Foreign matter inspection device for laver

Abstract

To provide a foreign matter inspection device for laver which, firstly, facilitates operation, secondly, prevents overlooking of a foreign matter, sorting errors, operational errors, etc., and thirdly, achieves these features simply and easily.SOLUTION: A foreign matter inspection device 12 is used during removal operations for foreign matters adhering to an outer surface (top or bottom) of laver B or foreign matters nipped in the inside of the laver B. The foreign matter inspection device 12 includes a first system G and a second system H. The first system G and the second system H are integrated into a device frame 2, can be simultaneously activated, and, while in this simultaneous activation state, can alternately perform inspections. This enables presence / absence and a position of a foreign matter A to be determined and inspected. Furthermore, a camera 15 of the second system H is provided with a visible light cut filter 14, and a near-infrared transmitting placement plate 13, upon which the laver B to be inspected is placed, is configured as a dark tone, low-brightness plate matching the brightness of the laver B.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a foreign matter inspection device for nori seaweed, specifically to a foreign matter inspection device used in the removal of foreign matter attached to the outer surface (front or back) of nori seaweed or trapped inside the nori seaweed. [Background technology]

[0002] 《Technical background》 On the nori (dried nori) production line, after the pre-processing lines of picking raw nori, washing with water, papering, dehydrating, and drying, the nori goes through post-processing lines of sorting for foreign objects, counting and accumulating, folding, and bundling before being produced and shipped. In the foreign object sorting process, a foreign object sorting machine sorts out seaweed B that has foreign object A, such as various impurities or metals, attached or trapped inside it, as shown in Figure 4. The sorted seaweed B with foreign object A is removed from the other good seaweed B, temporarily removed from the line, and collected in a defective bucket. Afterwards, the seaweed is removed from the defective bucket and the foreign object A is removed from each piece by hand using a knife or other tool. The seaweed B from which the foreign object A has been removed is then returned to the line as a product.

[0003] The removal of foreign object A was carried out while visually inspecting the seaweed B. Foreign object A was found by visual inspection, its location was determined, and any foreign object A found through visual inspection was removed manually. Incidentally, foreign matter A has already been removed by a removal device, that is, by a pre-removal process carried out on raw seaweed before it is supplied to the production line, and large pieces of foreign matter A have already been removed. Therefore, after the incident, the foreign matter A that was used for the removal work was often small in size, and it was not easy to find it through visual inspection.

[0004] <<Prior Art>> In view of this situation, foreign matter inspection devices have been developed to assist in the foreign matter A removal process by inspecting for the foreign matter A. As shown in Figure 3, in this foreign matter inspection device 1, a first system C and a second system D were incorporated into an equipment frame 2. The seaweed B was placed on a near-infrared transparent mounting plate 3 made of a white diffuser. In the first system C, visible light E emitted from a visible light source 4 is polarized by a light source-side polarizer 5, and the polarized light illuminates seaweed B, and the reflected light is received by a viewing-side polarizer 6. Then, based on the light transmission and light blocking, an operator M inspects for foreign matter A (see (1) and (2) in Figure 4) adhering to the outer surface of seaweed B. In the second system D, near-infrared light F emitted from an infrared light source 7 is irradiated onto the seaweed B, and the foreign object A (see (3) and (4) in Figure 4) trapped inside the seaweed B is inspected by measuring the light transmission and blocking of the seaweed B, and then photographing the image with a camera 8 and displaying the photographed image on a display 9. [Prior art documents] [Patent documents]

[0005] Examples of such conventional techniques include those disclosed in the following Patent Document 1 and Non-Patent Document 1. [Patent Document 1] JP 2023-163836 A (Patent No. 7256567 A) [Non-Patent Document 1] "8. Inspection method for scratches and foreign matter in seaweed" on pages 291 to 293 of "Automation Technology for Visual Inspection" by Tadashi Nakajima, published by Techno System Co., Ltd., first published on January 6, 1995 Summary of the Invention [Problem to be solved by the invention]

[0006] However, the following problems have been pointed out as issues with such a conventional foreign matter inspection device 1 for laver. In this foreign matter inspection device 1, as shown in Figure 3(1), the first system C is turned on by its operation switch 10, which turns on the visible light source 4, thereby inspecting for foreign matter A attached to the outer surface of the seaweed B using a reflection method. At that time, the second system D was turned off by its operation switch 11, and the infrared light source 7 was turned off so that the near-infrared light F would not affect the inspection by the first system C. In contrast, as shown in Figure 3 (2), the second system D is turned on by its operation switch 11, which turns on the infrared light source 7, thereby inspecting the foreign object A sandwiched in the seaweed B using the transmission method. At that time, the first system C was turned off by its operation switch 10 and the visible light source 4 was turned off so that the visible light E would not affect the inspection by the second system D. The camera 8 was also turned off so that it would not be affected by the visible light E.

[0007] In this way, in the conventional foreign matter inspection device 1, the first system C and the second system D are alternately turned on and off separately. Then, depending on when they are turned on, inspection for foreign matter A on the outer surface of the seaweed B and inspection for foreign matter A sandwiched inside are alternately performed. Therefore, it has been pointed out that the operation of the conventional foreign matter inspection device 1 is troublesome. There was also a time loss caused by switching the operation switches 10 and 11 on and off, and the inspection took longer due to the time required for switching the switches.

[0008] In particular, in the case of Nori B, foreign matter A on the outer surface (front and back) and foreign matter A sandwiched inside are generally mixed in various patterns. In other words, even within the same sheet of seaweed B, there are various patterns of foreign matter A. Foreign matter A is present in various patterns in any or all of the surface, back, and interior parts of seaweed B. Then, such seaweed B is inspected one after another by the foreign matter inspection device 1, and each time, depending on the foreign matter A pattern, the corresponding first system C or second system D is turned on, and the incompatible first system C or second system D is turned off. In this way, the operation switches 10 and 11 are frequently switched on and off each time, which makes the operation more complicated and troublesome, and also makes it easy for mixed foreign matter A to be overlooked, for selection errors to occur, or for operational errors to occur.

[0009] About the present invention The foreign matter inspection device for laver of the present invention has been made in view of the above circumstances and to solve the problems of the prior art. The present invention aims to provide a foreign matter inspection device for seaweed that, firstly, simplifies operation, secondly prevents overlooking foreign matter, sorting errors, operating errors, etc., and thirdly, makes all of these possible in a simple and easy manner. [Means for solving the problem]

[0010] <<About each claim>> The technical means of the present invention for solving such problems are as follows, as set forth in the claims. Regarding claim 1, the following applies: The foreign matter inspection device for laver of claim 1 is used in the work of removing foreign matter from laver, and comprises a first system and a second system. The laver is placed on a low-brightness near-infrared transparent mounting plate. In the first system, visible light emitted downward from a visible light source is polarized by a light source-side polarizer, and the polarized light illuminates the seaweed on the mounting plate, and the reflected light is received by the viewing-side polarizer. Thus, foreign matter adhering to the outer surface of the laver can be inspected based on the light transmission or light blocking by the viewing-side polarizing plate. In the second system, near-infrared light is emitted upward from an infrared light source and irradiates the seaweed through the mounting plate. Thus, the device is characterized in that foreign objects caught in the seaweed can be inspected by detecting light transmission or blocking of the seaweed, taking a photograph using a camera with a visible light cut filter based on this, and displaying the captured image on a display.

[0011] Regarding claim 2, the following applies: The seaweed foreign matter inspection device of claim 2 is characterized in that the first system and the second system are incorporated into the device frame in claim 1. They can be driven on simultaneously and can be inspected alternately while simultaneously driven on, thereby determining the presence and location of foreign matter in each system. Regarding claim 3, the following applies: The seaweed foreign matter inspection device of claim 3 is the same as claim 1, wherein the mounting plate on which the seaweed to be inspected is placed has a dark tone that matches the brightness of the seaweed and transmits near-infrared light, the camera is an area camera, and the visible light cut filter cuts visible light and transmits near-infrared light.

[0012] <About the effects> The present invention comprises such means and is as follows: (1) This foreign body inspection device is used as an auxiliary device in the process of removing foreign bodies from seaweed. (2) The first system and the second system can be turned on at the same time. (3) The first and second systems can be switched on at the same time to determine and inspect the presence and location of foreign matter. (4) In other words, the first system uses visible light reflection to inspect for foreign matter attached to the outer surface of the seaweed. (5) The second system uses a near-infrared light transmission method to inspect for foreign objects sandwiched between seaweed. (6) In this foreign body inspection device, both the visible light source and the infrared light source remain on, and inspections are performed by each system alternately and individually. This eliminates the need to repeatedly turn the devices on and off depending on the type of foreign body or inspection. (7) This simplifies and simplifies the operation, allowing the operator to concentrate on inspecting for foreign matter. (8) To ensure that these functions are achieved without any problems, this foreign body inspection device is equipped with a visible light cut filter on the camera of the second system, and the near-infrared transparent mounting plate is made dark in tone and low in brightness to match the brightness of the seaweed. [Effects of the Invention]

[0013] First effect First, operation is facilitated. The seaweed foreign matter inspection device of the present invention is characterized in that the first system and the second system can be driven on simultaneously and can be inspected alternately while being driven on simultaneously. That is, when the operation switch is turned on, the visible light source is turned on and the infrared light source remains on, and the seaweed to be inspected is inspected for foreign matter attached to the outer surface and for foreign matter that has been trapped in the seaweed, alternating in sequence as appropriate. Unlike the conventional foreign matter inspection device of this type described above, there is no need to frequently turn the first system and the second system on and off separately each time depending on whether the foreign matter is on the mixed outer surface or trapped. This simplifies operation. There is no need for the complicated on / off operation of the operation switch, eliminating the time loss required for switching switches and significantly shortening the inspection time.

[0014] Second Effect Secondly, it also prevents overlooking foreign objects, sorting errors, operating errors, etc. As described above, the operation of the seaweed foreign matter inspection device according to the present invention is simplified and easy to operate, allowing the operator to concentrate on determining the presence and location of foreign matter and inspecting it, thereby preventing the overlooking of mixed foreign matter, sorting errors, operation errors, etc.

[0015] Third Effect Third, these are easily and simply achieved. The foreign matter inspection device for seaweed according to the present invention is characterized in that the camera of the second system is provided with a visible light cut filter, and the near-infrared transparent mounting plate for the seaweed is made dark-toned and low-brightness to match the brightness of the seaweed. With such a simple configuration, inspection can be easily performed with the first and second systems simultaneously driven on. In this way, the effects of the present invention are remarkable and great, as all of the problems that existed in the prior art of this type are solved. [Brief explanation of the drawings]

[0016] [Figure 1] 1A and 1B are diagrams illustrating an embodiment of a foreign matter inspection device for laver according to the present invention, in which FIG. 1 is a side view and FIG. 2 is a perspective view. [Figure 2] The drawings are provided to explain the embodiment of the invention, and Fig. 1 is a side view of the foreign substance inspection using visible light and near-infrared light, and Fig. 2 is a front view of the display. [Figure 3] This will be used to explain this type of conventional example. Figure (1) is a side view of foreign matter inspection using visible light, and Figure (2) is a side view of foreign matter inspection using near-infrared light. [Figure 4] Figures (1) and (3) are plan views, and Figures (2) and (4) are enlarged longitudinal cross-sectional views. Figures (1) and (2) show foreign matter attached to the outer surface of the nori seaweed, and Figures (3) and (4) show foreign matter sandwiched between the nori seaweed. DETAILED DESCRIPTION OF THE INVENTION

[0017] The present invention will now be described in detail with reference to the drawings. Regarding foreign matter A and seaweed B: First, the foreign matter A and the seaweed B will be described with reference to FIG. Nori B, which is harvested from the ocean and processed on a production line, is a roughly rectangular sheet measuring approximately 190 mm wide and 210 mm long. It contains a large amount of foreign matter A, including impurities and metals. That is, impurities such as pieces of vinyl, feathers, shells, paper, wood chips, sawdust, stone chips, sand, soil, fine stones, shrimp, insects, etc. are often found adhering as foreign matter A. Foreign matter A may also be found adhering to the product, such as chipped pieces, tiny pieces, wear particles, rust, fine powder, residue, etc. of iron, aluminum, copper, stainless steel, and other metals. As shown in Figure 4 (1) and (2), foreign matter A first adheres to the outer surface of seaweed B, that is, the front and back surfaces of seaweed B. When removing foreign matter A, the back surface is turned upside down and subjected to inspection and removal work. Furthermore, foreign object A may be trapped inside seaweed B, as shown in Figure 4 (3) and (4). The above is the case regarding seaweed B and foreign object A.

[0018] Foreign body inspection device 12 The foreign matter inspection device 12 of the present invention will be described below with reference to FIGS. The foreign matter inspection device 12 is used as an auxiliary device when removing foreign matter A from seaweed B, and is equipped with a first system G and a second system H. The device frame 2 of the foreign matter inspection device 12 has a roughly U-shaped cross section with the front and both sides open, and the seaweed B to be inspected is placed on a placement plate 13 above the lower part. The mounting plate 13 is inclined downwards towards the operator M in order to make it easier for the operator M in front to remove the foreign object B. For details on the foreign object B removal work, the production line, etc., please refer to the section on technical background mentioned above.

[0019] About System 1 G The first system G of the foreign matter inspection device 12 will now be described. In the first system G, visible light E emitted downward from the visible light source 4 is polarized by the light source-side polarizer 5, and the polarized light K illuminates the seaweed B on the mounting plate 13 from above, and the reflected light L is received by the viewing-side polarizer 6. Thus, foreign matter A adhering to the outer surface of the seaweed B is inspected based on the light transmission or blocking of the reflected light L (polarized light K) at the viewing-side polarizing plate 6.

[0020] <<Details of System G 1>> Such a first system G will be described in further detail below. First, the first system G is based on the premise that the reflection characteristics of seaweed B are almost total reflection. The visible light source 4 is disposed on the lower surface of the upper part of the device frame 2 near the front. The light source-side polarizing plate 5 is attached to the front of the visible light source 4. The viewer-side polarizing plate 6 is attached to the front edge of the upper part of the device frame 2 with a hinge or the like, and faces the operator M outside the front of the device frame 2. The visible light source 4 is, for example, a linear LED, and irradiates visible light E from above onto the seaweed B placed on the mounting plate 13 at the bottom of the device frame 2 .

[0021] The light source side polarizing plate 5 transmits only light of a certain polarization plane with respect to the visible light E from the visible light source 4. The visible light E is converted into polarized light K by linear polarization. That is, visible light E emitted from the visible light source 4 is filtered by the light source-side polarizing plate 5, and only light with a certain polarization plane is transmitted. Of the visible light E, which is natural light from the visible light source 4, only the linearly polarized component is transmitted as is. The visible light E from the visible light source 4 is polarized by the light source side polarizing plate 5 in this manner, and the polarized light K irradiates the laver B on the mounting plate 13 . The viewer-side polarizing plate 6 receives visible light E, i.e., polarized light K, from the visible light source 4 that has passed through the light source-side polarizing plate 5, as reflected light L from the seaweed B. The viewer-side polarizing plate 6 has a polarization plane shifted by 90 degrees, and the presence and position of foreign matter A attached to the outer surface of the seaweed B can be determined based on its light transmission and light blocking.

[0022] First, if there is no foreign matter A attached to the outer surface of seaweed B, the situation is as follows. In this case, the reflected light L from the seaweed B is blocked by the viewing-side polarizing plate 6 and does not pass through, so no light enters the sheet when viewed visually. This results in a determination that there is no foreign matter A on the outer surface. In other words, the entire outer surface is made up of only low-brightness, dark-toned, black seaweed B, and the reflected light L is oriented in a fixed direction with no deviation in the polarization plane. As a result, the reflected light L is blocked by the viewing-side polarizing plate 6 as expected, and no light enters the operator M's eyes. In contrast, as shown in Figure 4 (1) and (2), if there is a foreign object A attached to the outer surface of seaweed B, the following occurs: In this case, the reflected light L from the seaweed B in the area of ​​the foreign object A is polarized in a different plane due to diffuse reflection by the foreign object A, and is transmitted through the viewing-side polarizing plate 6 without being blocked, becoming a light-entering state when viewed visually. This allows the presence and location of foreign object A on the outer surface to be determined. That is, the foreign matter A is scattered on the outer surface of the seaweed B, and each of them diffuses and reflects light, causing a deviation in the polarization plane of the reflected light L. As a result, the light passes through the viewing-side polarizing plate 6 without being blocked, and enters as dots when viewed by the operator M. Of course, the other areas of the seaweed B are blocked, and no light enters. The above is the case for System 1 G.

[0023] <<About the near-infrared transmission mounting plate 13>> Next, the mounting plate 13 will be described. The seaweed B is placed on a low-brightness near-infrared-transparent mounting plate 13. The near-infrared-transparent mounting plate 13, on which the seaweed B to be inspected is placed, has a dark tone that matches the brightness of the seaweed B, and transmits near-infrared light F while blocking visible light E and the like. That is, the mounting plate 13 is made of a filter that transmits near-infrared light F and cuts visible light E and the like, and various commercially available plastic products are used. In addition, the mounting plate 13 is selected to be low in brightness, dark in tone, or black. That is, the seaweed B actually has small holes, i.e., tiny through-holes. If the brightness of the mounting plate 13 is high, there is a risk of malfunction during inspection by the first system G described above. In other words, diffuse reflection occurs on the high-brightness mounting plate 13 through the small holes in the seaweed B, and this reflected light L passes through the viewer-side polarizing plate 6, which may erroneously be confused as the presence of foreign matter A. Therefore, in order to prevent such malfunctions during inspection by the first system G, the mounting plate 13 is selected to be the same color as the seaweed B, i.e., one with the same low brightness and reflective properties of almost total reflection. The near-infrared transmitting mounting plate 13 is as described above.

[0024] About the Second System H Next, the second system H of the foreign matter inspection device 12 will be described. In the second system H, near-infrared light F emitted upward from the infrared light source 7 is irradiated onto the seaweed B via the mounting plate 13. Thus, foreign matter A trapped within the seaweed B is inspected by detecting the light transmission or blocking of near-infrared light F through the seaweed B, and based on this, photographing is performed by a camera 15 equipped with a visible light cut filter 14, and the photographed image is displayed on a display 9.

[0025] Details of the Second System H Such a second system H will be described in further detail below. The infrared light source 7 is composed of, for example, a number of infrared LEDs, and is installed in a box at the bottom of the device frame 2. Near-infrared light F is irradiated from below onto the seaweed B via a near-infrared-transparent mounting plate 13. The mounting plate 13 transmits the near-infrared light F. Thus, the near-infrared light F irradiating the seaweed B passes through the seaweed B and enters the camera 15. The camera 15 is an area camera that captures a transmitted image of the seaweed B based on the incident near-infrared light F, and sends the captured image signal to the display 9 via an image processing unit. The display 9 displays the image captured by the camera 15 . First, if there is no foreign object A sandwiched between the nori seaweed B, the following occurs. In this case, the image displayed on the display 9 is based entirely on near-infrared light F that has passed through the nori seaweed B, and the entire area is bright. As a result, it is determined that there is no foreign object A sandwiched between the nori seaweed B. In contrast, as shown in (3) and (4) of Figure 4, when there is a foreign object A sandwiched between seaweed B, the situation is as follows. In this case, the image displayed on the display 9 shows foreign matter A scattered as shown in FIG. 2(2). That is, foreign object A does not transmit near-infrared light F, so it is displayed in the image as a dotted pattern in low brightness, dark tones, and black. It is displayed as a dotted pattern among the seaweed B, which is displayed in full brightness in the other image areas. This allows worker M to determine the presence and location of trapped foreign object A, and perform the work of removing foreign object A while looking at the image displayed on display 9. The camera 15 is provided with a visible light cut filter 14, which will be described later. The second system H is as described above.

[0026] <<Simultaneous operation and individual inspection>> In this foreign matter inspection device 12, the first system G and the second system H incorporated in the device frame 2 can be driven on simultaneously, and can be alternately driven on while still performing inspections. First, 16 is an operation switch for the entire device, and by switching it on, the visible light source 4 of the first system G and the infrared light source 7, camera 15, display 9, etc. of the second system H can be simultaneously driven on. Of course, instead of relying on the illustrated example, an operation switch may be provided for each of them, and by turning on each switch, they may be driven on simultaneously. With the first system G and the second system H simultaneously driven and on, they can take turns inspecting the seaweed B individually. The operator M can take turns as needed to determine the presence and location of each foreign object A and identify it. Inspection of the foreign object A on the outer surface using the reflection method and inspection of the trapped foreign object A using the transmission method can be performed in sequence.

[0027] The camera 15 is provided with a visible light cut filter 14 . As described above, in consideration of the fact that the first system G and the second system H are simultaneously driven on, the camera 15 is provided with a visible light cut filter 14 so that the camera 15 is not affected by visible light E, particularly its reflected light L. That is, the visible light cut filter 14 is made of a long wavelength transmission filter, which cuts out visible light E and transmits near-infrared light F. A commercially available filter for image processing or the like is used. The use of visible light cut filter 14 prevents visible light E (polarized light K, reflected light L) that occurs when first system G is turned on from adversely affecting camera 15. Camera 15 of second system H, which is turned on at the same time, is designed for near-infrared light F, and visible light E is blocked from entering. The above is about simultaneous operation and individual inspection.

[0028] 《Effect, etc.》 The foreign matter inspection device 12 for laver B of the present invention is configured as described above. (1) The foreign matter inspection device 12 of the present invention is used as an auxiliary device when removing foreign matter A from seaweed B. In use, the seaweed B to be inspected is placed on the mounting plate 13, and the first system G and the second system H can be simultaneously driven on (see FIG. 1).

[0029] (2) That is, the visible light source 4 of the first system G and the infrared light source 7, camera 15, display 9, etc. of the second system H can be driven on simultaneously (see FIG. 1).

[0030] (3) In the illustrated example, the first system G and the second system H can be inspected alternately by turning on the operation switch 16 while both are simultaneously driven on. Operator M can alternate between inspecting foreign matter A attached to the outer surface of seaweed B using the reflection method and inspecting foreign matter A sandwiched inside seaweed B using the transmission method as appropriate (see (1) in Figure 2).

[0031] (4) That is, in the first system G, visible light E from the visible light source 4 is polarized by the light source side polarizer 5, and the polarized light K illuminates the seaweed B, and the reflected light L is received by the viewing side polarizer 6. Based on the light transmission and light blocking, the presence and location of foreign matter A attached to the outer surface of the seaweed B is visually determined and inspected by the operator M (see (1) and (2) in Figure 4). If foreign matter A is present, the operator M will then carry out a removal operation.

[0032] (5) In the second system H, near-infrared light F from an infrared light source 7 is irradiated onto the seaweed B, and the light is transmitted or blocked. Based on this, a camera 15 takes a photograph, and the photographed image is displayed on the display 9 (see (2) in Figure 2). By viewing the image displayed on the display 9, the operator M can determine and inspect the presence and location of foreign matter A sandwiched between the seaweed B (see (3) and (4) in Figure 4). If foreign matter A is present, the operator M will perform the task of removing the foreign matter A.

[0033] (6) In the foreign substance inspection device 12 of the present invention, the visible light source 4 and the infrared light source 7 can be alternately inspected while both are turned on and illuminated. This simplifies operation. Unlike the conventional foreign matter inspection device 1 described above, there is no need to troublesomely switch the operation switches 10, 11 on and off each time depending on the type of foreign matter A present or the type of inspection (there is no need to switch between (1) and (2) in Figure 3).

[0034] (7) Regarding the seaweed B being inspected, foreign matter A is mixed on the surface (outer surface), foreign matter A on the back (outer surface), and foreign matter A sandwiched in between in various patterns. For such seaweed B, the foreign matter inspection device 12 does not require the above-mentioned complicated switching operation, and the operation is therefore simplified. This allows the operator M to concentrate on determining the presence and location of foreign matter A and inspecting it.

[0035] (8) The foreign matter inspection device 12 employs the following configuration so that the first system G and the second system H can be driven simultaneously and inspected alternately without any problems. That is, the camera 15 of the second system H is provided with a visible light cut filter 14. Also, to prevent the small holes in the seaweed B from being mistaken for foreign matter A, the near-infrared transparent mounting plate 13 is made dark in tone and low in brightness to match the brightness of the seaweed B. The effects etc. are as described above. [Explanation of symbols]

[0036] A. Foreign body B Seaweed C. System 1 (conventional example) D. Second system (conventional example) E Visible light F Near-infrared light G. First System (present invention) H. Second System (present invention) K polarized light L Reflected light M Operator 1 Foreign body inspection device (conventional example) 2. Device frame 3. Mounting plate (conventional example) 4 Visible light source 5 Light source side polarizing plate 6. Viewing side polarizer 7. Infrared light source 8 cameras (conventional example) 9. Display 10 Operation switch (conventional example) 11 Operation switch (conventional example) 12 Foreign body inspection device (present invention) 13 Mounting plate (present invention) 14 Visible light cut filter 15 Camera (invention) 16 Operation switch (present invention)

Claims

1. A foreign matter inspection device used in removing foreign matter from seaweed, comprising a first system and a second system, The seaweed is placed on a low-intensity near-infrared transparent plate. In the first system, visible light emitted downward from a visible light source is polarized by a light source-side polarizing plate, the polarized light illuminates the nori on the mounting plate, and the reflected light is received by a viewing-side polarizing plate; Thus, based on the light transmission or light blocking by the viewing-side polarizing plate, foreign matter adhering to the outer surface of the nori seaweed is inspected. In the second system, near-infrared light emitted upward from an infrared light source is irradiated onto the seaweed through the mounting plate, and the seaweed is then illuminated. This allows the seaweed to transmit or block light, and the resulting image is then captured by a camera equipped with a visible light cut filter, and displayed on a screen. This seaweed foreign body inspection device is characterized by inspecting for foreign bodies trapped inside the seaweed.

2. 2. The seaweed foreign matter inspection device according to claim 1, wherein the first system and the second system are incorporated into an apparatus frame, can be simultaneously driven on, and can be inspected alternately while simultaneously driven on, thereby determining the presence and location of foreign matter in each system.

3. According to claim 1, the mounting plate is configured to have a dark tone corresponding to the brightness of the seaweed to be inspected, and is transparent to near-infrared light. The camera is an area camera, and the visible light cut filter cuts visible light and transmits near-infrared light, thereby providing a foreign matter inspection device for laver.

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