Inspection device and method for inspecting segments for the energy battery manufacturing industry

Abstract

An inspection device 1 for inspecting segments 2 suitable for assembling a battery stack for the energy battery manufacturing industry, a conveying device 3 having a number of receiving compartments 4 for receiving and conveying one of the segments 2 each, In the inspection device 1, the plurality of storage units 4 are movable by moving the conveying device relative to a fixed unit 5 of the inspection device 1, each of said plurality of receiving compartments 4 comprises at least two contact surfaces 6, 7, 8 for electrical and / or signal-technical contact with a segment 2 received in the respective receiving compartment 4, the testing device 1 in which at least two of the contact surfaces 6, 7, 8 of each one of the plurality of receiving sections 4 are connectable to at least one measuring device 10a, 10b, 10c, 10d by means of a switch matrix 9;

Description

[Technical field]

[0001] The invention relates to an inspection device having the generic features of claim 1 and to a corresponding method having the generic features of claim 15. [Background technology]

[0002] Power batteries or accumulators, for example battery cells, are used for electrolyte batteries, for example in cars, other vehicles, ships and aircraft. In said batteries, huge amounts of power must be stored rechargeably for longer periods. For this purpose, such power batteries have a structure consisting of a large number of stacks of stacked segments. These segments are formed, for example, by single cells. The anode and cathode sheets of each of these cells are interleaved. These sheets are also called electrodes, separated from each other by separator sheets. Generally, a single cell therefore has the stacking sequence: separator - electrode (for example anode) - separator - electrode (for example cathode).

[0003] These segments are pre-cut during the manufacturing process and stacked together in a predetermined order into a cell stack, eg, bonded together by lamination.

[0004] Apparatuses for producing battery cells are known, for example, from WO 2016041713 A1 and DE 102017216213 A1.

[0005] The segments may be damaged during the manufacturing process. In the case of a segment as a single cell, for example, the separator may be damaged during its manufacture. If a single cell with a damaged separator is used to assemble a battery stack, this may adversely impair the function of the battery stack and may adversely shorten its service life.

[0006] The power cell may be, for example, a fuel cell or a solar cell, in which case the segments may also be damaged during their manufacture.

[0007] It is therefore primarily known from the prior art to inspect the segments during the stacking process and possibly reject them during the manufacturing process so that only normal segments are used to assemble the battery stack.

[0008] Such a test process must be carried out taking into account the current production capacity and the transport speed of the production facility. Therefore, it is mainly known from the prior art to provide a test device which cooperates with the segments during the production process and tests them in turn. For this, the test device actively contacts so-called conductive protrusions which are components of the electrodes of the segments. However, with such a test method, the machine performance is limited due to the discontinuous movement. Furthermore, the segments can be damaged when contacted by the conductive protrusions. [Prior art documents] [Patent documents]

[0009] [Patent Document 1] International Patent Application Publication No. 2016041713 [Patent Document 2] DE 102017216213 Summary of the Invention [Problem to be solved by the invention]

[0010] The object of the present invention is to provide an improved inspection device and a corresponding method for inspecting segments. Further preferred embodiments of the invention are described in the dependent claims, the drawings and the associated specification. [Means for solving the problem]

[0011] To achieve this object, an inspection device for the energy battery manufacturing industry is therefore proposed for inspecting segments suitable for assembling a battery stack, whereby a transport device with a number of receptacles is provided for receiving and transporting a respective one of the segments, whereby the receptacles are movable by moving the transport device relative to a fixing part of the inspection device, whereby each of the receptacles comprises at least two contact surfaces for electrical and / or signal-technical contacting with the respective segment accommodated in the respective receptacle, whereby at least two contact surfaces of the plurality of contact surfaces of each receptacle of the plurality of receptacles are connectable to at least one measuring device by means of a switch matrix.

[0012] The segments arranged in the receiving section can be transported by a transport device. In this case, during the transport process, an inspection of the segments can be carried out by the contact surfaces. If the receiving section includes at least two contact surfaces, at least one separator can be measured.

[0013] Preferably, each of the plurality of receptacles comprises at least three contact surfaces, and more preferably consists of exactly three contact surfaces.

[0014] Preferably, the switch matrix is ​​configured to connect at least two or three contact surfaces of one of the multiple receptacles differently so that measurements by the at least one measuring device can be performed in a predefined electrical circuit or in a different electrical circuit.

[0015] A switch matrix in this application preferably includes at least one input channel and multiple output channels that are connectable to each other in a predetermined arrangement, and may be configured to connect two or multiple output paths to each other.

[0016] At least two contact surfaces of each of the receptacles are connected to a number of output channels of the switch matrix, which in turn are connected to at least one measuring device which is connected to said at least one output channel. Basically, it is also possible to connect each of the at least one measuring device to the switch matrix via two or more input channels.

[0017] Preferably, all contact surfaces of the receptacle are connected to the switch matrix on the output channel side, and more preferably, all measuring devices are also connected to the switch matrix on the input channel side.

[0018] It is self-evident that the matrix may in principle have other input channels and / or other output channels that are not connected to the at least one measuring device or to the contact surfaces, so that for example other input channels may be provided in which a power supply is connected to the switch matrix via said other input channels.

[0019] At least two of the at least three contact surfaces of one housing can preferably be connected to a measuring device at the same time. For example, based on the measurement of the impedance, ohmic resistance or capacitance of at least two of the at least three contact surfaces, the system state of the respective segment can be inferred. The ohmic resistance can be measured in the case of direct current or as the reciprocal of the real part of the complex admittance in the case of alternating current, for example with a frequency of 1 kHz, 10 kHz or 1000 kHz. The capacitance can be measured analogously in the case of alternating voltage. By means of the dielectric breakdown test, for example, foreign bodies can be detected, the diameter or dimensions of which are smaller than the layer thickness of the separator. For example, if the segment to be inspected is formed by the above-mentioned single cell, the electrical resistance between two electrodes decreases when the separator arranged between these electrodes is damaged.

[0020] If there are at least three, preferably exactly three, contact surfaces per receptacle, a so-called three-point measurement of the segments arranged in this receptacle can be carried out. This has the advantage that the two separators of one cell can be tested separately and / or together, i.e. not only the separator of the segment arranged between the first and second electrodes can be tested, but also the outer separator which is first contacted by an electrode of the adjacent segment during assembly of the battery stack. The corresponding measurements can be carried out by intelligently connecting the contact surfaces to at least one measuring device.

[0021] Furthermore, if there are at least three contact surfaces per receptacle, it has the advantage that a very damage-free electrical contact of the segments is possible. Due to this appropriate connection of two of the three contact surfaces, various measurements can be carried out without the segment having to be removed from the receptacle. By avoiding the transfer of the segment to be tested to another receptacle or to another test device, measurements of the segment can be carried out with very gentle handling of the product. In particular, the very sensitive conductive projections of the electrodes already mentioned at the beginning are not repeatedly contacted.

[0022] Preferably, the transport device is formed by a rotatably supported drum. A number of receptacles are arranged on the outer surface of the drum, which is radially outward. The segments to be inspected can thus be transported by a rotational movement, which is very simple and efficient. The transport device is then formed by the inspection drum. The receptacles are either fixedly connected to the drum and therefore can only be removed using a tool, or the receptacles themselves form the drum.

[0023] Preferably, a number of measuring devices are provided. In this case, the switch matrix is ​​configured to electrically and / or signal-technically connect individual or multiple contact surfaces of the multiple contact surfaces of each of the multiple receptacles to different measuring devices. Thus, a segment can be connected to different measuring devices without being removed from the respective receptacle. This allows for a very gentle measurement of different parameters and of the product. For example, it is also possible for multiple segments arranged in different receptacles to be tested in parallel.

[0024] According to a preferred embodiment, each of the receptacles comprises a first contact surface and a second contact surface for electrical and / or signal-technical contact with two electrodes of the arranged segment. In this case, it is proposed that a third contact surface is provided for electrical and / or signal-technical contact with the separators of the arranged segment. Preferably, each of the receptacles has contact surfaces arranged in this way. This arrangement of the contact surfaces in a receptacle allows the separators of a cell to be advantageously separated from one another without the cell having to be removed from the receptacle of the transport device. The third contact surface is therefore used as an electrode temporarily attached to the test device. The separators lying outside the segment can be tested with this electrode.

[0025] Preferably, the third contact surface simultaneously forms a carrier for the respective segment or at least a part of the carrier. In this case, the flat extension of the third contact surface corresponds to the area of ​​the electrode of the respective segment excluding the conductive protrusions of the electrode; preferably, the flat extension of the third contact surface differs from the flat extension of the electrode by less than 50%, more preferably by less than 20%, in particular by less than 10%. The carrier thus simultaneously assumes the function of transporting the segments and the function of electrically connecting or signal-technically contacting the separators of the transported segment. For example, when a segment is transported as a single cell in a receiving section, a separator of the segment to be inspected, preferably one of the separators, rests against the carrier of the respective receiving section. The first and second contact surfaces then contact both electrodes of the segment by means of the above-mentioned conductive protrusions protruding from the bottom side of the separators.

[0026] According to another preferred embodiment, instead of the third contact surface a pure carrier can be provided, which preferably consists of an insulating material, for example in order to reduce stray capacitances during measurements by the first and second contact surfaces.

[0027] The proposed device with one or more segments, for example as single cells, arranged in a receiving section is naturally also included in the disclosure of the present application.

[0028] Preferably, the switch matrix is ​​configured such that the first contact surface and the second contact surface simultaneously connect to the same measuring device, the first contact surface and the third contact surface simultaneously connect to the same measuring device, and / or the second contact surface and the third contact surface simultaneously connect to the same measuring device. For example, when one segment is arranged in one of the housings for the purpose of testing as one single cell, for example, three contact surfaces of one housing contact the arranged segment as follows: The segment abuts the third contact surface by a first separator; a first electrode adjacent the first separator abuts the first contact surface, e.g., as an anode; and a second electrode separated from the first electrode by a second separator is connected to the second contact surface, e.g., as a cathode.

[0029] When the first contact surface and the second contact surface are simultaneously connected to at least one measuring device, a separator arranged between these contact surfaces can be inspected.

[0030] If the first contact surface and the third contact surface are simultaneously connected to at least one measuring device, a separator arranged outside the segment can be inspected.

[0031] If the second contact surface and the third contact surface are simultaneously connected to at least one measuring device, the first separator and the second separator can be tested simultaneously, the first separator and the second separator being arranged according to a switching arrangement in a series circuit or a parallel circuit between the second contact surface and the third contact surface.

[0032] These switching arrangements, which can be adjusted by a switch matrix, allow a comprehensive examination of the segment to be examined.

[0033] According to another preferred embodiment, it is proposed that the contact surfaces are arranged in one of the receiving parts in an electrically insulated manner from one another. Preferably, the contact surfaces are also electrically insulated from the rest of the conveying device. For example, the mutual electrical insulation of the contact surfaces can also be achieved by at least a part of the conveying device being made of a non-conductive material.

[0034] Preferably, the switch matrix is ​​configured to connect at least three contact surfaces of one of the receptacles differently, such that measurements by at least one measuring device can be performed with different electric circuits. For example, the switching arrangements can be different depending on whether the first separator or the second separator or both separators are to be tested. In this way, multiple measurements can be performed on a segment while this segment is being transported on the transport device. For example, two or more contact surfaces of one receptacle can be short-circuited to each other.

[0035] Preferably, the switch matrix is ​​configured to connect each of the contact surfaces of one of the housings to a power supply and / or to ground. This type of connection may allow further switching arrangements, so that the measurement possibilities may be expanded.

[0036] Preferably, the switch matrix includes a number of relays for connecting the contact surfaces together and / or for connecting individual or multiple contact surfaces of the contact surfaces to one or more measuring devices. In this case, these relays can be open-loop or closed-loop controlled, for example by a control device. Since there are a large number of switching combinations, it has proven advantageous to operate the switch matrix by means of relays. The switch matrix, i.e. the relays, can be controlled, for example, based on the position of the transport device relative to the fixing part of the inspection device. Naturally, alternatively or additionally, other input parameters can be used for open-loop or closed-loop control of the switch matrix or the relays. The connection of the individual or multiple contact surfaces to ground and / or to the power supply is preferably carried out by relays. The main advantage of relays is the galvanically isolated passive switching and the minimally intrusive behavior for changing the measurement section. Furthermore, relays can conduct direct and alternating current; in contrast, switching transistors can only conduct direct current. Furthermore, switching transistors have a significant influence on the measurement section.

[0037] Preferably, the switch matrix is ​​a component of the transport device, so that connections in the transport device can be efficiently implemented.

[0038] Preferably, the at least one measurement device is configured to measure capacitance and / or ohmic resistance and / or to perform a dielectric breakdown test. Measurement devices or methods for measuring ohmic resistance or capacitance are well known and provide reliable measurement results. By testing a segment using ohmic resistance and / or capacitance measurements, the system state of the segment to be tested can be reliably inferred.

[0039] Preferably, the at least one measuring device is a component of the stationary part of the inspection device. The at least one measuring device therefore does not have to be moved by the transport device. This is particularly advantageous if the inspection device is composed of several measuring devices. Furthermore, several measuring devices may be connected to contact surfaces of preferably different receiving parts. As a result, only a smaller number of measuring devices are required. However, it is also basically possible to integrate one or more of the several measuring devices in the transport device.

[0040] According to another preferred embodiment it is proposed that the transport device is electrically and / or signal-technically connected to said stationary part by means of a sliding contact device, which has proven to be advantageous for connecting a moving, e.g. rotating, transport device to a stationary part of the testing device.

[0041] Preferably, each of the plurality of accommodation parts has an opening through which a vacuum can be applied to hold the segment. The holding of the segment, in particular the conductive protrusion, can be performed very gently by vacuum, since gripping and / or clamping tools that can damage the sliding contact device can be omitted. The opening can be provided, for example, in the carrier as the third contact surface and / or in at least one of the remaining contact surfaces. Furthermore, the opening can be formed, for example, by a holding hole or by a pore in the breathable material. However, it is also possible that instead the segment can be held in the accommodation part by mechanical means.

[0042] Furthermore, the above-mentioned object is achieved by a method for the energy battery manufacturing industry for inspecting segments provided for assembling a battery stack, whereby a number of segments are inspected by means of the above-mentioned inspection device, whereby each of the segments is arranged in one of a number of receptacles.

[0043] Preferably, the inspection of the segment is carried out during the transport of said segment, i.e. while the transport device moves relative to a stationary part of the inspection device.

[0044] More preferably, if a damaged or poor quality segment is detected, said segment is rejected from the production process, which can for example be performed by the inspection device itself or alternatively by a separate device, for example as a rejection drum.

[0045] However, alternatively or additionally, it is also possible that these segments are not necessarily rejected from the process, but that quality parameters of the segments are detected by an inspection device for later use, so that, for example, the formed battery stacks can be classified into different quality classes.

[0046] For technical operations and advantages associated with the proposed method, please refer to the discussion related to the testing device above.

[0047] Hereinafter, the present invention will be described based on preferred embodiments with reference to the accompanying drawings. [Brief description of the drawings]

[0048] [Figure 1] 1 illustrates the placement of an inspection device in a system for assembling battery stacks. [Diagram 2] 1 shows the transport device as an inspection drum. [Diagram 3] 1 shows a first cross section perpendicular to the axis of rotation of a receptacle with a segment disposed in the receptacle; [Figure 4] 2 shows a second cross section parallel to the axis of rotation of the receptacle with the segments arranged in the receptacle; [Diagram 5] FIG. 1 is a schematic diagram of an inspection device. [Figure 6] 1 shows a sliding contact device. [Figure 7] 1 shows a schematic diagram of a switch network for the test drum. [Figure 8] FIG. 2 is an equivalent circuit diagram of a single battery. [Figure 9] FIG. 4 is an equivalent circuit diagram of a cell in a first switching configuration. [Figure 10] FIG. 11 is an equivalent circuit diagram of a cell in a second switching configuration. [Figure 11] FIG. 11 is an equivalent circuit diagram of a cell in a third switching arrangement. [Figure 12] FIG. 11 is an equivalent circuit diagram of a cell in a fourth switching arrangement. [Figure 13] FIG. 11 is an equivalent circuit diagram of a cell in a fifth switching arrangement. [Figure 14] FIG. 13 is an equivalent circuit diagram of a cell in a sixth switching arrangement. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0049] FIG. 1 shows a system 100 for assembling a battery stack, which is composed of a manufacturing apparatus 17 for assembling segments 2, an inspection apparatus 1 for inspecting the segments 2, and a battery stack apparatus 18.

[0050] The manufacturing apparatus 17 of this embodiment is configured to manufacture segments 2 as a plurality of single cells. The single cells are four-layered. In this case, the following four layers are continuous: a separator 21, a first electrode 22 as an anode, a second separator 23, and a second electrode 24 as a cathode. In the manufacturing apparatus 17, these layers are stacked and bonded to each other by lamination. As a result, a four-layered continuous track 26 is formed. This continuous track 26 is cut by a cutter 27 at right angles to the longitudinal direction into sections of the same length. As a result, a plurality of segments 2 of the same length are formed. The segments 2 supplied to the inspection apparatus 1 are so-called dry segments 2 that are not filled with electrolyte liquid. In the manufacturing process, the cut segments 2 are inspected by the inspection apparatus 1 subsequent to the manufacturing apparatus 17.

[0051] In the manufacturing process, the inspection apparatus 1 is followed by a number of battery stacking apparatuses 18, each configured to stack a number of segments 2 into a battery stack. In this case, four battery stacking apparatuses 18 are provided. A number of battery stacks can be assembled in parallel by these battery stacking apparatuses 18.

[0052] The inspection device 1 is used to detect defective or damaged segments 2 so that the defective or damaged segments 2 are not used by the battery stacking device 18 to assemble a battery stack. In the following, for the sake of simplicity, the defective segments 2 are described. Thus, all segments 2 that do not meet the predefined quality conditions are described. In this embodiment, the inspection device 1 is not configured to reject the defective segments 2 from the manufacturing process itself. In this embodiment, this is performed by a rejection drum 25, which dumps the defective segments into a waste tank, not shown. In this case, the inspection device 1 comprises a conveying device 3 as an inspection drum rotatably journaled about a rotation axis 14. A conveying drum 20 is provided between the conveying device 3 and the rejection drum 25. The directions of rotation of these drums are indicated by arrows 28. Only two of these directions of rotation are marked by the corresponding reference signs. By rejecting the defective segments 2 by means of the rejection drum 25, it can be ensured that only normal segments 2 are used by the battery stacking device 18 to assemble a battery stack.

[0053] FIG. 2 shows the transport device 3 as an inspection drum, which is rotatably journalled about a rotation axis 14. Along its radially outer outer surface 19, the transport device 3 has a number of receiving sections 4a, 4b, 4c, for example between the transport device 3 and the outer surface 19, and also for example between the measuring device 10 and the insulator 16. Each of these receiving sections 4a, 4b, 4c is adapted to receive and transport a segment 2. The transport device 3 shown here consists of exactly twelve receiving sections 4. The transport device 3 rotates relative to a fixed part 5 of the inspection device 1. The receiving sections 4a, 4b, 4c, which are visible here, can be depressurized. As a result, the segments 2 are held in the receiving sections 4a, 4b, 4c by the effect of the depressurization. Thus, undamaged receiving and removal of the segments 2 is also possible.

[0054] Each of the accommodations 4a, 4b, 4c has a first contact surface 6, a second contact surface 7 and a third contact surface 8, which are electrically insulated from one another and from the rest of the transport device 3. The accommodation 4b is occupied by a segment 2. As a result, the third contact surface 8 of the accommodation 4b is covered by the segment 2. However, it can be seen that the first electrode 22 contacts the first contact surface 6 by its conductive projection 11. Furthermore, it can be seen that the second electrode 24 contacts the second contact surface 7 by its conductive projection 12. In the following, the contact of the segment 2 with the third contact surface 8 of the accommodation 4b is explained on the basis of FIG. 3.

[0055] FIG. 3 shows a cross section of a segment 2 arranged on a transport device 3, said cross section being arranged in a plane perpendicular to the axis of rotation 14 (see FIG. 2) of the transport device 3. In the cross section of FIG. 3, the receptacle 4b according to FIG. 2 is shown. The receptacle 4b comprises a third contact surface 8 which is electrically insulated with respect to the rest of the receptacle 4b and therefore also with respect to the rest of the transport device 3. A first separator 21 of the segment 2 abuts against the third contact surface 8 which at the same time forms a suitable transport platform for the segment 2. Furthermore, it can be seen that the flat extension of the third contact surface 8 corresponds to the area of ​​the first electrode 22 and the second electrode 24, irrespective of the conductive projections 11, 12 which are not shown here. Thus, the third contact surface 8 forms together with the first electrode 22 arranged on the first separator 21 an electrode pair suitable for testing the first separator 21 arranged between them. The first electrode 22 is then contacted over the first contact surface 6 as shown in FIG.

[0056] 3 further shows that a second separator 23 and a second electrode 24 follow the first electrode 22. Thus, the first electrode 22 and the second electrode 24 form an electrode pair suitable for testing the second separator 23 disposed therebetween.

[0057] Figure 4 shows another cross section of a segment 2 arranged on a conveying device 3. In this case, the cross section is arranged in a plane parallel to the axis of rotation 14 (see Figure 2) of the conveying device 3. In this figure, it can be seen that the first electrode 22 contacts the first contact surface 6 by its conductive projection 11. Furthermore, it can be seen that the second electrode 24 contacts the second contact surface 7 by its conductive projection 12. In order to avoid twisting of the conductive projections 11, 12, the contact surfaces 6, 7 have an appropriately adapted height in the radial direction; thus, the radial height of the contact surface 6 is lower than the height of the contact surface 7.

[0058] 5 is a schematic view of the inspection device 1, which includes a transport device 3, which is pivotally supported relative to a stationary part 5. The arrow 28 indicates the rotational mobility of the transport device 3 as an inspection drum, which can be actuated by an actuator 31. The actuator 31 is open-loop or closed-loop controlled by a control device 30. The control device 30 and the actuator 31 are attached to the stationary part 5. Furthermore, twelve receptacles 4a, 4b, ..., 4l are shown diagrammatically. The contact surfaces 6, 7, 8 of three of these receptacles are electrically and / or signal-technically connected to the switch matrix 9 via three cables 33. Thus, each of the receptacles 4a, 4b, ..., 4l is connected to the switch matrix 9 via three cables 33, respectively.

[0059] The switch matrix 9 consists of a number of relays 29a, 29b, 29c which connect the cable 33 to an input cable 34. In Fig. 5 only three relays 29a, 29b and 29c are shown, which are representative of the number of relays. By means of a sliding contact device 13, the input cable 34, which rotates together with the transport device 3, is electrically and / or signal-technically connected to the fixed part 5.

[0060] The fixed part 5 comprises four measuring devices 10a, 10b, 10c, 10d which are each electrically and / or signal-technically connected to the sliding contact device 13 by means of a cable pair 35. Each of the measuring devices 10a, 10b, 10c, 10d can thus be connected to the contact surfaces 6, 7, 8 (see FIG. 2) of different receiving parts 4a, 4b, ..., 4l via the sliding contact device 13 and a switch matrix 9 in various arrangements.

[0061] For a better understanding, first consider only the connection of the three cables 33 assigned to each one of the receptacles 4a, 4b, ..., 4l with the cable pair 35 assigned to each one of the measuring devices 10a, 10b, 10c, 10d. In order to connect the measuring devices 10a, 10b, 10c, 10d in all combinations to the three contact surfaces 6, 7, 8 of the receptacles 4a, 4b, ..., 4l, respectively, the switch matrix 9 must have 12 x 3 = 36 terminals on the side assigned to the receptacles 4a, 4b, ..., 4l, since each of the twelve receptacles 4a, 4b, ..., 4l consists of three contact surfaces connected via the cables 33. Furthermore, the switch matrix 9 must have 4 x 2 = 8 terminals on the side assigned to the sliding contact device 13. This is because each of the four measurement devices 10 a , 10 b , 10 c , 10 d is equipped with one cable pair 35 .

[0062] In the present case, the voltage supply 36 starting from the control device 30 including the power supply is not taken into account. The voltage supply 36 is connected to the switch matrix 9 by means of the sliding contact device 13. Thus, a voltage can be applied to the given contact surfaces 6, 7, 8 in order to carry out a measurement.

[0063] Furthermore, in the above discussion, the data transmission cable 37, which also starts from the control device 30, has not been taken into account. The data transmission cable 37 is connected to the switch matrix 9 via the sliding contact device 13. As a result, the relays 29a, 29b, 29c can be controlled by control signals thus transmitted from the control device 30 to the switch matrix 9. The relays 29a, 29b, 29c are configured to connect the terminals of the switch matrix 9 on the side of the housings 4a, 4b, ..., 4l with each other and / or to connect the terminals of the switch matrix 9 on the side of the housings 4a, 4b, ..., 4l with the terminals of the switch matrix 9 on the side of the sliding contact device 13.

[0064] Furthermore, the above discussion does not take into account the separate cable 38 used to ground or earth each and / or each of the contact surfaces 6, 7, 8. This cable 38 is also connected to the switch matrix 9 via the sliding contact device 13.

[0065] Furthermore, the measuring devices 10a, 10b, 10c, 10d are also connected to the control device 30 by a cable 39. By means of this cable, for example, the control devices 10a, 10b, 10c, 10d can be controlled. Furthermore, the values ​​measured by the measuring devices 10a, 10b, 10c, 10d can also be stored in a data memory of the control device 30. For example, if a defective segment 2 is detected by one of the measuring devices 10a, 10b, 10c, 10d, a corresponding signal can be output by the control device 30 to the rejection drum 25 shown in FIG. 1. As a result, the corresponding segment 2 can be rejected from the production process.

[0066] 6 shows diagrammatically the sliding contact arrangement 13, which is composed of a stator 40 and a rotor 41. The stator 40 is connected, here only as a representative example, to two cable pairs 35 which are connected to the measuring devices 10a and 10b (see FIG. 5). A corresponding input cable 34 for the switch matrix 9 (see FIG. 5) is attached to the rotor 41. The sliding contact arrangement 13 is provided with a number of slip rings - not visible in this view - which are contactable or in contact with contact brushes, which are also not visible. Thus, a number of electric cables and / or a number of signal cables can be connected separately between the stator 40 and the rotor 41.

[0067] FIG. 7 shows a schematic switch network of the test device 1. Here, four measuring devices 10a, 10b, 10c, 10d are shown. In this case, the network can basically be expanded by further measuring devices. Furthermore, it can be seen that each measuring device 10a, 10b, 10c, 10d can basically be connected to each receptacle 4a-4e by means of a switch matrix 9. For better clarity, only five receptacles out of the twelve receptacles 4a, ..., 4l are shown here. Furthermore, it can be seen that each receptacle 4a, ..., 4e is assigned to one segment 2. Furthermore, on the right side, the contact surfaces 6, 7, 8 of the first receptacle 4a and the connectability of these contact surfaces 6, 7, 8 by means of switches 42, ..., 47 are shown in detail. The switches 42, ..., 47 are components of the switch matrix 9 and can be constituted, for example, by relays 29a, 29b, 29c (see FIG. 5). Depending on the switching positions of the switches 42,...,47, the contact surfaces 6,7,8 can be connected to each other and / or to one of the measuring devices 10a,10b,10c,10d and / or in another way. It is also basically possible to connect one or more of the receptacles 4a,...,4l to different measuring devices 10a,10b,10c,10d in order to carry out parallel measurement processes. The receptacles 4a,...,4l may also be connected successively in time to several measuring devices 10a,10b,10c,10d.

[0068] Possible switching positions are further explained below with reference to Figures 9 to 13.

[0069] Figure 8 is an equivalent circuit diagram of a segment 2 (see Figure 2) mounted in a receiving part 4b. To improve clarity, the first electrode 22 as an anode is designated by A, the second electrode 24 as a cathode is designated by K and the third contact surface 8 forming the transport support is designated by T. This designation is also used in the circuit diagrams of Figures 9 to 13.

[0070] The equivalent circuit diagram 32 of FIG. 8 shows a series resistance R representing the cable resistance and the contact resistance of the transport support T formed by the anode A, the cathode K and the third contact surface 8. S,A ,R S,K and R S,T In addition, the resistance R represents the insulation resistance between the anode A and the cathode K. p,AK and resistance R representing the insulation resistance between the anode A and the transport support T. p,AT Therefore, the resistor R p,AT and resistor R p,AK denotes the conductivity of the separators 21 and 23. Furthermore, the capacitor C AK ,C AT are capacitors generated between the anode A and the cathode K and between the anode A and the transport support part T.

[0071] The equivalent circuit 32 of Fig. 8 is used as a reference for the switching arrangements illustrated in Fig. 9 to 13. For example, a measuring device 10a configured to measure ohmic resistance is used, but in principle any other measuring device may be used.

[0072] If it is described below that one contact surface 6, 7, 8 is connected to earth, this is implemented in this embodiment by connecting the corresponding contact surface 6, 7 or 8 to an earth cable or to an earth point of the circuit. Basically, however, other possibilities for earth connection are also conceivable, for example by connection to the drum of the transport device 3 when this is earthed. If it is described below that one contact surface 6, 7, 8 is not connected, the corresponding contact surface 6, 7 or 8 is electrically isolated from the electrical cable of the remaining switch network.

[0073] Figure 9 shows a first switching arrangement used for testing the second separator 23 (see Figure 3). The measuring device 10a is connected to the first contact surface 6 and to the second contact surface 7, i.e. the anode A and the cathode K. The contact surface 8, i.e. the transport support T, is not connected and therefore is not shown.

[0074] Figure 10 shows a second switching arrangement, which is also used to inspect the second separator 23 (see figure 3). The measuring device 10a is connected to the first contact surface 6 and to the second contact surface 7, i.e. the anode A and the cathode K. The contact surface 8, i.e. the transport support T, is connected to ground.

[0075] Figure 11 shows a third switching arrangement, which is used to inspect a first separator 21 (see Figure 3). A measuring device 10a is connected to the first contact surface 6 and further to the anode A and to the third contact surface 8, i.e. the transport support T. The second contact surface 7, against which the cathode K abuts, is not connected and therefore is not shown.

[0076] Figure 12 shows a fourth switching arrangement, which is also used to inspect the first separator 21 (see Figure 3). The measuring device 10a is connected to the first contact surface 6 and also to the anode A and to the third contact surface 8, i.e. the transport support T. The second contact surface 7, against which the cathode K abuts, is connected to ground.

[0077] 13 shows a fifth switching arrangement in which separators 21 and 23 can be tested together. The measuring device 10a is connected to the first contact surface 6 by a first ground terminal 48 and also to the anode A. Furthermore, the measuring device 10a is connected to the second contact surface 7 and to the third contact surface 8 by a second ground terminal 49. In this fifth switching arrangement, both separators 21 and 23 connected in parallel are connected to the measuring device 10a.

[0078] 14 shows a sixth switching arrangement, in which the separators 21 and 23 can also be tested together. The measuring device 10a is connected to the second contact surface 7 and also to the cathode K and to the third contact surface 8, i.e. the transport support T. The first contact surface 6, against which the anode A rests, is not connected and is therefore not shown. In this sixth switching arrangement, both separators 21 and 23 connected in series are connected to the measuring device 10a.

[0079] By means of the switching arrangements shown in Figures 9 to 13, suitable measuring bridges can be constructed, by means of which the state of the segments present per receptacle 4 (see Figures 2, 3, 4 and 5) can be reliably ascertained.

Claims

1. An inspection device (1) for inspecting segments (2) suitable for assembling battery stacks for the energy battery manufacturing industry, comprising: a conveying device (3) having a plurality of receiving compartments (4) for receiving and conveying one segment (2) each; In the inspection device (1), the plurality of storage units (4) are movable by moving the transport device relative to a fixed unit (5) of the inspection device (1), - each of said plurality of receiving portions (4) comprises at least two contact surfaces (6, 7, 8) for electrical and / or signal-technical contact with the segments (2) received in the respective receiving portion (4), - an inspection device (1), characterized in that at least two of the contact surfaces (6, 7, 8) of each one of the plurality of receptacles (4) can be connected to at least one measuring device (10a, 10b, 10c, 10d) by means of a switch matrix (9).

2. - Inspection device (1) according to claim 1, characterized in that each of said plurality of receptacles (4) comprises at least three contact surfaces (6, 7, 8).

3. - Inspection device (1) according to claim 1, characterized in that the transport device (3) is formed by a rotatably supported drum, and the plurality of receptacles (4) are arranged on the outer surface (19) of the drum, which is radially outward.

4. - a plurality of measuring devices (10a, 10b, 10c, 10d) are provided, - The inspection device (1) according to claim 1, characterized in that the switch matrix (9) is configured to electrically and / or signal-technically connect individual or multiple contact surfaces of the multiple contact surfaces (6, 7, 8) of each one of the multiple receptacles (4) to different measuring devices (10a, 10b, 10c, 10d).

5. - each of said plurality of receptacles (4) comprises one first contact surface (6) and one second contact surface (7) for electrical and / or signal-technical contact with two electrodes (22, 24) of the installed segment (2); - Inspection device (1) according to claim 2, characterized in that each one third contact surface (8) is provided for electrical and / or signal-technical contact with the separator (21) of the installed segment (2).

6. The switch matrix (9) - said first contact surface (6) and said second contact surface (7) are simultaneously connected to the same measuring device (10a, 10b, 10c, 10d); - the first contact surface (6) and the third contact surface (8) are simultaneously connected to the same measuring device (10a, 10b, 10c, 10d), and / or - Inspection device (1) according to claim 5, characterized in that the second contact surface (7) and the third contact surface (8) are configured to be connected simultaneously to the same measuring device (10a, 10b, 10c, 10d).

7. - An inspection device (1) according to any one of claims 1 to 6, characterized in that the contact surfaces (6, 7, 8) are arranged electrically insulated from one another in one of the plurality of containers (4).

8. - The inspection device (1) according to claim 2, 5 or 6, characterized in that the switch matrix (9) is configured to connect each of the at least three contact surfaces (6, 7, 8) of one of the plurality of receptacles (4) differently so that measurements by the at least one measuring device (10a, 10b, 10c, 10d) can be performed with different electrical circuits.

9. - The inspection device (1) according to any one of claims 1 to 6, characterized in that the switch matrix (9) is configured to connect each or each of the plurality of contact surfaces (6, 7, 8) of one of the plurality of housings (4) to a power supply and / or to ground.

10. Inspection device (1) according to any one of the preceding claims, characterized in that the switch matrix (9) is a component of the transport device (3).

11. - an inspection device (1) according to any one of claims 1 to 6, characterized in that the at least one measuring device (10a, 10b, 10c, 10d) is configured to measure capacitance and / or ohmic resistance and / or to perform a dielectric breakdown test.

12. - Inspection device (1) according to any one of claims 1 to 6, characterized in that the at least one measuring device (10a, 10b, 10c, 10d) is a component of the fixed part (5) of the inspection device (1).

13. - Inspection device (1) according to any one of claims 1 to 6, characterized in that the conveying device (3) is electrically and / or signal-technically connected to the fixed part (5) by means of a sliding contact device (13).

14. - An inspection device (1) according to any one of claims 1 to 6, characterized in that each of the plurality of containers (4) has an opening that can be depressurized to hold the segment (2).

15. 1. A method for inspecting segments provided for assembling a battery stack for use in the energy battery manufacturing industry, comprising: - A method in which a plurality of segments are inspected by an inspection device according to any one of claims 1 to 6, characterized in that each of the segments to be inspected is placed in one of a plurality of receptacles.

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