which a parameter related to the passing electromagnetic wave is expressed by a linear expression for the weight of the dielectric, a calibration curve in which a parameter related to the passing electromagnetic wave is expressed by a higher-order expression for the weight of the dielectric, or a trained model obtained by machine learning based on the parameter related to the passing electromagnetic wave and the weight of the dielectric. In the adjustment method of the sixth aspect, the measurement device can be adjusted using a more appropriate actual measurement function and reference function.

[0072] (Seventh Aspect) In any of the preparation methods of the first to sixth aspects, the dielectric may be zirconia. In the preparation method of the sixth aspect, zirconia, which has a relatively large dielectric constant and is chemically stable, is used as the dielectric, so that the frequency of replacing the dielectric can be reduced.

[0073] (Eighth Aspect) The program of the seventh aspect is a program for causing a computer to execute the adjusting method according to any one of the first to sixth aspects.

[0074] (Ninth Aspect) The measuring device of the eighth aspect measures the moisture content of a measuring object using electromagnetic waves. The measuring device includes an irradiation unit that irradiates the measuring object with electromagnetic waves, a receiving unit that receives the electromagnetic waves that have passed through the measuring object, and an information processing unit that executes information processing regarding the measuring device. In this measuring device, the information processing unit irradiates a dielectric having a predetermined weight with electromagnetic waves from the irradiation unit, receives the passed electromagnetic waves that have passed through the dielectric by the receiving unit, measures parameters related to the passed electromagnetic waves, changes the weight of the dielectric, and repeatedly performs irradiation of the electromagnetic waves and measurement of the parameters related to the passed electromagnetic waves, calculates an actual measurement function based on the weight of the dielectric and the parameters related to the passed electromagnetic waves based on the measurement results of the parameters related to the passed electromagnetic waves obtained for the multiple weights of the dielectric, and adjusts the measuring device so that the actual measurement function coincides with a reference function that is a reference function based on the weight of the dielectric and the parameters related to the passed electromagnetic waves.

[0075] In the measurement device of the ninth aspect, electromagnetic waves are irradiated onto a plurality of dielectrics having different weights to obtain parameters related to a plurality of passing electromagnetic waves, an actual measurement function is calculated based on the measurement results, and the measurement device is adjusted so that the calculated actual measurement function coincides with a reference function. In this way, by adjusting the measurement device so that the actual measurement function coincides with the reference function, the measurement device can be appropriately adjusted to a predetermined standard.

[0076] In addition, since a dielectric has a relatively large dielectric constant, even if a function obtained by using a dielectric is affected by disturbance, the degree of the effect is small. By adjusting a measuring device using a function obtained by using a dielectric and less affected by disturbance, it is possible to perform accurate adjustment of the measuring device.

[0077] (10th Aspect) The measurement device of the 9th aspect may further include a plurality of adjustment samples each having a dielectric material with a different weight. In the measurement device of the 9th aspect, the adjustment sample can be placed in the measurement device as an "internal standard" for adjusting the measurement device. As a result, for example, even if the measurement device is in operation for measuring the moisture content, the measurement device can be adjusted using the adjustment sample as an internal standard.

[0078] (11th aspect) The measurement device of the 9th or 10th aspect may further include an internal calibration sample that can be placed inside the irradiation unit or the reception unit. In the measurement device of the 11th aspect, adjustment or calibration of the measurement device can be performed using the internal calibration sample. [Explanation of symbols]

[0079] 100: Measuring device 1: Irradiation unit 3: Receiving section 5: Information processing section 51: Electromagnetic wave measurement section 53: Information processing device 7: Sample supply section for adjustment 9: Transport device AJ: Sample for adjustment

Claims

1. A method for adjusting a measurement device for measuring the moisture content of a measurement object using electromagnetic waves, comprising the steps of: irradiating a dielectric body having a predetermined weight with electromagnetic waves; measuring a parameter related to the electromagnetic wave passing through the dielectric material; A step of repeatedly performing irradiation of an electromagnetic wave and measurement of parameters related to the passing electromagnetic wave by changing the weight of the dielectric body; calculating an actual measurement function based on the weight of the dielectric and the parameters related to the passing electromagnetic wave, based on measurement results of a plurality of parameters related to the passing electromagnetic wave obtained for a plurality of weights of the dielectric; adjusting the measuring device so that the actual measurement function coincides with a reference function, which is a reference function based on a weight of the dielectric material and a parameter related to a passing electromagnetic wave; The adjustment method includes:

2. The measuring device includes an irradiation unit that irradiates the dielectric with an electromagnetic wave, and a receiving unit that receives the electromagnetic wave that has passed through the dielectric, The adjustment method according to claim 1 , wherein the step of adjusting the measurement device includes the step of adjusting a distance between the irradiating unit and the receiving unit.

3. The adjustment method according to claim 1 , wherein the step of adjusting the measurement device includes a step of changing a frequency of an electromagnetic wave applied to the dielectric body.

4. The adjustment method according to claim 1 , wherein the parameter is a phase delay of the electromagnetic wave passing through the dielectric relative to an electromagnetic wave irradiated onto the dielectric.

5. The adjustment method according to claim 1 , wherein the parameter is a change in amplitude of the electromagnetic wave passing through the dielectric relative to the electromagnetic wave irradiated thereon.

6. 2. The adjustment method according to claim 1, wherein the actual measurement function and the reference function are a calibration curve in which a parameter related to the passing electromagnetic wave is expressed by a linear expression for the weight of the dielectric, a calibration curve in which a parameter related to the passing electromagnetic wave is expressed by a higher-order expression for the weight of the dielectric, or a trained model obtained by machine learning based on the parameter related to the passing electromagnetic wave and the weight of the dielectric.

7. The method of claim 1 , wherein the dielectric material is zirconia.

8. A program for causing a computer to execute the adjustment method according to any one of claims 1 to 7.

9. A measuring device for measuring the moisture content of a measurement object using electromagnetic waves, An irradiation unit that irradiates the measurement object with an electromagnetic wave; A receiving unit that receives an electromagnetic wave that has passed through the object to be measured; An information processing unit that performs information processing on the measurement device; Equipped with The information processing unit includes: Irradiating electromagnetic waves from the irradiation unit to a dielectric body having a predetermined weight; The electromagnetic wave passing through the dielectric body is received by the receiving unit, and a parameter related to the electromagnetic wave passing through the dielectric body is measured; Repeatedly changing the weight of the dielectric body and measuring parameters related to the electromagnetic wave passing therethrough; calculating an actual measurement function based on the weight of the dielectric and the parameters related to the passing electromagnetic wave based on measurement results of a plurality of parameters related to the passing electromagnetic wave obtained for a plurality of weights of the dielectric; adjusting the measuring device so that the actual measurement function coincides with a reference function, which is a reference function based on a weight of a dielectric material and a parameter related to a passing electromagnetic wave; Measuring equipment.

10. The measurement apparatus according to claim 9 , further comprising a plurality of adjustment samples, each having a different weight of the dielectric material.

11. The measurement device of claim 9 , further comprising an internal calibration sample positionable within the irradiating unit or the receiving unit.

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