Universal modular test and fixing device

Abstract

We provide improved testing equipment. [Solution] A test apparatus for supporting a sample to undergo at least one of a compression test and a tensile test comprises a spine, a first platform, a second platform including a first cavity for receiving a portion of the sample having an opening extending through a first side end face of the second platform, and a second cavity for receiving a portion of the spine, wherein the spine does not come into contact with the second cavity, and a third platform fixed to the first platform by the spine. The second platform is positioned between the first platform and the third platform and is movable relative to the first platform and the third platform.

Description

Technical Field

[0001] Embodiments of the present disclosure relate to modular test fixtures having different configurations that can be used for various mechanical tests of samples.

Background Art

[0002] Test fixtures are used to support samples during testing in a testing machine (e.g., a universal testing machine or UTM, etc.). When the samples to be tested have a similar configuration or shape (e.g., tensile test of a rod), a test fixture configured to support only samples of a similar shape (e.g., gripping a rod) is used in the testing machine. However, when performing tests on samples of different configurations and / or different types of tests (e.g., needle cap removal force test, flange fracture strength test, etc.), usually, in order to accommodate the different configurations of the samples and / or tests, the test fixture (such as a grip) supporting the sample during testing has to be replaced. It takes time to replace or reconfigure the test fixture during the test, resulting in reduced efficiency. In such cases, it is desirable to use a test fixture configured to support samples of different sizes in a configuration that can apply the desired type of force to the sample while minimizing changes to the test fixture.

Summary of the Invention

[0003] Embodiments of the present disclosure include modular test fixtures that can be easily adapted or configured to support different configurations of samples undergoing different types of tests in a testing machine. However, the scope of the present disclosure is defined by the appended claims and is not defined by the functions of solving specific problems.

[0004] The accompanying drawings, which are incorporated herein and constitute a part of this specification, illustrate exemplary embodiments of the present disclosure and, together with the description, serve to explain the principles of the present disclosure. Each of the embodiments disclosed herein may include one or more of the features described in relation to any of the other disclosed embodiments.

Brief Description of the Drawings

[0005] [Figure 1A] These are different figures of exemplary test fixtures in this disclosure. [Figure 1B] These are different figures of exemplary test fixtures in this disclosure. [Figure 1C] These are different figures of exemplary test fixtures in this disclosure. [Figure 1D] These are different figures of exemplary test fixtures in this disclosure. [Figure 2A] Figure 1A is a top view of the upper plate of the test fixture with the sample bracket removed. [Figure 2B] This figure shows the upper plate of Figure 2A with the sample brackets connected. [Figure 3] Figure 3 is a perspective view of an exemplary sample bracket. [Figure 3A] This is an exploded view of an exemplary sample bracket and upper plate. [Figure 3B] This is an exploded view of an exemplary sample bracket and upper plate. [Figure 4A] Figures 1A to 1D show different finger assemblies used in exemplary test fixtures. [Figure 4B] Figures 1A to 1D show different finger assemblies used in exemplary test fixtures. [Figure 4C] Figures 1A to 1D show different finger assemblies used in exemplary test fixtures. [Figure 5A] This is a diagram illustrating exemplary replacement parts. [Figure 5B] This is a diagram illustrating exemplary replacement parts. [Figure 5C] This is a diagram illustrating exemplary replacement parts. [Figure 5D] This is a diagram illustrating exemplary replacement parts. [Figure 5E] This is a diagram illustrating exemplary replacement parts. [Figure 6] Figure 6 shows an exemplary method of the present disclosure. [Modes for carrying out the invention]

[0006] This disclosure describes exemplary test fixtures that may be used in combination with universal testing machines (UTMs), such as Instron® testing machines. While the principles of this disclosure are described with reference to UTM test fixtures, it should be understood that the disclosure is not limited thereto. Rather, the disclosed test fixtures may be used alone or in combination with any type of apparatus or machine (for any application). Generally, relative terms such as “about,” “substantially,” or “approximately” used in this disclosure are used to indicate a possible variation of ±10% of the indicated value. Implementations described as examples herein should not be construed as preferable or advantageous to other implementations. Rather, the term “exemplary” is used in the sense of an example or illustration.

[0007] Figures 1A to 1C show different perspective views of an exemplary test fixture (test apparatus) 100 of the present disclosure, and Figure 1D shows a bottom view of the test fixture 100. The following description will refer to Figures 1A to 1D. In the embodiments shown in these figures, the test fixture 100 includes an upper plate 10, an intermediate plate 30, and a lower plate 50 spaced apart in the z direction (see the XYZ triad in Figures 1A to 1C). In the following description, the z direction will be referred to as the vertical direction, the end marked "A" will be referred to as the front end of the test fixture 100, and the end marked "B" will be referred to as the rear end. However, it should be noted that references to "front," "rear," "top," "bottom," etc., are merely for convenience and are not essential.

[0008] As shown in Figures 1A to 1D, the upper, middle, and lower plates 10, 30, 50 can be planar structures extending generally in the xy plane, and therefore each can be substantially parallel to the others. Although not required, in some embodiments the upper, middle, and lower plates 10, 30, 50 may have a generally rectangular shape (in the XY plane) as shown. The upper, middle, and lower plates 10, 30, 50 may be formed from any material and may be formed in any suitable manner. Although not required, in some embodiments these plates 10, 30, 50 may include plastic or polymer materials (e.g., nylon, glass-filled polyamide, epoxy resin, polycarbonate, etc.). These plates may be formed or manufactured in any suitable manner (machining, molding, etc.). In some embodiments some or all of these plates may be manufactured using 3D printing. In some embodiments one or more sheets of reinforcing material may be embedded in the upper plate 10, the middle plate 30, and / or the lower plate 50. For example, one or more of the plates may include a sheet of metal or glass fiber printed within another 3D printed polymer plate.

[0009] The upper, middle, and lower plates 10, 30, and 50 can be connected together, for example, close to their corners, by the support columns 12, 14, and 16 and the movable (e.g., rotary screw) assembly 20. As shown in the figure, the support columns 12 and 14 can connect the plates 10, 30, and 50 together at the front end A of the test fixture 100, and the support column 16 and the movable assembly 20 can connect the plates 10, 30, and 50 together at the rear end B of the test fixture 100. As best shown in Figure 1C, the upper and lower plates 10 and 50 are also connected together at the rear end B by the spine 60. The movable assembly 20 and the spine 60 will be described later. The support columns 12, 14, and 16 are shown as cylindrical columnar structures with a diameter (in the XY plane), but this is merely illustrative. In general, these support columns 12, 14, and 16 can have any suitable configuration or shape (rectangle, square, etc.). In some embodiments, as best shown in Figure 1A, the struts 12, 14 positioned at the front end A of the test fixture 100 may have a smaller diameter (or width in embodiments where these struts are not cylindrical) than the struts 16 positioned at the rear end B. Positioning the struts 12, 14 with a smaller diameter at the front end A may allow for greater clearance between these struts, making it easier to load samples (syringes, beakers, etc.) into the test fixture 100. Although not required, in some embodiments the struts 12, 14 may have substantially the same diameter or width, while in other embodiments the struts 12, 14 may have different diameters and / or widths (each smaller than the corresponding diameter and / or width of strut 16). The struts 12, 14, 16 may generally be formed from any suitable material and in any suitable manner. In some embodiments, these supports 12, 14, and 16 may be formed from a metallic material such as stainless steel or aluminum, but in other embodiments, supports 12, 14, and / or 16 may be formed from a polymer material or a combination of metal and polymer. In some embodiments, supports 12, 14, and / or 16 may be formed by 3D printing.The test fixture 100 is intended to be connected to a universal testing machine (UTM), such as a UTM manufactured by Instron or ZwickRoell. For example, the lower plate 50 may be connected to the UTM via a bore 50C (see Figure 1A) configured to receive bolts of the UTM. The bolts may be of any suitable size, such as M6 bolts or M10 bolts.

[0010] The support columns 12, 14, and 16 may be fixedly connected to the upper and lower plates 10 and 50, or slidably connected to the intermediate plate 30. In other words, the upper and lower plates 10 and 50 are fixed to the support columns 12, 14, and 16, and the intermediate plate 30 is slidable on the support columns 12, 14, and 16 in a direction perpendicular to them. The support columns 12, 14, and 16 may be fixedly connected to the upper and lower plates 10 and 50 in any way. In some embodiments, these support columns 12, 14, and 16 may be press-fitted into the upper and lower plates 10 and 50. Additionally or alternatively, in some embodiments, the support columns 12, 14, and 16 may be connected to the upper and lower plates 10 and 50 using screws or other types of fasteners (see, for example, Figures 1D, 2A, and 2B). In some embodiments, bearings 18A, 18B, 18C (e.g., linear motion bearings) may be connected to the intermediate plate 30 so that the intermediate plate 30 can slide relatively easily on the struts 12, 14, 16. These bearings 18A, 18B, 18C may also enable or assist in centering the struts 12, 14, 16 in corresponding through-holes or cavities in the intermediate plate 30 through which they pass. In some embodiments, as illustrated (see, for example, Figures 1A-1C), the bearings 18A-18C are connected to the intermediate plate 30 using fasteners (e.g., four fasteners) arranged substantially symmetrically around each strut 12, 14, 16. Suitable bearings 18A, 18B, 18C that can be used to slidably connect the intermediate plate 30 on the struts 12, 14, 16 are known to those skilled in the art and therefore will not be described in detail herein. In the illustrated embodiment, bearings 18A, 18B, and 18C are shown fixed to the underside of the intermediate plate 30 (i.e., closer to the lower plate 50 than to the upper plate 10). This configuration may help create additional space for the sample on the intermediate plate 30. However, it is intended that one or more of bearings 18A, 18B, and / or 18C may be positioned on top of the intermediate plate 30 (i.e., closer to the upper plate 10 than to the lower plate 50).

[0011] The upper plate 10 may have a first side end face 10A at its front end A and a second side end face 10B at its rear end B. The first side end face 10A may be substantially parallel to the second side end face 10B. Similarly, the intermediate plate 30 may have a first side end face 30A at its front end A and a second side end face 30B at its rear end B. The first side end face 30A may be substantially parallel to the second side end face 30B. It is also intended that the side end faces 10A, 10B, 30A, and / or 30B may be substantially parallel to each other. In some embodiments, the support columns 12, 14 may be positioned closer to the first side end faces 10A, 30A than to the second side end faces 10B, 30B. In some embodiments, each of the support column 16, spine 60, and moving assembly 20 may be positioned closer to the second side end faces 10B, 30B than to the first side end faces 10A, 30A.

[0012] Each of the upper plate 10 and the intermediate plate 30 may have a central cavity or recess 15, 32 extending from the front end A to the rear end B of the test fixture 100. In particular, cavity 15 may extend from an opening 10C in the first side end face 10A of the upper plate 10 toward the second side end face 10B. Similarly, cavity 32 may extend from an opening 30C in the first side end face 30A of the intermediate plate 30 toward the second side end face 30B. In some embodiments, it is intended that the openings 10C, 30C face the same direction (i.e., toward the front end A of the test apparatus 100). However, this is not essential, as it is intended that the opening 10C may extend through the second side end face 10B so that cavity 15 extends toward the center of the upper plate 10 from the second side end face 10B. In alternative embodiments, the opening 15C may face the rear end B. While not mandatory, in some embodiments, as illustrated, the central cavity 15 may be positioned substantially in the center of the width of the upper plate 10, and the central cavity 32 may be positioned substantially in the center of the width of the intermediate plate 30. The central cavity 15 on the upper plate 10 may extend from the front end A to the (closed) rear end 15A (see Figure 2A), and the central cavity 32 on the intermediate plate 30 may extend from the front end A to the (closed) rear end 32A (see Figures 1A and 2A). The central cavity 15 on the upper plate 10 and the central cavity 32 on the intermediate plate 30 may be positioned on their respective plates so that they are vertically aligned. That is, when viewed from above the test fixture 100, the central cavity 15 may be positioned directly above the central cavity 32 (see Figures 2A and 2B). In other words, one or more longitudinal axes (substantially parallel to the Z-axis) may intersect each of the cavities 15 and 32. The intersecting longitudinal axes may be substantially parallel to the longitudinal axes of the support columns 12, 14, 16, the spine 60, and the moving assembly 20. As described later, brackets 80 (e.g., U-shaped brackets for supporting different types of samples) may be connected to the central cavity 15 on the upper plate 10. If the test fixture 100 is used to support a sample during testing, the sample may be placed (or inserted) into the test fixture 100 through one or both of the central cavities 15, 32. The central cavities 15, 32 may have any shape and size.In general, the shape and size of the central cavities 15,32 may depend on the size and configuration of the sample intended for use with the test fixture 100. In some embodiments, one or both of the central cavities 15,32 may be roughly rectangular or U-shaped. In general, the central cavities 15,32 may be sized such that they do not extend completely from the front end A to the rear end B of the test fixture 100. That is, as shown in Figures 1A, 1C, 2A, and 2B, the upper plate 10 and the intermediate plate 30 may include strip-shaped material extending from the rear ends 15A,32A of the respective central cavities 15,32 to the rear end B of the test fixture 100. Furthermore, the (closed) rear ends 15A,32A may be positioned closer to the second side end faces 10B,30B than to the first side end faces 10A,30A.

[0013] The spine 60 connecting the upper and lower plates 10, 50 may extend through the intermediate plate 30 via a vertically extending cavity 36 (or through hole) located between the rear end 34 of the central cavity 32 and the rear end B of the test fixture 100 (see Figure 1C). The cavity 36 may be sized such that the spine 60 extends through the intermediate plate 30 without hindering the vertical movement of the intermediate plate 30 (described later). For example, in some embodiments, the cavity 36 may be sized such that the spine 60 extends through the intermediate plate 30 without physically contacting the intermediate plate. The spine 60 may be fixedly connected to the upper and lower plates 10, 50, for example, using fasteners. For example, as shown in Figure 1C, fasteners 52A, 52B may extend through the cavity on the spine to connect the spine 60 to the lower plate 50. Similar fasteners (not shown) may extend through cavities 16A and 16B on the upper plate 10 to connect the spine 60 to the upper plate 10. These fasteners used to connect the spine 60 to the upper plate 10 may extend through cavities 16A and 16B and through the rear end 14 of the central cavity 15 into the central cavity 15 (of the upper plate 10). The portions of these fasteners extending into the central cavity 15 may be used to mount the bracket 80 (or another suitable bracket, replacement part, etc.) into the central cavity 15. The spine 60 is shown as a rectangular component, but this is merely illustrative. In general, the spine 60 may have any suitable shape and size (e.g., width, thickness, etc.) that provides sufficient rigidity to the test fixture 100. In some embodiments, the spine 60 may include (or be configured) a size and material that provides sufficient stability to the test fixture 100 to withstand torsional and / or bending forces that may occur during testing (e.g., torsional and bending forces generated from the sample supported by the test fixture to the test fixture 100). The spine 60 may be formed in any suitable manner. In some embodiments, the spine 60 may be a 3D printed component configured to provide additional stiffness in the longitudinal direction. More specifically, the spine 60 may generally be a 3D printed component of a polymer.In some embodiments, one or more reinforcing sheets may be embedded within the spine 60. For example, the spine 60 may be printed from a plastic composite material having one or more reinforcing materials, e.g., metal strands, within it. In another example, the spine 60 may include a sheet of metal or glass fiber printed within another 3D printed polymer plate. Including 3D printed reinforcing materials ensures that the spine 60 is rigid enough to withstand torsional and / or bending forces that may occur during testing, while being manufactured quickly and easily as required. As described above, the spine 60 may have an integrated plate within it to help apply sufficient torque to the bolts extending through the entire fixture 100. The upper through-bolts that make the fixture 100 a single continuous unit may, in some embodiments, introduce looseness between components that can affect the rigidity of the fixture 100. Therefore, in at least some embodiments, it is desirable that the single continuous unit—the fixture 100—be rigid in order to obtain accurate test results.

[0014] The effectiveness of spine 60, with and without reinforcement, was demonstrated using repeated tests. During the repeated tests, a load was applied to the upper plate 10. The load was approximately 200 N, and the deflection of the upper plate 10 was measured over time while the load was applied. This approximate load is significantly higher than the loads applied during the use of the test fixture 100 in various medical syringe tests, including, for example, 1) break loose glide force tests (e.g., less than approximately 1 N to approximately 20 N), 2) override force tests of lockout mechanisms (e.g., approximately 50 N to approximately 100 N), 3) injection force tests of automatic injectors (e.g., approximately 50 N to approximately 100 N), and 4) cap removal force tests (e.g., approximately 50 N to approximately 100 N). During the break loose glide force tests, the displacement per unit force can be measured, for example, from approximately 15 mm to approximately 20 mm. These tests generally last from approximately 3 to 5 seconds, or up to approximately 10 seconds. However, these durations are merely illustrative, and other durations are also intended. With this approximate load, after reinforcing the spine 60 with a metal plate as described above, the displacement of the upper plate 10 measured under a load of approximately 200 N was approximately 0.225 to 0.242 mm (data sampling is shown in the "Displacement - Supported" column of Table 1 below), with a standard deviation of 0.0049 mm. In yet another test, with a fixture without any spine 60, the displacement of the upper plate 10 measured under the same load of approximately 200 N ranged from 1.164 nm to 1.193 mm (data sampling is shown in the "Displacement - Unsupported" column of Table 1), with a standard deviation of 0.0068 mm. The repeated tests described herein were conducted in April 2019. In the repeated tests, an ElectroPuls Instron machine was used to periodically apply a 200N load to the upper plate 10, first upward and then downward. Each cycle (including the application of force both upward and downward) lasted 1 second, and each fixture was tested for 72 hours (259,200 cycles or 259,200 seconds). The displacement of the upper plate 10 was measured every 5 cycles (seconds). Table 1 reflects the sampling of data collected during the repeated tests. Tests of the fixture with and without support were performed on different days.The difference in displacement of the equivalent cycles between the two tests ranged from 0.927 mm to 0.964 mm, and the standard deviation was 0.0349. Many of the (relatively small) deviations in the displacement data collected during the repeated tests were observed to be due to temperature changes in the test area. In yet another test not shown in Table 1, the spine 60 consisted of only plastic and no reinforcement was included, and the displacement of the upper plate 10 was about 0.35 to 0.40 mm.

[0015]

Table 1

[0016] Furthermore, according to this disclosure, the spine 60 may or may not be reinforced. In some embodiments, reinforcement may not be necessary if the spine 60 is configured to withstand the loads expected to be applied during operation (e.g., testing of an injectable medical device). In other words, reinforcement may not be necessary if, under the loads intended during testing of an injectable medical device, the spine 60 is capable of supporting the upper plate 10 so that it exhibits only a small, acceptable deformation, or no deformation at all. For example, if the components of the fixture 100, including the spine 60, are manufactured from plastic (without reinforcement) in a single 3D printer on the same day, the performance of such a spine 60 (i.e., lack of deflection of the upper plate 10) is likely to be equivalent to that of a spine 60 that has reinforcement within it.

[0017] The intermediate plate 30 may also include a concave cavity or track 38 extending in the XY plane laterally (or substantially perpendicularly) to the central cavity 32 (see Figure 1A). The track 38 may include a first portion 38A extending to one side of the central cavity 32 and a second portion 38B extending to the opposite side of the central cavity 32. The first portion 38A may be collinear with the second portion 38B. The track 38 may be a slotted cavity configured to slidably support one or more components therein. A finger assembly 40 may be slidably supported on each portion 38A, 38B of the track 38 (only one finger assembly 40 (on the first portion 38A) is shown in Figure 1A). Each finger assembly 40 may be configured to slide on the track 38 toward and away from the central cavity 32. Although not required, in some embodiments, each finger assembly 40 may be a spring-loaded component (or assembly of components) biased toward the central cavity 32. That is, the finger assemblies 40 on two parts 38A, 38B of track 38 may be biased toward each other.

[0018] Each finger assembly 40 may include a base 42 or carriage configured to slide along the track 38 toward and away from the central cavity 32. While not required, in some embodiments (not shown), a thumbscrew (or another mechanism, such as a slot) may be provided to lock the base 42 in a desired position on the track 38. The finger members, i.e., the fingers 46, may be connected to the base 42 of each finger assembly 40 using the thumbscrew 48. As best shown in Figure 1A, the finger 46 may be an elongated component extending from one end adjacent to the thumbscrew 48 to the other end toward the central cavity 32. The finger 46 is connected to the base 42 such that the length of the finger 46 is at an angle to the base 42; that is, the finger 46 can be angled relative to the base 42. The angle the finger 46 makes with the base 42 can be changed using the thumbscrew 48. For example, loosening the thumbscrew 48 (for example, by turning the thumbscrew 48) allows the finger 46 to rotate around the thumbscrew 48, changing the angle between the finger 46 and the base 42.

[0019] In embodiments where the finger assembly 40 is spring-loaded, the spring 45 can bias the finger 46 upward (i.e., toward the upper plate 10 and away from the lower plate 50). The spring 45 can be connected to a peg 46a located beneath the finger 46. In particular, the spring 45 can be received on or adjacent to the peg 46a in a groove (not shown). The spring 45 can also be connected to a screw or other fastener 46b. The fastener 46b can connect the base 42 to a projection received by a slot or recess in the track 38. Thus, when a downward force is applied to the finger 46 (by a sample or test instrument), the spring 45 can be compressed, allowing the finger 46 to pivot downward. When the downward force is released, the spring 45 expands to its resting position, and the finger 46 can return to its original and / or resting position. In some embodiments, the presence of the spring 45 can allow testing of the sample without clamping the sample. For example, in some embodiments, the sample may be fixed only by tension.

[0020] The ends of the fingers 46, positioned toward the central cavity 32, may be configured to contact and support the sample on the test fixture 100 during testing. For example, in an embodiment where a syringe is supported on the test fixture 100 for testing, the body of the syringe may be vertically supported by the fingers 46 of the finger assembly 40 on either side of the central cavity 32, such that the syringe extends toward the lower plate 50 through the central cavity 32. In this configuration, the loading arm of the UTM descends into the test fixture 100 through the central cavity 15 of the upper plate 10, allowing a desired type of force (tensile, compressive, etc.) to be applied to a desired position on the syringe. The ability to translate the finger assembly 40 along the track 38 (for example, in the X direction in Figure 1A) allows the fingers 46 to be used to support samples of different sizes (e.g., syringes, beakers, etc.) on the test fixture 100. Furthermore, the ends of the fingers 46 positioned toward the central cavity 32 may include inwardly facing recesses 46c that can be used to support the flange of the injector or syringe being tested (e.g., the finger flange of a syringe). While a specific configuration of the finger assembly 40 having the fingers 46 is illustrated, it should be noted that this is merely illustrative. In general, the finger assembly 40 and the fingers 46 can have any configuration.

[0021] As previously mentioned, the intermediate plate 30 of the test fixture 100 is slidably connected to the support columns 12, 14, and 16. The intermediate plate 30 can be slid on the support columns 12, 14, and 16 using the moving assembly 20, and the intermediate plate 30 can be moved vertically (i.e., toward or away from the upper or lower plates 10, 50). Referring to Figure 1C, the moving assembly 20 includes a screw 22 supported by a collar such as a split clamp 56 (e.g., a McMaster split clamp) provided on the lower plate 50. In some embodiments, as shown in Figure 1C, the split clamp 56 may be provided in or embedded in a cavity of a corresponding shape formed on a thumbwheel 54 formed on the lower plate 10. In some embodiments, as shown in Figure 1C, the thumbwheel 54 is a tire-shaped projection on the lower plate 50 that includes a central cavity supporting the split clamp 56.

[0022] As will be recognized by those skilled in the art, the screw 22 (e.g., an endless screw) can be rotated on the lower plate 50 by rotating the thumbwheel 54 around the longitudinal (Z) axis of the assembly 20. The screw 22 may be self-braking and have a screw shape such that the intermediate plate 30 does not translate vertically by pushing against it. Alternatively, the moving assembly 20 may be configured so that the intermediate plate 30 can only be moved vertically by rotating the thumbwheel 54. For example, the intermediate plate 30 may include a bearing and fasteners (e.g., nuts) 24 having threads to receive the threads of the screw 22. The upper end of the screw 52 includes a bearing 26 attached to it. In some embodiments, the bearing 26 may have a hemispherical bore into which the upper end of the screw 52 snaps. In some embodiments, the bearing 26 is not attached to the upper plate 10. In some embodiments, the upper part of the bearing 26 may contact the back surface of the upper plate 10 so that the bearing 26 slides on the upper plate 10 (in the XY plane) and the effects of displacement of the moving assembly 20 on the test fixture 100, such as the rotating screw assembly 20, can be minimized. When the thumbwheel 54 is turned (or rotated), the screw 22 (and bearing 26) rotate relative to the upper and lower plates 10, 50. The screw 22 extends through the intermediate plate 30 via a bearing 24 fixed to the intermediate plate 30. As will be recognized by those skilled in the art, the bearing 24 converts the rotational motion of the screw 22 into linear motion of the intermediate plate 30 to which it is attached. Although not shown, in some embodiments the intermediate plate 30 may also include a bearing (e.g., a brass bearing, a bronze bearing, etc.) located within the cavity through which the screw 22 extends. When the thumbwheel 54 is rotated, the ball screw 22 rotates around the upper and lower plates 10 and 50, causing the intermediate plate 30 to translate vertically (Z-direction) up and down. When the thumbwheel 54 is rotated in one direction, the intermediate plate 30 moves in one direction (for example, towards the upper plate 10 or towards the lower plate 50), and when the thumbwheel is rotated in the opposite direction, the intermediate plate 30 moves in the opposite direction.The function of moving the intermediate plate 30 up and down allows different types and sizes of samples to be supported by the test fixture 100.

[0023] The moving assembly 20 may also be any suitable linear motion component configured to translate the intermediate plate 30 along the Y-axis relative to the upper plate 10 and the lower plate 50. For example, the moving assembly 20 may include a pulley system or the like.

[0024] As previously mentioned, the central cavity 15 of the upper plate 10 can support a bracket 80 (see Figures 1A, 1B, 2A, and 2B). An exemplary bracket 80 that can be supported by the upper plate 10 is shown in Figure 3. As best shown in Figures 1A and 1B, the sidewall of the central cavity 15 may include a slot 82A (e.g., a rectangular recess). In some embodiments, the slot 82A extends along the length of the central cavity 15 (i.e., along the Y-axis, see Figure 2A) from the front end A of the test fixture 100 to the rear end 14 of the central cavity 15. The slot 82A on the sidewall of the central cavity 15 is configured to slidably receive a projection 82B of a corresponding shape on the side of the bracket 80. Bracket 80 can be attached to the central cavity 15 by engaging its projection 82B with the slot 82A of the central cavity 15 and sliding the bracket 80 into the central cavity 15 so that the front surface of bracket 80 is flush with the front surface of the upper plate 10 (see Figures 1A and 1B). Next, fasteners used to connect the spine 60 to the upper plate 10 can be inserted into the cavities 16A and 16B (see Figure 1C). These fasteners may extend through the upper plate 10 into the screw holes 86A and 86B on the rear surface of bracket 80 (see Figure 3) to attach the spine 60 and bracket 80 to the upper plate 10.

[0025] Bracket 80 may also be used to support a test sample within the test fixture 100. The inner end of bracket 80 may include a structure 84 configured to engage with the sample and support the sample on bracket 80. Note that the bracket 80 and structure 84 shown in Figure 3 are illustrative only. In general, the type of bracket used and the structure provided on the bracket depends on the type of sample being supported. In some embodiments, a first bracket (e.g., bracket 80) may be used to support one type of sample during one test. After that test, the bracket may be removed and another bracket mounted in the central cavity 15 to support a different sample for another test. The ability to quickly switch between brackets configured to support different types of samples improves the adaptability of the test fixture.

[0026] In some embodiments, a structure provided on the bracket 80 may be configured to support another bracket. For example, referring to the bracket 80 in Figures 3, 3A, and 3B, in some embodiments, a structure 84 on the inner surface of the bracket 80 may be configured to engage with and support another bracket 80A configured to support a sample (e.g., an inner bracket 80A that fits into the bracket 80 and is configured to support several test samples). In such embodiments, the bracket attached to the upper plate 10 (e.g., bracket 80) does not need to be replaced to support a differently configured test sample. Instead, the inner bracket 80A supported by the bracket 80 attached to the upper plate may be replaced with another inner bracket configured to support a new test sample. The ability to quickly replace brackets and / or inner brackets to support different sample configurations allows the test fixture 100 to support many different configurations of test samples.

[0027] The inner bracket 80A may include a circular opening and other suitable structures configured to support a test sample, such as a syringe. In some embodiments, the inner bracket 80A may be configured to receive one or more syringe adapters or packs used in the tests performed by the UTM. The syringe adapters or packs may be commercially available or custom-made and may be individually designed to support different samples, syringes, containers, etc. For example, the adapters or packs may be configured to accommodate or support a variety of syringe diameters, shapes, configurations, etc.

[0028] In some embodiments, the bracket of the upper plate 10 (e.g., bracket 80) and the finger assembly 40 of the intermediate plate 30 may be configured to cooperate in supporting a sample for testing. For example, a syringe extending through both cavities 12, 32 (e.g., vertically) (in the upper and intermediate plates 10, 30) may be supported by both the bracket 80 of the upper plate 10 and the fingers 46 of the finger assembly 40 of the intermediate plate 30. The ability to change the spacing between the upper and intermediate plates 10, 30 by moving the intermediate plate 30 vertically using a thumbwheel 54 allows for easy support of samples of different configurations and sizes on the test fixture 100 without changing the fixture. The ability to easily reconfigure the test fixture 100 to test different test samples increases efficiency while saving time and costs.

[0029] Figures 5A and 5B show exemplary replacement parts that can be attached to the center plate 30. For example, Figure 5A shows a sample holding arm 500 that can be used to support a sample collection container on the platform 502. For example, the holding arm 500 may be used to support a “bulk” main container (i.e., a syringe) that is tested under tension, or the holding arm 500 may be used to hold a waste collection cup when weighing of the sample is not required. These uses are non-limiting, and it is intended that the holding arm 500 may be used similarly in other test applications. The sample collection container may collect liquid discharged from the syringe or test apparatus during the test. Similarly, Figure 5B shows a holder 510 that can be used to support or hold a centrifuge tube, etc. The replacement parts or adapters shown in Figures 5A and 5B may be used in certain tests that do not utilize the finger assembly 40. The retaining arms 500 and / or holders 510 may be connected to the center plate 30 by one or more fasteners (e.g., bolts) that pass through the openings of the retaining arms 500 and / or holders 510 and extend through the openings of the center plate 30.

[0030] Figures 5C to 5E show exemplary replacement parts that can be used with the top plate 10 to perform tests, for example, with ISO vials or other similar containers. Figure 5C shows a bracket 80 used with an inner bracket 80B (instead of the inner bracket 80A described above). The inner bracket 80B may be used to support a vial for puncture testing. The inner bracket 80B may include a mating flange 80C configured to rest on the top surface of the bracket 80 in order to connect the inner bracket 80B to the bracket 80. The inner bracket 80B may also include a bottom surface 80D offset from the mating flange 80C (in a different plane), although in at least some embodiments it is intended that the mating flange 80C and the bottom surface 80D may be coplanar. The side wall 80E may be positioned between the mating flange 80C and the bottom surface 80D and in some embodiments may be substantially perpendicular to both the mating flange 80C and the bottom surface 80D. The side wall 80E may include partially cylindrical portions whose ends are connected to substantially parallel portions of the side wall 80E. The partially cylindrical portions of the side wall 80E may have a radius that approximates, or is slightly larger than, the radius of the sample container or vial being tested. Furthermore, the distance between the substantially parallel portions of the side wall 80E may approximate, or be slightly larger than, the radius of the sample container or vial being tested. During testing, the bottom of the sample container or vial may be supported by the bottom surface 80D and the side wall 80E.

[0031] Figure 5D shows a bracket 80F that can be inserted into the upper plate 10 in substantially the same manner as the bracket 80 described herein, for example, using projection 82B. The bracket 80F may include a top surface 80G positioned above and offset from projection 82B, although in some embodiments these may be coplanar. The bracket 80F may include one or more struts 80H extending upward away from the top surface 80G. In the illustrated embodiment, the bracket 80F includes three struts 80H, but this number is not limiting, and the bracket 80F may include more or fewer struts 80H. Each strut 80H may include a lumen extending through it and may include one or more fitting structures, such as threads, rails, etc., to receive a complementary structure for fasteners (such as bolts or screws). The bracket 80F may include a bottom surface 80I positioned lower than and offset from the top surface 80G. The side wall 80J is positioned between the top surface 80G and the bottom surface 80I and may be substantially perpendicular to the top surface 80G and the bottom surface 80I. Similar to the side wall 80E described above, the side wall 80J may include partially cylindrical portions at both ends that are connected to substantially parallel portions of the side wall 80J.

[0032] Figure 5E shows a retaining plate 80K that may be used in conjunction with a bracket 80F to perform a cap removal force test (where the test force rotates from the side of the sample container or vial) on a sample container or vial. The retaining plate 80K may include one or more openings 80L extending through the retaining plate 80K, each configured to align with a corresponding support 80H from the bracket 80F. In the illustrated embodiment, the retaining plate 80K includes three openings 80L, but this is not limiting, and the retaining plate 80K may include additional or fewer openings 80L. The retaining plate 80K may include a recess 80M whose shape corresponds at least partially to the bottom surface 80I of the bracket 80F. Additionally, a side wall 80N may surround the recess 80M, and a portion of the side wall 80N may correspond in shape and geometrically to the side wall 80J of the bracket 80F. When the retaining plate 80K is connected to the bracket 80F, the partially cylindrical portions of the side walls 80J and 80N can be aligned vertically.

[0033] The retaining plate 80K can be connected to the bracket 80F by aligning its opening 80L with the opening of the lumen of the support column 80H. The retaining plate 80K can be fixed to the bracket 80F by inserting fasteners (screws or bolts, etc.) into the respective openings 80L / support column 80H. The corresponding shapes of the retaining plate 80K and the bracket 80F may allow both the retaining plate 80K and the bracket 80F to support different parts of the same sample container or vial. For example, the bottom surface 80I and side wall 80J may support the lower part of the sample container or vial, while the side wall 80N may support the upper or middle part of the same sample container or vial.

[0034] The components shown in Figures 5C–5E, like other replacement parts described herein, can be designed and manufactured in substantially less time than existing components used to perform the same tests. For example, the components in Figures 5C–5E can be designed in less than 3 hours and printed in less than 10 hours. As described above, these replacement parts can be used for testing ISO vials, and the test fixture 100 can help keep the sample and replacement part concentric and position the sample container or vial at the minimum test height of the system. The test fixture 100 and its various replacement parts allow for rapid modification of the test fixture 100 to accommodate testing of different components (e.g., pre-filled syringes and ISO vials), whereas existing test configurations require far more hardware and setup time / cost.

[0035] Embodiments of the present disclosure may be used in any suitable test configuration. For example, embodiments of the present disclosure may be used to collect force-time date in the testing of syringes or autoinjectors. The disclosed apparatus may be used in syringe / plunger force tests such as breakaway force tests (to determine the force required to initially push down the plunger) or sustaining / glide force tests (to determine the force required to keep the plunger moving). The disclosed apparatus may also be used in (1) needle cap or other pull-out tests (e.g., force to remove the needle / safety cap), (2) activation force and displacement tests, (3) tests to determine the force required to displace the needle guard, (4) needle penetration and pull-out tests, and (5) Luer cone breakage tests. The disclosed apparatus may also be used in blister pack tests, pill crush tests, or other tests performed by UTMs that require the development or purchase of new support structures. Accordingly, the disclosed apparatus may be used in any tensile or compressive tests of medical devices, sample containers, or vials, where it is necessary to fix or tighten the apparatus to be tested in a specific orientation. The disclosed apparatus may be used to fix a wide variety of test structures with volumes ranging from about 0.5 mL to about 5 mL or more. Smaller and larger capacity containers are also intended, including, for example, containers with a capacity of about 0.5 mL or less, such as about 0.4 mL or less, about 0.3 mL or less, about 0.2 mL or less, or about 0.1 mL or less. Furthermore, containers larger than about 5 mL may be tested, including containers with capacities such as about 10 mL or more, about 20 mL or more, about 30 mL or more, etc. The container to be tested may be cylindrical, conical, rectangular, pyramidal, irregular in shape, and / or have any other suitable shape or combination of shapes.

[0036] Figure 6 shows an exemplary method 600. Method 600 may begin in step 602, in which the test apparatus 100 may be connected to or fixed to a test machine, such as a universal tester as described above. Next, Method 600 proceeds to step 604, in which the user may select an appropriate insert or replacement part for a desired first test and fix it to the test fixture 100. For example, the user may select one or more of the bracket 80, the inner bracket 80A, the finger assembly 40, the retaining arm 500, the holder 510, and / or any other appropriate replacement part required for the first test. Method 600 may also include step 606 in which the test fixture 100 and the selected replacement part may be further configured. This may include, for example, moving the center plate 30 vertically if required for the first test, adjusting the tension of the finger assembly 40, or other necessary setup work. Step 606 may be performed before, during, or after step 604. Next, Method 600 may proceed to step 608, in which the first test is performed. In some cases, the user may wish to perform another test using the test fixture 100. Thus, Method 600 may proceed to step 610, in which case the user may select a new insert or replacement part to be used during the second or subsequent test. From step 610, Method 600 may proceed to steps 612 and 614, which may be substantially similar to steps 604 and 606, respectively, and may be modified as necessary due to differences between the first test and the second or subsequent test. As with steps 604 and 606, step 612 may be performed before, during, or after step 610. After step 614, Method 600 may be completed, or it may return to step 610 for additional subsequent tests.

[0037] A second or subsequent test may be of the same type as the first test (e.g., a glide test), but may be performed with a different sample or apparatus (e.g., a different syringe). The second or subsequent test may also be a different type of test using the same sample or apparatus as used in the first test, or a different type of test using a different sample / apparatus than used in the first test. However, regardless of the type of test or sample intended for use in the second or subsequent test, the same test fixture 100 may be used, and only replacement parts and / or inserts of a new configuration may be required. For example, a new bracket 80 and / or a new inner bracket 80A may be used in the test. In some examples, only the new inner bracket 80A may be used, or the inner bracket 80A may be removed. In other examples, the retaining arm 500 and / or holder 510 may be used on the center plate 30 in the second test instead of using the finger flange 40, or vice versa. In some embodiments, step 610 of the method may be performed without separating the test fixture 100 from the universal testing machine. However, this is not limiting, and in fact, in some embodiments, the test fixture 100 may be used with different universal testing machines or with the same universal testing machine, although some separation / recombination between different tests may be required.

[0038] Embodiments of this disclosure may enable testing to be conducted at minimal overhead compared to existing testing solutions. For example, the cost of existing testing equipment ranges from $100 to over $1,000. Furthermore, new equipment must be purchased to conduct new tests, resulting in the expenditure of both capital costs and employee labor costs (often significantly higher than capital costs). In addition, existing equipment incurs productivity losses in the design, manufacture, and / or shipment of new testing equipment. However, the modular testing fixtures of this disclosure may help mitigate these problems. For example, new tests can be conducted at significantly lower costs, especially since many users may have already invested in a suitable 3D printer, after investing in initial modules and, for example, a 3D printer (ranging from approximately $300 to over $250,000). Some 3D printers may be configured to print inserts or replacement parts in a final, ready-to-use form, while others may print intermediate components that require further modification. For example, certain printers may require additional supports (e.g., steel rods) or intermediate components may require further milling or machining. For example, new inserts and replacement parts may include material costs of around $10 to $100. Since only the inserts / replacement parts need to be designed, rather than the entire module, design time (and therefore employee labor costs) is reduced. Furthermore, because less design and manufacturing expertise is required to create the inserts / replacement parts, individuals who may not have sufficient experience in creating test equipment (e.g., chemists, chemical engineers, biomedical engineers, biological scientists, etc.) may be able to create suitable inserts / replacement parts. Moreover, if additional assistance from engineering / design / manufacturing professionals is required, such assistance may be limited compared to when entirely new test equipment is needed. Additionally, many of the inserts / replacement parts in this disclosure can be printed on-site (e.g., by 3D printing). This allows custom inserts / replacement parts to be ready for use in hours / days, potentially reducing productivity losses compared to the long timeframe required to build and ship new test equipment.Furthermore, after the design of the new insert or replacement part, it is intended that the 3D printing of such insert or replacement part may be outsourced to a third-party 3D printer at a user cost ranging from approximately US$400 to US$700.

[0039] In embodiments of the present disclosure, the need for a new replacement part may be identified at a first point in time, and the new replacement part may be designed and manufactured (e.g., by 3D printing) into a ready-to-use component, which is then intended to be used in a tensile or compression test within approximately 12 hours (measured from the first point in time). Other time periods are also intended, especially considering the complexity of certain components. In other embodiments, the new replacement part is ready to use, and the replacement part may be actually used in a tensile or compression test within approximately 18 hours or approximately 24 hours (measured from the first point in time). Furthermore, in at least some embodiments of the present disclosure, the new replacement part may be manufactured solely by 3D printing (i.e., sending print instructions to a 3D printer and printing a complete, ready-to-use component without the need for any other milling, machining, etc.).

[0040] As used herein, inserts or replacement parts may be any components required to support and / or orient a test sample or container using a modular test fixture for performing compression and / or tensile tests on the sample or container. Components may include, but are not limited to, any structures that may come into direct or indirect contact with the test sample or container, such as brackets, platforms, support surfaces, supports, flanges, fasteners, etc.

[0041] The principles of this disclosure are described herein with reference to test fixtures that may be used in combination with other devices (e.g., UTMs), but it should be understood that this disclosure is not limited thereto. Rather, the systems described herein can be used with batteries for any application. Furthermore, those skilled in the art and those with access to the teachings provided herein will recognize that all additional modifications, applications, embodiments, and substitutions of equivalents fall within the scope of the embodiments described herein. Thus, this disclosure should not be considered limited by the foregoing description. For example, while certain features have been described in relation to various embodiments, it should be understood that any feature described in relation to any embodiment disclosed herein may be used in conjunction with any other embodiment disclosed herein. The following describes the technical concepts that can be understood from the above embodiments. [Note 1] A test apparatus, The first platform and A second platform comprising a first cavity having a first opening extending through a first side end face of the second platform, wherein the first cavity extends from the first opening toward the center of the second platform, A third platform comprising a second cavity having a second opening extending through the first side end face of the second platform, wherein the second cavity extends from the second opening toward the center of the third platform, The aforementioned second platform is, It is positioned between the first platform and the third platform, It is movable between the first platform and the third platform, The test apparatus further includes a moving assembly configured to move the second platform relative to the first platform and the third platform. [Note 2] The test apparatus as described in Appendix 1, wherein the movable assembly has a first longitudinal axis, and the movable assembly is connected to each of the first platform, the second platform, and the third platform, and the rotation of the movable assembly around the first longitudinal axis causes the second platform to move relative to the first platform and the third platform. [Note 3] The test apparatus as described in Appendix 2, wherein at least a portion of each of the first cavity and the second cavity is positioned along a second longitudinal axis parallel to the first longitudinal axis of the moving assembly. [Note 4] The test apparatus as described in Appendix 1, wherein the first opening and the second opening are facing the same direction. [Note 5] The aforementioned same direction is the test apparatus as described in Appendix 4, which faces forward. [Note 6] The test apparatus as described in Appendix 1, wherein the first platform and the second platform are substantially parallel to each other. [Note 7] The test apparatus as described in Appendix 6, wherein the first platform and the third platform are substantially parallel to each other. [Note 8] The test apparatus as described in Appendix 1, wherein the first platform and the second platform are fixed to each other. [Note 9] The aforementioned movable assembly is the test apparatus described in Appendix 1, including an endless screw. [Note 10] The test apparatus according to Appendix 9, wherein the second platform includes a screw-shaped fastener for receiving the endless screw. [Note 11] The test apparatus as described in Appendix 2, wherein the first platform includes a drive assembly configured to receive the end of the moving assembly, the drive assembly includes a thumbwheel configured to rotate the moving assembly around a first longitudinal axis. [Note 12] The test apparatus as described in Appendix 11, wherein the drive assembly includes a collar surrounded by the thumbwheel, and the move assembly extends through the collar. [Note 13] The test apparatus described in Appendix 1 is used for at least one of a compression test and a tensile test. [Note 14] The test apparatus as described in Appendix 1, wherein the second platform includes a first track and a second track, each of the first track and the second track being configured to receive a spring-loaded holder. [Note 15] The first track and the second track are on the same straight line, as described in Appendix 14, in the test apparatus. [Note 16] The test apparatus according to Appendix 14, further comprising a first spring-type holder configured to be received by the first track, and a second spring-type holder configured to be received by the second track. [Note 17] The test apparatus according to Appendix 16, wherein the first spring-type holder includes a first finger and a first spring, the first finger being biased toward the third platform by the first spring, and the second spring-type holder includes a second finger and a second spring, the second finger being biased toward the third platform by the second spring. [Note 18] The test apparatus according to Appendix 1, further comprising a spine fixed to the first platform and the third platform, wherein the second platform includes a third opening through which the spine extends, and the spine is adjacent to the closed ends of the first cavity and the second cavity. [Note 19] The test apparatus according to Appendix 18, wherein the spine comprises a polymer and one or more metal sheets disposed within the polymer. [Note 20] The test apparatus according to Appendix 1, further comprising a U-shaped bracket detachably received by the second cavity. [Note 21] The test apparatus according to Appendix 20, wherein the second cavity includes one or more slots, and the U-shaped bracket includes one or more projections configured to be received by the one or more slots. [Note 22] The second platform includes a second side end face substantially parallel to the first side end face of the second platform, The test apparatus according to Appendix 1, comprising a first support and a second support connected to the first platform and the second platform, wherein the first support and the second support are positioned closer to the first side end face of the second platform than to the second side end face of the second platform. [Note 23] The test apparatus according to Appendix 22, further comprising a third support connected to the first platform and the second platform, wherein the third support has a larger diameter than each of the first and second supports, and the third support is positioned closer to the second side end face of the second platform than to the first side end face of the second platform. [Note 24] The test apparatus according to Appendix 22, wherein the moving assembly is positioned closer to the second side end face of the second platform than to the first side end face of the second platform. [Note 25] A test apparatus, The first platform and A second platform comprising a cavity having an opening extending through the first side end face of the second platform, a first track and a second track, Equipped with a third platform, The aforementioned second platform is, It is positioned between the first platform and the third platform, It is movable between the first platform and the third platform, The aforementioned test apparatus is A moving assembly configured to move the second platform relative to the first platform and the third platform, A first spring-loaded holder configured to be received by the first track, comprising a first finger and a first spring, wherein the first finger is biased toward the third platform by the first spring, A test apparatus further comprising: a second spring-loaded holder configured to be received by the second track, comprising a second finger and a second spring, wherein the second finger is biased toward the third platform by the second spring. [Note 26] A test apparatus, The first platform and A second platform including a cavity having an opening that extends through the first side end face of the second platform, Equipped with a third platform, The aforementioned second platform is, It is positioned between the first platform and the third platform, It is movable between the first platform and the third platform, The aforementioned test apparatus is A moving assembly configured to move the second platform relative to the first platform and the third platform, A test apparatus further comprising: a spine fixed to the first platform and the third platform, the second platform including an opening through which the spine extends, and the spine comprising a polymer and one or more metal sheets disposed within the polymer. [Note 27] A test apparatus, The first platform and A second platform comprising a first cavity having a first opening extending through a first side end face of the second platform, wherein the first cavity extends from the first opening toward the center of the second platform, A third platform comprising a second cavity having a second opening extending through the first side end face of the second platform, wherein the second cavity extends from the second opening toward the center of the third platform, The aforementioned second platform is, It is positioned between the first platform and the third platform, It is movable between the first platform and the third platform, The test apparatus further includes a moving assembly configured to move the second platform relative to the first platform and the third platform, A test apparatus in which, when a load of approximately 200 N is applied to the third platform, the third platform exhibits a displacement of approximately 0.40 mm or less. [Note 28] The test apparatus described in Appendix 27, wherein when the aforementioned load is applied, the third platform exhibits a displacement of approximately 0.23 mm or less.

Claims

1. A test apparatus for supporting a sample undergoing at least one of a compression test and a tensile test, Spine and, The first platform and A second platform comprising a first cavity for receiving a portion of the sample having an opening extending through the first side end face of the second platform, and a second cavity for receiving a portion of the spine, wherein the spine does not contact the second cavity, The system comprises a third platform fixed to the first platform by the spine, A test apparatus in which the second platform is positioned between the first platform and the third platform and is movable relative to the first platform and the third platform.

2. The test apparatus according to claim 1, wherein the opening of the first cavity extends from the opening toward the center of the second platform.

3. The test apparatus according to claim 1, wherein the third platform includes a third cavity having an opening that extends through the first side end face of the third platform, and the third cavity extends from the opening toward the center of the third platform.

4. The test apparatus according to claim 1, wherein the first platform and the second platform are substantially parallel to each other.

5. The test apparatus according to claim 4, wherein the first platform and the third platform are substantially parallel to each other.

6. The test apparatus according to claim 1, wherein the first platform and the third platform are fixed to each other.

7. The test apparatus according to claim 1, wherein when a load of approximately 200 N is applied to the third platform, the third platform exhibits a displacement of approximately 0.40 mm or less.

8. The test apparatus according to claim 7, wherein when the load is applied, the third platform exhibits a displacement of approximately 0.23 mm or less.

9. The test apparatus according to claim 1, further comprising a moving assembly configured to move the second platform relative to the first platform and the third platform.

10. The test apparatus according to claim 9, wherein the moving assembly has a first longitudinal axis, and the moving assembly is connected to each of the first platform, the second platform, and the third platform, and the rotation of the moving assembly around the first longitudinal axis causes the second platform to move relative to the first platform and the third platform.

11. The test apparatus according to claim 10, wherein the first platform includes a drive assembly configured to receive the end of the moving assembly, the drive assembly includes a thumbwheel configured to rotate the moving assembly around a first longitudinal axis.

12. The test apparatus according to claim 11, wherein the drive assembly includes a collar surrounded by the thumbwheel, and the move assembly extends through the collar.

13. A test fixture, The first platform and A cavity having an opening extending through the first side end face of the second platform, and a second platform including a first track and a second track arranged on the second platform, Equipped with a third platform, The second platform is positioned between the first platform and the third platform and is movable relative to the first platform and the third platform. The aforementioned test fixture is A first spring-loaded holder configured to be received by the first track, comprising a first base, a first finger, and a first spring, wherein the first finger is biased toward the third platform by the first spring, The second spring holder, configured to be received by the second track, further comprises a second base, a second finger, and a second spring, wherein the second finger is biased toward the third platform by the second spring, The aforementioned test fixture is a test fixture that supports a sample in at least one of a compression test and a tensile test.

14. The test fixture according to claim 13, wherein the first track and the second track are on the same straight line.

15. The test fixture according to claim 13, wherein the first spring-loaded holder is slidable on the first track toward and away from the cavity of the second platform, and the second spring-loaded holder is slidable on the second track toward and away from the cavity of the second platform.

16. The test fixture according to claim 13, wherein each of the first finger of the first spring-type holder and the second finger of the second spring-type holder includes an inwardly facing recess.

17. The test fixture according to claim 13, wherein the first finger of the first spring-type holder and the second finger of the second spring-type holder are configured to contact a portion of the sample.

18. The test fixture according to claim 13, wherein the first spring-loaded holder includes a first screw for connecting the first finger to the first base, and the second spring-loaded holder includes a second screw for connecting the second finger to the second base.

19. The test fixture according to claim 13, wherein the third platform includes a cavity having an opening extending through the first side end face of the third platform, the cavity extending from the opening toward the center of the third platform.

20. The test fixture according to claim 13, further comprising a moving assembly configured to move the second platform relative to the first platform and the third platform.

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