Inspection socket

Abstract

To provide an inspection socket for performing inspection by bringing a terminal part of an object to be inspected into contact with a contact probe while holding the object to be inspected in a horizontal direction when bringing the terminal part of the object to be inspected into contact with the contact probe connected to an inspection substrate.SOLUTION: An inspection socket 1 used for inspection of electrical characteristics of an object to be inspected 10 includes a housing portion 100 that houses the object to be inspected 10, a first pressing member 101 that presses a side surface of the object to be inspected 10 housed in the housing portion 100, a second pressing member 101 that presses an inclined surface portion formed on an outer side of the first pressing member 101, a first spring 103 that presses the second pressing member 102 by biasing in a direction of the housing portion 100, and a third pressing member 104 that presses the first pressing member 102 in a vertical direction.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present invention relates to an apparatus for inspecting a board to be inspected, in which a connector provided on the board to be inspected is electrically connected to a connector having probe pins provided on the inspection board as contacts. [Background technology]

[0002] Conventional board testing equipment includes contact probes placed on the test board and brought into contact with the electrodes of the test object to test electrical characteristics. The springs attached to the contact probes contact the electrodes of the test object perpendicular to the test surface of the test object, enabling efficient testing.

[0003] The contact probe used here comprises a cylindrical body, terminals housed in the upper and lower ends of the cylinder so that they can slide freely, and a spring housed within the cylinder that biases the terminals.When the terminals are pressed by the electrodes of the test object, the terminals come into contact with the cylinder, and electricity is conducted between the test object and the test board.

[0004] In order to bring the contact probes into contact with the electrodes of the object under test, it is necessary to position the object under test horizontally and to apply pressure from above. The electrical component socket described in Patent Document 1 is configured so that a pressure member moves the electrical component under test forward and backward from the side to position it, and the pressure member presses the sides of the electrical component from above to bring the terminals of the electrical component into contact with the contact probes. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2017-135027 Summary of the Invention [Problem to be solved by the invention]

[0006] In recent years, the precision of test objects has increased, and it is often not desirable to apply pressure from above to test objects that have electronic circuits built into their top surface. In particular, when the electronic circuits are built into the entire top surface, it is difficult to control the pressure from above when contacting the terminals of the electrical component with the contact probes.

[0007] Therefore, an object of the present invention is to provide an inspection socket that, when bringing the terminal portion of an object under test into contact with a contact probe connected to an inspection board, performs inspection by bringing the terminal portion of the object under test into contact with a contact probe while holding the object under test horizontally. [Means for solving the problem]

[0008] That is, the present invention aims to achieve the above-mentioned object, and the means of claim 1 is characterized in that an inspection socket used for inspecting the electrical characteristics of an object to be inspected comprises a storage section for accommodating the object to be inspected, a first pressing member for pressing a side surface of the object to be inspected accommodated in the storage section, a second pressing member for pressing a sloped portion formed on the outside of the first pressing member, a first spring for urging the second pressing member toward the storage section, and a third pressing member for pressing in a direction perpendicular to the first pressing member.

[0009] The means of claim 2 is an inspection socket used for inspecting electrical characteristics of an object under test, comprising: a storage section for storing the object under test; a first pressing member for pressing a side surface of the object under test stored in the storage section; a second pressing member arranged outside the first pressing member; a first spring fixed to the second pressing member for urging it toward the storage section to press the first pressing member; and a third pressing member for pressing the first pressing member and the second pressing member in a direction perpendicular to the first pressing member, wherein the second pressing member pressed by the third pressing member moves obliquely downward along a slope formed on the second pressing member.

[0010] Furthermore, the means of claim 3 is characterized in that the third pressing member according to claim 1 or 2 has a latch structure. [Effects of the Invention]

[0011] The testing socket of the present invention makes it possible to test the electrical characteristics of an object under test without applying pressure to the upper surface of the object under test. [Brief explanation of the drawings]

[0012] [Figure 1] FIG. 1 is a plan view of an inspection socket according to a first embodiment of the present invention. [Figure 2] 1 is a cross-sectional view of an inspection socket according to a first embodiment of the present invention. [Figure 3] 1 is a cross-sectional view of the inspection socket according to the first embodiment of the present invention, illustrating a state in which the tip of a third pressing member presses the first pressing member. [Figure 4] FIG. 10 is a plan view of an inspection socket according to a second embodiment of the present invention. [Figure 5] FIG. 10 is a cross-sectional view of an inspection socket according to a second embodiment of the present invention, illustrating a state in which a tip end of a third pressing member presses a first pressing member. [Figure 6] FIG. 10 is a plan view of an inspection socket according to a third embodiment of the present invention. [Figure 7] FIG. 10 is a cross-sectional view of an inspection socket according to a third embodiment of the present invention, illustrating a state in which a tip end of a third pressing member presses a first pressing member. DETAILED DESCRIPTION OF THE INVENTION

[0013] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. [Example]

[0014] Fig. 1 is a plan view showing one embodiment of an inspection socket according to the present invention. Fig. 2 is a cross-sectional view taken along line AA in Fig. 1. The inspection socket 1 is used to inspect the electrical characteristics of an object under test 10, which is an electrical component, and is configured to include a housing portion 100 that houses the object under test 10, a first pressing member 101 that presses the side surface of the object under test 10 housed in the housing portion 100, a second pressing member 102 that presses a sloped portion 101a formed on the outside of the first pressing member 101, and a first spring 103 that biases the second pressing member 102 in the direction of the housing portion 100.

[0015] 1, the first pressing member 101, the second pressing member 102, and the first spring 103 are arranged in four directions on the sides of the X-axis and the Y-axis in a plan view, and the four side surfaces of the object under test 10 accommodated in the accommodation unit 100 are pressed. The configuration in FIG. 1 may be such that the first pressing member 101, the second pressing member 102, and the first spring 103 at two locations in the X-axis direction are removed, and the object under test 10 accommodated in the accommodation unit 100 is pressed on two side surfaces in the Y-axis direction.

[0016] The inspection socket 1 of the first embodiment of the present invention includes a third pressing member 104 that presses against the first pressing member 101 in a direction perpendicular to the first pressing member 101. The third pressing member 104 is arranged in two lateral directions along one axis in a plan view, which in this embodiment is the Y-axis direction in FIG. 1. The inspection socket 1 is placed and fixed on an inspection board (not shown), and is configured so that lower ends 106a of contact probes 106 protrude from the bottom surface of a base 105 that contacts the printed circuit board. A first outer base 107 that houses the contact probes 106 is provided on top of the base 105, and upper ends 106b of the contact probes 106 protrude from the top surface of the first outer base 107. When the device under test 10 hangs down and the terminals 11 of the device under test 10 come into contact with the upper ends 106b of the contact probes 106, electricity is passed through, and the device under test 10 is inspected.

[0017] A gripping portion 12 that grips the side surface of the object under test 10 is attached integrally to the object under test 10. The first pressing member 101 comes into contact with the gripping portion 12 and presses the object under test 10. By holding the gripping portion 12 and attaching / detaching the object under test 10 to / from the inspection socket 1, the object under test 10 can be inspected without touching the top surface of the object under test 10.

[0018] A second outer base 108 is provided on the upper surface of a base 105 around the periphery of the inspection socket 1, and a third outer base 109 is further provided on the upper surface of the second outer base 108. The outer ends of the first spring 103 are fixed to the receiving portion 100 sides of the second outer base 108 and the third outer base 109.

[0019] 3 is a cross-sectional view taken along line AA in FIG. 1, illustrating a state in which the tip 104a of the third pressing member 104 is pressing the first pressing member 101. The third pressing member 104 of this embodiment has a latch structure and is supported by a shaft 110 to swing. The third pressing member 104 is housed in a third outer base 109 and is biased by a second spring 112 fixed to the upper surface of the second outer base 108. In a stationary state, the tip 104a of the third pressing member 104 presses the first pressing member 101 due to the bias of the second spring 112. When the operating portion 104b of the third pressing member 104 is pressed down against the second spring 112, the pressure of the tip 104a on the first pressing member 101 is released.

[0020] The first pressing member 101 is provided with an adjustment member 113 that adjusts the horizontal position of the first pressing member 101 by grasping it from above and below. The adjustment member 113 has a structure that is horizontally hollowed out from the outside to the inside of the inspection socket 1, and the first pressing member 101 is housed in the hollowed-out space. A third spring 114 is housed horizontally in the adjustment member 113, flexibly adjusting the horizontal position of the first pressing member 101. An alignment key 111 is provided on the top surface of the first outer base 107, and a fourth spring 115 is fixed to the first outer base 107 and urges the first pressing member 101 and the adjustment member 113 vertically upward. The pressing force of the second spring 112 on the tip end 104a of the third pressing member 104 is adjusted to exceed the urging force of the fourth spring 115, allowing the first pressing member 101 and the adjustment member 113 to be pressed vertically downward.

[0021] When the first pressing member 101 is pressed vertically downward by the third pressing member 104, the first pressing member 101 presses the inclined surface 102a of the second pressing member 102, which faces and abuts against the inclined surface 101a formed on the outside of the first pressing member 101. At this time, since the tip of the first pressing member 101 abuts against the gripping portion 12 that grips the side surface of the object under test 10, the horizontal position of the first pressing member 101 does not change, and the second pressing member 102 moves horizontally outward against the bias of the first spring 103. Here, the bias of the first spring 103 causes the first pressing member 101 to strongly press against the side surface of the gripping portion 12 of the object under test 10. In this state, the first pressing member 101 moves vertically downward, so that the terminals 11 of the device under test 10 firmly gripped by the first pressing member 101 come into contact with the upper ends 106 b of the contact probes 106 .

[0022] When the inspection is completed, the operating portion 104b of the third pressing member 104 can be pressed down to release the pressure of the first pressing member 101 by the third pressing member 104, returning to the state shown in Fig. 2. At this time, the pressure of the gripping portion 12 of the object under test 10 by the first pressing member 101 is released, and the object under test 10 can be removed from the inspection socket 1 by suction. [Example]

[0023] Fig. 4 is a plan view showing another embodiment of the inspection socket according to the present invention. Fig. 5 is a cross-sectional view taken along line BB in Fig. 4. The inspection socket 2 is configured to include a housing portion 200 that houses the object under test 20, a first pressing member 201 that presses the side surface of the object under test 20 housed in the housing portion 200, a second pressing member 202 that presses a sloped portion 201a formed on the outside of the first pressing member 201, and a first spring 203 that biases the second pressing member 202 in the direction of the housing portion 200.

[0024] 4, the first pressing member 201, the second pressing member 202, and the first spring 203 are arranged in four directions on the sides of the X-axis and the Y-axis in a plan view, and the four side surfaces of the object under test 20 accommodated in the accommodation section 200 are pressed. The configuration of FIG. 4 may be such that the first pressing member 201, the second pressing member 202, and the first spring 203 at two locations in the X-axis direction are removed, and the object under test 20 accommodated in the accommodation section 200 is pressed on two side surfaces in the Y-axis direction.

[0025] The inspection socket 2 of the second embodiment of the present invention includes a third pressing member 204 that presses against the first pressing member 201 in a direction perpendicular to the first pressing member 201. The third pressing member 204 is arranged in two lateral directions along one axis in a plan view, which in this embodiment is the Y-axis direction in FIG. 4. The inspection socket 2 is placed and fixed on an inspection board (not shown), and is configured so that lower ends 206a of contact probes 206 protrude from the bottom surface of a base 205 that contacts the printed circuit board. A first outer base 207 that houses the contact probes 206 is provided on top of the base 205, and upper ends 206b of the contact probes 206 protrude from the top surface of the first outer base 207. When the object under test 20 hangs down and the terminal portions 21 of the object under test 20 come into contact with the upper ends 206b of the contact probes 206, electricity is passed through, and the object under test 20 is inspected.

[0026] A second outer base 208 is provided above the base 205 on the periphery of the inspection socket 2, and a third outer base 209 is further provided on the upper surface of the second outer base 208. The outer end of the first spring 203 is fixed to the receiving part 200 side of the third outer base 209.

[0027] In this embodiment, the third pressing member 204 is housed inside the inspection socket 2, and the up and down movement of the first pressing member 201 is controlled by a switch 210. Specifically, the switch 210 is supported by a third outer base 209, and when the switch 210 is in a stationary state, the tip 204a of the third pressing member 204 presses the first pressing member 201 due to the bias of a second spring 212 housed in the third outer base 209.

[0028] The first pressing member 201 is provided with an adjustment member 213 that adjusts the horizontal position of the first pressing member 201 by grasping it from above and below. The adjustment member 213 has a structure that is horizontally hollowed out from the outside to the inside of the inspection socket 2, and the first pressing member 201 is housed in the hollowed space. A third spring 214 is housed horizontally in the adjustment member 213 to flexibly maintain the horizontal position of the first pressing member 201. An alignment key 215 is provided on the top surface of the first outer base 207, and a fourth spring 216 is fixed to the base 205 and urges the first pressing member 201 and the adjustment member 213 vertically upward. The pressing force of the second spring 212 on the tip end 204a of the third pressing member 204 is adjusted to exceed the urging force of the fourth spring 216, allowing the first pressing member 201 and the adjustment member 213 to be pressed vertically downward.

[0029] When the first pressing member 201 is pressed vertically downward by the third pressing member 204, the first pressing member 201 presses the inclined surface 202a of the second pressing member 202, which faces and abuts against the inclined surface 201a formed on the outside of the first pressing member 201. At this time, because the tip of the first pressing member 201 abuts against the object under test 20, the horizontal position of the first pressing member 201 does not change, and the second pressing member 202 moves horizontally outward against the bias of the first spring 203. Here, the bias of the first spring 203 causes the first pressing member 201 to strongly press against the side surface of the gripping portion 22 of the object under test 20. As the first pressing member 201 moves vertically downward in this state, the terminal portion 21 of the object under test 20, which is firmly gripped by the first pressing member 201, comes into contact with the upper end 206b of the contact probe 206.

[0030] When the inspection is completed, the switch 210 of the third pressing member 204 can be opened to release the pressure of the first pressing member 201 by the third pressing member 204. While the switch 210 is being pressed, the third pressing member 204 is lifted by the action of the arm 211, so that the pressure of the tip 204a on the first pressing member 201 is released, and the object under test 20 can be removed from the inspection socket 2 by suction. [Example]

[0031] Fig. 6 is a plan view showing another embodiment of the inspection socket according to the present invention. Fig. 7 is a cross-sectional view taken along line CC in Fig. 6. The inspection socket 3 includes a housing portion 300 that houses the object under test 30, a first pressing member 301 that presses the side surfaces of the object under test 30 housed in the housing portion 300, a second pressing member 302 that is disposed outside the first pressing member 301, and a first spring 303 that urges the first pressing member 301 toward the housing portion 300. The first pressing member 301, the second pressing member 302, and the first spring 303 are disposed in four lateral directions in a plan view, and the four side surfaces of the object under test 30 housed in the housing portion 300 are pressed.

[0032] 6, the first pressing member 301, the second pressing member 302, and the first spring 303 are arranged in four directions on the sides of the X-axis and the Y-axis in a plan view, and the four side surfaces of the object under test 30 accommodated in the accommodation section 300 are pressed. The configuration of FIG. 6 may be such that the first pressing member 301, the second pressing member 302, and the first spring 303 at two locations in the X-axis direction are removed, and the object under test 30 accommodated in the accommodation section 300 is pressed on two side surfaces in the Y-axis direction.

[0033] The inspection socket 3 of the third embodiment of the present invention includes a third pressing member 304 that presses against the first pressing member 301 in a direction perpendicular to the first pressing member 301. The third pressing member 304 is arranged in two lateral directions along one axis in a plan view, which in this embodiment is the Y-axis direction in FIG. 6. The inspection socket 3 is placed and fixed on an inspection board (not shown), and is configured so that lower ends 306a of contact probes 306 protrude from the bottom surface of base 305 that contacts the printed circuit board. A contact probe base 311 that houses the contact probes 306 is provided on the top of base 305, and upper ends 306b of the contact probes 306 protrude from the top surface of contact probe base 311. When an object under test 30 hangs down and terminal portions 31 of the object under test 30 come into contact with upper ends 306b of the contact probes 306, electricity is passed through, and inspection of the object under test 30 is performed.

[0034] A second outer base 308 is provided on the upper surface of the first outer base 307 around the periphery of the inspection socket 3 , and a third outer base 309 is further provided on the upper surface of the second outer base 308 .

[0035] The third pressing member 304 of this embodiment has a latch structure and is supported by a shaft 310 to swing. The shaft 310 is inserted through the third outer base 309. The third pressing member 304 is housed in the second outer base 308 and the third outer base 309 and is biased by a second spring 312 fixed to the upper surface of the first outer base 307. In a stationary state, the tip 304a of the third pressing member 304 presses the first pressing member 301 due to the bias of the second spring 312. When the operating portion 304b of the third pressing member 304 is pressed down against the second spring 312, the pressure of the tip 304a on the first pressing member 301 is released.

[0036] The first pressing member 301 is provided with an adjustment member 313 that adjusts the horizontal position of the first pressing member 301 by pressing from above. The first outer base 307 is provided with a sloped surface 307a facing inward, which abuts against a sloped surface 302a provided on the outside of the second pressing member 302. The second pressing member 302 can move slightly along the slope between the first outer base 307 and the adjustment member 313. At this time, the first pressing member 301 and the adjustment member 313 can also move in conjunction with the second pressing member 302.

[0037] When the first pressing member 301 is pressed vertically downward by the third pressing member 304, the second pressing member 302 moves obliquely downward along the inclined surface. Because the tip of the first pressing member 301 abuts against the gripping portion 32 that grips the side surface of the object under test 30, the horizontal position of the first pressing member 301 does not change. Here, the biasing force of the first spring 303 causes the first pressing member 301 to strongly press against the side surface of the gripping portion 32 of the object under test 30. In this state, the second pressing member 302 moves obliquely downward, causing the terminal portion 31 of the object under test 30, which is firmly gripped by the first pressing member 301, to come into contact with the upper end portion 306b of the contact probe 306.

[0038] When the inspection is completed, the operation portion 304b of the third pressing member 304 can be pressed down to release the pressure of the third pressing member 304 on the first pressing member 301, and the inspection object 30 can be easily removed from the inspection socket 3. [Explanation of symbols]

[0039] 1...inspection socket, 2...inspection socket, 3...inspection socket. 10...Object to be inspected, 11...Terminal section, 12...Gripping section. 20...Object to be inspected, 21...Terminal section, 22...Gripping section. 30...Object to be inspected, 31...Terminal section, 32...Gripping section. 100...accommodation portion, 101...first pressing member, 101a...inclined portion, 102...second pressing member, 102a...inclined portion, 103...first spring, 104...third pressing member, 104a...tip portion, 104b...operating portion, 105...base, 106...contact probe, 106a...lower end portion, 106b...upper end portion, 107...first outer casing base, 108...second outer casing base, 109...third outer casing base, 110...shaft portion, 111...alignment key, 112...second spring, 113...adjustment member, 114...third spring, 115...fourth spring. 200...accommodation portion, 201...first pressing member, 201a...inclined portion, 202...second pressing member, 202a...inclined portion, 203...first spring, 204...third pressing member, 204a...tip portion, 205...base, 206...contact probe, 206a...lower end portion, 206b...upper end portion, 207...first outer casing base, 208...second outer casing base, 209...third outer casing base, 210...switch, 211...arm, 212...second spring, 213...adjustment member, 214...third spring, 215...alignment key, 216...fourth spring. 300...accommodation section, 301...first pressing member, 302...second pressing member, 302a...inclined portion, 303...first spring, 304...third pressing member, 304a...tip portion, 304b...operation section, 305...base, 306...contact probe, 306a...lower end portion, 306b...upper end portion, 307...first outer casing base, 307a...inclined portion, 308...second outer casing base, 309...third outer casing base, 310...shaft portion, 311...contact probe base, 312...second spring, 313...adjustment member.

Claims

1. In a test socket used to test the electrical characteristics of an object to be tested, a storage section for storing the object to be inspected; a first pressing member that presses a side surface of the object to be inspected accommodated in the accommodation portion; a second pressing member that presses a sloped surface formed on the outer side of the first pressing member; a first spring that biases the second pressing member toward the housing portion; a third pressing member that presses against the first pressing member in a direction perpendicular to the first pressing member.

2. In a test socket used to test the electrical characteristics of an object to be tested, a storage section for storing the object to be inspected; a first pressing member that presses a side surface of the object to be inspected accommodated in the accommodation portion; a second pressing member disposed outside the first pressing member; a first spring fixed to the second pressing member and biasing the first pressing member toward the housing portion; a third pressing member that presses the first pressing member and the second pressing member in a direction perpendicular to the first pressing member and the second pressing member, 10. An inspection socket according to claim 9, wherein the second pressing member, pressed by the third pressing member, moves obliquely downward along an inclined surface formed on the second pressing member.

3. 3. The inspection socket according to claim 1, wherein the third pressing member has a latch structure.

Images