High DQE direct detection image sensor for electrons with energies from 40 to 120KEV

Abstract

A detector is provided for forming images by detecting electrons in an electron microscope at energies in the range of 3 keV to 300 keV, more specifically in the range of 40 keV to 120 keV, with very high spatial resolution and sensitivity. The detector is formed by bonding a handle wafer to the front surface of a planarized monolithic active pixel sensor (MAPS), partially or completely removing a substrate layer on the back surface, and selectively removing the handle material from the front surface to leave a perimeter of the handle material in non-imaging areas. The detector may be implemented in an electron microscope for backside illumination. The detector provides high-resolution images at low energies due to the backside illumination and at high energies due to the reduced epitaxial layer thickness and the absence of backscattering substrate material.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS

[0001] This application claims the benefit of U.S. Provisional Application No. 63 / 073,719, filed September 2, 2020, which is incorporated by reference in its entirety. [Technical field]

[0002] The present disclosure relates to direct detection sensor and camera systems for high detective quantum efficiency (high DQE) imaging of electrons with energies in the range of 3 keV to 300 keV, and more specifically, electrons in the range of 40 keV to 120 keV. [Background technology]

[0003] Devices currently used to detect electrons and form images in electron microscopes do not provide high spatial resolution and sensitivity in the energy range of 40 keV to 120 keV. Direct detection devices (DDDs) and other detectors that detect electrons without an intervening scintillator work well at energies above 120 keV. These systems achieve a detection quantum efficiency (DQE), a measure of sensitivity and resolution, close to the theoretical limit by using electron counting. Alternatively, detectors that use scintillators suffer from blurring and diffuse scattering that limit the resolution of light, limiting the DQE. However, because direct detectors do not work well at low energies, detection of electrons below 120 keV has traditionally relied on scintillator-based detectors.

[0004] Two types of detector technologies are used for the direct detection of electrons in microscopy. The first technology has been widely adopted and is used almost exclusively for biological applications where the sample is kept at cryogenic temperatures while being imaged (cryo-EM). These are monolithic active pixel sensors (MAPS) fabricated using complementary metal oxide semiconductor (CMOS) image sensor fabrication processes. A schematic cross section of such a sensor is shown diagrammatically in FIG. 1. These sensors are built on a silicon wafer 110 of about 1 mm thickness, on which a lightly doped epitaxial p-type silicon layer (epi) 120 of thickness 5 μm-30 μm is grown. Circuitry 130 is then built on or within the epi layer 120 using the CMOS image sensor fabrication process. An n-type photodiode 121 is formed in the depletion region 122, on top of which a p-type photodiode 124 is grown. ++ There is a pinned layer 123. The epitaxial material is p-type silicon. The substrate 110 is p + The photodiode is a p-type silicon substrate. The floating diffusion region FD is an n-type region. The photodiode acts like the source and the floating diffusion acts like the drain of a MOS transistor. The metallization pattern is ++A source contact to the region, a drain contact 132 to the floating diffusion region, and a transfer gate 134 contact. The electrons interact with the silicon as they penetrate the device, generating a signal charge that is collected and read out by readout circuitry 140. As shown in FIG. 2, each incident electron 212 generates many secondary electrons 216 that form a cloud trail as they scatter across through the detector. The interactions within the epilayer 220 are of interest because they generate the charge that is collected. Some of the incident electrons may undergo scattering at large angles either in the epilayer or in the material below the epilayer, which is called backscattering, resulting in the deposition of secondary charges at locations far from the electron's entry point (as shown by backscattered electrons 214, FIG. 2), thereby reducing image quality. To minimize this effect, a portion of the substrate wafer can be removed to reduce the amount of backscattering, as shown in FIG. 2. In FIG. 2, the epilayer 220 is fabricated to a thickness of about 10 μm, and the substrate layer is thinned to a thickness of about 1 mm to about 20 μm. The incident electron energy is 300 keV.

[0005] MAPS detectors perform very well at electron energies above 200 keV, achieving near-ideal DQE. High-energy primary electrons create a relatively small and localized cloud of secondary electrons as they pass through the detector's epilayer. The limited size of the secondary electron cloud ensures that the signal from each primary electron is not spread across many pixels. Furthermore, if the detector is thin enough, the high-energy primary electrons are unlikely to scatter at high angles in the subsequent material such that backscattering is minimized.

[0006] However, the performance of the MAPS detector drops dramatically at lower electron energies due to increased electron scattering at lower energies as shown in FIG. 3 where the primary electron energy is 100 keV. This low energy causes three problems. First, the low energy primary electrons 312 tend to generate many secondary electrons in the epilayer 320, thereby saturating the pixel with fewer primary electrons. Second, the low energy primary electrons and their resulting secondary electron cloud trails 316 tend to scatter over many pixels, thereby expanding the detector's point spread function and reducing the detector's resolution, as shown by comparing the size of the interaction volume in FIG. 3 to that shown in FIG. 2. Third, the low energy primary electrons tend to scatter at high angles upon interaction with any material below the epilayer, resulting in more backscattered electrons 314. These backscattered electrons 314 cause the detection of secondary events far away from the original point of incidence of the primary electrons. Backscatter reduces the resolution as measured by the modulation transfer function (MTF) and increases noise by adding extra false positives.

[0007] The second type of detector used to directly detect electrons in an electron microscope is the hybrid pixel detector (HPD) shown in FIG. 4. Hybrid pixel detectors provide electronic imaging of the electron energy range of interest with high DQE. These devices are a hybrid between an aluminum detector layer 430, which absorbs primary electrons and produces a cloud of secondary electrons, and a readout circuit layer 440, which reads out the number and location of interactions. The two layers are electrically connected to each other through a process called bump bonding, which involves indium or similar metal "bumps" 442 that form a connection between the detector layer 430 and the readout pixels 446. A voltage 445 is applied between the aluminum detector layer 430 and a p-type silicon layer 444. As shown in FIG. 4, the p-type silicon layer 444 captures the electron / hole disturbances generated by the impinging primary electron beam 412, and a current is conveyed to the readout circuit layer 440 through the solder bumps 442. Unlike modern MAPS detectors used in electron microscopes, which allow the primary electrons to pass completely through the sensitive volume, HPDs attempt to stop the primary electrons in a relatively thick detector layer. Note that the dimensions of these detector layers are generally about 10 times larger than those of MAPS detectors.

[0008] Hybrid pixel detectors work best at lower electron energies (i.e., 120 keV or less) where the incident electrons can be stopped within the detector layer, but performance degrades as the energy is increased because the secondary charge cloud increases in volume and may completely penetrate the detection layer before the primary electron is stopped, thereby depositing less than its full energy. In recent years, there have been efforts to improve the performance of HPDs for high energy electrons (i.e., 200 keV or more) by using high-Z materials other than silicon (higher atomic numbers, e.g., germanium (Ge), gallium arsenide (GaAs), cadmium telluride (CdTe), and cadmium zinc telluride (CZT)) for the detection layer.

[0009] HPDs have two significant limitations that limit their usefulness in imaging methods such as cryo-EM. First, it is difficult in these sensors to account for detection events that spread across multiple pixels. The use of large (i.e., width >50 μm) pixels reduces the chance that a primary electron will deposit energy across multiple pixels, but it remains possible, especially if the primary electron interacts with the sensor near the boundary between two pixels. Large pixels are also required for HPDs to accommodate the space required by the readout electronics. Second, the use of large pixels in HPDs severely limits the overall size (total number of pixels) of the pixel array. Large arrays of HPDs require tiling of smaller devices, and at some point, the array becomes too large to be practical for electron microscopy. Current generations of HPDs are limited to approximately 0.5-1.0 megapixels, while MAP detectors achieve sizes up to 67 megapixels.

[0010] MAPS sensors, used at 200 keV and 300 keV, have been tested at lower energies, but the DQE is not high enough. The same is true for scintillator-coupled CCD and CMOS systems. HPDs have shown promise in the energy range of interest, but due to their pixel size, arrays on the order of 100 mm on a side would be required to give a 4 megapixel field of view, making them impractical due to both space constraints in an electron microscope and manufacturing costs.

[0011] Despite the shortage of high quality detectors, there is great interest in operating electron microscopes in the 60 kV to 120 kV range for both life and materials science research.

[0012] Back-illumination of electron microscope detectors has been used without removing the substrate, for example using a series of lens electrodes or scintillators to slow down the electrons before they reach the substrate (e.g., U.S. Patent Application Publication No. 2010 / 0123082).

[0013] For example, in materials science, the use of low energy electrons limits knock-on damage and allows for effective study of the structure of graphene. (See Bachmatiuk A, Zhao J, Gorantla SM, Martinez IGG, Wiedermann J, Lee C, Eckert J, Rummeli MH, "Low voltage transmission electron microscopy of graphene", Small 11(5):515-42 (2015).)

[0014] There is a growing push in the life sciences for effective, low-cost 100 kV cryo-EM instruments. A peer-reviewed paper by Nobel laureate Richard Henderson was recently published to demonstrate the high-resolution potential of such systems. However, the paper states that "currently, large numbers of pixels (>4 × 10 6 (Naydenova K, McMullan G, Peet MJ, Lee Y, Edwards PC, Chen S, Leahy E, Scotcher S, Henderson R, & Russo CJ, "CryoEM at 100 keV: demonstration and perspectives", IUCrJ 6(6):1086-1098 (2019), and Hand E, "We need a people's cryo-EM. Scientists hope to bring revolutionary microscope to the masses", Science (2020), available at www.sciencemag.org)

[0015] It is therefore an object of the present disclosure to provide devices, systems and methods for direct detection sensor and camera systems for high DQE imaging of electrons with energies in the range of 3 keV to 300 keV, and more specifically, electrons in the range of 40 keV to 120 keV, to meet the need for high speed, highly efficient detectors with a large number of pixels and high image resolution. [Prior art documents] [Patent documents]

[0016] [Patent Document 1] US Patent Application Publication No. 2010 / 0123082 [Non-patent literature]

[0017] [Non-Patent Document 1] Bachmatiuk A, Zhao J, Gorantla SM, Martinez IGG, Wiedermann J, Lee C, Eckert J, Rummeli MH, “Low voltage transmission electron microscopy of graphene”, Small 11(5):515-42 (2015) [Non-Patent Document 2] Naydenova K, McMullan G, Peet MJ, Lee Y, Edwards PC, Chen S, Leahy E, Scotcher S, Henderson R, & Russo CJ, "CryoEM at 100 keV: demonstration and perspectives", IUCrJ 6(6):1086-1098(2019), and Hand E, "We need a people's cryo-EM. Scientists hope to bring revolutionary microscope to the masses" Summary of the Invention [Problem to be solved by the invention]

[0018] This disclosure describes a direct detection sensor and camera system for high DQE imaging of electrons with energies in the range of 3 keV to 300 keV, and more specifically, electrons in the range of 40 keV to 120 keV. A camera is provided that is capable of imaging electrons in an electron microscope with high resolution and a wide field of view at electron beam energies that are scientifically interesting but have been difficult to use until now. The system also represents a practical approach for high volume, low cost manufacturing. [Means for solving the problem]

[0019] According to one embodiment, a method of forming a direct detector for imaging ionizing radiation in a transmission electron microscope is described, the method including the steps of forming a monolithic active pixel sensor in a CMOS image sensor process, the sensor including an epitaxial silicon layer disposed on a silicon substrate and a CMOS layer disposed on the epitaxial silicon layer; bonding a handling wafer material to a front side of the CMOS layer; removing the silicon substrate to expose a rear surface of the epitaxial silicon layer; selectively removing a first section of the handling wafer material from a sensing area of ​​the CMOS layer and leaving a second section of the handling wafer material around an outer periphery of the sensing area, the direct detector configured to be mounted in the transmission electron microscope by contacting only the second section, the direct detector further configured such that ionizing radiation enters only from the rear surface of the epitaxial silicon layer.

[0020] According to another embodiment, a direct detector for imaging ionizing radiation is described, the detector comprising a monolithic active pixel sensor including an epitaxial silicon layer disposed on a silicon substrate, a CMOS layer disposed on the epitaxial silicon layer, and a handling wafer bonded to a front side of the CMOS layer, wherein the silicon substrate is removed to a rear side of the epitaxial silicon layer, and a first section of the handling wafer is selectively removed from an area corresponding to the pixel sensor while leaving a second section of the handling wafer at an outer periphery of the sensor.

[0021] According to one embodiment, a method for detecting ionizing radiation in a transmission electron microscope includes the steps of: providing a monolithic active pixel sensor including an epitaxial layer disposed between a CMOS layer and a silicon substrate, where providing the monolithic active detector includes planarizing a front surface of the CMOS layer; bonding a handling wafer to the front surface of the CMOS layer; removing the silicon substrate to expose a rear surface of the epitaxial silicon layer; selectively removing a first section of the handling wafer from a sensing area of ​​the CMOS layer; and leaving a second section of the handling wafer around an outer periphery of the sensing area; mounting the detector to a transmission electron microscope; orienting the detector such that ionizing radiation enters the detector from the rear surface of the epitaxial silicon layer; and reading out a signal representative of the ionizing radiation from the detector.

[0022] The preceding paragraphs have been provided by way of general introduction and are not intended to limit the scope of the following claims. The described embodiments, together with further advantages, may best be understood by reference to the following detailed description taken in conjunction with the accompanying drawings, in which:

[0023] A more complete understanding of the present invention and many of the attendant advantages thereof will be readily obtained as the same becomes better understood by reference to the following detailed description when considered in conjunction with the accompanying drawings, in which: [Brief description of the drawings]

[0024] [Figure 1] FIG. 1 is a schematic cross-sectional view of a monolithic active pixel sensor. [Diagram 2] A thinned MAPS sensor showing the charge cloud generated by the incident primary electrons. [Diagram 3] The effect of the primary electron energy level on the secondary electron cloud size at 100 keV is shown. [Figure 4] FIG. 2 shows a schematic cross-sectional view of a hybrid pixel detector. [Diagram 5] 1 shows an electron detector fabricated in the epi layer of a silicon wafer. [Figure 6] 1 shows a silicon handling wafer bonded onto an electron detector. [Figure 7] The electron detector is shown after removal of the original substrate silicon leaving the back surface of the epilayer exposed, along with a handling wafer for mechanical support. [Figure 8] 13 shows the electron detector after selective removal of the handling wafer material. [Figure 9] 1 shows the electron detector back surface orientation relative to the primary electron beam. [Figure 10A] Shown is an image of a beam stop with a selected area (SA) aperture inserted in a TEM operated at 100 kV in electron counting mode. [Figure 10B] 1 shows images of a beam stop with a selected area (SA) aperture inserted in a TEM operating at 100 kV in electron counting mode, "A" for the whole image and "B" a zoomed-in view of the edge of the beam stop. [Figure 11A] 13 is a graph showing the MTF and DQE of a prototype sensor for 100 kV cryo-EM. [Figure 11B] 1 is a graph comparing the DQE of a prototype sensor at 100 kV with a conventional sensor at 300 kV. [Figure 12A] A resolution evaluation at 100 kV of a prototype sensor showing a Thon ring at 3.5 Å is shown. [Figure 12B] Figure 1 shows the Fourier transform of an image of a line grating replica grid collected under low-dose cryo-EM conditions in electron counting mode on a prototype sensor. [Figure 13A] 13 shows a cryo-EM micrograph of mouse heavy chain apoferritin collected at 100 kV with the prototype sensor, showing an area cropped from the final image. [Figure 13B] 13B shows a Fourier transform of the image in FIG. 13A. [Figure 13C] Illustrates a rotationally averaged power spectrum showing the Thon ringout to approximately 4 Å resolution. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0025] The terms "a" or "an," as used herein, are defined as one or more. The term "multiple," as used herein, are defined as two or more. The term "other," as used herein, are defined as at least a second or more. The terms "including" and / or "having," as used herein, are defined as comprising (i.e., open language). Throughout this document, references to "one embodiment," "particular embodiment," "one embodiment," "implementation," "one example," or similar terms mean that a particular feature, structure, or characteristic described in connection with an embodiment is included in at least one embodiment of the present disclosure. Thus, appearances of such phrases in various places throughout this specification do not necessarily all refer to the same embodiment. Furthermore, particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments, without limitation.

[0026] Because the sensing layer in the disclosed detector remains near the top surface (due to a back-surface illuminated (BSI) MAPS device), the sensor works well for low energy electrons (i.e., 1 keV-60 keV) and because the sensor is thin enough, it also works well for high energy electrons (i.e., 120 keV-300 keV). Thus, for the first time, a MAPS detector is described that is sensitive to the full range of electron energies commonly used in electron microscopy.

[0027] Back-thinned and back-illuminated have been used to detect visible and ultraviolet photons, and thinned and back-illuminated MAPS sensors have been tested to detect electrons with energies below about 25 keV. These sensors do not require removal of handling wafer material because the primary beam electrons do not penetrate beyond the thickness of the epilayer. However, these sensors do not work well at higher electron energies due to backscattering from the handling wafer material.

[0028] A high DQE is important in electron detectors used in electron microscopy. Current scintillator-coupled CCD or CMOS sensors and current direct detection MAPS sensors do not provide sufficient DQE.

[0029] Other requirements for detecting electrons in an electron microscope are for a large field of view with at least 4 megapixels, a physical size that fits into current microscope designs. Other concerns are minimizing conversion costs and total cost of ownership (TCO). HPD sensors offer high DQE, but cannot really meet these other requirements due to the large pixels required for these devices. Larger devices have several disadvantages, the two most important being that they do not fit easily into microscopes as they are currently designed and that they are more expensive. Two factors drive the cost, firstly, there are fewer devices that fit on a silicon wafer and secondly, the yield per device decreases as the area increases. The hybridization step also adds cost.

[0030] This disclosure describes a monolithic active pixel sensor fabricated in epi-silicon where all or essentially all of the substrate silicon is removed and the epi-silicon is oriented in the electron beam such that the primary beam electrons are incident on the epi-vacuum interface.

[0031] The device fabrication will now be described.

[0032] 5 shows the fabrication of a monolithic active pixel sensor on a standard epi-wafer that would typically be used in a CMOS image sensor process. For clarity, the CMOS circuitry layer 530, the 10 μm epitaxial layer 520, and the substrate layer 510 are shown in the inset.

[0033] Following device fabrication, the CMOS top surface is planarized and then bonded to a secondary handling wafer 650 as shown in Figure 6. Bonding such as oxide-to-oxide bonding may be used. As shown in the inset, the CMOS layer 630, the 10 μm epitaxial layer 620, and the substrate layer 610 remain in place.

[0034] Once the handle wafer is in place, the substrate silicon is partially or completely removed down to or near the epi-substrate bond using processes such as, for example, grinding followed by chemical mechanical polishing and / or chemical etching, resulting in the structure shown in Figure 7. The inset shows that the substrate layers have been removed, leaving the handling layer 750, the CMOS layer 730, and the 10 μm epitaxial layer 720. Optionally, a thin passivation layer can be added to the surface after removal of the substrate silicon.

[0035] FIG. 8 shows the next step where the handle wafer is selectively removed from areas adjacent to the array of pixels, leaving material 852 on the device periphery for strength. The thickness of material 852 is shown as d, which may be any thickness in the range of 1 micron to 800 microns. Processes such as grinding followed by selective chemical etching can be used. The handle wafer can be completely removed from behind the pixel array, as shown in the inset showing the CMOS layer 830 and the 10 μm epitaxial layer 820, or some material can be left behind to provide additional rigidity. A tradeoff is made between mechanical strength and the degree of electron backscattering.

[0036] The device is mounted by attaching a mounting structure to the remaining handle wafer material along the periphery so that the primary beam electrons 912 enter the device from the side with the epi layer 920 exposed, as shown in Figure 9, and then placed into the camera system. Secondary electrons generated in the epi layer 920 form tight groups as they enter the CMOS circuit layer 930. Backscattered electrons 916 in the handling wafer 950, which is 0 to about 20 μm thick, exit the device without being picked up by the photodiode.

[0037] The present disclosure uses a MAPS detector with backside illumination (BSI) once the substrate has been removed in combination with handling wafer removal from behind the active area to significantly reduce backscattering. This is the first known implementation of wafer removal behind a BSI MAPS device for detection of electrons.

[0038] Conventional MAPS detectors in electron microscopy use front surface illumination (FSI) where a portion of the substrate material is removed to reduce backscattering. These conventional detectors are on the order of 30 μm in thickness. The BSI MAPS detectors of the present disclosure provide high resolution low energy (<120 keV) electron imaging with a reduced thickness of about 10 μm to about 30 μm.

[0039] HPDs have also been proposed to detect electrons between 40 keV and 120 keV. In these detectors, electrons enter a detection layer that is designed to be thick enough to absorb them. Photogenerated electron-hole pairs are separated by an applied electric field, and the resulting current pulse is detected by adjacent bump-coupled readout CMOS circuitry. This differs from the architecture of MAPS detectors, which are monolithic and generally require that incident electrons pass through the sensor without being completely absorbed.

[0040] 2 and 9, microscopic electrons (212, 912) can enter the device either from the front side through the CMOS layer 230 or the back side 920. The electrons interact with silicon in the epitaxial silicon region 920 and generate conduction band electrons. Unlike photons, microscopic electrons carry much more energy and generate many conduction band electrons for each incident electron. The number of conduction band electrons generated depends on many factors, including the incident energy of the system (e.g., the microscopic electrons).

[0041] The FSI of the MAPS detector results in excessive electron scattering and backscattering when the primary beam energy is reduced below about 200 keV, resulting in a high DQE. To form the detector of the present disclosure that achieves the high DQE, BSI and handling wafer removal are used. Mechanical integrity is maintained by using a selective handling wafer removal technique that leaves material in the non-imaging areas of the device. The device is mounted and cooled through this more robust peripheral region. The detector of the present disclosure has high pixel density, provides a practical way to achieve a wide field of view for imaging at 40 keV to 120 keV with high DQE, and has a manufacturing cost similar to that of the MAPS detectors currently used at higher primary beam energies.

[0042] Furthermore, because the sensitive layer of the detector of the present disclosure remains near the top surface (because it is a BSI MAPS), the sensor works well for low energy electrons (i.e., 1 keV to 60 keV) and the sensor is thin enough that it also works well for high energy electrons (i.e., 60 keV to 300 keV). Thus, for the first time, a MAPS detector is described that is sensitive to the full range of electron energies commonly used in electron microscopy.

[0043] Finally, compared to HPDs, the small pixels of the disclosed detectors allow multiple devices to be formed on a single silicon wafer, thus enabling large pixel arrays within the space constraints of an electron microscope, minimizing manufacturing costs.

[0044] Two of the most important problems with conventional direct detection sensors at 100 kV were (1) low resolution due to increased scattering of 100 kV primary electrons in the sensor's sensing layer, and (2) high background noise due to backscattering of 100 keV primary electrons. The detector was tested with a 100 kV camera installed on a Thermo Fisher Talos TEM equipped with a field emission gun and aligned for 100 kV operation. FIG. 10A shows an image of the selected area (SA) aperture of the beam stop detected by the detector of the present disclosure installed on a Thermo Fisher Talos TEM operating at 100 kV. The image has sharp edges (no noticeable blurring at the edge of the beam stop) and only 0.05% backscattering (based on the relative counts under the beam stop that can only be due to backscattering). FIG. 10B is a close-up of the end of the beam stop.

[0045] To generate a quantitative assessment, the MTF 1152 and DQE 1154 of the prototype detector were calculated (FIG. 11A). The theoretical maximum MTF 1156 and theoretical maximum DQE 1158 are also plotted to compare the close response of the detector with the theoretical curves.

[0046] The MTF of a detector is a measure of its ability to transfer contrast from an object to an image with a particular resolution, i.e., the MTF determines how much of the original object contrast is preserved by the detector. In practice, the MTF is determined by acquiring one or more images of a straight ("knife") edge on the detector, calculating the line spread function (i.e., the amount of blur at the edge in the image), and transforming the calculated real-space line spread function into frequency space using a Fourier transform. The MTF is graphed as a normalized modulation versus spatial frequency at the inverse Nyquist limit. By definition, the value of the MTF at a spatial frequency of 0 is 1, but in the presence of long-range scattering in the detector, this can drop rapidly with increasing spatial frequency.

[0047] The MTF was calculated using eight images of the inserted beam stop, then collected in electron counting mode, where a total detected exposure of 52.3 electrons per pixel was spread across 5017 raw frames (resulting in a per frame exposure of 0.01 electrons per frame). Each image was processed independently (see, e.g., Ruskin, Yu, & Grigorieff, J Struct Biol 184:385-393 (2013), "FindDQE v.1.06"), and the resulting MTF curves were then averaged to generate the final MTF curve.

[0048] DQE is the input signal-to-noise ratio (S / N) in Output signal-to-noise ratio (S / N) for squared out It is defined as the ratio of the squares of the DQE and gives an indication of the quality with which the incident electrons are recorded. A perfect detector has a DQE of 1 at zero spatial frequency (DQI(0)), and to achieve this, all incident electrons must be detected with equal weighting. The DQE of a real detector is always less than 1, reflecting the fact that in practice incident electrons are recorded with different weights. We calculated (DQE(0)) in several steps:

[0049] First, we plotted histograms of the total integrated intensity of each detected event from raw integration mode frames collected from an empty sample area. A total of 3,664,451 events were analyzed from a 256 × 256 region of interest in the center of the sensor. The histograms were fitted to a Landau distribution using a curve fitting function. (See, e.g., Landau, J Phys USSR 8:201 (1944); scipy.optimize.curve_fit function, SciPy.org, Release 1.5.2, July 23, 2020, available at docs.scipy.org). The fraction of incident electrons missed by the detector was estimated to be below the detector's counting threshold using the integrated area under the fitted Landau curve. This means that 2.69% of the incident electrons were missed by the detector, a fraction of electrons that deposited little energy in the sensor's sensing layer and were therefore below the sensor's noise level. The fitted Landau curve therefore implies that 97.3% of the incident 100 keV electrons were detected by the sensor.

[0050] Second, the total number of detected events under the beam stop was compared to the illuminated area of ​​the sensor. To reduce diffuse scattering in the perimeter TEM and camera instruments, this data was collected with the SA aperture of the TEM inserted such that the illuminated area was smaller than the sensor. A 256 × 256 area under the beam stop had 1,981 detected events, while a 256 × 256 area in the illuminated area in the same data set had 3,664,451 detected events. The ratio of these values ​​means that 0.054% of the 100 keV primary electrons are backscattered in the camera resulting in false secondary detections.

[0051] Therefore, the detected exposure rate on the sensor was adjusted by dividing by 97.3% and multiplying by [100% - 0.054%] to account for miss- and backscattered electrons, respectively. The final calibrated exposure rate was 53.7 electrons per pixel per frame.

[0052] Finally, the DQE(0) was calculated using a noise binning method (see, e.g., McMullan, Chen, Henderson, & Faruqi, Ultramicroscopy 109:1126-1143 (2009)).

[0053] The final DQE curve was calculated by multiplying DQE(0) by the MTF squared. Note that the noise power spectrum (NPS) has no effect since it is unity for all spatial frequencies in the electron counting MAPS detector in the absence of coincidence losses. (See, e.g., Li, Zheng, Egami, Agard, & Cheng, J Struct Biol 184:251-260 (2013)).

[0054] Figure 11B shows that the performance of the cryo-EM prototype sensor at 100 kV (line 1162) closely matches that of a conventional detector (Gatan K 2-Summit) at 300 kV in terms of maximum DQE (line 1166). The DQE of the conventional detector at 300 kV (line 1164) was taken from McMullan, Faruqi, Clare, & Henderson, Ultramicroscopy 147:156-163 (2014). The results clearly demonstrate the high performance of the prototype sensor at 100 kV.

[0055] The contrast transfer function (CTF) is a mathematical description of the imaging process in a TEM expressed in Fourier space. An image of a carbon film under low-dose cryo-EM conditions at 100 kV using a prototype sensor shows Thon rings at a resolution of up to about 3.5 Angstroms and is shown in FIG. 12A. The Fourier transform of the detected power spectrum 1260 is compared to the CTF model 1262 and the quality of the fit 1264 is shown in FIG. 12B.

[0056] FIG. 13A shows that an image of frozen hydrated apoferritin (a standard cryo-EM sample) shows high contrast and high resolution, as expected from the DQE curve. The nominal magnification of the microscope was 73,000x, resulting in a sampling of 1.37 Å / pixel. The total exposure was about 40 e- / Å2. FIG. 13B shows the Fourier transform of the detected power spectrum 1360 compared to the CTF model 1362. The quality of the fit 1364 is indicated. FIG. 13C illustrates the rotationally averaged power spectrum showing Thon ring-out to a resolution of about 4.

[0057] Moreover, the embodiments of the present disclosure may be as described in the following parentheses.

[0058] (1) A method of forming a direct detector for imaging ionizing radiation in a transmission electron microscope is described, the method including the steps of forming a monolithic active pixel sensor in a CMOS image sensor process, the sensor including an epitaxial silicon layer disposed on a silicon substrate and a CMOS layer coated on the epitaxial silicon layer; bonding a handling wafer material to a front side of the CMOS layer; removing the silicon substrate to expose a rear surface of the epitaxial silicon layer; and selectively removing a first section of the handling wafer material from a sensing area of ​​the CMOS layer and leaving a second section of the handling wafer material around an outer periphery of the sensing area, the direct detector configured to be mounted in the transmission electron microscope by contacting only the second section, the direct detector further configured such that ionizing radiation enters only from the rear surface of the epitaxial silicon layer.

[0059] (2) The method of (1), further comprising the steps of removing a first portion of the silicon substrate by a grinding process and removing a remaining portion of the silicon substrate by chemical etching.

[0060] (3) The method of (1), further comprising the step of removing the first section of the handling wafer by selective chemical etching.

[0061] (4) The method of (1), further comprising the steps of forming a photodiode in the epitaxial silicon layer; and forming a floating diffusion region in the epitaxial silicon layer.

[0062] (5) Any of the methods of (1) to (4), further comprising the steps of forming a metallization pattern on the CMOS layer, the metallization pattern including a photodiode contact, a floating diffusion contact, and a gate contact, and connecting the floating diffusion contact to a readout circuit.

[0063] (6) Any of the methods of (1) to (5), further comprising the step of planarizing the front surface of the CMOS layer prior to bonding of the handling wafer.

[0064] (7) Any of the methods of (1) to (6), further comprising the step of bonding a handling wafer material to the front side of the CMOS layer by an oxide-to-oxide bond.

[0065] (8) Any of the methods (1) to (7), further comprising the step of disposing the epitaxial layer to a thickness of between 4 μm and 20 μm.

[0066] (9) A direct detector for imaging ionizing radiation, the detector comprising a monolithic active pixel sensor including an epitaxial silicon layer disposed on a silicon substrate, a CMOS layer disposed on the epitaxial silicon layer, and a handling wafer bonded to a front side of the CMOS layer, wherein the silicon substrate is removed to a back side of the epitaxial silicon layer, and a first section of the handling wafer is selectively removed from an area corresponding to the pixel sensor while leaving a second section of the handling wafer at an outer periphery of the sensor.

[0067] (10) A direct detector of (9), in which the epitaxial layer has a thickness of about 4 μm to 20 μm.

[0068] (11) The direct detector of either (9) or (10), wherein the monolithic active pixel sensor further includes a depletion region in the epitaxial silicon layer, a photodiode in the depletion region, a pinned layer on the photodiode, and a floating diffusion region in the epitaxial silicon layer.

[0069] (12) The epitaxial layer is a p-type silicon layer, the photodiode is an n-type photodiode buried in the depletion region, and the pinned layer is a p ++ 14. A direct detector of any of (9) through (11), wherein the n-type silicon is n-type silicon and the floating diffusion region is n-type silicon material.

[0070] (13) Any of the direct detectors of (9) to (12), wherein the CMOS layer includes a metallization pattern on a front side of the CMOS layer including a photodiode contact, a floating diffusion region contact, and a gate contact, and a readout circuit connected to the floating diffusion region contact.

[0071] (14) A direct detector of any of (9) to (13), configured to be mounted in a transmission electron microscope in an orientation such that ionizing radiation enters the detector from a rear surface of the epitaxial silicon layer.

[0072] (15) A method for detecting ionizing radiation in a transmission electron microscope, comprising the steps of: providing a monolithic active pixel sensor including an epitaxial layer disposed between a CMOS layer and a silicon substrate, wherein providing the monolithic active detector comprises the steps of planarizing a front surface of the CMOS layer; bonding a handling wafer to the front surface of the CMOS layer; removing the silicon substrate to expose a rear surface of the epitaxial silicon layer; selectively removing a first section of the handling wafer from a sensing area of ​​the CMOS layer; and leaving a second section of the handling wafer around an outer periphery of the sensing area; mounting the detector in a transmission electron microscope; orienting the detector such that ionizing radiation enters the detector from the rear surface of the epitaxial silicon layer; and reading out a signal representative of the ionizing radiation from the detector.

[0073] (16) The method according to (15), wherein the ionizing radiation is electrons having an energy of 40 keV to 120 keV.

[0074] (17) The method according to (15), wherein the ionizing radiation is electrons having an energy of 0 keV to 100 keV.

[0075] (18) The method according to (15), wherein the ionizing radiation is electrons having an energy of 0 keV to 300 keV.

[0076] (19) The method according to (15), wherein the ionizing radiation is electrons having an energy of 0 keV to 30 keV.

[0077] (20) The method of (15), wherein the ionizing radiation is electrons having an energy of 100 keV.

[0078] The foregoing description discloses and describes exemplary embodiments of the present invention. As will be understood by those skilled in the art, the present invention may be embodied in other specific forms without departing from its spirit or essential characteristics. Accordingly, the disclosure of the present invention is intended to be illustrative, but not limiting, of the scope of the present invention, as well as the scope of the other claims. The disclosure defines in part the scope of the preceding claim terms, including any readily identifiable variations of the teachings herein, so that the subject matter of the invention is not solicited by the public.

Claims

1. 1. A method of forming a direct detector for imaging ionizing radiation in a transmission electron microscope, comprising: forming a monolithic active pixel sensor in a CMOS image sensor process, the sensor including an epitaxial silicon layer disposed on a silicon substrate, and a CMOS layer disposed on the epitaxial silicon layer; bonding a handling wafer material to the front side of the CMOS layer; removing the silicon substrate to expose a rear surface of the epitaxial silicon layer; selectively removing a first section of the handling wafer material from a sensing area of ​​the CMOS layer and leaving a second section of the handling wafer material around a periphery of the sensing area; Including, the direct detector is configured to be mounted to the transmission electron microscope by contacting only the second section; the direct detector is further configured such that the ionizing radiation enters only from the back surface of the epitaxial silicon layer. method.

2. removing a first portion of the silicon substrate by a grinding process; removing remaining portions of the silicon substrate by chemical etching; The method of claim 1 further comprising:

3. removing the first section of the handle wafer by selective chemical etching; The method of claim 1 further comprising:

4. forming a photodiode in the epitaxial silicon layer; forming a floating diffusion region in the epitaxial silicon layer; The method of claim 1 further comprising:

5. forming a metallization pattern on the CMOS layer, the metallization pattern including a photodiode contact, a floating diffusion contact, and a gate contact; connecting the floating diffusion contact to a readout circuit; The method of claim 4 further comprising:

6. planarizing the front surface of the CMOS layer prior to the bonding of the handle wafer; The method of claim 1 further comprising:

7. 2. The method of claim 1, wherein the bonding of the handling wafer material to the front side of the CMOS layer is by oxide-to-oxide bonding.

8. The method of claim 1 , wherein the epitaxial layer is deposited to a thickness of between 4 μm and 20 μm.

9. 1. A direct detector for imaging ionizing radiation, said detector comprising: a monolithic active pixel sensor including an epitaxial silicon layer disposed on a silicon substrate and a CMOS layer disposed on the epitaxial silicon layer; a handle wafer bonded to the front side of the CMOS layer; Equipped with the silicon substrate is removed to a rear surface of the epitaxial silicon layer; a first section of the handle wafer is selectively removed from an area corresponding to the pixel sensor while leaving a second section of the handle wafer around an outer periphery of the pixel sensor; Direct detector.

10. The direct detector of claim 9, wherein the epitaxial layer has a thickness of about 4 μm to 20 μm.

11. The monolithic active pixel sensor comprises: a depletion region in the epitaxial silicon layer; a photodiode within the depletion region; a pinned layer on the photodiode; a floating diffusion region in the epitaxial silicon layer; The direct detector of claim 9 further comprising:

12. the epitaxial layer is a p-type silicon layer, the photodiode is an n-type photodiode with a buried depletion region; The pinned layer is p ＋＋ It is a mold silicon, the floating diffusion region is an n-type silicon material; A direct detector as claimed in claim 11.

13. The CMOS layer includes: a metallization pattern on the front side of the CMOS layer, the metallization pattern including a photodiode contact, a floating diffusion region contact, and a gate contact; a readout circuit connected to the floating diffusion region contact; The direct detector of claim 11 , comprising:

14. 10. The direct detector of claim 9, wherein the direct detector is configured to be mounted in a transmission electron microscope with an orientation such that ionizing radiation enters the detector from the back surface of the epitaxial silicon layer.

15. 1. A method for detecting ionizing radiation in a transmission electron microscope, comprising: providing a monolithic active pixel sensor including an epitaxial layer disposed between a CMOS layer and a silicon substrate, the monolithic active detector further including a handle wafer bonded to a front side of the CMOS layer, the silicon substrate being removed to expose a rear side of the epitaxial silicon layer, and a first section of the handle wafer being selectively removed from a sensing area of ​​the CMOS layer while leaving a second section of the handle wafer around an outer periphery of the sensing area; mounting the detector on the transmission electron microscope; orienting the detector such that the ionizing radiation enters the detector from the back surface of the epitaxial silicon layer; reading out a signal representative of the ionizing radiation from the detector; The method includes:

16. 16. The method of claim 15, wherein the ionizing radiation is electrons having an energy between 40 keV and 120 keV.

17. 16. The method of claim 15, wherein the ionizing radiation is electrons having an energy between 0 keV and 100 keV.

18. 16. The method of claim 15, wherein the ionizing radiation is electrons having an energy between 0 keV and 300 keV.

19. 16. The method of claim 15, wherein the ionizing radiation is electrons having an energy between 0 keV and 30 keV.

20. 16. The method of claim 15, wherein the ionizing radiation is electrons having an energy of 100 keV.

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