Probe pins, inspection jigs and inspection units

Abstract

To provide a probe pin with high contact reliability, an inspection jig including the probe pin, and an inspection unit including the inspection jig.SOLUTION: A probe pin comprises: an elastic part that is elastically deformable along a first direction; a first contact part that is provided at one end in the first direction of the elastic part; and a second contact part that is provided at the other end in the first direction of the elastic part. The elastic part has a plurality of horizontal band parts and at least one curved band part. The first contact part and the second contact part are each arranged on the same side with respect to a first center line that passes through the center in a second direction of the elastic part and extends in the first direction. At least a side face of the first contact part has a shape asymmetric, when viewed from the second direction, with respect to a second center line that passes through the center in a third direction and extends in the first direction.SELECTED DRAWING: Figure 3

Description

[Technical field]

[0001] The present disclosure relates to a probe pin, an inspection jig, and an inspection unit. [Background technology]

[0002] In the manufacturing process of electronic component modules such as cameras or liquid crystal panels, continuity tests and performance characteristic tests are generally performed. These tests are performed by using probe pins to connect terminals for connecting to a main body substrate installed on the electronic component module to terminals of an inspection device.

[0003] An example of such a probe pin is described in Patent Document 1. This probe pin has a pair of contacts that can come into contact with an electrode terminal of an electronic component and an electrode terminal of a connected electronic component, respectively, and a serpentine portion that is interposed between the pair of contacts and connects the pair of contacts. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2002-134202 A Summary of the Invention [Problem to be solved by the invention]

[0005] Since each contact of the probe pin is configured to make contact with the electrode terminal at one point, for example, if a non-conductive foreign matter adheres to the tip of each contact, this foreign matter may cause poor conductivity between the probe pin and the electrode terminal, reducing contact reliability.

[0006] An object of the present disclosure is to provide a probe pin with high contact reliability, an inspection tool including this probe pin, and an inspection unit including this inspection tool. [Means for solving the problem]

[0007] An example probe pin of the present disclosure includes: An elastic portion that is elastically deformable along a first direction; a first contact portion provided at one end of the elastic portion in the first direction; a second contact portion provided at the other end of the elastic portion in the first direction; Equipped with The elastic portion is a plurality of horizontal band portions extending in a second direction intersecting the first direction and spaced apart in the first direction; and at least one curved band portion connected to adjacent horizontal band portions; Each of the first contact portion and the second contact portion is are disposed on the same side of a first center line that passes through a center of the elastic portion in the second direction and extends along the first direction, A pair of plate surfaces facing each other in a third direction intersecting the first direction and the second direction, and side surfaces intersecting the pair of plate surfaces, At least the side surface of the first contact portion has an asymmetric shape with respect to a second center line that passes through a center in the third direction and extends in the first direction, when viewed from the second direction.

[0008] Moreover, an example inspection jig of the present disclosure includes: The probe pin; a housing in which the probe pin is housed; Equipped with.

[0009] Moreover, the inspection unit according to an example of the present disclosure includes: At least one of the inspection jigs is provided. Effect of the Invention

[0010] According to the probe pin, the first contact portion and the second contact portion are disposed on the same side of the first center line that passes through the center of the elastic portion in the second direction and extends along the first direction. Also, at least the side surface of the first contact portion has an asymmetric shape with respect to the second center line that passes through the center of the third direction and extends in the first direction when viewed from the second direction. With this configuration, for example, when the connection terminal of the test object or the test device is moved toward the second contact portion along the first direction in a state where the first contact portion is in contact with the test object or the test device, the first contact portion rotates relative to the second contact portion on a first plane including the first direction and the second direction while remaining in contact with the test object or the test device connection terminal, and also rotates relative to the second contact portion on a second plane that intersects with the first plane including the first direction and the third direction. That is, wiping operations in two different directions can be simultaneously generated for the test object or the test device connection terminal. As a result, even if a non-conductive foreign matter adheres to the portion of the first contact portion that comes into contact with the connection terminal, the foreign matter can be easily removed, thereby achieving a probe pin with high contact reliability.

[0011] According to the inspection jig, the probe pin makes it possible to realize an inspection jig with high contact reliability.

[0012] According to the inspection unit, the inspection jig can realize an inspection unit with high contact reliability. [Brief description of the drawings]

[0013] [Figure 1] FIG. 2 is a perspective view showing a probe pin according to an embodiment of the present disclosure. [Diagram 2] FIG. 2 is a cross-sectional view of an inspection jig equipped with the probe pin of FIG. 1. [Diagram 3] 2 is an enlarged side view showing a first contact portion of the probe pin in FIG. 1; [Figure 4] FIG. 2 is an enlarged side view showing a first modified example of the probe pin in FIG. [Diagram 5] FIG. 2 is an enlarged side view showing a second modified example of the probe pin in FIG. [Figure 6]FIG. 2 is an enlarged side view showing a third modified example of the probe pin in FIG. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0014] An example of the present disclosure will be described below with reference to the accompanying drawings. In the following description, terms indicating specific directions or positions (e.g., terms including "upper", "lower", "right" and "left") are used as necessary, but the use of these terms is for the purpose of facilitating understanding of the present disclosure with reference to the drawings, and the meanings of these terms do not limit the technical scope of the present disclosure. In addition, the following description is essentially merely illustrative, and is not intended to limit the present disclosure, its application, or its uses. Furthermore, the drawings are schematic, and the ratios of the dimensions do not necessarily correspond to the real ones.

[0015] A probe pin according to an embodiment of the present disclosure is, for example, a thin, elongated, conductive plate as shown in Fig. 1. This probe pin 10 is used in a state housed in an insulating housing 100 as shown in Fig. 2, and constitutes an inspection jig 2 together with the housing 100. The inspection jig 2 houses a plurality of probe pins 10, for example.

[0016] Moreover, the inspection jig 2 can constitute a part of the inspection unit 1. For example, as shown in Fig. 2, when the inspection unit 1 is constituted by a pair of inspection jigs 2, each inspection jig 2 is disposed so that each contact portion of a probe pin 10 described later is adjacent to a second direction Y intersecting (for example, perpendicular to) a first direction X in which the probe pin 10 extends.

[0017] As shown in Fig. 2, each housing 100 has a plurality of storage sections 101 (only one is shown in Fig. 2) therein. Each storage section 101 has a slit shape and is configured to be able to store and hold one probe pin 10 electrically independently. Moreover, each storage section 101 is arranged in a line at equal intervals along a third direction Z (shown in Fig. 3) that intersects (for example, is perpendicular to) the first direction X and the second direction Y.

[0018] 1 and 2, each probe pin 10 includes an elastic portion 20 that is elastically deformable along a first direction X, and a first contact portion 30 and a second contact portion 40 provided at both ends of the elastic portion 20 in the first direction X. As an example, each probe pin 10 is formed by electroforming, and the elastic portion 20, the first contact portion 30 and the second contact portion 40 are arranged in series along the first direction X and are integrally configured.

[0019] 2, the elastic portion 20 is, for example, composed of a plurality of elastic strip pieces 21, 22 (two elastic strip pieces in this embodiment) arranged with a gap 23 between them. Each of the elastic strip pieces 21, 22 has a meandering shape in which a plurality of horizontal band portions 24 (seven horizontal band portions 24 in this embodiment) extending in the second direction Y and arranged with a gap in the first direction X and at least one curved band portion 25 (six curved band portions 25 in this embodiment) having both ends connected to adjacent horizontal band portions 24 are alternately connected along the first direction X. The horizontal band portions 24 at both ends in the first direction X of each of the elastic strip pieces 21, 22 are connected to the first contact portion 30 and the second contact portion 40, respectively.

[0020] A contact surface 241 is provided on the horizontal band 24 connected to the first contact portion 30 of the elastic band piece 21 farther from the second contact portion 40 in the first direction X. This contact surface 241 is configured to come into contact with the inner surface of the housing 100 constituting the accommodating portion 101 when the probe pin 10 is accommodated in the accommodating portion 101 of the housing 100. A rib 242 connecting the elastic band pieces 21, 22 is provided on the horizontal band piece 24 connected to the first contact portion 30 to prevent contact between the elastic band pieces 21, 22.

[0021] As shown in Fig. 2, the first contact portion 30 and the second contact portion 40 are disposed on the same side of a first center line CL1 in the second direction Y of the elastic portion 20. In this embodiment, as shown in Fig. 2, a straight line that passes through the center of the maximum distance L in the second direction Y of the combined portion of the horizontal band portion 24 connected to the first contact portion 30 and the curved band portion 25 connected to this horizontal band portion 24 and extends in the first direction X is defined as the first center line CL1 in the second direction Y of the elastic portion 20.

[0022] As an example, the first contact portion 30 has a substantially rectangular plate shape extending in the first direction X, and is disposed at an end of the elastic portion 20 in the second direction Y. An end of the first contact portion 30 farther from the elastic portion 20 in the first direction X is substantially in the shape of a right-angled triangle having an apex at a position farthest from the first center line CL1 of the elastic portion 20 in the second direction Y, and the apex constitutes a contact portion 31 that can come into contact with a connection terminal 110 of a contact object (e.g., an object to be inspected or an inspection device). A through hole 32 is provided at an end of the first contact portion 30 closer to the elastic portion 20 in the first direction X. The through hole 32 is connected to the gap 23 between the belt-shaped elastic pieces 21, 22.

[0023] 3, a side surface 35 of the first contact portion 30 intersecting a pair of plate surfaces 33, 34 facing each other in the third direction Z has an asymmetric shape with respect to a second center line CL2 passing through the center of the third direction Z and extending in the first direction X, as viewed from the second direction Y. In detail, the side surface 35 of the first contact portion 30 is linearly inclined in the first direction X from one plate surface 33 to the other plate surface 34 in the third direction Z so as to move away from the elastic portion 20. Note that FIG. 3 is a side view of the first contact portion 30 as viewed from the direction of arrow A in FIG. 2.

[0024] As an example, the second contact portion 40 has a main body portion 41 extending in the second direction Y, a connection portion 42 provided at one end of the main body portion 41 in the second direction Y, and a contact portion 43 provided at the other end of the main body portion 41 in the second direction Y. The main body portion 41 has a contact surface 411 that contacts the inner surface of the housing 100 constituting the accommodation portion 101 when the probe pin 10 is accommodated in the accommodation portion 101 of the housing 100. The connection portion 42 extends from the main body portion 41 in the first direction X toward the first contact portion 30, and is connected to the horizontal band portion 24 of the elastic portion 20. The contact portion 43 extends from the main body portion 41 in the first direction X in a direction away from the first contact portion 30, and is configured to be able to contact a connection terminal 110 of a contact object.

[0025] Although not shown, the side surface of the second contact portion 40, like the side surface of the first contact portion 30, also slopes linearly away from the elastic portion 20 in the first direction X as it moves from one plate surface to the other plate surface in the third direction Z.

[0026] Next, the operation of the probe pin 10 when the connection terminal 110 of the contact object is brought into contact with the contact portion 31 of the first contact portion 30 and moved along the first direction X toward the second contact portion 40 (i.e., in the direction of arrow B in Figures 2 and 3) will be described.

[0027] When the connection terminal 110 is moved in the direction of arrow B while being in contact with the contact portion 31 of the first contact portion 30, the elastic portion 20 is compressed via the first contact portion 30. At this time, since the first contact portion 30 and the second contact portion 40 are arranged on the same side with respect to the first center line CL1 of the elastic portion 20 (i.e., they are not arranged on the first center line CL1 of the elastic portion 20), they rotate in the direction of arrow C in FIG. 2 relative to the second contact portion 40 on a first plane (i.e., the XY plane shown in FIG. 2) including the first direction X and the second direction Y while remaining in contact with the connection terminal 110 of the contact object. In addition, since the side surface 35 of the first contact portion 30 is linearly inclined, they also rotate in the direction of arrow D in FIG. 3 relative to the second contact portion 40 on a second plane (i.e., the XZ plane shown in FIG. 3) intersecting the first plane including the first direction X and the third direction Z. That is, wiping operations in two different directions occur simultaneously with respect to the connection terminal 110 of the contact object.

[0028] Thus, in the probe pin 10, the first contact portion 30 and the second contact portion 40 are disposed on the same side with respect to the first center line CL1 that passes through the center of the elastic portion in the second direction and extends along the first direction. In addition, at least the side surface 35 of the first contact portion 30 has an asymmetric shape with respect to the second center line CL2 that passes through the center in the third direction Z and extends in the first direction X, as viewed from the second direction Y. With this configuration, wiping operations in two different directions can be simultaneously generated with respect to the connection terminal 110 of the contact object. As a result, for example, even if a non-conductive foreign object adheres to the portion of the first contact portion 30 that contacts the connection terminal 110 (i.e., the contact portion 31), the foreign object can be easily removed, and therefore a probe pin 10 with high contact reliability can be realized.

[0029] Moreover, each of the first contact portion 30 and the second contact portion 40 is disposed at an end of the elastic portion 20 in the second direction Y. With such a configuration, for example, the first contact portion 30 can increase the amount of rotation of the first contact portion 30 relative to the second contact portion 40 on the first plane, thereby improving wiping performance.

[0030] An inspection jig 2 with high contact reliability can be realized by using such a probe pin 10. Furthermore, an inspection unit 1 with high contact reliability can be realized by using an inspection jig 2 including such a probe pin 10.

[0031] Note that the side surface 35 of the first contact portion 30 does not necessarily have to be linearly inclined as long as it has an asymmetric shape with respect to the second center line CL2 that passes through the center in the third direction Z and extends in the first direction X when viewed from the second direction Y. For example, the side surface 35 of the first contact portion 30 may have a triangular shape when viewed from the second direction Y (i.e., the direction penetrating the paper surface of FIG. 4) as shown in FIG. 4. In this case, the apex 351 of the triangle is located at a position away from the second center line CL2 in the third direction Z (in FIG. 4, a position closer to the plate surface 34 than the second center line CL2).

[0032] Also, for example, as shown in FIG. 5, the side surface 35 of the first contact portion 30 may have a concave curved shape when viewed in the second direction Y (that is, the direction penetrating the paper surface of FIG. 5).

[0033] Furthermore, for example, as shown in Figs. 5 and 6, corners 36 formed by each of the pair of plate surfaces 33, 34 and the side surface 35 when viewed from the second direction Y may be chamfered.

[0034] In this way, the shape of the side surface 35 of the first contact portion 30 can be changed according to the design of the probe pin 10. In other words, a probe pin 10 with a high degree of freedom in design can be realized.

[0035] It is sufficient that at least the side surface 35 of the first contact portion 30 has an asymmetric shape with respect to the second center line CL2 when viewed from the second direction Y. In other words, the side surface of the second contact portion 40 may have a symmetric shape with respect to the second center line CL2 when viewed from the second direction Y.

[0036] Each of the first contact portion 30 and the second contact portion 40 may be disposed on the same side with respect to the first center line CL1 of the elastic portion 20. In other words, each of the first contact portion 30 and the second contact portion 40 is not limited to being disposed at an end of the elastic portion 20 in the second direction Y, and may be disposed, for example, midway between the center line CL1 and the end of the elastic portion 20 in the second direction Y.

[0037] The elastic portion 20 is not limited to being composed of a plurality of elastic strip pieces 21, 22, but may be composed of a single elastic strip piece.

[0038] The number of contact portions of the first contact portion 30 and the second contact portion 40 is not limited to one, and may be multiple. That is, the number of contact portions of the first contact portion 30 and the second contact portion 40 can be configured to be capable of contacting the connection terminal 110 of the contact object at two or more points, not limited to one point.

[0039] Various embodiments of the present disclosure have been described above in detail with reference to the drawings. Finally, various aspects of the present disclosure will be described. In the following description, reference symbols will be used as examples.

[0040] The probe pin 10 according to the first embodiment of the present disclosure is An elastic portion 20 that is elastically deformable along a first direction X; a first contact portion 30 provided at one end of the elastic portion 20 in the first direction X; a second contact portion 40 provided at the other end of the elastic portion 20 in the first direction X; Equipped with The elastic portion 20 is The belt has a plurality of horizontal band portions 24 extending in a second direction Y intersecting the first direction X and arranged at intervals in the first direction X, and at least one curved band portion 25 connected to adjacent horizontal band portions 24, Each of the first contact portion 30 and the second contact portion 40 is are disposed on the same side of a first center line CL1 passing through the center of the elastic portion 20 in the second direction Y and extending along the first direction X, The plate has a pair of plate surfaces 33, 34 facing each other in a third direction Z intersecting the first direction X and the second direction Y, and a side surface 35 intersecting the pair of plate surfaces 33, 34, At least the side surface 35 of the first contact portion 30 has an asymmetric shape with respect to a second center line CL2 that passes through the center in the third direction Z and extends in the first direction X when viewed from the second direction Y.

[0041] According to the probe pin 10 of the first aspect, wiping operations in two different directions can be simultaneously performed on the connection terminal 110 of the contact object. As a result, even if a non-conductive foreign matter adheres to the portion of the first contact portion 30 that contacts the connection terminal 110 (i.e., the contact portion 31), the foreign matter can be easily removed, thereby realizing a probe pin 10 with high contact reliability.

[0042] The probe pin 10 according to the second embodiment of the present disclosure is The first contact portion 30 and the second contact portion 40 are each disposed at an end of the elastic portion 20 in the second direction Y.

[0043] According to the probe pin 10 of the second embodiment, for example, the first contact portion 30 can increase the amount of rotation of the first contact portion 30 relative to the second contact portion 40 on the first plane, thereby improving wiping performance.

[0044] The probe pin 10 according to the third aspect of the present disclosure is The side surface 35 has a triangular shape when viewed from the second direction Y.

[0045] According to the probe pin 10 of the third aspect, it is possible to realize a probe pin 10 with a high degree of freedom in design.

[0046] The probe pin 10 according to the fourth aspect of the present disclosure is When viewed from the second direction Y, corners 36 formed by each of the pair of plate surfaces 33, 34 and the side surface 35 are chamfered.

[0047] According to the probe pin 10 of the fourth aspect, it is possible to realize a probe pin 10 with a high degree of freedom in design.

[0048] The probe pin 10 according to the fifth aspect of the present disclosure is The side surface 35 has a concave curved shape when viewed from the second direction Y.

[0049] According to the probe pin 10 of the fifth aspect, it is possible to realize a probe pin 10 with a high degree of freedom in design.

[0050] The inspection jig 2 according to the sixth aspect of the present disclosure is The probe pin 10; a housing 100 in which the probe pin 10 is housed; Equipped with.

[0051] According to the inspection jig 2 of the sixth aspect, the probe pin 10 makes it possible to realize an inspection jig 2 with high contact reliability.

[0052] The inspection unit 1 according to the seventh aspect of the present disclosure includes: At least one of the inspection jig 2 is provided.

[0053] According to the inspection unit 1 of the seventh aspect, the inspection jig 2 makes it possible to realize the inspection unit 1 with high contact reliability.

[0054] Any of the above-mentioned various embodiments or modifications may be combined as appropriate to achieve the effects of each of them. In addition, combinations of embodiments, combinations of examples, or combinations of embodiments and examples are possible, and combinations of features of different embodiments or examples are also possible. [Industrial Applicability]

[0055] The probe pin of the present disclosure can be applied to an inspection tool used for inspecting semiconductors such as camera devices, USB devices, HDMI devices, or QFN devices and SON devices.

[0056] The inspection tool of the present disclosure can be applied to inspection units used for inspecting semiconductors such as camera devices, USB devices, HDMI devices, or QFN devices and SON devices, for example.

[0057] The inspection unit of the present disclosure can be applied to, for example, an inspection device used for inspecting semiconductors such as camera devices, USB devices, HDMI devices, or QFN devices and SON devices. [Explanation of symbols]

[0058] 1 Inspection unit 2 Inspection fixture 10 Probe Pins 20 Elastic part 21, 22 Elastic strip 23 Gap 24 Horizontal belt 241 Contact surface 242 Ribs 25 Curved belt section 30 1st contact part 31 Contact part 32 Through hole 33, 34 plate surface 35 Side 351 Vertex 40 Second contact part 41 Main body 411 Contact surface 42 Connection 43 Contact part 100 Housing 101 Storage unit 110 Connection terminal

Claims

1. An elastic portion that is elastically deformable along a first direction; a first contact portion provided at one end of the elastic portion in the first direction; a second contact portion provided at the other end of the elastic portion in the first direction; Equipped with The first contact portion is a first contact portion located at one of both ends of the first contact portion in the first direction that is farther from the elastic portion; The second contact portion is a second contact portion located at an end of the second contact portion in the first direction that is farther from the elastic portion; The elastic portion is a plurality of horizontal band portions extending in a second direction intersecting the first direction and spaced apart in the first direction; and at least one curved band portion connected to an adjacent one of the horizontal band portions, the first contact portion, the second contact portion, a connection portion of the first contact portion and the elastic portion, and a connection portion of the second contact portion and the elastic portion are disposed on the same side of a first center line that passes through a center of the elastic portion in the second direction and extends along the first direction, each of the first contact portion and the second contact portion has a pair of plate surfaces facing each other in a third direction intersecting the first direction and the second direction, and a side surface intersecting the pair of plate surfaces; A probe pin, wherein at least the side surface of the first contact portion has an asymmetric shape, when viewed from the second direction, with respect to a second center line that passes through the center in the third direction and extends in the first direction.

2. The probe pin according to claim 1 , wherein each of the first contact portion and the second contact portion is disposed at an end of the elastic portion in the second direction.

3. an end portion of the side surface of the first contact portion away from the second contact portion in the first direction has a triangular shape when viewed from the second direction; 3. The probe pin according to claim 1, wherein an end of the side surface of the second contact portion, which is remote from the first contact portion in the first direction, has a triangular shape when viewed from the second direction.

4. 3. The probe pin according to claim 1, wherein corners formed by each of the pair of plate surfaces and the side surface when viewed from the second direction are chamfered.

5. A probe pin of claim 1 or 2, wherein an end of the side of the first contact portion in the first direction away from the second contact portion has a concave curved shape when viewed from the second direction.

6. A probe pin according to any one of claims 1 to 5; a housing in which the probe pin is housed; An inspection jig comprising:

7. An inspection unit comprising at least one inspection jig according to claim 6.

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