Apparatus and method for automatic data erasure in non-volatile memory of an electronic device

Abstract

The present invention relates to an automated apparatus and method for erasing data stored in the non-volatile memory (M) of an electronic device (A), such as a smartphone or tablet. The invention features the use of an irradiation chamber (1) with at least one X-ray source (S) enclosed in an X-ray opaque housing that can accept multiple electronic devices (A), which can be transported into the chamber (1) by a conveyor (2). A control unit (CU) controls the conveyor (2) and the X-ray source (S) to irradiate each electronic device (A) with a controlled power and duration in order to erase the data stored in the non-volatile memory (M) of the electronic device (A).

Description

[Technical Field]

[0001] The present invention relates to the field of electronic devices containing non-volatile memory (NAND or NOR), such as, for example, computers, smartphones, tablets, or any type of device containing such memory. The present invention particularly relates to the erasure of data contained in such memory. [Background technology]

[0002] Indeed, problems in this field relate to the erasure of data contained in these memories, particularly in ensuring that user data cannot be retrieved by third parties without consent when refurbishing or recycling these devices. Traditionally, to erase data in this type of memory, bits are reset by accessing the memory through computer means using logic gates, but this is tedious and requires starting the device, which must remain at least partially functional. For example, if a device no longer functions to the point where the motherboard and / or major components must be repaired to initiate a software erasure command, the currently preferred solution is to downgrade the device for destruction by polishing and / or melting, which represents a clear waste in many respects (with significant economic and ecological problems). Furthermore, even if these devices remain sufficiently functional for software access, a recurring problem relates to the fact that many devices on the market have very different connection means and operating systems, which require a wide variety of connectors and data access software. This makes the time required for data erasure a major issue. Therefore, automating data erasure is difficult to envision in the current state of the art. On the other hand, the types of memory included in these devices have various hardware architectures with more or less performance and durability, which also complicates data erasure. The use of ionizing radiation to erase memory data is also known in the prior art, particularly from U.S. Patent Application Publication No. 4,393,479 and Japanese Patent Application Publication No. 5,975,496. However, these solutions are deployed during the manufacture of a specific, specific type of memory prior to integration into a device and are only intended to provide a completely blank memory. Therefore, these solutions do not solve the problem of erasing data from a device while keeping it functional (hardware and / or software). Summary of the Invention

[0003] In this context, the present application proposes a device that allows reliable and rapid data erasure, avoiding unnecessary destruction of the device as much as possible, and preferably in a manner that is compatible with the automation of data erasure of various electronic devices.

[0004] This object is achieved by an automated device for erasing data stored in a non-volatile memory of an electronic device, for example a wearable device such as a smartphone or a tablet, characterized in that it comprises: an irradiation chamber enclosed in an enclosure sealed against X-rays and equipped with at least one X-ray source capable of successively receiving a plurality of electronic devices brought into the chamber by a conveyor; means for identifying each of said devices in order to recognize the type of device and / or memory to be irradiated; and a control unit for controlling the conveyor and the X-ray source to irradiate each of the electronic devices with controlled power and duration in accordance with irradiation parameters corresponding to the device identified by the identification means in order to erase the data contained in the non-volatile memory of said electronic device.

[0005] According to another feature, the control unit determines the location and type of memory of the device to be irradiated by the identification means and controls the conveyor and the X-ray source according to the determined location and type of memory.

[0006] According to another feature, the X-ray source generates an X-ray beam which irradiates the device along a main axis which is inclined or tiltable relative to the plane of the conveyor, the angle of which is determined by the control unit by the identification means.

[0007] According to another feature, the control unit controls the X-ray source by monitoring the power and duration depending on the type of memory included in the electronic device.

[0008] According to a further feature, the control unit is adapted to operate within a 100m range to limit the risk of damaging device components. 2 .s- 2It can be configured to deliver a first type of irradiation with parameters that provide a dose less than 1000 mW (i.e., Gray or Joules / kg), while allowing for an incomplete erasure of data in the device's memory that is sufficient to impose a device reset on the next boot, which includes a fresh install and complete erasure of the operating system.

[0009] According to another feature, the control unit is adapted to operate within a range of 200-1000mV to limit the risk of damaging device components while allowing for a complete erasure of data in the device memory, necessitating reprogramming of the memory. 2 .s- 2 The radiation source can be configured to deliver a second type of radiation having parameters that provide a dose (i.e., Gray or Joules / kg).

[0010] According to another feature, the identification means comprise at least one computer file listing the serial number or model of each of the successive devices placed on the conveyor, and the control unit determines the parameters to be used for each of the devices from this file and from a database storing the device characteristics.

[0011] According to another feature, the identification means include a code reader attached to the device.

[0012] According to another feature, the identification means comprises means for recognizing the components of the device and their arrangement from at least one image of the device obtained by an imaging process using irradiation at a dose lower than that used to erase the data in the memory.

[0013] According to another feature, the apparatus includes a preheat chamber for preheating the memory before passing in front of the X-ray source.

[0014] According to another feature, the device comprises a heating chamber at the exit of the irradiation chamber to improve the condition of some device components after irradiation.

[0015] According to another feature, the device comprises positioning means capable of placing each successive device at a position in three-dimensional space determined depending on the device's identity.

[0016] According to another feature, the apparatus comprises at least one protective mask that can be positioned between the X-ray source and the apparatus to protect certain components of the apparatus during exposure of the memory to the radiation source.

[0017] According to another feature, the control unit controls the irradiation power by controlling the supply voltage of the X-ray source to be between 175 and 300 kilovolts and the target intensity of the X-ray source to be between 250 microamperes and 100 milliamperes, preferably 20 milliamperes.

[0018] According to another feature, the X-ray source includes a target made of tungsten or molybdenum.

[0019] According to another feature, the X-ray source has a window made of beryllium or aluminum.

[0020] According to another feature, the distance between the X-ray source and the conveyor transporting the device is between 1 and 20 centimeters, preferably between 2.5 and 4 centimeters.

[0021] Another object of the present application is to provide a reliable and fast data erasure method that avoids unnecessary destruction of devices as much as possible and that is preferably compatible with the automation of data erasure of electronic devices.

[0022] The object is to provide a method for erasing data stored in a non-volatile memory of an electronic device, for example a portable device such as a smartphone or a tablet, comprising: - identification of each of the devices and / or memory to be illuminated in order to recognize the type of said device and / or memory; - determining, by the control unit, irradiation parameters corresponding to the device identified by the identification means; - Irradiating the electronic devices with at least one X-ray source enclosed within an X-ray opaque housing of an irradiation chamber capable of successively receiving a plurality of electronic devices carried into the chamber by a conveyor, the conveyor and the X-ray source being controlled by the control unit according to irradiation parameters including power and duration of irradiation to erase data contained in the non-volatile memory of the electronic devices.

[0023] According to another feature, the irradiation parameters include a principal axis of the X-ray beam generated by the X-ray source, which axis is inclined or inclinable with respect to the plane of the conveyor, the angle of which is determined by the control unit by the identification means.

[0024] According to another feature, the identification includes determining by the identification means the location and type of memory of the device to be irradiated, and the control unit drives the conveyor and the X-ray source depending on the location and type of memory determined during the irradiation.

[0025] According to another feature, the control unit drives the X-ray source by controlling the power and duration depending on the type of memory included in the electronic device.

[0026] According to another feature, the irradiation includes adjusting the position of each of the successive devices relative to the X-ray source depending on the components of the device.

[0027] According to another feature, the process includes positioning at least one protective mask between the X-ray source and the device to protect certain components of the device during exposure of the memory to the radiation source. [Brief explanation of the drawings]

[0028] Other characteristics and advantages of the present invention will become more apparent from the following description of various embodiments, which is given with reference to the accompanying drawings, in which: [Figure 1]1 is a schematic side view of an automatic data erasure device according to various embodiments. [Figure 2] 1 is a schematic side view of an automatic data erasure device according to various embodiments including a tiltable X-ray beam. [Figure 3] 1 is a schematic side view of an automatic data erasure device according to various embodiments, including a tiltable X-ray beam and a device positioning base. [Figure 4] 1 shows a schematic side view of an automatic data erasure device according to various embodiments, comprising a means for identifying the device by imaging and a means for locating the device. [Figure 5] 1A-1C show schematic side views of an automatic data erasure device in various embodiments, including a device positioning means and a protective mask. [Figure 6] 1A-1C show schematic side views of an automatic data erasure device in various embodiments, including a device positioning means and a protective mask. DETAILED DESCRIPTION OF THE INVENTION

[0029] This application relates to an automated device for erasing data stored in a non-volatile memory (M) of an electronic device (A), such as a portable device like a laptop, smartphone, or tablet, or any type of electronic or data storage device containing non-volatile memory, such as a solid-state disk (SSD) or "flash" type memory. The term "non-volatile memory" encompasses, for example, NAND or NOR type memories (i.e., flash and / or EEPROM) based on semiconductor technology (MOS, "metal-oxide-semiconductor") that use floating gate transistors (technologies known by the acronyms SLC, MLC, or TLC) that trap one or more electrons in charge traps (or cells), configured in the form of floating grids arranged in one or more layers (3D NAND technology), each electron corresponding to a bit of data that can be recorded and erased at will. While conventionally, to erase data in this type of memory, the bits are reset by accessing the memory through computer means using logic gates, this application proposes a faster data erasure method without requiring computer access to this type of memory, thanks to the use of X-rays calibrated to release the electrons trapped in the charge traps. To this end, the present invention proposes a calibration of illumination that takes into account the architecture of non-volatile memory. The present invention allows for the rapid erasure of personal data stored in the memory of electronic devices, such as portable devices like smartphones or tablets, or any other devices incorporating this type of memory (e.g., portable memory). Data erasure is particularly important with regard to preserving the confidentiality of a user's personal data (e.g., in the context of GDPR), especially when the user's device or equipment is intended to be reconditioned or recycled. While data erasure is generally cumbersome, the present invention allows for easy and rapid data erasure, offering advantages in terms of time and cost, regardless of the fate of the device from which data stored in non-volatile memory needs to be erased. Furthermore, for example, in the case of reconditioning, this data erasure should preferably avoid damaging other components of the device, and various embodiments of the present invention allow for addressing this issue.

[0030] Furthermore, various embodiments of the present invention provide several "levels" (or "types") of data erasure, depending on requirements (such as the user's wishes and / or needs). Indeed, unlike solutions known in the prior art for erasing data by irradiation, which aim to erase the entire memory, possibly irreversibly, the present invention proposes to prevent access to data while preserving the memory containing it and other components of the device in which they reside. To this end, some embodiments of the present invention propose to take into account not only the nature of the memory to be erased, but also the characteristics (hardware and software) of these devices. Indeed, in addition to taking precautions to avoid physically damaging device components, it is advantageous to take into account the software aspects of the device to be irradiated. For example, a first "level" of irradiation is designed to achieve partial erasure of the memory, making it impossible to access the data it contains without modifying the software recovery capabilities built into the device. In fact, devices such as smartphones or tablets integrate an operating system (software, e.g., iOS or Android) that manages the interoperability of the various components of the device. Therefore, some embodiments of the present invention propose only partially erasing the device's data, so that the operating system remains operational, and the next time the device is started, the device must be reinitialized, resulting in a complete erasure of the data. In the event of such a partial erasure, the device detects an anomaly and requests a reinstallation of the operating system (OS). This reinstallation typically requires a change of the encryption key used to encrypt the data, making previously recorded data unreadable in the newly installed version. Thus, instead of having to access the device's software to completely erase the data (which can be costly, especially if it doesn't work), automated partial erasure by irradiation ensures a complete erasure before the device can be immediately reused, remaining bootable and requiring only a complete reinitialization.The second "level" is also designed to irradiate the device in a more intense manner, causing a total erasure, even to the point of erasing some of the data necessary to run the device's operating system. In the case of 100% memory erasure (NAND), this second level currently renders the device unable to boot, requiring a complete reprogramming of the memory, as the operating system is 100% erased, as well as the microcontroller firmware on the memory chip itself. Depending on the requirements, users can choose between these two erasure levels.

[0031] Therefore, in some embodiments, the control unit (CU) may be configured to adjust the temperature within 100m to limit the risk of damaging the device (A) components. 2 .s- 2 The device can be configured to deliver a first type (or level) of irradiation with parameters providing a dose less than 1000 kJ / s (i.e., Gray or Joules per kilogram), while allowing for partial erasure of data in the device's memory (M), sufficient to bring the device (A) into a recovery mode upon next boot. For example, electronic devices such as smartphones or tablets incorporate firmware (or embedded software), which is an integrated computer program that allows them to operate and evolve (through the installation of updates). Once the device is partially erased in this way, it automatically boots into a recovery or restore mode, or into a device firmware update (DFU) mode, as the case may be (the difference being primarily the boot loader). Such a device boot mode requires the reinstallation of a new operating system, which implies the installation of new encryption keys, making it impossible to read data previously stored in memory cells without damaging the device. Preferably, in such an embodiment, the control unit (CU) drives the X-ray source to deliver irradiation for a duration of 1 to 8 minutes, preferably 2 to 5 minutes. In this way, the dose received by the memory is sufficient to erase a portion of the data without risking damage to the memory and maintaining device functionality.

[0032] On the other hand, in one embodiment, the control unit (CU) is configured to operate within a time period of 200-1000 m, so as to limit the risk of damaging the device components (A) while allowing for the complete erasure of data in the device memory (M), which would require reprogramming of the memory (M). 2 .s- 2 The device can be configured to deliver a second type of irradiation having parameters that provide a dose of 10 to 40 minutes (i.e., Gray or Joules / kg). Preferably, in such an embodiment, the control unit (CU) drives the X-ray source to deliver irradiation for a period of 10 to 40 minutes, preferably 20 to 30 minutes. After that, the device can no longer be started, even in a recovery mode or equivalent, and requires a complete reprogramming (e.g., "from factory"), although the integrity of the memory remains preserved and the device can operate normally after reprogramming.

[0033] As is clear from the above, the irradiation dose can be adjusted depending on the device, not only at the hardware level but also at the software level, where the sensitivity of the device depends on the memory and other components irradiated, and the sensitivity of this memory depends on its architecture and composition (in terms of the materials used), and all these aspects can be taken into account in the present invention.

[0034] An automatic data erasure apparatus according to various preferred embodiments of the present invention features a radiation chamber (1) (or "cabin") with at least one X-ray source (S) enclosed in an X-ray-tight enclosure (or "radio-opaque enclosure") and capable of successively receiving a plurality of electronic devices (A), which can be conveyed into the chamber (1) by a conveyor (2). Such X-ray-opaque chambers (1) are known in the art and are necessary for user protection, particularly for the irradiation power used in carrying out the present invention. The conveyor (2) may be, for example, a conveyor belt on which the devices (A) to be irradiated are sequentially placed, e.g., after their identification, as described in more detail below. The apparatus, in turn, comprises a control unit (CU) that controls the conveyor (2) and the X-ray source (S) to irradiate each of the electronic devices (A) with a controlled power and duration in order to erase the data contained in the non-volatile memory (M) of the electronic devices (A). Thus, the chamber (1) has a hermetically sealed X-ray enclosure (i.e., an X-ray-opaque enclosure), and the devices (A) enter the X-ray enclosure via a conveyor through at least one door (e.g., a single door if the conveyor shuttles through a single entrance-exit of the chamber, or two doors if the conveyor traverses the chamber, such doors being able to slide, for example, perpendicular to the plane of the conveyor), preferably preventing any leakage of radiation from the chamber (1). These doors are controlled by a control unit (CU) when the devices (A) are moved in front of the X-ray source (S). The opening and closing of the doors is therefore controlled for each device individually or for a batch of several devices simultaneously, according to the exposure time of the devices (A) in the chamber (1). With regard to the exposure and control of the X-ray source (S), the applicant has observed that, as will be explained in more detail below, due to the nature of the memory (M) and / or other components they contain, it is necessary to control both the power and duration of the exposure of the various devices (A).It will be understood from the present application and the drawings that the X-ray source can irradiate the device from above (e.g. as in Figures 1 and 2) or from below (e.g. as in Figures 3, 4, 5 and 6), that various configurations of chambers or tunnels and conveyors are possible, and that the heating means and / or image and / or position capture means (for tracking and / or aligning the devices in their path during the process) are adapted to the control performed by the control unit, as detailed in the present application. For example, Figure 4 shows heating chambers (H) upstream and downstream of the irradiation chamber (1), and shows a preliminary view of the upstream heating chamber (H) for device identification, but a person skilled in the art will understand that many variations are possible and that the figure represents only an illustrative and non-limiting example.

[0035] In various preferred embodiments of the present invention, the control unit (CU) drives the X-ray source by controlling the power and duration based on the type of memory (M) included in the electronic device (A). Indeed, depending on the type of memory (M) and its architecture, the applicant has observed that the duration and power of the irradiation must be adjusted to ensure data erasure. For example, "cheap" or "low-end" memory is often more sensitive than higher-quality memory. On the other hand, certain memories (M) are designed to be protected from radiation, especially when the electronic device (A) passes through airport scanners. Therefore, these memories require more power and duration than unprotected memories. Furthermore, the location of memories (M) within the electronic device (A) varies greatly, to the point where some memories (M) are intentionally or accidentally protected by the presence of other components within the device (A). Finally, there are three-dimensional architecture memories, such as those using a technology known as 3D NAND or vertical NAND (V-NAND), which are non-volatile memories, in which cells are vertically stacked to increase storage density. This type of memory requires more irradiation and / or more sophisticated irradiation (e.g., specific irradiation) than single-layer memories. All these aspects lead to the need to know the type of memory and its location in order to control the irradiation and adjust its power and duration depending on the model of electronic device (A) from which data erasure is desired. This affects the speed of the conveyor (2) that carries successive devices (A) into the chamber (1), and in particular involves adjusting the power and / or duration of the irradiation according to the desired "level" (or type) of erasure. Therefore, the control unit (CU) needs to be able to control these parameters thanks to knowledge of the type of device (A) and / or memory (M) to be irradiated, for example by the serial number of the device (A). Therefore, device identification means are provided to enable the control unit to manage the necessary operations (e.g., device cadence, irradiation power, beam and / or device tilt, etc.) for each successive device.This identification (i.e., knowledge) can be provided by a user inputting parameters to be used by the control unit or selecting the parameters to be used from multiple parameters stored in the control unit's memory. Preferably, various devices (A) of the same type are pre-arranged to be transported in succession so that the parameters and speed are constant, but the present invention provides for variation of these depending on the type of device (A) arranged on the conveyor. In certain embodiments, means for identifying electronic devices (A) are provided for automatic recognition of the devices (A) and adjustment of irradiation parameters by the control unit using a memory that stores corresponding parameters for the recognized devices (A). In certain embodiments, a human-machine interface (HMI), one illustrative and non-limiting example of which is shown in FIG. 2, is provided to allow a user to control the irradiation parameters (using input or selection means) and / or monitor their progress (using image capture means within the chamber that displays the irradiation area and the device being irradiated). In some embodiments, the identification means comprises at least one computer file in which the technical characteristics of each of the successive devices placed on the conveyor (2) are listed, for example via serial number or model, and the control unit determines the parameters to be used for each device based on this file and a database storing device characteristics (A). Such a database can be stored locally or remotely and enhanced with each new device encountered.

[0036] In some embodiments, the identification means comprises a reader capable of reading a code pre-attached to said device (A). Such a code may be a bar or QR code, or any other means that is easily readable by the reader and allows the devices processed by the device to be identified. Preferably, this code is used to track each device as it is processed by the device or process of the present application and is preferably verified at each stage, so that a certificate of erasure can be issued when it leaves the device (at the end of the method). In some embodiments, this device identification code may be generated from an order placed by a user who wishes to erase their data. When the device is received, the generated code is attached to the device, identifying it until a certificate of erasure is issued.

[0037] The device according to any one of the preceding claims, characterized in that the identification means comprises means for recognizing the device's components and their arrangement from at least one image of the device obtained by an imaging process using irradiation at a dose lower than that used to erase the data in the memory (M). Indeed, it is possible to acquire an image of the device using low-power irradiation (much lower than that used for erasure, e.g., comparable to that used at security gates, especially at airports) and determine which components are present, or even identify the model of the device using, for example, artificial intelligence trained on a large number of data from known electronic devices and programmed against a set of references to extract criteria relevant to locating and identifying the components to be erased and protected. While such irradiation may be performed by the X-ray source (S) used for erasure, it is generally preferable to use a separate X-ray source upstream of the erasure chamber (e.g., as shown in Figure 4). Thanks to such imaging, which preserves the device components, the device can adjust irradiation parameters (beam and / or device tilt, power, duration, location of irradiated areas and / or areas protected, for example, by a mask). For example, a camera in a heated tunnel upstream of the chamber could be used to identify the device. The camera provides information about the characteristics of the device, which are then identified by the AI, which then provides information about the targeting and radiation intensity of the irradiation chamber.

[0038] FIG. 1 shows a schematic diagram of an automatic data erasure apparatus according to various preferred embodiments. In some of these embodiments, the X-ray source includes a tungsten or molybdenum target (CX). This type of target has proven particularly advantageous for delivering an effective X-ray beam for erasing data in the memory (M) of a commercially available electronic device (A). In addition, the present applicant has observed that among the important parameters for irradiating the memory (M) to erase data, the power supply voltage of the X-ray source is as important as the target strength of the X-ray source. Therefore, selection of the voltage, target, and target strength is necessary to achieve the desired results.

[0039] In some of these embodiments, the X-ray source comprises a beryllium window (F). This type of window has the advantage of filtering out high-energy rays and allowing low-energy rays to pass. The use of a thin beryllium window has been shown to be particularly advantageous for obtaining effective irradiation for data erasure. Aluminum is also an advantageous material for the window, as it particularly filters low-energy photons. Various types of X-ray sources and windows are possible.

[0040] Aluminum windows can also be used with different parameters. Indeed, the voltage and intensity must be adjusted depending on the material used for the target and / or window, and the target intensity may vary from case to case. Similarly, the parameters (especially the intensity) vary depending on the distance between the X-ray source (S) and the device to be irradiated. Thanks to the explanations provided in this application, those skilled in the art can adjust the parameters to obtain an effective irradiation according to the type of configuration selected, especially with regard to the material and the distance between the target and the device. For example, in the case of a beryllium window, some embodiments provide for the control unit (CU) to control the irradiation output by controlling the supply voltage of the X-ray source to 175 kilovolts to 300 kilovolts and the target X-ray source intensity to hundreds of microamperes to tens of milliamperes, for example, 250 microamperes to 100 milliamperes, preferably around 20 milliamperes. On the other hand, the irradiation time strongly depends on the type of memory (M) present in the device to be irradiated. Therefore, the control unit (CU) controls the X-ray source to deliver irradiation for a duration ranging from 1 to 8 minutes, preferably 2 to 5 minutes.

[0041] On the other hand, for example, in some embodiments, the distance between the X-ray source (S) and the device or conveyor carrying the device may be between 1 centimeter and 20 centimeters, depending particularly on the type of device; computers generally require a different distance than smartphones. However, in many cases, a distance of 2.5 to 4 centimeters is preferred. In fact, the present applicant has observed that erasure is most effective when the memory to be erased is only 2 to 3 centimeters away from the X-ray source (S). However, greater distances are possible, particularly at higher intensities and / or depending on the type of window used.

[0042] On the other hand, it has been observed that memory is less likely to be damaged by ionizing radiation if it is preheated. Therefore, various embodiments provide for preheating the device upstream of the erase chamber, preferably below a critical temperature of about 50°C, to protect device components, particularly their battery and / or screen. Additionally, in some embodiments, device heating is provided at the exit from the erase chamber (regardless of whether a preheat chamber is present upstream). For example, a heating tunnel may be provided at the exit of the irradiation chamber, so that heat can fill any irradiation-induced holes, particularly on other components such as the microcontroller. For devices without heat-sensitive components (e.g., SSDs), the temperature of the heat tunnel at the exit can reach a temperature of about 120°C to shorten post-processing time.

[0043] Generally speaking, device identification allows various exposure parameters to be adjusted to achieve first-level or second-level erasure without damaging memory and other device components. Such adjustments typically involve limiting and targeting the irradiated area by controlling the relative position and orientation (e.g., tilt) of the X-ray source and device using positioning means (P) and / or shielding specific areas with protective masks. In some embodiments, the X-ray source (S) generates a beam of X-rays that irradiates the device (A) along a tilted or tiltable major axis (AF) relative to the conveyor plane. Indeed, the present applicants have recognized that irradiation with a beam that is not perpendicular to the conveyor plane can, in some cases, facilitate data erasure, especially in the case of memories with three-dimensional structures. Furthermore, such a tilted beam often makes it possible to avoid, or at least limit the risk of damage to, other components of the electronic device (A) whose memory contents are being erased. FIG. 2 depicts an illustrative, non-limiting example of such an embodiment with a tilted major axis (AF) of the X-ray beam. The control unit (CU) is then configured to control the beam tilt depending on the identification of the device (A) being irradiated, for example, under the control of a user using a human-machine interface (HMI) or under the control of parameters stored in a memory. It is not necessary to explain in more detail here the control of the tilt of the X-ray beam, which is well known to those skilled in the art. It will be understood from the present application that the tilt may be a fixed angle determined based on the preferred angles of most known devices (A), or it may be variable and adjustable by the control unit (CU) controlling the X-ray source and the motor that tilts its beam, for example, depending on the identification of successive devices (A) brought into the chamber (1). In some embodiments, the control unit (CU) also controls the tilt of the main axis of the beam depending on the type of device present in the chamber (1).The spindle can therefore be tilted at various angles relative to the conveyor plane, so that the X-ray beam can be optimally targeted at the memory (M) according to its architecture and / or its positioning relative to other components of the device (A) that includes it. The X-ray source (S) can therefore be attached to at least one motor configured to displace the X-ray source (S) relative to the conveyor. This displacement can therefore be controlled by a control unit (CU) that determines the focal point at which the X-ray beam should be centered within the target device at each instant. Such tilting of the ionizing radiation beam is particularly advantageous for memories with sophisticated three-dimensional structures, such as the 3D-NAND described earlier in this specification. As an alternative to or in combination with such beam tilting, various embodiments of the present invention also provide for tilting the device (A) itself so that the memory it contains can be optimally irradiated for data erasure, while preserving other components of the device (some of which may be particularly sensitive to ionizing radiation (e.g., OLED-type displays, etc., which means that it is preferable to irradiate the device from its "edge," i.e., lateral edge). Indeed, the present application provides not only beam tilting but also device tilting to optimize their positioning relative to the beam. The device according to any one of the preceding claims, characterized in that it comprises positioning means (P) capable of positioning each successive device at a position in three-dimensional space determined according to the identity of the device (A). Such positioning means can, for example, comprise a receptacle or base or mold (possibly fitted with a protective mask) configured to receive the devices in an arrangement (orientation and position) optimized for preserving their components during irradiation. Figure 3 shows a non-limiting example of such a base for the positioning device (combined with tilting the ionizing radiation beam). Such positioning means may also include device gripping means (e.g., an articulating arm fitted with suction cups or grippers for gripping the devices) configured to position them in an appropriate manner determined by their identification.Figures 4 and 5 show, in a non-limiting manner, examples of such positioning means, for example comprising articulated gripping means that allow the device to be positioned as needed (Figure 4 represents an example in which the device is positioned perpendicular to the plane of the conveyor in order to illuminate the device without damaging the screen (especially of the OLED type)).

[0044] In addition to this positioning and targeting of the beam on the memory to be erased, it may be useful or even necessary to provide protection for certain components by means of materials capable of stopping radiation, such as lead plates or other suitable materials known for this property. Thus, in some embodiments, the device comprises at least one protective mask (MP) positionable between the X-ray source and the device to protect certain components of the device (A) during exposure of the memory (M) to the radiation source. Such a mask can be obtained in many ways within the skill of those skilled in the art. The following are only some illustrative and non-limiting examples. For example, a barrel containing multiple masks with radiopaque zones can be attached to the X-ray source. It will be understood that such sealed zones can be made of various materials with different thicknesses depending on the radiation power (depending on the absorption coefficient). Alternatively, it is possible to provide radiopaque plates with shapes and dimensions adapted to at least one type of device, and these plates can be changed for successive devices. FIG. 6 provides a non-limiting example of such a mask, which may be fed perpendicular to the axis of a conveyor carrying the device into the chamber to interpose a mask determined according to the device's identification between the X-ray source and the device.

[0045] It will be appreciated that the present invention also relates to a reliable and fast method for data erasure, which avoids as far as possible the unnecessary destruction of devices and is preferably compatible with the automation of electronic data erasure. Indeed, thanks to the proposed configurations and / or parameters specified by the applicant of the present application, the present invention also provides an effective method of data erasure, which allows saving time and better preservation of the materials and components of device (A), which, when destroyed, are the main source of contamination.

[0046] The present invention therefore relates to a method for erasing data stored in a non-volatile memory (M) of an electronic device (A), for example a portable device such as a smartphone or a tablet, characterized in that the electronic device (A) is irradiated by at least one X-ray source (S) of X-rays enclosed in an X-ray-opaque enclosure (or "X-ray sealed enclosure") of an irradiation chamber (1) capable of successively receiving a plurality of such electronic devices (A), which may be conveyed into the chamber by a conveyor (2), wherein the conveyor (2) and the X-ray source (S), controlled by a control unit (CU), control the power and duration of the irradiation for erasing the data contained in the non-volatile memory (M) of the electronic device (A). The various embodiments of the device described in this application also apply to the method, which may comprise various steps and use various parameters according to the functions described in this application. For example, the method may comprise a tilt of a light beam adjusted by the control unit depending on the architecture of the device to be irradiated (e.g. the location of the memory relative to other components).

[0047] This application describes various technical features and advantages with reference to drawings and / or various embodiments. Those skilled in the art will understand that the technical features of a given embodiment may actually be combined with the features of another embodiment unless expressly stated to the contrary, or unless it is clear that these features are incompatible, or unless it is clear that the combination does not provide a solution to at least one of the technical problems addressed in this application. Furthermore, a technical feature described in a given embodiment may be considered separately from other features of that embodiment, unless expressly stated otherwise. [Explanation of symbols]

[0048] M: Non-volatile memory A:Electronic equipment 1: Chamber S:X-ray source 2: Conveyor CU: Control unit AF: Main axis of the X-ray beam CX: X-ray source target F: X-ray source window IHM: Human Machine Interface P: Positioning means MP: Protective mask H: Heating chamber

Claims

1. 1. An automated device for erasing data stored in a non-volatile memory (M) of an electronic device (A), for example a portable device such as a smartphone or tablet, comprising:

1. An automated device comprising: an irradiation chamber (1) enclosed in an X-ray-opaque enclosure and comprising at least one X-ray source (S) capable of successively receiving a plurality of electronic devices (A) brought into said chamber (1) by a conveyor (2); means for identifying each of said devices (A) in order to recognize the type of device (A) and / or memory (M) to be irradiated; and a control unit (CU) for controlling said conveyor (2) and said X-ray source (S) to irradiate each of said electronic devices (A) with controlled power and duration according to irradiation parameters corresponding to said device (A) identified by said identification means in order to erase data contained in the non-volatile memory (M) of said electronic devices (A).

2. 2. The device according to claim 1, wherein the control unit (CU) determines the location and type of memory (M) of the device (A) to be irradiated by the identification means, and controls the conveyor (2) and the X-ray source (S) according to the determined location and type of memory (M).

3. 3. Apparatus according to claim 2, characterized in that the X-ray source (S) generates an X-ray beam which irradiates the device (A) along a main axis (AF) inclined or tiltable relative to the plane of the conveyor, the angle of this main axis (AF) being determined by the control unit (CU) by the identification means.

4. 4. The device according to claim 1, wherein the control unit (CU) controls the X-ray source by monitoring the power and duration depending on the type of memory (M) contained in the electronic device (A).

5. The control unit (CU) is adapted to limit the risk of damaging the components of the device (A) by 100m ２ .s- ２ 5. The device according to claim 1, characterized in that it is configurable to deliver a first type of irradiation having parameters providing a dose of less than 1000 kJ / kg (i.e. Gray or Joules / kg), while allowing a partial erasure of data in the memory (M) of said device (A), but sufficient to impose a reset of said device (A) at the next start-up, which means a new installation and a complete erasure of the operating system.

6. The control unit (CU) is adapted to operate for a period of 200-1000 m, so as to limit the risk of damaging the components of the device (A) while allowing a complete erasure of the data in the memory (M) of the device, which would require reprogramming of the memory (M). ２ .s- ２ 6. The device of claim 1, wherein the device is configurable to deliver a second type of radiation having parameters providing a dose in Gy or Joules / kg.

7. 7. Apparatus according to any one of claims 1 to 6, characterized in that the identification means comprise at least one computer file listing the serial number or model of each of the successive devices placed on the conveyor (2), and the pilot unit determines the parameters to be used for each of the devices from this file and from a database storing the characteristics of the devices (A).

8. A device according to any one of claims 1 to 7, characterized in that the identification means comprise a code reader attached to the device (A).

9. 9. The device according to claim 1, wherein said identification means comprise means for recognizing said components of said device and their arrangement from at least one image of said device obtained by an imaging process with irradiation at a dose lower than that used to erase said data in said memory (M).

10. Apparatus according to any one of claims 1 to 9, characterized in that it comprises a preheating chamber for preparing the memory (M) before passing in front of the X-ray source (S).

11. Device according to any one of the preceding claims, characterized in that it comprises a heating chamber at the outlet of the irradiation chamber in order to improve the condition of certain components of the device after irradiation.

12. 12. Apparatus according to any one of claims 1 to 11, characterized in that it comprises positioning means (P) capable of placing each of said successive devices at a position in three-dimensional space determined depending on said identification of said device (A).

13. 13. Apparatus according to any one of claims 1 to 12, characterized in that it comprises at least one protective mask (MP) which can be placed between the X-ray source and the apparatus (A) in order to protect certain components of the apparatus (A) during exposure of the memory (M) to the radiation source.

14. 14. Apparatus according to any one of claims 1 to 13, characterized in that the control unit (CU) controls the irradiation power by controlling the supply voltage of the X-ray source between 175 and 300 kilovolts and the target intensity of the X-ray source between 250 microamperes and 100 milliamperes, preferably 20 milliamperes.

15. Apparatus according to any one of the preceding claims, characterized in that the X-ray source comprises a target (CX) made of tungsten or molybdenum.

16. Device according to any one of the preceding claims, characterized in that the X-ray source comprises a window (F) made of beryllium or aluminium.

17. Device according to any one of the preceding claims, characterized in that the distance between the X-ray source (S) and the conveyor transporting the device is between 1 and 20 centimeters, preferably between 2.5 and 4 centimeters.

18. A method for erasing data stored in a non-volatile memory (M) of an electronic device (A), for example a mobile device such as a smartphone or a tablet, comprising: - identification of each of the devices (A) and / or memories (M) to be illuminated in order to recognize their type; - determination by a control unit (CU) of irradiation parameters corresponding to said device (A) identified by said identification means; - irradiation of the electronic devices (A) by at least one X-ray source (S) enclosed in an X-ray opaque enclosure of an irradiation chamber (1) capable of successively receiving a plurality of electronic devices (A) conveyed into said chamber by a conveyor (2), said conveyor (2) and said X-ray source (S) being controlled by said control unit (CU) according to said irradiation parameters comprising the power and duration of irradiation for erasing the data contained in the non-volatile memory (M) of said electronic devices (A); A method comprising:

19. 19. The method according to claim 18, characterized in that the exposure parameters include a principal axis (AF) of the X-ray beam generated by the X-ray source, which axis (AF) is inclined or inclinable with respect to the conveyor plane, and the angle of this principal axis (AF) is determined by the control unit (CU) by the identification means.

20. 20. The method according to claim 18 or 19, characterized in that the identification comprises the determination by the identification means of the location and type of a memory (M) of the device (A) to be irradiated, and the control unit drives the conveyor (2) and the X-ray source (S) depending on the location and type of this memory (M) determined during the irradiation.

21. 21. The method according to any one of claims 18 to 20, characterized in that the control unit (CU) drives the X-ray source by controlling its power and duration depending on the type of memory (M) contained in the electronic device (A).

22. 22. Method according to any one of claims 18 to 21, characterized in that the irradiation comprises adjusting the position of each of the successive devices relative to the X-ray source depending on the components of the device (A).

23. 23. The method according to any one of claims 18 to 22, characterized in that it comprises positioning at least one protective mask (MP) between the X-ray source and the device (A) to protect certain components of the device (A) during exposure of the memory (M) to the radiation source.

Images