Continuity test system

Abstract

To provide a conduction inspection system capable of easily performing conduction inspection of a wire harness while suppressing a burden on a worker.SOLUTION: The conduction inspection system 40 includes a laser device 80, a first infrared camera 110, and a control device 200. The control device 200 controls the laser device 80 so as to irradiate a terminal to be irradiated electrically connected to an electric wire to be inspected with laser light for a predetermined time. The control device 200 controls the first infrared camera 110 to acquire the first and second temperature information of the terminal to be measured electrically connected to the electric wire to be inspected before and after irradiating the terminal to be irradiated with the laser light. The control device 200 calculates a value of the temperature change of the terminal to be measured based on the first temperature information and the second temperature information. The control device 200 determines the continuity state of the electric wire to be inspected based on the value of the temperature change of the terminal to be measured and the reference value associated with the electric wire to be inspected.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a continuity inspection system. [Background technology]

[0002] BACKGROUND ART Conventionally, in an inspection process in the manufacture of a wire harness, a continuity test of the wire harness is performed.

[0003] Patent Document 1 discloses an inspection device used in a continuity inspection system for inspecting the continuity of a wire harness. In the continuity inspection of a wire harness, an operator fixes a connector provided on the wire harness to a connector receptacle of the inspection device, and then brings external terminals of the inspection device into contact with terminals of the connector to inspect the continuity of electric wires electrically connected to the terminals. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2000-19214 Summary of the Invention [Problem to be solved by the invention]

[0005] However, when using such a continuity testing system, the worker must contact the external terminals of the testing device with the terminals of the connector fixed to the connector receptacle of the testing device, which places a heavy burden on the worker.

[0006] Therefore, further improvements are required to reduce the burden on the worker and to easily perform the continuity test of the wire harness.

[0007] The present invention has been made in view of the problems inherent in the conventional technology, and an object of the present invention is to provide a continuity inspection system that can easily perform a continuity inspection of a wire harness while reducing the burden on the worker. [Means for solving the problem]

[0008] A continuity test system according to an aspect of the present invention tests the continuity of electric wires included in a wire harness and includes: a first holder that holds a first connector having a first terminal therein electrically connected to one end of the electric wire to be tested; a laser device that is arranged to face the first connector held in the first holder and that selectively irradiates laser light onto the first terminal; a second holder that holds a second connector having a second terminal therein electrically connected to the other end of the electric wire to be tested; a measurement device that is arranged to face the second connector held in the second holder and that acquires temperature information of the second terminal; and a control device that controls the laser device and the measurement device. The first connector has a plurality of terminals including the first terminal. The plurality of terminals are each electrically connected to a plurality of electric wires including the electric wire to be tested. the control device includes: a storage unit that stores, as a reference value, a value of a temperature change at one end of each conductive electric wire that is estimated to occur when the laser light is irradiated onto the other end of the electric wire for a predetermined time, linked to identification information of the electric wire; a first control unit that controls the laser device to irradiate the laser light to the first terminal for the predetermined time; a second control unit that controls the measuring device to obtain first temperature information of the second terminal before the laser light is irradiated onto the first terminal; a third control unit that controls the measuring device to obtain second temperature information of the second terminal after the laser light is irradiated onto the first terminal for the predetermined time; a communication unit that receives the first temperature information and the second temperature information from the measuring device; a calculation unit that calculates a value of the temperature change at the second terminal based on the first temperature information and the second temperature information; and a determination unit that determines a continuity state of the electric wire to be inspected based on the value of the temperature change at the second terminal and a reference value linked to the electric wire to be inspected. [Effects of the Invention]

[0009] According to the present invention, it is possible to provide a continuity inspection system that can easily perform a continuity inspection of a wire harness while reducing the burden on an operator. [Brief explanation of the drawings]

[0010] [Figure 1] FIG. 1 is a schematic diagram showing the overall configuration of a continuity inspection system according to this embodiment. [Figure 2] FIG. 2 is a diagram showing the frontage of a connector provided at one end of a main line of a wire harness in the continuity inspection system according to this embodiment. [Figure 3] FIG. 3 is a diagram showing the frontage of a connector provided at the other end of the main line of the wire harness in the continuity test system according to this embodiment. [Figure 4] FIG. 4 is a diagram illustrating an example of a connection state between a terminal of a connector provided at one end of a main line of a wire harness and a terminal of another connector in the continuity test system according to this embodiment. [Figure 5] FIG. 5 is a diagram showing parameters for determining the focused diameter of the laser beam used in the continuity inspection system according to this embodiment. [Figure 6] FIG. 6 is a block diagram showing an example of the functional configuration of a control device in the continuity test system according to this embodiment. [Figure 7A] FIG. 7A is a diagram showing parameters for determining the reference value of an electric wire, which are used in the continuity inspection system according to this embodiment. [Figure 7B] FIG. 7B is a diagram showing physical properties that determine the reference values ​​of the electric wires used in the continuity inspection system according to this embodiment. [Figure 8] FIG. 8 is a diagram showing an example of a reference value table used in the continuity test system according to this embodiment. [Figure 9] FIG. 9 is a diagram showing an example of the timing of laser light irradiation in the continuity test system according to this embodiment. [Figure 10]FIG. 10 is a diagram showing an example of the hardware configuration of a control device in the continuity test system according to this embodiment. [Figure 11A] FIG. 11A is a flow diagram showing an example of an inspection procedure in the continuity inspection system according to this embodiment. [Figure 11B] FIG. 11B is a flowchart showing an example of an inspection procedure in the continuity inspection system according to this embodiment. [Figure 12] FIG. 12 is a diagram showing an example of a temperature rise pattern in a terminal to be measured in a continuity test system according to a first modified example of this embodiment. [Figure 13] FIG. 13 is a schematic diagram showing the overall configuration of a continuity inspection system according to a second modified example of this embodiment. [Figure 14] FIG. 14 is a schematic diagram showing the overall configuration of a continuity inspection system according to a third modified example of this embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0011] The continuity inspection system according to this embodiment will be described in detail below with reference to the drawings. Note that the same or similar reference numerals are used to designate the same functions and configurations, and descriptions thereof will be omitted as appropriate.

[0012] [Configuration of the continuity inspection system] First, a description will be given of the configuration of the continuity inspection system 40. Fig. 1 is a schematic diagram of the entire configuration of the continuity inspection system 40. As shown in Fig. 1, the continuity inspection system 40 is used in an inspection process in the manufacture of a wire harness 1.

[0013] The wire harness 1 is composed of a main line 10 and branch lines 20A and 20B. The branch line 20A branches off from the main line 10 at a branch position 30A. The branch line 20B branches off from the main line 10 at a branch position 30B. The number of branch lines is not limited to two, and may be three or more.

[0014] The wire harness 1 is provided with connectors 31 to 34. Specifically, the connector 31 is provided at one end of the main line 10. The connector 32 is provided at the other end of the main line 10. The connector 33 is provided at one end of the branch line 20A. The connector 34 is provided at one end of the branch line 20B.

[0015] Fig. 2 is a diagram showing an opening 31A of the connector 31. As shown in Fig. 2, six terminal accommodating chambers separated by partition walls are open in the opening 31A. Note that the number of terminal accommodating chambers is not limited to six, and may be five or less or seven or more.

[0016] In the frontage 31A, three terminal accommodating chambers are open along the longitudinal direction of the frontage 31A, and two terminal accommodating chambers are open along the lateral direction of the frontage 31A. In this way, the frontage 31A is divided into a matrix of 2 rows and 3 columns by partition walls.

[0017] The six terminal accommodating chambers accommodate terminals 31a to 31f, respectively. Terminals 31a to 31f are metal terminals and are, for example, tin-plated. Therefore, terminals 31a to 31f have a high absorptivity for laser light. With this configuration, connector 31 has terminals 31a to 31f inside.

[0018] In the opening 31A, three terminals (terminals 31a to 31c and terminals 31d to 31f) are arranged along the longitudinal direction of the opening 31A, and two terminals (terminals 31a and 31d, terminals 31b and 31e, and terminals 31c and 31f) are arranged along the lateral direction of the opening 31A. In this way, within the opening 31A, the terminals 31a to 31f are arranged in a matrix of 2 rows and 3 columns.

[0019] Fig. 3 is a diagram showing an opening 32A of the connector 32. As shown in Fig. 3, six terminal accommodating chambers separated by partition walls are open in the opening 32A. Note that the number of terminal accommodating chambers is not limited to six, and may be five or less or seven or more.

[0020] In the frontage 32A, three terminal accommodating chambers are open along the longitudinal direction of the frontage 32A, and two terminal accommodating chambers are open along the lateral direction of the frontage 32A. In this way, the frontage 32A is divided into a matrix of two rows and three columns by partition walls.

[0021] The six terminal accommodating chambers accommodate terminals 32a to 32f, respectively. The terminals 32a to 32f are metal terminals, and are, for example, tin-plated. Therefore, the terminals 32a to 32f have a high absorptivity for laser light. With this configuration, the connector 32 has the terminals 32a to 32f inside.

[0022] In the opening 32A, three terminals (terminals 32a to 31c and terminals 31d to 31f) are arranged along the longitudinal direction of the opening 32A, and two terminals (terminals 32a and 32d, terminals 32b and 32e, and terminals 32c and 32f) are arranged along the lateral direction of the opening 32A. In this way, the terminals 32a to 32f are arranged in a matrix of 2 rows and 3 columns within the opening 32A.

[0023] Like connectors 31 and 32, connector 33 has six terminals 33a to 33f arranged in a matrix of 2 rows and 3 columns inside (see FIG. 4). Like connectors 31 and 32, connector 34 has six terminals 34a to 34f arranged in a matrix of 2 rows and 3 columns inside (see FIG. 4).

[0024] Fig. 4 is a diagram illustrating an example of a connection state between the terminals of connector 31 and the terminals of connectors 32 to 34. As shown in Fig. 4, the terminal of connector 31 is connected to the terminal of one of connectors 32 to 34 via an electric wire. Specifically, terminal 31a is electrically connected to terminal 32a of connector 32 via electric wire 11. Terminal 31b is electrically connected to terminal 33b of connector 33 via electric wire 12. Terminal 31c is electrically connected to terminal 34c of connector 34 via electric wire 13.

[0025] Terminal 31d is electrically connected to terminal 32d of connector 32 via electric wire 14. Terminal 31e is electrically connected to terminal 33e of connector 33 via electric wire 15. Terminal 31f is electrically connected to terminal 34f of connector 34 via electric wire 16.

[0026] In this manner, terminals 31a and 32a are electrically connected to both ends of electric wire 11, respectively. Terminals 31b and 33b are electrically connected to both ends of electric wire 12, respectively. Terminals 31c and 34c are electrically connected to both ends of electric wire 13, respectively. Terminals 31d and 32d are electrically connected to both ends of electric wire 14, respectively. Terminals 31e and 33e are electrically connected to both ends of electric wire 15, respectively. Terminals 31f and 34f are electrically connected to both ends of electric wire 16, respectively.

[0027] Each of the electric wires 11 to 16 has a conductor and an insulating coating that covers the conductor. In this embodiment, the conductor of each electric wire is made of copper or a copper alloy, which has high thermal conductivity. In a wire harness, an electric wire to which two terminals are connected is also called a circuit. In the above-described connected state, the two terminals connected to both ends of the electric wire are provided inside different connectors, but this is not limited thereto and they may be provided inside the same connector. Furthermore, in the above-described connected state, the two terminals connected to both ends of the electric wire are arranged at the same position within the openings of the two connectors, but this is not limited thereto and they may be arranged at different positions within the openings of the two connectors.

[0028] As shown in FIG. 1, the continuity inspection system 40 includes a jig plate 50, a plurality of supports 60, holders 71 to 74, a laser device 80, a robot arm 100, a first infrared camera 110, a second infrared camera 120, a shape measuring device 130, and a control device 200.

[0029] The jig plate 50 is formed in a plate shape. A plurality of supports 60 and holders 71 to 74 are provided upright on the jig plate 50. The plurality of supports 60 support the wire harness 1.

[0030] Each of the holders 71 to 74 is disposed at a specific position on the jig plate 50. The holder 71 holds the connector 31 so that the opening 31A of the connector 31 faces upward and is fixed parallel to the surface of the jig plate 50. The holder 72 holds the connector 32 so that the opening 32A of the connector 32 faces upward and is fixed parallel to the surface of the jig plate 50.

[0031] The holder 73 holds the connector 33 so that the front of the connector 33 faces upward and is fixed parallel to the surface of the jig plate 50. The holder 74 holds the connector 34 so that the front of the connector 34 faces upward and is fixed parallel to the surface of the jig plate 50.

[0032] Laser device 80 is disposed so as to face the opening of one of connectors 31 to 34 held by holders 71 to 74, and selectively irradiates laser light onto each of a plurality of terminals provided on that connector.

[0033] In this embodiment, the electric wires to be inspected are the electric wires 11 to 16. For this reason, the laser device 80 is disposed so as to face the opening 31A of the connector 31 held by the holder 71. The laser device 80 selectively irradiates laser light onto each of the terminals 31a to 31f electrically connected to one end of the electric wires 11 to 16.

[0034] Laser device 80 may be sequentially arranged to face openings 32A to 34A of connectors 32 to 34 held by holders 72 to 74, instead of opening 31A of the connector. In this case, laser device 80 selectively irradiates laser light sequentially to terminals 32a and 32d of connector 32, terminals 33b and 33e of connector 33, and terminals 34c and 34f of connector 34, which are electrically connected to the other ends of electric wires 11 to 16.

[0035] The laser device 80 includes a laser emitter 81, a multi-core optical fiber cable 82, a multi-core connector 83, an optical switch device 84, a plurality of optical fibers 85, a plurality of collimator lenses 86, lens arrays 87a to 87d, and a lens replacement mechanism 88.

[0036] The laser emitter 81 has a plurality of laser oscillators. Each laser oscillator is connected to the control device 200. Each laser oscillator generates a laser beam based on a control signal from the control device 200. The laser emitter 81 emits a plurality of laser beams generated by the plurality of laser oscillators, respectively. Each laser beam has a single light intensity peak.

[0037] The laser emitter 81 may have one laser oscillator instead of a plurality of laser oscillators. In this case, the laser emitter 81 emits one laser beam.

[0038] The multi-core optical fiber cable 82 guides the plurality of laser beams emitted from the laser emitter 81 to the multi-core connector 83. Note that an optical fiber cable in which a plurality of optical fibers are bundled may be used instead of the multi-core optical fiber cable 82. In this case, the plurality of optical fibers guide the plurality of laser beams emitted from the laser emitter 81 to the multi-core connector 83.

[0039] Furthermore, when the laser emitter 81 emits one laser beam, a single-core optical fiber cable is used instead of the multi-core optical fiber cable .

[0040] The multi-core connector 83 is provided at an end of the multi-core optical fiber cable 82 and connects the multi-core optical fiber cable 82 to the optical switch device 84. The multi-core connector 83 outputs the plurality of laser beams guided by the multi-core optical fiber cable 82 to the optical switch device 84.

[0041] If the number of laser oscillators is smaller than the number of terminals provided on the connector, a branching optical system having a diffractive optical element or the like is used instead of the multi-core connector 83. The branching optical system branches one or more laser beams guided by the single-core optical fiber cable or multi-core optical fiber cable 82 to generate laser beams in a number equal to the number of terminals provided on the connector. The branching optical system outputs the generated laser beams to the optical switch device 84. A distribution optical system may be used instead of the branching optical system.

[0042] In this embodiment, each of the connectors 31 to 34 has six terminals therein, and therefore the number of laser beams output to the optical switch device 84 is six.

[0043] The optical switch device 84 is connected to the control device 200. The optical switch device 84 individually controls the output of the plurality of laser beams output from the multi-core connector 83 or the branching optical system, using physical shutters (for example, laser shutters) provided in the optical paths of the respective laser beams, based on a control signal from the control device 200. Note that an optical modulator may be used instead of the physical shutters.

[0044] Each of the plurality of optical fibers 85 is connected to the optical switch device 84, and guides the laser light output from the optical switch device 84 to the vicinity of a terminal provided in the connector. The plurality of optical fibers 85 are arranged so that the end faces of the plurality of optical fibers 85 face the plurality of terminals provided in the connector, respectively, and are bundled as a fiber bundle.

[0045] In this embodiment, each of the connectors 31 to 34 has six terminals therein, and therefore the number of optical fibers 85 is six. The six optical fibers 85 are arranged in a matrix of 2 rows and 3 columns such that the end faces of the six optical fibers 85 face the six terminals provided in the connector, respectively.

[0046] In this embodiment, the electric wires to be inspected are the electric wires 11 to 16. Therefore, the end faces of the six optical fibers 85 face the terminals 31a to 31f provided on the connector 31, respectively.

[0047] The plurality of collimator lenses 86 are respectively provided at the ends of the plurality of optical fibers 85. The plurality of collimator lenses 86 adjust the plurality of laser beams emitted from the ends of the plurality of optical fibers 85 to be parallel beams. Note that instead of using the plurality of collimator lenses 86 to adjust the plurality of laser beams to be parallel beams, the ends of the plurality of optical fibers 85 may be processed into a spherical or lens-like shape to adjust the plurality of laser beams to be parallel beams.

[0048] Each of the lens arrays 87a to 87d focuses the laser beams emitted from the collimator lenses 86 onto the terminals provided in the connector. The lens arrays 87a to 87d are also called light-focusing members.

[0049] In this embodiment, each of the lens arrays 87a to 87d has six lenses. In the lens array 87a, the six lenses are arranged in a matrix of 2 rows and 3 columns so as to correspond to the arrangement and spacing of the terminals 31a to 31f provided in the connector 31. With this configuration, as shown in FIG. 2, irradiation points 90a to 90f of the laser light can be aligned with the terminals 31a to 31f, respectively, at the opening 31A of the connector 31.

[0050] For example, in the case of a single-mode laser, the focused diameter D0 of the laser beam can be calculated using the formula D0 = 4λf / (πD). Here, λ represents the laser wavelength, f represents the lens focal length, and D represents the incident beam diameter. FIG. 5 is a diagram showing parameters that determine the focused diameter of the laser beam. As shown in FIG. 5, when the laser wavelength is 1.07 μm, the lens focal length is 100 mm, and the incident beam diameter is 5 mm, the focused diameter of the laser beam is 27.25 μm. Thus, even when the laser wavelength, lens focal length, and incident beam diameter have typical values ​​as shown in FIG. 5, it is possible to narrow the focused diameter of the laser beam to 30 μm or less. Therefore, the laser device 80 can selectively irradiate each of the terminals 31a to 31f of the connector 31 with laser beams.

[0051] Similarly, in lens array 87b, six lenses are arranged in a matrix of 2 rows and 3 columns to correspond to the arrangement and spacing of terminals 32a to 32f provided in connector 32. In lens array 87c, six lenses are arranged in a matrix of 2 rows and 3 columns to correspond to the arrangement and spacing of terminals 33a to 33f provided in connector 33. In lens array 87d, six lenses are arranged in a matrix of 2 rows and 3 columns to correspond to the arrangement and spacing of terminals 34a to 34f provided in connector 34.

[0052] Instead of each of the lens arrays 87a to 87d, a diffractive optical element (DEO) may be used to focus the laser beams emitted from the collimator lenses 86 onto the terminals provided on the connector.

[0053] The lens exchange mechanism 88 is connected to a control device 200 (not shown). Based on a control signal from the control device 200, the lens exchange mechanism 88 rotates clockwise or counterclockwise by a predetermined angle.

[0054] Lens arrays 87a to 87d are housed in lens exchange mechanism 88. In lens exchange mechanism 88, each of lens arrays 87a to 87d is arranged at a fixed angle (for example, 90 degrees) from an adjacent lens array. With this configuration, lens exchange mechanism 88 can rotate by a predetermined angle based on a control signal from control device 200, thereby making the lens array corresponding to the arrangement and terminal spacing of a plurality of terminals provided on the connector face the plurality of terminals.

[0055] The robot arm 100 is configured to support the laser device 80 and is connected to a control device 200 (not shown). Based on a control signal from the control device 200, the robot arm 100 moves the laser device 80 so that the laser device 80 faces the opening of a desired connector. When the robot arm 100 completes the movement of the laser device 80, it transmits a completion signal to the control device 200.

[0056] The laser device 80 may be supported by an XYZ stage instead of the robot arm 100. In this case, the XYZ stage moves the laser device 80 based on a control signal from the control device 200 so that the laser device 80 faces the opening of a desired connector.

[0057] The first infrared camera 110 is disposed so as to face the opening of one of the connectors 31 to 34 held by the holders 71 to 74. The first infrared camera 110 is connected to the control device 200. Based on a control signal from the control device 200, the first infrared camera 110 measures the amount of infrared radiation emitted from each of a plurality of terminals provided in the opposing connector, and obtains temperature information for each terminal based on the measured amount of infrared radiation.

[0058] The first infrared camera 110 acquires, for example, a temperature distribution image within the opening of the opposing connector as temperature information for each terminal. If the first infrared camera 110 includes an image processing circuit, the acquired temperature distribution image may be processed to acquire temperature data for each terminal. In this case, the first infrared camera 110 acquires the temperature data for each terminal as temperature information for each terminal.

[0059] In this embodiment, the electric wires to be inspected are electric wires 11 to 16. Therefore, the first infrared camera 110 is sequentially arranged to face the openings 32A to 34A of the connectors 32 to 34 held by the holders 72 to 74. The first infrared camera 110 sequentially acquires temperature information of the terminals 32a and 32d of the connector 32, the terminals 33b and 33e of the connector 33, and the terminals 34c and 34f of the connector 34, which are electrically connected to the other ends of the electric wires 11 to 16.

[0060] In addition, when the laser devices 80 are sequentially arranged so as to face the openings 32A to 34A of the connectors 32 to 34 held by the holders 72 to 74, the first infrared camera 110 is arranged so as to face the opening 31A of the connector 31 held by the holder 71.

[0061] 1, the first infrared camera 110, like the laser device 80, is supported by a robot arm, an XYZ stage, or the like, and can be moved so as to face the opening of a desired connector. The first infrared camera 110 is also referred to as a measuring device. Note that the number of first infrared cameras 110 is not limited to one, and multiple first infrared cameras 110 may be arranged so as to face the openings of multiple connectors, respectively.

[0062] The second infrared camera 120 is placed in a position overlooking all of the connectors 31 to 34. The second infrared camera 120 is connected to the control device 200. Based on a control signal from the control device 200, the second infrared camera 120 measures the amount of infrared radiation emitted from the openings 31A to 34A of the connectors 31 to 34, and obtains temperature distribution information within the openings 31A to 34A of the connectors 31 to 34 based on the measured amount of infrared radiation.

[0063] In this way, the second infrared camera 120 acquires temperature distribution information within the openings 31A to 34A of the connectors 31 to 34 from an angle of view that overlooks the entire jig plate 50. The temperature distribution information within the openings 31A to 34A of the connectors 31 to 34 is also referred to as temperature distribution information within the openings of all the connectors. The temperature distribution information within the openings of all the connectors is also referred to as an overhead image.

[0064] The second infrared camera 120 acquires, for example, temperature distribution images within the openings 31A to 34A of the connectors 31 to 34 as temperature distribution information within the openings of all the connectors. If the second infrared camera 120 includes an image processing circuit, the acquired temperature distribution images may be processed to acquire temperature distribution data within the openings 31A to 34A of the connectors 31 to 34. In this case, the second infrared camera 120 acquires temperature distribution data within the openings 31A to 34A of the connectors 31 to 34 as temperature distribution information within the openings of all the connectors.

[0065] The first infrared camera 110 may acquire temperature distribution information within the openings of all connectors instead of the second infrared camera 120. In this case, the first infrared camera 110 is supported by a robot arm, an XYZ stage, or the like, and moves to a position where it can overlook the connectors 31 to 34 at a predetermined timing. The number of second infrared cameras 120 is not limited to one, and multiple second infrared cameras 120 may be arranged to face the openings of multiple connectors, respectively. In this case, each second infrared camera 120 acquires temperature distribution information within the openings of the opposing connector. The second infrared camera 120 is also referred to as an auxiliary measuring device.

[0066] The shape measuring device 130 is disposed so that the first infrared camera 110 faces the opening of the opposing connector among the connectors 31 to 34 held by the holders 71 to 74. The shape measuring device 130 is connected to the control device 200. Based on a control signal from the control device 200, the shape measuring device 130 acquires shape information of each of the multiple terminals provided in the opposing connector.

[0067] The shape measuring device 130 may acquire information about the shape of each terminal by, for example, performing image processing on an image of each terminal captured using a camera. Alternatively, the shape measuring device 130 may acquire information about the shape of each terminal by using a laser microscope to perform positioning on each terminal using laser confocal or white light interference.

[0068] In this embodiment, the electric wires to be inspected are the electric wires 11 to 16. Therefore, the shape measuring device 130 is sequentially arranged so as to face the openings 32A to 34A of the connectors 32 to 34 held by the holders 72 to 74. The shape measuring device 130 sequentially acquires shape information of the terminals 32a and 32d of the connector 32, the terminals 33b and 33e of the connector 33, and the terminals 34c and 34f of the connector 34, which are electrically connected to the other ends of the electric wires 11 to 16.

[0069] 1, the shape measuring device 130, like the laser device 80, is supported by a robot arm, an XYZ stage, or the like, and can be moved so as to face the opening of a desired connector. Note that if the electrical continuity test of the electric wire to be tested does not involve testing for damage or deformation of the shape of the terminals, the shape measuring device 130 may be omitted. Note that the number of shape measuring devices 130 is not limited to one, and multiple shape measuring devices 130 may be arranged so as to face the openings of multiple connectors, respectively.

[0070] The control device 200 is connected via cables to each of the laser device 80, the robot arm 100, the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130. The control device 200 controls the operations of the laser device 80, the robot arm 100, the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130.

[0071] The terminal electrically connected to one end of the electric wire to be inspected is also called the first terminal. The connector having the first terminal therein is also called the first connector. The holder that holds the first connector is also called the first holder.

[0072] Similarly, the terminal electrically connected to the other end of the wire under test is also referred to as the "second terminal." A connector having the second terminal therein is also referred to as the "second connector." A holder that holds the second connector is also referred to as the "second holder."

[0073] In the following description, an electric wire electrically connected to a terminal onto which laser light is irradiated from laser device 80 is appropriately referred to as an electric wire to be inspected. A terminal onto which laser light is irradiated from laser device 80 is appropriately referred to as an irradiation target terminal. A terminal from which temperature information is acquired by first infrared camera 110 and shape information is acquired by shape measuring device 130 is appropriately referred to as a measurement target terminal.

[0074] As will be described later, the control device 200 performs a continuity test on the electric wire to be inspected based on the temperature information of the terminal to be measured obtained from the first infrared camera 110, the temperature distribution information within the openings of all connectors obtained from the second infrared camera 120, and the shape information of the terminal to be measured obtained from the shape measurement device 130.

[0075] [Functional configuration of the control device] Next, a functional configuration of the control device 200 will be described. Fig. 6 is a block diagram showing an example of the functional configuration of the control device 200. As shown in Fig. 6, the control device 200 includes a control unit 201, a storage unit 203, a communication unit 205, a laser device control unit 207, a first infrared camera control unit 209, a second infrared camera control unit 211, a shape measurement device control unit 213, a robot arm control unit 215, a scheduling unit 217, a calculation unit 219, a determination unit 221, and a display unit 223.

[0076] The control unit 201 controls the overall processing in the control device 200. Specifically, the control unit 201 controls the operations of the storage unit 203, the communication unit 205, the laser device control unit 207, the first infrared camera control unit 209, the second infrared camera control unit 211, the shape measurement device control unit 213, the robot arm control unit 215, the scheduling unit 217, the calculation unit 219, the determination unit 221, and the display unit 223.

[0077] The storage unit 203 stores in advance, as lens array arrangement information, the arrangement order of the lens arrays 87a to 87d and the angles between adjacent lens arrays in the lens exchange mechanism 88 of the laser device 80. The storage unit 203 stores the lens array currently facing the laser device 80 as lens array facing information.

[0078] The memory unit 203 stores in advance, as shutter information, physical shutters provided in the optical paths of the laser light emitted to each of the six terminals of each connector when the laser device 80 faces each of the connectors 31 to 34.

[0079] The storage unit 203 stores temperature information of the terminals to be measured received from the first infrared camera 110. The storage unit 203 stores temperature distribution information within the openings of all connectors received from the second infrared camera 120. The storage unit 203 stores shape information of the terminals to be measured received from the shape measurement device 130. The storage unit 203 stores a color temperature conversion table used to calculate temperature from color data included in the temperature distribution image.

[0080] The storage unit 203 stores in advance a reference value table (see FIG. 8) described later. The storage unit 203 stores in advance information on the normal shape of the terminals as reference terminal shape information. The storage unit 203 stores in advance information on the arrangement of the six terminals that each of the connectors 31 to 34 has as terminal arrangement information.

[0081] The communication unit 205 transmits control signals to each of the laser device 80, the robot arm 100, the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130. The communication unit 205 receives a completion signal from the robot arm 100. The communication unit 205 receives temperature information of the terminals to be measured from the first infrared camera 110. The communication unit 205 receives temperature distribution information within the openings of all connectors from the second infrared camera 120. The communication unit 205 receives shape information of the terminals to be measured from the shape measuring device 130.

[0082] The laser device control unit 207 controls the operation of the laser device 80. Specifically, the laser device control unit 207 transmits a control signal to the lens exchange mechanism 88 of the laser device 80 via the communication unit 205, and rotates the lens exchange mechanism 88 so that the lens array corresponding to the connector having the terminal to be irradiated therein faces the connector.

[0083] At this time, the laser device control unit 207 refers to the lens array arrangement information, lens array opposing information, and terminal arrangement information stored in the storage unit 203, and calculates the rotation angle of the lens exchange mechanism 88 required for the lens array corresponding to the connector having the terminal to be irradiated therein to face the connector. The laser device control unit 207 includes the calculated rotation angle in the control signal transmitted to the lens exchange mechanism 88.

[0084] The laser device control unit 207 transmits a control signal to the laser emitter 81 of the laser device 80 via the communication unit 205 to drive one or more laser oscillators for a predetermined time. At this time, the laser device control unit 207 includes in the control signal transmitted to the laser emitter 81 a time (period) for driving the one or more laser oscillators.

[0085] The laser device control unit 207 transmits a control signal to the optical switch device 84 of the laser device 80 via the communication unit 205 to control the output of a plurality of laser beams. At this time, the laser device control unit 207 refers to the shutter information and terminal arrangement information stored in the storage unit 203 and determines whether to open or close each physical shutter provided in the optical switch device 84 so that the laser beam is irradiated only onto the terminals to be irradiated. The laser device control unit 207 includes information on whether to open or close each physical shutter in the control signal transmitted to the optical switch device 84.

[0086] By such an operation, the laser device control unit 207 can control the laser device 80 so that the laser light is irradiated onto the target terminal for a predetermined time.

[0087] The laser device control unit 207 controls the laser device 80 so that the laser device 80 irradiates the target terminal with laser light at the timing (period) scheduled by the scheduling unit 217, as will be described later.

[0088] The laser device control unit 207 is also called a first control unit.

[0089] The first infrared camera control unit 209 controls the operation of the first infrared camera 110. Specifically, the first infrared camera control unit 209 transmits a control signal to the first infrared camera 110 via the communication unit 205 to cause the first infrared camera 110 to acquire temperature information of the terminal being measured. The first infrared camera control unit 209 causes the first infrared camera 110 to acquire temperature information of the terminal being measured before and after the laser device 80 irradiates the terminal with laser light.

[0090] At this time, if the first infrared camera 110 includes an image processing circuit, the first infrared camera control unit 209 includes information specifying the area for which the first infrared camera 110 will perform image processing in the control signal sent to the first infrared camera 110. The area for which the first infrared camera 110 will perform image processing is an area in the temperature distribution image acquired by the first infrared camera 110 that corresponds to the terminal to be measured.

[0091] The first infrared camera control unit 209 is also referred to as a second control unit and a third control unit.

[0092] The second infrared camera control unit 211 controls the operation of the second infrared camera 120. Specifically, the second infrared camera control unit 211 transmits a control signal to the second infrared camera 120 via the communication unit 205 to cause the second infrared camera 120 to acquire temperature distribution information within the openings of all connectors. The second infrared camera control unit 211 causes the second infrared camera 120 to acquire temperature distribution information within the openings of all connectors before and after the laser device 80 irradiates the laser light.

[0093] The second infrared camera control unit 211 is also referred to as a second control unit and a third control unit.

[0094] The shape measuring device control unit 213 controls the operation of the shape measuring device 130. Specifically, the shape measuring device control unit 213 transmits a control signal to the shape measuring device 130 via the communication unit 205 to cause the shape measuring device 130 to acquire shape information of the terminal to be measured.

[0095] At this time, the shape measuring device control unit 213 includes information specifying the area where the shape measuring device 130 performs shape measurement in the control signal transmitted to the shape measuring device 130. The area where the shape measuring device 130 performs shape measurement is, for example, an area corresponding to the terminal to be measured in the image captured by the camera.

[0096] The shape measuring device control section 213 is also called a fourth control section.

[0097] The robot arm control unit 215 controls the operation of the robot arm 100. Specifically, the robot arm control unit 215 transmits a control signal to the robot arm 100 via the communication unit 205 to move the laser device 80 so that the laser device 80 faces the opening of a desired connector.

[0098] The scheduling unit 217 schedules the timing at which the laser device 80 irradiates the target terminal with laser light.

[0099] When a laser beam is irradiated onto a terminal to be irradiated, the terminal absorbs the laser and generates heat. The heat generated at the terminal to be irradiated is conducted by the electric wire to be inspected. This causes a temperature change (temperature rise) at the terminal to be measured that is electrically connected to the electric wire to be inspected.

[0100] The worker acquires in advance, as a reference value, the value of the temperature change (temperature rise at the other end) that is estimated to occur when one end of each conducting electric wire is irradiated with laser light for a predetermined time at the other end of each electric wire. The worker associates the acquired reference value (temperature rise at the other end) of each electric wire with the identification information of each electric wire and stores it in the memory unit 203 of the control device 200 as a reference value table.

[0101] FIG. 7A is a diagram showing parameters that determine the reference value of an electric wire. FIG. 7B is a diagram showing physical properties that determine the reference value of an electric wire. As shown in FIG. 7A and FIG. 7B, when the conductor of the electric wire is copper (density 8.96 g / cm 3 , specific heat 385J / kg℃) and the cross-sectional area of ​​the wire is 0.519mm 2 If the length of the electric wire is 1 m, the laser output is 100 W, the irradiation time is 1 s, and the laser absorption rate is 0.05, the reference value (temperature rise at the other end) of the electric wire is 2.79°C.

[0102] Since the temperature resolution of a typical infrared camera is about 0.05°C, as described below, the judgment unit 221 can determine whether or not there has been a change in the temperature of the terminal being measured from the difference in temperature of the terminal being measured acquired by the first infrared camera 110 before and after the laser device 80 irradiates the terminal being measured with laser light.

[0103] In this way, the temperature rise (reference value) at the other end of each electric wire that is estimated to occur when one end of each electric wire is irradiated with laser light is determined by the wire length, wire diameter, and material of the electric wire, the laser output, the irradiation time, and the laser absorption rate. Therefore, the worker refers to the wire length, wire diameter, and material of each electric wire and, through measurements, obtains in advance as a reference value the value of the temperature change at the other end of each electric wire that is estimated to occur when one end of each electric wire is irradiated with laser light for a predetermined time.

[0104] When obtaining the reference value of each electric wire, terminals may be electrically connected to one end and the other end of each electric wire.

[0105] Fig. 8 is a diagram showing an example of a reference value table. As shown in Fig. 8, in the reference value table, the reference value Ta of the electric wire 11, the reference value Tb of the electric wire 12, and the reference value Tc of the electric wire 13 are linked to the identification number A of the electric wire 11, the identification number B of the electric wire 12, and the identification number C of the electric wire 13, respectively. In addition, in the reference value table, the reference value Td of the electric wire 14, the reference value Te of the electric wire 15, and the reference value Tf of the electric wire 16 are linked to the identification number D of the electric wire 14, the identification number E of the electric wire 15, and the identification number F of the electric wire 16, respectively.

[0106] Here, if the wire lengths, wire diameters, and materials of two or more electric wires to be inspected are equivalent, the reference values ​​of these electric wires are equivalent. For example, if two or more first terminals electrically connected to two or more electric wires to be inspected are provided inside the same connector and two or more second terminals are provided inside the same other connector, the wire lengths of these electric wires will be the same. Therefore, if the wire diameters and materials of these electric wires are equivalent, it is estimated that when laser light is irradiated onto the two or more first terminals for a predetermined period of time, the temperature change values ​​of the two or more second terminals will be equivalent.

[0107] In this case, if the spatial resolution of the first infrared camera 110 is low, there is a possibility that two or more other terminals may not be distinguishable from one another in the temperature distribution image acquired by the first infrared camera 110.

[0108] Therefore, if the difference in the reference values ​​of two or more electric wires to be inspected is within a predetermined range in the reference value table, the scheduling unit 217 schedules the irradiation of laser light to the terminals to be irradiated that are electrically connected to these electric wires at different times.

[0109] Specifically, the scheduling unit 217 refers to the reference value table, and when it determines that the difference between the reference value of each electric wire and the reference value of another electric wire is within a predetermined range, it determines that these reference values ​​are equivalent. In this case, the scheduling unit 217 schedules the period (first period) during which the laser light is irradiated onto the terminals to be irradiated that are electrically connected to each electric wire so as not to overlap with the period (second period) during which the laser light is irradiated onto the terminals to be irradiated that are electrically connected to the other electric wires.

[0110] The scheduling unit 217 refers to the reference value table, and when it determines that the difference between the reference value of each electric wire and the reference value of another electric wire is not within a predetermined range, it determines that these reference values ​​are different. In this case, the scheduling unit 217 schedules the period (first period) during which the laser light is irradiated onto the terminals to be irradiated that are electrically connected to each electric wire, so that it overlaps with the period (second period) during which the laser light is irradiated onto the terminals to be irradiated that are electrically connected to the other electric wires.

[0111] Such scheduling makes it possible to prevent two or more terminals to be measured that are provided inside the same connector from experiencing the same temperature rise at the same timing (period).

[0112] Furthermore, with this scheduling, for example, if two electric wires to be inspected have the same wire diameter and material but different wire lengths, the reference values ​​for these electric wires will be different. Therefore, laser light is irradiated at the same timing (period) to two terminals to be irradiated that are electrically connected to these electric wires. Of these electric wires, the temperature rise of the terminal to be measured that is electrically connected to the shorter electric wire is higher than the temperature rise of the terminal to be measured that is electrically connected to the longer electric wire. Therefore, the two terminals to be measured can be distinguished from each other in the temperature distribution image acquired by the first infrared camera 110.

[0113] In addition, the laser output is adjusted so that the temperature change of the terminal to be measured is several times or more the temperature resolution of the first infrared camera 110, so that even for the wire with the lowest reference value among the multiple wires, the temperature change of the terminal to be measured can be obtained based on the temperature distribution image acquired by the first infrared camera 110.

[0114] Fig. 9 is a diagram showing an example of the timing of laser light irradiation. As shown in Fig. 9, when the electric wires to be inspected are the electric wires 11 to 16, for example, three cases are possible. In the first case, the reference values ​​Ta to Tf of the electric wires 11 to 16 are all different. In this case, the scheduling unit 217 schedules the laser light to be irradiated to the terminals 31a to 31f electrically connected to one ends of the electric wires 11 to 16 at the same timing (period P1).

[0115] In the second case, the reference values ​​Ta to Te of the electric wires 11 to 15 are different, but the reference values ​​Ta and Tf of the electric wires 11 and 16 are equivalent. In this case, the scheduling unit 217 schedules the irradiation of laser light to terminals 31a to 31e electrically connected to one end of the electric wires 11 to 15 at the same timing (period P1). The scheduling unit 217 schedules the irradiation of laser light to terminal 31f electrically connected to one end of the electric wire 16 at a timing (period P2) different from period P1.

[0116] In the third case, the reference values ​​Ta to Tf of the electric wires 11 to 16 are all equal. In this case, the scheduling unit 217 schedules the irradiation of laser light to the terminals 31a to 31f electrically connected to one ends of the electric wires 11 to 16 at different timings (periods P1 to P6).

[0117] In this embodiment, the terminal 32a electrically connected to the other end of the electric wire 11 and the terminal 32d electrically connected to the other end of the electric wire 14 are provided inside the same connector 32, and therefore the reference values ​​Ta and Td of the electric wires 11 and 14 are equivalent. Similarly, the reference values ​​Tb and Te of the electric wires 12 and 15 are equivalent, and the reference values ​​Tc and Tf of the electric wires 13 and 16 are equivalent. For this reason, the scheduling unit 217 schedules the laser light irradiation at different times for the terminals 31a, 31b, and 31c electrically connected to one ends of the electric wires 11, 12, and 13 and the terminals 31d, 31e, and 31f electrically connected to one ends of the electric wires 14, 15, and 16. This makes it possible to prevent two terminals to be measured provided inside the same connector from experiencing the same temperature rise at the same time (period).

[0118] The calculation unit 219 reads, from the storage unit 203, temperature information (first temperature information) of the terminal to be measured, which is acquired by the first infrared camera 110, before the laser device 80 irradiates the terminal to be measured, which is electrically connected to the electric wire to be inspected, with laser light for a predetermined time. When the temperature information of the terminal to be measured is a temperature distribution image, the calculation unit 219 refers to the color temperature conversion table stored in the storage unit 203 and calculates the temperature (first temperature) of a region in the temperature distribution image corresponding to the terminal to be measured. On the other hand, when the temperature information of the terminal to be measured is temperature data, the calculation unit 219 reads the temperature (first temperature) of the terminal to be measured from the temperature data. In this way, the calculation unit 219 acquires the first temperature of the terminal to be measured based on the first temperature information.

[0119] Similarly, the calculation unit 219 reads from the storage unit 203 temperature information (second temperature information) of the terminal to be measured, which is acquired by the first infrared camera 110 after the laser device 80 has irradiated the terminal to be measured, which is electrically connected to the electric wire to be inspected, with laser light for a predetermined period of time. When the temperature information of the terminal to be measured is a temperature distribution image, the calculation unit 219 refers to the color temperature conversion table stored in the storage unit 203 and calculates the temperature (second temperature) of a region in the temperature distribution image corresponding to the terminal to be measured. On the other hand, when the temperature information of the terminal to be measured is temperature data, the calculation unit 219 reads the temperature (second temperature) of the terminal to be measured from the temperature data. In this way, the calculation unit 219 acquires the second temperature of the terminal to be measured based on the second temperature information.

[0120] The calculation unit 219 calculates the temperature change value (temperature rise value) of the terminal to be measured based on the difference between the first temperature and the second temperature. Specifically, the calculation unit 219 acquires the difference value obtained by subtracting the first temperature from the second temperature as the temperature rise value of the terminal to be measured.

[0121] The determination unit 221 determines the continuity state of the electric wire being inspected based on the temperature change value of the terminal being measured calculated by the calculation unit 219 and the reference value of the electric wire being inspected. Specifically, the determination unit 221 determines that the electric wire being inspected is conductive if the difference between the temperature change value of the terminal being measured and the reference value of the electric wire being inspected is within an allowable range. If the difference between the temperature change value of the terminal being measured and the reference value of the electric wire being inspected is not within an allowable range, the determination unit 221 determines that the electric wire being inspected is not conductive, i.e., that there is a defect in the electric wire being inspected.

[0122] The determination unit 221 reads from the storage unit 203 temperature distribution information (first temperature distribution information) within the openings of all connectors acquired by the second infrared camera 120 before the laser device 80 irradiates the terminals to be irradiated that are electrically connected to the electric wire to be inspected with laser light for a predetermined time. The determination unit 221 reads from the storage unit 203 temperature distribution information (second temperature distribution information) within the openings of all connectors acquired by the second infrared camera 120 after the laser device 80 irradiates the terminals to be irradiated that are electrically connected to the electric wire to be inspected with laser light for a predetermined time.

[0123] The determination unit 221 compares the first temperature distribution information with the second temperature distribution information to determine whether a temperature change is detected in areas other than those corresponding to the terminals of the measurement target within the openings of all connectors. After determining that the electric wire to be inspected is conductive, if the determination unit 221 does not detect a temperature change in areas other than those corresponding to the terminals of the measurement target, the determination unit 221 determines that the electric wire to be inspected is not short-circuited. On the other hand, after determining that the electric wire to be inspected is not conductive, if the determination unit 221 does not detect a temperature change in areas other than those corresponding to the terminals of the measurement target, the determination unit 221 determines that the electric wire to be inspected is open-circuited. If the determination unit 221 detects a temperature change in areas other than those corresponding to the terminals of the measurement target, the determination unit 221 determines that the electric wire to be inspected is short-circuited.

[0124] The determination unit 221 reads shape information of the terminals to be measured, which is acquired by the shape measuring device 130, from the storage unit 203. The determination unit 221 reads reference terminal shape information from the storage unit 203. The determination unit 221 compares the shape information of the terminals to be measured with the reference terminal shape information to determine whether or not there is a change in the shape of the terminals to be measured. If there is a difference between the shape information of the terminals to be measured and the reference terminal shape information, the determination unit 221 determines that there is a change in the shape of the terminals to be measured. If there is no difference between the shape information of the terminals to be measured and the reference terminal shape information, the determination unit 221 determines that there is no change in the shape of the terminals to be measured.

[0125] The display unit 223 displays the various determination results of the determination unit 221.

[0126] [Control device hardware configuration] Next, the hardware configuration of the control device 200 will be described. Fig. 10 is a diagram showing an example of the hardware configuration of the control device 200. As shown in Fig. 10, the control device 200 is configured by a computer and includes a CPU (Central Processing Unit) 301, a ROM (Read Only Memory) 303, and a RAM (Random Access Memory) 305. The control device 200 includes a storage 307, an input device 309, an output device 311, and an RTC (Real-Time Clock) 313. The control device 200 includes a laser device interface 315, a first infrared camera interface 317, a second infrared camera interface 319, a shape measurement device interface 321, and a robot arm interface 323.

[0127] The CPU 301 executes a program stored in the ROM 303. The CPU 301 performs arithmetic processing on data loaded into the RAM 305 in accordance with the program, and comprehensively controls each unit of the control device 200. The CPU is also called a processor.

[0128] The ROM 303 stores programs and the like to be executed by the CPU 301. In this embodiment, the ROM 303 stores at least a program for controlling the inspection procedure, which will be described later. The RAM 305 temporarily stores calculation data when the CPU 301 executes the programs stored in the ROM 303. The ROM and RAM are also referred to as non-volatile memory and volatile memory, respectively.

[0129] The storage 307 stores lens array arrangement information, shutter information, a reference value table, reference terminal shape information, terminal arrangement information, a color temperature conversion table, etc. The CPU 301 controls reading and writing of data from and to the storage 307 in accordance with a program stored in the ROM 303. The storage 307 is, for example, a hard disk drive (HDD) or a solid state drive (SSD), and the storage 307 may be a combination of an HDD and an SSD. The storage 307 may also be provided as a database outside the control device 200.

[0130] The input device 309 is, for example, a touch panel, and inputs various information to the control device 200. The output device 311 is, for example, a display, and outputs various information from the control device 200. For example, the output device 311 displays various determination results of the determination unit 221. The RTC 313 generates time information used by the control device 200.

[0131] The laser device interface 315 is connected to the laser device 80. The CPU 301 communicates with the laser device 80 via the laser device interface 315. The first infrared camera interface 317 is connected to the first infrared camera 110. The CPU 301 communicates with the first infrared camera 110 via the first infrared camera interface 317.

[0132] The second infrared camera interface 319 is connected to the second infrared camera 120. The CPU 301 communicates with the second infrared camera 120 via the second infrared camera interface 319. The shape measurement device interface 321 is connected to the shape measurement device 130. The CPU 301 communicates with the shape measurement device 130 via the shape measurement device interface 321. The robot arm interface 323 is connected to the robot arm 100. The CPU 301 communicates with the robot arm 100 via the robot arm interface 323.

[0133] The control device 200 may further include an external interface (not shown), which is connected to an auxiliary storage device such as a memory card.

[0134] [Inspection Procedure] Next, an explanation will be given of the inspection procedure in the continuity inspection system 40. Specifically, the inspection procedure will be explained using as an example a case where the electric wire to be inspected, the terminal to be irradiated, and the terminal to be measured are the electric wire 11, the terminal 31a electrically connected to one end of the electric wire 11, and the terminal 32a electrically connected to the other end of the electric wire 11, respectively.

[0135] In the laser device 80, the six lenses of the lens array 87a face the terminals 31a to 31f of the connector 31, and the first infrared camera 110 and the shape measuring device 130 face the opening 32A of the connector 32.

[0136] 11A and 11B are flow diagrams showing an example of an inspection procedure in the continuity inspection system 40. As shown in Fig. 11A, in step S1, the control device 200 acquires temperature information of the terminals 32a of the connector 32 from the first infrared camera 110, and acquires temperature distribution information (bird's-eye view images) within the openings of all the connectors from the second infrared camera 120.

[0137] Specifically, the first infrared camera control unit 209 transmits a control signal to the first infrared camera 110 to cause it to acquire temperature information of the terminal 32a. When the first infrared camera 110 acquires the temperature information of the terminal 32a, the first infrared camera 110 transmits the acquired temperature information to the control device 200. When the first infrared camera control unit 209 receives the temperature information of the terminal 32a from the first infrared camera 110, the first infrared camera control unit 209 stores the received temperature information in the storage unit 203 as first temperature information of the terminal 32a.

[0138] The second infrared camera control unit 211 transmits a control signal to the second infrared camera 120 to cause it to acquire temperature distribution information within the openings of all of the connectors. After acquiring the temperature distribution information within the openings of all of the connectors, the second infrared camera 120 transmits the acquired temperature distribution information to the control device 200. Upon receiving the temperature distribution information within the openings of all of the connectors from the second infrared camera 120, the second infrared camera control unit 211 stores the received temperature distribution information in the storage unit 203 as first temperature distribution information within the openings of all of the connectors.

[0139] In step S3, the control device 200 controls the laser device 80 so that the laser device 80 irradiates the terminal 31a of the connector 31 with laser light for a predetermined time.

[0140] Specifically, the laser device control unit 207 transmits control information to the laser emitter 81 and the optical switch device 84 at the timing (period) scheduled by the scheduling unit 217. Upon receiving a control signal from the laser device control unit 207, the laser emitter 81 reads the time for driving one or more laser oscillators from the control signal, and drives the one or more laser oscillators for that time.

[0141] When the optical switch device 84 receives a control signal from the laser device control unit 207, it reads the opening / closing information of the physical shutter from the control signal, and based on the opening / closing information, opens the physical shutter provided in the optical path of the laser light irradiated to the terminal 31a of the connector 31, and closes all physical shutters provided in the optical paths of the other laser lights.

[0142] In step S5, the control device 200 acquires temperature information of the terminals 32a of the connector 32 from the first infrared camera 110, acquires temperature distribution information within the openings of all connectors from the second infrared camera 120, and acquires shape information of the terminals 32a of the connector 32 from the shape measurement device 130.

[0143] Specifically, when a predetermined time has elapsed since the laser device control unit 207 sent a control signal to the laser emitter 81, the first infrared camera control unit 209, the second infrared camera control unit 211, and the shape measurement device control unit 213 send control signals to the first infrared camera 110, the second infrared camera 120, and the shape measurement device 130, respectively.

[0144] When the first infrared camera control unit 209 receives temperature information of terminal 32a from the first infrared camera 110 by the same operation as in step S1, it stores the received temperature information as second temperature information of terminal 32a in the storage unit 203. When the second infrared camera control unit 211 receives temperature distribution information within the openings of all connectors from the second infrared camera 120 by the same operation as in step S1, it stores the received temperature distribution information in the storage unit 203 as second temperature distribution information within the openings of all connectors.

[0145] When the shape measuring device 130 acquires the shape information of the terminal 32a, it transmits the acquired shape information to the control device 200. When the shape measuring device control unit 213 receives the shape information of the terminal from the shape measuring device 130, it stores the received shape information in the storage unit 203.

[0146] In step S7, the control device 200 calculates the value of the temperature change of the terminal 32a. Specifically, the calculation unit 219 reads the first temperature information and the second temperature information of the terminal 32a from the storage unit 203, and calculates the value of the temperature change of the terminal 32a based on the first temperature information and the second temperature information.

[0147] In step S9, the control device 200 calculates the difference between the reference value associated with the electric wire 11 and the value of the temperature change of the terminal 32a calculated in step S7. Specifically, the determination unit 221 reads the reference value associated with the electric wire 11 from the storage unit 203, and calculates the difference between the reference value associated with the electric wire 11 and the value of the temperature change of the terminal 32a calculated by the calculation unit 219.

[0148] 11B, in step S11, the control device 200 determines whether the difference calculated in step S9 is within an allowable range. Specifically, the determination unit 221 determines whether the calculated difference is within an allowable range.

[0149] If the control device 200 determines that the difference calculated in step S9 is within the allowable range, the process proceeds to step S13. In step S13, the control device 200 performs a continuity determination. Specifically, if the determination unit 221 determines that the calculated difference is within the allowable range, the determination unit 221 determines that the electric wire 11 is conductive. After performing the continuity determination in step S13, the control device 200 proceeds to step S17.

[0150] On the other hand, if the control device 200 determines that the difference calculated in step S9 is not within the allowable range, the process proceeds to step S15. In step S15, the control device 200 performs a malfunction determination. Specifically, if the determination unit 221 determines that the calculated difference is not within the allowable range, the determination unit 221 determines that the electric wire 11 is not conducting, that is, that there is a malfunction in the electric wire 11. If the control device 200 performs a malfunction determination in step S15, the process proceeds to step S23.

[0151] In step S17, the control device 200 determines whether or not a temperature change has been detected in any area within the openings of all connectors other than the area corresponding to the terminals 32a. Specifically, the determination unit 221 reads the first temperature distribution information and the second temperature distribution information within the openings of all connectors from the storage unit 203 and compares the first temperature distribution information with the second temperature distribution information. Based on this comparison, the determination unit 221 determines whether or not a temperature change has been detected in any area within the openings of all connectors other than the area corresponding to the terminals 32a.

[0152] If the control device 200 determines in step S17 that no temperature change has been detected in any area within the frontage of the connector other than the area corresponding to the terminal 32a, the control device 200 proceeds to step S19. In step S19, the control device 200 performs a non-short circuit determination. Specifically, if the determination unit 221 determines that no temperature change has been detected in any area other than the area corresponding to the terminal 32a, the control device 200 determines that the wire 11 is not short-circuited. If the control device 200 performs a non-short circuit determination in step S19, the control device 200 proceeds to step S27.

[0153] On the other hand, if the control device 200 determines in step S17 that a temperature change has been detected in an area other than the area corresponding to the terminal 32a within the frontage of all connectors, the control device 200 proceeds to step S21. In step S21, the control device 200 performs a short-circuit determination. Specifically, if the determination unit 221 determines that a temperature change has been detected in an area other than the area corresponding to the terminal 32a, the control device 200 determines that the electric wire 11 is short-circuited. If the control device 200 performs a short-circuit determination in step S21, the control device 200 proceeds to step S27.

[0154] In step S23, the control device 200 determines whether or not a temperature change has been detected in any area of ​​the openings of all connectors other than the area corresponding to the terminal 32a, as in step S17. If the control device 200 determines in step S23 that a temperature change has not been detected in any area of ​​the openings of all connectors other than the area corresponding to the terminal 32a, the process proceeds to step S25. In step S25, the control device 200 performs a wire break determination. Specifically, if the determination unit 221 determines that a temperature change has not been detected in any area other than the area corresponding to the terminal 32a, the control device 200 determines that the wire 11 is broken. If the control device 200 performs a wire break determination in step S25, the process proceeds to step S27. On the other hand, if the control device 200 determines in step S23 that a temperature change has been detected in any area of ​​the openings of all connectors other than the area corresponding to the terminal 32a, the process proceeds to step S21 described above.

[0155] In step S27, the control device 200 determines whether or not there is a deformation in the terminal 32a of the connector 32. Specifically, the determination unit 221 reads the shape information of the terminal 32a and the reference terminal shape information from the storage unit 203, and compares the shape information of the terminal 32a with the reference terminal shape information. Based on this comparison, the determination unit 221 determines whether or not there is a change in the shape of the terminal 32a.

[0156] If the control device 200 determines in step S27 that there is no change in the shape of the terminal 32a, the process proceeds to step S29. In step S29, the control device 200 performs a shape normality determination. Specifically, if the determination unit 221 determines that there is no difference between the shape information of the terminal 32a and the reference terminal shape information, it determines that there is no change in the shape of the terminal 32a. After performing the shape normality determination in step S29, the control device 200 displays these determination results and ends the inspection procedure.

[0157] On the other hand, if the control device 200 determines in step S27 that there is a change in the shape of the terminal 32a, the process proceeds to step S31. In step S31, the control device 200 performs a shape abnormality determination. Specifically, if the determination unit 221 determines that there is a difference between the shape information of the terminal 32a and the reference terminal shape information, the control device 200 determines that there is a change in the shape of the terminal 32a. After performing the shape abnormality determination in step S31, the control device 200 displays the determination results and ends the inspection procedure.

[0158] [Actions and Effects] According to this embodiment, the continuity inspection system 40 inspects the continuity state of the electric wires 11 included in the wire harness 1, and includes a holder 71, a holder 72, a laser device 80, a first infrared camera 110, and a control device 200. The holder 71 holds a connector 31 having therein a terminal 31a electrically connected to one end of the electric wire 11 to be inspected. The holder 72 holds a connector 32 having therein a terminal 32a electrically connected to the other end of the electric wire 11 to be inspected.

[0159] The laser device 80 is disposed opposite the connector 31 held by the holder 71, and selectively irradiates the target terminals 31a with laser light. The first infrared camera 110 is disposed opposite the connector 32 held by the holder 72, and acquires temperature information of the target terminals 32a. The control device 200 controls the laser device 80 and the first infrared camera 110.

[0160] The connector 31 has a plurality of terminals 31a to 31f including the terminal 31a. The plurality of terminals 31a to 31f are electrically connected to a plurality of electric wires 11 to 16 including the electric wire 11 to be inspected, respectively. The control device 200 includes a storage unit 203, a communication unit 205, a laser device control unit 207, a first infrared camera control unit 209, a calculation unit 219, and a determination unit 221.

[0161] The storage unit 203 stores, as a reference value, a value of a temperature change at the other end of each of the conductive electric wires 11 to 16 that is estimated to occur when a laser beam is irradiated onto one end of each of the electric wires 11 to 16 for a predetermined time, in association with the identification information of each of the electric wires 11 to 16. The laser device control unit 207 controls the laser device 80 so as to irradiate the laser beam onto the terminal 31a to be irradiated for a predetermined time.

[0162] The first infrared camera control unit 209 controls the first infrared camera 110 to acquire first temperature information of the terminal 32a to be measured before the terminal 31a to be irradiated with laser light. The first infrared camera control unit 209 controls the first infrared camera 110 to acquire second temperature information of the terminal 32a to be measured after the terminal 31a to be irradiated with laser light for a predetermined period of time.

[0163] The communication unit 205 receives the first temperature information and the second temperature information from the first infrared camera 110. The calculation unit 219 calculates a temperature change value of the terminal 32a to be measured based on the first temperature information and the second temperature information. The determination unit 221 determines the continuity state of the electric wire 11 to be inspected based on the temperature change value of the terminal 32a to be measured and a reference value associated with the electric wire 11 to be inspected.

[0164] With this configuration, the electrical continuity of the electric wire to be inspected can be inspected in a non-contact manner without contacting the external terminals for inspection with the terminals to be irradiated and the terminals to be measured, which are electrically connected to the electric wire to be inspected, thereby reducing the burden on the operator.

[0165] In this way, the continuity test system 40 can easily perform the continuity test of the wire harness 1 while reducing the burden on the worker.

[0166] Furthermore, since there is no need to bring the external terminals for testing into contact with the terminals to be irradiated and the terminals to be measured that are electrically connected to the electric wire to be tested, deformation and damage to the terminals of the connector due to contact with the external terminals can be avoided.

[0167] In a conventional continuity test system, the continuity of a wire is tested by applying a voltage to one end of the wire while the external terminals of the test device are in contact with the terminals of connectors provided at both ends of the wire, and determining whether the applied voltage is detected at the other end of the wire. To configure a circuit for applying such a voltage, back wiring is required to electrically connect the external terminals of the test device.

[0168] However, the continuity test system 40 performs the continuity test of the wire harness without contact, eliminating the need for back wiring and enabling the system to be simplified and lightweight. This allows the continuity test of the wire harness to be performed on the production line (for example, on a conveyor). This reduces the effort required to move the wire harness from the production line to perform the continuity test, thereby improving production efficiency.

[0169] According to this embodiment, if the difference between the temperature change value of the terminal 32a to be measured and the reference value associated with the electric wire 11 to be inspected is within an allowable range, the determination unit 221 determines that the electric wire 11 to be inspected is conductive. If the difference between the temperature change value of the terminal 32a to be measured and the reference value associated with the electric wire 11 to be inspected is not within an allowable range, the determination unit 221 determines that the electric wire 11 to be inspected is not conductive.

[0170] With this configuration, even when the continuity test of the wire harness is performed in a non-contact manner, the continuity state of the electric wires to be tested can be easily tested.

[0171] According to this embodiment, the laser device 80 includes a laser emitter 81, an optical switch device 84, a plurality of optical fibers 85, and a lens array 87a. The plurality of optical fibers 85 guide the plurality of laser beams emitted from the laser emitter 81 to the vicinity of the plurality of terminals 31a to 31f, respectively. The lens array 87a focuses the plurality of laser beams emitted from the plurality of optical fibers 85 onto the plurality of terminals 31a to 31f, respectively. The optical switch device 84 passes, based on a control signal (first control signal) from the laser device control unit 207, the laser beam that is focused on the terminal 31a to be irradiated, and blocks the other laser beams.

[0172] With this configuration, the laser device 80 can selectively irradiate the terminal 31a to be measured with laser light with a simple configuration.

[0173] According to this embodiment, when the laser device control unit 207 determines that, for multiple electric wires 11 to 16, the difference between the reference value associated with the electric wire 11 to be inspected and the reference value associated with another electric wire to be inspected is not within a predetermined range, the laser device control unit 207 controls the laser device 80 so that the period during which laser light is irradiated onto the terminal 31a electrically connected to the electric wire 11 to be inspected overlaps with the period during which laser light is irradiated onto another terminal electrically connected to the other electric wire to be inspected.

[0174] With this configuration, the continuity test system 40 can test the continuity of a plurality of test target electric wires at the same timing (period), thereby shortening the time required for the continuity test of the wire harness 1.

[0175] According to this embodiment, when the laser device control unit 207 determines that the difference between the reference value associated with the electric wire 11 to be inspected and the reference value associated with another electric wire to be inspected is within a predetermined range for multiple electric wires 11 to 16, the laser device control unit 207 controls the laser device 80 so that the period during which laser light is irradiated onto the terminal 31a electrically connected to the electric wire 11 to be inspected does not overlap with the period during which laser light is irradiated onto other terminals electrically connected to the other electric wires to be inspected.

[0176] With this configuration, even if there are electric wires close together that experience the same temperature rise when irradiated with laser light, the continuity inspection system 40 can detect the continuity states of these electric wires individually by staggering the inspection of the continuity states of these electric wires.

[0177] Here, in order to perform a non-contact continuity test of a wire harness, a method can be considered in which electromagnetic waves with the same frequency as the resonant frequency of the electric wire being tested are emitted from the outside to cause resonance in the electric wire, and the temperature rise of the electric wire is measured.

[0178] However, with such a continuity inspection system, when multiple electric wires of the same length are present, these electric wires simultaneously resonate with electromagnetic waves emitted from outside. As a result, it is not possible to individually detect the continuity status of these electric wires. On the other hand, with the continuity inspection system 40, even when multiple electric wires of the same length are present, the continuity status of these electric wires can be individually detected by staggering the inspection of the continuity status of these electric wires.

[0179] According to this embodiment, the continuity inspection system 40 further includes a second infrared camera 120. The second infrared camera 120 is disposed in a position overlooking all of the connectors 31 to 34 provided in the wire harness 1, and acquires temperature distribution information within the openings 31A to 34A of all of the connectors 31 to 34. The second infrared camera control unit 211 controls the second infrared camera 120 to acquire first temperature distribution information within the openings 31A to 34A of all of the connectors 31 to 34 before irradiating the laser light onto the terminal 31a to be irradiated.

[0180] The second infrared camera control unit 211 controls the second infrared camera 120 to acquire second temperature distribution information within the openings 31A to 34A of all connectors 31 to 34 after the target terminals 31a have been irradiated with laser light for a predetermined period of time. The communication unit 205 receives the first temperature distribution information and the second temperature distribution information from the second infrared camera 120.

[0181] The judgment unit 221 compares the first temperature distribution information with the second temperature distribution information, and if a temperature change is detected in an area other than the area corresponding to the terminal 32a being measured within the openings 31A to 34A of all connectors 31 to 34, it judges that the electric wire being inspected is short-circuited.

[0182] With this configuration, the continuity test system 40 can determine whether the electric wire 11 to be tested has a short circuit with a simple configuration.

[0183] According to the present embodiment, the continuity inspection system 40 further includes a shape measuring device 130. The shape measuring device 130 is disposed to face the connector 32 held by the holder 72, and selectively acquires shape information of the terminals 32a to be measured. The control device 200 further includes a shape measuring device control unit 213. The shape measuring device control unit 213 controls the shape measuring device 130 to acquire the shape information of the terminals 32a to be measured.

[0184] The communication unit 205 receives the shape information of the terminal 32a from the shape measuring device 130. The determination unit 221 determines whether or not there is a change in the shape of the terminal 32a to be measured, based on the shape information of the terminal 32a to be measured.

[0185] With this configuration, the continuity test system 40 can determine the shape of the terminal to be measured with a simple configuration.

[0186] [First Modification] In the above-described embodiment, when the reference values ​​of two or more electric wires to be inspected are equivalent, the scheduling unit 217 schedules the irradiation of the laser light to the terminals to be irradiated that are electrically connected to these electric wires at different timings (periods) (see FIG. 9), but this is not limited to this.

[0187] In this modification, even if the reference values ​​of two or more electric wires to be inspected are equivalent, the scheduling unit 217 schedules the irradiation of the laser light to the terminals to be irradiated electrically connected to these electric wires at the same timing (period). In this case, the scheduling unit 217 differentiates the irradiation patterns for irradiating the terminals to be irradiated electrically connected to these electric wires with the laser light.

[0188] For example, if the reference values ​​of the three electric wires are the same, the scheduling unit 217 sets the following laser light irradiation pattern: The terminal to be irradiated, which is electrically connected to the first electric wire, is continuously irradiated with laser light. The terminal to be irradiated, which is electrically connected to the second electric wire, is irradiated with laser light for X seconds at W second intervals. The terminal to be irradiated, which is electrically connected to the third electric wire, is irradiated with laser light for Z seconds at Y second intervals. The values ​​of W to Z are determined by the temporal resolution of the first infrared camera 110.

[0189] In this way, by setting multiple irradiation patterns for intermittently irradiating the laser light, even when the laser light is irradiated at the same timing (period) to the irradiation target terminals electrically connected to the electric wires, the temperature rise patterns of the measurement target terminals electrically connected to the electric wires can be made different, thereby allowing the first infrared camera 110 to individually identify the measurement target terminals.

[0190] Fig. 12 is a diagram showing an example of a temperature rise pattern at terminals to be measured in this modification. In the example shown in Fig. 12, electric wires 11 and 13 to be inspected have the same reference value, and electric wires 11 and 15 have different reference values. In this modification, terminals 31a and 32a are electrically connected to both ends of electric wire 11, terminals 31c and 32c are electrically connected to both ends of electric wire 13, and terminals 31e and 32e are electrically connected to both ends of electric wire 15.

[0191] The laser device control unit 207 transmits a control signal to the laser device 80 at the timing (period) scheduled by the scheduling unit 217, and controls the laser device 80 to irradiate the laser light to the terminals 31a, 31c, and 31e to be irradiated that are electrically connected to the electric wires 11, 13, and 15 in various irradiation patterns.

[0192] Laser device 80 reads various irradiation patterns from the control signal, and continuously irradiates target terminals 31a and 31e with laser light for a predetermined period, and intermittently irradiates target terminal 31c with laser light for a predetermined period. As a result, as shown in Fig. 12, first infrared camera 110 acquires continuous and different temperature rises in the areas corresponding to target terminals 32a and 32e, and acquires intermittent (blinking) temperature rises in the area corresponding to target terminal 32c.

[0193] The laser device 80 intermittently irradiates the terminal 31c with laser light for a predetermined period of time by opening and closing a physical shutter provided in the optical path of the laser light irradiated to the terminal 31c of the connector 31 based on an irradiation pattern corresponding to the terminal 31c.

[0194] According to this modification, when the laser device control unit 207 determines that the difference between the reference value associated with the electric wire 11 to be inspected and the reference value associated with another electric wire to be inspected is within a predetermined range for a plurality of electric wires 11 to 16, the laser device control unit 207 controls the laser device 80 so that the period for irradiating the terminal electrically connected to the electric wire 11 to be inspected with laser light overlaps with the period for irradiating the other terminal electrically connected to the other electric wire to be inspected with laser light, and so that the irradiation pattern (first irradiation pattern) for irradiating the terminal 31a electrically connected to the electric wire 11 to be inspected with laser light is different from the irradiation pattern (second irradiation pattern) for irradiating the other terminal electrically connected to the other electric wire to be inspected with laser light.

[0195] With this configuration, the continuity test system 40 can test the continuity of multiple electric wires at the same timing (period) even if the reference values ​​of the multiple electric wires are the same, thereby further shortening the time required for the continuity test of the wire harness 1.

[0196] [Second Modification] In the above-described embodiment, the laser device 80 generates laser light using one or more laser oscillators, but is not limited to this. In this modification, laser light is generated using multiple semiconductor laser chips instead of one or more laser oscillators.

[0197] Fig. 13 is a schematic diagram of the entire configuration of a continuity inspection system 40A in this modification. As shown in Fig. 13, the continuity inspection system 40A uses a laser device 80A instead of the laser device 80. The continuity inspection system 40A has the same configuration as the continuity inspection system 40, except for the laser device 80A.

[0198] The laser device 80A includes a plurality of collimator lenses (not shown), lens arrays 87a to 87d, a lens exchange mechanism 88, and a laser head 400. The configurations of the lens arrays 87a to 87d and the lens exchange mechanism 88 have been described in the above embodiment, and therefore description thereof will be omitted in this modified example.

[0199] The laser head 400 has semiconductor laser chips 401a to 401f, which are arranged in a matrix of 2 rows and 3 columns so as to face six terminals provided on the connector, respectively.

[0200] In this modification, the electric wires to be inspected are the electric wires 11 to 16. Therefore, the semiconductor laser chips 401a to 401f face the terminals 31a to 31f provided on the connector 31, respectively.

[0201] The plurality of collimator lenses adjust the plurality of laser beams emitted from the semiconductor laser chips 401a to 401f to be parallel beams, respectively. The plurality of laser beams emitted from the plurality of collimator lenses are condensed onto the terminals 31a to 31f provided on the connector 31 by the six lenses of the lens array 87a.

[0202] The semiconductor laser chips 401a to 401f are connected to the control device 200. Each semiconductor laser chip generates a laser beam based on a control signal from the control device 200. Each laser beam has a single light intensity peak.

[0203] The laser device control unit 207 controls the output of a plurality of laser beams by transmitting control signals to the semiconductor laser chips 401a to 401f via the communication unit 205. At this time, the laser device control unit 207 refers to the terminal arrangement information and the laser chip arrangement information stored in the storage unit 203, and determines the semiconductor laser chips 401a to 401f that will generate the laser beam so that the laser beam is irradiated only onto the terminals that are the irradiation targets. The laser chip arrangement information is information regarding the arrangement of the semiconductor laser chips 401a to 401f, and is stored in advance in the storage unit 203.

[0204] According to this modification, the laser device 80A includes a lens array 87a and a laser head 400. The laser head 400 has semiconductor laser chips 401a to 401f. The lens array 87a focuses a plurality of laser beams emitted from the laser head 400 onto the terminals 31a to 31f of the connector 31, respectively. The laser device control unit 207 drives one of the semiconductor laser chips 401a to 401f that outputs laser beams that are focused onto the terminals to be irradiated, and does not drive the other semiconductor laser chips.

[0205] With this configuration, the laser device 80A can selectively irradiate each of the plurality of terminals 31a to 31f with laser light with a simpler configuration.

[0206] [Third Modification] In the above-described embodiment, the laser device 80 radiates a plurality of laser beams each having a single light intensity peak, but this is not limiting. In this modification, the laser device 80B radiates a single laser beam each having multiple light intensity peaks, instead of radiating a plurality of laser beams each having a single light intensity peak.

[0207] Fig. 14 is a schematic diagram of the entire configuration of a continuity inspection system 40B in this modified example. As shown in Fig. 14, the continuity inspection system 40B uses a laser device 80B instead of the laser device 80. The continuity inspection system 40B has the same configuration as the continuity inspection system 40, except for the laser device 80B. Note that the robot arm 100 is not shown in Fig. 14.

[0208] The laser device 80B includes a laser emitter 501, an optical fiber cable 502, a collimator lens 503, a beam expander 504, a spatial phase modulator 505, and a condenser lens 506.

[0209] The laser emitter 501 has a single laser oscillator. The laser oscillator is connected to the control device 200. The laser oscillator generates a single laser beam based on a control signal from the control device 200. The laser emitter 81 emits the single laser beam generated by the laser oscillator. The single laser beam has a single light intensity peak.

[0210] Optical fiber cable 502 guides the single laser beam emitted from laser emitter 501 to collimator lens 503 arranged near terminals 31a to 31f. Collimator lens 503 adjusts the single laser beam emitted from the end of optical fiber cable 502 to become a parallel beam. Beam expander 504 expands the diameter of the single laser beam emitted from collimator lens 503 and outputs it to spatial phase modulator 505.

[0211] The spatial phase modulator 505 is connected to the control device 200. Based on a control signal from the control device 200, the spatial phase modulator 505 generates a light pattern corresponding to the arrangement pattern of the terminals to be irradiated, from the single laser light emitted from the beam expander 504.

[0212] The spatial phase modulator 505 can arbitrarily control the phase of the laser light in two dimensions by controlling the liquid crystal using a chip with CMOS electrodes, etc. Therefore, the spatial phase modulator 505 changes the optical pattern of a single laser light having a single optical intensity peak (Gaussian distribution) into an optical pattern of a single laser light having multiple optical intensity peaks corresponding to the number of terminals to be irradiated.

[0213] The condenser lens 506 condenses the single laser beam emitted from the spatial phase modulator 505 so that the condensing point of the light intensity peak of the single laser beam is positioned on the terminal to be irradiated. The condenser lens 506 is also called a condensing member.

[0214] The laser device control unit 207 sends a control signal to the laser oscillator via the communication unit 205 to drive a single laser beam for a predetermined time. The laser device control unit 207 also sends a control signal to the spatial phase modulator 505 via the communication unit 205 to change the light pattern of a single laser beam having a single light intensity peak to a light pattern of a single laser beam having multiple light intensity peaks. At this time, the laser device control unit 207 references the terminal arrangement information stored in the storage unit 203 and determines the light pattern so that the light intensity peak of the single laser beam is irradiated only onto the terminal to be irradiated that is electrically connected to the electric wire to be inspected. The laser device control unit 207 includes information about the determined light pattern in the control signal sent to the spatial phase modulator 505.

[0215] According to this modification, the laser device 80B includes a laser emitter 501, an optical fiber cable 502, a spatial phase modulator 505, and a condenser lens 506. The optical fiber cable 502 guides the single laser beam emitted from the laser emitter 501 to the vicinity of the terminals 31a to 31f. The spatial phase modulator 505 controls the phase of the single laser beam emitted from the optical fiber cable based on a control signal (second control signal) from the laser device control unit 207 so as to form a light pattern corresponding to the arrangement pattern of the terminals to be irradiated. The condenser lens 506 condenses the single laser beam so that the focal point of the light intensity peak of the single laser beam emitted from the spatial phase modulator 505 is located at the terminal to be irradiated.

[0216] With this configuration, the laser device 80B can selectively irradiate each of the plurality of terminals 31a to 31f with laser light with a simpler configuration.

[0217] [Other variations] In the above-described embodiment, each of the connectors 31 to 34 has six terminals arranged in a matrix of two rows and three columns, but this is not limiting. The connectors 31 to 34 may have different numbers of terminals.

[0218] In this case, the number of optical fibers 85 of the laser device 80 is prepared according to the maximum number of terminals among the multiple terminals that each of the connectors 31 to 34 has. If the number of optical fibers 85 is greater than the number of terminals that the connectors have, the control device 200 controls the optical switch device 84 so as not to emit laser light from the optical fibers 85 that do not face any terminal. The same applies to the semiconductor laser chips 401a to 401f of the second modified example.

[0219] In the above-described embodiment, the direction in which the laser device 80 emits laser light and the observation directions of the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130 are perpendicular to the surface of the jig plate 50, but this is not limiting. The direction in which the laser device 80 emits laser light and the observation directions of the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130 may also be horizontal to the surface of the jig plate 50.

[0220] In this case, the connectors 31 to 34 are fixed by holders 71 to 74 so that they face horizontally. The laser device 80, the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130 are each supported by an independent robot arm. Therefore, each robot arm is used to adjust the laser device 80, the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130 so that they are oriented horizontally with respect to the surface of the jig plate 50.

[0221] In the above-described embodiment, the surface of the jig plate 50 is flat, but this is not limiting. The surface of the jig plate 50 may be three-dimensional. In this case, the laser device 80, the first infrared camera 110, the second infrared camera 120, and the shape measuring device 130 are each supported by an independent robot arm, and therefore can be adjusted to irradiate laser light in any direction and capture images with the infrared camera.

[0222] Although the present embodiment has been described above, the present embodiment is not limited to this, and various modifications are possible within the scope of the gist of the present embodiment. [Explanation of symbols]

[0223] 1 Wire harness 11~16 Electric wire 31~34 Connectors 32A~34A Frontage 31a~31f terminals 32a, 32d, 33b, 33e, 34c, 34f terminals 71,72 Holder 80, 80A, 80B laser device 81 Laser emitter 84 Optical Switching Device 85 Optical Fiber 87a Lens array 110 First Infrared Camera 120 Second infrared camera 130 Shape measuring device 200 control device 203 Storage section 205 Communications Department 207 Laser device control unit 209 1st infrared camera control unit 211 Second infrared camera control unit 213 Shape measuring device control section 219 Calculation Unit 221 Judgment section 400 laser head 401a~401f Semiconductor laser chip 501 Laser emitter 502 Fiber Optic Cable 505 Spatial Phase Modulator 506 Condenser Lens

Claims

1. A continuity inspection system for inspecting the continuity of electric wires included in a wire harness, a first holder for holding a first connector having a first terminal therein electrically connected to one end of the electric wire to be inspected; a laser device that is disposed to face the first connector held by the first holder and that selectively irradiates the first terminals with laser light; a second holder for holding a second connector having a second terminal therein electrically connected to the other end of the electric wire to be inspected; a measuring device that is disposed to face the second connector held by the second holder and that acquires temperature information of the second terminal; a control device that controls the laser device and the measurement device; Equipped with the first connector has a plurality of terminals including the first terminal, the plurality of terminals are electrically connected to a plurality of electric wires including the electric wire to be inspected, The control device a storage unit that stores, as a reference value, a value of a temperature change at one end of each of the conductive electric wires that is estimated to occur when the laser light is irradiated onto the other end of the electric wires for a predetermined period of time, in association with identification information of the electric wires; a first control unit that controls the laser device so as to irradiate the first terminal with the laser light for the predetermined period of time; a second control unit that controls the measurement device to acquire first temperature information of the second terminal before the laser light is irradiated onto the first terminal; a third control unit that controls the measurement device to acquire second temperature information of the second terminal after the first terminal has been irradiated with the laser light for the predetermined time; a communication unit that receives the first temperature information and the second temperature information from the measurement device; a calculation unit that calculates a value of a temperature change of the second terminal based on the first temperature information and the second temperature information; a determination unit that determines a continuity state of the electric wire to be inspected based on a value of the temperature change of the second terminal and a reference value associated with the electric wire to be inspected; A continuity inspection system comprising:

2. the determination unit determines that the electric wire to be inspected is conductive when a difference between the value of the temperature change of the second terminal and the reference value is within an allowable range; 2. The continuity test system according to claim 1, wherein the determination unit determines that the test target electric wire does not have continuity when a difference between the value of the temperature change of the second terminal and the reference value is not within the allowable range.

3. The laser device includes: a laser emitter; a plurality of optical fibers that guide the plurality of laser beams emitted from the laser emitter to the vicinity of the plurality of terminals, respectively; a focusing member that focuses the laser beams emitted from the optical fibers onto the terminals, respectively; an optical switch device that passes, based on a first control signal from the first control unit, a laser beam that is focused on the first terminal among the plurality of laser beams and blocks other laser beams; The continuity inspection system of claim 1 , comprising:

4. The laser device includes: a laser emitter; an optical fiber cable that guides the single laser beam emitted from the laser emitter to the vicinity of the plurality of terminals; a spatial phase modulator that controls the phase of the single laser light emitted from the optical fiber cable based on a second control signal from the first control unit so as to form a light pattern corresponding to an arrangement pattern of the first terminals; a focusing member that focuses the single laser beam so that a focusing point of a light intensity peak of the single laser beam emitted from the spatial phase modulator is positioned at the first terminal; The continuity inspection system of claim 1 , comprising:

5. The laser device includes: a laser head having a plurality of semiconductor laser chips; a focusing member that focuses the plurality of laser beams emitted from the laser head onto the plurality of terminals, respectively; Equipped with 2. The continuity test system according to claim 1, wherein the first control unit drives a semiconductor laser chip among the plurality of semiconductor laser chips that outputs laser light that is focused on the first terminal, and does not drive other semiconductor laser chips.

6. 2. The continuity inspection system according to claim 1, wherein, when the first control unit determines that a difference between the reference value associated with the electric wire to be inspected and a reference value associated with another electric wire to be inspected is not within a predetermined range, the first control unit controls the laser device so that a first period during which the laser light is irradiated onto the first terminal electrically connected to the electric wire to be inspected overlaps with a second period during which the laser light is irradiated onto another terminal electrically connected to the other electric wire to be inspected.

7. 2. The continuity inspection system according to claim 1, wherein, when the first control unit determines that a difference between the reference value associated with the electric wire to be inspected and a reference value associated with another electric wire to be inspected is within a predetermined range, the first control unit controls the laser device so that a first period during which the laser light is irradiated onto the first terminal electrically connected to the electric wire to be inspected does not overlap with a second period during which the laser light is irradiated onto another terminal electrically connected to the other electric wire to be inspected.

8. 2. The continuity inspection system according to claim 1, wherein, when the first control unit determines that, for the plurality of electric wires, a difference between the reference value associated with the electric wire to be inspected and a reference value associated with another electric wire to be inspected is within a predetermined range, the first control unit controls the laser device so that a first period in which the laser light is irradiated to the first terminal electrically connected to the electric wire to be inspected overlaps with a second period in which the laser light is irradiated to another terminal electrically connected to the other electric wire to be inspected, and a first irradiation pattern in which the laser light is irradiated to the first terminal is different from a second irradiation pattern in which the laser light is irradiated to the other terminal.

9. the continuity test system further includes an auxiliary measuring device that is arranged at a position overlooking all of the connectors provided in the wire harness and that acquires temperature distribution information within the openings of all of the connectors, the second control unit controls the auxiliary measuring device to acquire first temperature distribution information within the openings of all of the connectors before irradiating the first terminals with the laser light; the third control unit controls the auxiliary measuring device to acquire second temperature distribution information within the openings of all of the connectors after the first terminals are irradiated with the laser light for the predetermined time; the communication unit receives the first temperature distribution information and the second temperature distribution information from the auxiliary measurement device; 2. The continuity inspection system according to claim 1, wherein the determination unit compares the first temperature distribution information with the second temperature distribution information, and determines that the electric wire being inspected is short-circuited if a temperature change is detected in an area other than the area corresponding to the second terminal within the openings of all of the connectors.

10. the continuity test system further includes a shape measuring device that is disposed to face the second connector held by the second holder and that selectively acquires shape information of the second terminals, the control device further includes a fourth control unit that controls the shape measuring device to acquire shape information of the second terminal; the communication unit receives shape information of the second terminal from the shape measuring device; The continuity test system according to claim 1 , wherein the determining unit determines whether or not there is a change in the shape of the second terminal based on shape information of the second terminal.

Images