Mass spectrometer sampler cone and interface and method for sealing them together - Patents.com

Abstract

A mass spectrometer assembly or the like is provided that provides a substantially liquid-tight seal and contributes to achieving and maintaining reduced pressure in a vacuum region of the mass analyzer. [Solution] A particular configuration of a sampler cone and its use with a metal gasket to seal the sampler cone to a mass spectrometer interface are described. The sampler cone, the interface, or both may include one or more surface features. By coupling the sampler cone to the interface, the metal gasket can be compressed or crushed to provide a seal between the sampler cone and the interface. For example, a crushing force imparted by the surface features of the sampler cone and the interface can crush the gasket and provide a substantially fluid-tight seal between the sampler cone and the interface.

Description

[Technical field]

[0001] A particular configuration of a mass spectrometer sampler cone, metal gasket, and interface that can be used together to provide a seal.

[0002] Priority Application This application claims priority to and the benefit of U.S. Provisional Patent Application No. 62 / 750,114, filed October 24, 2018, the entire disclosure of which is incorporated herein by reference for all purposes. [Background technology]

[0003] Mass spectrometer analysis requires various vacuum stages that operate at pressures significantly lower than atmospheric pressure. Leaks can occur between various components in the system, leading to inaccuracies and reduced precision in the mass measurements. Summary of the Invention

[0004] In one aspect, the mass spectrometer assembly includes a sampler cone, a mass analyzer interface, and a gasket. In some examples, the sampler cone includes a sample orifice configured to fluidly couple to an ionization source that provides a fluid beam including ions to the sample orifice, and the sampler cone includes a first surface feature on a surface of the sampler cone. In certain examples, the mass analyzer interface can be configured to couple to the sampler cone, and the mass analyzer interface includes a second surface feature on a surface of the interface. In some configurations, the gasket can be between the first surface feature and the second surface feature, the first surface feature imparting a force to the first surface of the gasket and the second surface feature imparting a force to the second surface of the gasket, providing a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the interface when the sampler cone is coupled to the interface.

[0005] In certain embodiments, the first surface feature of the sampler cone includes a recess and the second surface feature of the mass analyzer interface includes a protrusion, the recess configured to engage with the protrusion and crush a gasket between the recess and the protrusion to provide a substantially liquid-tight seal between the sampler cone and the interface when the sampler cone is coupled to the mass analyzer interface. In other embodiments, the first surface feature of the sampler cone includes a protrusion and the second surface feature of the interface includes a recess, the protrusion configured to engage with the recess and crush a gasket between the recess and the protrusion to provide a substantially liquid-tight seal between the sampler cone and the interface when the sampler cone is coupled to the mass analyzer interface. In some examples, the sampler cone further includes threads configured to couple to threads on the mass analyzer interface. In other examples, the first surface feature of the sampler cone includes a first protrusion and the second surface feature of the mass analyzer interface includes a second protrusion, the first protrusion configured to apply a force to the first surface of the gasket and the second protrusion configured to apply a force to the second surface of the gasket to compress the gasket to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass analyzer interface. In certain embodiments, at least one of the sampler cone and the mass analyzer interface further includes additional surface features. In other embodiments, the gasket includes a metal gasket having a thickness of about 0.1 mm to about 0.5 mm. In some examples, the first surface feature, the second surface feature, and the gasket each include materials having substantially similar thermal expansion coefficients. In other examples, the gasket is a multi-layer metal gasket.

[0006] In some embodiments, the gasket includes a thickness of about 0.2 mm to about 0.25 mm, the first surface feature is configured as a triangular protrusion having a height of less than 1 mm, and the second surface feature is configured as a triangular protrusion having a height of less than 1 mm.

[0007] In another embodiment, the gasket includes a thickness of about 0.2 mm to about 0.25 mm, the first surface feature is configured as a triangular protrusion having a height of less than 1 mm, and the second surface feature is configured as a triangular recess having a depth of less than 1 mm.

[0008] In some configurations, the gasket includes a thickness of about 0.2 mm to about 0.25 mm, the first surface feature is configured as a triangular recess having a depth of less than 1 mm, and the second surface feature is configured as a triangular protrusion having a height of less than 1 mm.

[0009] In another aspect, a method of sealing a sampler cone to a mass analyzer interface is described. In some cases, the method includes coupling the sampler cone to the mass analyzer interface by crushing a metal gasket between a first surface feature of the sampler cone and a second surface feature of the mass analyzer interface to provide a substantially liquid-tight seal between the sampler cone and the mass analyzer interface, thereby providing a substantially liquid-tight seal between the sampler cone and the mass analyzer interface.

[0010] In some examples, the method includes crushing a metal gasket between a first surface feature and a second surface feature by tightening a first thread of the sampler cone to a second thread of the mass analyzer interface. In some cases, the first surface feature of the sampler cone includes a recess and the second surface feature of the mass analyzer interface includes a protrusion, the recess configured to engage with the protrusion and crush the gasket between the recess and the protrusion to provide a substantially liquid-tight seal between the sampler cone and the interface when the sampler cone is coupled to the interface. In other examples, the first surface feature of the sampler cone includes a protrusion and the second surface feature of the mass analyzer interface includes a recess and the protrusion configured to engage with the recess and crush the gasket between the recess and the protrusion to provide a substantially liquid-tight seal between the sampler cone and the interface when the sampler cone is coupled to the mass analyzer interface. In some embodiments, the first surface feature of the sampler cone includes a first protrusion and the second surface feature of the mass analyzer interface includes a second protrusion, the first protrusion configured to apply a force to a first surface of the gasket and the second protrusion configured to apply a force to a second surface of the gasket to compress the gasket and provide a substantially liquid-tight seal (or a liquid-tight seal).

[0011] In some examples, the gasket includes a thickness of about 0.2 mm to about 0.25 mm, the first surface feature is configured as a triangular protrusion having a height of less than 1 mm, and the second surface feature is configured as a triangular protrusion having a height of less than 1 mm.

[0012] In certain examples, the first surface feature, the second surface feature, and the gasket each include materials having substantially similar (or the same) coefficients of thermal expansion. In some examples, the gasket is a multi-layer metal gasket.

[0013] In another aspect, a mass spectrometer includes a sampler cone including a sample orifice configured to fluidly couple to an ionization source that provides a fluid beam including ions to the sample orifice, the sampler cone including a first surface feature on a surface of the sampler cone; a mass analyzer interface configured to couple to the sampler cone, the mass analyzer interface including a second surface feature on a surface of the mass analyzer interface; a gasket between the first surface feature and the second surface feature, the first surface feature imparting a force to a first surface of the gasket and the second surface feature imparting a force to a second surface of the gasket, providing a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the interface when the sampler cone is coupled to the mass analyzer interface; and a mass analyzer.

[0014] In certain configurations, the mass spectrometer includes a sample introduction device fluidly coupled to an ionization source, the ionization source being fluidly coupled to an orifice of the sampler cone. In other configurations, the mass spectrometer includes a detector. In some examples, the ionization source includes an inductively coupled plasma. In certain examples, the mass analyzer includes at least one quadrupole. In some embodiments, the detector includes an electron multiplier. In some examples, the first surface feature of the sampler cone includes a recess and the second surface feature of the mass analyzer interface includes a protrusion, the recess configured to engage the protrusion and crush a gasket between the recess and the protrusion to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass analyzer interface when the sampler cone is coupled to the mass analyzer interface. In another example, the first surface feature of the sampler cone includes a protrusion and the second surface feature of the mass analyzer interface includes a recess, the protrusion configured to engage the recess and crush the gasket between the recess and the protrusion to provide a substantially liquid-tight seal between the sampler cone and the interface when the sampler cone is coupled to the mass analyzer interface. In another embodiment, the first surface feature of the sampler cone includes a first protrusion and the second surface feature of the mass analyzer interface includes a second protrusion, the first protrusion configured to apply a force to a first surface of the gasket and the second protrusion configured to apply a force to a second surface of the gasket to compress the gasket to provide a substantially liquid-tight seal between the sampler cone and the mass analyzer interface. In some embodiments, the gasket includes a thickness of about 0.1 mm to about 0.5 mm.

[0015] In another embodiment, the kit includes a sampler cone including a sample orifice configured to be fluidly coupled to an ionization source that provides a fluid beam including ions to the sample orifice, the sampler cone including a first surface feature configured to engage with a second surface feature on an interface of a mass spectrometer; a gasket, e.g., a metal gasket, sized and positioned to be placed between the first surface feature of the sampler cone and the second surface feature of the interface and configured to be crushed between the first surface feature of the sampler cone and the second surface feature of the interface when the sampler cone is coupled to the interface of the mass spectrometer; and written or electronic instructions for using the sampler cone and the metal gasket to couple the sampler cone to the interface of a mass spectrometer and provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the interface of the mass spectrometer. In some examples, the kit includes the interface. In other examples, the kit includes a tool including a preset torque for tightening the threads of the sampler cone to the threads of the interface to crush the metal gasket and provide a substantially liquid-tight seal.

[0016] In another aspect, a mass spectrometer sampler cone includes a sample orifice configured to fluidly couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, and a first surface feature on a surface of the sampler cone, the first surface feature configured to apply a force to a surface of a metal gasket to crush the metal gasket between the first surface feature of the sampler cone and a second surface feature of the mass analyzer interface to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass analyzer.

[0017] In certain embodiments, the first surface feature of the sampler cone comprises a recess. In other embodiments, the first surface feature of the sampler cone comprises a protrusion. In some examples, the sampler cone further comprises a thread configured to mate with a thread on a mass analyzer interface.

[0018] In an additional aspect, a mass spectrometer interface configured to couple to the sampler cone includes a first surface feature configured to apply a force to a surface of the metal gasket to crush the metal gasket between the first surface feature of the mass spectrometer interface and the second surface feature of the sampler cone to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass spectrometer interface.

[0019] In some examples, the first surface feature of the mass spectrometer interface comprises a recess. In other examples, the first surface feature of the mass spectrometer interface cone comprises a protrusion. In some examples, the mass spectrometer interface further comprises a thread configured to mate with a thread on the sampler cone.

[0020] In another aspect, a mass spectrometer sampler cone is described that includes a sample orifice and a surface feature. In some configurations, the sample orifice is configured to fluidly couple to an ionization source that provides a fluid beam including ions to the sample orifice. In a particular example, the sampler cone includes a surface feature on a surface of the sampler cone that is configured to engage and crush a metal gasket between the surface feature of the sampler cone and the surface feature of the mass analyzer interface to provide a substantially liquid-tight seal between the sampler cone and the mass analyzer interface.

[0021] In certain embodiments, the surface feature of the sampler cone includes a recess and the surface feature of the interface includes a protrusion, the recess configured to engage with the protrusion and crush a metal gasket between the recess and the protrusion when the sampler cone is clamped to the interface. In other embodiments, the surface feature of the sampler cone includes a protrusion and the surface feature of the interface includes a recess, the protrusion configured to engage with the recess and crush a metal gasket between the recess and the protrusion when the sampler cone is clamped to the interface.

[0022] In some examples, the sampler cone further includes threads configured to mate with threads on the interface.

[0023] In other examples, the surface feature of the sampler cone includes a circular recess and the surface feature of the interface includes a circular protrusion, the circular recess configured to engage the circular protrusion via a metal gasket and to crush the metal gasket between the circular recess and the circular protrusion to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass analyzer interface. In some examples, the circular recess includes a depth of less than 1 mm and the metal gasket includes a thickness of less than 0.5 mm.

[0024] In other examples, the sampler cone comprises a material similar to a metal gasket. In some embodiments, the sampler cone comprises one or more of aluminum, nickel, platinum, or a nickel base with a platinum tip.

[0025] In certain embodiments, the sampler cone comprises a conical shape in which the inner diameter of the sampler cone increases from the sample orifice to the base of the sampler cone where the surface features of the sampler cone reside.

[0026] In other embodiments, the sampler cone includes a second surface feature on the sampler cone, the second surface feature being separated from the surface feature.

[0027] In additional aspects, the mass spectrometer interface includes a first thread configured to couple to the second thread of the sampler cone. In some examples, the interface further includes a first surface feature configured to engage with a second surface feature on the sampler cone. In some configurations, the first surface feature and the second surface feature crush a metal gasket positioned between the first surface feature and the second surface feature to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the interface when the second thread of the sampler cone mates with the first thread of the interface.

[0028] In some embodiments, the first surface feature of the interface includes a recess and the second surface feature of the sampler cone includes a protrusion, the recess configured to engage the protrusion and crush a metal gasket between the recess and the protrusion when the sampler cone is tightened to the interface.

[0029] In other embodiments, the first surface feature of the interface includes a protrusion and the second surface feature of the sampler cone includes a recess, the protrusion configured to engage the recess and crush a metal gasket between the recess and the protrusion when the sampler cone is tightened to the interface.

[0030] In additional embodiments, the first surface feature of the interface includes a circular recess and the second surface feature of the sampler cone includes a circular protrusion, the circular recess configured to engage the circular protrusion and crush a metal gasket between the circular recess and the circular protrusion to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass analyzer interface. In some examples, the circular recess includes a depth of less than 1 mm and the metal gasket includes a thickness of less than 0.5 mm.

[0031] In another example, the first surface feature of the interface includes a circular protrusion and the second surface feature of the sampler cone includes a circular recess, the circular protrusion configured to engage with the circular recess and crush a metal gasket between the circular protrusion and the circular recess to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the mass analyzer interface.

[0032] In some embodiments, the interface comprises a material similar to a metal gasket, while in other embodiments, the interface comprises aluminum.

[0033] In some examples, the mass spectrometer interface includes a second surface feature on the interface, the second surface feature being separated from the surface feature.

[0034] In some embodiments, the interface is configured to couple to the sampler cone without the use of a rubber O-ring between the interface and the sampler cone.

[0035] In another aspect, a mass spectrometer includes a sampler cone including a sample orifice configured to fluidly couple to an ionization source that provides a fluid beam including ions to the sample orifice, the sampler cone including a first thread and a first surface feature. The mass spectrometer may also include an interface coupled to the mass analyzer and including a metal gasket and a second thread configured to couple to the first thread of the sampler cone, the interface further including a second surface feature configured to engage with the first surface feature of the sampler cone, such that when the first thread of the sampler cone is mated with the second thread of the interface, the metal gasket is crushed between the first surface feature and the second surface feature to provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the interface.

[0036] In certain embodiments, the mass spectrometer includes a sample introduction device, an ionization source, and a detector, where the sample introduction device is fluidly coupled to the ionization source, the sample orifice of the sampler cone is fluidly coupled to the ionization source, and the mass analyzer is fluidly coupled to the detector. In some embodiments, the ionization source includes an inductively coupled plasma. In other examples, the mass analyzer includes at least one quadrupole. In some embodiments, the detector includes an electron multiplier. In other examples, the detector includes a time-of-flight device.

[0037] In certain embodiments, the first surface feature of the sampler cone includes a recess and the second surface feature of the interface includes a protrusion configured to engage the recess, and the metal gasket is positioned between the recess and the protrusion and is crushed when the first thread of the sampler cone mates with the second thread of the interface.

[0038] In some examples, the first surface feature of the sampler cone includes a protrusion and the second surface feature of the interface includes a recess configured to engage the protrusion, and the metal gasket is positioned between the protrusion and the recess and is crushed when the first thread of the sampler cone mates with the second thread of the interface.

[0039] In another example, the first surface feature of the sampler cone includes a circular recess and the second surface feature of the interface includes a circular protrusion configured to engage with the circular recess, and the metal gasket is positioned between the circular recess and the circular protrusion and is crushed when the first thread of the sampler cone mates with the second thread of the interface.

[0040] In a further embodiment, the first surface feature of the sampler cone includes a circular protrusion and the second surface feature of the interface includes a circular recess configured to engage with the circular protrusion, and the metal gasket is positioned between the circular protrusion and the circular recess and is crushed when the first thread of the sampler cone mates with the second thread of the interface.

[0041] In another aspect, the kit includes a sampler cone, a metal gasket, and instructions for using the sampler cone and the gasket. In some embodiments, the sampler cone of the kit includes a sample orifice configured to fluidly couple to an ionization source that provides a fluid beam including ions to the sample orifice, and the sampler cone includes a first surface feature configured to engage with a second surface feature on the interface. In some embodiments, the metal gasket can be sized and positioned to be placed between the first surface feature of the sampler cone and the second surface feature of the interface, and configured to be crushed between the first surface feature of the sampler cone and the second surface feature of the interface when the sampler cone is coupled to the interface of the mass analyzer. In a particular example, the kit includes instructions for using the sampler cone and the metal gasket to couple the sampler cone to the interface of the mass analyzer and provide a substantially liquid-tight seal (or a liquid-tight seal) between the sampler cone and the interface of the mass analyzer.

[0042] In some examples, the kit may also include an interface, hi other examples, the kit may include a tool that includes a preset torque for tightening the sampler cone to the interface and crushing the metal gasket to provide a substantially liquid-tight seal (or a liquid-tight seal) without over-tightening the sampler cone.

[0043] In an additional aspect, a method is provided for coupling a sampler cone to a mass analyzer interface to provide a substantially liquid-tight seal between the sampler cone and the mass analyzer interface. In some examples, the method includes crushing a metal gasket between a first surface feature of the sampler cone and a second surface feature of the mass analyzer interface to provide a substantially liquid-tight seal between the sampler cone and the mass analyzer interface. In other examples, the method includes crushing a metal gasket between the first surface feature and the second surface feature by tightening a first thread of the sampler cone to a second thread of the mass analyzer interface with a selected torque value.

[0044] Additional features, aspects, embodiments, and configurations are described in more detail below.

[0045] Specific embodiments and configurations are described below with reference to the accompanying figures. [Brief description of the drawings]

[0046] [Figure 1] 1 is a diagram of a sampler cone and an interface, according to some examples. [Figure 2A] FIG. 1 is an exploded view of the sampler cone, metal gasket, and interface. [Figure 2B] FIG. 2B illustrates the components of FIG. 2A assembled together according to a particular configuration. [Figure 2C] FIG. 1 is an exploded view of the sampler cone, metal gasket, and interface. [Figure 2D] FIG. 2D shows the components of FIG. 2C assembled together according to a particular configuration. [Diagram 3] 1 is a diagram of a sampler cone including surface features configured as protrusions, and an interface including surface features configured as recesses, according to some embodiments. [Figure 4]1 is a diagram of a sampler cone including a surface feature configured as a recess, and an interface including a surface feature configured as a recess, according to some embodiments. [Diagram 5] 1 is a diagram of a sampler cone including a surface feature configured as a convex, and an interface including a surface feature configured as a convex, in accordance with certain embodiments. [Figure 6A] 1 is a diagram of a metal gasket having a top surface including a protrusion, according to a particular example. [Figure 6B] 1 is a diagram of a metal gasket having a top surface that includes a U-shape, according to a particular example. [Figure 6C] 1 is a diagram of a metal gasket in accordance with a particular example, where the upper and lower surfaces each include a U-shape. [Figure 6D] 1 is a diagram of a metal gasket having an upper surface including a U-shape and a lower surface including a convex portion, according to a particular example. [Figure 6E] 13A-13C are diagrams of a gasket in which the top surface has a different length than the bottom surface, according to some configurations. [Figure 6F] 1 is a diagram of a gasket including recesses on each surface, according to certain examples. [Figure 6G] 1A-1C are diagrams of a gasket including offset recesses on each surface according to some embodiments. [Figure 6H] 1 is a diagram of a gasket including different materials across the surface of the gasket, according to some examples. [Figure 6I] 1 is a diagram of a gasket including different thicknesses across a surface of the gasket, according to some examples. [Figure 7A] 1 is a cutaway view of a gasket with two components each including a surface feature. [Figure 7B] 7B is an assembly diagram of the components of FIG. 7A, according to some examples. [Figure 8A] 1 is an assembly diagram of two components, each including a surface feature with a flat surface that can exert a compressive force on a gasket, according to a particular example. [Figure 8B]FIG. 1 illustrates an assembly of two components, according to some examples, where one component includes a surface feature with a flat surface and the other component includes a surface feature with a sharp end or tip that can exert a compressive force on the gasket. [Figure 9A] 1 is an assembly diagram of two components, each of which includes two or more surface features that can provide a compressive force to a gasket, according to some examples. [Figure 9B] FIG. 1 illustrates an assembly of two components, according to some examples, each of which includes two or more surface features that can provide a compressive force to a gasket, with at least one surface feature being offset. [Figure 10] FIG. 2 is a diagram of certain components of a mass spectrometer, according to some embodiments. [Figure 11] 1 is a diagram of a sampler cone including a first surface feature and a second surface feature on a mating surface of the sampler cone, according to certain embodiments. [Figure 12] 10 is a flowchart illustrating a method of coupling a sampler cone and an interface together via a gasket to provide a substantially fluid-tight seal therebetween, according to some examples. [Figure 13] 1A-1C are cross-sectional views of a sampler cone showing depressions or dimples on the periphery of the bottom surface of the sampler cone according to some configurations. [Figure 14] FIG. 1 is a diagram of a sampler cone including an interface including a protrusion, a metal gasket, and a groove, according to certain embodiments. [Figure 15A] 1 illustrates two components and a gasket that may be used to provide a substantially liquid-tight seal. [Figure 15B] 1 illustrates two components and a gasket that may be used to provide a substantially liquid-tight seal.

[0047] It will be appreciated by those skilled in the art, given the benefit of this disclosure, that the various components shown in the figures are not necessarily drawn to scale. Certain features may be enlarged or distorted to enhance understanding. For example, gasket thickness may be increased to better show how one component connects to another or applies a force. Exemplary gasket thicknesses are described, and no particular gasket thickness is intended from the exemplary configurations shown in the figures based on the relative sizes of the components shown in the figures. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0048] Certain configurations of sampling cones are described that can be used to form a seal with a mass spectrometer interface without the need for highly polished or flat surfaces. For example, a flat metal gasket can be positioned between each surface feature of the sampler cone and the interface and can crush between the surface features to help seal the sampler cone to the interface. In certain examples, the sampler cone and / or interface need not rely on a seal created between a flat surface and a highly polished surface, but can instead implement a crush seal approach, optionally in combination with surface features of the sampler cone and / or surface features of the interface, to seal the interface to the sampler cone. The seal can be provided by torquing the sampler cone down to the interface with a crush washer or gasket that helps create a liquid-tight seal between the two components. When the sampler cone is tightened to the interface, at least a portion of the metal gasket distorts or "crushes" at least to some extent, providing a seal between the components. As described in more detail below, part or all of the metal gasket may be sandwiched or crushed between other components, thereby helping to provide a substantially liquid-tight seal.

[0049] In certain instances, reference is made herein to a "protruding" or "recessed" portion. These terms provide a more user-friendly description and refer to the presence of a surface feature, which in the case of a protruding portion is at least partially positioned above the surface, or in the case of a recessed portion is provided with some open space through and along the surface. No particular shape, width, height, length, or configuration is intended to be required by the use of these terms unless specified for a particular configuration. Reference is also made to a "substantially liquid-tight seal," which refers to a seal between the sampler cone and the interface such that little or no gas leaks from the sampler cone / interface surface into the vacuum stage of the mass analyzer. If desired, the seal between the sampler cone and the interface is liquid-tight, allowing zero gas to be drawn into the mass analyzer from any space between the sampler cone and the interface, except the sampler orifice.

[0050] In a particular embodiment, a general schematic diagram of certain components of a mass spectrometer (MS) is shown in FIG. 1. The sampler cone 110 is shown as being coupled to the edge 120 of the mass analyzer interface. Without wishing to be bound to any particular configuration, the interface is generally the point or area where the ionized sample is introduced into the mass analyzer portion. This interface allows for fluid coupling between the ionization device or ion generation stage of the MS and the mass analyzer stage of the MS. For example, when an inductively coupled plasma (ICP) is used as the ionization source, ions exit the torch, which maintains the ICP in the form of a hot fluid stream, e.g., a hot gas stream, that contains ions, photons, and other species generated in the plasma. The fluid stream then impinges on the sampler cone 110. While there are many different configurations, the sampler cone 110 is often configured as a water-cooled cone with a small orifice, allowing only a small portion of the entire fluid stream from the ICP to enter the mass analyzer stage. The temperature of the existing fluid stream is often very high, but downstream of the sampler cone 110, the temperature is extremely low due to the reduced pressure. The pressure difference across the sampler cone orifice creates a supersonic expansion. The drop in temperature is a result of the supersonic expansion, where plasma energy in the form of heat is converted to directed velocity in the free injection region. A portion of the fluid is allowed to pass through the sampler cone 110 and is often fed to the skimmer cone 115 for further containment / selection of the fluid stream, and may be fed to downstream components of the mass analyzer, such as lenses, collision cells, ion guides, ion deflectors, mass filters, etc. The mass analyzer may be maintained at a pressure significantly lower than atmospheric pressure using one or more vacuum pumps, such as a roughing pump 130 and a turbo pump 140.

[0051] In a particular example, fluid enters the mass analyzer only through a small orifice in the sampler cone 110 because a fluid-tight seal between the sampling cone 110 and the edge 120 of the interface is required to maintain a vacuum at different stages of the mass analyzer using pumps 130, 140.

[0052] In certain embodiments, to avoid or reduce problems associated with coupling the sampler cone to the interface using a rubber O-ring, certain configurations described herein advantageously include suitable shapes or surface features on or within the surface of the sampler cone that can engage or otherwise receive suitable shapes or surface features on or within the surface of the interface. In other examples, the sampler cone can be configured to sandwich or crush a gasket between two or more components to provide a substantially liquid-tight seal. For example, a thin metal crush gasket, washer, or seal can be positioned between the surface features of the sampler cone and the interface such that engaging the surface features of the sampler cone with the surface features of the interface crushes the thin metal gasket to provide a seal between the sampler cone and the interface. Alternatively, a thin metal crush gasket, washer, or seal can be positioned between the surface features of the sampler cone such that the thin metal crush gasket is sandwiched or crushed by the placement of the surface features close to each other to provide a substantially liquid-tight seal. Improved sealing and heat transfer can be achieved by using metal gaskets / seals with suitably configured sampler cones and / or interfaces. Additionally, the use of metal gaskets / seals eliminates the need for sampler cones and interfaces to have highly polished mating surfaces. For example, the surfaces of the sampler cones and / or interfaces where surface protrusions exist can be non-flat. Furthermore, the surface features do not need to have any particular shape or arrangement and can be designed, for example, to amplify forces in a given area to enhance the seal at the contact point(s) between the gasket and the component.

[0053] In a particular example, referring to FIG. 2A, an exploded view of a cross section of a side edge of a sampler cone / metal gasket / interface edge is shown. The sampler cone 210 includes a surface feature 212, e.g., a protrusion, which in this example may engage a surface feature 222, e.g., a groove or recess, on the interface 220. The metal gasket 215 may be positioned between the components 210 and 220 and adjacent to the surface features 212, 222. Upon tightening the sampler cone 210 to the interface 220 via threads (not shown), the metal gasket 215 is crushed into the groove 222 as the protrusion 212 engages the groove 222 from the tightening process. The result of the tightening process is a substantially liquid-tight seal between the sampler cone 210 and the interface 220. The metal gasket 215 is shown residing in the groove 222 and spanning the mating surfaces of the sampler cone 210 and the interface 220. In certain configurations, the metal gasket 215 is generally sized and positioned to be crushed into the groove 222 and lodged at least to some extent between the mating surfaces of the sampler cones 210 and 220. In such cases, the surfaces of the sampler cone 210 and the interface 220 do not necessarily need to be in contact when the sampler cone 210 is sealed to the interface 220.

[0054] In certain embodiments, the shapes of the sampler cone and interface features need not be the shapes shown in Figures 2A and 2B, and many other shapes are possible. With reference to Figures 2C and 2D, sampler cone 250 includes surface features including dimples, grooves, or recesses 252 on a surface and is configured to engage with a portion of metal gasket 255. Interface 260 includes surface features including bosses or protrusions 262 on a surface and is configured to insert into recess 252 of sampler cone 250. Although not shown, sampler cone 250 typically includes threads that mate with threads on interface 260 to couple sampler cone 250 to interface 260. When using the components of Figure 2C, metal gasket 250 may be placed between sampler cone 250 and interface 260 prior to threading sampler cone 250 through interface 260. Clamping of the sampler cone 250 to the interface 260 results in compression / crushing of the metal gasket 255 between the surface features 252 of the sampler cone 250 and the surface features 262 of the interface 260 (see FIG. 2D). The metal gasket 255 acts to seal the space between the sampler cone 250 and the interface 260 to provide a substantially liquid-tight seal between the sampler cone 250 and the interface 260 and contributes to achieving and maintaining reduced pressure in the vacuum region of the mass analyzer. The surface features shown on the sampler cone 250 and the interface 260 are typically three-dimensional, so that clamping of the sampler cone 250 to the interface 260 results in engagement of the surface features 252, 262 and the metal gasket 255 sandwiched between the surface features 252, 262.

[0055] Although threads present on the sampler cone and interface are described above as being used to couple the sampler cone to the interface, other configurations are possible. For example, there may be a retaining ring around the sampler cone that includes threads, and no threads on the sampler cone. In another configuration, there are multiple screws or bolts (or other types of external fasteners) on the circumference of the sampler cone, away from the seal line. The fasteners are tightened and the cone is pressed against the interface, thereby crushing the metal gasket between the surface features. In another example, the vacuum pressure in the vacuum manifold itself can be used to pull the sampler cone against the interface and crush the metal gasket to provide a seal without the use of any external fasteners or threads. The sampler cone can include many different types of materials and typical materials that are generally inert and non-reactive to ions or other analytes that pass through the sample orifice of the sampler cone or otherwise contact the surface of the sampler cone. For example, the sampler cone may include one or more of aluminum, nickel, platinum, or nickel base with a platinum tip. The interface may comprise a similar material as the sampler cone, eg, aluminum, nickel, platinum, etc., although the interface material need not be the same as the material of the sampler cone and / or skimmer cone if present.

[0056] In some embodiments, the metal gaskets 215, 255 can each be configured as a generally flat-sided metal ring or have other shapes that generally mirror the shape on the sampler cone. For example, the metal gaskets 215, 255 can each be circular, elliptical, or have other shapes. The metal gaskets 215, 255 can each be configured as a single layer gasket or a multi-layer gasket. If desired, two or more individual gaskets can be used. Although not necessary in all cases, the metal gaskets can include a soft metal material that can at least partially crush or compress when the threads of the sampler cone are tightened onto the threads of the interface. For example, the metal gaskets 215, 255 can each independently include aluminum, nickel, brass, pure platinum, gold, copper, or other transition metals that can at least partially crush upon application of the force used to tighten the sampler cone onto the interface. As described herein, the sampler cone can be tightened to the interface to a suitable degree using a tool with a preset torque limit so as not to overtighten and deform or destroy the metal gasket and destroy any seals. The metal gasket can also allow for heat transfer from the sampler cone to the interface (or vice versa), if desired. The thickness of the metal gasket can vary, for example, from about 0.1 mm to about 0.5 mm, although these values ​​are merely exemplary and lesser or greater thicknesses can be used, if desired. The thickness of the metal gasket is typically sized based on the depth and / or height of surface features present on the non-flat surface sampler cone and / or interface. For example, the recesses of the sampler cone may be about 0.2-1 mm deep, while the height of the protrusions or bosses of the interface may be about 0.2-1 mm high.The metal gasket may be sized to occupy at least a portion of the space that may exist when the protrusion of the interface is mated with the recess of the sampler cone, e.g., after the metal gasket is compressed or crushed, the metal gasket may contact substantially all of the surfaces of the sampler cone and the surface features of the interface. As described in more detail below, the metal gasket need not be the same thickness in all areas, nor need it be made from the same material across the gasket's surface. Additionally, the gasket may include indicia, indentations, or other surface features that aid in positioning the gasket at a particular site or area as desired.

[0057] In other configurations, the sampler cone need not have a recess, but could alternatively include a protrusion or boss. One illustration is shown in FIG. 3, where the sampler cone 310 includes a surface feature, which includes a protrusion 312 on a non-planar mating surface that mates with a groove or recess 332 on the non-planar mating surface of the interface 330 via a metal gasket 320. Fastening the sampler cone 310 to the interface 330 via the threads of these components crushes the metal gasket 320 between the surface features 312 and the surface features 332, facilitating a fluid-tight seal between the components 310 and 330. As noted above, configurations other than threads for the sampler cone and interface could also be used. The metal gasket 320 could be configured similarly to the gasket 220. For example, the metal gasket 320 could be a single layer gasket or a multi-layer gasket. The metal gasket 320 may include a soft metal material that may crush or compress to at least some extent when the sampler cone 310 is tightened to the interface 330. In some examples, the metal gasket 320 may include aluminum, nickel, brass, pure platinum, gold, copper, or other transition metals that may compress to at least some extent upon application of a force used to tighten the threads of the sampler cone 310 to the threads of the interface 330. As described herein, a tool with a preset torque limit may be used to tighten the sampler cone 310 to a suitable degree to the interface 330 so as not to overtighten and deform the metal gasket 320 and destroy any seals. The metal gasket 320 may also allow for heat transfer from the sampler cone 310 to the interface 330 (or vice versa), if desired. The thickness of the gasket 320 may vary, for example, from about 0.1 mm to about 0.5 mm, although these values ​​are merely exemplary and lesser or greater thicknesses may be used, if desired. The thickness of the gasket is typically sized based on the depth and / or height of any surface features present on the non-planar surface of the sampler cone 310 and / or interface 330.For example, the recess of the interface 330 may be about 0.2-1 mm and the height of the protrusion or boss of the sampler cone 310 may be about 0.2-1 mm. The metal gasket 320 may be sized to occupy at least a portion of the space that may exist when the protrusion of the sampler cone is mated with the recess of the interface, e.g., after the metal gasket is compressed or crushed, the metal gasket may contact substantially all of the surfaces of the sampler cone and the surface features of the interface.

[0058] In certain embodiments, the sampler cone and the interface may each have a recess or other inwardly facing surface feature designed to mate / engage with the metal gasket. In such cases, the gasket thickness itself may increase or the gasket thickness may vary across the surface of the metal gasket so that when the gasket is crushed or compressed, the gasket is pressed into the recesses of the sampler cone and the interface. As shown in FIG. 4, the sampler cone 410 includes a surface feature, which includes a recess 412 on a surface that mates with a recess 432 on a surface of the interface 430 via the threads of these components. Fastening the sampler cone 410 to the interface 430 via the threads of these components compresses the metal gasket 420 between the surface features 412 and 432, facilitating a substantially liquid-tight or liquid-tight seal between the components 410 and 430. As noted above, configurations other than threads of the sampler cone and the interface may also be used. The metal gasket 420 is pressed into the recesses 412 and 432. For example, the metal gasket 420 may be sized to have a thicker central body than the edges, allowing a portion of the gasket 420 to occupy the recesses 412, 432 when the sampler cone 410 is coupled to the interface 430. Alternatively, multiple different sized gaskets may be stacked such that the central region of the gasket occupies at least a portion of the space of the recesses 412, 432. In certain embodiments, the metal gasket 420 may be a single layer gasket or a multi-layer gasket. The metal gasket 420 may include a soft metal material that may compress, at least to a certain extent, when the sampler cone 410 is tightened to the interface 430. In some examples, the metal gasket 420 may include aluminum, nickel, brass, pure platinum, gold, copper, or other transition metals that may crush or compress, at least to a certain extent, upon application of a force used to tighten the threads of the sampler cone 410 to the threads of the interface 430.As described herein, the sampler cone 410 can be tightened to the interface 430 to a suitable degree using a tool with a preset torque limit so as not to overtighten and deform the metal gasket 420 and destroy any seals. The metal gasket 420 can also allow for heat transfer from the sampler cone 410 to the interface 430 (or vice versa), if desired. The thickness of the gasket 420 can vary, for example, from about 0.1 mm to about 0.5 mm, although these values ​​are merely exemplary and lesser or greater thicknesses can be used, if desired. The thickness of the gasket is typically sized based on the depth of any recesses present in the surfaces of the sampler cone 410 and / or interface 430. For example, the recesses in the interface 430 and sampler cone 410 can each independently be about 0.2 to 1 mm deep. The metal gasket 420 may be sized to occupy at least a portion of the space that would exist if the recess of the interface were mated to the recess of the sampler cone, e.g., after the metal gasket is compressed or crushed, the metal gasket may contact substantially all of the surfaces of the sampler cone and the surface features of the interface. The recesses 412, 432 need not have flat recessed surfaces, but instead can adopt many different arrangements and shapes as desired, including tapered recessed surfaces, pointed recessed surfaces, and the like.

[0059] In certain embodiments, the sampler cone and the interface may each have a protrusion or other outward surface feature designed to mate / engage with a metal gasket. As shown in FIG. 5, the sampler cone 510 includes a surface feature, which includes a protrusion 512 on a surface that mates with a protrusion 532 on a surface of the interface 530 via the metal gasket 520. Tightening the sampler cone 510 to the interface 530 via the threads of these components compresses the metal gasket 520 between the surface features 512 and the surface features 532, facilitating a substantially liquid-tight or liquid-tight seal between the components 510 and 530. As noted above, configurations other than threads of the sampler cone and the interface may also be used. The metal gasket 520 may be configured similarly to gaskets 220, 320, or 420. For example, the metal gasket 520 may be a single layer gasket or a multi-layer gasket. The metal gasket 520 may include a soft metal material that may compress, at least to some extent, when the sampler cone 510 is tightened to the interface 530. In some examples, the metal gasket 520 may include aluminum, nickel, brass, pure platinum, gold, copper, or other transition metals that may crush or compress, at least to some extent, upon application of a force used to tighten the threads of the sampler cone 510 to the threads of the interface 530. As described herein, a tool with a preset torque limit may be used to tighten the sampler cone 510 to a suitable degree to the interface 530 so as not to overtighten and deform the metal gasket 520 and destroy any seals. The metal gasket 520 may also allow for heat transfer from the sampler cone 510 to the interface 530 (or vice versa), if desired. The thickness of the gasket 520 may vary, for example, from about 0.1 mm to about 0.5 mm, although these values ​​are merely exemplary and lesser or greater thicknesses may be used, if desired. The thickness of the gasket is typically sized based on the height of any protrusions present on the surface of the sampler cone 510 and / or interface 530.For example, the protrusions on interface 530 and sampler cone 510 may each independently be about 0.2-1 mm in height. Metal gasket 520 may be sized to span the width of each of protrusions 512, 532 when the mating surfaces of sampler cone 510 and interface 530 are joined. Protrusions 512, 532 need not be flat surfaces, but instead may employ many different arrangements and shapes as desired, including, for example, pointed protrusions, tapered protrusions, trapezoidal protrusions, or other shapes that are not necessarily flat surfaces.

[0060] In certain embodiments, the metal gaskets described herein need not be flat-sided. For example, the metal gasket may have its own shape or surface features configured to bond to the surface features of the sampler cone and / or interface. One view is shown in FIG. 6A where a gasket 610 includes a protrusion 612 on the top surface. Another configuration is shown in FIG. 6B where a gasket 620 includes a U-shaped feature 622 configured to engage a protrusion from the sampler cone or interface. An additional configuration is shown in FIG. 6C where a gasket 630 includes U-shaped features 623, 624 on each of the top and bottom surfaces. Each of the U-shaped features 632, 634 may engage a protrusion from the sampler cone or interface. The U-shaped features 632, 634 need not be positioned under each other as shown in FIG. 6C. Another configuration is shown in FIG. 6D where a gasket 640 includes a U-shaped feature 642 on the top surface and a protrusion 644 on the bottom surface. An additional configuration is shown in FIG. 6E, where the length of the top surface 652 of the gasket 650 is shorter than the length of the bottom surface 654 of the gasket 650. Another configuration is shown in FIG. 6F, where the gasket 660 includes non-planar recesses 662, 664 that can be used to receive protrusions on a sampler cone, interface, or other component. When recesses, protrusions, or other features are present on the gasket, the features need not be positioned on the same vertical axis. Referring to FIG. 6G, a gasket 670 is shown that includes offset recesses 672, 674. By offsetting the recesses, the thickness of the gasket can be increased in areas designed to receive protrusions (or other shaped features) of a sampler cone, interface, or other component. Other gasket shapes, surface features, and configurations can also be used as desired. Various metal gasket surface features can be produced, for example, by machining features into a solid metal body and then forming, trimming, cutting, etc. the metal gasket into the desired shape and bonding to the sampler cone and / or interface.

[0061] In certain embodiments, the entire surface of the gasket need not be made from the same material. For example, it may be desirable to match the material used on the surface of the mating region of the gasket with the material used on the cone, interface, or other component, such that there is little or no difference in the thermal expansion rates of the materials, e.g., little or no mismatch in the thermal expansion coefficients, to maintain a substantially liquid-tight seal over a wide temperature range. As shown in FIG. 6H, the gasket 680 includes a first material 682 on the surface of the gasket 680 designed to contact the cone, interface, or other component, and a second material 684 that is different from the first material 682 and is present in other areas of the gasket 680. Alternatively, the material on the mating surface of the gasket can be selected to expand when heated from room temperature to an operating temperature to fill any gaps that may exist between the surface of the gasket and the surface of the cone, interface, or other component. If the components to be joined comprise different materials, for example, the surface features on the sampler cone comprise a first material and the surface features on the interface comprise a different material, a multi-layer gasket with a suitable material present on each surface of the gasket can be used to minimize any leakage that may result from a thermal mismatch of the different materials.

[0062] In other configurations, the gasket need not have the same thickness across its entire surface. Referring to FIG. 6I, a gasket 690 is shown that includes a thickness in region 692 that is less than other regions of the gasket 690. As described herein, the thickness of the entire gasket may vary, with exemplary ranges including about 0.1 mm to about 1 mm, such as about 0.1 mm to about 0.5 mm, or about 0.2 mm to about 0.4 mm, or about 0.2 mm to about 0.3 mm, or about 0.2 mm, 0.21 mm, 0.22 mm, 0.23 mm, 0.24 mm, or 0.25 mm. If desired, regions of the gasket 690 that are not intended to mate to a cone, interface, or other component may be thicker than region 692. Alternatively, region 692 may alternatively be thicker than other regions of the gasket 690.

[0063] In certain instances, a gasket and surface features of a cone, interface, or other component may be configured together to provide a desired sealing force between the components. Referring to FIG. 7A, an exploded or cutaway view of certain components is shown including a first component 710, e.g., a sampler cone, including a surface protrusion 712, and a second component 720, e.g., an interface, including a surface protrusion 722 and a gasket 730. The protrusions 712, 722 may be present on various components. For example, one protrusion may be present on the sampler cone and the other protrusion may be present on the interface or other component. When the two components 710 and 720 are joined together, the component 710 may exert a force on the top surface 732 of the gasket 730 via the protrusion 712. The component 720 may exert a force on the bottom surface 734 of the gasket 730 via the protrusion 722. Depending on the overall shape of the protrusions 712, 722, it may be possible to amplify or focus the force applied to the gasket 730 at certain areas of the gasket where the protrusions 712, 722 contact the gasket. For example, applying the same force to a reduced surface area and applying the force to both sides of the gasket 730 may provide a better seal between the components 710 and 720. The exact thickness of the gasket 730 may vary from about 0.1 mm to about 1 mm, for example, from about 0.2 mm to about 0.5 mm. In some examples, the thickness of the gasket may be about 0.2 mm, about 0.25 mm, or about 0.2 mm to about 0.25 mm thick. The thickness of the gasket need not be the same across the entire surface of the gasket 730. Additionally, the triangular shape shown in the protrusions 712, 722 is not required and other geometric shapes including, for example, squares, rectangles, hexagons, octagons, etc. may be used as desired. Additionally, the overall geometric shapes of the protrusions 712, 722 need not be the same, although each of the protrusions 712, 722 may include a pointed or pointed surface that may engage a surface of the gasket 730. Similarly, the shapes of the protrusions 712, 722 need not be triangular, but may instead employ other shapes in which the ends or apexes of the shape may engage a surface of the gasket 730. The exact dimensions of the protrusions 712, 722 may vary and need not be the same.For example, the protrusions 712, 722 may include a height of less than 1 mm.

[0064] In other examples, the protrusions used to apply a force to the surface of the gasket do not need to be non-flat. For example, as shown in FIG. 8A, protrusions 810, 820 can include flat surfaces 812, 822, respectively. These can be used to apply a force to each surface of the gasket 830. The protrusions do not need to be aligned, be in the same vertical plane, or be the same protrusion. Referring to FIG. 8B, protrusion 860 includes a flat surface 862 that can apply a force to the top surface 882 of the gasket. Protrusion 870 includes a sharp point or tip 872 that can apply a force to the bottom surface 884 of the gasket 880. Tip 872 is also slightly offset from the center of the flat surface 862 of protrusion 860. Surface 862 and tip 872 do not have to apply the same force to gasket 880, but desirably, sufficient force is applied through surface 862 and tip 872 to provide a substantially liquid-tight seal between the various components. The exact thickness of gasket 880 can vary from about 0.1 mm to about 1 mm, such as from about 0.2 mm to about 0.5 mm. In some examples, the thickness of the gasket can be about 0.2 mm, about 0.25 mm, or about 0.2 mm to about 0.25 mm thick. The thickness of the gasket need not be the same across the entire surface of gasket 880. Additionally, the tetrahedral shape shown for protrusions 812, 822, and 862 is not required, and other geometric shapes including, for example, squares, rectangles, hexagons, octagons, and the like, can be used as desired. Similarly, the shape of protrusion 872 need not be triangular, and can alternatively employ other shapes in which the ends or apexes of the shape can engage the surface of gasket 880. The exact dimensions of the protrusions 812, 822, 862, 872 can vary and need not be the same. For example, the protrusions 812, 822, 862, 872 may include a height of less than 1 mm.

[0065] In other configurations, it may be desirable to use multiple protrusions or recesses on one or more of the components, e.g., the sampler cone and one or more of the interface. While many different configurations are possible, one configuration is shown in FIG. 9A, where protrusions 912, 914 are present on a component 910, e.g., the sampler cone, and protrusions 922, 924 are present on another component 920, e.g., the interface. A gasket 930 may be present and used to provide a seal between the first component 910 and the second component 920. In this configuration, protrusions 912 and 922 are aligned along the same vertical axis and provide a force to the area of ​​the gasket 930 between them. Similarly, protrusions 914 and 924 are aligned along the same vertical axis and provide a force to the area of ​​the gasket 930 between them. However, if desired, one or more of the protrusions may be offset as shown in FIG. 9B, where protrusion 926 is shown offset from protrusion 914. The protrusions 912, 914, 922, 924, and 926 need not have the same shape or arrangement. For example, one or more of the protrusions 912, 914, 922, 924, and 926 may include a different shape, such as a flat surface, than the other protrusions. The exact thickness of the gasket 930 may vary from about 0.1 mm to about 1 mm, such as from about 0.2 mm to about 0.5 mm. In some examples, the thickness of the gasket may be about 0.2 mm, about 0.25 mm, or about 0.2 mm to about 0.25 mm thick. The thickness of the gasket need not be the same across the entire surface of the gasket 930. Although two protrusions are shown on each of the components 910, 920, one of the components may have a single protrusion or three or more protrusions as a surface feature that may engage with the gasket. If desired, each of the components 910, 920 may include three or more protrusions as a surface feature that may engage with the gasket. The exact dimensions of the protrusions 912, 922, 922, 924, and 926 can vary and need not be the same. For example, the protrusions 912, 922, 922, 924, and 926 may include a height of less than 1 mm.

[0066] In certain embodiments, the sampler cone and metal gasket, as well as other devices that can use gaskets to provide a substantially liquid-tight seal as described herein, can be used in a mass spectrometer system that includes many different components or stages. One diagram of a mass spectrometer 1000 is shown in FIG. 10, which includes a sample introduction device 1010, an ionization device / ionization source 1020, a mass analyzer 1030, and a detector 1040. In some cases, the sample introduction device 1010 can be configured as an induction nebulizer, a non-inductive nebulizer, or a hybrid of the two, a concentric, cross-flow, entrained, V-groove, parallel path, enhanced parallel path, flow blurr or piezoelectric nebulizer, a spray chamber, a chromatography device such as a gas chromatography device, or other device that can provide a sample to the ionization device / ionization source 1020.

[0067] In some configurations, the ionization device / ionization source 1020 may include many different types of devices that can receive fluid from the sample introduction device 1010 and ionize / nebulize the analytes in the fluid sample. In some examples, the ionization device / ionization source 1020 may include inductively coupled plasma, which may be generated using a torch and induction device, capacitively coupled plasma, electron ionization device, chemical ionization device, field ionization source, such as those sources configured for fast atom bombardment, field desorption, laser desorption, plasma desorption, thermal desorption, electrohydrodynamic ionization / desorption, etc., thermospray or electrospray ionization sources, or other types of ionization sources. Although many different types of ionization device / ionization source 1020 may be used, the ionization device / ionization source 1020 may typically ionize analyte ions in the sample and provide them in a fluid beam downstream of the sampler cone and to the mass analyzer 730, where the ions / atoms may be separated / selected based on different mass-to-charge ratios. For example, U.S. Patent Nos. 10,096,457, 9,942,974, 9,848,486, 9,810,636, 9,686,849, and other patents owned by PerkinElmer Health Sciences, Inc. (Waltham, Massachusetts) or PerkinElmer Health Sciences Canada Inc. (Woodbridge, Canada) include various types of ionization devices / ionization sources and related components.

[0068] In some examples, the mass analyzer 1030 can take a number of forms, generally depending on the nature of the sample, the desired resolution, etc. An exemplary mass analyzer may include, for example, one or more rod assemblies, such as a quadrupole or other rod assembly. The mass analyzer 1030 may include one or more cones, such as skimmer cones, sampling cones, interfaces, ion guides, collision cells, lenses, and other components that may be used to sample the incoming beam received from the ionization device / ionization source 1020. Selecting various components may contribute to removing interfering species, removing photons, and otherwise selecting desired ions from an incoming fluid that contains ions. In some examples, the mass analyzer 1030 may be or include a time-of-flight device. In some cases, the mass analyzer 1030 may include its own radio frequency generator. In certain examples, the mass analyzer 1030 may be a scanning mass analyzer, a magnetic sector analyzer (e.g., for use in single-focusing and dual-focusing MS devices), a quadrupole mass analyzer, an ion trap analyzer (e.g., cyclotron, quadrupole ion trap), a time-of-flight analyzer (e.g., matrix-assisted laser desorption ionization time-of-flight analyzer), and other suitable mass analyzers capable of separating species with different mass-to-charge ratios. Optionally, the mass analyzer 1030 may include two or more different devices arranged in series, such as a tandem MS / MS device or a triple quadrupole device, to select and / or identify ions received from the ionization device / ionization source 1020. Various components that may be present in a mass analyzer are described in patents currently owned by PerkinElmer Health Sciences, Inc. (Waltham, Massachusetts) or PerkinElmer Health Sciences Canada Inc. (Woodbridge, Canada), such as, for example, U.S. Patent Nos. 10,032,617, 9,916,969, 9,613,788, 9,589,780, 9,368,334, and 9,190,253.

[0069] In some examples, the detector 1040 may be any suitable detection device that may be used in existing mass spectrometers, such as an electron multiplier, a Faraday cup, a coated photographic plate, a scintillation detector, a multichannel plate, or the like, and other suitable devices selected by one of skill in the art given the benefit of this disclosure. Exemplary detectors that may be used in mass spectrometers are described, for example, in U.S. Patent Nos. 9,899,202, 9,384,954, 9,355,832, 9,269,552, and other patents currently owned by PerkinElmer Health Sciences, Inc. (Waltham, Mass.) or PerkinElmer Health Sciences Canada Inc. (Woodbridge, Canada).

[0070] In certain examples, the mass spectrometer system may also include a processor 1050, which typically takes the form of a microprocessor and / or computer, and suitable software for the analysis of samples introduced into the mass spectrometer 1000. The processor 1050 is shown as being electrically coupled to the mass analyzer 1030 and the detector 1040, but may also be electrically coupled to other components shown in FIG. 10 to generally control or operate various components of the system 1000. In some embodiments, the processor 1050 may reside, for example, in a controller or as a stand-alone processor, to control and coordinate the operation of the system 1000 for various modes of operation in which the system 1000 is used. To this end, the processor may be electrically coupled to each of the components of the system 1000, for example, one or more pumps, one or more voltage sources, rods, etc., as well as any other voltage sources included in the system 700.

[0071] In certain configurations, the processor 1050 may reside in one or more computer systems and / or general hardware circuitry including, for example, a microprocessor and / or suitable software for operating the system, for example, controlling voltages of the ion source, pumps, mass analyzer, detectors, etc. In some examples, any one or more components of the system 700 may include its own respective processor, operating system, and other functions that enable operation of that component. The processor may be integrated into the system, or the processor may reside on one or more accessory boards, printed circuit boards, or computers that are electrically coupled to the components of the system. The processor is typically electrically coupled to one or more memory units to receive data from other components of the system and allow it to adjust various system parameters as needed or desired. The processor may be part of a general purpose computer, for example, based on a Unix, Intel PENTIUM type processor, Apple A series processor, Motorola PowerPC, Sun UltraSPARC, Hewlett-Packard PA-RISC processor, or other type of processor. One or more of any type of computer system may be used according to various embodiments of the present technology. Furthermore, the system may be connected to a single computer or may be distributed across multiple computers connected by a communication network. It should be understood that other functions, including network communication, may be implemented and that the present technology is not limited to having a particular function or set of functions. Various aspects may be implemented as specialized software running on a general-purpose computer system. The computer system may include a processor connected to one or more memory devices, such as a disk drive, memory, or other device for storing data. Typically, the memory is used to store programs, calibrations, and data while operating the system in various modes using mixed gases.The components of the computer system can be coupled by an interconnection device, which may include one or more buses (e.g., between components integrated in the same machine) and / or networks (e.g., between components present in separate individual machines). The interconnection device provides communication (e.g., signals, data, instructions) exchanged between the components of the system. The computer system can typically receive and / or issue commands within processing times, e.g., milliseconds, microseconds or less, to allow rapid control of the system 1000. For example, computer control can be implemented to control vacuum pressure and control voltage provided to the mass analyzer. The processor is typically electrically coupled to a power source, which may be, for example, a DC power source, an AC power source, a battery, a fuel cell or other power source, or a combination of power sources. The power source may be shared with other components of the system. The system may also include one or more input devices, e.g., a keyboard, a mouse, a trackball, a microphone, a touch screen, a manual switch (e.g., an override switch), and one or more output devices, e.g., a printing device, a display screen, a speaker. In addition, the system may include one or more communication interfaces (in addition to or as an alternative to the interconnect device) that connect the computer system to a communication network. The system may also include suitable circuitry for converting signals received from various electrical equipment present in the system. Such circuitry may be present on the printed circuit board, or may be present on a separate board or device electrically coupled to the printed circuit board via a suitable interface, e.g., a Serial ATA interface, an ISA interface, a PCI interface, etc., or via one or more wireless interfaces (such as Bluetooth, Wi-Fi, Near Field Communication, other wireless protocols and / or interfaces).

[0072] In certain embodiments, the storage systems used in the systems described herein typically include computer readable and writable non-volatile recording media on which code may be stored. These may be used by the programs executed by the processor or by information stored on or in the media processed by the programs. The media may be, for example, a hard disk, a solid state drive, or a flash memory. Typically, the processor reads and manipulates data from the non-volatile recording media into another memory that allows the processor to access the information faster than the media. This memory is typically a volatile random access memory such as a dynamic random access memory (DRAM) or a static memory (SRAM). These may be in a storage system or in a memory system. The processor. typically manipulates data in the integrated circuit memory and copies the data to the media after processing is complete. Various mechanisms are known for managing data movement between the media and the integrated circuit memory elements, and the technology is not limited thereto. Additionally, the technology is not limited to any particular memory or storage system. In certain embodiments, the system may also include specially programmed, special purpose hardware, such as an application specific integrated circuit (ASIC) or a field programmable gate array (FPGA). Aspects of the technology may be implemented in software, hardware, firmware, or any combination thereof. Furthermore, such methods, acts, systems, system elements, and components thereof may be implemented as part of the above-described system or as separate components. Although a particular system is described as an example of one type of system in which various aspects of the technology may be practiced, it should be understood that the aspects are not limited to being implemented in the described system. Various aspects may be practiced on one or more systems having different architectures or components. The system may include a general-purpose computer system programmable using a high-level computer programming language. The system may also be implemented using specially programmed, special purpose hardware.In the system, the processor is typically a commercially available processor, such as the well-known Pentium class processor available from Intel Corporation. Many other processors are also commercially available. Such a processor typically runs an operating system, which may be, for example, Windows 95, Windows 98, Windows NT, Windows 2000 (Windows ME), Windows XP, Windows Vista, Windows 7, Windows 8, or Windows 10 operating systems available from Microsoft Corporation, MAC OS X, such as Snow Leopard, Lion, Mountain Lion, or other versions available from Apple, the Solaris operating system available from Sun Microsystems, or a UNIX or Linux operating system available from a variety of sources. Many other operating systems may be used, and in certain embodiments, a simple set of commands or instructions may function as the operating system.

[0073] In certain examples, the processor and operating system may together define a platform for which application programs in a high-level programming language may be written. It should be understood that the present technology is not limited to a particular system platform, processor, operating system, or network. It will also be apparent to one of ordinary skill in the art, given the benefit of this disclosure, that the present technology is not limited to a particular programming language or computer system. It should be further understood that other suitable programming languages ​​and other suitable systems may be used. In certain examples, the hardware or software may be configured to implement a cognitive architecture, a neural network, or other suitable implementation. If desired, one or more portions of the computer system may be distributed across one or more computer systems coupled to a communications network. These computer systems may also be general-purpose computer systems. For example, various aspects may be configured to be distributed across one or more computer systems to provide services (e.g., servers) to one or more client computers, or to perform tasks entirely as part of a distributed system. For example, various aspects may be implemented on a client-server or multi-tier system that includes components distributed across one or more server systems that perform various functions according to various embodiments. These components may be executable, intermediate (e.g., IL) or interpreted (e.g., Java) code that communicates over a communications network (e.g., the Internet) using a communications protocol (e.g., TCP / IP). It should also be understood that the technology is not limited to running on any particular system or group of systems. It should also be understood that the technology is not limited to any particular distributed architecture, network, or communications protocol.

[0074] In some cases, various embodiments may be programmed using an object-oriented programming language, such as, for example, SQL, SmallTalk, Basic, Java, Javascript, PHP, C++, Ada, Python, iOS / Swift, Ruby on Rails, or C# (C Sharp). Other object-oriented programming languages ​​may also be used. Alternatively, functional, scripting, and / or logic programming languages ​​may be used. Various configurations may be implemented in a non-programmed environment (e.g., a document created in HTML, XML, or other format that, when viewed in a browser program window, renders aspects of a graphical user interface (GUI) or performs other functions). Particular configurations may be implemented as programmed or non-programmed elements, or any combination thereof. In some cases, the system may include a remote interface, such as that present on a mobile device, tablet, laptop computer, or other portable device that communicates via a wired or wireless interface and allows remote operation of the system as needed.

[0075] In some embodiments, one or both of the sampler cone or the interface may include two or more surface features. Referring to FIG. 11, a cross section of a portion of a sampler cone is shown including a first recess 1110 and a second recess 110 spaced apart from the first recess 1110. Each of the recesses 1110, 1120 may be sized differently and configured to engage a surface feature from a respective metal gasket (not shown) and / or interface and compress the metal gasket between all of the surface features. If desired, a single metal gasket may span both recesses 1110, 1120 and be crushed when the recesses 1110, 1120 engage respective protrusions of another component. The interface may include two or more suitable surface features that may engage / receive or otherwise bond to each of the metal gaskets. The threads of the sampler cone may bond to the threads of the interface to compress each of the gaskets in the recesses 1110, 1120. As noted above, configurations other than threads on the sampler cone and interface may be used. The use of two metal gaskets in combination with two surface features on the sampler cone and interface may enhance the seal between the sampler cone and interface. If desired, three, four, or more separate surface features may be present on each of the sampler cone and interface, each configured to engage a respective metal gasket.

[0076] In certain embodiments, the sampler cone, metal gasket, and / or interface may be present in a kit that can be used to retrofit an existing MS system with various components. A tool with a preset torque may also be included in the kit to tighten the sampler cone to the interface using an appropriate amount of torque. The kit may include, for example, a sampler cone including a sample orifice configured to fluidly couple to an ionization source, the ionization source providing an ionized sample including ions to the sample orifice, the sampler cone including a first surface feature configured to engage with a second surface feature on the interface. The kit may also include a metal gasket, the metal gasket sized and positioned to rest between the first surface feature of the sampler cone and the second surface feature of the interface, and configured to be crushed between the first surface feature of the sampler cone and the second surface feature of the interface when the sampler cone is coupled to the interface of a mass analyzer. The kit may further include instructions for using the sampler cone and the metal gasket to couple the sampler cone to an interface of a mass analyzer to provide a substantially liquid-tight seal between the sampler cone and the interface of the mass analyzer. Optionally, the kit may include the interface. Optionally, the kit may also include a tool, such as a wrench, screwdriver, ratchet, etc., that includes a preset torque for tightening the sampler cone to the interface and crushing the metal gasket to provide a substantially liquid-tight seal without over-tightening the sampler cone. In other embodiments, the kit may include two or more types of gaskets, gaskets of different thicknesses, or gaskets that include different materials.

[0077] In certain embodiments, a method of coupling a sampler cone to a mass analyzer interface to provide a substantially liquid-tight seal between the sampler cone and the mass analyzer interface can be implemented. This method is illustrated in FIG. 12. The method includes assembling or placing a gasket 1230 between the sampler cone 1210 and the interface 1220 to provide an assembly 1250 with the gasket 1230 positioned between a first surface feature of the sampler cone 120 and a second surface feature of the interface 1220. When assembled, a force is applied to crush the metal gasket 1230 between the first surface feature of the sampler cone 1210 and the second surface feature of the mass analyzer interface 1230, providing a substantially liquid-tight seal between the sampler cone 1210 and the mass analyzer interface 1220, and the sampler cone 1210 can be assembled to the interface 1220 to form an assembly 1260. In some embodiments, the method may also include compressing a metal gasket between the first surface feature and the second surface feature by tightening the first thread of the sampler cone to the second thread of the mass analyzer interface at a selected torque value. In other examples, the method may include compressing the gasket about 0.2 to about 0.25 mm using a sharp-edged surface feature of one or both of the sampler cone 1210 and the interface 1220. For example, the sampler cone 1210 and the interface 1220 may be coupled to one another using internal threads, external fasteners, or other means.

[0078] Certain embodiments are described to provide a better understanding of some of the novelty and non-obviousness of the technology described herein.

[0079] Example 1 Referring to FIG. 13, a cross section of a sampler cone 1300 is shown. The sampler cone 1300 includes a body 1305 and a sample orifice 1310 that may allow the ingress of a sample into the sampler cone 1300. The base of the sampler cone 1300 includes a generally annular recess or cut 1320 that may engage a protrusion on an interface (not shown) via a metal gasket. When the sampler cone 1300 is screwed onto the interface, as the groove of the interface is forced into the annular recess, the metal gasket is crushed between the surfaces of the groove / recess, providing a seal between the sampler cone 1300 and the interface. The crush seal does not rely on the surface finish of the sampler cone and the interface as in conventional devices and methods used to couple sampler cones to interfaces.

[0080] Example 2 Referring to FIG. 14, a diagram of the sampler cone and interface is shown. The sampler cone 1410 includes a protrusion 1412 that extends away from the bottom surface of the sampler cone. The interface 1420 includes a groove 1422 that may engage the protrusion 1412 of the sampler cone 1410. A metal gasket 1415 may be positioned between the groove 1422 and the protrusion 1412. When the sampler cone 1410 is tightened to the interface using the internal threads 1420 on the interface and threads (not shown) on the sampler cone 1420, the protrusion 1412 is forced into the groove 1422, crushing the gasket 1415. This crushing of the gasket 1415 provides a substantially liquid-tight seal between the sampler cone 1410 and the interface 1420.

[0081] Example 3 Referring to FIG. 15A, a cutaway view of a sampler cone 1510, an interface 1520, and a gasket 1530 is shown. The sampler cone 1510 includes a surface feature 1512 configured as a triangular protrusion. The interface 1520 also includes a surface feature 1522 configured as a triangular protrusion 1522. When the cone 1510 is mated to the interface 1520 (see FIG. 15B), the tips of the protrusions 1512, 1522 exert a compressive force on the surface of the gasket 1530, crushing the gasket 1530 in these areas. By selecting the protrusions 1512, 1522 to have points or tips, a selected amount of force can be exerted on a small area of ​​the gasket, thereby enhancing the resulting fluid seal.

[0082] When introducing elements of the embodiments disclosed herein, the articles "a," "an," "the," and "said" are intended to mean that there are one or more elements. The terms "including" and "having" are intended to be open-ended and mean that there may be additional elements other than the listed elements. Those skilled in the art will recognize, given the benefit of this disclosure, that various components of the embodiments may be interchanged or substituted for various components in other embodiments.

[0083] While particular aspects, examples, and embodiments have been described above, it will be recognized by those of ordinary skill in the art, given the benefit of this disclosure, that additions, substitutions, variations, and modifications of the disclosed exemplary aspects, examples, and embodiments are possible.

Claims

1. 1. A mass spectrometer assembly comprising: a mass analyzer cone including a first surface having a protrusion; a mass analyzer including a second surface having a recess configured to receive the protrusion; a flat metal gasket disposed between the first surface and the second surface; the first surface and the second surface are configured to provide a liquid-tight seal by crushing the flat metal gasket into the recess based on the mass analyzer cone coupled to the mass analyzer.

2. The mass spectrometer assembly of claim 1 , wherein the mass analyzer cone further comprises a first thread configured to mate with a second thread on the mass analyzer.

3. The mass spectrometer assembly of claim 1 , wherein the flat metal gasket comprises a thickness of between 0.1 mm and 0.5 mm.

4. The mass spectrometer assembly of claim 1 , wherein the protrusion, the recess, and the flat metal gasket each comprise a material having the same coefficient of thermal expansion.

5. The mass spectrometer assembly of claim 1 , wherein the flat metal gasket further comprises a soft metal gasket.

6. 2. The mass spectrometer assembly of claim 1, wherein the flat metal gasket comprises a thickness of 0.2 mm to 0.25 mm, the protrusions are configured as triangular protrusions having a height of 0.2 mm to less than 1 mm, and the recesses are configured as triangular recesses having a depth of 0.2 mm to less than 1 mm.

7. 1. A method of sealing a mass analyzer cone to a mass analyzer interface, the method comprising: coupling the mass analyzer cone to the mass analyzer interface by inserting a protrusion on a first surface of the mass analyzer cone into a recess on a second surface of the mass analyzer interface and crushing a flat metal gasket between the protrusion of the mass analyzer cone and the recess of the mass analyzer interface to provide a fluid tight seal between the mass analyzer cone and the mass analyzer interface.

8. 8. The method of claim 7, wherein tightening a first thread of the mass analyzer cone onto a second thread of the mass analyzer interface collapses the flat metal gasket between the protrusion and the recess.

9. 8. The method of claim 7, wherein the flat metal gasket comprises a thickness of 0.2 mm to 0.25 mm, the protrusions are configured as triangular protrusions having a height of 0.2 mm to less than 1 mm, and the recesses are configured as triangular recesses having a depth of 0.2 mm to less than 1 mm.

10. The method of claim 7 , wherein the protrusions, the recesses, and the flat metal gasket each comprise materials having the same coefficient of thermal expansion.

11. The method of claim 7 , wherein the flat metal gasket further comprises a soft metal gasket.

12. 1. A mass spectrometer comprising: a mass analyzer cone including a first surface having a protrusion; a mass analyzer interface including a second surface having a recess for receiving the protrusion; a flat metal gasket disposed between the first surface and the second surface; a mass analyzer; the first surface and the second surface are configured to provide a liquid-tight seal by crushing the flat metal gasket into the recess based on the mass analyzer cone coupled to the mass analyzer interface.

13. 13. The mass spectrometer of claim 12, further comprising a sample introduction device fluidly coupled to an ionization source, the ionization source fluidly coupled to an orifice of the mass analyzer cone.

14. 14. The mass spectrometer of claim 13 further comprising a detector.

15. The mass spectrometer of claim 14 , wherein the ionization source comprises an inductively coupled plasma.

16. The mass spectrometer of claim 15 , wherein the mass analyzer comprises at least one quadrupole.

17. 17. The mass spectrometer of claim 16, wherein the detector comprises an electron multiplier.

18. The mass spectrometer of claim 12, wherein the flat metal gasket comprises a thickness of between 0.1 mm and 0.5 mm.

19. A kit comprising: a mass analyzer cone including a first surface with a protrusion configured to be received by a recess in a second surface of the mass analyzer; a flat metal gasket sized and configured to be placed between the first surface and the second surface; the first surface is configured to provide a fluid-tight seal by crushing the flat metal gasket into the recess based on the mass analyzer cone coupled to a mass analyzer.

20. 20. The kit of claim 19, further comprising the mass analyzer.

21. 21. The kit of claim 20, further comprising a tool including a preset torque for tightening the threads of the mass analyzer cone onto the threads of the mass analyzer to collapse the flat metal gasket and provide a liquid tight seal.

22. 1. A mass spectrometer sampler cone comprising: a sample orifice configured to be fluidly coupled to an ionization source that provides a fluid beam comprising ions to the sample orifice; a first surface having a protrusion configured to be received by a recess in a second surface of a mass analyzer, the first surface being configured to provide a fluid-tight seal by crushing a flat metal gasket into the recess upon the sampler cone being coupled to the mass analyzer.

23. 23. The mass spectrometer sampler cone of claim 22, wherein the sampler cone further comprises threads configured to mate with threads on the mass analyzer.

24. 1. A mass analyzer interface configured to couple to a mass analyzer cone, the mass analyzer interface including a first surface, the first surface configured to receive a protrusion of a mass analyzer cone and comprising a recess configured to provide a liquid-tight seal by allowing a flat metal gasket to be crushed into the recess upon the mass analyzer cone being coupled to the mass analyzer interface.

25. 25. The mass analyzer interface of claim 24, wherein the mass analyzer interface further comprises threads configured to mate with threads on the mass analyzer cone.

26. The mass spectrometer assembly of claim 1 , wherein the protrusion and the recess each have a triangular cross section.

27. The mass spectrometer assembly of claim 1 , wherein the protrusion and the recess each have a square or rectangular cross-section.

28. The mass spectrometer assembly of claim 1 , wherein the mass analyzer cone comprises a sampler cone.

29. The method of sealing a mass analyzer cone to a mass analyzer interface of claim 7 , wherein the protrusion and the recess each have a triangular cross-section.

30. The method of sealing a mass analyzer cone to a mass analyzer interface of claim 7 , wherein the protrusion and the recess each have a square or rectangular cross-section.

31. The method of sealing a mass analyzer cone to a mass analyzer interface of claim 7 , wherein the mass analyzer cone comprises a sampler cone.

32. The mass spectrometer of claim 12 , wherein the protrusions and the recesses each have a triangular cross section.

33. 13. The mass spectrometer of claim 12, wherein the protrusions and recesses each have a square or rectangular cross-section.

34. The mass spectrometer of claim 12 , wherein the mass analyzer cone comprises a sampler cone.

35. 20. The kit of claim 19, wherein the protrusion has a triangular cross-section.

36. The kit of claim 19, wherein the protrusion has a square or rectangular cross-section.

37. 20. The kit of claim 19, wherein the mass analyzer cone comprises a sampler cone.

38. 23. The mass spectrometer sampler cone of claim 22, wherein the protrusion has a triangular cross section.

39. 23. The mass spectrometer sampler cone of claim 22, wherein the protrusion has a square cross-section or a rectangular cross-section.

40. The mass analyzer interface of claim 24 , wherein the recess has a triangular cross-section.

41. 25. The mass analyzer interface of claim 24, wherein the recess has a square or rectangular cross-section.

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