SYSTEM AND METHOD FOR DETECTING DEFECTS ON A MACHINE SURFACE - Patent application

Abstract

Systems and methods are described for identifying defects in manufacturing equipment. Camera-based image analysis may be used to improve product quality and reliability. Images of a machine surface may be repeatedly captured and analyzed by a processing device. The machine surface may be etched with landmarks to help remove distortions in images collected from the machine surface.

Description

[Technical field]

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS This application claims priority to and the benefit of U.S. Provisional Patent Application No. 63 / 315,354, filed March 1, 2022, the entire disclosure of which is incorporated herein by reference. [Background technology]

[0002] Impurities such as dirt or dust that are generated during the manufacturing of equipment or in the surrounding manufacturing environment can cause defects or poor performance in endless sheets used to form electrochemical cells and capacitors, for example. These same impurities can also damage the equipment rollers, such as calender rollers and nip rollers, by creating surface pitting. The surface integrity of the equipment rollers is very important because if surface pitting occurs on the equipment rollers, the sheets formed for electrochemical cells can fall outside of dimensional specifications due to improper handling and deformation of the powder used to form such sheets. Furthermore, the impurities themselves can become embedded within the endless sheets. These impurities and roller surface defects in such equipment can result in poor performance and reliability of electrochemical cells, as well as increased likelihood of product failure.

[0003] A need exists for improved detection techniques for identifying and locating defects in manufactured machine surfaces and / or manufactured electrodes. Summary of the Invention

[0004] In some embodiments, the system may include at least one camera and at least one processing device configured to detect the presence or absence of one or more defects on the machine surface using image input from the at least one camera.

[0005] In some embodiments, the at least one camera includes two or more cameras.

[0006] In some embodiments, the at least one camera may be an optical camera.

[0007] In some embodiments, the at least one camera may have a resolution of at least about 0.5 mm.

[0008] In some embodiments, the at least one camera may be configured to periodically capture an image output.

[0009] In some embodiments, the at least one camera may be configured to capture image input based on external input, including at least one of a sensor input and a user input.

[0010] In some embodiments, the at least one camera may be configured to wirelessly transmit image input to the at least one processing device.

[0011] In some embodiments, the at least one processing device may be further configured to receive and analyze the image input and detect the presence of one or more defects on the machine surface.

[0012] In some embodiments, the at least one processing device may be further configured to output a report or signal regarding the presence of defects on the machine surface.

[0013] In some embodiments, the at least one processing device may be further configured to count defects on the machine surface.

[0014] In some embodiments, the at least one processing device may be configured to identify a physical location of the defect on the machine surface.

[0015] In some embodiments, a method of detecting the presence or absence of defects in a machine surface used to manufacture an electrode may include providing at least one machine surface used to manufacture an electrode, acquiring at least one image of the machine surface using at least one camera, and analyzing the image using at least one processing device to detect the presence or absence of defects.

[0016] In some embodiments, the method may further include acquiring at least one image.

[0017] In some embodiments, the method may further include acquiring at least one image based on external input, including at least one of a sensor input and a user input.

[0018] In some embodiments, the analysis may be qualitative.

[0019] In some embodiments, the analysis may be quantitative.

[0020] In some embodiments, the method may further include determining whether the presence of the defect is acceptable.

[0021] In some embodiments, the method may further include identifying a physical location of the defect on the machine surface.

[0022] In some embodiments, the method may further include applying a liquid to the machine surface prior to acquiring the at least one image. [Brief description of the drawings]

[0023] The present disclosure will become more fully understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0024] [Figure 1] 1 illustrates a machine surface having identifying landmarks, according to an embodiment.

[0025] [Diagram 2] 1 illustrates a system with a camera and a machine surface, according to an embodiment.

[0026] [Figure 3A] 1 shows an illustrative example of a system with multiple cameras and a machine surface, according to an embodiment.

[0027] [Figure 3B] 1 shows a second illustrative example of a system with multiple cameras and a machine surface, according to an embodiment.

[0028] [Figure 4] 1 illustrates a diagram of a process sequence for verifying a machine surface, according to an embodiment.

[0029] [Diagram 5] 13 illustrates a comparison of a template of a machine surface with a captured image of an electrode, according to an embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0030] definition As used herein, the term "about" immediately preceding a numerical value means a range of ±10% of that value, unless otherwise indicated in the context of this disclosure or inconsistent with such an interpretation, for example, "about 50" means 45 to 55, "about 25,000" means 22,500 to 27,500, etc.

[0031] The present disclosure is not limited with respect to the specific embodiments described in this application, which are intended to be illustrative of various aspects. As will be apparent to those skilled in the art, many modifications and variations may be made without departing from the spirit and scope thereof. From the foregoing description, functionally equivalent methods and devices falling within the scope of the present disclosure, in addition to those methods and devices recited herein, will be apparent to those skilled in the art. Such modifications and variations are intended to be included within the scope of the appended claims. The present disclosure is to be limited only in accordance with the appended claims, along with the full scope of equivalents to which the appended claims are entitled. It is to be understood that the present disclosure is not limited to specific methods, reagents, compounds, compositions, or biological systems, which may, of course, vary. It is also to be understood that the terminology used herein is for the purpose of describing specific embodiments only, and is not intended to be limiting.

[0032] As used in this document, the singular forms "a," "an," and "the" include plural referents unless the context clearly dictates otherwise. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. Nothing in this disclosure should be construed as an admission that the embodiments described in this disclosure are not entitled to antedate this disclosure by virtue of prior invention. As used in this document, the term "comprising" means "including, but not limited to."

[0033] Although various compositions, methods, and devices are described in terms of "comprising" various components or steps (which should be interpreted as meaning "including, but not limited to" the various components or steps), the compositions, methods, and devices may also "consist essentially of" or "consist of" various components and steps, and such terms should be interpreted as defining essentially exclusive groups of elements.

[0034] With respect to the use of nearly all plural and / or singular terms herein, those of skill in the art may make substitutions from the plural to the singular and / or from the singular to the plural as appropriate to the context and / or application. Various singular / plural substitutions may be expressly set forth herein for clarity.

[0035] Those of skill in the art will understand that the terms used in this specification, in general, and in the appended claims in particular (e.g., the body of the appended claims), are generally intended to be "open" terms (e.g., the term "including" should be interpreted as "including but not limited to," the term "having" should be interpreted as "having at least," the term "includes" should be interpreted as "including but not limited to," etc.). Those of skill in the art will further understand that where a specific number is intended in the recitation of the claims introduced, such intent will be expressly set forth in the claim, and that in the absence of such recitation, no such intent exists. For example, to facilitate understanding, the appended claims below may include the use of the introductory phrases "at least one" and "one or more" to introduce the recitation of the claims. However, the use of such phrases should not be construed as meaning that the introduction of a claim recitation with the indefinite article "a" or "an" means that any particular claim that includes such an introduced claim recitation is limited to embodiments that include only one such recitation, even when the same claim includes the introductory phrase "one or more" or "at least one" and an indefinite article such as "a" or "an" (e.g., "a" and / or "an" should be construed to mean "at least one" or "one or more"), and the same applies to the use of definite articles used to introduce claim recitations. Moreover, those skilled in the art will understand that even when a particular number is explicitly recited in a claim recitation, such recitation should be construed to mean at least the recited number (e.g., recitation of only "two recitations" without any other modifiers means at least two recitations, or more than two recitations).Furthermore, in instances where a convention similar to "such as at least one of A, B, and C" is used, such syntax is generally intended to mean that one of skill in the art would understand the convention (e.g., "a system having at least one of A, B, and C" includes, but is not limited to, systems having only A, only B, only C, A and B, A and C, B and C, and / or A and B and C, etc.). In instances where a convention similar to "such as at least one of A, B, or C" is used, such syntax is generally intended to mean that one of skill in the art would understand the convention (e.g., "a system having at least one of A, B, or C" includes, but is not limited to, systems having only A, only B, only C, A and B, A and C, B and C, and / or A and B and C, etc.). Those skilled in the art will further appreciate that substantially any disjunctive word and / or phrase presenting two or more alternative terms, whether in the specification, claims, or drawings, should be understood as considering the possibility of including one of the terms, either one of the terms, or both terms. For example, the phrase "A or B" is understood to include the possibilities of "A" or "B" or "A and B."

[0036] Furthermore, when features or aspects of the disclosure are described in terms of a Markush group, those skilled in the art will recognize that the disclosure also is described in terms of any individual element or subgroup of elements of the Markush group.

[0037] As will be understood by those skilled in the art, for all purposes, including with respect to the provision of a specification, all ranges disclosed herein include all possible subranges and combinations of these subranges. Any recited range can be readily recognized as fully descriptive and allowing the same range to be broken down into at least equal halves, thirds, fourths, fifths, tenths, etc. As a non-limiting example, each range discussed herein can be readily divided into a lower third, a middle third, and an upper third, etc. As will also be understood by those skilled in the art, all language such as "up to" and "at least" is intended to include the stated numbers and to refer to a range that can be subsequently broken down into subranges as described above. Finally, as will be understood by those skilled in the art, ranges include individual elements. Thus, for example, a group having 1 to 3 cells refers to a group having 1, 2, or 3 cells. Similarly, a group having 1 to 5 cells refers to a group having 1, 2, 3, 4, or 5 cells, and so on.

[0038] Various of the above-disclosed and other features and functions, or alternatives thereof, may be combined to create many other different systems or applications, in which various presently unforeseen or unanticipated alternatives, modifications, variations, or improvements may subsequently be made by those skilled in the art, each of which is intended to be encompassed by the disclosed embodiments.

[0039] The present disclosure is not limited to the particular systems, devices, and methods described, which may vary, and the terminology used in the description is for the purpose of describing the particular versions or embodiments only, and is not intended to limit the scope.

[0040] system A system can be constructed that assists in detecting defects in the machine surfaces used to manufacture electrodes.

[0041] Referring to FIG. 1 , the system may include at least one machine surface 102 used to manufacture electrodes using image input from a camera, at least one camera 101, and a processing device (not shown) configured to detect the presence or absence of one or more defects on the machine surface using image input from the at least one camera.

[0042] 2, the mechanical surface 201 may include one or more landmarks 202. The one or more landmarks 202 may be etched into the mechanical surface 201 by a laser or chemical etching process. The one or more landmarks 202 may be in addition to similar physical landmarks on electrodes fabricated using the mechanical surface 201. The one or more landmarks 202 on the mechanical surface 201 and electrodes may be used in optical tracking and identification.

[0043] The number of cameras can be any number, typically one or more than one. For example, one, two, three, four, five, six or more cameras can be used.

[0044] The at least one camera can typically be of any type. For example, the at least one camera can be an optical camera. The at least one camera can typically have any minimum resolution. For example, the minimum resolution can be at least about 0.5 mm, at least about 0.4 mm, at least about 0.3 mm, at least about 0.2 mm, or at least about 0.1 mm. The minimum resolution is sufficient to at least detect defects. For example, the size of a dent can be at least about 0.5 mm in size. Therefore, in order to detect dents, the minimum resolution may be selected to be at least about 0.5 mm.

[0045] When two or more cameras are used in the system, the cameras can be configured in any orientation. For example, each camera can be oriented with respect to the surface to be imaged. Each camera can be oriented with any angle with respect to the surface to be imaged, such as about 0 degrees, about 5 degrees, about 10 degrees, about 15 degrees, about 20 degrees, about 25 degrees, about 30 degrees, or a range between any two of these values. In examples where two or more cameras are used, the cameras can be oriented with the same or different angles with respect to the surface to be imaged. With brief reference to FIG. 3A and FIG. 3B, there are two exemplary camera system orientations. In some implementations, the two cameras 301 / 302 can be positioned on different sides of the roller 303. In some embodiments, the two cameras 304 / 305 can be oriented to face the same surface of the roller 306. In some embodiments, a liquid such as water can be present and flow along the roller or machine surface to simplify the detection of defects. The system can further include a nozzle, an injector, or any other liquid handling system configured to apply liquid to the electrode or machine surface.

[0046] The at least one camera may be configured to capture at least one image and transmit the at least one image to a processing device for analysis. The at least one camera may be configured to capture images periodically or based on an external input. In some embodiments, each image may include a still image. In some embodiments, the at least one image may include a moving image at a predetermined frame rate. Image capture may be triggered based on an external input from a sensor (e.g., temperature, humidity, etc.) or a user. For example, a temperature sensor may detect that a machine surface exceeds a predetermined threshold temperature and periodically capture images to analyze product quality until the temperature falls below the threshold. The camera may be configured to transmit images wired / cabled or wirelessly (e.g., via a network, Wi-Fi, or Bluetooth connection).

[0047] The processing device may be any type of processing device, such as a desktop computer, a laptop computer, a tablet, and a mobile phone. The processing device may be configured to receive at least one image and analyze the image to detect the presence or absence of one or more defects on the machine surface. The processing device may be configured to correct any image distortion caused by the placement of the camera. In some embodiments, the image distortion correction may be performed based on a known placement of the camera. In some embodiments, the image correction may be performed automatically. Landmarks as disclosed herein may aid in the automatic correction of image distortion. The processing device may be further configured to output a report or signal based on the presence and / or absence of defects on the machine surface.

[0048] The presence or absence of defects may be determined qualitatively (e.g., "no defects" or "defects detected") or quantitatively (e.g., "no defects", "one defect", or "two defects", etc.). In some embodiments, the processing device is configured to count the defects on the machine surface. In some embodiments, the processing device may be configured to compare the number of detected defects to a standard or threshold value. Such an embodiment may be used where the machine surface is deemed acceptable if the number of detected defects is below the standard or threshold value, and the machine surface is deemed unacceptable if the number of detected defects is above the standard or threshold value. Additionally or alternatively, the processing device may compare the number of detected defects to an average number of defects over a period of time to detect changes in production quality. The detected defects may be measured in various ways. For example, the number of defects in a given area may be measured. In some examples, the number of defects is about 1 defect / m 2 Less than 0.5 defects / m 2 Less than 0.4 defects / m 2 Less than 0.3 defects / m 2 Less than 0.2 defects / m 2 Less than or equal to 0.1 defects / m 2 In the ideal case, the number of defects is below the detection limit of the system, i.e., 0 defects / m 2It is.

[0049] In some embodiments, the processing device may be configured to identify a number of defects detected, hi some embodiments, the processing device may be configured to provide information regarding a physical location of the defects on the machine surface.

[0050] The machine surface used to manufacture the electrode can generally be any machine surface. An exemplary machine surface can include a calender roller.

[0051] The system may further include at least one alarm. For example, the alarm may be configured to signal an operator if the machine surface has an unacceptable number of defects. The alarm signal may be audible, visual, or tactile. The alarm signal may be an electrical signal that transmits to a remote processing device.

[0052] The system may further include at least one database of detected defects. The system may be configured to compare the acquired one or more images to the database of previously detected defects. The system may be configured to add images of newly detected defects to the database.

[0053] The system may further include a non-transitory storage device that stores the template image of the machine surface. The system may be configured to acquire a new template image of the machine surface during operation.

[0054] method A method may be implemented to aid in the detection of defects in machine surfaces used to manufacture electrodes and the like.

[0055] In one example, a method is provided for detecting the presence or absence of defects in at least one machine surface used for electrode manufacturing. In some embodiments, the method includes providing at least one machine surface, acquiring at least one image of the at least one machine surface using at least one camera, and analyzing the at least one image using at least one processing device to detect the presence and / or absence of defects. The number, type, and orientation of cameras used in such a method may be as specified above.

[0056] The at least one image may be acquired periodically or based on an external input. The at least one image may be a still image or a moving image. The type of image and the image capture rate may be selected based on factors such as line speed and roller diameter. In some embodiments, the method may include applying a liquid to the machine surface prior to acquiring the at least one image.

[0057] The at least one image may be analyzed qualitatively (e.g., "no defects" or "defects detected") or quantitatively (e.g., "no defects", "one defect", "two defects", etc.). The analysis of the at least one image may include comparing the number of detected defects to a standard or threshold value. In such embodiments, if the number of detected defects in each analyzed image is below the standard or threshold value, the machine surface may be deemed acceptable. Conversely, if the number of detected defects in each analyzed image is above the standard or threshold value, the machine surface may be deemed unacceptable. Additionally or alternatively, the analysis of each image may include comparing the number of detected defects to an average number of defects over a period of time. In such embodiments, the comparison may enable detection of changes in production quality. In such embodiments, the image of the entire machine surface may be analyzed for defects. In such embodiments, a portion of the image of the machine surface may be sampled.

[0058] Analyzing the machine surface may further include comparing the collected images to a template image. With reference to FIG. 4, the method may include receiving 401 a template of the machine surface, capturing 402 at least two images of the machine surface, comparing 403 the at least two images of the machine surface to the template, and identifying 404 whether one or more of the at least two images have deviations from the template. The method may include indicating 406 that there is no error if the number of images showing the particular deviation is below a predetermined threshold. The method may include indicating 405 that there is an error if the number of images showing the particular deviation is above a predetermined threshold. The template 404 may be a single image showing the deviation. Alternatively, in embodiments with multiple cameras, images from alternative sources may be used in the same way as the template. Relying on images from multiple cameras may ignore deviations caused by a single camera (e.g., due to calibration errors or interference with the lens).

[0059] 5, there is shown an exemplary comparison between a template 501 and a collected image 502. The template 501 and the collected image 502 may each include landmarks 503. By comparing the two images 501 / 502, deviations 504 may be detected.

[0060] Image comparison may include processing the images with a processing unit. Reprocessing may further include alignment and defect collection. In embodiments with landmarks, the processing unit may warp and align the landmarks to match the template image. Reprocessing may further include other image corrections, including but not limited to saturation, contrast, and color selection.

[0061] Image comparison may be used for machine learning, neural networks, and / or artificial intelligence. Machine learning for image comparison may include forming a training set. The training set may include images of known defects or images of false defects created using a template image.

[0062] The image comparison may involve a pixel-by-pixel comparison of the collected image and the template. Alternatively, pixels may be clustered and averaged for comparison.

[0063] The method may further include flowing a liquid, such as water, across the machine surface to facilitate detection of defects. The flowing liquid may change the reflective properties of the surface and improve image contrast.

[0064] The method may further include comparing the acquired one or more images to at least one database of previously detected defects. The method may further include adding newly detected defect images to the database.

Claims

1. 1. A system for detecting defects in a machine surface used to manufacture electrodes, comprising: At least one camera; at least one processing device configured to detect the presence or absence of one or more defects on the machine surface using image input from the at least one camera; The system comprising:

2. The system of claim 1 , wherein the at least one camera comprises two or more cameras.

3. The system according to any one of claims 1 to 2, wherein the at least one camera is an optical camera.

4. The system of any of claims 1 to 3, wherein the at least one camera has a resolution of at least about 0.5 mm.

5. The system of any one of claims 1 to 4, wherein the at least one camera is configured to capture image inputs periodically.

6. The system of any of claims 1 to 4, wherein the at least one camera is configured to capture image input based on external input comprising at least one of a sensor input and a user input.

7. The system of any preceding claim, wherein the at least one camera is configured to wirelessly transmit the image input to the at least one processing device.

8. The system of any of claims 1 to 7, wherein the at least one processing device is further configured to receive and analyze the image input and detect the presence or absence of one or more defects on the machine surface.

9. The system of any of claims 1 to 8, wherein the at least one processing device is further configured to output a report or signal based on the presence of defects on the machine surface.

10. The system of any of claims 1 to 9, wherein the at least one processing device is further configured to count defects on the machine surface.

11. The system of any of claims 1 to 10, wherein the at least one processing device is further configured to identify physical locations of defects on the machine surface.

12. 1. A method for detecting the presence of defects in a machine surface used to manufacture an electrode, comprising: providing at least one machine surface used to manufacture an electrode; acquiring at least one image of the machine surface using at least one camera; analyzing the image using at least one processing device to detect the presence of the defect; The method comprising:

13. The method of claim 12 , further comprising acquiring the at least one image periodically.

14. The method of claim 12 , further comprising acquiring the at least one image based on an external input comprising at least one of a sensor input and a user input.

15. The method according to any of claims 13 to 14, wherein the analysis is qualitative.

16. The method according to any one of claims 13 to 14, wherein the analysis is quantitative.

17. The method of any of claims 13 to 16, further comprising determining whether the presence of defects is acceptable.

18. The method of any of claims 13 to 17, further comprising identifying a physical location of a defect on the machine surface.

19. The method of any of claims 13 to 18, further comprising applying a liquid to the machine surface before acquiring the at least one image.

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