Heat exchanger test device and heat exchanger test method

Abstract

To provide a heat exchanger testing device capable of switching, within a short time, between a state where a high-temperature fluid flows into a primary side of a heat exchanger and a state where a low-temperature fluid flows into the primary side of the heat exchanger.SOLUTION: A heat exchanger testing device 100 is a testing device for a heat exchanger 10 including a primary-side passage 11 and a secondary-side passage 12 and comprises: a high-temperature passage 22 and a low-temperature passage 23 configured to communicate with the primary-side passage 11; a high-temperature branch path 25 branched from the high-temperature passage 22; a low-temperature branch path 26 branched from the low-temperature passage 23; and switch means 15 for switching a test state between a high-temperature test state where a fluid from the high-temperature passage 22 is mainly introduced to the primary-side passage 11 while a fluid from the low-temperature passage 23 is introduced to the low-temperature branch path 26, and a low-temperature test state where the fluid from the low-temperature passage 23 is mainly introduced to the primary-side passage 11 while the fluid from the high-temperature passage 22 is introduced to the high-temperature branch path 25.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a testing device for a heat exchanger and a testing method for a heat exchanger. [Background technology]

[0002] Conventionally, in various industrial fields, various heat exchangers that perform heat exchange between a fluid on a primary side (heat source side) and a fluid on a secondary side (use side) are known. For example, heat exchangers are sometimes used in an environment where the fluid flowing into the primary side changes from high to low temperature or low to high temperature in a short period of time. In such heat exchangers, thermal stress caused by the temperature difference between the high-temperature fluid and the low-temperature fluid causes deformation and deterioration of each part of the heat exchanger, so a test device for evaluating such heat exchangers is desired. Summary of the Invention [Problem to be solved by the invention]

[0003] When creating such a test device, it is conceivable to configure the fluid flowing into the primary side of the heat exchanger under test to alternate between a fluid conditioned to a high temperature and a fluid conditioned to a low temperature. However, since it takes time to adjust the temperature of the fluid using a heater and a cooler, that is, time to raise and lower the temperature of the fluid, it is difficult to switch between the fluid conditioned to a high temperature and the fluid conditioned to a low temperature in a short time and flow into the primary side of the heat exchanger.

[0004] The present invention has been made in consideration of the above-mentioned conventional technology, and has as its object to provide a testing device for heat exchangers that can quickly switch between a state in which a fluid conditioned to a high temperature flows into the primary side of the heat exchanger, and a state in which a fluid conditioned to a low temperature flows into the primary side of the heat exchanger. [Means for solving the problem]

[0005] In order to achieve the above object, a heat exchanger testing device according to the present invention is a testing device for testing a heat exchanger having a primary side flow path and a secondary side flow path, and includes a high-temperature flow path configured to be connected to the primary side flow path, a low-temperature flow path configured to be connected to the primary side flow path, a high-temperature branch path branching off from the high-temperature flow path, a low-temperature branch path branching off from the low-temperature flow path, and a switching means for switching a test state between a high-temperature test state in which a fluid from the high-temperature flow path is mainly introduced into the primary side flow path as a primary side fluid while a fluid of the low-temperature flow path is introduced into the low-temperature branch path, and a low-temperature test state in which a fluid from the low-temperature flow path is mainly introduced into the primary side flow path as a primary side fluid while a fluid of the high-temperature flow path is introduced into the high-temperature branch path. The low-temperature flow path is provided with a cooler for cooling the fluid and a heater for heating the fluid. is.

[0006] In the heat exchanger testing device according to the present invention, when the testing state of the testing device is switched to the high-temperature testing state by the switching means, the fluid in the high-temperature flow path mainly flows into the primary-side flow path of the heat exchanger as the primary-side fluid, while the fluid in the low-temperature flow path flows into the low-temperature branch path. Then, when the high-temperature testing state is switched to the low-temperature testing state, the fluid in the low-temperature flow path that had been flowing toward the low-temperature branch path mainly flows into the primary-side flow path, while the fluid in the high-temperature flow path that had been flowing toward the primary-side flow path flows into the high-temperature branch path. In other words, when the testing state is switched, the destination of the fluid that had been flowing into the branch path is switched to the heat exchanger, so that the testing state can be switched in a short time.

[0007] Furthermore, it is possible to adjust the temperature of the fluid introduced into the branch path from the high-temperature flow path or the low-temperature flow path before switching the test state, so that when the test state is switched, the temperature-adjusted fluid can be immediately flowed into the primary flow path of the heat exchanger as the primary fluid.

[0008] In this way, it is possible to quickly switch between a state in which a primary side fluid regulated to a high temperature is introduced into the primary side of the heat exchanger and a state in which a primary side fluid regulated to a low temperature is introduced. Furthermore, since a cooler and a heater are provided in the low-temperature flow path, during low-temperature testing, the temperature of the fluid in the low-temperature flow path can be adjusted and introduced into the primary flow path regardless of the set temperature of the fluid flowing in the primary flow path.As a result, this heat exchanger testing device can be used for testing to evaluate heat exchangers used in environments in which the temperature of the fluid flowing into the primary flow passage changes.

[0009] The present invention Heat exchanger test equipment: a high-temperature test state in which a fluid from the high-temperature flow path is mainly introduced into the primary-side flow path as a primary-side fluid while a fluid from the low-temperature flow path is introduced into the low-temperature branch path, and a low-temperature test state in which a fluid from the low-temperature flow path is mainly introduced into the primary-side flow path as a primary-side fluid while a fluid from the high-temperature flow path is introduced into the low-temperature branch path; and a switching means for switching a test state between a high-temperature test state in which a fluid from the low-temperature flow path is mainly introduced into the primary-side flow path as a primary-side fluid while a fluid from the high-temperature flow path is introduced into the high-temperature branch path; The present invention includes a circulation circuit for circulating a secondary fluid introduced into the secondary flow path, and a heat utilization device provided in the circulation circuit and connected to the high-temperature branch path and the low-temperature branch path. picture, When the switching means is switched to a high temperature test state, a fluid may be introduced into the heat utilization device from the low temperature branch path, and when the switching means is switched to a low temperature test state, a fluid may be introduced into the heat utilization device from the high temperature branch path. R .

[0010] In the heat exchanger testing device according to the present invention, when the testing state of the testing device is switched to the high-temperature testing state by the switching means, the fluid in the high-temperature flow path mainly flows into the primary-side flow path of the heat exchanger as the primary-side fluid, while the fluid in the low-temperature flow path flows into the low-temperature branch path. Then, when the high-temperature testing state is switched to the low-temperature testing state, the fluid in the low-temperature flow path that had been flowing toward the low-temperature branch path mainly flows into the primary-side flow path, while the fluid in the high-temperature flow path that had been flowing toward the primary-side flow path flows into the high-temperature branch path. In other words, when the testing state is switched, the destination of the fluid that had been flowing into the branch path is switched to the heat exchanger, so that the testing state can be switched in a short time. Furthermore, it is possible to adjust the temperature of the fluid introduced into the branch path from the high-temperature flow path or the low-temperature flow path before switching the test state, so that when the test state is switched, the temperature-adjusted fluid can be immediately flowed into the primary flow path of the heat exchanger as the primary fluid. In this way, it is possible to quickly switch between a state in which a primary-side fluid regulated to a high temperature is introduced into the primary side of the heat exchanger and a state in which a primary-side fluid regulated to a low temperature is introduced into the primary side of the heat exchanger, and as a result, the heat exchanger testing device can be used in tests to evaluate heat exchangers used in environments in which the temperature of the fluid flowing into the primary side flow path changes. moreover In a high-temperature test state, the fluid of the high-temperature flow path may be introduced into the primary flow path of the heat exchanger, while the fluid of the low-temperature flow path may be introduced into the heat utility through the low-temperature branch path. In this case, the secondary fluid heated by the primary fluid can be cooled in the heat utility by the fluid from the low-temperature branch path. Similarly, in a low-temperature test state, the fluid of the low-temperature flow path may be introduced into the primary flow path of the heat exchanger, while the fluid of the high-temperature flow path may be introduced into the heat utility through the high-temperature branch path. In this case, the secondary fluid cooled by the primary fluid can be heated in the heat utility by the fluid from the high-temperature branch path. Therefore, it is possible to utilize the fluid flowing in the high-temperature branch path and the low-temperature branch path for temperature adjustment of the fluid flowing in the circulation circuit.

[0011] The heat exchanger testing apparatus may include a heating and cooling unit that adjusts the temperature of the secondary fluid circulating through the circulation circuit, and the heat utilization device may be arranged in the circulation circuit upstream of the heating and cooling unit in the flow direction of the secondary fluid.

[0012] In this embodiment, the secondary fluid is auxiliary cooled or heated by the fluid introduced from the low temperature flow path or the high temperature flow path in the heat utilization device, and then introduced into the heating and cooling unit. Therefore, the amount of heat required for heating or cooling the secondary fluid in the heating and cooling unit can be reduced, and a heating and cooling unit with reduced heating and cooling capacity can be used.

[0013] The high-temperature branch passage may include a high-temperature connection passage configured to connect from the high-temperature passage to the heat utilization device, and a high-temperature discharge passage for discharging fluid from the high-temperature passage, and the switching means may be configured to select a destination for the fluid in the low-temperature passage or distribute the fluid in the low-temperature passage between the low-temperature connection passage and the low-temperature discharge passage in the high-temperature test state, and to select a destination for the fluid in the high-temperature passage or distribute the fluid in the high-temperature passage between the high-temperature connection passage and the high-temperature discharge passage in the low-temperature test state.

[0014] In this embodiment, in the high temperature test state, the fluid of the high temperature flow path is introduced into the primary flow path of the heat exchanger, while the fluid of the low temperature flow path can be selected to be introduced into the low temperature communication path or the low temperature discharge path. Or the fluid of the low temperature flow path can be distributed between the low temperature communication path and the low temperature discharge path and introduced. Similarly, in the low temperature test state, the fluid of the low temperature flow path is introduced into the primary flow path of the heat exchanger, while the fluid of the high temperature flow path can be selected to be introduced into the high temperature communication path or the high temperature discharge path. Or the fluid of the high temperature flow path can be distributed between the high temperature communication path and the high temperature discharge path and introduced. That is, it is possible to select whether or not to use the heat utilization device, and the heat of the fluid of the high temperature flow path and the low temperature flow path can be utilized by the heat utilization device as necessary. Or the flow rate can be adjusted and distributed to the heat utilization device as necessary.

[0015] The heat exchanger testing apparatus may further include a high-temperature side temperature sensor provided in the high-temperature flow path or the high-temperature branch path, a low-temperature side temperature sensor provided in the low-temperature flow path or the low-temperature branch path, and a secondary-side temperature sensor for detecting the temperature of the secondary-side fluid flowing through the circulation circuit, and the switching means may be further configured to select a destination for the fluid in the low-temperature flow path or distribute the fluid in the low-temperature flow path between the low-temperature connection path and the low-temperature discharge path in the high-temperature test state based on the temperatures of the fluid detected by the high-temperature side temperature sensor, the low-temperature side temperature sensor, and the secondary-side temperature sensor, and to select a destination for the fluid in the high-temperature flow path or distribute the fluid in the high-temperature flow path between the high-temperature connection path and the high-temperature discharge path in the low-temperature test state.

[0016] In this embodiment, the use or non-use of the heat utilization device can be switched according to the temperature of the fluid in the high-temperature passage, the fluid in the low-temperature passage, and the secondary fluid. Alternatively, since each fluid is distributed and introduced, the flow rate can be adjusted as necessary to distribute it to the heat utilization device.

[0017] The present invention Heat exchanger test equipment: a high-temperature test state in which a fluid from the high-temperature flow path is mainly introduced into the primary-side flow path as a primary-side fluid while a fluid from the low-temperature flow path is introduced into the low-temperature branch path, and a low-temperature test state in which a fluid from the low-temperature flow path is mainly introduced into the primary-side flow path as a primary-side fluid while a fluid from the high-temperature flow path is introduced into the low-temperature branch path; and a switching means for switching a test state between a high-temperature test state in which a fluid from the low-temperature flow path is mainly introduced into the primary-side flow path as a primary-side fluid while a fluid from the high-temperature flow path is introduced into the high-temperature branch path; The high-temperature side heat utilization device is connected to the high-temperature branch path and heats a portion of the high-temperature flow path downstream of the branch point of the high-temperature branch path by a fluid flowing through the high-temperature branch path, and the low-temperature side heat utilization device is connected to the low-temperature branch path and cools a portion of the low-temperature flow path downstream of the branch point of the low-temperature branch path by a fluid flowing through the low-temperature branch path. R .

[0018] In the heat exchanger testing device according to the present invention, when the testing state of the testing device is switched to the high-temperature testing state by the switching means, the fluid in the high-temperature flow path mainly flows into the primary-side flow path of the heat exchanger as the primary-side fluid, while the fluid in the low-temperature flow path flows into the low-temperature branch path. Then, when the high-temperature testing state is switched to the low-temperature testing state, the fluid in the low-temperature flow path that had been flowing toward the low-temperature branch path mainly flows into the primary-side flow path, while the fluid in the high-temperature flow path that had been flowing toward the primary-side flow path flows into the high-temperature branch path. In other words, when the testing state is switched, the destination of the fluid that had been flowing into the branch path is switched to the heat exchanger, so that the testing state can be switched in a short time. Furthermore, it is possible to adjust the temperature of the fluid introduced into the branch path from the high-temperature flow path or the low-temperature flow path before switching the test state, so that when the test state is switched, the temperature-adjusted fluid can be immediately flowed into the primary flow path of the heat exchanger as the primary fluid. In this way, it is possible to quickly switch between a state in which a primary-side fluid regulated to a high temperature is introduced into the primary side of the heat exchanger and a state in which a primary-side fluid regulated to a low temperature is introduced into the primary side of the heat exchanger, and as a result, the heat exchanger testing device can be used in tests to evaluate heat exchangers used in environments in which the temperature of the fluid flowing into the primary side flow path changes. lowIn the high-temperature test state, the temperature is likely to drop downstream of the high-temperature branch in the high-temperature flow path because no high-temperature fluid flows there. However, the high-temperature side heat utilization device heats the part downstream of the high-temperature branch in the high-temperature flow path, preventing the temperature from dropping at that part. Similarly, in the high-temperature test state, the temperature is likely to rise downstream of the low-temperature branch in the low-temperature flow path because no low-temperature fluid flows there. However, the low-temperature side heat utilization device cools the part downstream of the low-temperature branch in the low-temperature flow path, preventing the temperature from rising at that part.

[0020] The method for testing a heat exchanger according to the present invention comprises: a high-temperature flow path, a low-temperature flow path, and a high-temperature branching off from the high-temperature flow path. Crossroads and a low-temperature flow path branched off from the low-temperature flow path. Crossroads Equipped with The low-temperature flow path is provided with a cooler for cooling the fluid and a heater for heating the fluid. A testing method for testing a heat exchanger having a primary side flow path and a secondary side flow path using a testing device, the method including: a step of connecting the high-temperature flow path and the low-temperature flow path to the primary side flow path of the heat exchanger; a high-temperature testing step of testing the heat exchanger by introducing a fluid mainly from the high-temperature flow path as a primary side fluid into the primary side flow path of the heat exchanger and introducing a fluid of the low-temperature flow path into the low-temperature branch path; and a low-temperature testing step of testing the heat exchanger by introducing a fluid mainly from the low-temperature flow path as a primary side fluid into the primary side flow path of the heat exchanger and introducing a fluid of the high-temperature flow path into the high-temperature branch path, wherein switching between the high-temperature testing step and the low-temperature testing step is performed by switching between a state in which a fluid from the high-temperature flow path is mainly introduced into the primary side flow path of the heat exchanger and a state in which a fluid from the low-temperature flow path is mainly introduced into the primary side flow path of the heat exchanger.

[0021] In the heat exchanger testing method according to the present invention, in the high temperature test step, the fluid of the high temperature flow path mainly flows into the primary side flow path of the heat exchanger as the primary side fluid, while the fluid of the low temperature flow path flows into the low temperature branch path. Then, when the high temperature test step is shifted to the low temperature test step, the fluid of the low temperature flow path that had been flowing toward the low temperature branch path mainly flows into the primary side flow path, while the fluid of the high temperature flow path that had been flowing toward the primary side flow path flows into the high temperature branch path. In other words, when the test state is switched, the destination of the fluid that had been flowing into the branch path is switched, so that the test state can be switched in a short time.

[0022] Furthermore, since the temperature of the fluid in the high-temperature flow path or the low-temperature flow path can be adjusted in advance before switching the test state, when the test state is switched, the fluid can be immediately flowed into the primary flow path as the primary fluid of the heat exchanger.

[0023] Therefore, according to this testing method, it is possible to quickly switch between a state in which a primary side fluid regulated to a high temperature is introduced into the primary side of the heat exchanger and a state in which a primary side fluid regulated to a low temperature is introduced. Furthermore, since a cooler and a heater are provided in the low-temperature flow path, in the low-temperature test step, the fluid in the low-temperature flow path can be temperature-adjusted and introduced into the primary flow path regardless of the set temperature of the fluid flowing in the primary flow path. As a result, it is possible to carry out tests to evaluate heat exchangers used in environments in which the temperature of the fluid flowing into the primary flow passage changes. Effect of the Invention

[0024] As described above, according to the present invention, it is possible to provide a testing device for a heat exchanger that can quickly switch between a state in which a fluid conditioned to a high temperature flows into the primary side of the heat exchanger, and a state in which a fluid conditioned to a low temperature flows into the primary side of the heat exchanger. [Brief description of the drawings]

[0025] [Figure 1] FIG. 1 is a circuit diagram showing an outline of a heat exchanger testing device according to a first embodiment. [Diagram 2] 4 is a flowchart showing the process of the testing method according to the first embodiment. [Diagram 3]FIG. 2 is a circuit diagram showing a part of a primary side circuit according to the first embodiment. [Figure 4] FIG. 2 is a circuit diagram showing a part of a primary side circuit according to the first embodiment. [Diagram 5] FIG. 5 is a circuit diagram showing an outline of a heat exchanger testing device according to a second embodiment. [Figure 6] 10 is a flowchart showing a part of the process of a testing method according to a second embodiment. [Figure 7] 10 is a flowchart showing a part of the process of a testing method according to a second embodiment. [Figure 8] FIG. 11 is a circuit diagram showing an outline of a heat exchanger testing device according to a third embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0026] First Embodiment As shown in Fig. 1, a test apparatus 100 according to the first embodiment is a test apparatus for testing a heat exchanger 10, which is a specimen. Tests performed by such a test apparatus 100 include, for example, a test for evaluating a product by repeatedly flowing high-temperature fluid and low-temperature fluid into a primary flow path of the heat exchanger, a test for evaluating durability, etc. Such tests can be used for testing in-vehicle heat exchangers and the like that are used in an environment where the primary fluid changes between high and low temperatures.

[0027] The test device 100 includes a primary side circuit 13 that flows a primary side fluid in a primary side flow path 11 of the heat exchanger 10, a secondary side circuit 14 that flows a secondary side fluid in a secondary side flow path 12 of the heat exchanger 10, and a switching means 15 that switches the fluid to be flowed into the primary side flow path 11. For example, a gas such as air is used as the primary side fluid, and for example, a liquid such as water or antifreeze is used as the secondary side fluid. Note that the primary side fluid is not limited to a gas and may be, for example, a liquid such as water or antifreeze, and the secondary side fluid is not limited to a liquid and may be, for example, a gas such as air.

[0028] The primary circuit 13 includes an inlet passage 21, a high-temperature passage 22 provided with a heater 35, a low-temperature passage 23 provided with a cooler 36 and a heater 37, a junction passage 24, a high-temperature branch passage 25, a low-temperature branch passage 26, and a discharge passage 27. The inlet passage 21 is provided with a compressor 31 that pressurizes a fluid supplied from the outside to a pressure higher than the pressure loss occurring in the primary-side passage 11, and a cooler 32 that cools the fluid whose temperature has increased by the pressurization. The inlet passage 21 is also provided with a discharge means 33 that discharges excess fluid from the inlet passage 21 to the outside to adjust the flow rate of the high-temperature passage 22 and the low-temperature passage 23.

[0029] The high temperature flow path 22 and the low temperature flow path 23 are connected to the downstream end of the inlet path 21 and the upstream end of the junction path 24, respectively. The downstream end of the junction path 24 is configured to be connectable to one end of the primary side flow path 11 of the heat exchanger 10 as a specimen. The high temperature branch path 25 branches off from the downstream side of the heater 35 in the high temperature flow path 22 and leads to the outside of the test device 100. The low temperature branch path 26 branches off from the downstream side of the cooler 36 and the heater 37 in the low temperature flow path 23 and leads to the outside of the test device 100. The discharge path 27 is configured to be connectable to the other end of the primary side flow path 11 of the heat exchanger 10 as a specimen.

[0030] The secondary side circuit 14 is configured to be connectable to the secondary side flow path 12 of the heat exchanger 10, and is provided with a pump and a heating / cooling unit (not shown). The secondary side circuit 14 may be an open circuit configured to receive a fluid from the outside, or may be a closed circuit configured to circulate a fluid within the secondary side circuit 14.

[0031] The switching means 15 includes a switching mechanism 42 configured to be able to switch the inflow state between a state in which fluid flows from the high-temperature flow path 22 into the primary side flow path 11 and a state in which fluid flows from the low-temperature flow path 23 into the primary side flow path 11, and a control unit 43 that controls the switching mechanism 42.

[0032] The switching mechanism 42 has a high temperature flow path valve 46 on the high temperature flow path 22, a low temperature flow path valve 47 on the low temperature flow path 23, a high temperature branch path valve 48 on the high temperature branch path 25, and a low temperature branch path valve 49 on the low temperature branch path 26. The high temperature flow path valve 46 is disposed downstream of the branch point of the high temperature branch path 25 in the high temperature flow path 22, and the low temperature flow path valve 47 is disposed downstream of the branch point of the low temperature branch path 26 in the low temperature flow path 23. The four valves 46 to 49 are configured as opening / closing valves that can be switched between an open state and a closed state.

[0033] When the high temperature flow passage valve 46 and the low temperature branch passage valve 49 are open and the low temperature flow passage valve 47 and the high temperature branch passage valve 48 are closed, the high temperature flow passage 22 communicates with the primary side flow passage 11 of the heat exchanger 10, and the test device 100 is in a high temperature test state. At this time, the fluid in the low temperature flow passage 23 flows into the low temperature branch passage 26, so the temperature of the fluid in the low temperature flow passage 23 can be adjusted by the cooler 36 and the heater 37 before switching to the next low temperature test state. Similarly, when the low temperature flow passage valve 47 and the high temperature branch passage valve 48 are open and the high temperature flow passage valve 46 and the low temperature branch passage valve 49 are closed, the low temperature flow passage 23 communicates with the primary side flow passage 11 of the heat exchanger 10, and the test device 100 is in a low temperature test state. At this time, the fluid in the high temperature flow passage 22 flows into the high temperature branch passage 25, so the temperature of the fluid in the high temperature flow passage 22 can be adjusted by the heater 35 before switching to the next high temperature test state. In this manner, the testing apparatus 100 is configured such that the testing state can be switched between a high-temperature testing state and a low-temperature testing state in a short period of time by switching the four valves 46 to 49 between open and closed states.

[0034] A testing method of the testing apparatus 100 configured as above will be described with reference to Fig. 2. Here, a testing method will be described in which a high-temperature test and a low-temperature test are repeatedly performed a predetermined number of times on the heat exchanger 10 as a specimen.

[0035] First, the primary side flow path 11 of the heat exchanger 10 is connected to the junction path 24 and the discharge path 27, and the secondary side flow path 12 of the heat exchanger 10 is connected to the secondary side circuit 14 (step ST1).

[0036] When the tester issues a start command while the heat exchanger 10 is connected to the primary side circuit 13 and the secondary side circuit 14, the control unit 43 closes the high temperature flow passage valve 46 and the low temperature flow passage valve 47, and opens the high temperature branch passage valve 48 and the low temperature branch passage valve 49. The control unit 43 further operates the compressor 31, the cooler 32, the heater 35, the cooler 36, and the heater 37 to make a state in which a fluid flows from the introduction passage 21 through the high temperature flow passage 22 to the high temperature branch passage 25 and a fluid flows through the low temperature flow passage 23 to the low temperature branch passage 26. The control unit 43 further causes a fluid having a predetermined temperature to flow into the secondary side flow passage 12 of the heat exchanger 10. As a result, the test device 100 enters a preparatory operation state in which the high temperature flow passage 22 is connected to the high temperature branch passage 25 and the low temperature flow passage 23 is connected to the low temperature branch passage 26 (step ST2).

[0037] In the preparatory operation state, when the temperature of the fluid flowing through the high-temperature branch path 25 reaches a predetermined temperature and the temperature of the fluid flowing through the low-temperature branch path 26 reaches a predetermined temperature, the control unit 43 switches the high-temperature flow path valve 46 to an open state and switches the high-temperature branch path valve 48 to a closed state (step ST3). That is, the inflow destination of the high-temperature fluid is switched from the high-temperature branch path 25 to the primary side flow path 11 of the heat exchanger 10, and the testing device 100 enters a high-temperature testing state.

[0038] When a predetermined time has elapsed since the testing device 100 was switched to the high-temperature test state, the control unit 43 switches the switching mechanism 42 from a state in which the high-temperature fluid from the high-temperature flow path 22 flows into the primary-side flow path 11 to a state in which the low-temperature fluid from the low-temperature flow path 23 flows into the primary-side flow path 11. That is, the high-temperature branch path valve 48 is switched to an open state, the high-temperature flow path valve 46 is switched to a closed state, the low-temperature flow path valve 47 is switched to an open state, and the low-temperature branch path valve 49 is switched to a closed state (step ST4). As a result, the inflow destination of the high-temperature fluid is switched from the primary-side flow path 11 to the high-temperature branch path 25, and the inflow destination of the low-temperature fluid is switched from the low-temperature branch path 26 to the primary-side flow path 11, and the testing device 100 is switched from the high-temperature test state to the low-temperature test state.

[0039] When a predetermined time has elapsed since the testing device 100 was switched to the low-temperature test state, the control unit 43 performs a condition determination of the number of tests (step ST5). That is, if the number of high-temperature tests and low-temperature tests performed has not reached the predetermined number, the testing device 100 repeats the above-mentioned high-temperature test step (step ST3) and low-temperature test step (step ST4). On the other hand, if the number of tests performed has reached the predetermined number, the testing device 100 returns to the above-mentioned preparation operation state (step ST6).

[0040] After the testing equipment 100 returns to the preparatory operation state, the control unit 43 stops the operation of each device 31, 32, 35, 36, and 37 of the testing equipment 100, stops the flow of fluid into the primary side flow path 11 and the secondary side flow path 12 of the heat exchanger 10, and ends the test.

[0041] In the testing device 100 configured as described above, when the device is switched to a high-temperature test state, a high-temperature fluid flows from the high-temperature flow path 22 into the primary-side flow path 11 as a primary-side fluid. At this time, a low-temperature fluid flows from the low-temperature flow path 23 into the low-temperature branch path 26. Therefore, the fluid in the low-temperature flow path 23 can be adjusted to a target temperature in advance before switching to the next low-temperature test state.

[0042] When the high temperature test state is switched to the low temperature test state, the low temperature fluid that had been flowing in the low temperature branch path 26 flows from the low temperature flow path 23 to the primary side flow path 11, while the high temperature fluid that had been flowing in the primary side flow path 11 flows from the high temperature flow path 22 to the high temperature branch path 25. That is, when the destinations of the high temperature fluid in the high temperature flow path 22 and the low temperature fluid in the low temperature flow path 23 are switched, the destination of the fluid that had been flowing in the branch paths 25, 26 is switched to the heat exchanger 10, so that the test state can be switched in a short time.

[0043] Furthermore, since the temperature of the fluid introduced from the high-temperature flow path 22 or the low-temperature flow path 23 into the branch paths 25, 26 can be adjusted before switching the test state, when the test state is switched, the temperature-adjusted fluid can be immediately flowed into the primary side flow path 11 of the heat exchanger 10 as the primary side fluid.

[0044] In this way, it is possible to switch between high-temperature fluid and low-temperature fluid in a short period of time and allow them to flow into the primary flow path 11 of the heat exchanger 10. As a result, the testing device 100 can be used for evaluation testing of heat exchangers that are used in environments where the temperature of the fluid flowing into the primary flow path 11 changes.

[0045] In the first embodiment, the primary side circuit 13 is formed as an open circuit that discharges the fluid flowing out from the discharge path 27 to the outside of the testing device 100, but it may also be configured as a closed circuit that returns the fluid from the discharge path 27 to the inlet path 21.

[0046] In addition, the high temperature flow path 22 and the low temperature flow path 23 are connected to the junction flow path 24 and are configured to be connected to the heat exchanger 10, but this is not limited thereto. For example, as shown in Fig. 3, the junction flow path 24 may be omitted, and the high temperature flow path 22 and the low temperature flow path 23 may be configured to be directly connected to the header 28 of the primary side flow path 11, respectively, without merging with each other.

[0047] The switching mechanism 42 has a high-temperature flow passage valve 46, a low-temperature flow passage valve 47, a high-temperature branch passage valve 48, and a low-temperature branch passage valve 49, but is not limited thereto. For example, as shown in FIG. 4(a), the switching mechanism 42 may have a high-temperature side three-way valve 51 arranged at the connection point of the high-temperature branch passage 25 in the high-temperature flow passage 22, and a low-temperature side three-way valve 52 arranged at the connection point of the low-temperature branch passage 26 in the low-temperature flow passage 23. In this case, the four valves 46 to 49 are omitted. The control unit 43 is configured to switch the inflow destinations of the high-temperature fluid and the low-temperature fluid by controlling the flow directions of the high-temperature side three-way valve 51 and the low-temperature side three-way valve 52, thereby switching the test state of the test device 100.

[0048] In addition, the switching mechanism 42 may be configured to have a high-temperature side three-way valve 51, a low-temperature flow path valve 47, and a low-temperature branch path valve 49, or the switching mechanism 42 may be configured to have a low-temperature side three-way valve 52, a high-temperature flow path valve 46, and a high-temperature branch path valve 48.

[0049] 4(b), the switching mechanism 42 may have a common three-way valve 53 arranged at the connection point of the high temperature flow path 22, the low temperature flow path 23, and the junction flow path 24. In this case, the high temperature flow path valve 46 and the low temperature flow path valve 47 are omitted. The control unit 43 is configured to switch the test state of the testing device 100 by controlling the flow direction of the common three-way valve 53 to switch the flow path connected to the primary side flow path 11.

[0050] The test device 100 is configured such that either the high-temperature fluid or the low-temperature fluid is introduced into the primary flow passage 11 of the heat exchanger 10 in any test state, but is not limited thereto. For example, the high-temperature flow passage valve 46 and the low-temperature flow passage valve 47 may be configured as adjustment valves whose opening degree is adjusted by the control unit 43. In this case, in the high-temperature test state, the primary flow passage 11 is configured such that the high-temperature fluid of the high-temperature flow passage 22 mainly flows in, and the low-temperature fluid of the low-temperature flow passage 23 whose flow rate is adjusted by adjusting the opening degree of the low-temperature flow passage valve 47 flows in at the same time. Similarly, in the low-temperature test state, the primary flow passage 11 is configured such that the low-temperature fluid of the low-temperature flow passage 23 mainly flows in, and the high-temperature fluid of the high-temperature flow passage 22 whose flow rate is adjusted by adjusting the opening degree of the high-temperature flow passage valve 46 flows in at the same time.

[0051] Also, after the preparatory operation (step ST2), the high-temperature test precedes the low-temperature test, but is not limited to this. For example, the low-temperature test may precede the high-temperature test. In this case, after a predetermined time has elapsed since switching from the low-temperature test to the high-temperature test, the testing device 100 is configured to perform a condition determination (step ST5) of the number of tests, rather than switching to the low-temperature test. That is, the tests are performed in the order of the preparatory operation (step ST2), the low-temperature test (step ST4), the high-temperature test (step ST3), and the condition determination (step ST5) of the number of tests.

[0052] Furthermore, the testing apparatus 100 is configured to switch to the high temperature test state when the fluid flowing through the high temperature branch path 25 and the fluid flowing through the low temperature branch path 26 reach a predetermined temperature (step ST3), but is not limited to this. For example, the testing apparatus 100 may be configured to switch to the high temperature test state when the temperature of the fluid flowing through the high temperature branch path 25 reaches a predetermined temperature, even if the fluid in the low temperature branch path 26 has not reached the predetermined temperature.

[0053] <Second embodiment> A testing apparatus 100 according to the second embodiment will be described with reference to Fig. 5. Here, the same components as those in the first embodiment are given the same reference numerals, and detailed description thereof will be omitted. The testing apparatus 100 of the second embodiment differs from the first embodiment in that the secondary side circuit 14 is formed as a closed circuit for circulating the secondary side fluid, while the testing apparatus 100 of the second embodiment is provided with a heat utilization device 55 for heating and cooling the secondary side fluid by the fluids in the high temperature branch path 25 and the low temperature branch path 26.

[0054] The heat utilization device 55 has a heat dissipation flow path 56 through which the fluids of the high-temperature branch path 25 and the low-temperature branch path 26 flow, and a heat receiving flow path 57 through which the circulating fluid circulating in the secondary side circuit 14 flows, and is configured so that heat exchange takes place between the heat dissipation flow path 56 and the heat receiving flow path 57. A junction flow path 64 which is connected to the high-temperature flow path 22 and the low-temperature flow path 23 is connected to the upstream end of the heat dissipation flow path 56.

[0055] The high-temperature branch path 25 has a high-temperature communication path 60 connecting the high-temperature flow path 22 and the junction path 64, and a high-temperature exhaust path 62 connecting the high-temperature flow path 22 and the outside. The low-temperature branch path 26 has a low-temperature communication path 61 connecting the low-temperature flow path 23 and the junction path 64, and a low-temperature exhaust path 63 connecting the low-temperature flow path 23 and the outside. In other words, the high-temperature flow path 22 is connected to the heat dissipation flow path 56 via the high-temperature communication path 60 and the junction path 64, and the low-temperature flow path 23 is connected to the heat dissipation flow path 56 via the low-temperature communication path 61 and the junction path 64.

[0056] The secondary side circuit 14 is a closed circuit for circulating the secondary side fluid, and has one end connectable to one end of the secondary side flow path 12 of the heat exchanger 10 and the other end connectable to the other end of the secondary side flow path 12. The secondary side circuit 14 is provided with a heat utilization device 55, a pump 73, and a heating / cooling unit 74, and is connected to a bypass path 75. One end of the bypass path 75 is connected between the heat utilization device 55 and the pump 73, and the other end is connected between the heating / cooling unit 74 and the heat exchanger 10. In other words, the bypass path 75 is formed so as to connect a portion upstream of the heat exchanger 10 and a portion downstream of the heat utilization device 55, and is a flow path for bypassing the heat exchanger 10 and the heat utilization device 55 in the secondary side circuit 14. Note that the secondary side circuit 14 is provided with an open / close valve (not shown) on the upstream side or downstream side of the heat exchanger 10, and is configured to circulate the circulating fluid through the bypass path 75 without passing through the heat exchanger 10 during the warm-up operation (step ST2). Therefore, in the warm-up operation (step ST2), the circulating fluid is adjusted to a predetermined temperature by the heating and cooling unit 74.

[0057] The switching mechanism 42 further includes a high-temperature communication valve 66 on the high-temperature communication passage 60 and a low-temperature communication valve 67 on the low-temperature communication passage 61. The high-temperature branch passage valve 48 is disposed on the high-temperature discharge passage 62, and the low-temperature branch passage valve 49 is disposed on the low-temperature discharge passage 63. The six valves 46, 47, 48, 49, 66, and 67 are open / close valves that are controlled to open and close by the control unit 43. The testing device 100 is configured such that the inflow destinations of the fluid in the high-temperature passage 22 and the fluid in the low-temperature passage 23 are switched between the primary side passage 11 of the heat exchanger 10, the heat dissipation passage 56 of the heat utilization device 55, the high-temperature discharge passage 62, and the low-temperature discharge passage 63 under the control of the switching mechanism 42. In other words, the testing device 100 is configured to not only switch the test state between the high-temperature test and the low-temperature test, but also to switch the inflow state of the fluid from the primary side circuit 13 to the heat utilization device 55.

[0058] The test device 100 further includes a high-temperature side temperature sensor 77 provided on the high-temperature flow path 22, a low-temperature side temperature sensor 78 provided on the low-temperature flow path 23, and a secondary-side temperature sensor 79 provided on the secondary-side circuit 14. The high-temperature side temperature sensor 77 is disposed downstream of the heater 35 in the high-temperature flow path 22, and detects a temperature T3 (high-temperature side temperature) of the fluid flowing through the high-temperature flow path 22. The low-temperature side temperature sensor 78 is disposed downstream of the heater 37 in the low-temperature flow path 23, and detects a temperature T4 (low-temperature side temperature) of the fluid flowing through the low-temperature flow path. The secondary-side temperature sensor 79 includes a first temperature sensor 81 disposed upstream of the heat exchanger 10 in the secondary-side circuit 14, and a second temperature sensor 82 disposed downstream of the heat utilization device 55. The first temperature sensor 81 detects a temperature T1 (upstream temperature) of the fluid immediately before it flows into the heat exchanger 10 in the secondary-side circuit 14. The second temperature sensor 82 detects a temperature T2 (downstream temperature) of the fluid immediately after it flows out of the heat utilization device 55 in the secondary side circuit 14. Each of the temperature sensors 77, 78, 81, 82 transmits a signal indicating each of the detected temperatures T1-T4 to the control unit 43. The six valves 46-49, 66, 67 of the switching mechanism 42 are configured so that their open / closed states are controlled by the control unit 43 based on each of the temperatures T1-T4.

[0059] Here, a test method using the test device 100 of the second embodiment will be described. The preparatory operation (steps ST1, 2, 6) and the condition determination of the number of tests (step ST5) in the second embodiment are similar to those in the first embodiment, so the description will be omitted, and only the details of the test methods for the high temperature test and the low temperature test will be described here.

[0060] 6, in the high-temperature test, first, the control unit 43 switches the high-temperature flow passage valve 46 to an open state, and switches the high-temperature branch passage valve 48 and the high-temperature communication passage valve 66 to a closed state. As a result, the inflow destination of the high-temperature fluid in the high-temperature flow passage 22 is switched to the primary side flow passage 11 of the heat exchanger 10 (step ST10). At this time, the low-temperature flow passage valve 47 and the low-temperature communication passage valve 67 are switched to a closed state, and the low-temperature branch passage valve 49 is switched to an open state.

[0061] During the high-temperature test, the control unit 43 performs condition determination by referring to the upstream-side temperature T1, the downstream-side temperature T2, and the low-temperature-side temperature T4 (step ST11).

[0062] When the downstream temperature T2 is higher than the upstream temperature T1 and higher than the low-temperature temperature T4, the control unit 43 switches the low-temperature communication valve 67 to an open state and switches the low-temperature branching valve 49 to a closed state (step ST12). In other words, when the temperature of the low-temperature fluid is lower than the temperature of the circulating fluid at the outlet of the heat utilization device 55, the low-temperature fluid in the low-temperature flow path 23 is caused to flow into the heat dissipation flow path 56 of the heat utilization device 55 to cool the circulating fluid flowing through the heat receiving flow path 57.

[0063] On the other hand, when the upstream temperature T1 is equal to or higher than the downstream temperature T2, or when the low-temperature side temperature T4 is equal to or higher than the downstream temperature T2, the control unit 43 switches the low-temperature communication valve 67 to a closed state and switches the low-temperature branching valve 49 to an open state (step ST13). In other words, when the temperature of the low-temperature fluid is equal to or higher than the temperature of the circulating fluid at the outlet of the heat utilization device 55, the low-temperature fluid in the low-temperature flow path 23 is discharged from the low-temperature discharge path 63 to the outside of the testing device 100, and the circulating fluid in the secondary side circuit 14 is not cooled. Also, when the upstream temperature T1 is equal to or higher than the downstream temperature T2, the heat utilization device 55 is not used.

[0064] Thereafter, the control unit 43 performs a condition determination for the elapsed time of the high-temperature test (step ST14). If the elapsed time has not reached the predetermined time, the testing device 100 repeats the above-mentioned temperature condition determination (step ST11) and control operation (steps ST12-13). On the other hand, if the elapsed time has reached the predetermined time, the high-temperature test is terminated and the process proceeds to the low-temperature test (step ST4) or the condition determination for the number of tests (step ST5).

[0065] 7, when a low-temperature test is performed, first, the control unit 43 switches the low-temperature passage valve 47 to an open state and switches the low-temperature branch passage valve 49 and the low-temperature connection passage valve 67 to a closed state. As a result, the inflow destination of the low-temperature fluid in the low-temperature passage 23 is switched to the primary side passage 11 of the heat exchanger 10 (step ST15).

[0066] In the low-temperature test, the control unit 43 performs condition determination by referring to the upstream side temperature T1, the downstream side temperature T2, and the high-temperature side temperature T3 (step ST16).

[0067] When the high-temperature side temperature T3 is higher than the downstream temperature T2 and the upstream temperature T1 is higher than the downstream temperature T2, the control unit 43 switches the high-temperature communication valve 66 to an open state and switches the high-temperature branching valve 48 to a closed state (step ST17). In other words, when the temperature of the high-temperature fluid is higher than the temperature of the circulating fluid at the outlet of the heat utilization device 55, the high-temperature fluid in the high-temperature flow path 22 is caused to flow into the heat release flow path 56 of the heat utilization device 55, and the circulating fluid flowing in the heat receiving flow path 57 is heated.

[0068] On the other hand, when the high-temperature side temperature T3 is equal to or lower than the downstream side temperature T2, or when the upstream side temperature T1 is equal to or lower than the downstream side temperature T2, the control unit 43 switches the high-temperature communication valve 66 to a closed state and switches the high-temperature branching valve 48 to an open state (step ST18). In other words, when the temperature of the high-temperature fluid is equal to or lower than the temperature of the circulating fluid at the outlet of the heat utilization device 55, the high-temperature fluid in the high-temperature flow path 22 is discharged from the high-temperature discharge path 62 to the outside of the testing device 100, and the circulating fluid in the secondary side circuit 14 is not heated. In other words, the heat utilization device 55 is not used. Also, when the upstream side temperature T1 is equal to or lower than the downstream side temperature T2, the heat utilization device 55 is not used.

[0069] Thereafter, the control unit 43 performs a condition determination for the elapsed time of the low-temperature test (step ST19). If the elapsed time has not reached the predetermined time, the testing device 100 repeats the above-mentioned temperature condition determination (step ST16) and control operation (steps ST17-18). On the other hand, if the elapsed time has reached the predetermined time, the low-temperature test is terminated and the process proceeds to the high-temperature test (step ST3) or the condition determination for the number of tests (step ST5).

[0070] In this embodiment, in a high temperature test state, the fluid in the high temperature flow path 22 is introduced into the primary side flow path 11 of the heat exchanger 10, while the fluid in the low temperature flow path 23 is introduced into the heat dissipation flow path 56 of the heat utilization device 55 through the low temperature communication path 61. At this time, the secondary side fluid after heat exchange with the high temperature fluid in the primary side flow path 11 in the heat exchanger 10 flows into the heat receiving flow path 57 of the heat utilization device 55. Therefore, the heat utilization device 55 can auxiliary cool the secondary side fluid heated by the primary side fluid as a pre-stage before being introduced into the heating and cooling unit 74.

[0071] Similarly, in the low-temperature test state, the fluid in the low-temperature flow path 23 is introduced into the primary-side flow path 11 of the heat exchanger 10, while the fluid in the high-temperature flow path 22 is introduced into the heat dissipation flow path 56 of the heat utility 55 through the high-temperature communication path 60. At this time, the secondary-side fluid after heat exchange with the low-temperature fluid in the primary-side flow path 11 in the heat exchanger 10 flows into the heat receiving flow path 57 of the heat utility 55. Therefore, the heat utility 55 can supplementarily heat the secondary-side fluid cooled by the primary-side fluid as a pre-stage before being introduced into the heating and cooling unit 74.

[0072] Therefore, the fluid flowing through the high temperature flow path 22 and the low temperature flow path 23 can be utilized to adjust the temperature of the fluid flowing through the secondary side circuit 14. This makes it possible to mitigate a sudden temperature change that occurs in the secondary side flow path 12 of the heat exchanger 10 when the fluid in the primary side circuit 13 is switched, and makes it easier to control the temperature of the heating / cooling unit 74 at the time of switching. Moreover, since the fluid flowing into the heat utilization device can be switched between the fluid from the low temperature flow path 23 and the fluid from the high temperature flow path 22 depending on the timing of switching the test state, a control means for controlling the switching timing is not required.

[0073] The secondary fluid can be auxiliary heated or cooled by the heat utilization device 55 and then introduced into the heating and cooling unit 74. This makes it possible to reduce the amount of heat required for heating or cooling the secondary fluid in the heating and cooling unit 74, and thus makes it possible to use a heating and cooling unit 74 with reduced heating and cooling capacity.

[0074] When the testing apparatus 100 is in a high temperature test state or a low temperature test state, the six valves 46-49, 66, 67 of the switching mechanism 42 are configured to be controlled by the control unit 43 to open and close in response to temperatures T1-T4 detected by the four temperature sensors 77, 78, 81, 82. Therefore, the control unit 43 can introduce high temperature fluid and low temperature fluid from the high temperature flow path 22 and the low temperature flow path 23 into the heat utility 55 as necessary, thereby auxiliary heating and cooling the secondary side fluid.

[0075] In the test device 100, in a high temperature test state, the fluid in the high temperature flow path 22 is introduced into the primary flow path 11 of the heat exchanger 10, while the fluid in the low temperature flow path 23 can be selected to be introduced into the low temperature communication path 61 or the low temperature discharge path 63. Similarly, in a low temperature test state, the fluid in the low temperature flow path 23 is introduced into the primary flow path 11 of the heat exchanger 10, while the fluid in the high temperature flow path 22 can be selected to be introduced into the high temperature communication path 60 or the high temperature discharge path 62. In other words, it is possible to select whether or not to use the heat utility 55, and the heat of the fluids in the high temperature flow path 22 and the low temperature flow path 23 can be used by the heat utility 55 as necessary.

[0076] The secondary side circuit 14 is formed as a closed circuit for circulating the secondary side fluid, but is not limited thereto. The secondary side circuit 14 may be formed as an open circuit for passing the secondary side fluid supplied from one end through the secondary side flow passage 12 of the heat exchanger 10 and discharging it from the other end, similar to the first embodiment.

[0077] In addition, the bypass circuit 75 in the secondary side circuit 14 may be omitted.

[0078] Furthermore, the control unit 43 can control the switching mechanism 42 based on the temperature detected by one of the first temperature sensor 81 and the second temperature sensor 82 of the secondary-side temperature sensor 79. In this case, the other sensor is omitted.

[0079] The control unit 43 may also control the switching mechanism 42 not based on the temperature of the fluid. In this case, the four temperature sensors 77, 78, 81, 82 are omitted, and the control unit 43 controls the switching mechanism 42 so that the low-temperature fluid in the low-temperature flow path 23 flows into the heat utility 55 during a high-temperature test, and the high-temperature fluid in the high-temperature flow path 22 flows into the heat utility 55 during a low-temperature test.

[0080] In addition, in the temperature condition determination during high temperature testing (step ST11) and the temperature condition determination during low temperature testing (step ST16), the control unit 43 uses the upstream temperature T1 as one of the determination elements, but this is not limited to this. For example, the control unit 43 may use a target temperature upstream of the heat exchanger 10 instead of the upstream temperature T1, which is the detected temperature. In addition, in the temperature condition determination during high temperature testing (step ST11) and the temperature condition determination during low temperature testing (step ST16), the comparison between the downstream temperature T2 and the upstream temperature T1 (or the target temperature) may not be performed.

[0081] The high-temperature branch valve 48, the low-temperature branch valve 49, the high-temperature communication valve 66, and the low-temperature communication valve 67 may be configured as adjustment valves whose openings are adjusted by the control unit 43. In this case, in the high-temperature test state, the fluid of the high-temperature flow path 22 mainly flows into the primary flow path 11, and the openings of the low-temperature branch valve 49 and the low-temperature communication valve 67 are adjusted to distribute the fluid of the low-temperature flow path 23, so that a flow rate of low-temperature fluid can be introduced into the heat utility 55 as required. Similarly, in the low-temperature test state, the fluid of the low-temperature flow path 23 mainly flows into the primary flow path 11, and the openings of the high-temperature branch valve 48 and the high-temperature communication valve 66 are adjusted to distribute the fluid of the high-temperature flow path 22, so that a flow rate of high-temperature fluid can be introduced into the heat utility 55 as required.

[0082] Further, in place of the compressor 31, the introduction passage 21 of the primary side circuit 13 may be provided with a pump that pressurizes a fluid supplied from the outside.

[0083] Moreover, instead of the pump 73, the secondary circuit 14 may be provided with a compressor for pressurizing the circulating fluid.

[0084] It should be noted that the description of the other configurations, operations and effects will be omitted, but the description of the first embodiment can be applied to the second embodiment.

[0085] <Third embodiment> A test apparatus 100 according to the third embodiment will be described with reference to Fig. 8. Here, the same components as those in the first embodiment are given the same reference numerals, and detailed description thereof will be omitted. The third embodiment differs from the first embodiment in that the test apparatus 100 is provided with a high-temperature heat utilization device 85 and a low-temperature heat utilization device 86.

[0086] The high-temperature heat utility 85 is provided to suppress a drop in temperature of the high-temperature flow path 22 during a low-temperature test, and is connected to a portion of the high-temperature flow path 22 downstream of the branching portion of the high-temperature branch path 25 and upstream of the high-temperature flow path valve 46. The high-temperature heat utility 85 heats the portion of the high-temperature flow path 22 downstream of the branching portion of the high-temperature branch path 25 by means of a fluid flowing through the high-temperature branch path 25. The high-temperature heat utility 85 may be connected upstream of the junction path 24 and downstream of the high-temperature flow path valve 46.

[0087] A thermal resistance member 87 is provided in the high-temperature flow path 22 between the high-temperature heat utility 85 and the high-temperature flow path valve 46. The thermal resistance member 87 suppresses the transfer of heat (cold heat) downstream of the high-temperature flow path valve 46 in the high-temperature flow path 22 to the high-temperature heat utility 85 side during a low-temperature test.

[0088] The low-temperature heat utilization device 86 is provided to suppress an increase in temperature of the low-temperature flow path 23 during a high-temperature test, and is connected to the low-temperature flow path 23 downstream of the branching portion of the low-temperature branching path 26 and upstream of the low-temperature flow path valve 47. The low-temperature heat utilization device 86 cools a portion of the low-temperature flow path 23 downstream of the branching portion of the low-temperature branching path 26 by means of a fluid flowing through the low-temperature branching path 26. The low-temperature heat utilization device 86 may be connected upstream of the junction path 24 and downstream of the low-temperature flow path valve 47.

[0089] A heat resistance member 88 is provided in the low-temperature flow path 23 between the low-temperature heat utility 86 and the low-temperature flow path valve 47. The heat resistance member 88 suppresses the transfer of heat downstream of the low-temperature flow path valve 47 in the low-temperature flow path 23 to the low-temperature heat utility 86 side during a high-temperature test.

[0090] In this embodiment, the heat resistance members 87 and 88 are provided, but the heat resistance members 87 and 88 may be omitted.

[0091] Although the description of other configurations, operations, and effects will be omitted, the description of the first embodiment can be applied to the second and third embodiments. For example, the mechanism shown in Fig. 3 and Fig. 4 can be applied to the second and third embodiments.

[0092] The embodiments disclosed herein are illustrative in all respects and should not be construed as limiting. The scope of the present invention is defined by the claims, not the above description, and is intended to include all modifications within the meaning and scope of the claims. [Explanation of symbols]

[0093] 100 Test Equipment 10 Heat exchanger 11 Primary flow path 12 Secondary flow passage 15 Switching means 22 High temperature flow path 23 Low temperature flow path 25 Hot Fork 26 Low Temperature Junction 36 Cooler 37 Heater 44 Heating and cooling unit 55 Heat Utilizer 60 High Temperature Passage 61 Low Temperature Access 62 High temperature exhaust channel 63 Cold discharge path 77 High temperature sensor 78 Low temperature sensor 79 Secondary Temperature Sensor 85 High temperature side heat utilization device 86 Low temperature side heat utilization device

Claims

1. A test apparatus for testing a heat exchanger having a primary flow path and a secondary flow path, a high temperature flow path configured to communicate with the primary flow path; a low temperature flow path configured to communicate with the primary flow path; A high-temperature branch path branching off from the high-temperature flow path; a low-temperature branch path branching off from the low-temperature flow path; a switching means for switching a test state between a high temperature test state in which a fluid from the high temperature flow path is mainly introduced into the primary side flow path as a primary side fluid, while a fluid from the low temperature flow path is introduced into the low temperature branch path, and a low temperature test state in which a fluid from the low temperature flow path is mainly introduced into the primary side flow path as a primary side fluid, while a fluid from the high temperature flow path is introduced into the high temperature branch path, The low-temperature flow path is provided with a cooler for cooling a fluid and a heater for heating the fluid.

2. A test apparatus for testing a heat exchanger having a primary flow path and a secondary flow path, comprising: a high temperature flow path configured to communicate with the primary flow path; a low temperature flow path configured to communicate with the primary flow path; A high-temperature branch path branching off from the high-temperature flow path; a low-temperature branch path branching off from the low-temperature flow path; a switching means for switching a test state between a high temperature test state in which fluid from the high temperature flow path is mainly introduced into the primary side flow path as a primary side fluid, while fluid from the low temperature flow path is introduced into the low temperature branch path, and a low temperature test state in which fluid from the low temperature flow path is mainly introduced into the primary side flow path as a primary side fluid, while fluid from the high temperature flow path is introduced into the high temperature branch path; a circulation circuit for circulating a secondary fluid introduced into the secondary flow path; a heat utilization device provided in the circulation circuit and connected to the high-temperature branch path and the low-temperature branch path, A testing device for a heat exchanger, wherein when the switching means is switched to a high temperature test state, a fluid may be introduced into the heat utilization device from the low temperature branch path, and when the switching means is switched to a low temperature test state, a fluid may be introduced into the heat utilization device from the high temperature branch path.

3. a heating and cooling unit that adjusts the temperature of the secondary fluid circulating in the circulation circuit, 3. The heat exchanger testing device according to claim 2, wherein the heat utilization device is disposed in the circulation circuit upstream of the heating and cooling unit in a flow direction of the secondary fluid.

4. The high-temperature branch passage includes a high-temperature communication passage configured to connect from the high-temperature flow passage to the heat utilization device, and a high-temperature discharge passage that discharges a fluid from the high-temperature flow passage, The low-temperature branch path includes a low-temperature connection path configured to connect from the low-temperature flow path to the heat utilization device, and a low-temperature discharge path that discharges a fluid from the low-temperature flow path, The heat exchanger testing device of claim 2 or claim 3, wherein the switching means is configured to select a destination for fluid in the low-temperature flow path between the low-temperature connection path and the low-temperature discharge path or distribute the fluid in the low-temperature flow path in the high-temperature test state, and to select a destination for fluid in the high-temperature flow path between the high-temperature connection path and the high-temperature discharge path or distribute the fluid in the high-temperature flow path in the low-temperature test state.

5. a high-temperature side temperature sensor provided in the high-temperature flow path or the high-temperature branch path; a low-temperature side temperature sensor provided in the low-temperature flow path or the low-temperature branch path; a secondary temperature sensor for detecting a temperature of the secondary fluid flowing through the circulation circuit, 5. The heat exchanger testing device of claim 4, wherein the switching means is configured to select a destination for the fluid in the low-temperature flow path or distribute the fluid in the low-temperature flow path between the low-temperature connection path and the low-temperature discharge path in the high-temperature test state based on the temperatures of the fluid detected by the high-temperature side temperature sensor, the low-temperature side temperature sensor, and the secondary side temperature sensor, and to select a destination for the fluid in the high-temperature flow path or distribute the fluid in the high-temperature flow path between the high-temperature connection path and the high-temperature discharge path in the low-temperature test state.

6. A test apparatus for testing a heat exchanger having a primary flow path and a secondary flow path, comprising: a high temperature flow path configured to communicate with the primary flow path; a low temperature flow path configured to communicate with the primary flow path; A high-temperature branch path branching off from the high-temperature flow path; a low-temperature branch path branching off from the low-temperature flow path; a switching means for switching a test state between a high temperature test state in which fluid from the high temperature flow path is mainly introduced into the primary side flow path as a primary side fluid, while fluid from the low temperature flow path is introduced into the low temperature branch path, and a low temperature test state in which fluid from the low temperature flow path is mainly introduced into the primary side flow path as a primary side fluid, while fluid from the high temperature flow path is introduced into the high temperature branch path; a high-temperature side heat utilization device connected to the high-temperature branch passage and configured to heat a downstream side of a branch point of the high-temperature branch passage in the high-temperature flow path by a fluid flowing through the high-temperature branch passage; a low-temperature side heat utilization device connected to the low-temperature branch path and configured to cool a portion of the low-temperature flow path downstream of a branch point of the low-temperature branch path by a fluid flowing through the low-temperature branch path.

7. A test method for testing a heat exchanger having a primary flow path and a secondary flow path, using a test device comprising a high-temperature flow path, a low-temperature flow path, a high-temperature branch path branching off from the high-temperature flow path, and a low-temperature branch path branching off from the low-temperature flow path, the low-temperature flow path being provided with a cooler for cooling a fluid and a heater for heating the fluid, the method comprising: connecting the high-temperature flow path and the low-temperature flow path to the primary side flow path of the heat exchanger; a high-temperature test step of testing the heat exchanger by introducing a fluid from the high-temperature flow path as a primary fluid into the primary flow path of the heat exchanger and introducing a fluid from the low-temperature flow path into the low-temperature branch path; a low-temperature test step of testing the heat exchanger by introducing a fluid from the low-temperature flow path as a primary fluid into the primary flow path of the heat exchanger and introducing a fluid from the high-temperature flow path into the high-temperature branch path, A method for testing a heat exchanger, in which switching between the high-temperature test step and the low-temperature test step is performed by switching between a state in which fluid from the high-temperature flow path is mainly introduced into the primary side flow path of the heat exchanger and a state in which fluid from the low-temperature flow path is mainly introduced into the primary side flow path of the heat exchanger.

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