Connection jig, chamber with jig and withstand voltage test device

The connection jig with a holding and restricting portion, combined with an electromagnetic shield, effectively prevents noise and discharge, and manages thermal effects in withstand voltage tests.

JP2025178666APending Publication Date: 2025-12-09ESPEC CORP
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Patent Information

Application Number
JP2024085407
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-05-27
Publication Date
2025-12-09

AI Technical Summary

Technical Problem

Existing cable connection jigs for withstand voltage tests do not adequately prevent noise leakage and discharge when exposed to high voltages, and they do not effectively manage thermal effects within the test chamber.

Method used

A connection jig with a holding portion, restricting portion, and electromagnetic shield that electromagnetically shields the conductor, prevents discharge, and maintains a space to reduce thermal impact, using insulating materials and conductive members arranged equidistant from the electromagnetic shield.

Benefits of technology

Prevents noise leakage and discharge within the test chamber while reducing thermal impact by using an electromagnetic shield and spaced components to manage heat accumulation.

✦ Generated by Eureka AI based on patent content.

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Abstract

To prevent noise leakage from a hole in a test chamber when a high voltage load is applied, and to suppress discharge within the hole in the test chamber.SOLUTION: A connection jig 20 includes a holding part 28 made of an insulating material and holding a first connector 40, a restricting part 30 made of an insulating material and disposed at a position spaced apart from the holding part 28, an electromagnetic shield 32 sized to fit into a hole formed in a wall body of the test chamber and disposed to cover a gap space 34 between the holding part 28 and the restricting part 30, and a conductor 26 connected to the first connector 40 and having at least a portion to be disposed in the gap space 34. The conductor 26 is connected to a second connector 50 fixed to the restricting part 30.SELECTED DRAWING: Figure 2
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Description

[Technical Field]

[0001] The present invention relates to a connection jig, a chamber with a jig, and a withstand voltage test device. [Background technology]

[0002] Hitherto, withstand voltage test equipment has been known for checking whether electrical products, electrical components, semiconductor components, etc. have sufficient dielectric strength against the operating voltage, i.e., whether dielectric breakdown will occur, or for measuring insulation resistance. The withstand voltage test equipment includes a withstand voltage test chamber, a power supply unit that generates a high voltage (e.g., a high voltage of 1 kV or more), and wiring that connects the power supply unit to the test specimen, and is configured to apply a high voltage to the test specimen placed in the withstand voltage test chamber. The test can be accelerated by conducting the test while the test specimen is exposed to a high temperature. The wiring is led into the chamber through a cable hole provided in the high-voltage test chamber.

[0003] When passing wiring through the cable hole of the chamber, it may be possible to use the cable connection jig 80 disclosed in the following Patent Document 1. As shown in Fig. 15, this cable connection jig 80 has an outer terminal block 81 provided with outer terminals 81a to which external wiring can be connected, an inner terminal block 82 provided with inner terminals 82a to which wiring within the chamber can be connected, and connector means 85 that is inserted into a cable hole 84 of the chamber and electrically connects both terminals 81a, 82a. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2014-163718 Summary of the Invention [Problem to be solved by the invention]

[0005] The cable connection jig 80 disclosed in Patent Document 1 only requires connecting the external wiring to the outer terminal 81a while connecting the wiring inside the chamber to the inner terminal 82a, thereby avoiding the need to insert the wiring into the cable hole 84. This reduces the burden of the wiring work. However, because the cable connection jig 80 in Patent Document 1 is installed in a test device that performs environmental testing on a test specimen, it does not have measures in place to withstand high voltages such as those used in a withstand voltage test.

[0006] Therefore, the present invention has been made in consideration of the above-mentioned conventional technology, and its object is to prevent noise leakage from the hole in the test chamber when a high voltage load is applied, and to suppress discharge within the hole in the test chamber. [Means for solving the problem]

[0007] To achieve the above object, the connection jig of the present invention is a connection jig for use in a test chamber, and includes: a holding portion made of an insulating material that holds a connector portion; a restricting portion that is arranged at a position separated from the holding portion and made of an insulating material; an electromagnetic shield that is sized to fit into a hole formed in a wall of the test chamber and is arranged to cover the space between the holding portion and the restricting portion; and a conductor that is connected to the connector portion and has at least a portion that is arranged within the space. The conductor is connected to the connector portion that is fixed to the restricting portion, or is pulled out through the restricting portion while the position of the conductor relative to the electromagnetic shield is restricted.

[0008] In the connecting jig according to the present invention, the conductor is electromagnetically shielded by the electromagnetic shield in the space between the holding portion and the restricting portion, preventing noise generated by the conductor from leaking outside the holding portion, restricting portion, and electromagnetic shield even when a high voltage is applied to the conductor. Furthermore, the holding portion and restricting portion restrict the position of the conductor relative to the electromagnetic shield, thereby preventing air discharge between the conductor and the electromagnetic shield. Furthermore, the holding portion and restricting portion are spaced apart, creating a space between them. This reduces the thermal capacity of the jig compared to a jig made of an insulator shaped to fill a hole in the test chamber. Therefore, when the connecting jig is used in the test chamber, the temperature inside the test chamber is prevented from being affected by heat stored in the connecting jig.

[0009] The conductor may have a plurality of conductive members, and the connector portion of the holding portion may have a plurality of connectors corresponding to the plurality of conductive members. In this case, the plurality of conductive members may be arranged at equal distances from the electromagnetic shield by the plurality of connectors and the restricting portion.

[0010] In this aspect, since each conductive member is disposed at an equal distance from the electromagnetic shield, it is possible to avoid a situation in which discharge is likely to occur between any of the conductive members and the electromagnetic shield.

[0011] The electromagnetic shield may be formed in a cylindrical shape, and the number of the conductive members may be three or more. In this case, the conductive members may be arranged concentrically with the electromagnetic shield and at equal intervals in the circumferential direction of the electromagnetic shield.

[0012] In this configuration, the distances between adjacent conductive members in the circumferential direction are equal, which prevents discharges from occurring between adjacent conductive members. In addition, the conductive members are arranged concentrically with the electromagnetic shield, which prevents discharges from occurring between any of the conductive members and the electromagnetic shield.

[0013] The connector portion and the electromagnetic shield held by the holding portion may be in contact with a surface of the holding portion, and in this case, the surface of the holding portion may have an uneven portion formed between the connector portion and the electromagnetic shield.

[0014] In this aspect, the creeping distance between the connector portion and the electromagnetic shield can be made relatively long on the surface of the holding portion, so that the occurrence of creeping discharge can be suppressed.

[0015] The plurality of connectors may each be in contact with a surface of the holding portion, and in this case, the surface of the holding portion may have an uneven portion formed between adjacent connectors among the plurality of connectors.

[0016] In this aspect, the creeping distance between adjacent connectors on the surface of the holding portion can be made relatively long, thereby making it possible to suppress the occurrence of creeping discharge.

[0017] The connector portion may be in contact with a surface of the holding portion, in which case the surface of the holding portion may have an unevenness formed around the connector portion.

[0018] In this aspect, the creeping distance around the connector portion on the surface of the holding portion can be made relatively long, thereby making it possible to suppress the occurrence of creeping discharge.

[0019] The jig-equipped chamber according to the present invention comprises the connecting jig and a test chamber, and a hole is formed in the wall of the test chamber into which the electromagnetic shield of the connecting jig is inserted.

[0020] In the jig-equipped chamber according to the present invention, the conductor is electromagnetically shielded by the electromagnetic shield, preventing noise generated by the conductor from leaking outside the test chamber even when a high voltage is applied to the conductor when the connection jig is placed in the hole in the wall. Furthermore, the holding portion and the restricting portion restrict the position of the conductor relative to the electromagnetic shield, thereby suppressing discharge between the conductor and the electromagnetic shield. Furthermore, the holding portion and the restricting portion are spaced apart, leaving a space between them. This reduces the thermal capacity of the jig compared to when a jig made of an insulator shaped to cover the hole in the wall is used. This prevents heat accumulation in the jig from affecting the temperature in the space within the test chamber.

[0021] The connecting jig may be disposed in a position where the holding portion is located inside the test chamber with respect to the restricting portion, and the electromagnetic shield may be formed of a plate-shaped member. In this case, the jig-equipped chamber may further include a sealing member that seals the gap between the holding portion and the electromagnetic shield.

[0022] This configuration prevents air (or steam or gas in some cases) in the test chamber from entering the electromagnetic shield. Furthermore, when the test chamber is heated to a high temperature, the conductor is prevented from being exposed to the high temperature, thereby preventing discharge from the conductor. Furthermore, since the electromagnetic shield is formed of a plate-like member, discharge from the conductor to the electromagnetic shield can be more effectively prevented than when the electromagnetic shield is formed of a mesh-like member.

[0023] The withstand voltage test apparatus according to the present invention includes the chamber with the jig and a power supply unit configured to be able to apply a voltage to the conductor. [Effects of the Invention]

[0024] As described above, according to the present invention, when a high voltage load is applied, it is possible to prevent noise leakage from the hole in the test chamber and to suppress discharge within the hole in the test chamber. [Brief explanation of the drawings]

[0025] [Figure 1] 1 is a diagram schematically illustrating a withstand voltage test device according to a first embodiment. [Figure 2] 3 is a diagram showing a configuration of a connection jig provided in the withstand voltage test apparatus. FIG. [Figure 3] FIG. 4 is a view showing the connecting jig as viewed from the holding portion side. [Figure 4] FIG. 2 is a diagram showing the connecting jig in a state before the first and second connector portions, the conductor, and the electromagnetic shield are assembled. [Figure 5] FIG. 10 is a diagram showing a state in which the conductor is assembled. [Figure 6] 6 is a cross-sectional view of the holding portion taken along line VI-VI in FIG. 3. [Figure 7] 7 is a cross-sectional view of the holding portion taken along line VII-VII in FIG. 3. [Figure 8] FIG. 4 is a view showing the connecting jig as viewed from the restricting portion side. [Figure 9] 9 is a cross-sectional view of the restriction portion taken along line IX-IX in FIG. 8. [Figure 10] 9 is a cross-sectional view of the restriction portion taken along line XX in FIG. 8. [Figure 11] FIG. 4 is a side view of an electromagnetic shield provided in the connecting jig. [Figure 12] 1 is a diagram showing the connecting jig according to the first embodiment with an electromagnetic shield removed. FIG. [Figure 13] 10A and 10B are diagrams showing a connecting jig according to another embodiment. [Figure 14] 10A and 10B are diagrams illustrating a connecting jig according to another embodiment as viewed from the restricting portion side. [Figure 15] FIG. 10 is a diagram showing a conventional cable connection jig. DETAILED DESCRIPTION OF THE INVENTION

[0026] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0027] The withstand voltage test apparatus according to this embodiment is a test apparatus for applying a high voltage to a test object such as an electrical component to check whether the test object will undergo dielectric breakdown. That is, the test object includes an insulating part, and the withstand voltage test apparatus is used to evaluate the withstand voltage of this insulating part.

[0028] (First embodiment) As shown in FIG. 1, a withstand voltage test apparatus 10 includes a test chamber 12, a connection jig 20, and a power supply unit 14. The test chamber 12 has a test chamber TR in which multiple specimens S are placed. The connection jig 20 is connected to a cable hole 12b, which is an example of a hole formed in a wall 12a that separates the test chamber TR in the test chamber 12. The power supply unit 14 generates a voltage to be applied to the specimens S placed in the test chamber TR. The test chamber 12 and the connection jig 20 form a chamber 16 with a jig. In the example shown in FIG. 1, a fixing member 17 on which multiple specimens S are placed is installed on a shelf 18 in the test chamber TR, but the fixing member 17 can be omitted. The specimens S may be immersed in an insulating liquid stored in a box made of insulating material.

[0029] The test chamber 12 has a tank body 12c that forms a test chamber TR with an open front, and a door body 12d that opens and closes the front opening of the test chamber TR.

[0030] The test chamber 12 may be any type of chamber as long as it has a test chamber TR. In this embodiment, the test chamber TR can be set to a temperature environment of, for example, 100°C or higher or a sub-zero temperature environment. The test chamber 12 may also be a chamber used to induce a predetermined reaction in a test specimen placed in a room temperature environment. In this case, even if a gas, such as ozone, that should not be leaked to the outside, is generated from the test specimen, the gas can be prevented from leaking from the test chamber TR.

[0031] The power supply unit 14 is configured to generate at least one of a DC voltage and an AC voltage of, for example, 10 kV or more. A first conductive material 21 is connected to one connection end of the power supply unit 14, and a second conductive material 22 is connected to the other connection end. The first conductive material 21 and the second conductive material 22 are then electrically connected to the specimen S, respectively. This forms a closed circuit between the power supply unit 14 and the specimen S. When the power supply unit 14 generates at least one of a DC voltage and an AC voltage, no current flows in the closed circuit if the insulation of the specimen S is functioning normally. However, if the specimen S experiences insulation breakdown, current will flow in the closed circuit. Therefore, the voltage withstand capability of the specimen S can be tested by monitoring the presence or absence of current with an ammeter (not shown).

[0032] The cable hole 12b is formed in the wall 12a that partitions the test chamber TR in the tank body 12c (test chamber 12). Note that Fig. 1 shows the cable hole 12b formed in the back wall of the tank body 12c, and the first conductive material 21 is inserted through this cable hole 12b. The second conductive material 22 is inserted through a cable hole (not shown) formed in the side wall of the tank body 12c. Note that the positions of the cable hole 12b through which the first conductive material 21 is inserted and the cable hole 12b through which the second conductive material 22 is inserted are not limited to these positions.

[0033] The first conductive material 21 includes an external wiring 24, an internal chamber wiring 25, and a conductor 26. The external wiring 24 is a wiring connected to the power supply unit 14 to receive the voltage generated by the power supply unit 14, and is provided outside the chamber 12. The external wiring 24 is made of a shielded wire having a core wire, an insulating material, a shield, and a coating.

[0034] A plurality of external wirings 24 are connected to the power supply unit 14. An external connector 24a connectable to an outer connector portion 26b of a conductor 26 (described later) is provided at the tip of each external wiring 24 opposite the power supply unit 14. The withstand voltage test apparatus 10 is configured to be able to apply a high voltage to a plurality of test specimens S at once, and therefore the plurality of external wirings 24 are connected in parallel to the power supply unit 14. Note that the withstand voltage test apparatus 10 is not limited to one that tests a plurality of test specimens S at once, and may be configured to test a single test specimen S.

[0035] The in-chamber wiring 25 is wiring placed in the test chamber TR and electrically connected to the specimen S. The in-chamber wiring 25 is made of a wire having a core wire and a coating. The in-chamber wiring 25 may also be made of a shielded wire.

[0036] A plurality of internal chamber wirings 25 are provided. An internal connector 25a is provided at one end of each internal chamber wiring 25. The internal connector 25a can be connected to a first connector portion 40 provided in a holding portion 28, which will be described later. The other end of each internal chamber wiring 25 is electrically connected to the specimen S.

[0037] The conductor 26 is used to electrically connect the multiple external wirings 24 and the multiple internal chamber wirings 25. The conductor 26 is a component of the connection jig 20 inserted into the cable hole 12b. The connection jig 20 is a jig for electrically connecting the external wirings 24 and the internal chamber wirings 25 to each other through the cable hole 12b, and is arranged to block the cable hole 12b so that air (or steam or gas in some cases) inside the test chamber TR does not leak out of the test chamber TR through the cable hole 12b.

[0038] As shown in Figures 2 and 3, the connecting jig 20 includes a conductor 26, a holding portion 28, a restricting portion 30, and an electromagnetic shield 32. The holding portion 28 is disposed at the end of the cable port 12b on the test chamber TR side (the inner end of the cable port 12b), and the restricting portion 30 is disposed at the end of the cable port 12b on the outer side of the tank (the outer end of the cable port 12b). In other words, the restricting portion 30 is disposed at a position separated from the holding portion 28. Therefore, a space is formed between the holding portion 28 and the restricting portion 30, and the electromagnetic shield 32 is disposed so as to define the outer periphery of this space. The space defined by the electromagnetic shield 32 between the holding portion 28 and the restricting portion 30 will be referred to as a gap space 34 below.

[0039] 4 and 5, the holding portion 28 and the restricting portion 30 are connected by a connecting rod 35. The connecting rod 35 is made of an insulating material. The connecting rod 35 is arranged so that one end face abuts against the holding portion 28 and the other end face abuts against the restricting portion 30. The connecting rod 35 is fastened to the holding portion 28 by a fastener 37 (see FIG. 2) inserted into an insertion hole 28a (see FIG. 7) formed in the holding portion 28, and is fastened to the restricting portion 30 by a fastener 38 (see FIG. 2) inserted into an insertion hole 30a (see FIG. 10) formed in the restricting portion 30. By disposing the connecting rod 35 between the holding portion 28 and the restricting portion 30, the gap between the holding portion 28 and the restricting portion 30 is set to a predetermined width. In addition, multiple connecting rods 35 may be arranged at circumferential intervals near the outer periphery of the retaining portion 28 and the regulating portion 30, or alternatively, one connecting rod 35 may be arranged in the center of the retaining portion 28 and the regulating portion 30.

[0040] As shown in FIGS. 3 to 7, the retaining portion 28 is formed in a circular plate shape corresponding to the cross-sectional shape of the cable hole 12b and is made of an insulating material. The retaining portion 28 is arranged so that one of its main surfaces (the surface facing the gap space 34 or the space-side main surface 28c) is located inside the cable hole 12b. The other main surface (the surface facing the side opposite the gap space 34 or the opposite main surface 28d) may be arranged so as to be flush with the inner end of the cable hole 12b, or may be arranged in a position that protrudes further toward the test chamber TR than the inner end of the cable hole 12b. Therefore, the retaining portion 28 has a portion that is located in the space inside the electromagnetic shield 32.

[0041] The holding portion 28 holds a connector portion (first connector portion 40). The first connector portion 40 has a plurality of connectors (first connectors 40a) corresponding to a plurality of conductive members 26a, which will be described later.

[0042] A plurality of holding holes 28b (see FIG. 6) penetrate the holding portion 28 in the thickness direction, and the first connectors 40a are inserted into the holding holes 28b, respectively. Each of the first connectors 40a protrudes from the space-side main surface 28c of the holding portion 28 and also from the opposite main surface 28d.

[0043] An internal connector 25a (see FIG. 1) of the intra-chamber wiring 25 is detachably connected to an inner end of the first connector 40a, which is the end on the test chamber TR side. Meanwhile, an outer end of the first connector 40a, which is the end inside the cable hole 12b, is connected to a conductive member 26a (described below) that constitutes the conductor 26. By connecting the conductive member 26a to the first connector 40a, the position of the inner end side portion of the conductive member 26a is maintained in a predetermined position.

[0044] The first connectors 40a are arranged concentrically with the electromagnetic shield 32 and at equal intervals in the circumferential direction. That is, the first connectors 40a are arranged at equal intervals in the circumferential direction so that the intervals between adjacent first connectors 40a are the same. Furthermore, the first connectors 40a are arranged concentrically with the electromagnetic shield 32 so that they are equidistant from the electromagnetic shield 32.

[0045] 6 and 7, the outer peripheral surface 28e of the retaining portion 28 is provided with a rib 28f against which one axial end face of the electromagnetic shield 32 abuts. The rib 28f extends circumferentially around the entire outer peripheral surface 28e of the retaining portion 28, and the electromagnetic shield 32 contacts the side surface of the rib 28f. This prevents the electromagnetic shield 32 from protruding beyond the retaining portion 28 toward the test chamber TR, and determines the axial position of the electromagnetic shield 32 relative to the retaining portion 28.

[0046] An outer circumferential groove 28g extending circumferentially over the entire circumferential direction is formed in the outer circumferential surface 28e of the retaining portion 28. A sealing member 41 (see FIG. 4) in contact with the inner circumferential surface of the electromagnetic shield 32 is fitted into this outer circumferential groove 28g.

[0047] The sealing member 41 airtightly seals the gap between the holding portion 28 and the electromagnetic shield 32 and is formed, for example, by an O-ring. Providing the sealing member 41 makes it possible to prevent air (and in some cases steam or gas) in the test chamber TR from leaking into the gap space 34 (the space inside the electromagnetic shield 32) from the gap between the holding portion 28 and the electromagnetic shield 32. Furthermore, the sealing member 41 can prevent water droplets and foreign matter contained in gas from adhering to the space-side main surfaces 28c, 30c of the holding portion 28 and the restricting portion 30, thereby making it possible to prevent discharge via these substances.

[0048] The sealing member 41 is not limited to an O-ring, and may be formed of a silicone seal or the like that is arranged to fill the outer circumferential groove 28g. If the electromagnetic shield 32 is in airtight contact with the outer circumferential surface 28e of the holding portion 28, the sealing member 41 can be omitted.

[0049] 3 and 6, the surface of the holding portion 28 that comes into contact with the first connector portion 40 has projections and recesses formed thereon. Note that the projections and recesses may be omitted.

[0050] Specifically, the multiple first connectors 40a held by the holding portion 28 are provided so as to protrude from the space-side main surface 28c and the opposite-side main surface 28d of the holding portion 28, respectively, and are in contact with the space-side main surface 28c and the opposite-side main surface 28d (see FIG. 2). The electromagnetic shield 32 is in contact with the outer peripheral surface 28e of the holding portion 28. A recess (circumferential recess 43), which is a type of unevenness, is formed between the first connectors 40a (or the holding holes 28b) and the outer peripheral surface 28e and extends in the circumferential direction on the space-side main surface 28c and the opposite-side main surface 28d. Therefore, the creepage distance between the first connectors 40a and the electromagnetic shield 32 is increased on the space-side main surface 28c and the opposite-side main surface 28d.

[0051] The circumferential recess 43 may be formed in an arc shape concentric with the outer circumferential surface 28e, or may be formed to extend over the entire circumferential direction. To increase the creepage distance, a convex portion (circumferential convex portion) may be provided instead of the circumferential recess 43, or unevenness may be provided.

[0052] 3 and 7, recesses (radial recesses 44), which are a type of unevenness, are formed in the space-side main surface 28c and the opposite-side main surface 28d between adjacent first connectors 40a so as to extend in the radial direction. Therefore, the creepage distance between adjacent first connectors 40a is increased on the space-side main surface 28c and the opposite-side main surface 28d.

[0053] In order to increase the creepage distance, convex portions (radial convex portions) may be provided instead of the radial concave portions 44, or unevenness may be provided.

[0054] 3 and 6, recesses (peripheral recesses 45), which are a type of unevenness, are formed around the holding hole 28b on the space-side main surface 28c and the opposite-side main surface 28d. That is, unevenness is formed on the surface of the holding portion 28 that comes into contact with the first connector 40a. This increases the creepage distance on the space-side main surface 28c and the opposite-side main surface 28d.

[0055] In order to increase the creepage distance, a convex portion (peripheral convex portion) may be provided instead of the peripheral concave portion 45, or unevenness may be provided.

[0056] The restricting portion 30 is disposed at a position spaced apart from the holding portion 28 in the longitudinal direction of the conductor 26. As shown in FIGS. 8 to 10 , the restricting portion 30 is formed in the shape of a circular plate having the same diameter as the holding portion 28 and is made of an insulating material. The restricting portion 30 is disposed so that one of its main surfaces (the surface facing the gap space 34 or the space-side main surface 30c) is located inside the cable hole 12b. The other main surface (the surface facing the opposite side from the gap space 34 or the opposite main surface 30d) may be disposed so as to be flush with the outer end of the cable hole 12b, or may be disposed in a position that protrudes outward beyond the outer end of the cable hole 12b (outside the test chamber 12). Therefore, the restricting portion 30 has a portion that is located in the space inside the electromagnetic shield 32.

[0057] 2, a stop plate 47 is fastened to the restricting portion 30, and this stop plate 47 is fixed to the wall 12a of the tank body 12c (test chamber 12) that defines the test chamber TR. As a result, the connecting jig 20 is fixed to the test chamber 12 in an orientation in which the restricting portion 30 is located on the opposite side of the holding portion 28 from the test chamber TR.

[0058] 2 and 8, a connector portion (second connector portion 50) is fixed to the restricting portion 30. The second connector portion 50 has a plurality of connectors (second connectors 50a) corresponding to a plurality of conductive members 26a described below.

[0059] A plurality of restriction holes 30b (see FIG. 9) penetrate the restriction portion 30 in the thickness direction, and the second connectors 50a are inserted into the restriction holes 30b, respectively. Each second connector 50a protrudes from the space-side main surface 30c of the restriction portion 30 and also from the opposite main surface 30d.

[0060] An external connector 24a of the external wiring 24 is detachably connected to the outer end of the second connector 50a. Meanwhile, an inner end of the second connector 50a, which is the end inside the cable hole 12b, is connected to a conductive member 26a (described below) that constitutes the conductor 26. By connecting the conductive member 26a to the second connector 50a, the position of the outer end side portion of the conductive member 26a is regulated.

[0061] The second connectors 50a are arranged concentrically with the electromagnetic shield 32 and at equal intervals in the circumferential direction. That is, the second connectors 50a are arranged at equal intervals in the circumferential direction so that the intervals between adjacent second connectors 50a are the same. Furthermore, the second connectors 50a are arranged concentrically with the electromagnetic shield 32 so as to be equidistant from the electromagnetic shield 32.

[0062] The surface of the restricting portion 30 is formed with projections and recesses, similar to the holding portion 28. However, the projections and recesses may be omitted.

[0063] Specifically, the multiple second connectors 50a fixed to the restriction portion 30 are provided so as to protrude from the space-side main surface 30c and the opposite-side main surface 30d of the restriction portion 30, respectively, and are in contact with the space-side main surface 30c and the opposite-side main surface 30d. An electromagnetic shield 32 is in contact with the outer peripheral surface 30e of the restriction portion 30. As shown in FIGS. 8 and 9, recesses (circumferential recesses 52), which are a type of unevenness, are formed in the space-side main surface 30c and the opposite-side main surface 30d between the second connectors 50a (or the restriction holes 30b) and the outer peripheral surface 30e, extending in the circumferential direction. Therefore, the creepage distance between the second connectors 50a and the electromagnetic shield 32 is increased on the space-side main surface 30c and the opposite-side main surface 30d.

[0064] The circumferential recess 52 may be formed in an arc shape concentric with the outer circumferential surface 30e, or may be formed to extend over the entire circumferential direction. To increase the creepage distance, a convex portion (circumferential convex portion) may be provided instead of the circumferential recess 52, or unevenness may be provided.

[0065] 8 and 10, recesses (radial recesses 53), which are a type of unevenness, are formed in the space-side main surface 30c and the opposite-side main surface 30d between adjacent second connectors 50a so as to extend in the radial direction. Therefore, the creepage distance between adjacent second connectors 50a is increased on the space-side main surface 30c and the opposite-side main surface 30d.

[0066] In order to increase the creepage distance, convex portions (radial convex portions) may be provided instead of the radial concave portions 53, or concaves and convexes may be provided.

[0067] 8 and 9, a recess (peripheral recess 54), which is a type of unevenness, is formed around the restriction hole 30b on the space-side main surface 30c and the opposite-side main surface 30d. That is, unevenness is formed on the surface of the restriction portion 30 that comes into contact with the second connector 50a. This increases the creepage distance on the space-side main surface 30c and the opposite-side main surface 30d.

[0068] To increase the creepage distance, a convex portion (peripheral convex portion) may be provided instead of the peripheral concave portion 54, or irregularities may be provided.

[0069] The conductor 26 is a conductor for electrically connecting the external wiring 24 and the internal wiring 25 to each other. The conductor 26 has a plurality of conductive members 26a, and each conductive member 26a is made of a metal conductor such as a flexible metal wire or an inflexible metal rod. One end (outer end) of each conductive member 26a is provided with an outer connecting portion 26b (see FIG. 5) that connects to a second connector 50a provided in the restricting portion 30. The other end (inner end) of each conductive member 26a is provided with an inner connecting portion 26c (see FIG. 5) that connects to a first connector 40a provided in the holding portion 28.

[0070] Each conductive member 26a is disposed in the space between the holding portion 28 and the restricting portion 30. That is, the conductor 26 has a portion that is disposed in the space inside the electromagnetic shield 32. Each conductive member 26a is disposed concentrically with the electromagnetic shield 32 and at equal intervals in the circumferential direction of the electromagnetic shield 32.

[0071] 2 to 4, four conductive members 26a are provided, but the number of conductive members 26a is not limited to this. The number of first connectors 40a of the holding portion 28 and the number of second connectors 50a of the restricting portion 30 correspond to the number of conductive members 26a, and the numbers of first connectors 40a and second connectors 50a also change depending on the number of conductive members 26a.

[0072] Each conductive member 26a is coated with an insulating coating 56. Therefore, an insulator is interposed between adjacent conductive members 26a, preventing aerial discharge between the adjacent conductive members 26a. Each conductive member 26a may also be coated with a second insulating coating 57 that is harder than the insulating coating 56. This further reduces deformation of each conductive member 26a. The second insulating coating 57 may be omitted.

[0073] Similar to the holding portion 28, the restricting portion 30 may have an outer peripheral groove (not shown) formed on its outer peripheral surface 30e, and a sealing member (not shown) may be fitted into this outer peripheral groove. This sealing member is in airtight contact with the electromagnetic shield 32. Alternatively, the electromagnetic shield 32 may be in airtight contact with the outer peripheral surface 30e of the restricting portion 30 without providing a sealing member.

[0074] As shown in Fig. 11, the electromagnetic shield 32 is formed into a cylindrical shape from a thin metal plate. The electromagnetic shield 32 has a shape that fits the cross-sectional shape of the cable hole 12b, and the outer peripheral surface of the electromagnetic shield 32 is in airtight contact with the inner peripheral edge of the cable hole 12b over the entire circumferential direction. However, the outer peripheral surface of the electromagnetic shield 32 does not need to be in contact with the inner peripheral edge of the cable hole 12b over the entire axial direction; it is sufficient that the outer peripheral surface of the electromagnetic shield 32 is in contact with the inner peripheral edge of the cable hole 12b over at least a portion of the axial direction. The contact of the electromagnetic shield 32 with the cable hole 12b prevents air (or steam or gas, as the case may be) in the test chamber TR from leaking to the outside through the gap between the electromagnetic shield 32 and the inner peripheral edge of the cable hole 12b.

[0075] In this embodiment, the electromagnetic shield 32 is provided to prevent noise leakage as well as air leakage, and is therefore in airtight contact with the inner periphery of the cable hole 12b. However, if preventing air leakage is not important, the electromagnetic shield 32 does not need to be in airtight contact with the inner periphery of the cable hole 12b. In this case, the electromagnetic shield 32 may be formed into a cylindrical shape using a mesh member.

[0076] A shield wire 58 (see FIG. 2) is connected to the electromagnetic shield 32, and when the electromagnetic shield 32 becomes charged, the charge can be released through the shield wire 58.

[0077] As described above, in the connecting jig 20 according to this embodiment, the conductor 26 is electromagnetically shielded by the electromagnetic shield 32 in the space between the holding portion 28 and the restricting portion 30. Therefore, even when a high voltage is applied to the conductor 26, noise generated by the conductor 26 can be prevented from leaking outside the holding portion 28, the restricting portion 30, and the electromagnetic shield 32. Furthermore, the holding portion 28 and the restricting portion 30 restrict the position of the conductor 26 relative to the electromagnetic shield 32, thereby preventing air discharge between the conductor 26 and the electromagnetic shield 32. Furthermore, because the holding portion 28 and the restricting portion 30 are spaced apart from each other, a space is formed between the holding portion 28 and the restricting portion 30. This reduces the thermal capacity of the connecting jig compared to a jig made of an insulator shaped to fill the cable hole 12b. Therefore, when the connecting jig 20 is used in the test chamber 12, the temperature in the test chamber 12 can be prevented from being affected by heat stored in the connecting jig 20.

[0078] Furthermore, in the connecting jig 20 of this embodiment, the multiple conductive members 26a are arranged by the multiple connectors and restricting portions 30 so as to be equidistant from the electromagnetic shield 32. This makes it possible to avoid a situation in which discharge is likely to occur between any of the conductive members 26a and the electromagnetic shield 32.

[0079] Furthermore, in the connecting jig 20 of this embodiment, the conductive members 26a are arranged concentrically with the electromagnetic shield 32 and at equal intervals in the circumferential direction of the electromagnetic shield 32, and the distance between adjacent conductive members 26a in the circumferential direction is equal. This makes it possible to prevent discharge from occurring easily between adjacent conductive members 26a.

[0080] Furthermore, in the connecting jig 20 of this embodiment, unevenness is formed on the space-side principal surface 28c and the opposite-side principal surface 28d of the holding portion 28, with which the first connector 40a comes into contact, between the first connector portion 40 and the electromagnetic shield 32. This makes it possible to relatively increase the creeping distance on the surface of the holding portion 28 between the first connector portion 40 and the electromagnetic shield 32, thereby suppressing the occurrence of creeping discharge.

[0081] Furthermore, in the connecting jig 20 of this embodiment, unevenness is formed between adjacent first connectors 40a on the space-side main surface 28c and the opposite-side main surface 28d of the holding portion 28, with which the first connectors 40a come into contact. Therefore, the creeping distance between adjacent first connectors 40a can be relatively long on the space-side main surface 28c and the opposite-side main surface 28d of the holding portion 28, and the occurrence of creeping discharge can be suppressed.

[0082] Furthermore, in the connecting jig 20 of this embodiment, unevenness is formed around the first connector portion 40 on the space-side main surface 28c and the opposite-side main surface 28d of the holding portion 28. This makes it possible to relatively increase the creeping distance around the first connector portion 40 on the space-side main surface 28c and the opposite-side main surface 28d of the holding portion 28, thereby suppressing the occurrence of creeping discharge.

[0083] Furthermore, in the connection jig 20, the jig-equipped chamber 16, and the withstand voltage test apparatus 10 of this embodiment, the holding portion 28 and the restricting portion 30 are spaced apart, and a space (gap space 34) is formed between the holding portion 28 and the restricting portion 30. Therefore, compared to when the inside of the cable hole 12b is blocked with a jig made of an insulating material, the heat capacity of the jig can be reduced, and it is possible to prevent the temperature in the space inside the test chamber from being affected by heat stored in the jig.

[0084] Furthermore, the connecting jig 20, the chamber 16 with the jig, and the withstand voltage test apparatus 10 of this embodiment are provided with a sealing member 41 that seals the gap between the holding portion 28 and the electromagnetic shield 32. This prevents air (or steam or gas in some cases) inside the test chamber 12 from entering the electromagnetic shield 32. Furthermore, when the inside of the test chamber 12 is heated to a high temperature, the conductor 26 can be prevented from being exposed to the high temperature, thereby suppressing discharge from the conductor 26. Furthermore, because the electromagnetic shield 32 is formed from a plate-like member, discharge from the conductor 26 to the electromagnetic shield 32 can be suppressed more effectively than when the electromagnetic shield 32 is formed from a mesh-like member or the like.

[0085] In the present embodiment, the first connector 40a is configured to protrude from both the space-side main surface 28c and the opposite-side main surface 28d of the holding portion 28, but this is not limiting. For example, the first connector 40a may be configured to protrude only from the opposite-side main surface 28d of the holding portion 28, and not from the space-side main surface 28c. In this case, the conductive member 26a is configured to be connected to the first connector 40a inside the holding portion 28.

[0086] In addition, in the present embodiment, the second connector 50a is configured to protrude from both the space-side main surface 30c and the opposite-side main surface 30d of the restriction portion 30, but this is not limited to this. For example, the second connector 50a may be configured to protrude only from the opposite-side main surface 30d of the restriction portion 30, and not from the space-side main surface 30c. In this case, the conductive member 26a is configured to be connected to the second connector 50a inside the restriction portion 30.

[0087] (Second embodiment) In the first embodiment, the position of the outer portion of the conductor 26 (plurality of conductive members 26a) is restricted by fixing the second connector portion 50 to the restricting portion 30 and connecting the conductor 26 (plurality of conductive members 26a) to the second connector portion 50. That is, the conductor 26 (plurality of conductive members 26a) is provided separately from the external wiring 24.

[0088] In contrast to this, in the second embodiment, the restricting portion 30 is not provided with a second connector portion 50. As shown in Fig. 12, the conductors 26 (plurality of conductive members 26a) are inserted into the restricting holes 30b of the restricting portion 30 and are drawn out to the outside through the restricting portion 30. Note that the same components as those in the first embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted.

[0089] The restriction hole 30b may have a larger inner diameter than the restriction hole 30b of the restriction portion 30 in the first embodiment. In this case, the conductive members 26a (including the insulating coating 56 and the second insulating coating 57, if any) may not contact the inner circumferential surface of the restriction hole 30b. However, even in this case, the position of the conductive members 26a (conductors 26) in the restriction hole 30b is restricted by the restriction hole 30b. Therefore, it is possible to prevent aerial discharge between the conductive members 26a (conductors 26) and the electromagnetic shield 32.

[0090] An inner end of the conductive member 26a is provided with an inner connecting portion 26c that is connected to a first connector 40a provided on the holding portion 28. Meanwhile, the conductive member 26a passes through a restriction hole 30b of the restriction portion 30 and is drawn out from the gap space 34 to the outside. That is, the conductive member 26a (conductor 26) passes through the restriction portion 30 and is drawn out to the outside. This conductive member 26a (conductor 26) constitutes at least a part of the external wiring 24. Therefore, the outer end of the conductive member 26a (conductor 26) may be directly connected to the power supply unit 14.

[0091] In the second embodiment, the inner connecting portion 26c can be removed from the first connector 40a of the holding portion 28 by pulling the conductive member 26a from the outside of the connecting jig 20.

[0092] Although the description of other configurations, actions, and effects will be omitted, the description of the first embodiment can be applied to the second embodiment.

[0093] (Other embodiments) It should be noted that the embodiments disclosed herein are illustrative in all respects and should not be considered limiting. The present invention is not limited to the above-described embodiments, and various modifications and improvements are possible without departing from the spirit and scope of the present invention.

[0094] For example, in the above embodiment, since the cable hole 12b is formed with a circular cross section, the holding portion 28 and the restricting portion 30 are formed with a disk shape, and the electromagnetic shield 32 is formed with a cylindrical shape. However, this is not limited to this. If the cable hole 12b has a shape other than a circular cross section, the holding portion 28 and the restricting portion 30 are formed with a corresponding shape, and the electromagnetic shield 32 is also formed with a cylindrical shape having a corresponding cross section. For example, if the cable hole 12b has a polygonal cross section, the holding portion 28 and the restricting portion 30 will also be polygonal, and the electromagnetic shield 32 will also be cylindrical with a polygonal cross section.

[0095] 13, a partition member 59 may be provided between the holding portion 28 and the restriction portion 30. The partition member 59 is provided to prevent air (and in some cases steam or gas) on the holding portion 28 side in the gap space 34 from flowing toward the restriction portion 30 side. For this reason, it is preferable that a sealing member (not shown) is provided on the outer peripheral surface of the partition member 59, similar to the holding portion 28. Furthermore, by providing the partition member 59, it becomes more difficult for the temperature on the test chamber TR side to be transmitted to the outside of the test chamber TR.

[0096] 14, the restriction portion 30 may be formed with a through-hole 30f so that dry air can be supplied into the gap space 34. This reduces the amount of water vapor in the gap space 34, thereby preventing the portions of the holding portion 28 and the restriction portion 30 that face the gap space 34 from becoming wet, thereby suppressing creeping discharge on the wet surfaces. Furthermore, instead of being used to supply dry air, the through-hole 30f may be used to evacuate the gap space 34. When the through-hole 30f is not used, a plug member (not shown) that closes the through-hole 30f may be provided.

[0097] The insulating coating 56 of each conductive member 26a may be omitted. In this case, however, insulating partitions are provided between the conductive members 26a to prevent aerial discharge between the conductive members 26a. That is, an insulator is interposed between the conductive members 26a. This insulating partition may be disposed at the position of the radial recess 44 of the holding portion 28 shown in FIG. 3. Furthermore, to prevent aerial discharge between the conductive members 26a and the electromagnetic shield 32, an insulating partition is also provided between the conductive members 26a and the electromagnetic shield 32. That is, an insulator is interposed between the conductive members 26a and the electromagnetic shield 32. This insulating partition may be disposed at the position of the circumferential recess 43 of the holding portion 28 shown in FIG. 3. Furthermore, an insulating resin coating may be applied to the inner circumferential surface of the electromagnetic shield 32. [Explanation of symbols]

[0098] 10: Withstand voltage test equipment 12: Test chamber 12a: Wall 12b: Cable port 14: Power supply section 16: Chamber with jig 20: Connection jig 26: Conductor 26a: Conductive member 28: Holding part 30: Regulation Department 32: Electromagnetic shield 34: Interstitial space 40: First connector part 40a: First connector 41: Sealing member 43: Circumferential recess 44: Radial recess 45: Surrounding recess 50: Second connector part

Claims

1. A connection jig for use in a test chamber, a holding portion made of an insulating material that holds the connector portion; a restricting portion that is disposed at a position separated from the holding portion and is made of an insulating material; an electromagnetic shield having a size that fits into a hole formed in a wall of the test chamber and is arranged to cover the space between the holding portion and the restricting portion; a conductor connected to the connector portion and having at least a portion disposed within the space, A connection jig in which the conductor is connected to a connector portion fixed to the regulating portion, or is pulled out through the regulating portion while the position of the conductor relative to the electromagnetic shield is regulated.

2. the conductor has a plurality of conductive members; the connector portion of the holding portion has a plurality of connectors corresponding to the plurality of conductive members, The connecting jig according to claim 1 , wherein the plurality of conductive members are arranged at equal distances from the electromagnetic shield by the plurality of connectors and the restricting portion.

3. The electromagnetic shield is formed in a cylindrical shape, the plurality of conductive members is three or more; The connecting jig according to claim 2 , wherein the conductive members are concentric with the electromagnetic shield and are arranged at equal intervals in the circumferential direction of the electromagnetic shield.

4. the connector portion and the electromagnetic shield held by the holding portion are in contact with a surface of the holding portion, The connecting jig according to claim 1 , wherein the surface of the holding portion has an uneven surface formed between the connector portion and the electromagnetic shield.

5. each of the plurality of connectors contacts a surface of the holding portion; The connecting jig according to claim 2 , wherein the surface of the holding portion has projections and recesses formed between adjacent connectors among the plurality of connectors.

6. the connector portion is in contact with a surface of the holding portion, The connecting jig according to claim 1 , wherein the surface of the holding portion is formed with irregularities around the periphery of the connector portion.

7. The connecting jig according to any one of claims 1 to 6; a test chamber; A chamber with a jig, wherein a wall of the test chamber is formed with a hole into which the electromagnetic shield of the connection jig is inserted.

8. the connecting jig is disposed in a position in which the holding portion is positioned inside the test chamber with respect to the restricting portion, the electromagnetic shield is formed of a plate-shaped member, The jig-equipped chamber according to claim 7 , further comprising a sealing member that seals the gap between the holding portion and the electromagnetic shield.

9. The jig-equipped chamber according to claim 7; a power supply unit configured to be able to apply a voltage to the conductor.

Citation Information

Patent Citations

  • Terminal unit, and environmental test device with terminal unit

    JP2014163718A