Method and apparatus for arranging a thin film sample

Abstract

A system and method are provided for improving a solution for holding a thin film sample. An apparatus for handling a thin film sample can include a sample holder configured to engage the thin film sample, the sample holder including one or more holding components configured to receive the thin film sample in a flat arrangement relative to the sample holder, and one or more fixing components configured to fix and maintain the thin film sample in the flat arrangement during operation of the sample holder. The sample holder can include one or more openings that allow access to both sides of the thin film sample at two or more positions on the thin film sample between the one or more fixing components. The sample holder can include width adjustment components configured to be adaptable to different sample widths.

Description

Technical Field

[0001] [Claims of Priority] This patent application claims priority to and the benefit of U.S. Provisional Patent Application No. 63 / 357,432, filed Jun. 30, 2022; U.S. Provisional Patent Application No. 63 / 405,640, filed Sep. 12, 2022; and U.S. Provisional Patent Application No. 63 / 442,432, filed Jan. 31, 2023. The applications listed above are hereby incorporated by reference in their entirety into this specification as part of this specification.

[0002] The present disclosure generally relates to the handling of thin film samples. More specifically, various embodiments according to the present disclosure relate to methods and apparatuses for positioning thin film samples.

[0003] Further limitations and disadvantages of conventional approaches will be apparent to those skilled in the art in comparison to some aspects of the present methods and systems described in the remainder of this disclosure with reference to the drawings.

Summary of the Invention

[0004] Aspects of the present disclosure relate to test solutions and systems used in conjunction therewith. More specifically, various embodiments according to the present disclosure relate to methods and apparatuses for positioning thin film samples that are substantially illustrated by at least one of the drawings or described in relation to at least one of the drawings and are more fully described in the claims.

[0005] These advantages, aspects, and novel features of the present disclosure, as well as other advantages, aspects, and novel features, will be more fully understood from the following description and the drawings in conjunction with the details of their illustrated embodiments.

Brief Description of the Drawings

[0006]

Figure 1

[0007]

Figure 2

[0008]

Figure 3

[0009]

Figure 4

[0010]

Figure 5A

Figure 5B

Figure 5C

Figure 5D

[0011]

Figure 6A

Figure 6B

[0012]

Figure 7A

Figure 7B

[0013] Various embodiments according to the present disclosure relate to providing improved and optimized solutions for gripping and holding thin film samples, and in particular, thin film sample holders for aligning thin film samples in a material testing system. As used herein, a "thin film sample" is not limited to a sample of a thin film, but can also include samples of foils or other sheet-like objects that are thin enough to require careful handling to avoid deformation or other damage to these samples during handling. A material testing system is used to measure physical properties such as the tensile or compressive strength of a material sample. In this regard, the use and handling of thin film samples require special attention, especially when testing the material properties of thin films.

[0014] The handling of thin film samples involves various particularly difficult movements such as inserting and aligning such samples into a material testing system. In particular, it is difficult to properly insert a thin film sample (e.g., into a gripping component used for performing a tensile test). Furthermore, sample alignment is difficult even in the best case. In this regard, sample alignment can be the most commonly mentioned issue when discussing any gripping solution. When the sample to be tested is extremely thin and easily damaged, sample alignment is particularly important because simply gripping or placing the sample can damage the sample and make it unusable for testing.

[0015] Conventional solutions for handling thin film samples have various problems and drawbacks, particularly with respect to the insertion, gripping, and alignment of thin film samples. For example, in some existing solutions, the sample may bend, and thus it may be necessary to re-grip the sample several times. This can damage the sample and lead to jaw breakage or inconsistent results. Further, in many existing solutions, alignment is performed manually, for example, by the user relying solely on visual estimation.

[0016] According to the disclosed exemplary thin film sample holder, it is possible to improve the handling of thin film samples, particularly with respect to insertion, gripping, and alignment. In particular, such a solution enables or improves the ability to easily and reproducibly insert the sample with the confidence that the sample is aligned. Such an improvement is highly desirable. For example, enabling reliable and reproducible alignment is advantageous as it allows the user to improve the reproducibility of handling thin film samples. Such reproducibility in handling during testing can, for example, as a result, increase throughput while also reducing the need for retesting due to unreliable results. Further, by reducing the variability in results, the opportunity for the operator to discard batches or samples (multiple samples from the same batch) can be reduced, which can be particularly important for quality control purposes. Similarly, by improving gripping, the user can have the confidence to properly grip the sample on the first attempt, leading to a significant improvement in handling throughput and thus to improved performance.

[0017] Furthermore, the solution described herein can be configured to adjust the gripping pressure. The ability to adjust the gripping pressure can be desirable as it can, for example, avoid damaging the sample prior to the start of testing. In some cases, existing systems or devices (e.g., existing compressed air kits) can be used to facilitate or assist with such adjustments.

[0018] In various embodiments in accordance with the present disclosure, fixtures that are specially designed and constructed to hold thin film samples are used. Such fixtures can be configured to be used in combination with a gripping device that is configured to grip the thin film sample in a fixed manner, i.e., without deforming or otherwise damaging the thin film sample while also maintaining alignment of the thin film sample. In some embodiments, a powered thin film sample gripping device (e.g., pneumatically) can be used. In this regard, a dedicated powered thin film gripping portion is provided that provides easy sample alignment, combined with the ability to easily set and adjust the gripping pressure, providing the user with the functions required for handling thin film samples in an improved manner. In this regard, in some cases, this can be done by using a dedicated improved gripping attachment that can operate in conjunction with an existing gripping device. In other words, in some cases, rather than using a completely newly designed and constructed gripping device, improved attachments and alignment components configured to operate in conjunction with an existing gripping device can be used. These features are described in more detail with respect to the exemplary embodiments described below.

[0019] As used herein, "and / or" means any one or more of the items in the list connected by "and / or". As an example, "x and / or y" means any element of the three-element set {(x), (y), (x, y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" means any element of the seven-element set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y and / or z" means "one or more of x, y and z". As used herein, the term "exemplary" serves as a non-limiting example, instance or illustration. As used herein, the term "for example" begins a list of one or more non-limiting examples, instances or illustrations.

[0020] As used herein, the terms "circuit" and "circuitry" refer to physical electronic components (e.g., hardware), and any software and / or firmware ("code") that can configure the hardware, that the hardware can execute, and / or that can otherwise be associated with the hardware. For example, as used herein, a particular processor and memory (e.g., volatile or non-volatile memory devices, general-purpose computer-readable media, etc.) can include a first "circuit" when executing a first one or more lines of code, and can include a second "circuit" when executing a second one or more lines of code. Further, a circuit can include analog and / or digital circuitry. Such circuitry can operate on, for example, analog and / or digital signals. A circuit can be within a single device or chip, on a single motherboard, within a single chassis, within multiple enclosures at a single geographical location, within multiple enclosures distributed across multiple geographical locations, etc. It should be understood that, similarly, the term "module" can refer to, for example, physical electronic components (e.g., hardware), and any software and / or firmware ("code") that can configure the hardware, that the hardware can execute, and / or that can otherwise be associated with the hardware.

[0021] As used herein, a circuit or module is "operable" to perform its function whenever it includes the hardware and code (if either is required) necessary to perform that function, regardless of whether the performance of that function has been disabled (e.g., by user-configurable settings, factory trim, etc.) or is not enabled.

[0022] Various embodiments according to the present disclosure relate to providing solutions for gripping and holding improved and optimized thin film samples, particularly thin film sample holders. In this regard, the use and handling of thin film samples are very important in certain industries such as the manufacture of batteries used in electric vehicles (EVs), especially when handling thin film samples or components incorporating such samples (e.g., separators, etc.) during battery assembly or molding. Handling thin film samples involves various particularly difficult movements such as inserting and aligning such samples. In particular, it is difficult to properly insert thin film samples (e.g., into gripping components used in handling systems). Furthermore, sample alignment is difficult even in the best case. In this regard, sample alignment can be the most commonly mentioned issue when discussing any gripping solution. When the sample under test is extremely thin and easily damaged, sample alignment is particularly important because just gripping the sample can damage it and make it unusable for testing.

[0023] Assuming there are conventional solutions, there are various problems and drawbacks in conventional solutions for handling thin film samples, particularly with regard to inserting, gripping, and aligning thin film samples. For example, in some existing solutions, the sample may bend, and thus it may be necessary to re-grip the sample several times. This can damage the sample and lead to jaw breakage or inconsistent results. Furthermore, in many existing solutions, alignment is performed manually, for example, by the user aligning only by visual inspection.

[0024] According to the solution based on the present disclosure, it is possible to improve the handling of thin film samples, particularly with regard to insertion, gripping, and alignment. In particular, according to such a solution, it is possible to enable or improve the ability to easily and reproducibly insert a sample with the confidence that the sample is aligned. Such an improvement is highly desirable. For example, enabling reliable and reproducible alignment is advantageous because it allows the user to improve the reproducibility of handling thin film samples. Such reproducibility in handling during testing can, for example, as a result, increase throughput while also reducing the need for retesting due to unreliable results. Similarly, by improving gripping, the user can be confident that they can properly grip the sample on the first try, leading to a significant improvement in handling throughput and thus to an improvement in performance.

[0025] Furthermore, the solution described herein can be configured to adjust the gripping pressure. The ability to adjust the gripping pressure can be desirable because it can, for example, avoid damaging the sample prior to the start of testing. In some cases, existing systems or devices (such as an existing compressed air kit) can be used to facilitate or assist with such adjustment.

[0026] In various embodiments according to the present disclosure, fixtures that are specially designed and constructed to hold thin film samples are used. Such fixtures can be configured to be used in combination with a gripping device that is configured to grip the thin film sample in a fixed manner, i.e., without deforming or otherwise damaging the thin film sample while also maintaining the alignment of the thin film sample. In some embodiments, a powered thin film sample gripping device (e.g., pneumatically) can be used. In this regard, a dedicated powered thin film gripping portion is provided that provides easy sample alignment combined with the ability to easily set and adjust the gripping pressure, providing the functions required for the user to handle the thin film sample in an improved manner. These features are described in more detail with respect to the exemplary embodiments described below.

[0027] FIG. 1 shows an exemplary apparatus for holding and gripping a thin film sample. FIG. 1 shows an apparatus 100 (or a portion thereof) that can be used to hold and grip a thin film sample in a particularly improved and enhanced manner. As shown in FIG. 1, the apparatus 100 includes a sample fixture 110, one or more grippers 120, and one or more gripper controllers 130.

[0028] The sample fixture 110 is configured to hold the thin film sample in a fixed manner, i.e., the thin film sample 140 can be inserted, and then the thin film sample 140 is fixedly held such that the thin film sample 140 is maintained in a flat configuration. During subsequent handling (e.g., during transport, placement and alignment with the gripper 120, and / or during gripping), the sample fixture 110 maintains the sample 140 in a flat (e.g., taut) configuration without deformation or other damage to the sample 140. Any suitable design or technique can be used in the implementation of the sample fixture 110 as long as the thin film sample 140 can be inserted, fixedly held, i.e., maintained in a flat state without being deformed or otherwise damaged. Non-limiting exemplary embodiments of the sample fixture 110 are shown and described in more detail with respect to FIG. 2.

[0029] One or more gripping tools 120 are configured to grip the thin film sample once engaged with the sample holder 110. For example, the gripping tool 120 can include gripping components that engage the thin film sample 140 and can be adjusted to maintain gripping of the thin film sample 140 (e.g., during a tensile test) without deforming or otherwise damaging the sample 140. The gripping tool 120 can further include, or alternatively be attached to, an alignment component 150. In this regard, the alignment component 150 can be configured to hold the thin film sample 140 once engaged with the gripping tool(s) 120. The alignment component 150 is described in more detail with respect to the non-limiting exemplary embodiment shown in FIG. 3. In various embodiments, one or more gripping tools 120 can be powered to enable adaptively adjustable gripping (e.g., by pneumatic pressure, although the present disclosure is not limited to the use of pneumatic-based designs). Various features of the gripping tool 120 are described in more detail with respect to the non-limiting exemplary embodiments shown in FIGS. 3 and 4.

[0030] One or more gripper control units 130 are configured to engage with and drive one or more grippers 120 during operation. In this regard, each gripper control unit 130 can be configured to engage with or otherwise be attached to one or more grippers 120 and drive and control the operation of the gripper(s) 120. To that end, the gripper control unit 130 can include appropriate engagement or attachment components (e.g., of any suitable mechanical design) for engagement, connection, or otherwise attachment to the gripper(s) 120. Further, the gripper control unit 130 can include appropriate drive components for driving the gripper(s) 120. For example, if the gripper(s) 120 is a power-supplied device, the gripper control unit 130 can include appropriate components for supplying and / or otherwise regulating the power of the gripper(s) 120. If the gripper(s) 120 is pneumatically driven, for example, the gripper control unit 130 can include valves and / or piping for sending compressed air to the inside and outside of the gripper(s) 120. Such a design is shown in the non-limiting exemplary embodiment shown in FIG. 1.

[0031] In some cases, the gripper control unit 130 can include circuitry for managing and controlling various features related to the power supply and driving of the gripper 120. However, the present disclosure is not limited to this, and in other embodiments, the gripper control unit 130 can instead be connected to a dedicated control system (e.g., a programmed computer system) that supplies control-related signals for controlling and managing the power supply and driving of the gripper 120.

[0032] In an exemplary operation, the thin film sample can be inserted into the sample holder 110 and then fixed and held thereby. Next, the gripper 120 can engage or otherwise attach to the gripper control unit 130. Then, the combination(s) of the gripper 120 and the gripper control unit 130 can engage the sample holder 110, and the gripper 120 directly engages and grips the thin film sample 140 held within the sample holder 110. In this regard, it can be ensured that the alignment of the thin film sample 140 is maintained while being engaged and gripped by the gripper 120. For this purpose, the gripper 120 can incorporate specific components, mechanisms, and / or design features that maintain the alignment of the thin film sample. For example, the gripper 120 can incorporate alignment components that maintain such alignment. Such alignment components can, for example, be provided with alignment grooves that are specially designed to align with the thin film sample held within the sample holder 110 and maintain that alignment while the thin film sample is engaged and gripped by the gripper 120. The various components of the apparatus 100, as well as its operation and specific features, are described in more detail below with respect to FIGS. 2 - 5D.

[0033] FIG. 2 shows an exemplary thin film holder that can be used in an apparatus for holding and gripping a thin film sample. Shown in FIG. 2 is the sample holder 110 of FIG. 1.

[0034] In this regard, as described above, the sample holder 110 is configured to hold the thin film sample in a manner that fixes it. As shown in FIG. 2, the sample holder 110 includes a flat holding surface 220 on which the thin film sample is located, and one or more fixing elements 210 for fixing the thin film sample once placed on the flat holding surface 220. In the non-limiting exemplary embodiment shown in FIG. 2, the fixing element 210 can have a hinge-type or clip-type (e.g., spring clip) design. However, the present disclosure is not limited to such a design, and thus any suitable design that enables fixing the thin film sample 140 once applied to the sample holder 110 can be used. For example, a removable spring clip that holds the sample 140 when disposed on the outer surface can be used, or the sample 140 can be held using a built-in or removable clamp.

[0035] The fixing elements 210 are disposed on both sides of the holding surface 220 (e.g., at each end of the sample holder 110), and one or more openings 230 are defined between the fixing elements 210, providing access to the sample 140 by the gripper 120. In the example of FIG. 2, there is an opening 230 between each of the fixing elements 210 and the holding surface 220. The opening 230 can be sized based on the size of the gripping surface that contacts the sample 140. In an example where there is no holding surface 220 between the fixing elements 210, the opening 230 can extend over the entire length between the fixing elements. By fixing the sample 140 via the fixing elements 210 and gripping the sample 140 at the opening 230 between the fixing elements 210, the thin film sample 140 can be more easily aligned and gripped while being held in a flat, taut arrangement.

[0036] FIG. 3 shows an exemplary thin film holder when engaged with a gripper(s) in an apparatus for holding and gripping a thin film sample 140. FIG. 3 shows the sample holder 110 of FIG. 1 with two grippers 120 engaged therewith.

[0037] In this regard, as described above, in the exemplary operation, after the thin film sample is applied and held in the sample holder 110, the gripper 120 can be applied. The gripper 120 can include appropriate components or elements for securely fixing and gripping the thin film sample, that is, for ensuring that the thin film sample 140 is held and gripped such that it remains undamaged and undeformed. For example, in the non-limiting exemplary embodiment shown in FIG. 3, each gripper 120 can include an alignment component 310 and a gripping component 320.

[0038] The alignment component 310 can be configured to align the thin film sample 140 with the gripping component 320. In this regard, the alignment component 310 can correspond to a non-limiting exemplary embodiment of the alignment component 150 as described herein. The alignment component 310 can include an alignment groove specially designed to be aligned with the flat holding surface 220 of the sample holder 110 so that the thin film sample 140 is kept flat and aligned while the gripping component 320 engages the sample 140.

[0039] The gripping component 320 can be configured to grip the thin film sample 140. In this regard, various designs or techniques can be used to achieve this result. For example, in the non-limiting exemplary embodiment shown in FIG. 3, the gripping component 320 can include two opposing square plates that can move inward (towards each other) or outward (away from each other). In the art, a particular embodiment of the gripping component 320 may be referred to as a "jaw" or "jaw surface".

[0040] Various mechanisms can be used to facilitate such movement. For example, in some cases, a pneumatic mechanism can be used, for example, using the injection of compressed air to facilitate inward movement and the release of air to cause outward movement. Thus, these plates can be moved inward to achieve gripping.

[0041] FIG. 4 shows an example alignment component of a gripping tool that can be used in an apparatus for holding and gripping a thin film sample. FIG. 4 shows an alignment component 400, which can be used in a gripping tool, such as gripping tool 120, in an apparatus for holding and gripping a thin film sample according to the present disclosure.

[0042] As shown in FIG. 4, the alignment component 400 can have a portion that forms an alignment groove 410 for fixing and maintaining the alignment of the thin film sample 140 once it is inserted and held by a holding component (e.g., sample holder 110) as described herein. The alignment component 400 can further comprise a portion for attaching it to a gripping apparatus (e.g., gripping tool 120). For example, in the non-limiting exemplary embodiment shown in FIG. 4, the alignment component 400 can incorporate a mounting portion with holes for bolting or otherwise attaching the alignment component 400 to the gripping tool(s) 120, as shown in various figures.

[0043] Each of the gripping tools 120 can comprise a corresponding alignment component 400. In some examples, the alignment groove 410 is defined by a first surface 420 on which the sample side of the sample holder 110 (e.g., the side of the holding component 120 that contacts the sample 140) is disposed, a second surface 430 on which the non-sample side of the sample holder 110 is disposed, and a stop surface 440 that provides an indication of the vertical alignment of the sample holder 110. In some examples, one or more of the surfaces and / or the holding component 120 can be lightly magnetically attractive to maintain the holder 110 in an engaged state with the alignment component 400 without substantially affecting the ability of an operator to adjust the placement of the sample holder 110 relative to the alignment component 400. In other examples, the alignment component 400 and / or the holder 110 can have a sufficiently high coefficient of friction to hold the holder 110 in place within the alignment groove 410 when properly positioned.

[0044] Figures 5A - 5D show the states when different components of an exemplary apparatus for holding and gripping a thin - film sample are assembled, from various viewpoints. Figures 5A - 5D show an exemplary apparatus (e.g., apparatus 100 of FIG. 1) for holding and gripping a thin - film sample according to the present disclosure, with its different components (e.g., holding part 110, gripper(s) 120, and gripper control part(s) 130) assembled, for example, when engaged / holding a thin - film sample. In this regard, Figures 5A - 5D show the fully assembled apparatus 100 from different viewpoints, showing how these components engage with each other when a thin - film sample is applied and held within the apparatus.

[0045] Figures 6A and 6B show another exemplary apparatus for holding and gripping a thin - film sample, with additional improved features. Figures 6A and 6B show an apparatus 600 (or a part thereof) that can be used to hold and grip a thin - film sample in a particularly improved and enhanced manner.

[0046] Apparatus 600 can be made substantially similar to other apparatuses described herein (e.g., apparatus 100) and can operate in a substantially similar manner. In this regard, as shown in Figures 6A and 6B, apparatus 600 includes a sample holder 610 and one or more alignment components 620. Further, although not shown in Figures 6A and 6B, apparatus 600 can include other components, such as gripper(s), gripper control part(s), etc. The various components of apparatus 600 can be the same or identical to the similar components in other exemplary embodiments as described above and can operate in a substantially similar or identical manner.

[0047] For example, the sample holder 610 can be the same as the sample holder 110. Similarly, it can be configured to hold the thin film sample in the same manner as fixing the thin film sample, that is, to be able to insert a thin film sample such as the thin film sample 630 as shown in FIG. 6A. Therefore, once the sample 630 engages with the holder 610, the sample 630 can be fixedly held so as to be maintained in a flat arrangement. Similarly, each of the alignment components 620 can be the same as or identical to any one of the sample alignment components (singular or plural) 150, 310, and / or 400 described herein, and can be configured to maintain the alignment of the sample 630 held within the sample holder 610. For example, once engaged with a gripper (singular or plural) (not shown), the alignment component 620 can align with the sample 630 held within the sample holder 610 and can maintain its alignment, for example, while the sample 630 is engaged and gripped by the gripper, as described in more detail above.

[0048] However, the components of the apparatus 600 can incorporate additional functions to improve performance. For example, as shown in FIG. 6A, the alignment component 620 can incorporate longer fins (thus creating longer grooves) compared to the other exemplary embodiments described above to improve sample alignment. This is shown in FIG. 6A, where the illustrated holder 610 (with the sample 620 inserted therein) is engaged with an alignment component (singular or plural) 630 having longer fins than the exemplary alignment component shown in FIG. 4.

[0049] Furthermore, as shown in FIG. 6B, the holder 610 can incorporate pads (singular or plural) (e.g., rubber pads) 640 into the base 612 of the holder 610. In this regard, the use of such pads can improve sample engagement by ensuring that the holder remains stationary, that is, does not move, while the sample is inserted and engaged (e.g., by the fixing elements of the holder 610).

[0050] As shown in FIG. 6B, the holder 610 can further incorporate one or more magnetic elements 650 to further improve the engagement of the sample. In this regard, the magnetic element(s) 650 can be incorporated into one or both of the inside of the base 612 of the holder 610 and the inside of the opposite side of the holder arm 614 connecting the fixing element. In this regard, by pushing the holder arm 614, it is possible to open the fixing element when the sample is placed within the holder 610. Thus, when engaging with the sample, once the holder arm 614 is pushed towards the base, the magnetic element(s) engage and can keep the fixing element open until the sample is placed or positioned. In some cases, a single magnet can be used on one of the two opposing insides, and a metal piece can be placed on the opposite side. Alternatively, two magnets (one on each side) can be used. Further, in some embodiments, for example, a single magnetic base array can be used at the center of the holder arm 614 connecting the fixing element, while in other embodiments, multiple arrays (e.g., using two of the arrays, one at each end, three with one at the center and one at each end, etc.) can be used.

[0051] The magnetic element(s) and its / their array are selected or adjusted to provide a magnetic force that is just sufficient to keep the fixing element open (thus, the operator does not need to do so), but not so strong as to require a force that is too large to overcome and that may adversely affect the placement of the sample before the sample engages with the fixing element. In other examples, the magnet(s) can be replaced with other types of holding devices that keep the fixing element in an open configuration. For example, other holding devices that can be attached to and / or integrated with the sample holder 610 include hooks, clips or clamps (e.g., pressing the holder arm 614 against the body of the sample holder to hold), stoppers or braces (e.g., holding one or both of the fixing elements away from the body 620), and / or any other type of holding device.

[0052] In some embodiments, an apparatus such as any one of those described herein can be used to adjust the apparatus, particularly the sample holder, to incorporate additional features and / or components related to adjustment that enable it to adapt to samples of different sizes and / or shapes. For example, in one exemplary embodiment, the sample holding component can be configured to be split in the center and each side can be moved individually as needed and locked in place. In another exemplary embodiment, an adjustable internal slider with markings along the apparatus indicating the set length and width of the sample can be used. In this regard, in such embodiments, a plurality of magnet-based arrays can be used at different parts of the sample holding device, such as at each end, for holding.

[0053] Figures 7A and 7B show an apparatus for holding and gripping another exemplary thin film sample with sample width adjustment features. Figures 7A and 7B show an apparatus 700 (or a portion thereof) that can be used to hold and grip a thin film sample in a particularly improved and enhanced manner.

[0054] Apparatus 700 can be made substantially similar to other apparatuses described herein (e.g., apparatus 100 and apparatus 600) and can operate in a substantially similar manner. In this regard, as shown in Figures 7A and 7B, apparatus 700 includes a sample holder 710, one or more grippers 720, one or more gripper controllers 730, and one or more alignment components 750. These components of apparatus 700 can be made similar or identical to the similar components in other exemplary embodiments as described above and can operate in a substantially similar or identical manner.

[0055] For example, the sample holder 710 can be similar to each of the sample holders 110 and 610, and similarly, it can be configured to hold the thin film sample in the same way as it is fixed, that is, to be able to insert the thin film sample. In this regard, the sample holder 710 can be provided with components and / or features for fixing, engaging, and holding the sample so that the sample is maintained in a flat arrangement once engaged. For example, as shown in FIGS. 7A and 7B, the sample holder 710 can include a central flat holding surface and a fixing element (e.g., a clip) for fixing the thin film sample once placed on the flat holding surface.

[0056] Similarly, the alignment component 750 can be similar or identical to any one of the sample alignment components (singular or plural) 150, 310, 400, and 620 as described herein, and similarly, it can be configured to maintain the alignment of the sample held within the sample holder 710. However, the exemplary embodiments according to the present disclosure can fix the alignment of the sample in a different way so that an alignment device attached to the gripper is not required. For example, the width adjustment component can incorporate an alignment feature (e.g., the front protrusion shown in FIG. 7B) that aligns with a corresponding alignment indexing feature (e.g., a hole or a space) on the front surface of the gripping part as shown in FIG. 7. Once the gripper(s) (not shown) engages, the alignment component 750 can be aligned with the sample held within the sample holder 710 and can maintain its alignment, for example, while the sample is engaged and held by the gripper, as described in more detail above.

[0057] However, the apparatus 700 can additionally be configured to be able to adjust the sample width. In this regard, in some cases, different sample widths may be required, so it may be desirable to be able to adjust the width. This can be done, for example, by enabling at least partial lateral adjustment movement of the sample holder (such as that shown in FIGS. 7A and 7B). In this regard, in some cases, a fiducial feature for controlling the engagement with the sample holder (e.g., how far the sample holder can be inserted) can be incorporated into the gripper (e.g., away from the end of the gripping portion), and the width adjustment component can enable adaptation to different widths of the sample by adjusting the insertion amount. Thus, by using the width adjustment feature in the sample holder, it can be made possible to move a part of the sample holder laterally, so that it can adapt to samples having different widths.

[0058] In some exemplary implementations, the width adjustment can be provided by using a spring or similar tension-based element, such as the implementation shown in FIGS. 7A and 7B. Nevertheless, the present disclosure is not limited to the embodiments shown in FIGS. 7A and 7B, and any other suitable implementation that provides width adjustment in a substantially similar manner can equally apply.

[0059] For example, as shown in FIGS. 7A and 7B, the sample holder 710 can incorporate a width adjustment component 760 configured to enable or assist in width-based adjustment. In this regard, the width adjustment component 760 can be implemented as a mounting feature that allows for sample alignment without the need to use a back piece attached to a gripping portion (e.g., the gripper 720 in apparatus 700). In particular, in the exemplary embodiments shown in FIGS. 7A and 7B, the width adjustment component 760 can be implemented as a spring load component that includes a load spring 764 whose tension or compression can be adjusted, for example. The compression of the load spring 764 is adjusted via a butterfly screw 762 as shown in FIG. 7B, for example. Thus, the user can turn the butterfly screw 762 to set the distance from the center of the load spring 764 such that samples of different widths can all be aligned to the center of the load spring 764 using the same apparatus.

[0060] In one exemplary embodiment, the securing elements of the sample holder (e.g., the clips shown in FIGS. 7A and 7B) can be configured to engage synchronously (i.e., in unison). Alternatively, in other embodiments, the securing elements can engage individually and independently, e.g., first through one securing element (e.g., one of the clips) and then through another securing element (e.g., a second clip). Also, in the various figures, the securing elements are shown as being of the same type (e.g., clips), but the present disclosure is not so limited, and thus, different securing elements, such as different types of the same mechanism (e.g., different clips), or entirely different types of engagement mechanisms, etc., can be used in the same sample holder.

[0061] In some embodiments, the sample holder can further incorporate a mechanism that allows for length adjustment, optionally in conjunction with the width adjustment feature.

[0062] In one exemplary use case, the sample can engage onto the sample holder (after any necessary width adjustment). This can involve fixing one side with a clip and then fixing the second side after ensuring the sample is pulled flat. The sample holder with the sample is then engaged onto the gripper.

[0063] An exemplary apparatus for handling a thin film sample according to the present disclosure includes a sample holder configured to engage with the thin film sample. The sample holder includes one or more holding components configured to receive the thin film sample in a flat arrangement relative to the sample holder, and one or more fixing components configured to fix and maintain the thin film sample in a flat arrangement during operation of the sample holder. The sample holder includes one or more openings that allow access to both sides of the thin film sample at two or more positions on the thin film sample between the one or more fixing components.

[0064] In one exemplary embodiment, the one or more holding components include a flat holding surface located between the one or more openings.

[0065] In one exemplary embodiment, the apparatus further includes a first alignment component that is attached to a first gripper of a materials testing system and is configured to receive the flat holding surface such that the sample is aligned with the first gripper of the materials testing system when the flat holding surface is fully inserted within the first alignment component.

[0066] In one exemplary embodiment, the apparatus further includes a second alignment component configured to be attached to a second gripper of the materials testing system. The first alignment component and the second alignment component are configured to receive the flat holding surface such that the sample is aligned with the first gripper and the second gripper of the materials testing system when the flat holding surface is fully inserted within the first alignment component and the second alignment component.

[0067] In one exemplary embodiment, the one or more fixing components include one or more clip components.

[0068] In one exemplary embodiment, at least one clip component is integral with the sample holder.

[0069] In one exemplary embodiment, at least one clip component includes a surface integral with the sample holder and a removable fixing clip.

[0070] In one exemplary embodiment, the one or more openings provide access to both sides of the thin film sample by the gripping part of the material testing system.

[0071] In one exemplary embodiment, the sample holder further includes one or more pads on the bottom surface of the sample holder, and the one or more pads are configured to maintain the sample holder in a stationary state while engaging with the thin film sample.

[0072] In one exemplary embodiment, the sample holder further includes one or more magnet-based arrays configured to keep the one or more fixing components open while the thin film sample is inserted or engaged with the sample holder.

[0073] An exemplary apparatus for handling a thin film sample according to the present disclosure includes a sample holder configured to engage with the thin film sample, the sample holder including one or more holding components configured to receive the thin film sample in a flat arrangement relative to the sample holder, one or more fixing components configured to fix and maintain the thin film sample in a flat arrangement during operation of the sample holder, and a width adjustment component configured to be capable of adapting to different sample widths.

[0074] In one exemplary embodiment, the width adjustment component is configured to allow at least a partial lateral movement of the sample holder.

[0075] In one exemplary embodiment, the width adjustment component includes a spring-based component.

[0076] In one exemplary embodiment, the spring-based component includes a load spring and a control element configured to be able to adjust the tension or compression of the load spring.

[0077] In one exemplary embodiment, the control element includes a butterfly screw.

[0078] In one exemplary embodiment, each of the one or more fixed components is of the same type and / or uses the same type of fixing mechanism.

[0079] In one exemplary embodiment, at least one fixed component is of the same type different from at least one other fixed component and / or uses a different type of fixing mechanism.

[0080] In one exemplary embodiment, the one or more fixed components include one or more clip components.

[0081] In one exemplary embodiment, at least one clip component is integral with the sample holder.

[0082] In one exemplary embodiment, at least one clip component includes a surface integral with the sample holder and a removable fixing clip.

[0083] Other embodiments according to the present disclosure can provide a non-transitory computer-readable medium and / or storage medium, and / or a non-transitory machine-readable medium and / or storage medium having at least one code section executable by a machine and / or a computer, thereby causing the machine and / or the computer to execute processing as described herein, and storing machine code and / or a computer program.

[0084] Accordingly, various embodiments according to the present disclosure can be realized in hardware, software, or a combination of hardware and software. The present disclosure can be realized in a centralized form in at least one computing system, or in a distributed form in which different elements are spread over several interconnected computing systems. Any kind of computing system or other device adapted to execute the methods described herein is suitable. A typical combination of hardware and software can be a general-purpose computing system that uses a program or other code to control the computing system to execute the methods described herein when loaded and executed. Another typical embodiment can include application-specific integrated circuits or chips.

[0085] Various embodiments according to the present disclosure include all features enabling the embodiments of the methods described herein, and can also be embedded in a computer program product that is capable of executing these methods when loaded into a computer system. A computer program in this context means any representation, in any language, code, or notation, of a set of instructions that are intended to cause a system having information processing capabilities to perform a specific function, either directly or after one or both of the following: a) conversion to another language, code, or notation; b) reproduction in a different material form.

[0086] Although the present disclosure has been described with reference to certain embodiments, those skilled in the art will understand that various changes can be made and equivalents can be substituted without departing from the scope of the present disclosure. For example, the blocks and / or components of the disclosed examples can be combined, divided, rearranged, and / or otherwise changed. Additionally, many modifications can be made to adapt the teachings of the present disclosure to specific situations or materials without departing from the scope of the present disclosure. Accordingly, the present disclosure is not limited to the specific embodiments disclosed, but rather, the present disclosure is intended to include all embodiments that fall within the scope of the appended claims.

Claims

1. An apparatus for handling a thin film sample, comprising: a sample holder configured to engage with the thin film sample; The sample holder includes: one or more holding components configured to receive the thin film sample in a flat arrangement relative to the sample holder; one or more fixing components configured to fix and maintain the thin film sample in the flat arrangement during operation of the sample holder; The sample holder further includes one or more openings between the one or more fixing components, the one or more openings enabling access to both sides of the thin film sample at two or more positions on the thin film sample. Apparatus.

2. The apparatus according to claim 1, wherein the one or more holding components include a flat holding surface located between the one or more openings.

3. The apparatus according to claim 2, further comprising a first alignment component configured to be attached to a first gripping part of a material testing system and to receive the flat holding surface such that the sample is aligned with the first gripping part of the material testing system when the flat holding surface is fully inserted into the first alignment component.

4. The apparatus according to claim 3, further comprising a second alignment component configured to be attached to a second gripping part of the material testing system, wherein the first alignment component and the second alignment component are configured to receive the flat holding surface such that the sample is aligned with the first gripping part and the second gripping part of the material testing system when the flat holding surface is fully inserted into the first alignment component and the second alignment component.

5. The apparatus according to claim 1, wherein the one or more fixing components include one or more clip components.

6. The apparatus according to claim 5, wherein at least one clip component is integral with the sample holder.

7. The apparatus according to claim 5, wherein at least one clip component includes a plurality of surfaces integral with the sample holder and a plurality of removable fixing clips.

8. The apparatus according to claim 1, wherein the one or more openings provide access to both sides of the thin film sample by a gripping part of a material testing system.

9. ​ ​ The sample holder further comprises one or more pads on the bottom surface of the sample holder, and the one or more pads are configured to maintain the sample holder in a stationary state while engaging with the thin film sample. The apparatus according to claim 1.

10. The sample holder further comprises one or more magnet-based arrays configured to keep the one or more fixing components open while the thin film sample is inserted or engaged with the sample holder. The apparatus according to claim 1.

11. An apparatus for handling a thin film sample, comprising a sample holder configured to engage with the thin film sample wherein the sample holder comprises one or more holding components configured to receive the thin film sample in a flat arrangement with respect to the sample holder, one or more fixing components configured to fix and maintain the thin film sample in the flat arrangement during operation of the sample holder, and a width adjustment component configured to be adaptable to different sample widths. The apparatus.

12. The width adjustment component is configured to enable at least a partial lateral movement of the sample holder. The apparatus according to claim 11.

13. The width adjustment component includes a spring-based component. The apparatus according to claim 11.

14. The spring-based component comprises a load spring and a control element configured to be able to adjust the tension or compression of the load spring. The apparatus according to claim 13.

15. The control element includes a butterfly screw. The apparatus according to claim 14.

16. Each of the one or more fixing components is of the same type and / or uses the same type of fixing mechanism. The apparatus according to claim 11.

17. At least one fixing component is of a different same type than at least one other fixing component and / or uses a different type of fixing mechanism. The apparatus according to claim 11.

18. The one or more fixing components include one or more clip components. The apparatus according to claim 11.

19. At least one clip component is integral with the sample holder. The apparatus according to claim 18.

20. At least one clip component comprises a plurality of surfaces integral with the sample holder and a plurality of removable fixing clips. The apparatus according to claim 18.

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