Dielectric spectroscopy measurement device and dielectric spectroscopy measurement method

Abstract

The present invention comprises: a signal generation unit that generates electromagnetic waves; a signal splitting unit that splits the electromagnetic waves according to transmission direction, and outputs the split electromagnetic waves to output destinations corresponding to the transmission directions; a changeover switch unit that takes in, via the signal splitting unit, the electromagnetic waves generated by the signal generation unit, outputs the taken in electromagnetic waves while switching output destination, and outputs, to the signal splitting unit, electromagnetic waves returning from the output destinations; a sensor unit that irradiates a measurement subject with electromagnetic waves outputted by the changeover switch unit, and outputs, to the changeover switch unit, measurement subject waves obtained by said irradiation; a calibration standard unit that is provided with a circuit for a calibration standard, said circuit outputting, to the changeover switch unit, reflection waves for calibration that are generated by receiving electromagnetic waves outputted by the changeover switch unit; a signal reception unit that receives the measurement subject waves and the reflection waves for calibration via the signal splitting unit; and a computation unit that takes in a measured value outputted by the signal reception unit which has received the measurement subject waves and the reflection waves for calibration, and corrects the taken in measured value for the measurement subject on the basis of a measured value corresponding to the taken in reflection waves for calibration.

Description

[Technical field]

[0001] The present invention relates to a dielectric spectroscopy measurement device and a dielectric spectroscopy measurement method. [Background technology]

[0002] As the aging population advances, dealing with adult diseases has become a major issue. Tests such as blood glucose level require blood sampling, which places a heavy burden on patients. For this reason, non-invasive element concentration measurement devices that do not require blood sampling have been attracting attention. As a non-invasive element concentration measurement device, a method using microwave-millimeter wave electromagnetic waves has been proposed because there is less scattering in the body compared to optical methods such as near-infrared light, and the energy of one photon is low.

[0003] As a method using electromagnetic waves in the microwave to millimeter wave band, for example, there is a method using a resonant structure as shown in Non-Patent Document 1. In this method, a measurement sample is brought into contact with a device with a high Q value, such as an antenna or a resonator, and frequency characteristics around the resonant frequency are measured. The resonant frequency is determined by the complex dielectric constant around the device. Therefore, by predicting the correlation between the amount of shift in the resonant frequency and the concentration of a component in advance, the concentration of a component can be estimated from the amount of shift in the resonant frequency.

[0004] As another method using microwave-millimeter wave electromagnetic waves, dielectric spectroscopy as shown in Patent Document 1 has been proposed. In dielectric spectroscopy, electromagnetic waves are irradiated into the skin, and the electromagnetic waves are absorbed according to the interaction between the blood components to be measured, such as glucose molecules, and water, and the amplitude and phase of the electromagnetic waves are observed. From the amplitude and phase of the observed electromagnetic waves with respect to the frequency, a dielectric relaxation spectrum can be calculated. Since the dielectric relaxation spectrum is generally expressed as a linear combination of relaxation curves based on the Cole-Cole equation, a complex dielectric constant can be calculated from the dielectric relaxation spectrum.

[0005] For example, it is known that there is a correlation between the amount of blood components such as glucose and cholesterol contained in blood, i.e., the component concentration, and the complex dielectric constant. The complex dielectric constant can be measured by measuring the amplitude and phase of an electric signal that changes in response to the change in the complex dielectric constant. Therefore, in measuring a biological component, a calibration model can be constructed by measuring in advance the change in the complex dielectric constant and the correlation between the complex dielectric constant and the component concentration, and the component concentration can be calibrated from the constructed calibration model and the change in the dielectric relaxation spectrum calculated based on the amplitude and phase for the frequency of the electromagnetic wave.

[0006] Regardless of which method is used, the measurement sensitivity can be improved by selecting a frequency band that is highly correlated with the target component. Therefore, it is important to measure the change in complex permittivity in advance using broadband dielectric spectroscopy. Among dielectric spectroscopy methods, the method using a coaxial probe (open-ended coaxial probe or open-ended coaxial line) as shown in Non-Patent Documents 2 and 3 can use easily available samples such as water to calibrate the measuring device, and can measure the complex permittivity of the measured sample by contacting the sample to the probe end without requiring special processing of the material. Therefore, it is suitable for measuring samples such as living organisms, fruits, and soil whose electrical properties are to be evaluated without processing them. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] JP 2013-032933 A [Non-patent literature]

[0008] [Non-Patent Document 1] M. Hofmann, G. Fischer, R. Weigel, and D. Kissinger, “Microwave-Based Noninvasive Concentration Measurements for Biomedical Applications”, IEEE Trans. Microwave Theory and Techniques, Vol.61, No.5, pp. 2195-2204,2013 [Non-Patent Document 2] J. P. Grant, R N. Clarke, G T. Symm and N M. Spyrou, “A critical study of the open-ended coaxial line sensor technique for RF and microwave complex permittivity measurements”, J. Phys. E: Sci. Instrum, Vol. 22, pp. 757-770, 1989 [Non-Patent Document 3] TP Marsland, and S. Evans, “Dielectric measurements with an open-ended coaxial probe”, IEE Proceedings, Vol. 134, No.4, pp.341-349, 1987 Summary of the Invention [Problem to be solved by the invention]

[0009] For example, to perform measurements using the above-mentioned coaxial probe on a person who needs to continuously test blood glucose levels, etc., it is considered desirable to configure the device as a small sensor terminal device such as a wearable device that is worn by the person. In contrast, a device configuration for performing measurements using a conventional coaxial probe is, for example, as shown in Fig. 11, a device configuration in which a coaxial probe 101 is connected to a general-purpose measuring device 103 that generates and detects microwaves by a high-frequency cable 102. Considering the size and weight of the general-purpose measuring device 103, it can be said that the conventional device configuration is not suitable for use as described above, which is worn by a person.

[0010] In order to make a small sensor terminal device that can be attached to a living body, it is possible to form a measuring device 210 by integrating a coaxial probe 214, a signal generating unit 212 that generates microwaves, a signal receiving unit 215 that receives microwaves, transmission lines 221-223, and a signal separating unit 213 such as a directional coupler, all on a printed circuit board 211, as shown in FIG. 12, using, for example, a discrete IC (Integrated Circuit) or MMIC (Monolithic Microwave Integrated Circuit).

[0011] However, in the case of such a measuring device 210, changes in the electrical characteristics of the printed circuit board 211 due to heat generated during long-term operation, and signal changes due to changes in the microwave oscillation mode of the signal generating unit 212, may be superimposed on the measurement results as errors, causing drift. Therefore, there is a problem in that it is difficult to measure the measurement target continuously with high accuracy.

[0012] In view of the above circumstances, an object of the present invention is to provide a technique that makes it possible to reduce the effects of drift and improve the accuracy of measurement when a dielectric spectrometer is created using a circuit board to measure an object to be measured. [Means for solving the problem]

[0013] One aspect of the present invention includes a signal generating unit that generates electromagnetic waves, a signal separating unit that separates the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction, a changeover switch unit that takes in the electromagnetic waves generated by the signal generating unit via the signal separating unit, switches an output destination to output the taken-in electromagnetic waves, and outputs the electromagnetic waves returning from the output destination to the signal separating unit, a sensor unit that irradiates a measurement object with the electromagnetic waves output by the changeover switch unit and outputs a measurement object wave obtained by the irradiation to the changeover switch unit, and a circuit for calibration standards, wherein the changeover switch unit is a calibration standard unit that receives the electromagnetic wave output from the measurement target unit and generates a calibration reflected wave and outputs the generated calibration reflected wave to the changeover switch unit; a signal receiving unit that receives the measurement target wave and the calibration reflected wave via the signal separation unit; and a calculation unit that takes in the measurement value that the signal receiving unit receives and outputs, and corrects the taken in measurement value of the measurement target based on the measurement value corresponding to the taken in calibration reflected wave, wherein the signal generating unit, the signal receiving unit, the changeover switch unit, the sensor unit, and the signal separation unit are formed on a single circuit board as a dielectric spectroscopic measuring instrument.

[0014] One aspect of the present invention is a dielectric spectroscopy measurement method performed by a dielectric spectroscopy measurement device in which a signal generation unit, a signal receiving unit, a changeover switch unit, a sensor unit, and a signal separation unit are formed on a single circuit board as a dielectric spectroscopy measurement instrument, wherein the signal generation unit generates an electromagnetic wave, the signal separation unit takes in the electromagnetic wave generated by the signal generation unit and outputs the taken-in electromagnetic wave to the changeover switch unit, the changeover switch unit takes in the electromagnetic wave generated by the signal generation unit via the signal separation unit and outputs the taken-in electromagnetic wave by switching an output destination, a calibration standard circuit outputs a calibration reflected wave generated in response to the electromagnetic wave output by the changeover switch unit to the changeover switch unit, and the changeover switch unit outputs a calibration reflected wave to the changeover switch unit, the sensor unit irradiates the electromagnetic wave output by the changeover switch unit onto an object to be measured and outputs the electromagnetic wave obtained by the irradiation to the changeover switch unit as a measurement object wave, the changeover switch unit outputs the measurement object wave returning from the output destination to the signal separation unit, the signal separation unit outputs the measurement object wave and the calibration reflected wave to the signal receiving unit, the signal receiving unit receives the measurement object wave and the calibration reflected wave, a calculation unit takes in measurement values ​​received by the signal receiving unit for the measurement object wave and the calibration reflected wave and outputs them, and corrects the taken-in measurement value of the object to be measured based on the measurement value corresponding to the taken-in calibration reflected wave. Effect of the Invention

[0015] According to the present invention, when a dielectric spectrometer is created using a circuit board to measure an object to be measured, it is possible to reduce the influence of drift and increase the measurement accuracy. [Brief description of the drawings]

[0016] [Figure 1] 1 is a block diagram showing a configuration of a dielectric spectroscopy measuring device according to an embodiment of the present invention. [Diagram 2] FIG. 2 is a block diagram showing the configuration of an open circuit provided in a calibration standard unit of a dielectric spectroscopy measuring apparatus according to an embodiment of the present invention. [Diagram 3]FIG. 2 is a block diagram showing the configuration of a short circuit provided in a calibration standard unit of a dielectric spectroscopy measurement apparatus according to an embodiment of the present invention. [Figure 4] FIG. 2 is a block diagram showing a configuration of a termination circuit provided in a calibration standard unit of a dielectric spectroscopy measurement apparatus according to an embodiment of the present invention. [Diagram 5] 4 is a flowchart showing a process flow of a dielectric spectroscopy measuring apparatus according to an embodiment of the present invention. [Figure 6] FIG. 13 is a diagram showing S parameters and an error term model in the case of one-port measurement. [Figure 7] FIG. 2 is a block diagram showing another configuration example (part 1) of a dielectric spectroscopy measuring device according to an embodiment of the present invention. [Figure 8] FIG. 2 is a block diagram showing another configuration example (part 2) of the dielectric spectroscopy measuring device in the embodiment of the present invention. [Figure 9] 13 is a graph showing the results of measurement carried out using a short circuit as a calibration standard and air as a measurement target in another configuration example (part 2) of the dielectric spectroscopy measurement apparatus in the embodiment of the present invention. [Figure 10] 13 is a graph showing the results of measurement carried out using a short circuit as a calibration standard and an aqueous glucose solution as a measurement target in another configuration example (part 2) of the dielectric spectroscopy measurement apparatus in an embodiment of the present invention. [Figure 11] FIG. 1 is a block diagram showing a configuration of a device for performing measurements using a conventional coaxial probe. [Figure 12] FIG. 13 is a block diagram showing the configuration of a device that performs measurements using a coaxial probe formed on a circuit board. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0017] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. 1 is a block diagram showing a configuration of a dielectric spectroscopic measurement device 1 according to an embodiment of the present invention. The dielectric spectroscopic measurement device 1 includes a dielectric spectrometer 10 and a signal processing device 30. The dielectric spectrometer 10 includes a circuit board 11, a signal generating section 12, a signal separating section 13, a changeover switch section 14, a sensor section 15, a calibration standard section 16, a signal receiving section 17, and transmission lines 41 to 47. The signal generating section 12, the signal separating section 13, the changeover switch section 14, the sensor section 15, the calibration standard section 16, the signal receiving section 17, and the transmission lines 41 to 47 are integrated and formed on the circuit board 11.

[0018] The circuit board 11 may be, for example, a printed circuit board, a ceramic board, or a semiconductor circuit board. The signal generating unit 12 is an electromagnetic wave oscillator, and may be, for example, a solid-state oscillator such as a voltage-controlled oscillator (VCO), a phased locked loop (PLL), a Gunn diode, a tunnel diode, or a dielectric resonator. The signal generating unit 12 generates electromagnetic waves such as microwaves and millimeter waves. The signal receiving unit 17 is a receiver that receives electromagnetic waves such as microwaves and millimeter waves. The signal receiving unit 17 may be, for example, a Schottky barrier diode, an IQ (In-Phase, Quadrature-Phase) mixer, or the like.

[0019] The signal separation unit 13 is, for example, a directional coupler or a circulator. The signal separation unit 13 is connected to the signal generation unit 12 via a transmission line 44, to the signal reception unit 17 via a transmission line 45, and to the changeover switch unit 14 via a transmission line 46. The signal separation unit 13 separates the electromagnetic waves taken in from the transmission lines 44 and 46 according to the transmission direction, and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction. More specifically, when the signal separation unit 13 takes in an electromagnetic wave propagating through the transmission line 44, it outputs the taken-in electromagnetic wave only to the transmission line 46 without outputting it to the transmission line 45. When the signal separation unit 13 takes in an electromagnetic wave propagating through the transmission line 46, it outputs the taken-in electromagnetic wave only to the transmission line 45 without outputting it to the transmission line 44.

[0020] The changeover switch unit 14 is a one-input, four-output switch that switches the output destination of the electromagnetic wave. For example, a semiconductor switch or a MEMS (Micro Electro Mechanical Systems) switch is applied to the changeover switch unit 14. The changeover switch unit 14 switches and connects the transmission line 46 to one of the transmission lines 41, 42, 43, and 47, thereby switching the output destination of the electromagnetic wave generated by the signal generating unit 12 that propagates through the transmission line 46, and outputs the electromagnetic wave returning from the output destination to the transmission line 46.

[0021] The sensor unit 15 is a reflection type sensor such as a coaxial probe, and is used by contacting it with the object to be measured. The sensor unit 15 is connected to the changeover switch unit 14 via the transmission line 47, and takes in the electromagnetic waves generated and output by the signal generation unit 12 via the signal separation unit 13 and the changeover switch unit 14. The sensor unit 15 irradiates the taken-in electromagnetic waves to the measured substance to be measured. Here, the measured substance to be measured is a gas, liquid, or solid sample, for example, a living body, fruit, materials such as wood and stone, soil, water, an aqueous solution, air, etc. The sensor unit 15 takes in either a reflected wave reflected by the measured substance after receiving the irradiated electromagnetic wave or a transmitted wave after the irradiated electromagnetic wave has transmitted through the measured substance, or if both exist, both as the measured wave. The sensor unit 15 may be, for example, a coaxial sensor such as the above-mentioned coaxial probe, an antenna designed according to the application of the dielectric spectroscopy measurement device 1, a split-ring resonator (SRR), or the like.

[0022] The calibration standard unit 16 includes calibration standard circuits 21, 22, and 23 for detecting the characteristics of the circuit board 11 at the time of measurement. The calibration standard circuits 21, 22, and 23 are circuits formed at the ends of the transmission lines 41, 42, and 43 connected to each other, and are three types of circuits, namely, open, short, and terminated, in terms of electrical circuitry. Hereinafter, detailed configurations of the circuits 21, 22, and 23 will be described with reference to Figs. 2 to 4. Note that Figs. 2 to 4 (A), (B), and (C) are side views, front views, and plan views, respectively, and in Figs. 2 to 4, the same reference numerals are used for the same configuration as in Fig. 1. In Figs. 2 to 4, the portion indicated by reference numeral 50 is a ground electrode on the back surface of the circuit board 11.

[0023] Fig. 2 is a diagram showing the configuration of circuit 21, which is an open circuit. Circuit 21 is a circuit in which the tip of transmission line 41, indicated by reference symbol 41tip in Fig. 2(C), is in an open state. Since circuit 21 is in an open state, when an electromagnetic wave reaches the tip of transmission line 41, reflection with a reflection coefficient of "1" occurs, and an electromagnetic wave identical to the electromagnetic wave that arrived propagates through transmission line 41 in the opposite direction, i.e., toward changeover switch unit 14.

[0024] 3 is a diagram showing the configuration of circuit 22, which is a short circuit. As shown in Figs. 3(A) to (C), an end of transmission line 42 is connected to ground electrode 50 of circuit board 11 by electrically conducting pier 55, thereby forming a short circuit. Since circuit 22 is in a short circuit state, when an electromagnetic wave reaches the end of transmission line 42, a reflection with a reflection coefficient of "-1" occurs, and the electromagnetic wave, whose voltage sign is opposite to that of the arriving electromagnetic wave, propagates through transmission line 42 in the opposite direction, i.e., toward changeover switch unit 14.

[0025] 4 is a diagram showing the configuration of circuit 23, which is a terminating circuit. As shown in FIGS. 4(A) to 4(C), a terminating circuit is formed by connecting chip-type resistor element 56 to the end of transmission line 43. The resistance value of chip-type resistor element 56 is determined in advance so as to be the same as the characteristic impedance when transmission line 46 is connected to transmission line 43. Since the resistance value of chip-type resistor element 56 is the same as the characteristic impedance when transmission line 46 is connected to transmission line 43, when an electromagnetic wave reaches the end of transmission line 43, a reflection with a reflection coefficient of "0", that is, no reflection occurs.

[0026] In the following, the reflected waves generated by circuits 21 and 22 through reflection are referred to as reflected waves for calibration in order to distinguish them from the measurement target waves, which are electromagnetic waves taken in by sensor unit 15 and output to transmission line 47. In circuit 23, no reflection occurs, but for convenience of explanation, it is assumed that circuit 23 generates a reflected wave with a voltage value and current value of "0" through reflection, and this reflected wave is referred to as reflected wave for calibration as in the case of circuits 21 and 22.

[0027] The transmission lines 41 to 47 are lines that transmit electromagnetic waves, and may be, for example, a microstrip line (MSL), a coplanar waveguide (CPW), a grounded coplanar waveguide (GCPW), or a coplanar strip (CPS).

[0028] In addition, when the frequency of the electromagnetic wave to be measured or the center frequency of the frequency band to be measured is predetermined, when designing the transmission line length of the transmission lines 41, 42, 43 connecting the changeover switch unit 14 and the calibration standard unit 16 and the transmission line length of the transmission line 47 connecting the changeover switch unit 14 and the sensor unit 15, the transmission line length may be set to the length shown in the following equation (1) to reduce the influence of reflected waves caused by the transmission line length of the transmission lines 41, 42, 43, 47.

[0029]

number

[0030] In the above formula (1), L is the transmission line length, λ e is the effective wavelength of the electromagnetic wave, and is the reciprocal of the frequency of the object to be measured or the center frequency of the frequency band of the object to be measured. In formula (1), n ​​is an integer of 1 or more and can be arbitrarily determined.

[0031] The signal processing device 30 includes a control unit 31, a calculation unit 32, and a display unit 33. The control unit 31 is connected to each of the signal generating unit 12, the changeover switch unit 14, and the signal receiving unit 17 via a control line that transmits an electric signal. The control unit 31 outputs a generation start instruction signal to the signal generating unit 12 to instruct the signal generating unit 12 to start generating electromagnetic waves, and a generation end instruction signal to instruct the signal generating unit 12 to end generating electromagnetic waves. The control unit 31 outputs a switching instruction signal to instruct the changeover switch unit 14 to switch the connection destination of the transmission line 46 to any one of the transmission lines 41, 42, 43, and 47. The control unit 31 outputs a reception start instruction signal to instruct the signal receiving unit 17 to start receiving electromagnetic waves, and a reception end instruction signal to instruct the signal receiving unit 17 to end receiving electromagnetic waves.

[0032] The arithmetic unit 32 includes a data collection unit 35 and a calculation unit 36. The data collection unit 35 is connected to the signal receiving unit 17 via a control line that transmits electrical signals. The data collection unit 35 takes in measured values ​​of the electrical signals that the signal receiving unit 17 outputs after receiving the measurement target wave from the sensor unit 15 and the calibration reflected waves from each of the circuits 21, 22, and 23 of the calibration standard unit 16.

[0033] The calculation unit 36 ​​performs so-called OSL (Open / Short / Load) calibration based on the measurement values ​​corresponding to the calibration reflected waves corresponding to each of the circuits 21, 22, and 23 acquired by the data collection unit 35 and the known true values ​​corresponding to each of the circuits 21, 22, and 23, correcting the measurement values ​​of the substance to be measured acquired by the data collection unit 35 and calculating the true values ​​of the substance to be measured. Here, the true values ​​corresponding to each of the circuits 21, 22, and 23 are the reflection coefficients "1", "-1", and "0" of the circuits 21, 22, and 23 described above. The calculation unit 36 ​​stores the true values ​​corresponding to each of the circuits 21, 22, and 23 in advance in an internal storage area. The display unit 33 displays the corrected measurement values ​​of the substance to be measured calculated by the calculation unit 36.

[0034] The signal processing device 30 is composed of, for example, a personal computer or a microcomputer, and the calculation unit 36 ​​of the calculation unit 32 is configured to appropriately combine, for example, a high-resolution ADC (Analog Digital Converter), an FPGA (Field Programmable Gate Array), a DSP (Digital Signal Processor), etc., so as to obtain accuracy and calculation speed suitable for the application.

[0035] (Processing by dielectric spectroscopy measurement device) 5 is a flowchart showing the flow of processing by the dielectric spectroscopy measuring device 1. The sensor unit 15 is assumed to be in contact with a substance to be measured in advance. The control unit 31 includes a clock or other internal clock means, and when the time indicated by the clock means reaches a predetermined measurement time, outputs a generation start instruction signal to the signal generating unit 12 and outputs a reception start instruction signal to the signal receiving unit 17. Upon receiving the generation start instruction signal from the control unit 31, the signal generating unit 12 generates an electromagnetic wave and outputs it to the transmission line 44. Upon receiving the reception start instruction signal from the control unit 31, the signal receiving unit 17 starts receiving the electromagnetic wave from the transmission line 45 (step S1).

[0036] After outputting the generation start instruction signal and the reception start instruction signal, the control unit 31 outputs a switching instruction signal to the changeover switch unit 14 for connecting the transmission line 46 to the circuit 21 of the calibration standard unit 16. When the changeover switch unit 14 receives the switching instruction signal for connecting to the circuit 21 of the calibration standard unit 16 from the control unit 31, it switches the connection destination of the transmission line 46 and connects the transmission line 46 to the transmission line 41 (step S2).

[0037] The electromagnetic wave generated by the signal generating unit 12 and output to the transmission line 44 propagates through the transmission line 44 and reaches the signal separating unit 13. The signal separating unit 13 takes in the electromagnetic wave that has reached it and outputs the taken-in electromagnetic wave to the transmission line 46. The electromagnetic wave propagating through the transmission line 46 propagates through the transmission line 41 via the changeover switch unit 14. Since the circuit 21 is an open circuit, the electromagnetic wave is reflected at the tip of the transmission line 41 with a reflection coefficient of "1", and the reflected electromagnetic wave, a calibration reflected wave, propagates through the transmission line 41 in the reverse direction.

[0038] The reflected wave for calibration propagating through the transmission line 41 propagates through the transmission line 46 via the changeover switch unit 14, and reaches the signal separation unit 13. The signal separation unit 13 takes in the reflected wave for calibration that has arrived, and outputs the taken in reflected wave for calibration to the transmission line 45. The reflected wave for calibration propagates through the transmission line 45, and reaches the signal receiving unit 17.

[0039] The signal receiving unit 17 receives the reflected calibration wave that has arrived, and converts the received reflected calibration wave into a measured value of an electrical signal. This measured value indicates the S11 parameter among the S parameters. The signal receiving unit 17 outputs the converted measured value to the data collecting unit 35. The data collecting unit 35 receives the measured value output by the signal receiving unit 17 (step S3). As a result, the data collecting unit 35 obtains the measured value corresponding to the circuit 21, i.e., the S11 parameter for the circuit 21.

[0040] After outputting a switching instruction signal for connection to circuit 21 of calibration standard unit 16, when a predetermined fixed time has elapsed, control unit 31 outputs a switching instruction signal to changeover switch unit 14 for connecting transmission line 46 to circuit 22 of calibration standard unit 16. When changeover switch unit 14 receives a switching instruction signal for connection to circuit 22 of calibration standard unit 16 from control unit 31, it switches the connection destination of transmission line 46 and connects transmission line 46 to transmission line 42 (step S4).

[0041] The electromagnetic wave generated by the signal generating unit 12 and output to the transmission line 44 propagates through the transmission line 44 and reaches the signal separating unit 13. The signal separating unit 13 takes in the electromagnetic wave that has reached it and outputs the taken-in electromagnetic wave to the transmission line 46. The electromagnetic wave propagating through the transmission line 46 propagates through the transmission line 42 via the changeover switch unit 14. Since the circuit 21 is a short-circuited circuit, the electromagnetic wave is reflected at the tip of the transmission line 42 with a reflection coefficient of "-1", and the reflected electromagnetic wave, a calibration reflected wave, propagates through the transmission line 42 in the reverse direction.

[0042] The calibration reflected wave propagating through the transmission line 42 propagates through the transmission line 46 via the changeover switch unit 14, and reaches the signal separation unit 13. After reaching the signal separation unit 13, the process is the same as that in step S3 (step S5). As a result, the data collection unit 35 acquires the measurement value corresponding to the circuit 22, that is, the S11 parameter for the circuit 22.

[0043] After outputting a switching instruction signal for connection to circuit 22 of calibration standard unit 16, when a predetermined fixed time has elapsed, control unit 31 outputs a switching instruction signal to changeover switch unit 14 for connecting transmission line 46 to circuit 23 of calibration standard unit 16. When changeover switch unit 14 receives a switching instruction signal for connection to circuit 23 of calibration standard unit 16 from control unit 31, it changes the connection destination of transmission line 46 and connects transmission line 46 to transmission line 43 (step S6).

[0044] The electromagnetic wave generated by the signal generating unit 12 and output to the transmission line 44 propagates through the transmission line 44 and reaches the signal separating unit 13. The signal separating unit 13 takes in the electromagnetic wave that has reached it and outputs the taken-in electromagnetic wave to the transmission line 46. The electromagnetic wave propagating through the transmission line 46 propagates through the transmission line 43 via the changeover switch unit 14. Since the circuit 23 is a circuit in a terminal state, the electromagnetic wave is reflected at the tip of the transmission line 43 with a reflection coefficient of "0", and the reflected electromagnetic wave, a calibration reflected wave, propagates through the transmission line 43 in the reverse direction.

[0045] The calibration reflected wave propagating through the transmission line 43 propagates through the transmission line 46 via the changeover switch unit 14, and reaches the signal separation unit 13. After reaching the signal separation unit 13, the process is the same as that in step S3 (step S7). As a result, the data collection unit 35 acquires the measurement value corresponding to the circuit 23, that is, the S11 parameter for the circuit 23.

[0046] After outputting a switching instruction signal for connection to circuit 23 of calibration standard unit 16, when a predetermined fixed time has elapsed, control unit 31 outputs a switching instruction signal to changeover switch unit 14 for connecting transmission line 46 to sensor unit 15. When changeover switch unit 14 receives a switching instruction signal for connection to sensor unit 15 from control unit 31, it switches the connection destination of transmission line 46 and connects transmission line 46 to transmission line 47 (step S8).

[0047] The electromagnetic waves generated by signal generation unit 12 and output to transmission line 44 propagate through transmission line 44 and reach signal separation unit 13. Signal separation unit 13 takes in the electromagnetic waves that have arrived, and outputs the taken-in electromagnetic waves to transmission line 46. The electromagnetic waves propagating through transmission line 46 propagate through transmission line 47 via changeover switch unit 14, and reach sensor unit 15. Sensor unit 15 takes in the electromagnetic waves that have arrived, and irradiates the taken-in electromagnetic waves onto a substance to be measured that is in contact with sensor unit 15.

[0048] The sensor unit 15 captures, as a wave to be measured, either a reflected wave that is reflected by the substance to be measured after receiving the irradiated electromagnetic wave or a transmitted wave that is transmitted through the substance to be measured, or, if both exist, both, as a wave to be measured. The sensor unit 15 outputs the captured wave to be measured to the transmission line 47. The wave to be measured propagating through the transmission line 47 propagates through the changeover switch unit 14 to the transmission line 46 and reaches the signal separation unit 13. The signal separation unit 13 captures the wave to be measured that has arrived there, and outputs the captured wave to be measured to the transmission line 45. The wave to be measured propagates through the transmission line 45 and reaches the signal receiving unit 17.

[0049] The signal receiving unit 17 receives the wave to be measured that has arrived, and converts the received wave to be measured into a measurement value of an electrical signal. The signal receiving unit 17 outputs the converted measurement value to the data collecting unit 35. The data collecting unit 35 receives the measurement value output by the signal receiving unit 17 (step S9). As a result, the data collecting unit 35 obtains the measurement value corresponding to the object to be measured, i.e., the S11 parameter for the object to be measured.

[0050] After outputting a switching instruction signal to connect to sensor unit 15, control unit 31 outputs a generation end instruction signal to signal generation unit 12 and outputs a reception end instruction signal to signal reception unit 17 when a predetermined fixed time has elapsed. Signal generation unit 12 ends the generation of electromagnetic waves when it receives the generation end instruction signal from control unit 31. Signal reception unit 17 ends the capture of electromagnetic waves from transmission line 45 when it receives the reception end instruction signal from control unit 31 (step S10).

[0051] In the above steps S4, S6, S8, and S10, the length of the predetermined fixed time that the control unit 31 uses as the timing to start processing is equal to or longer than the time required for the data collection unit 35 to obtain new measured values ​​after the switching instruction signal is issued, and is predetermined to be long enough for the data collection unit 35 to reliably obtain new measured values. The control unit 31, for example, has an internal timer with the fixed time set therein, starts the timer when it outputs the switching instruction signal, and starts the next processing when the timer expires.

[0052] The data collection unit 35 outputs the acquired S11 parameters for the circuit 21, the S11 parameters for the circuit 22, the S11 parameters for the circuit 23, and the S11 parameters for the measurement target to the calculation unit 36. The data collection unit 35 may, for example, assign identification information to each of the S11 parameters and output them to the calculation unit 36 ​​so that the calculation unit 36 ​​can identify which S11 parameter it is, or may output them in a predetermined order. The calculation unit 36 ​​takes in the S11 parameters for each of the circuits 21, 22, and 23 and the measurement target output by the data collection unit 35.

[0053] The calculation unit 36 ​​calculates measurement errors caused by changes in electrical characteristics due to temperature of the circuit board 11 and signal changes resulting from changes in the oscillation mode of the signal generating unit 12, based on the true values ​​corresponding to each of the circuits 21, 22, 23 stored in the internal memory area and the S11 parameters for each of the captured circuits 21, 22, 23.

[0054] Here, the measurement error that occurs in one-port measurement will be described with reference to Fig. 6. Fig. 6(A) is a diagram showing S parameters in one-port measurement, and reference numeral 70 indicates the position of the substance to be measured, which is the object of measurement, or the circuits 21, 22, 23 for calibration standards. Fig. 6(B) is a diagram showing the causes of measurement error in one-port measurement using an error term model. In Fig. 6(B), Γ means is the measurement value, that is, the S11 parameter acquired by the calculation unit 36, and is the reflection coefficient obtained by measurement. sens is the true value of the reflection coefficient, and E D ,E S ,E R is the error term that accounts for the measurement error.

[0055] As shown in the following references, Γ means And, sens The relationship between D ,E S ,E RThis can be expressed as the following equation (2).

[0056] [Reference: Andrej Rumiantsev, NM Ridler, “VNA Calibration”, IEEE Microwave Magazine, IEEE Xplore, Volume9, No.3, pp86-99, June 2008]

[0057]

number

[0058] For example, Γ means (open) is the S11 parameter for circuit 21, and Γ sens (open) is the true value corresponding to the circuit 21, i.e., "1". means (short circuit) is the S11 parameter for circuit 22, and Γ sens (short circuit) is the true value corresponding to the circuit 22, i.e., "-1". means (termination) is the S11 parameter for the circuit 23, and Γ sens (Terminal) is the true value corresponding to circuit 23, i.e., "0."

[0059] The calculation unit 36 ​​calculates Γ means (Open) and Γ sens (Open) combination and Γ means (Short circuit) and Γ sens (Short circuit) combination and Γ means (Terminal) and Γ sens Based on the three equations applied to equation (2) for each of the combinations of (ends), E D ,E S ,E R is calculated (step S11).

[0060] The calculation unit 36 ​​calculates the S11 parameter for the captured measurement object as Γ means (measurement object), Γ means (measurement target) and the calculated E D ,E S ,E RSubstituting this into equation (2), the true value for the measurement target, i.e., the true value of the reflection coefficient of the measurement target material, Γ sens By calculating the above, the S11 parameter for the measurement object is corrected (step S12).

[0061] 6B is a model of an error term that exists on the same transmission line. Therefore, when the connection destination of the transmission line 46 is switched by the changeover switch unit 14, the E D ,E S ,E Rえ There is a possibility of errors occurring in the

[0062] In order to remove this error, the error occurring in each of the circuits 21, 22, and 23 is calculated as data in advance and stored in a storage area inside the calculation unit 36. The data indicating the error occurring in each of the circuits 21, 22, and 23 may be calculated by simulation or may be obtained by the following means. For example, the sensor unit 15 is removed from the transmission line 47, and instead, each of the circuits 21, 22, and 23 is connected to the transmission line 47 and measured. The difference between the measurement value when the circuit 21 is connected to the transmission line 47 and the measurement value when the circuit 21 is connected to the transmission line 41, the difference between the measurement value when the circuit 22 is connected to the transmission line 47 and the measurement value when the circuit 22 is connected to the transmission line 42, and the difference between the measurement value when the circuit 23 is connected to the transmission line 47 and the measurement value when the circuit 23 is connected to the transmission line 43 may be calculated, and each of the calculated differences may be used as data indicating the error occurring in each of the circuits 21, 22, and 23.

[0063] When performing the calculation in step S12, the calculation unit 36 ​​calculates the true value Γ of the reflection coefficient of the substance to be measured while correcting the error based on the data indicating the error occurring in each of the circuits 21, 22, and 23 stored in the internal storage area. sens In this way, the calculation unit 36 ​​calculates the true value Γ of the reflection coefficient of the measurement target substance with higher accuracy. sens can be calculated.

[0064] The calculation unit 36 ​​calculates the true value Γ of the reflection coefficient of the measured substance calculated by the correction process in step S12. sens The calculation unit 36 ​​calculates the complex dielectric constant of the substance to be measured by, for example, a coaxial probe method based on the above. The calculation unit 36 ​​outputs the calculated complex dielectric constant of the substance to be measured to the display unit 33 for display (step S13), and ends the process.

[0065] For example, when a coaxial probe, which is a coaxial sensor, is used as the sensor section 15, the complex dielectric constant of the substance to be measured can be calculated based on the following equations (3) and (4).

[0066]

number

[0067]

number

[0068] In formula (3), when the subscript of ρ is 1 to 3, that is, ρ1, ρ2, and ρ3 are the true values ​​of the reflection coefficients in the circuits 21, 22, and 23, respectively, that is, "1", "-1", and "0". m is the true value of the reflection coefficient of the measured substance calculated by the calculation unit 36.

[0069] In formula (4), the subscript i is i=1, 2, 3, m. In formulas (3) and (4), when the subscript of y is 1 to 3, that is, y1, y2, and y3 are linear maps of the admittances of the circuits 21, 22, and 23, respectively. y mis a linear mapping of the admittance of the material to be measured. In equation (4), when the subscript of ε is 1 to 3, that is, ε1, ε2, and ε3 are the complex dielectric constants of the circuits 21, 22, and 23, respectively. ε m is the complex dielectric constant of the substance to be measured. G0 is the conductance of the sensor unit 15 in a vacuum, C0 is the capacitance of the sensor unit 15 in a vacuum, and ω is 2π / λ e λ e As explained in equation (1), ω is the measurement frequency in the electromagnetic wave, or the effective wavelength, which is the reciprocal of the center frequency of the measurement frequency band.

[0070] When a coaxial probe is applied to the sensor unit 15, the radiation from the end face of the coaxial probe is smaller than the capacitive component of the end face of the coaxial probe, so ωC0 >> G0. Therefore, G0 / jωC0 in the second term on the right side of equation (4) can be approximated to 0. In the case of circuit 22, a short-circuit state is established, so y2 can be approximated to infinity. This allows equations (3) and (4) to be transformed into the following equations (5), (6), and (7).

[0071]

number

[0072]

number

[0073]

number

[0074] By substituting equation (6) into equation (5), the following equation (8) is derived.

[0075]

number

[0076] Since the complex dielectric constant ε1 corresponding to the circuit 21 and the complex dielectric constant ε3 corresponding to the circuit 23 are known, the calculation unit 36 ​​adds ρ1, ρ2, ρ3, and ρ m By substituting, the complex dielectric constant ε m can be calculated.

[0077] In the dielectric spectroscopy measuring device 1 of the above embodiment, the signal generating unit 12 generates an electromagnetic wave. The signal separating unit 13 separates the electromagnetic wave according to the transmission direction, and outputs the separated electromagnetic wave to an output destination corresponding to the transmission direction. The changeover switch unit 14 takes in the electromagnetic wave generated by the signal generating unit 12 via the signal separating unit 13, switches the output destination to output the taken-in electromagnetic wave, and outputs the electromagnetic wave returning from the output destination to the signal separating unit 13. The sensor unit 15 irradiates the electromagnetic wave output by the changeover switch unit 14 to a measurement target, and outputs a measurement target wave obtained by the irradiation to the changeover switch unit. The calibration standard unit 16 includes circuits 21, 22, and 23 for calibration standards, and the circuits 21, 22, and 23 output a calibration reflected wave generated by receiving the electromagnetic wave output by the changeover switch unit 14 to the changeover switch unit 14. The signal receiving unit 17 receives the measurement target wave and the calibration reflected wave via the signal separating unit 13. The signal generating unit 12, the signal receiving unit 17, the changeover switch unit 14, the sensor unit 15, and the signal separating unit 13 are formed on a single circuit board 11 as the dielectric spectrometer 10.

[0078] As a result, before measuring a substance to be measured, the dielectric spectroscopic measuring device 1 connects to the circuits 21 to 23 included in the calibration standard unit 16 by the changeover switch unit 14, and calculates an error term E based on the measurement value obtained when the circuits 21 to 23 are connected and the known true values ​​of the circuits 21 to 23. D ,E S ,E R The dielectric spectroscopic measurement device 1 can calculate the calculated error term E D ,E S ,E RBased on this, the measured value obtained when measuring the substance to be measured can be corrected to calculate the true value of the substance to be measured, that is, the true value of the reflection coefficient of the substance to be measured.

[0079] When performing continuous measurements, the processes of steps S1 to S12 shown in FIG. 5 are repeated for each measurement, and the measured values ​​of the substance to be measured can be corrected at any time based on the measured values ​​obtained at each of the predetermined measurement times when the circuits 21 to 23 are connected. Therefore, it is possible to perform stable measurements with reduced influence of drift caused by changes in the electrical characteristics of the circuit board 11 due to temperature changes in the circuit board 11 during continuous measurements, and signal changes caused by changes in the oscillation mode of the signal generating unit 12. Therefore, by configuring the dielectric spectrometer 10 using the circuit board 11, for example, when the measurement target is a human, a small device that can be attached to a living body can be realized, and it is possible to reduce the influence of drift and increase the accuracy of the measurement when performing measurements over a long period of time, such as when measuring the measurement target continuously. The predetermined measurement times may be random times or may be times at regular intervals.

[0080] In the above-described dielectric spectroscopy measuring device 1, the calculation unit 36 ​​calculates the complex dielectric constant of the substance to be measured based on the corrected S11 parameter which is the true value of the substance to be measured, i.e., the true value of the reflection coefficient of the substance to be measured. In contrast, the calculation unit 36 ​​may be configured to quantify the characteristics of the substance to be measured, instead of the complex dielectric constant of the substance, based on the true value of the reflection coefficient of the substance to be measured.

[0081] In the flowchart shown in Fig. 5, the control unit 31 outputs a generation start instruction signal to the signal generating unit 12 in step S1. In contrast, the control unit 31 may output a generation start instruction signal to the signal generating unit 12 after outputting a switching instruction signal to the changeover switch unit 14, that is, between steps S2 and S3, between steps S4 and S5, between steps S6 and S7, or between steps S8 and S9, without outputting a generation start instruction signal to the signal generating unit 12 in step S1, and output a generation end instruction signal to the signal generating unit 12 before outputting the next switching instruction signal to the changeover switch unit 14 in steps S4, S6, and S8. This allows the signal generating unit 12 to not generate and output electromagnetic waves to the transmission line 44 while the changeover switch unit 14 switches the connection destination of the transmission line 46, so that the signal receiving unit 17 can be prevented from receiving electromagnetic waves containing noise generated during switching while the changeover switch unit 14 is performing switching.

[0082] 5, in step S10, the control unit 31 outputs a generation end instruction signal to the signal generating unit 12, and outputs a reception end instruction signal to the signal receiving unit 17. On the other hand, when measurements are to be performed continuously, the process of step S10 is not performed, and after the process of step S13, the process from step S2 is performed successively, and the control unit 31 may perform the process of step S10 at any timing in response to a user's operation.

[0083] In the flowchart shown in Fig. 5, the order of steps S2 and S3 for connecting to the circuit 21 and measuring the S11 parameter, steps S4 and S5 for connecting to the circuit 22 in a short-circuited state and measuring the S11 parameter, and steps S6 and S7 for connecting to the circuit 23 in a terminated state and measuring the S11 parameter is not limited to the order of open, short, terminated, and may be interchanged. In the flowchart shown in Fig. 5, steps S8 and S9 for the sensor unit 15 are performed after steps S2 to S7, but steps S8 and S9 may be performed between any one of steps S1 and S2, steps S3 and S4, and steps S5 and S6.

[0084] (Another example of the configuration of the dielectric spectroscopy measurement device: Part 1) 7 is a block diagram showing the configuration of a dielectric spectroscopy measurement apparatus 1a which is another configuration example of the dielectric spectroscopy measurement apparatus 1. In the dielectric spectroscopy measurement apparatus 1a, the same components as those in the dielectric spectroscopy measurement apparatus 1 are given the same reference numerals, and different components will be described below.

[0085] The dielectric spectroscopic measurement device 1a includes a dielectric spectroscopic measurement device 10a and a signal processing device 30. The dielectric spectroscopic measurement device 10a includes a circuit board 11a, a signal generating unit 12, a signal separating unit 13, a changeover switch unit 14, a sensor unit 15, a signal receiving unit 17, transmission lines 41 to 47, high-frequency connectors 61, 62, and 63, and a calibration standard unit 16. The signal generating unit 12, the signal separating unit 13, the changeover switch unit 14, the sensor unit 15, the signal receiving unit 17, the transmission lines 41 to 47, and the high-frequency connectors 61, 62, and 63 are integrally formed on the circuit board 11a.

[0086] The high-frequency connectors 61, 62, and 63 may be, for example, SMA (Subminiature version A), SMK (2.92 mm connector), SMV (1.85 mm connector), SMP (Subminiature Push-on), or SMPM (Subminiature Push-on Micro). The circuits 21, 22, and 23 included in the calibration standard unit 16 are connected to the high-frequency connectors 61, 62, and 63, respectively. This makes it possible to detachably attach the calibration standard unit 16 to the circuit board 11a. The process performed by the dielectric spectroscopy measurement device 1a is the same as the process performed by the dielectric spectroscopy measurement device 1 shown in FIG. 5.

[0087] In addition, when designing the transmission line lengths of the transmission lines 41, 42, and 43 in the dielectric spectroscopy measurement device 1a based on the above formula (1), it is necessary to design the transmission line lengths of the transmission lines 41, 42, and 43 taking into consideration the transmission line lengths including the high-frequency connectors 61, 62, and 63.

[0088] (Another example of the dielectric spectroscopy measurement device: Part 2) 8 is a block diagram showing the configuration of a dielectric spectroscopy measurement apparatus 1b which is another configuration example of the dielectric spectroscopy measurement apparatus 1. In the dielectric spectroscopy measurement apparatus 1b, the same components as those in the dielectric spectroscopy measurement apparatus 1 are given the same reference numerals, and different components will be described below.

[0089] The dielectric spectrometer 1b includes a dielectric spectrometer 10b and a signal processor 30b. The dielectric spectrometer 10b includes a circuit board 11b, a signal generator 12, a signal separator 13, a changeover switch 14b, a sensor unit 15, a signal receiver 17, transmission lines 41 to 47, and a calibration standard unit 16b. The signal generator 12, the signal separator 13, the changeover switch 14b, the sensor unit 15, the signal receiver 17, the transmission lines 41 to 47, and the calibration standard unit 16b are integrated in the circuit board 11b. The calibration standard unit 16b includes an open circuit 21 for the calibration standard. The changeover switch 14b is a one-input, two-output switch, and switches the transmission line 46 to one of the transmission lines 41 and 47 upon receiving a switching instruction signal from the control unit 31b.

[0090] The signal processing device 30b includes a control unit 31b, a calculation unit 32b, and a display unit 33. The control unit 31b has the same configuration as the control unit 31 except for the configuration of the switching instruction signal output to the changeover switch unit 14b. The control unit 31 outputs a switching instruction signal to the changeover switch unit 14 to instruct the changeover switch unit 14 to switch the connection destination of the transmission line 46 to any one of the transmission lines 41, 42, 43, and 47. In response to this, the control unit 31b outputs a switching instruction signal to the changeover switch unit 14b to instruct the changeover switch unit 14b to switch the connection destination of the transmission line 46 to any one of the transmission lines 41 and 47.

[0091] The arithmetic unit 32b includes a data collecting unit 35 and a calculation unit 36b. Since the calibration standard unit 16b includes only the circuit 21, the calculation unit 36b corrects the measurement value of the measured substance acquired by the data collecting unit 35 based on the measurement value corresponding to the calibration reflected wave corresponding to the circuit 21 acquired by the data collecting unit 35, using the following equation (9).

[0092]

number

[0093] In equation (9), "S 11Corrected " is the feather notation of the S11 parameter of the measured material after correction. 11sens " is the S11 parameter of the measured substance before correction, that is, the measured value of the measured substance output by the data collecting unit 35 and taken in by the calculating unit 36b in feather notation. 11Cal " is the S11 parameter for circuit 21, i.e., the feather notation of the measurement value for circuit 21 output by data collecting unit 35 and taken in by calculating unit 36b. As can be seen from equation (9), calculating unit 36b performs correction based on the ratio between the measurement value for circuit 21 and the measurement value of the substance to be measured before correction.

[0094] The dielectric spectroscopic measuring device 1b performs steps S8 to S10 after steps S1 to S3 of the process performed by the dielectric spectroscopic measuring device 1 shown in Fig. 5. Thereafter, the calculation unit 36b of the dielectric spectroscopic measuring device 1b performs a process of correcting the S11 parameter of the measured substance using the above formula (9) instead of the processes of steps S11 and S12, and then performs a process of step S13. The process of the control unit 31 is performed by the control unit 31b, and the process of the changeover switch unit 14 is performed by the changeover switch unit 14b. In step S8, after outputting a switching instruction signal to connect to the circuit 21 of the calibration standard unit 16b, the control unit 31b performs a process of outputting a switching instruction signal to connect the transmission line 46 to the sensor unit 15 to the changeover switch unit 14b when a predetermined fixed time has elapsed.

[0095] 8 shows the case where the calibration standard unit 16b of the dielectric spectroscopy measurement apparatus 1b includes the open circuit 21, but the calibration standard unit 16b may include only the short circuit 22, or may include only the termination circuit 23. In the case of the calibration standard unit 16b including one circuit, it is desirable that the frequency characteristics are uniform, so the short circuit 22 is most suitable, and the short circuit 22 also has the advantage of being less susceptible to the effects of surrounding circuits.

[0096] (Implementation results) FIG. 9 is a graph showing the amplitude change of the S11 parameter of the measurement target when continuous measurements are performed with the measurement target being air in the dielectric spectroscopy measurement device 1b shown in FIG. 8, in which the calibration standard unit 16b has only the short circuit 22. In FIG. 9, the vertical axis is the amplitude (dB) of the S11 parameter of the measurement target, and the horizontal axis is the number of measurements. In FIG. 9, the broken line connecting the points marked with black circles shows the amplitude change of the S11 parameter when the dielectric spectroscopy measurement device 1b in which the calibration standard unit 16b has only the short circuit 22 is used. The broken line connecting the points marked with crosses shows the S11 parameter when the measurement target is measured by the dielectric spectroscopy measurement device 1b without using the calibration standard unit 16b, that is, the amplitude change of the S11 parameter of the measurement target before correction. As can be seen from the graph in FIG. 9, it can be seen that the measurement can be performed more stably when the calibration standard unit 16b is used than when the calibration standard unit 16b is not used.

[0097] 10 is a graph showing the amplitude change of the S11 parameter when the measurement target is an aqueous glucose solution in the dielectric spectroscopy measurement device 1b shown in FIG. 8 and the calibration standard unit 16b includes only the short circuit 22, similar to FIG. 9. In FIG. 10, the vertical axis is the amplitude (dB) of the S11 parameter of the measurement target, and the horizontal axis is the glucose concentration (mg / dL). In FIG. 10, the black circles represent the S11 parameter after correction, and the dashed line is an approximation line. As can be seen from the approximation line, the amplitude decreases as the glucose concentration increases, and it can be seen that the change in the S11 parameter of the measurement target corrected by the dielectric spectroscopy measurement device 1b in which the calibration standard unit 16b includes only the short circuit 22 varies depending on the change in the glucose concentration.

[0098] The signal processing devices 30 and 30b in the above-described embodiment may be realized by a computer. In that case, a program for realizing the function may be recorded in a computer-readable recording medium, and the program recorded in the recording medium may be read into a computer system and executed to realize the function. The term "computer system" as used herein includes hardware such as an OS and peripheral devices. The term "computer-readable recording medium" refers to portable media such as flexible disks, optical magnetic disks, ROMs, and CD-ROMs, and storage devices such as hard disks built into a computer system. The term "computer-readable recording medium" may also include a medium that dynamically holds a program for a short period of time, such as a communication line when a program is transmitted via a network such as the Internet or a communication line such as a telephone line, and a medium that holds a program for a certain period of time, such as a volatile memory inside a computer system that is a server or client in that case. The above-described program may be a program for realizing a part of the above-described function, or may be a program that can realize the above-described function in combination with a program already recorded in the computer system, or may be a program that is realized using a programmable logic device such as an FPGA.

[0099] Although an embodiment of the present invention has been described in detail above with reference to the drawings, the specific configuration is not limited to this embodiment, and designs that do not deviate from the gist of the present invention are also included. [Industrial Applicability]

[0100] It can be used to measure the complex dielectric constant of solutions present in humans or animals, and solutions collected from humans or animals. [Explanation of symbols]

[0101] 1...Dielectric spectroscopy measurement device, 10...Dielectric spectroscopy measurement device, 11...Circuit board, 12...Signal generation section, 13...Signal separation section, 14...Changeover switch section, 15...Sensor section, 16...Calibration standard section, 17...Signal receiving section, 21, 22, 23...Circuits, 41 to 47...Transmission lines, 30...Signal processing device, 31...Control section, 32...Calculation section, 33...Display section, 35...Data collection section, 36...Calculation section

Claims

1. A signal generating unit that generates an electromagnetic wave; a signal separator that separates the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction; a changeover switch unit that takes in the electromagnetic waves generated by the signal generation unit through the signal separation unit, switches an output destination to output the taken-in electromagnetic waves, and outputs the electromagnetic waves returning from the output destination to the signal separation unit; a sensor unit that irradiates an object to be measured with the electromagnetic wave output from the changeover switch unit and outputs a measurement object wave obtained by the irradiation to the changeover switch unit; a calibration standard unit including a circuit for a calibration standard, the circuit receiving the electromagnetic wave output by the changeover switch unit and generating a calibration reflected wave, the calibration standard unit outputting the calibration reflected wave to the changeover switch unit; a signal receiving unit that receives the measurement target wave and the calibration reflected wave via the signal separating unit; a calculation unit that receives measurement values ​​of the measurement object wave and the calibration reflected wave and outputs the measurement values ​​received by the signal receiving unit, and corrects the measurement values ​​of the measurement object based on the measurement values ​​corresponding to the received calibration reflected wave; Equipped with the signal generating unit, the signal receiving unit, the changeover switch unit, the sensor unit, and the signal separating unit are formed on a single circuit board as a dielectric spectrometer, The signal generating unit is generating the electromagnetic wave after the output destination is switched by the changeover switch unit and before the next switching is performed; Dielectric spectroscopy measurement device.

2. The circuit included in the calibration standard unit is any one or all of an open circuit that opens the end of a transmission line connected to the circuit, a short circuit that shorts the end of a transmission line connected to the circuit, and a termination circuit that terminates the end of a transmission line connected to the circuit. The dielectric spectroscopy measuring device according to claim 1 .

3. When the circuits included in the calibration standard unit are all of the open circuit, the short circuit, and the termination circuit, the changeover switch unit switches between and connects each of the three circuits, the open circuit, the short circuit, and the termination circuit, to the sensor unit; The calculation unit is correcting the measurement value of the measurement object based on the measurement value corresponding to the calibration reflected wave of each of the three circuits and a known true value of the reflection coefficient of each of the three circuits; The dielectric spectroscopy measuring device according to claim 2 .

4. A signal generating unit that generates an electromagnetic wave; a signal separator that separates the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction; a changeover switch unit that takes in the electromagnetic waves generated by the signal generation unit through the signal separation unit, switches an output destination to output the taken-in electromagnetic waves, and outputs the electromagnetic waves returning from the output destination to the signal separation unit; a sensor unit that irradiates an object to be measured with the electromagnetic wave output from the changeover switch unit and outputs a measurement object wave obtained by the irradiation to the changeover switch unit; a calibration standard unit including a circuit for a calibration standard, the circuit receiving the electromagnetic wave output by the changeover switch unit and generating a calibration reflected wave, the calibration standard unit outputting the calibration reflected wave to the changeover switch unit; a signal receiving unit that receives the measurement target wave and the calibration reflected wave via the signal separating unit; a calculation unit that receives measurement values ​​of the measurement object wave and the calibration reflected wave and outputs the measurement values ​​received by the signal receiving unit, and corrects the measurement values ​​of the measurement object based on the measurement values ​​corresponding to the received calibration reflected wave; Equipped with the signal generating unit, the signal receiving unit, the changeover switch unit, the sensor unit, and the signal separating unit are formed on a single circuit board as a dielectric spectrometer, the circuit included in the calibration standard unit is any one or all of an open circuit that opens the end of a transmission line connected to the circuit, a short circuit that shorts the end of a transmission line connected to the circuit, and a termination circuit that terminates the end of a transmission line connected to the circuit, When the circuit included in the calibration standard unit is predetermined to be any one of the open circuit, the short circuit, and the termination circuit, the changeover switch unit switches and connects the predetermined one of the circuits to the sensor unit, The calculation unit is A dielectric spectroscopy measurement apparatus that corrects a measurement value of the object to be measured by dividing the measurement value of the object to be measured by the measurement value corresponding to the calibration reflected wave of a predetermined one of the circuits.

5. The calibration standard is formed on the circuit board or is connected to the circuit board. The dielectric spectroscopy measuring device according to claim 1 .

6. A signal generating unit that generates an electromagnetic wave; a signal separator that separates the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction; a changeover switch unit that takes in the electromagnetic waves generated by the signal generation unit through the signal separation unit, switches an output destination to output the taken-in electromagnetic waves, and outputs the electromagnetic waves returning from the output destination to the signal separation unit; a sensor unit that irradiates an object to be measured with the electromagnetic wave output from the changeover switch unit and outputs a measurement object wave obtained by the irradiation to the changeover switch unit; a calibration standard unit including a circuit for a calibration standard, the circuit receiving the electromagnetic wave output by the changeover switch unit and generating a calibration reflected wave, the calibration standard unit outputting the calibration reflected wave to the changeover switch unit; a signal receiving unit that receives the measurement target wave and the calibration reflected wave via the signal separating unit; a calculation unit that receives measurement values ​​of the measurement object wave and the calibration reflected wave and outputs the measurement values ​​received by the signal receiving unit, and corrects the measurement values ​​of the measurement object based on the measurement values ​​corresponding to the received calibration reflected wave; Equipped with the signal generating unit, the signal receiving unit, the changeover switch unit, the sensor unit, and the signal separating unit are formed on a single circuit board as a dielectric spectrometer, A dielectric spectroscopy measurement device in which, when an effective wavelength of the electromagnetic wave to be measured is predetermined, a transmission line length of a transmission line between the changeover switch unit and the calibration standard unit, and a transmission line length of a transmission line between the changeover switch unit and the sensor unit are predetermined in accordance with the effective wavelength.

7. A signal generating unit that generates an electromagnetic wave; a signal separator that separates the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction; a changeover switch unit that takes in the electromagnetic waves generated by the signal generation unit through the signal separation unit, switches an output destination to output the taken-in electromagnetic waves, and outputs the electromagnetic waves returning from the output destination to the signal separation unit; a sensor unit that irradiates an object to be measured with the electromagnetic wave output from the changeover switch unit and outputs a measurement object wave obtained by the irradiation to the changeover switch unit; a calibration standard unit including a circuit for a calibration standard, the circuit receiving the electromagnetic wave output by the changeover switch unit and generating a calibration reflected wave, the calibration standard unit outputting the calibration reflected wave to the changeover switch unit; a signal receiving unit that receives the measurement target wave and the calibration reflected wave via the signal separating unit; a calculation unit that receives measurement values ​​of the measurement object wave and the calibration reflected wave and outputs the measurement values ​​received by the signal receiving unit, and corrects the measurement values ​​of the measurement object based on the measurement values ​​corresponding to the received calibration reflected wave; Equipped with the signal generating unit, the signal receiving unit, the changeover switch unit, the sensor unit, and the signal separating unit are formed on a single circuit board as a dielectric spectrometer, The calculation unit is a measurement value of the measurement object based on the measurement value of the calibration reflected wave and the difference in transmission loss and phase difference between a path leading to the sensor unit via the changeover switch unit and a path leading to the circuit of the calibration standard unit via the changeover switch unit, and

8. A dielectric spectroscopy measurement method performed by a dielectric spectroscopy measurement device in which a signal generating unit, a signal receiving unit, a changeover switch unit, a sensor unit, and a signal separating unit are formed on a single circuit board as a dielectric spectroscopy measurement device, comprising: The signal generating unit generates an electromagnetic wave, the signal separation unit receives the electromagnetic wave generated by the signal generation unit and outputs the received electromagnetic wave to the changeover switch unit; the changeover switch unit takes in the electromagnetic waves generated by the signal generation unit via the signal separation unit, switches an output destination of the taken-in electromagnetic waves, and outputs the electromagnetic waves; a calibration standard circuit outputs a calibration reflected wave generated by receiving the electromagnetic wave output by the changeover switch unit to the changeover switch unit; the changeover switch unit outputs the calibration reflected wave returning from the output destination to the signal separation unit; the sensor unit irradiates the electromagnetic wave output by the changeover switch unit to a measurement object, and outputs the electromagnetic wave obtained by the irradiation to the changeover switch unit as a measurement object wave; The changeover switch unit outputs the measurement target wave returning from the output destination to the signal separation unit, the signal separation unit outputs the measurement target wave and the calibration reflected wave to the signal receiving unit; the signal receiving unit receives the measurement target wave and the calibration reflected wave, a calculation unit that receives a measurement value output by the signal receiving unit after receiving the measurement object wave and the calibration reflected wave, and corrects the measurement value of the measurement object based on the measurement value corresponding to the received calibration reflected wave; the signal generating unit generates the electromagnetic wave after the output destination is switched by the changeover switch unit and before the next switching is performed. Dielectric spectroscopy measurement method.

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