Device with multi-channel imaging device and multi-aperture imaging device

The multi-aperture imaging device addresses miniaturization challenges by using multiple optical channels and beam deflection to capture high-quality images efficiently, optimizing space utilization and image capture.

JP7780496B2Active Publication Date: 2025-12-04FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EV
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Patent Information

Application Number
JP2023205731
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2019-06-06
Filing Date
2023-12-06
Publication Date
2025-12-04
Estimated Expiration
2040-06-05

AI Technical Summary

Technical Problem

Conventional cameras are limited in miniaturization due to transmitting the entire field of view within a single channel, which compromises image quality and space efficiency.

Method used

A multi-aperture imaging device that captures the entire field of view by using multiple optical channels and beam deflection means, allowing for high-capacity image quality while minimizing space, utilizing different wavelength ranges and beam deflection regions to optimize image capture.

Benefits of technology

Enables high-quality image capture of the entire field of view with reduced device size, incorporating depth information without stereo channels and minimizing occlusions.

✦ Generated by Eureka AI based on patent content.

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Abstract

To provide a multi-aperture imaging device that simultaneously enables large capacity image quality and a small installation space for the multi-aperture imaging device.SOLUTION: A multi-aperture imaging device includes image sensor means having: a plurality of image sensor regions 44a, 44b, 44c; and a plurality of optical channels 42a, 42b, 42c. In this case, each optical channel includes an optical system for imaging partial fields of view 64a, 64b of an overall field of view onto the image sensor region of the image sensor means associated with the optical channel. The plurality of optical channels are configured to completely image an overall field of view 60. A first partial field of view of the overall field of view and a second partial field of view of the overall field of view are captured by different numbers of optical channels.SELECTED DRAWING: Figure 6b
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Description

[Technical Field]

[0001] The present invention relates to a multi-channel imaging device and to a device having a multi-channel imaging device.The present invention further relates to a portable device having a multi-aperture imaging device. [Background technology]

[0002] Conventional cameras transmit the entire field of view within a single channel, limiting their miniaturization. Mobile devices such as smartphones employ two cameras, oriented in the direction of the surface normal of the display and facing it. Summary of the Invention [Problem to be solved by the invention]

[0003] Therefore, a concept that allows a miniaturized device to capture the entire field of view while still maintaining high image quality is desirable. SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide a multi-aperture imaging device that simultaneously enables high-capacity image quality and a small installation space for the multi-aperture imaging device. [Means for solving the problem]

[0004] This object is achieved by the subject matter of the independent claims.

[0005] The central idea of ​​the present invention is to find that the above objectives can be achieved in that, in order to combine partial images of the overall image, it is sufficient to determine depth information for the part of the overall image that is to be added to the reference part, and that stereo information is not absolutely essential for the reference part, which makes it possible to omit a channel and at the same time avoid occlusions for the image part that is to be modified.

[0006] According to one embodiment, a multi-aperture imaging device includes an image sensor means having a plurality of image sensor areas and a plurality of optical channels, where each optical channel includes an optical system for imaging a subfield of a total field of view onto an image sensor area of ​​the image sensor means associated with the optical channel. The plurality of optical channels are configured to image the total field of view. A first subfield of the total field of view and a second subfield of the total field of view are captured by different numbers of optical channels. Further advantageous embodiments are the subject matter of the dependent claims. Preferred embodiments of the present invention will now be described with reference to the accompanying drawings. [Brief explanation of the drawings]

[0007] [Figure 1] 1 is a schematic perspective view of a device according to one embodiment. [Figure 2] 10 is a schematic diagram of a main surface of a device according to a further embodiment. [Figure 3a] 3A and 3B show the state of the beam deflection means and the diaphragm in a first operating state according to an embodiment; [Figure 3b] FIG. 2 shows the beam deflection means and the diaphragm in a second operating state. [Figure 4a] 1 shows a schematic diagram of a beam deflection means according to one embodiment, said beam deflection means comprising a plurality of beam deflection regions. [Figure 4b] 4b is a schematic diagram of a beam deflection means according to an alternative configuration to FIG. 4a and according to an embodiment; [Figure 4c] 1 shows an advantageous implementation of a beam deflection means of an imaging device according to one implementation. [Figure 4d] 1 shows an advantageous implementation of a beam deflection means of an imaging device according to one implementation. [Figure 4e] 1 shows an advantageous implementation of a beam deflection means of an imaging device according to one implementation. [Figure 4f] 1 shows an advantageous implementation of a beam deflection means of an imaging device according to one implementation. [Figure 4g] 1 shows an advantageous implementation of a beam deflection means of an imaging device according to one implementation. [Figure 4h] 1 shows an advantageous implementation of a beam deflection means of an imaging device according to one implementation. [Figure 5a] 1 is a schematic perspective view of an imaging device according to an embodiment. [Figure 5b] 1 is a schematic perspective view of a multi-aperture imaging device according to an embodiment, comprising illumination means configured to emit a temporal or spatial illumination pattern; [Figure 5c] 1 is a schematic cross-sectional side view of a modified imaging device in which the beam deflection means is rotatably switchable between a first position and a second position in a first operating state; [Figure 6a] 1 is a schematic diagram of a full field of view that includes four overlapping partial fields of view. [Figure 6b] FIG. 6b shows a different distribution of the overall field of view from FIG. 6a, where the partial fields of view are captured twice and the partial fields of view are adjacently arranged along a first direction. [Figure 6c] FIG. 6b shows a differently distributed overall field of view from FIG. 6a, where the partial fields of view are captured twice and the partial fields of view are adjacently arranged along a second direction. [Figure 7a] 1 is a schematic perspective view of a device including two multi-aperture imaging devices for capturing a full field of view in stereo, according to one embodiment. FIG. [Figure 7b] FIG. 1 is a schematic perspective view of a device including two multi-aperture imaging devices according to an embodiment configured to generate depth information from capture in one of a wavelength range instead of stereoscopic capture. [Figure 7c] 1 is a schematic perspective view of a preferred implementation of a multi-aperture imaging device according to one embodiment, including a single direction of view; [Figure 8] FIG. 1 shows a schematic structure including a first multi-aperture imaging device and a second multi-aperture imaging device with a shared image sensor. [Figure 9a]1 is a schematic diagram of a multi-aperture imaging device according to an embodiment using different wavelength ranges. [Figure 9b] 1 is a schematic diagram of a multi-aperture imaging device according to an embodiment using different wavelength ranges. [Figure 9c] 1 is a schematic diagram of a multi-aperture imaging device according to an embodiment using different wavelength ranges. [Figure 9d] 1 is a schematic diagram of a multi-aperture imaging device according to an embodiment, using different wavelength ranges; and [Figure 10] FIG. 2 shows a schematic graph of sensitivity of an image sensor area of ​​an image sensor of a multi-aperture imaging device across wavelengths in a first wavelength range and a second wavelength range, according to an embodiment. [Figure 11a] 1 is a schematic perspective view of a multi-aperture imaging device according to one embodiment for capturing the entire field of view, having three optical channels; [Figure 11b] 11b is a schematic top view of the multi-aperture imaging device of FIG. 11a and a schematic diagram of the overall field of view. [Figure 12a] 11b shows a schematic perspective view of a multi-aperture imaging device according to an embodiment, in which the optical arrangement of the optical channels is modified compared to the multi-aperture imaging device of FIG. 11a. [Figure 12b] FIG. 12b shows a schematic top view of the multi-aperture imaging device of FIG. 12a together with an illustration of the overall field of view. [Figure 13a] 1A-1C are schematic top views of multi-aperture imaging devices according to embodiments, each configured to capture two overlapping fields of view. [Figure 13b] 1A-1C are schematic top views of multi-aperture imaging devices according to embodiments, each configured to capture two overlapping fields of view. [Figure 13c] 1A-1C are schematic top views of multi-aperture imaging devices according to embodiments, each configured to capture two overlapping fields of view. [Figure 13d] 1A-1C are schematic top views of multi-aperture imaging devices according to embodiments, each configured to capture two overlapping fields of view. [Figure 14] FIG. 1 shows a schematic top view of a multi-aperture imaging device according to one embodiment, where the optical channels are arranged in two opposing optical channels. [Figure 15] 1 is a schematic top view of an array of optical channels according to one embodiment, comprising an intersubstrate for several optical channels; DETAILED DESCRIPTION OF THE INVENTION

[0008] Before the embodiments of the present invention are described in more detail below with reference to the drawings, it should be noted that elements, objects and / or structures that are identical and have the same function or operation will be given the same reference numerals in the various figures, and therefore the descriptions of said elements presented in different embodiments are interchangeable and / or mutually applicable.

[0009] The following embodiments relate to the use of different wavelength ranges for imaging on an image sensor. The wavelength ranges relate to electromagnetic radiation, particularly light. For example, one example of a different wavelength range is the use of visible light, for example, in the wavelength range from about 380 nm to about 650 nm. For example, the different wavelength ranges may be the ultraviolet spectrum with wavelengths less than 380 nm and / or the infrared spectrum with wavelengths greater than 700 nm, from about 1000 nm to about 1000 μm, particularly the near-infrared spectrum with wavelengths ranging from about 700 nm or 780 nm to about 3 μm. The first wavelength range and the second wavelength range include at least partially different wavelengths. According to one embodiment, the wavelength ranges do not include any overlap. However, according to an alternative embodiment, the wavelength ranges overlap, but only partially, so that wavelengths that allow for differentiation are present in both ranges.

[0010] The following embodiments relate to a beam deflection region of the beam deflection means. The beam deflection region may be a surface area or region of an object configured to deflect the optical path within at least one wavelength range. It may be a series of at least one applied layer, such as a dielectric layer, as well as a series of conductive layers that provide or adjust reflectivity. This may be an electrically passive or active characteristic.

[0011] In the embodiments described below, reference is made to a primary surface and a secondary surface of a device. In the embodiments described herein, a primary surface of a device may be understood to be a surface of a housing or device that is larger or has the largest dimension compared to other surfaces. For example, although this does not have any limiting effect, a first primary surface may designate the front side and a second primary surface may designate the rear side. A secondary surface may be understood to mean a surface or face that connects the primary surfaces to each other.

[0012] Although the embodiments described below relate to portable devices, the described aspects can be easily transferred to other mobile or non-mobile devices. It is understood that the described portable devices may be installed within other devices, for example, within a vehicle. Furthermore, the housing of the device may be configured to be non-portable. This is why the implementations described below are not intended to be limited to portable devices, but may refer to any implementation of a device.

[0013] FIG. 1 shows a schematic perspective view of a portable device 10 according to one embodiment. The portable device 10 includes a housing 12 including a first transparent region 14a and a second transparent region 14b. For example, the housing 12 may be formed of opaque plastic, metal, or the like. The transparent regions 14a and / or 14b may be integrally formed with the housing 12 or may be formed in multiple parts. The transparent regions 14a and / or 14b may be recessed portions of the housing 12. Alternatively, a transparent material may be disposed in the recessed portions or within the regions of the transparent regions 14a and / or 14b. The transparent material of the transparent regions 14a and / or 14b may be transparent at least within the wavelength range of electromagnetic radiation received by the imaging device, particularly the multi-aperture imaging device 16, or its image sensor. This means that the transparent regions 14a and / or 14b may be configured to be partially or completely opaque in wavelength ranges different from the former. For example, imaging device 16 may be configured to capture a first wavelength range and a second wavelength range, such as the visible wavelength range, and a wavelength range that is at least partially different therefrom.

[0014] An imaging device or multi-aperture imaging device 16 is disposed inside the housing 12. The imaging device 16 includes a beam deflection means 18 and an image capture means 19. The image capture means 19 may include two or more optical channels, each equipped with one or more optics for modifying (e.g., concentrating, focusing, or scattering) the optical path of the imaging device 16, and an image sensor. The optics may be separate, non-separate, or channel-specific for the different optical channels. Alternatively, the optics may include elements that work together for two, several, or all optical channels, such as a converging lens combined with a channel-specific lens, a reciprocal filter, etc.

[0015] For example, the image capture means 19 may include one or more image sensors whose assigned optical paths are directed onto the beam deflection means 18 through one or more optical channels and deflected by the beam deflection means. As explained in the context of FIG. 6a, at least two optical channels may be deflected to capture overlapping partial fields of view (partial object areas) of the entire field of view (total object area). The imaging device 16 may be referred to as a multi-aperture imaging device. Each image sensor area of ​​the image sensor may be assigned to an optical channel. A structural gap may be arranged between adjacent image sensor areas, or the image sensor areas may be implemented as or part of different image sensors. Alternatively or additionally, adjacent image sensor areas may directly border each other and be separated from each other through the readout of the image sensor.

[0016] The portable device 10 has a first operating state and a second operating state. The operating state can be correlated with the location, position, or orientation of the beam deflection means 18. This can affect which wavelength ranges are deflected by the beam deflection means 16 by using surfaces with different deflection effectiveness. Alternatively, or additionally, the two different operating states can affect the direction in which the optical path is deflected. In an exemplary multi-aperture imaging device 16, there may be four operating states, for example, two for two different viewing directions and two for different wavelength ranges. One reason for this is that the beam deflection means 16 includes a first beam deflection region operable for a first wavelength range of electromagnetic radiation passing through the optical channel and a second beam deflection region operable for a second wavelength range of electromagnetic radiation passing through the optical channel, the second wavelength range being different from the first wavelength range.

[0017] With respect to the field of view direction, in a first operating state, the beam deflection means 18 may deflect the optical path 22 of the imaging device 16 so that the optical path passes through the first transparent region 14a, as shown by optical path 22a. In a second operating state, the beam deflection means 18 may be configured to deflect the optical path 22 of the imaging device 16 so that the optical path passes through the second transparent region 14b, as shown by optical path 22b. This may also be understood to mean that the beam deflection means 18 directs the optical path 22 to pass through one of the transparent regions 14a and / or 14b at a certain time and based on the operating state. Based on the operating state, the position of the field of view (object region) captured by the imaging device 16 may be arranged in a spatially varying manner.

[0018] A first beam deflection region operable for a first wavelength range and a second beam deflection region operable for a second wavelength range may be alternately used to deflect the optical path of the optical channel, i.e., optical path 22. This allows the portion of the spectrum in which the beam deflection region operates to be directed to the image sensor. For example, the beam deflection region may have a band-pass function, which deflects, i.e., reflects, the wavelength range for which the band-pass function is configured, while other wavelength ranges are suppressed, eliminated, or at least strongly attenuated, for example, by at least 20 dB, at least 40 dB, or at least 60 dB.

[0019] The beam deflection regions may be arranged on the same side of the beam deflection means 18, providing the advantage of a beam deflection means that can be displaced in a translational manner. Alternatively or additionally, different beam deflection regions may be arranged on different sides of the beam deflection means 18, and the regions may alternately face the image sensor based on the rotational movement of the beam deflection means 18. In this case, any tilt angle may be used. However, when using two possible opposite viewing directions of the multi-aperture imaging device 16, it is advantageous to select an angle of approximately 45°, so that a rotational movement of 90° is sufficient to change the viewing direction. On the other hand, with only one viewing direction, an additional degree of freedom may be selected.

[0020] By alternately orienting the different beam deflection regions to face, the multi-aperture imaging device is configured to capture a first capture of the entire field of view with the image sensor using a first beam deflection region, where the first capture is based on a first wavelength range, and to capture a second capture of the entire field of view with the image sensor using a second beam deflection region, where the second capture is based on a second wavelength range, so that the entire field of view for each field of view direction may be captured with a different wavelength range. Thus, for example, wavelength ranges invisible to the human eye may be used to obtain additional image information, such as a depth map.

[0021] The portable device 10 may include a first diaphragm 24a and a second diaphragm 24b. The diaphragm 24a is disposed within the transparent region 14a and configured to at least partially optically block the transparent region 14a when the diaphragm 24a is in a closed state. According to one embodiment, the diaphragm 24a is configured to completely block the transparent region 14a or at least 50%, 90%, or at least 99% of the surface area of ​​the transparent region 14a when the diaphragm is in a closed state. The diaphragm 24b is configured to block the transparent region 14b in the same or similar manner as described for the diaphragm 24a with respect to the transparent region 14a. In a first operating state in which the beam deflecting means 18 deflects the optical path 22 toward the optical path 22a, the diaphragm 24b may at least partially optically block the transparent region 14b such that little, or in some cases no, stray light enters the housing 12 through the transparent region 14b. This reduces the effect of stray light incident on diaphragm 14b on capturing the field of view in the first operating state. For example, in the second operating state in which optical path 22b exits housing 12, diaphragm 24a may at least partially optically block transparent region 14a. Simply put, diaphragms 24a and / or 24b may be configured to block transparent region 14a and / or 14b so that little or no stray light enters through such region from undesired directions (e.g., directions from which the captured field of view is not located). Diaphragms 24a and / or 24b may be configured to be continuous and, in each case, may be arranged for all optical channels of imaging device 16. This means that, depending on the respective operating state, diaphragms 24a and 24b can be used by any of the optical channels of the multi-aperture imaging device. According to one embodiment, instead of individual circular diaphragms for each optical channel, one diaphragm 24a or 24b is arranged to be used by all of the optical channels.Diaphragms 24a and / or 24b may have a rectangular, oval, circular or elliptical shape, for example, to fit polygonal constraints.

[0022] Switching between the first and second operating states may involve, for example, a movement of the beam deflection means 18 based on a translational movement 26 and / or based on a rotational movement 28 .

[0023] The diaphragms 24a and / or 24b may be configured, for example, as mechanical diaphragms. Alternatively, the diaphragms 24a and / or 24b may be configured as electrochromic diaphragms. This allows for the use of a reduced number of mechanically moving parts. Furthermore, configuring the diaphragms 24a and / or 24b as electrochromic diaphragms allows for noiseless opening and / or closing of the transparent regions 14a and / or 14b and an implementation that can be easily integrated into the optical system of the portable device 10. For example, the diaphragms 24a and / or 24b may be configured to have little optical difference from the housing 12, so that they are barely perceptible or not perceptible at all by a user when in the closed state.

[0024] The housing 12 may be configured to be flat. For example, the major surfaces 13a and / or 13b may be spatially arranged in the x / y plane or a plane parallel thereto. The secondary surfaces 15a and / or 15b located between the major surfaces 13a and 13b may be spatially arranged so that they are oblique or perpendicular to the major surfaces, and the major surfaces 13a and / or 13b and / or the secondary surfaces 15a and / or 15b may be configured to be curved or planar. For example, the extension of the housing 12 along the first housing direction z between the major surfaces 13a and 13b may be small compared to the further dimension of the housing 12 along the further extension, i.e., along the extension direction of the major surfaces 13a and / or 13b, in a manner parallel or anti-parallel to the surface normal of the display of the portable device 10. The secondary surfaces 15a and 15b may be parallel or anti-parallel to the surface normal of the display. The main surfaces 13a and / or 13b may be arranged spatially perpendicular to the surface normal of the display of the portable device 10. Thus, for example, the extension of the housing along the x and / or y direction may be at least three times, at least five times, or at least seven times the extension of the housing 12 along the first extension z. In simple terms, however, and without limiting effect, the extension z of the housing may be understood to be the thickness or depth of the housing 12.

[0025] FIG. 2 shows a schematic diagram of a main surface of a portable device 20 according to one embodiment. The portable device may include device 10. Portable device 20 may include a display 33, e.g., a screen. For example, device 20 may be a portable communication device, such as a mobile phone (smartphone), a tablet computer, a portable music player, a monitor, or a visual display unit, equipped with an imaging device 16. Transparent region 14a and / or transparent region 14b may be disposed within the region of housing 12 where display 33 is disposed. This means that diaphragms 24a and / or 24b may be disposed within the region of display 33. For example, transparent region 14a and / or 14b and / or diaphragms 24a and / or 24b may be hidden by display 33. Display information may be presented at least periodically in the region of display 33 where diaphragms 24a and / or 24b are disposed. The presentation of information may be any operation of portable device 20. For example, a viewfinder function may be presented on the display 33, where a field of view sampled or captured by an imaging device inside the housing 12 may be presented. Alternatively or additionally, an already captured image or any other information may be presented. Simply put, the transparent region 14a and / or the diaphragm 24a may be hidden by the display 33, such that the transparent region 14a and / or the diaphragm 24a are barely perceptible or cannot be perceived during operation of the portable device 20.

[0026] The transparent regions 14a and 14b may be disposed in at least one major surface 13a of the housing 12 and / or in the opposite major surface, respectively. Simply stated, the housing 12 may have a front transparent region and a rear transparent region. In this regard, it should be noted that the terms front and rear may be randomly replaced by other terms, such as left and right, top and bottom, etc., without limiting any of the embodiments described herein. According to further embodiments, the transparent regions 14a and / or 14b may be disposed on the secondary side. The location of the transparent regions may be arbitrary and / or may depend on the direction in which the optical path of the optical channel can be deflected.

[0027] In the region of transparent region 14a or diaphragm 24a, display 33 may be configured to be periodically deactivated, for example, while an image is being captured using the imaging device, or to increase the transparency of display 33 beyond housing 12. Alternatively, display 33 may also remain active in this region, for example, if display 33 emits no or little electromagnetic radiation in the relevant wavelength range into the interior of portable device 20 and / or into housing 12, or toward imaging device 16.

[0028] 3a shows, for example, the states of the beam deflection means 18 and the multi-aperture imaging device associated with the operating states of the first diaphragm 24a and the second diaphragm 24b. For example, the beam deflection means 18 deflects the optical path 22 at the beam deflection region 18A shown in FIG. 3b so that the optical path 22 passes through the transparent region 14a as the optical path 22a. The diaphragm 24b may periodically at least partially close the transparent region 14b, so that no or only a small amount of stray light enters the interior of the housing of the portable device through the transparent region 14b.

[0029] 3b shows the beam deflection means 18, diaphragm 24a and diaphragm 24b in a second operating state, for example, in this case the beam deflection means 18 has a different field of view using a 90° rotational movement 28. However, the beam deflection means now deflects the optical path with beam deflection region 18B operable for the second wavelength range, so that capture of the entire field of view arranged in the field of view direction of optical path 22b can be performed within the second wavelength range.

[0030] When the beam deflection means is rotated a further 90°, and thus 180° compared to the original state, the first viewing direction shown in Figure 3a is again adopted, but now influenced by the beam deflection region 18B. For example, viewing directions 22a or 22b may be provided using any angle so that only one overall field of view is captured, but also a greater number of overall fields of view, e.g. 2, 3 or more, may therefore be captured.

[0031] The beam deflection means 18 may deflect the optical path 22 so that the optical path 22 passes through the transparent region 14b as optical path 22b, while the diaphragm 24a at least partially optically blocks the transparent region 14a. In the second operating state, the diaphragm 24b may be at least partially or completely open. The open state may relate to the transparency of the diaphragm. For example, an electrochromic diaphragm may be said to open and close in response to a control state without the movement of a mechanical component. During the second operating state, the diaphragm 24b configured as an electrochromic diaphragm may be at least periodically partially or completely transparent to the wavelength range detected by the imaging device. In the first operating state depicted in FIG. 3a, the diaphragm 24b may be partially or completely opaque, or may be opaque, to this wavelength range. The switching between the first operating state of Figure 3a and the second operating state of Figure 3b may be realized based on a rotational movement 28 of the deflection means 18 and / or based on a translational movement, as will be explained in the context of Figures 4a and 4b, or may include at least one of said movements.

[0032] FIG. 4a shows a schematic diagram of the beam deflection means 18, which includes multiple beam deflection elements 32a-32h. For example, an imaging device may include multiple or multiple optical channels, e.g., two, four, or more. For example, if the imaging device includes four optical channels, the beam deflection means 18 may include multiple beam deflection elements 32a-32h, depending on the number of optical channels multiplied by the number of operational states to which the optical deflection means 18 or the portable device can be switched. For example, beam deflection elements 32a and 32e may be associated with a first optical channel, with beam deflection element 32a deflecting the optical path of the first optical channel in the first operational state, and beam deflection element 32e deflecting the optical path of the first optical channel in the first operational state. Similarly, beam deflection elements 32b and 32f, 32c and 32g, and 32d and 32h may be associated with additional optical channels, respectively.

[0033] The beam deflection means may be translationally movable along a translational movement direction 26 and / or may be movable back and forth between a first position and a second position of the beam deflection means 18 relative to the optical channels of the imaging device to change between a first operating state and a second operating state. A distance 34 over which the beam deflection means 18 moves between the first and second positions may correspond to at least the distance between the four optical channels of the imaging device. The beam deflection means 18 may include a block-wise selection of beam deflection elements 32a-32h. For example, the beam deflection elements 32a-32d may be configured to deflect the optical path of the imaging device in a first line of sight direction toward a first field of view, with each optical channel being associated with a partial field of view of the overall field of view. The beam deflection elements 32e-32h may be configured to deflect the optical path of the imaging device in a second line of sight direction toward a second field of view, with each optical channel being associated with a partial field of view of the overall field of view. According to a further embodiment, the optical paths of at least two optical channels can be deflected by beam deflecting elements, so that the beam deflection means 18 can have a smaller number of beam deflecting elements.

[0034] The beam deflecting elements 32a-32h may be regions of the beam deflecting means 18 having different curvatures or may be planar facets of a faceted mirror. For example, the beam deflecting means 18 may be understood to be an array of facets and / or deflecting elements 32a-32h exhibiting different inclinations, such that the optical paths of the optical channels impinging on the beam deflecting means 18 are directed towards different partial fields of view of the field of view in a first operating state, and the optical paths impinging on and deflected by the deflecting elements 32e-32h are directed towards different partial fields of view of the field of view in a second operating state.

[0035] FIG. 4b shows a schematic diagram of the beam deflection means 18 in a different configuration from that of FIG. 4a. The configuration of FIG. 4a can be understood as a block-by-block sorting of the beam deflection elements 32a-32h based on the operating state, while the configuration of FIG. 4b can be understood as a channel-by-channel sorting of the beam deflection elements 32a-32h based on the order of the optical channels of the imaging device. The beam deflection elements 32a and 32e associated with the first optical channel may be positioned adjacent to each other. Similarly, the beam deflection elements 32b and 32f, 32c and 32g, and 32d and 32h associated with optical channels 2, 3, and 4, respectively, may be positioned adjacent to each other. For example, if the optical channels of the imaging device are at a sufficiently large distance from each other, the distance 34' over which the beam deflection means 18 is moved back and forth between the first and second positions may be less than the distance 34, e.g., a quarter or half of the distance 34. This allows for a further compact structural design of the imaging device and / or portable device.

[0036] Instead of simply assigning beam deflection elements to optical channels, they may each provide a different type of beam deflection region, so that, for example, a first optical channel is deflected by deflecting with a beam deflection element 32a within a first wavelength range or by deflecting with a beam deflection element 32e within a second wavelength range.

[0037] The rotational movement may be combined with a translational movement. Thus, for example, it is also possible to imagine a translational movement to switch between wavelength ranges, i.e. different beam deflection elements 32a-32h being arranged on each side of the beam deflection means 18, in which case a double-reflecting implementation allows switching of the viewing direction and vice versa.

[0038] 4c to 4h illustrate advantageous implementations of the beam deflection means 18. The description illustrates a number of advantages that can be implemented individually or in any combination, but are not intended to be limiting.

[0039] FIG. 4c shows a schematic cross-sectional side view of a beam deflecting element 32, such as may be employed in the beam deflection means described herein, e.g., the beam deflection means 18 of FIG. 4a or 4b. The beam deflecting element 32 may have a cross-section in a polygonal manner. While a triangular cross-section is shown, any other polygonal shape is also possible. Alternatively or additionally, the cross-section may also include at least one curved surface; particularly for reflective surfaces, an at least partially flat configuration may be advantageous to avoid aberrations. Beam deflection regions that behave differently with respect to wavelength may be located on different and opposing major surfaces 35a and 35b.

[0040] For example, beam deflecting element 32 includes first surface 35a, second surface 35b, and third surface 35c. At least two surfaces, e.g., surfaces 35a and 35b, are configured to be reflective, such that beam deflecting element 32 is configured to be reflective on both sides. Surfaces 35a and 35b may be major surfaces of beam deflecting element 32, i.e., surfaces whose surface area is greater than the surface area of ​​surface 35c.

[0041] In other words, the beam deflecting element 32 may have the shape of a wedge and be formed so as to be reflective on both sides. However, a further surface, which is significantly smaller than the surface 35c, may be arranged opposite the surface 35c, i.e., between the surfaces 35a and 35b. In other words, in such a case, the wedge formed by the surfaces 35a, 35b and 35c is not arbitrarily tapered, but is provided with a surface on its pointed side and is therefore truncated.

[0042] 4d shows a schematic cross-sectional side view of the beam deflecting element 32, depicting the suspension or displacement axis 37 of the beam deflecting element 32. The displacement axis 37, about which the beam deflecting element 32 may be rotationally and / or translationally movable within the beam deflection means 18, may be displaced eccentrically relative to the centroid 43 of the cross section. Alternatively, the centroid may be a point representing half the dimension of the beam deflecting element 32 along the thickness direction 45 and along a direction 47 perpendicular thereto.

[0043] The displacement axis may be constant, for example, along the thickness direction 45, or may have any offset perpendicular thereto. Alternatively, an offset along the thickness direction 45 is also conceivable. The displacement may be performed, for example, such that a rotation of the beam deflecting element 32 about the displacement axis 37 results in a greater range of movement than a rotation about the center of gravity 43. Thus, the distance traveled by the edge between the surfaces 35a and 35b during rotation may be increased by the displacement of the displacement axis 37 compared to a rotation about the center of gravity 43 for the same rotation angle. Preferably, the beam deflecting element 32 is positioned such that the edge between the surfaces 35a and 35b, i.e., the pointed surface of the wedge-shaped cross section, faces the image sensor. Therefore, the respective other surfaces 35a and 35b can deflect the optical path of the optical channel using a small rotational movement. This means that the rotation can be performed in such a way that the space requirement of the beam deflecting means along the thickness direction 45 is reduced, since the beam deflecting element 32 does not need to be moved so that its main surface is perpendicular to the image sensor.

[0044] Surface 35c may also be called a secondary surface or a rear surface. Several beam deflecting elements may be connected to one another in such a way that the connecting elements are arranged on surface 35c or extend through the cross section of the beam deflecting element, i.e., arranged inside the beam deflecting element, for example in the region of the displacement axis 37. In particular, the retaining elements may be arranged so that they do not protrude beyond the beam deflecting element 32 in direction 45 or protrude only slightly, i.e., by a maximum of 50%, a maximum of 30%, or a maximum of 10%, so that they do not increase or determine the extension of the overall design along direction 45. Alternatively, the extension in thickness direction 45 may be determined by the lenses of the optical channel, i.e., said lenses have dimensions that define the minimum thickness.

[0045] The beam deflecting element 32 may be made from glass, ceramic, glass-ceramic, plastic, metal, or any combination of the above and / or further materials.

[0046] In other words, the beam deflecting element 32 may be positioned such that its tip, i.e., the edge located between the main faces 35a and 35b, points towards the image sensor. The beam deflecting element may be held only at the rear or inner face of the beam deflecting element, i.e., so that the main faces are not obscured. A common holding or connecting element may extend across the rear face 35c. The axis of rotation of the beam deflecting element 32 may be positioned eccentrically.

[0047] FIG. 4e shows a schematic perspective view of a multi-aperture imaging device 40 including an image sensor 36 and a linear array 38 of adjacently arranged optical channels 42a-42d. The beam deflection means 18 includes several beam deflection elements 32a-32d, which may correspond to the number of optical channels. Alternatively, a smaller number of beam deflection elements may be provided, for example, when at least one beam deflection element is used by two optical channels. Alternatively, a larger number may be provided, for example, when the deflection direction of the beam deflection means 18 is switched by translational movement, as described in connection with FIGS. 4a and 4b. Each beam deflection element 32a-32d may be associated with an optical channel 42a-42d. The beam deflection elements 32a-32d may be configured as multiple elements 32 according to FIGS. 4c and 4d. Alternatively, at least two, some, or all of the beam deflection elements 32a-32d may be integrally formed with one another.

[0048] 4f shows a schematic cross-sectional side view of the beam deflecting element 32, the cross-section of which is formed as a freeform surface. Thus, the surface 35c may be provided with a recess 49 that allows for the attachment of a holding element, which may also be formed as a protruding element, such as a key of a slot-and-key system. The cross-section further includes a fourth surface 35d, which has a smaller surface area than the main surfaces 35a and 35b and connects them to each other.

[0049] 4g shows a schematic cross-sectional side view of the first and second beam deflecting elements 32a, 32b, which are located behind the former when viewed in the direction shown. The recesses 49a, 49b may be arranged so as to essentially coincide with each other, so that connecting elements can be arranged in the recesses.

[0050] FIG. 4h shows a schematic perspective view of the beam deflection means 18, which includes, for example, four beam deflection elements 32a-32d connected to a connecting element 51. The connecting element may be adapted to be translationally and / or rotationally movable by an actuator. The connecting element 51 may be integrally formed and extend over or within the beam deflection elements 32a-32d in an extension direction, e.g., the y direction in FIG. 4e. Alternatively, for example, if the beam deflection elements 32a-32d are integrally formed, the connecting element 51 may be bonded to at least one side of the beam deflection means 18. Alternatively, the connection to the actuator and / or the connection of the beam deflection elements 32a-32d may also be made in any other way, for example by means of gluing, drawing or soldering.

[0051] 5a shows a schematic perspective view of the imaging device 16. The imaging device 16 includes a beam deflection means 18, an image sensor 36, and a linear array 38 of adjacently arranged optical channels 42a-42d. Each optical channel 42a-42d may include an optical system configured to optically influence the optical paths 22-1-22-4 of the imaging device 16. The optical system may be channel-specific or may include mutual components for groups of two or more optical channels.

[0052] The image sensor 36 may include image sensor regions 44a-44d, and the optical paths 22-1-22-4 of the optical channels 22a-22d may impinge on the image sensor regions 44a-44d, respectively. Simply put, each image sensor region 44a-44d may have an associated optical channel 22a-22d and / or optical path 22-1-22-4. The beam deflection means 18 may be configured to deflect the optical paths 22-1-22-4 in different directions and / or to different wavelengths based on different operating states of the portable device and / or different positions of the beam deflection means 18, for example, as described in connection with FIGS. 1, 2, 3a, 3b, and 4a-4h. This means that the imaging device 16 may be formed as or include a multi-aperture imaging device 40.

[0053] Each of the image sensor regions 44a-44d may be formed, for example, from a chip including a corresponding pixel array, and the image sensor regions may be mounted on a shared substrate and / or a shared circuit board. Alternatively, it is possible for each of the image sensor regions 44a-44d to be formed from a portion of a shared pixel array that extends continuously across the image sensor regions 44a-44d, with the shared pixel array being formed, for example, on an individual chip. For example, only the pixel values ​​of the shared pixel array are subsequently read out in the image sensor regions 44a-44d. Various combinations of the above alternatives are also possible, of course, such as one chip for two or more channels and additional chips for other channels. In the case of a several-chip image sensor 36, the chips may be mounted, for example, all together or in groups, on one or more circuit boards.

[0054] The linear array 38 may include a carrier 39 on which the optical systems 41a-41d of the optical channels are arranged. The optical paths 22-1-22-4 used for imaging in the individual optical channels may pass through the carrier 39. The optical channels of the multi-aperture imaging device may cross the carrier 39 between the beam deflection means 18 and the image sensor 36. The carrier 39 may maintain the relative positions of the optical systems 41a-41d in a stable manner. The carrier 39 may be transparent and may include, for example, glass and / or polymer materials. The optical systems 41a-41d may be arranged on at least one surface of the carrier 39. This eliminates the need to encapsulate the optical systems 41a-41d within their circumferential region, thereby enabling a small size of the carrier 39 along a direction parallel to the image sensor 36 and perpendicular to the line extension direction 56, and thus a small size of the linear array 38. According to an embodiment, the carrier 39 is configured to be no larger than the corresponding dimensions of the optical systems 41a-41d along a direction parallel to the main surface of the image sensor 36 and perpendicular to the line extension direction 56, or to be slightly larger than them, i.e., by up to 20%, up to 10% or up to 5% larger.

[0055] The beam deflection means may be configured to deflect the optical paths 22-1 to 22-4 of each optical channel 42a to 42d in different directions in the first and second positions. This means that the deflected optical paths 22-1 to 22-4 may be at angles to one another, as explained in the context of FIG. 6a. The optical channels 16a to 16d may be arranged in at least one line along the line extension direction 56. The array 38 may be formed as a multi-line array including at least two lines or as a single-column array including (exactly) one line of optical channels. The optical channels may be guided by the beam deflection means 18 based on a field of view set toward a varying field of view. The optical channels may be angled relative to one another in the field of view, so that, if they do overlap, they are directed into partial fields of view of the overall field that only partially overlap. The different angles of the optical channels may be obtained based on the optics of the optical channels and / or based on the different deflections of the optical channels by the beam deflection means 18.

[0056] The imaging device 16 may include, for example, an actuator 48a that is part of an optical image stabilizer 46a and / or that can be used to switch the position of the beam deflection means 18. The optical image stabilizer 46a may be configured to enable optical image stabilization of images captured by the image sensor 36. For this purpose, the actuator 48a may be configured to generate a rotational movement 52 of the beam deflection means 18. The rotational movement 52 may occur around a rotation axis 54, which may be located in a central region of the beam deflection means 18 or at a distance therefrom. The rotational movement 52 may be superimposed on the rotational movement 28 and / or the translational movement 26 to switch the beam deflection means between a first position or a first operating state and a second position or a second operating state. If the beam deflection means 18 is translationally movable, the translational movement 26 may be spatially arranged parallel to a line extension direction 56 of the in-line array 38. The line extension direction 56 may relate to the direction in which the optical channels 42a-42d are adjacently arranged. Based on the rotational movement 52, optical image stabilization may be achieved along a first image axis 58, possibly perpendicular to the line extension direction 56.

[0057] Alternatively or additionally, the optical image stabilizer 46 may include an actuator 48b configured to translate the linear array 38 along the line extension direction 56. Based on the translational movement of the linear array 38 along the line extension direction 56, optical image stabilization may be realized, possibly along a second image axis 62 parallel to the line extension direction 56 and / or parallel to the direction of movement of the linear array 38. The actuators 48a and 48b may be formed, for example, as piezoelectric actuators, pneumatic actuators, hydraulic actuators, DC motors, stepper motors, thermal actuators, electrostatic actuators, electrostrictive actuators, and / or magnetostrictive actuators. The actuators 48a and 48b may be identical or different from each other. Alternatively, it is also possible to arrange actuators configured to rotate the beam deflection means 18 and translate the linear array 38. For example, the rotation axis 54 may be parallel to the line extension direction 56. Rotational movement 52 about rotation axis 54 may require little installation space for imaging device 16 along a direction parallel to image axis 58, so that a portable device including imaging device 16 within a housing may have similarly small dimensions. Briefly, the portable device may include a flat housing.

[0058] The translational movement 26 may be performed, for example, parallel or essentially parallel to the extension of the main surfaces 13a and / or 13b of the device 10, so that additional installation space that may be required for switching the beam deflection between operating states can be arranged along the line extension direction 56 and / or the provision of installation space along the thickness direction of the device can be omitted. The actuators 48a and / or 48b may be arranged parallel to the extension direction of the main surfaces of the device housing, along and / or perpendicular to the line extension direction. Simply put, this can be explained as the actuator for switching the operating state and / or the actuator for the optical image stabilizer can be arranged next to, in front of, or behind the extension between the image sensor 36, the linear array 38, and the beam deflection means 18, with arrangement above and / or below being omitted to keep the installation height of the imaging device 16 small. This means that the actuator for switching the operating state and / or the actuator for the optical image stabilizer can be arranged in the plane in which the image sensor 36, the linear array 38, and the beam deflection means 18 are arranged.

[0059] According to further embodiments, actuator 48b and / or other actuators may be configured to change the distance between image sensor 36 and line array 38 and / or the optics of the optical channels. To this end, for example, actuator 48b may be configured to move line array 38 and / or image sensor 36 relative to each other along optical paths 22-1 to 22-4 and / or perpendicular to line extension direction 56 in order to change the focus of imaging of the field of view and / or to obtain autofocus functions.

[0060] The imaging device 16 may include focusing means configured to change the focus of the imaging device. The focusing means may be configured to provide relative movement between the linear array 38 and the image sensor 36. The focusing means may be configured to perform the relative movement while performing a simultaneous movement of the beam deflection means 18. For example, the actuator 48b or a further actuator may be configured to keep the distance between the linear array 38 and the beam deflection means 18 at least essentially constant, or, if no additional actuator is used, at least essentially constant, possibly even exactly constant, i.e., to move the beam deflection means 18 as much as the linear array 38 moves. In cameras without beam deflection means, implementing a focusing function may increase the dimensions (thickness) of the device.

[0061] Based on the beam deflection means, this can be achieved without any additional dimension arising along a dimension parallel to the main surface of the image sensor 36 and perpendicular to the line extension direction 56 (e.g., thickness) of the multi-aperture imaging device, since the installation space enabling the movement can be arranged perpendicular thereto. Based on a constant distance between the line array 38 and the beam deflection means 18, the beam deflection can be maintained in an adjusted (possibly optimal) state. Briefly, the imaging device 16 can include focusing means for changing the focus. The focusing means can be configured to provide relative movement (focusing movement) between at least one optical system 41a-41d of the optical channel of the multi-aperture imaging device 16 and the image sensor 36. The focusing means can include an actuator for providing the relative movement, for example, actuator 48b and / or 48a. The beam deflection means 18 can be moved simultaneously with the focusing movement, possibly using additional actuators due to a corresponding structural configuration or utilization. This means that the distance between the single row array 38 and the beam deflection means remains unchanged, and / or the beam deflection means 18 is moved simultaneously or with a fixed time lag to the same or a similar extent as the focusing movement occurs, so that it does not change, at least at the time the field of view is captured by the multi-aperture imaging device, compared to the distance before the focus change.

[0062] The imaging device 16 includes a control means 53 configured to receive image information from the image sensor 36. For this purpose, an image of the entire field of view is evaluated, said image being acquired by deflecting the optical paths 22-1 to 22-4 of the optical channels 42a to 42d with a first beam deflection region, and a corresponding, i.e., matching, image is evaluated, said image being acquired by deflecting the optical paths 22-1 to 22-4 of the optical channels 42a to 42d with a second beam deflection region, where any order of the first and second images may be used.

[0063] The control means 53 may, for example, use a method for image stitching to generate two overall images of the captured overall field of view, where the first overall image is based on a first wavelength range and the second overall image is based on a second wavelength range.

[0064] The control means may be configured to determine a depth map of the first capture using the second capture, for example, based on a wavelength range invisible to humans, such as the infrared range, in particular the near-infrared range (NIR). To this end, the control means may be configured, for example, to evaluate a pattern visible in the second wavelength range. Thus, for example, a predetermined pattern, such as a dot pattern, may be emitted toward the entire field of view in the NIR wavelength range, and the distortion of the pattern may be evaluated in the second capture or second image. The distortion may be correlated with depth information. The control means 53 may be configured to provide a depth map using the evaluation of the depth information. As an alternative or in addition to the spatial information of the pattern, temporal information may also be evaluated, for example, if the temporal dispersion of the pattern is known.

[0065] The illumination source may be configured to emit a temporal and / or spatial illumination pattern having a third wavelength range that completely or partially includes the second wavelength range, such that the third wavelength range at least partially corresponds to the second wavelength range. This includes the fact that partial reflection of the wavelengths of the emitted pattern already represents a sufficient source of light for the second wavelength range to reach the image sensor, and also includes wavelength shifts or partial reflections, e.g., due to absorption. For example, the second wavelength range and the third wavelength may coincide.

[0066] As described in connection with FIG. 1 , the deflected optical paths of the optical channels may pass through a transparent region of the device's housing, and a diaphragm may be disposed in the transparent region. In at least one operating state of the device, the diaphragm disposed within the transparent region may at least partially optically close the region, such that the diaphragm is operable for two, a number of, or all of the optical channels, i.e., is at least partially closed. In a different operating state, the diaphragm may be open for two, a number of, or all of the optical channels. This means that the diaphragm may be operable for at least two optical channels of the multi-aperture imaging device. In a first operating state, the diaphragm 24b may at least partially optically close the transparent region 14b for two, a number of, or all of the optical channels. In a second operating state, the diaphragm 24a may at least partially optically close the transparent region 14a for two, a number of, or all of the optical channels.

[0067] 5b shows a schematic perspective view of multi-aperture imaging device 16 according to one embodiment, where array 38 illustratively includes two optical channels including optical systems 41a-41b, although any larger number is possible, such as three, four, five, or more. Optical channels 41a and 41b are each configured to capture a subfield of view 64a or 64b of overall field of view 60. Subfields 64a and 64b overlap each other and together form overall field of view 60.

[0068] The multi-aperture imaging device 16 comprises illumination means 55 configured to emit a temporal or spatial illumination pattern 55a, in particular towards the overall field of view 60. The illumination pattern 55a may comprise a third wavelength range that at least partially overlaps or corresponds to the second wavelength range, so that when the second beam deflection region is used to deflect the light path, a distorted pattern in the overall field of view impinges on the image sensor and may be evaluated by the control means 53.

[0069] FIG. 5c shows a schematic cross-sectional side view of a modified imaging device 16′, in which the beam deflection means 18 can be moved between a first position Pos1 in a first operating state and a second position Pos2 in a second operating state based on a rotational movement 52′ about a rotation axis 54. In the first operating state, the imaging device 16′ can have a first line of sight 57a. In the second operating state, the imaging device 16′ can have a first line of sight 57b. The main surfaces 59a and 59b of the beam deflection means 18 can be formed to reflect as mirrors and / or faceted elements. During switching between operating states, the beam deflection means 18 can be switched between center positions 61 such that the difference between parallel planes 63a and 63b (which can represent the smallest dimension of the imaging device 16′ along the normal direction of the planes 63a and 63b) is affected by the dimensions of the image sensor 36 of the array 38 but is not affected by the movement of the beam deflection means 18. The rotational movement 52 may be superimposed with the rotational movement 28. In short, a superposition of switching and optical image stabilization may be implemented.

[0070] The actuator of the multi-aperture imaging device may be arranged so that it is at least partially located between two planes 63a and 63b spanned by (defined by) the sides of the rectangular parallelepiped. The faces of the rectangular parallelepiped may be arranged parallel to each other and to the line extension direction of the array and to part of the optical path of the optical channel between the image sensor and the beam deflection means. The volume of the rectangular parallelepiped is minimal, but nevertheless contains the image sensor, the array, and the beam deflection means, as well as their operationally related movements.

[0071] The thickness direction of the multi-aperture imaging device may be arranged perpendicular to the planes 63a and / or 63b. The actuator may have a dimension or extension parallel to the thickness direction. Starting from the region located between the planes 63a and 63b, a proportion of the dimension of up to 50%, up to 30%, or up to 10% may protrude beyond the planes 63a and / or 63b or beyond said region. Thus, the actuator may, for example, protrude only to an insignificant extent beyond the planes 63a and / or 63b. According to an embodiment, the actuator does not protrude beyond the planes 63a and / or 63b. Advantageously, the extension of the multi-aperture imaging device along the thickness direction is not increased by the actuator.

[0072] The volume of the multi-aperture imaging device may include a small or minimal footprint between plane 63a and plane 63b. Along the sides or extensions of planes 63a and / or 63b, the footprint of the multi-aperture imaging device may be larger or have any desired size. The volume of the imaginary rectangular parallelepiped may be affected, for example, by the arrangement of image sensor 36, array 38, and beam deflection means, which may be arranged, according to the embodiments described herein, such that the footprint of these components along a direction perpendicular to the planes, and thus the mutual distance between planes 63a and 63b, is small or minimized. Compared to other arrangements of the components, the volume of the imaginary rectangular parallelepiped and / or the distance between other planes may be enlarged.

[0073] FIG. 6a shows a schematic diagram of an overall field of view 60 including four overlapping partial fields of view 64a-64d. The partial fields of view 64a-64d are illustratively arranged within the object region along two directions H and V, which may, for example, but are not limited to, horizontal and vertical directions. Any other directional arrangement is possible. For example, referring to FIG. 5a, optical path 22-1 may be directed toward partial field of view 64a, optical path 22-2 may be directed toward partial field of view 64b, optical path 22-3 may be directed toward partial field of view 64c, and / or optical path 22-4 may be directed toward partial field of view 64d. While the association of optical paths 22-1-22-4 with partial fields of view 64a-64d is arbitrary, it becomes clear that, starting from the beam deflection means 18, optical paths 22-1-22-4 are directed in different directions from each other. In the described embodiment, the overall field of view 60 is captured by four optical channels capturing partial fields of view 64a-64d, but the overall field of view 60 may also be captured by any other number of partial fields of view greater than one, i.e., at least two, at least three, at least five, at least seven, or more.

[0074] 6b shows a different possible division of the overall field of view 60 from FIG. 6a, for example, the overall field of view is captured by only two partial fields of view 64a and 64b. For example, the partial fields of view 64a and 64b may be arranged along direction V or, as shown in FIG. 6c, along direction H, and may overlap each other to enable effective image combination. The partial fields of view are illustrated as having only different sizes to more effectively distinguish them, even if this indicates a corresponding optional implementation in such a manner.

[0075] In principle, the allocation of partial fields of view 64a and 64b to optical channels and the relative orientation of array 14 can be arbitrary. The direction in which the partial fields of view are arranged, for example, along V in FIG. 6b or H in FIG. 6c, can be arranged arbitrarily with respect to line extension direction 56 of array 14. In an advantageous arrangement, line extension direction 56 and the direction in which the partial fields of view are arranged are arranged perpendicular to each other, preferably perpendicular to each other, within a tolerance of ±25°, ±15°, or ±5°. In FIG. 6b, line extension direction 56 is arranged parallel to direction H, which is arranged perpendicular to V, for example. In FIG. 6c, line extension direction 56 is also rotated according to the arrangement of partial fields of view 64a and 64b, which are rotated compared to FIG. 6b, so that line extension direction 56 is parallel to V or perpendicular to H within a specified tolerance. Thus, the optical channels 42a-42c and image sensor areas 44a-44c may also overlap or may coincide within a tolerance within the illustrated plane of FIG. 6c, and are shown offset for illustrative purposes.

[0076] A multi-aperture imaging device according to an embodiment may be configured to capture the entire field of view 60 through at least two partial fields of view 64a-64b. In contrast to a partial field of view captured in a single-channel manner, such as partial field of view 64b or partial field of view according to the description of FIG. 6a, at least one of the partial fields of view may be captured by at least one of the first optical channel 42a and one-half optical channel 42c. For example, the entire field of view may be split into exactly two partial fields of view 64a, 64b. Exactly one of the partial fields of view, e.g., partial field of view 64a, may be captured via two optical channels 42a and 42c. The other partial field of view may be captured in a single-channel manner.

[0077] To this end, multi-aperture imaging devices according to embodiments provide for the use of exactly two optical channels to image two partial fields of view 64a and 64b within each or both wavelength ranges. In such a configuration, overlap or occlusion effects can occur in the overlap region, meaning that only one field of view angle is captured, instead of double capture of a field of view located behind an object. To reduce or avoid such effects, some embodiments provide for the capture of at least one of the partial fields of view 64a and / or 64b with an additional optical channel 42a-42c, such that at least this channel 42a-42c is captured multiple times, particularly twice. Any other number of partial fields of view captured twice and / or any other number of optical channels are also possible.

[0078] As shown based on Figures 6b and 6c, to capture partial fields of view 64 multiple times, optical channels 42a and 42c and / or image sensor areas 44a and 44c may be arranged symmetrically around optical channel 42b to capture other partial fields of view, may be spaced apart in array 14 with at least one optical channel 42b directed onto another partial field of view, and / or may include an extended distance or maximum distance towards each other in the array to enable specific measurements of parallax.

[0079] FIG. 7a shows a schematic perspective view of a device 701 including a first multi-aperture imaging device 16a and a second multi-aperture imaging device 16b configured to stereoscopically capture an entire field of view 60 using the multi-aperture imaging devices. The entire field of view 60 is disposed, for example, on a major surface 13b facing away from the major surface 13a. For example, the multi-aperture imaging devices 16a and 16b may capture the entire field of view 60 through transparent regions 14a and / or 14c, and diaphragms 24a and 24c disposed within the major surface 13b may be at least partially transparent. Diaphragms 24b and 24d disposed within the major surface 13a may at least partially optically block the transparent regions 14b and / or 14d, thereby at least reducing the amount of stray light coming from the side facing the major surface 13a that could corrupt the images captured by the multi-aperture imaging devices 16a and / or 16b. Although the multi-aperture imaging devices 16a and 16b are depicted as being spaced apart from one another, the multi-aperture imaging devices 16a and 16b may also be arranged in a spatially adjacent or interlaced manner. For example, the line arrays of the imaging devices 16a and 16b may be arranged adjacent to one another or parallel to one another. The line arrays may form a line with respect to one another, and each of the multi-aperture imaging devices 16a and 16b may comprise a line array. The imaging devices 16a and 16b may include a shared beam deflection means and / or a shared carrier 39 and / or a shared image sensor 36.

[0080] The transparent regions 14a-14d may additionally comprise switchable diaphragms 24a-24d that cover the optical structures when not in use. The diaphragms 24a-24d may include mechanically movable parts. Movement of the mechanically movable parts may be achieved using actuators, such as those described for actuators 48a and 48b. Alternatively or additionally, the diaphragms may be electrically controllable and may include an electrochromic layer or a series of electrochromic layers.

[0081] According to the preferred embodiment of Figure 7b, device 702 is implemented similarly to device 701, but instead of stereoscopic capture, depth information is generated from capture in one of the wavelength ranges, for example, through evaluation of pattern distortion in a non-visible wavelength range. According to this preferred embodiment, for example, device 70 is implemented with only a single imaging device 16 and is configured to capture the entire field of view from a viewpoint, i.e., the viewpoint of imaging device 16, but not to capture stereoscopic capture of the entire field of view.

[0082] However, device 70 may also be implemented according to a preferred implementation form to provide or generate a depth map of the entire field of view, for example by evaluating the pattern distortion in one of the captured wavelength ranges, for example by control means 53 or specially implemented calculation means of device 70 or imaging device 16.

[0083] The device 70 may be implemented without an additional infrared camera that complements or extends the imaging device 16, as such functionality is already implemented in the imaging device 16, possibly including the illumination means 55.

[0084] According to a further preferred embodiment shown in FIG. 7c, the imaging device 16 of device 703, in contrast to devices 701 and 702, is configured to include only one field of view direction, so that other directions, which are in each case optional, as well as the arrangement of corresponding field of view windows on the diaphragm may be omitted. Through evaluation of the two wavelength ranges, devices 702 and 703 may be configured to create a depth map of the entire field of view.

[0085] FIG. 8 shows a schematic structure including, for example, a first multi-aperture imaging device 16a and a second multi-aperture imaging device 16b that may be disposed in an imaging system 701. The multi-aperture imaging devices 16a and 16b may be formed, completely or partially, as a multi-aperture imaging device of one another. The in-line arrays 38a and 38b form a shared circuit. The image sensors 36a and 36b may be mounted on a shared substrate and / or a shared circuit carrier, such as a shared circuit board or a shared flex board. Alternatively, the image sensors 36a and 36b may include different substrates. Naturally, various combinations of the above alternatives are also possible, such as multi-aperture imaging devices including a shared image sensor, a shared array, and / or a shared beam deflection means 18, as well as additional multi-aperture imaging devices including separate components. Advantages of a shared image sensor, a shared in-line array, and / or a shared beam deflection means are that the movement of the respective components can be achieved with high precision by controlling a small number of actuators, and synchronization between the actuators can be reduced or avoided. Furthermore, a high level of thermal stability may also be achieved. Alternatively or additionally, the further multi-aperture imaging device may also comprise a shared array, a shared image sensor, and / or a shared beam deflection means. By arranging at least one further group of imaging optical channels, any number of which may be implemented, the multi-aperture imaging device may be configured to capture at least the entire field of view stereoscopically.

[0086] It has already been pointed out above that, starting from the beam deflection means, the optical paths and / or optical axes can be directed in different directions. This can be achieved by the optical paths being directed away from being parallel to one another during deflection at the beam deflection means and / or by the optical system. The optical paths and / or optical axes can deviate from being parallel before beam deflection or even without any beam deflection. This situation is limited below by the fact that the channels can be equipped with some kind of pre-deviation. This pre-deviation of the optical axes can, for example, allow several groups of channels to include or be oriented relative to facets with equal inclinations, even though not all of the facets of the beam deflection means differ from one another. The latter can then be formed so that the facets associated with said groups of channels adjacent in the line extension direction are integral or merge into one another in succession. The deviation of the optical axes of these channels can then result from a deviation of these optical axes, achieved by a lateral offset between the optical center of the optical system of the optical channel and the image sensor area of ​​the channel. The pre-deviation may, for example, be limited to a plane. The optical axis may, for example, extend in a shared plane before or without any beam deflection, but may extend in such a way as to deviate within said plane, and the facets may cause additional deviations only in other cross-sections, i.e., they are all inclined parallel to the line extension direction and are inclined relative to each other only in a way different from the above-mentioned shared plane of the optical axis; here again, some facets may have the same inclination, and / or their optical axes may generally be associated with groups of channels that are already pairwise different, for example, within the above-mentioned shared plane of the optical axis before or without any beam deflection. In short, the optical system may allow a (pre-)deviation of the optical path along a first (image) direction, and the beam deflection means may allow a deviation of the optical path along a second (image) direction.

[0087] The above-mentioned possible pre-deviations may be achieved, for example, in that the optical center of the optical system lies on a straight line along the line extension direction, while the centers of the image sensor areas are arranged so that they deviate from the projection of the optical center along the normal to the plane of the image sensor area to a point on a straight line in the image sensor plane, for example, at that point so that they deviate from the above-mentioned point on the straight line in the image sensor plane in a channel-specific manner along the line extension direction and / or along a direction perpendicular to both the line extension direction and the image sensor normal.

[0088] Alternatively, the pre-deviation may be achieved in that the center of the image sensor lies on a straight line along the line extension direction, while the center of the optical system deviates from a projection of the optical center of the image sensor along a normal to the plane of the optical center of the optical system to a point on a straight line in the optical center plane, e.g., in that the point deviates from the point on the straight line in the optical center plane in a channel-specific manner along the line extension direction and / or along a direction perpendicular to both the line extension direction and the normal to the optical center plane. Preferably, the channel-specific deviation from the respective projection occurs only in the line extension direction, i.e., the pre-deviation is simply applied to optical axes lying in a common plane. In that case, both the optical center and the image sensor area center are each located on a straight line parallel to the line extension direction but with different intermediate gaps. A lateral offset between the lens and the image sensor in a lateral direction perpendicular to the line extension direction therefore results in an increased installation height. A simple in-plane offset in the line extension direction does not change the installation height, but may reduce the number of facets and / or tilt the facets only in the angular direction, simplifying the design. For example, adjacent optical channels in each case may have optical axes that extend in a shared plane and are oblique to one another, i.e., pre-deviation is provided. The facets may be arranged, for a group of optical channels, to be inclined in only one direction and parallel to the line extension direction.

[0089] Furthermore, provision may be made for several optical channels to be associated with the same partial field of view, for example in order to achieve super-resolution and / or to increase the resolution at which the corresponding partial field of view is sampled by said channels. The optical channels in such a group may for example extend parallel before beam deflection and be deflected onto the partial field of view by one facet. Advantageously, the pixel images of the image sensors of the channels of one group are located at intermediate positions between the images of the pixels of the image sensors of the other channels of this group.

[0090] For example, even without any super-resolution purpose, an implementation would also be feasible in which, for stereoscopic purposes only, a group of directly adjacent channels completely covers the entire field of view with a partial field of view in the line extension direction, and further groups of channels directly adjacent to each other completely cover the entire field of view for those portions.

[0091] Thus, the above-described embodiments may be implemented in the form of a multi-aperture imaging device and / or a device including such a multi-aperture imaging device, particularly in a single-channel arrangement, where each channel transmits a partial field of view of the entire field of view, with the partial fields of view partially overlapping. Designs including several such multi-aperture imaging devices are possible, such as stereo, trio, and quattro designs for 3D imaging. In this regard, most modules may be implemented as one continuous line. A continuous line may benefit from identical actuators and shared beam deflection elements. One or more amplifier boards, which may possibly be present in the optical path, may extend across the entire line, forming a stereo, trio, or quattro design. Super-resolution methods may be employed, with several channels imaging the same partial image area. The optical axis may extend in such a way that it deviates even without any beam deflection device, resulting in fewer facets being required on the beam deflection unit. The facets then advantageously exhibit only one angular component. The image sensor may be in one part and may contain only one continuous pixel matrix or several interrupted pixel matrices. The image sensor may consist of many partial sensors arranged next to each other, for example on a printed circuit board. The autofocus drive may be configured so that the beam deflection element is moved synchronously with the optical system or is idle.

[0092] In principle, any number of sub-modules, each including an image sensor, imaging optics, and a mirror array, may be arranged. The sub-modules may be configured as a system. The sub-modules or the system may be installed in a housing, such as a smartphone. The system may be arranged in one or more lines and / or columns, and in any desired location. For example, two imaging devices 16 may be arranged in the housing 12 to enable stereoscopic capture of the field of view.

[0093] According to further embodiments, device 70 may include additional multi-aperture imaging devices 16, so that the entire field of view 60 may be sampled by three or more multi-aperture imaging devices. This allows for several partially overlapping channels capturing the entire field of view, since the viewing direction is adapted for each channel. To capture the entire field of view in a stereoscopic or higher-order manner, at least one additional arrangement of channels may be configured according to the embodiments and / or the described arrangement of channels, which may be embodied as exactly one line or a separate module. This means that a single-column array may be arranged with additional lines in a multi-column manner, where the lines of said additional optical channels may be associated with additional multi-aperture imaging devices. The optical channels of the additional lines may also capture overlapping subregions, each covering the entire field of view together. This makes it possible to obtain stereo, trio, quattro, etc. structures of array cameras consisting of partially overlapping channels covering the entire field of view within their subgroups.

[0094] In other words, a multi-aperture camera including a linear channel arrangement may include several optical channels arranged adjacent to each other and each transmitting a portion of the overall field of view. According to an embodiment, a mirror (beam deflection means) may be advantageously arranged in front of the imaging lens; in this case, the mirror may be used for beam deflection and may contribute to reducing the installation height. For example, in combination with mirrors adapted for each channel, such as faceted mirrors whose facets may be flat or exhibit any type of curvature or may comprise freeform surfaces, it may be advantageous to structure the imaging optics of the channels in an essentially identical manner, while the viewing direction of the channel is influenced or predefined by the individual facets of the mirror array. In combination with planar mirrors (mirrors that should be configured flat), the imaging optics of the channels may be configured or implemented differently to result in different viewing directions. The deflection mirror (beam deflection device) may be pivoted, and the rotation axis may extend perpendicular to the optical channel, i.e., parallel to the linear extension direction of the channel. The deflection mirror may be reflective on both sides, and a metal or dielectric layer or series of layers may be arranged to obtain reflectivity. The rotational or translational displacement of the mirror may be similar or stable along two or several directions, where stable may be understood to mean that a constant force is applied to achieve movement along a predicted direction, and when said force drops this may result in freezing or backward movement of the beam deflection means.

[0095] The analogous rotation (rotational movement 52) ​​may be used for one-dimensional adaptation of the image position, which may be understood as optical image stabilization. For example, a movement of only a few degrees, e.g., ≦15°, ≦10°, or ≦1°, may be sufficient here. Rotation of a mirror stabilized along two or several directions may be used to switch the camera's viewing direction. For example, the viewing direction can be switched between in front of, next to, and behind the display. Analogous movements or positions and movements or positions stabilized along two / several directions may be combinable, i.e., superimposed. For example, solutions found for portable devices such as smartphones that use two cameras with different viewing directions toward the front and rear may be replaced by a structure including only one imaging device according to the embodiments described herein. Unlike known solutions, this structure may be characterized, for example, in that the observation window is positioned within the camera housing in such a way that the front and rear viewing directions are in the same position, i.e., opposite in the upper or lower housing cover. The area of ​​the housing cover arranged for the passage of the beam may be transparent and may consist of or include glass and / or polymer if visible light is used.

[0096] While the above-described embodiments have been described in terms of the device having first and second operating states, according to further embodiments, further operating states may be provided to capture a further field of view, i.e. at least a third field of view.

[0097] Subsequently, particularly advantageous implementation forms of multi-aperture imaging devices are described based on Figures 9a to 9d, where the devices may be implemented on their own or as part of an inventive device such as devices 701, 702 and / or 703.

[0098] For example, the illustrated cross-sectional side views relate to each facet of the facet beam deflection means. For example, the beam deflection means may be formed as an array of facets. One facet may be assigned to each optical channel, and in this case, each facet may deflect one or several optical channels. Each facet may include a corresponding first beam deflection region and a corresponding second beam deflection region. As illustrated in Figures 4c-4f, the facets of the array of facets may be formed as mirrors reflecting on both sides. The wedge shape shown in Figures 4c-4f may enable a small installation size, especially when using only one viewing direction, or when combining translational and rotational movements to switch between four positions used to capture two viewing directions and two wavelength ranges. For this purpose, the beam deflection means may be moved so that the leading edges of the facets are slightly moved up and down without the surface normals of faces 35a and 35b being parallel to the surface normal of the image sensor, in order to deflect alternately in different planes.

[0099] On the other hand, a simple and / or small installation size along the line extension direction of the array may be realized by supporting the beam deflection means to rotate by more than 90°, for example by about 180° or even 360°. In this way, for example, the four mentioned positions may be realized only by rotational movements, and additional facets and / or translational movements may be omitted. Furthermore, this allows for a simple implementation of the facets as plane-parallel mirrors, for example as a single plane-parallel mirror, to adjust the deviation of the optical path by an optical system, and / or as mutually oblique or tilted planar-parallel facets that adjust the deviation completely or partially.

[0100] 9a shows a schematic side cross-sectional view of a multi-aperture imaging device 90 according to one embodiment, where opposing faces 18A and 18B are implemented to deflect the optical path 22 such that filtering is performed at faces 18A and 18B for reflected wavelengths. The beam deflection means is shown in a first position with face 18A facing the image sensor 36.

[0101] The beam deflection means 18A includes a first beam deflection region, e.g. formed on the surface 18A, operable for a first wavelength range, e.g. the visible wavelength range, of electromagnetic radiation passing through the optical channel, and a second beam deflection region 18B operable for a second wavelength range, e.g. ultraviolet (UV), infrared (IR) or near infrared (NIR), of electromagnetic radiation passing through the optical channel, the second wavelength range being different from the first wavelength range.

[0102] The wavelength ranges may be disjoint, but may also partially overlap, as long as they are at least partially different and thus make it possible to obtain different image information.

[0103] This allows the image sensor 36 to be utilized to capture different wavelength ranges, particularly in combination with the coded (N)IR pattern emitted by the device 90, so that, for example, a second capture can be used to create a depth map for the first capture.

[0104] FIG. 9a shows the beam deflection means 18 in a first position. To achieve initial capture of the entire field of view, the beam deflection means may be configured to include a tilt angle α1 of the first beam deflection area 18A relative to the image sensor of 45° within a tolerance of ±10°, ±5°, or ±2°. For example, surface 18A completely provides a corresponding first beam deflection area, and surface 18B completely provides a corresponding second beam deflection area, so these terms are used synonymously herein. However, the beam deflection areas may also cover only a portion of the surface.

[0105] FIG. 9b shows the beam deflection means 18 in a second position, with surface 18B facing the image sensor, such that surface 18B is operable to deflect NIR light. For example, the beam deflection means 18 may be rotated approximately 180° compared to the first position. Beam deflection region 18A may be disposed on a first surface of the beam deflection means 18, and second beam deflection region 18B may be disposed on a second surface opposite the first surface. The beam deflection means 18 may be configured, either as a whole or in individual beam deflection elements, such that the first surface faces the image sensor for a first capture of the entire field of view, and the second surface faces the image sensor for a second capture of the entire field of view. Rotation and / or translation may be used to change the surface facing the image sensor.

[0106] The planar-parallel implementation of the beam deflection means or its facets allows the facets or beam deflection means 18 for obtaining a second capture of the entire field of view, e.g., using a second wavelength range, to include a tilt angle α2 of the second beam deflection region 18B relative to the image sensor of 45° within a tolerance of ±10°, ±5°, or ±2°. For example, the tolerance may compensate for the fact that the beam deflection elements include tilt angles slightly different from 45° resulting from the tilt or inclination of different facets of the beam deflection means 18 relative to one another, so that on average about 45° may be obtained, but individual facets or deflection regions deviate therefrom due to their individual inclination.

[0107] The beam deflection means 18A and 18B may be realized through differently implemented coatings operable to be reflective or non-reflective in the first and second wavelength ranges, respectively.

[0108] An embodiment provides that, to generate the beam deflection regions 18A and 18B, a corresponding coating having one or more layers is provided on the surface of the beam deflection means 18. For example, these layers may comprise one or several dielectric layers which, in terms of their layer thickness, can be adapted to the tilt angle of the beam deflection means.

[0109] Depending on the selected operating mode or desired wavelength range for capture, some wavelengths, particularly other wavelength ranges, may strike the beam deflection means 18. Therefore, some embodiments include a region for absorbing specific wavelengths, such as a volume absorber. This region may be covered by a coating, so that, for example, some wavelengths are reflected first, while the other wavelengths, e.g., the transmitted wavelength range, are absorbed. Thus, for example, when capturing a first wavelength range, the corresponding wavelengths may be reflected by the coating, while other wavelengths, e.g., at least undesired portions of a second wavelength range, are transmitted, i.e., passed through these layers. An absorbing region located behind the coating may absorb these portions to avoid or at least reduce their adverse effects on imaging in a multi-aperture imaging device. Complementary means for absorbing undesired portions of the first wavelength range may be located on the second side and are operable when the second wavelength range 18B is used for beam deflection.

[0110] Figure 9c shows the beam deflection means 18 in an optional third position in which surface 18A again faces the image sensor, but the inclination is selected so that the optical path is deflected towards a second overall field of view, for example the first overall field of view in Figures 9a and 9b.

[0111] FIG. 9d shows the beam deflection means in an optional fourth position with side 18B again facing the image sensor, for example so that side 18B operates to deflect from the second overall field of view towards image sensor 36.

[0112] 9c and 9d, a capture of the second overall field of view may be captured with the image sensor using the first beam deflection region 18A, such that the capture is based on the first wavelength range. Additionally, the second overall field of view may be imaged in a further capture by using the beam deflection region 18B with the image sensor, such that the capture is based on the second wavelength range.

[0113] The two overall fields of view may be arranged along different main directions of the multi-aperture imaging device, e.g., along opposite directions, i.e., along directions that differ by approximately 180°. For example, when performing a continuous rotational movement along a sequence similar to that of FIGS. 9a-9d, the beam deflection region may deflect the optical path alternately toward the first overall field of view and the second overall field of view, and alternately toward the first beam deflection region 18A and the second beam deflection region 18B. This may be a possible, but not required, movement sequence. In practice, for example, the rotational direction that allows the shortest and / or fastest position change may always be selected so that the positions can be changed in any order, especially when capturing a third overall field of view along a third direction and / or when positioning the overall field of view at an angle not equal to 180°. The angles in Figures 9a-9d may be selected in any order, for example, each about 45°. Translational displacement of the beam deflection means may also be performed instead of or in combination with the rotational displacements described.

[0114] To acquire an image, image information, or an image having different wavelength information, the pixels of the image sensor may be configured to be operable for both wavelength ranges, and / or cells having different sensitivities may be spatially adjacently arranged so that at least the image sensor area is sensitive to both wavelength ranges.

[0115] For example, the image sensor area may be configured to generate an image in a first wavelength range and an image in a second wavelength range. For this purpose, the CMOS pixels may, for example, be simultaneously sensitive in the visual range and the NIR range, and the overlapping color filter array ("CFA"—typically in the visual range in a Bayer array) may also include "filter pixels" corresponding to colors (red, green, blue or magenta, cyan, yellow) that transmit only partially and only partially in the NIR, which is sufficient. Alternatively or additionally, in a cell arrangement, for example in an extended Bayer pattern, individual cells may be replaced with or implemented as cells that are sensitive only in the NIR.

[0116] For example, pixels of the image sensor area may be configured to generate an image in a first wavelength range and an image in a second wavelength range.Thus, the present invention relates to beam deflection means using the Facet VISION architecture with different implementations of the front and back surfaces of the mirrors, where Facet VISION refers to the multi-aperture imaging device described herein. The core idea is to implement a deflection mirror in such a way that it has different functions on its front and back faces.

[0117] This particularly concerns the reflectivity, especially the spectral reflectivity (i.e. depending on the incident wavelength), where the first surface specifically reflects the visual spectral range (visual - VIS) using a desired beam deflection angle but it does not reflect the near infrared (NIR), and the second surface reflects the NIR using a desired beam deflection but does not deflect the VIS, all of which is achieved by a dielectric layer system that is implemented differently on the first and second mirror surfaces. This allows for the following: The same camera may be used as a VIS or NIR camera "simultaneously" or in very rapid succession, simply by mirror switching.

[0118] The mirror does not necessarily have to be wedge-shaped, but can be a simple plane-parallel plate. A 180° rotation is used for VIS / NIR mirror switching. The possible negative impact of the mirror rotation range on the installation space can be overcome by opening or closing the cover glass at the location of the window (device opening).

[0119] The camera may be configured with only one viewing direction ("World" or "Selfie"), and mirror switching (180°) is used only to change the captured spectral range. However, it can also continue to allow forward and backward viewing directions. For example, with a 90° mirror rotation step: World-VIS, Selfie-NIR, World-NIR, Selfie-VIS. · The combination of field splitting and image stitching (e.g., two channels) is clearly possible.

[0120] A dual camera implementation is also possible to generate a disparity-based depth map for image stitching (e.g., 4 channels). However, this is not required (and is therefore channel-efficient and significantly more cost-effective) because:

[0121] The above configuration may now be combined with structured or coded illumination (e.g. with a Kinect) in the NIR (at one mirror position the camera is now also visible in the NIR), from which the depth map required for image stitching of the VIS image can be generated. All this is done with only two field-split camera channels, special mirrors and with the help of a NIR dot pattern projector, without any additional NIR camera.

[0122] The goal of reducing from 4 channels to 2 channels is achieved without adding an additional NIR camera (which would be the third optical channel); only an additional NIR projector is required. · Reducing costs while maintaining the overall installation height advantage simply through alternative generation of depth maps, partially integrated into the system itself.

[0123] FIG. 10 shows a schematic graph of the sensitivity E of the image sensor regions of an image sensor of a multi-aperture imaging device across wavelength λ in wavelength ranges 66 and 68, e.g., the sensitivity of one or more of image sensor ranges 44a-44d. The image sensor ranges may be configured to generate images in a first wavelength range 66 and generate images in a second wavelength range 68. For example, the first wavelength range 66 is located between a first lower wavelength λ1 and a first upper wavelength λ2, where λ1<λ2. For example, the second wavelength range 68 is located between a second lower wavelength λ3 and a second upper wavelength λ4, where λ3<λ4. While FIG. 10 shows the second wavelength range 68 as including wavelengths greater than the first wavelength range 66, it is also possible for the second wavelength range 68 to include wavelengths smaller than the first wavelength range 66. The wavelength ranges 66 and 68 may overlap each other or may be separated from each other by an intermediate region 72.

[0124] The image sensor area may be configured to generate image data in at least wavelength ranges 66 and 68, meaning that it includes a sensitivity E1 in at least wavelength ranges 66 and 68, which is increased relative to sensitivity E0, e.g., in this case the image sensor area is less sensitive to these wavelengths and therefore does not generate image data or image signals.

[0125] The beam deflection may be selectively performed for wavelength ranges 66 and 68, such that attenuation or removal of wavelengths outside the respective wavelength range in which the beam deflection region currently operates is accordingly performed, and it is sufficient to suppress or attenuate wavelengths located within the complementary wavelength range. For example, this means that wavelength ranges to which the image sensor is not sensitive can also be deflected by beam deflection regions 18A and / or 18B. In short, the image sensor region may be implemented for imaging outside wavelength ranges 66 and 68.

[0126] For example, the image sensor area may include a large number of image points, i.e., pixels (picture elements). Each pixel may be formed from at least one, preferably several, image sensor cells, i.e., they are photosensitive. They may be arranged freely or according to a pattern, such as a Bayer pattern. For example, the sensitivity of the image sensor area to the second wavelength range 68 may be obtained by a first subset of pixels that are sensitive to the first wavelength range 66 and a different second subset of pixels that are sensitive to the second wavelength range 68. Depending on the desired resolution of the first and / or second capture, the pixels of the first subset may be arranged alternately, i.e., 1:1, or in any other ratio. Alternatively or additionally, one, some, or all of the sensor cells of a pixel may be sensitive to the first and second wavelength ranges 66 and 68. Alternatively or additionally, the pattern of sensor cells may be altered for the first wavelength range 66 such that sensor cells sensitive to the second wavelength range 68 are added and / or replaced from the pattern. The pixels of the image sensor area may be configured to generate an image in the first wavelength range 66 or at least partially generate an image in the second wavelength range 68.

[0127] While the above-described embodiments relate to single or stereoscopic capture of the entire field of view, the following describes implementations of multi-aperture imaging devices that may include the same or at least similar structural individual features, such as with regard to the implementation of the image sensor area, the optics, the coupling of the optics to the array, and / or the optional use of beam deflection means.

[0128] The embodiments described below aim to reduce the installation space and / or number of components required to obtain a miniature camera or multi-aperture imaging device. Furthermore, the described embodiments aim to counteract the effects of occlusion, i.e., masking of image content.

[0129] In this regard, embodiments relate to a multi-aperture imaging device having an image sensor means with multiple image sensor areas. This refers to the fact that a single image sensor may be arranged, or several image sensors may be arranged in succession or at distributed locations. The multi-aperture imaging device includes multiple optical channels 42a-42c, where each optical channel includes an optical system for imaging a subfield of a total field of view onto an image sensor area 44a / 44c of the image sensor means 12 associated with the optical channel. The multiple optical channels 42a-42c are configured to completely image the total field of view. However, a first subfield of the total field of view and a second subfield of the total field of view are captured by different numbers of optical channels.

[0130] A different number allows for a smaller number of optical channels to be provided, which allows for a smaller camera. At the same time, occlusion effects can be at least partially eliminated by proper placement of the optical channels, especially optical channels that capture a partial field of view multiple times, allowing for higher quality images.

[0131] 11a shows a schematic perspective view of a multi-aperture imaging device 110 associated with this embodiment. The multi-aperture imaging device 110 includes an image sensor 12, also referred to as image sensor means, that includes image sensor areas 44a-44c configured to receive images of the optical channels 42a-42c and convert them into electronic signals. An optional beam deflection means 18 may deflect the optical paths 22-1-22-3 of the optical channels 42a-42c.

[0132] 11b shows a schematic top view of the multi-aperture imaging device 110 of FIG. 11a, as well as a schematic diagram of the entire field of view 60 captured or recorded by the multi-aperture imaging device 110. For example, the multi-aperture imaging device 110 includes three optical channels, although any greater number, e.g., 4, 5, 6, 7, 8, 9, 10, or more, may be implemented. The principles described herein remain valid. Thus, improved resolution, etc., may be obtained with the additional optical channels.

[0133] The optical channels are arranged adjacently in the array 14. The optical channels for imaging the partial field of view 64b are illustratively arranged between the optical channels for imaging the partial field of view 64a in the array 14. Alternatively, a different implementation may be selected.

[0134] The overall field of view 60 is exemplarily divided into two partial fields of view 64a and 64b, although any other division is also possible, in particular three or more partial fields of view arranged in one or two dimensions within the object region.

[0135] The partial fields of view 64a and 64b may be arranged adjacent to one another and may overlap within an overlap region 82. For example, the centers 74a and 74b, e.g., geometric centers, of the partial fields of view 64a and 64b, respectively, form a single column array 76 arranged transversely or perpendicularly to the line extension direction y of the array 14. However, it is also possible to position the partial fields of view 64a and 64b differently. However, arranging the array 76 transversely to the line extension direction y advantageously allows, among other things, to avoid occlusion.

[0136] Multi-aperture imaging device 110 is implemented such that partial field of view 64b is imaged through a single optical channel, i.e., optical channel 42b. Single may be understood to mean that only a single channel is provided to capture the partial field of view to create the overall image. In contrast, partial field of view 64ba is imaged through optical channels 42a and 42c, i.e., a different number than partial field of view 64b. The number of optical channels is adjusted to the number of times each partial field of view 64a or 64b is actually imaged by multi-aperture imaging device 60 and the number of times the acquired information is used to create the overall field of view. For example, this does not include adding or otherwise capturing partial fields of view that are implemented differently with respect to orientation and / or size, e.g., used for wide-angle or zoom functions, as described below. Identical partial fields of view refer to coincident portions within the object field that may have mechanical tolerances but do not include intentional misalignment within the object field.

[0137] According to the embodiment of Figures 11a and 11b, the partial field of view 64a is now captured stereoscopically, but the partial field of view 64b is recorded a different number of times, for example a smaller number, namely once.

[0138] Preferably, the depth information is used to combine or stitch the individual images of the partial fields of view 64a and 64b. The same may be created for the partial field of view 64a by means for image evaluation 78. The means for image evaluation is directly or indirectly connected to the image sensor 12 and is configured to acquire and evaluate image information from the image sensor areas 44a-44c.

[0139] For example, for partial field of view 64a, image information captured from different viewing directions of optical channels 42a and 42c is available from the two optical channels of partial field of view 64a. Means for image evaluation 78 may be configured to combine the image information of partial field of view 64a to obtain depth information of the corresponding partial image.

[0140] Therefore, depth information may also be obtained for overlap region 82 where partial fields of view 64a and 64b overlap each other. This makes it possible to implement image evaluation means 78 such that image information of partial field of view 64a is aligned with image information of partial field of view 64b acquired by optical channel 42b and evaluated by means 78. That is, the image of partial field of view 64b may be used as a reference image, and individual objects and / or the overall image of partial field of view 64a may be aligned with the partial image of partial field of view 64b.

[0141] This makes it possible, via means 78, to acquire an overall image based on different numbers of partial images within different overall image areas, for example based on two captures within the overall image area of ​​partial field of view 64a and based on a single capture within the overall image area of ​​partial field of view 64b.

[0142] This allows for the omission of a fourth optical channel for capturing the partial field of view 64b twice, thereby enabling a smaller size of the multi-aperture imaging device 110. Furthermore, stereoscopic capture 64a may be used to avoid occlusion, which is particularly effective when the optical channels for capturing the same partial field of view are as far apart as possible within array 14 and / or when array 76 is positioned transversely / perpendicular to the line extension direction y.

[0143] A multi-aperture imaging device may also include a different arrangement of optical channels for the sub-fields of view and / or a different number of optical channels. Also, a one-dimensional or two-dimensional arrangement of the sub-fields of view within the overall field of view may be implemented. Instead of capturing two sub-fields of view with three optical channels as shown, this may also result in a different combination, such as nine sub-fields of view imaged with twelve optical channels.

[0144] 12a shows a schematic perspective view of multi-aperture imaging device 120 according to one embodiment, in which the arrangement of optical systems 41a-41c and / or optical channels 42a-42c has been modified compared to multi-aperture imaging device 110. The field of view directions of the optical channels in multi-aperture imaging device 100 may be identical, at least in the region between the image sensor and the optical systems, i.e., the optical channels have substantially the same field of view directions, whereas the field of view directions of the optical channels of multi-aperture imaging device 110 may be different, for example, by having the field of view direction of optical channel 42b being opposite to the field of view directions of optical channels 42a and 42c.

[0145] Thus, for example, the optical channels form two facing groups. For example, compared to multi-aperture imaging device 110, optical channels 42a and 42c are arranged opposite optical channel 42b, such that optical system 41b for imaging partial field of view 64b is arranged opposite optical systems 41a and 41c for imaging partial field of view 64a. Multi-aperture imaging device 120 comprises beam deflection means 18 implemented such that optical paths 22-1 to 22-3 are deflected. For this purpose, beam deflection means 18 is arranged between one optical system 41a to 41c and the other optical system 41b.

[0146] The beam deflection means 18 may implement a fixed deflection angle. In such a case, the beam deflection means 18 may be implemented, for example, as a fixedly arranged prism or mirror. It is also possible to use a mutual carrier substrate for both deflection surfaces, onto which corresponding facets are subsequently applied using molding techniques.

[0147] Alternatively, the beam deflection means 18 may be configured to change the line of sight of the multi-aperture imaging device. In this case, the beam deflection means 18 may be implemented such that the beam deflection elements 32a and 32b are supported so that they can rotate about themselves, possibly about parallel rotation axes. For example, as described in connection with Figures 4a to 4h, the beam deflection means 18 can be implemented such that the beam deflection elements are configured to reflect on both sides and deflect the optical paths 22-1 to 22-3 in different states at different major surfaces. Alternatively, the same major surface can be used for deflection in both states.

[0148] With respect to the positions of the optical systems 41 a and 41 c, the optical system 41 b may exemplarily be opposite one of the two optical systems 41 a or 41 c or may have a different position. Locating the optical system 41 b centrally with respect to the optical systems 41 a and 41 c is advantageous as it allows for a symmetrical implementation of the multi-aperture imaging device.

[0149] Since optical paths that may run parallel to one another in the region between image sensor 121 and array 141 are deflected toward the same partial field of view, beam deflecting element 32a may be formed as a reciprocal facet of optical paths 22-1 and 22-3. Alternative embodiments provide individual implementations or arrangements of beam deflecting elements for optical channels 42a and 42c.

[0150] The arrangement of optical channels 42a, 42b and 42c is advantageous but exemplary. Thus, it is also possible to arrange optical channel 42b together with optical channels 42a or 42c in a mutual array 141, with the remaining optical channels opposite it being arranged in array 142 formed by a single optical channel. As discussed in connection with the multi-aperture imaging device 110, different numbers of optical channels may be arranged overall.

[0151] 12b shows a schematic top view of multi-aperture imaging device 120 along with a diagram of overall field of view 60. The face-to-face arrangement of optical channels 42a and 42c on the one hand and optical channel 42b on the other allows for symmetrical capture of overall field of view 60, similar to multi-aperture imaging device 110.

[0152] 11a, 11b, 12a, and 12b illustrate an embodiment of a multi-aperture imaging device that includes exactly three optical channels configured to completely image full field of view 60 through partial fields of view 64a and 64b, further embodiments embody the fact that different numbers of optical channels and / or partial fields of view are provided. For implementations of multi-aperture imaging devices 110 and 120, the optical channel for imaging one of the partial fields of view may be adjacently positioned and spaced apart from the optical channel for imaging a different partial field of view, as described for multi-aperture imaging device 110.

[0153] As an alternative to this, as described in connection with the multi-aperture imaging device 120, an optical channel for imaging a partial field of view can be positioned adjacent and opposite one or several optical channels for imaging a different partial field of view.

[0154] Each of the illustrated optical channels includes an associated image sensor area 44. These components, the optics and image sensor area, and possibly further components as well, may each be combined into a module, such that the multi-aperture imaging device is provided as a combination of modules. In this case, the module may include one or more optical channels. A module having at least two optical channels and / or image sensor areas may be implemented such that the optics of the image sensor areas and / or optical channels include a mutual substrate, for example in the form of the carrier 39 described in relation to FIG. 5a.

[0155] In combination, multi-aperture imaging device 110 and multi-aperture imaging device 120 are implemented such that a first group of optical channels completely captures entire field of view 60, i.e., partial fields of view 64a and 64b. It may be fully understood that all necessary image information is available. Additional optical channels are not required or provided to create the entire image. For example, a group may include optical channels 42a and 42b or 42c and 42w. A further group of optical channels, which may include only a single optical channel, is configured to partially capture the entire field of view. This may be the other of optical channels 42a or 42c, respectively.

[0156] 13a shows a schematic top view of a multi-aperture imaging device 1301, which may be implemented similarly to multi-aperture imaging device 110. As with multi-aperture imaging device 110, corresponding numbers within the regions of optical channels 42 indicate associated partial fields of view 64 within the object region. For example, an arrangement of array 141 having optical channels 42a, 42b, and 42c may be formed as a mutual module 841 including, for example, a continuous transparent carrier 391. Additionally, for example, a continuous single image sensor 121 may be provided having corresponding image sensor regions.

[0157] In addition to capturing or imaging an overall field of view 601, which may illustratively correspond to overall field of view 60 of Figure 11b, the multi-aperture imaging device further comprises optical channels 42d and 42e configured to together sample overall field of view 602. Overall field of view 602 includes an overlap with overall field of view 601. Although overall field of view 602 is shown to be a portion of overall field of view 601, overall field of view 601 may alternatively be a portion of overall field of view 602, which may be based on the size of the individual sub-fields.

[0158] Thus, optical channels 42a-42e are still configured to asymmetrically image, i.e., asymmetrically image, different numbers of sub-fields of view of, overall field of view 601. Further additional optical channels 42d and 42e are associated with different sub-fields of view of different overall fields of view.

[0159] Partial fields of view 64c and 64d may be arranged parallel to the arrangement of partial fields of view 64a and 64b, although different arrangements are possible. Overall field of view 602 is shown as forming a central portion of overall field of view 601, but different positioning and / or orientation is possible. This may be adjusted by adjusting the beam deflection and / or the relative orientation of optical channels 42d and 42e with respect to optical channels 42a and 42c.

[0160] As an example, the arrangement of optical channels 42d and 42e is formed as a second or further module 842. However, the optical channels 42a-42e may be formed in any arrangement from one or several modules.

[0161] The means 78 may be connected to the image sensors 121 and 122 to acquire image information for one, some, or all of the partial fields of view. The means 78 may be configured to combine and / or stitch the imaging information of the partial fields of view 64c and 64d, without stereoscopically sampling the partial fields of view 64c and 64d. This means that orientation of individual image regions or objects outside the overlap region 822 of the partial fields of view 64c and 64d is possible even if there is no direct stereoscopic information outside the overlap region 822. For this purpose, the means 78 may be configured to generate stereo pairs of the partial fields of view of different overall fields of view, for example, by generating a pair of the partial field of view 64a from the optical channels 42a and / or 42c for the partial field of view 64c and / or by forming a stereo pair from the partial fields of view 64b and 64d. The symmetrical arrangement of the partial fields of view shown is advantageous, but is not intended to limit the embodiment in this respect.

[0162] Each individual module 841 and 842 may comprise optional beam deflection means 181 and 182, respectively. Alternatively, beam deflection means 181 and / or 182 may also be located outside the module or may not be provided at all.

[0163] 13b shows a schematic top view of a multi-aperture imaging device 1302, in which, in contrast to multi-aperture imaging device 1301, the optical channels 42a-42e are formed as a mutual module with image sensor 12 comprising corresponding image sensor regions for optical channels 42a-42e. For example, the module is formed without optional beam deflection means 181 and 182, such that beam deflection means 181 and 182 can be arranged and / or positioned separately. Alternatively, the optional beam deflection means may also be implemented to include beam deflection regions 32a-32e operable for all optical channels.

[0164] As illustrated in FIG. 13a, the optical channels 42a-42e may be arranged in a mutually linear array of optical channels, in which case said array may be formed by two sub-arrays 141 and 142 or by mutual modules.

[0165] 13c shows a schematic top view of multi-aperture imaging device 1303, which may be configured similarly to multi-aperture imaging devices 1301 and 1302. In contrast to these multi-aperture imaging devices, optical channels 42d and 42e for capturing partial field of view 602 may be spaced apart from one, some, or all of optical channels 42a-42c for capturing partial field of view 601. In this manner, optical channels 42a-42c may form a linear arrangement and may be located, for example, between optical channels 42d and 42e. It is also conceivable, for example, to interchange optical channels 42a and 42e and / or optical channels 42c and 42d.

[0166] Figure 13d shows a schematic top view of a multi-aperture imaging device 1304 according to one embodiment, in which the optical channels 42a-42c for imaging the overall field of view 601 and the optical channels for imaging the overall field of view 602 are not arranged in different linear arrays of optical channels as in Figure 13a, but rather some or even all of the optical channels 42a-42e for capturing different overall fields of view are arranged in mutual linear arrays 14.

[0167] In some cases, the different sizes of the partial fields of view 64a and 64b on the one hand and 64c and 64d on the other hand may result in different dimensions or sizes of the optics of the optical channels. In this regard, it may be advantageous to implement the light beam deflection elements individually or, at most, to group them in groups of optical channels with the same focal length, as shown, for example, in Figures 13a, 13b, 13c and 13d.

[0168] 14 shows a schematic top view of a multi-aperture imaging device 140 according to one embodiment, in which optical channels 42a-42e are arranged in a mutually linear array 141, which is arranged opposite a linear array 142 including optical channels 42d and 42e, for example. Corresponding deflection of the optical paths towards the partial fields of view 64a and 64d of the overall fields of view 601 and 602 may be performed using beam deflection elements 32a-32e arranged in one or several beam deflection means. Grouping the optical channels based on their association with the overall fields of view 601 and 602 is chosen as an example to illustrate an advantageous implementation. However, the embodiments are not limited thereto and relate to any arrangement of optical channels in different arrays.

[0169] The optical channels described herein may each be arranged in the same plane so that the dimension of the multi-aperture imaging device along the z-direction can be kept as small as possible. For example, the arrays described herein are arranged in a single line so that different arrays, such as arrays 141 and 142, which may also be called sub-arrays, are arranged generally in the same plane and each form a line, even when these lines run parallel to each other and face each other.

[0170] The arrays 141 and 142 arranged opposite each other may be symmetrically or centrally arranged relative to each other such that the optics of the different arrays 141 and 142 are shifted relative to each other or are opposite each other within the array and / or beam deflection region, for example, as exemplarily described in connection with the multi-aperture imaging device 120.

[0171] FIG. 15 shows a schematic top view of an array 14 of the present invention, which may include optical channels 42a-42c, but may also include different, particularly additional, optical channels. In array 14 implemented as a linear array along the line extension direction, for example, optical channels 42a-42c are adjacently arranged. The array may include a carrier 39 mounted to mechanically fix at least a portion of the optical systems of optical channels 42a-42c. Thus, for example, optical systems 41a-2 and 41a-3, such as lenses or diffractive elements, of optical channel 42a and / or optical systems 41b-2 and / or 41b-3 of optical channel 42b and / or optical systems 41c-2 and / or 41c-3 of optical channel 42c may be arranged in a mechanically fixed manner on all major surfaces of carrier 39. Alternatively or additionally, further mechanical elements, such as lens holders, can be attached to the carrier 39, into which the optical elements 41a-1, 41b-1, and / or 41c-1 of the optical channels 42a-42c can then be placed. This advantageously allows for mutual movement of the optical systems and for their positions relative to one another to remain substantially constant. The optical channels 42a-42c can extend through the carrier 39, which can be implemented in a transparent manner, for example by using glass or polymer materials. Alternatively, the carrier 39 can comprise at least transparent regions, through which the optical channels 42a-42c extend, that are transparent for the wavelength ranges determined for the optical channels 42a-42c.

[0172] The described multi-aperture imaging devices 110, 120, 1301 to 1304 and 140 are independent of each other and can easily be combined individually with the described embodiments of optical image stabilization and / or focusing, which are implemented such that the actuators of the image stabilization and / or focusing means are at least partially located between planes 63a and 63b, as described in relation to Figure 5c.

[0173] In other words, a multi-aperture camera may be implemented according to the principle of channel-by-channel division of the entire field of view, which may have the advantage of reducing the installation height (z-direction) compared to conventional cameras. For this purpose, several adjacently arranged imaging channels may be provided. A larger number of components and greater installation effort for implementing the channels increases the cost and size of the structure. This means that the space requirements increase in the x / y direction. In the embodiments described herein, the arrangement in which the entire field of view is completely captured by two groups of channels is changed, and four channels are used for each of the two partial fields of view for this purpose. The entire field of view is completely imaged, and information about the depth location in object space is available throughout the field of view, resulting in a reduction in the number of optical channels. To reduce installation space and use fewer components, in the described embodiments, a group of channels completely captures the entire field of view, while a further group captures only a portion of it. Therefore, the groups may be implemented with different numbers of channels, with the optical channels being guided to match the partial fields of view. In an advantageous but simple implementation, the first group has only two channels (e.g., upper and lower, or right and left), and the second group has only one channel (only upper or only lower / only right or only left). Image data is available completely over the entire field of view. Depth information is available only for the portion seen or imaged by the two channels.

[0174] This involves an arrangement of top / bottom / top or bottom / top / bottom or equivalently right / left ordering, such that the resulting stereo pair surrounds or contains a channel that samples the partial field of view only once. Alternatively, other arrangements are possible, such as bottom / bottom / top. Additional depth sensors such as time-of-flight / structured light or additional stereo data may be used for depth information across the field of view.

[0175] The embodiment allows for the construction of a small camera while avoiding occlusion effects. Single-channel images are not subject to parallax and may be used as reference images. Two-channel images are parallax-free only at infinite distances of the object region. When the distance is finite or short, parallax occurs, preventing stitching. This may be achieved by sampling the additional object region to be stitched twice. The centrally located raw image can be complemented by an outer image showing the parallax in the optical channel, while together they can compensate or meet the occlusion.

[0176] In a further aspect of the embodiments described herein, a third group of optical channels, preferably two channels covering an additional overall field of view by capturing partially overlapping partial fields of view, is provided in addition to the first group (preferably two channels) having a complete field of view and the second group (preferably only one channel) having only a partial field of view. The additional overall field of view may at least partially overlap the first overall field of view, preferably resulting in complete overlap between one overall field of view and the other, i.e., one overall field of view is preferably a portion of the other overall field of view. This may mean complete overlap in which the overall fields of view are different in size. For example, this may be a zoom structure of the additional channels, as exemplarily illustrated in FIG. 14, or it may be a wide-angle structure. In this case, the third group of channels surrounds the first and second groups.

[0177] These embodiments can be optionally and individually combined with the orthogonality of the line vector of the array to the vector of the partial image field of the first group. Furthermore, a continuous substrate implementation for all channels of the array or for individual modules may be implemented. Tilting, double-sided mirroring, and / or a wedge-shaped design of the beam transformation / deflection means for changing the line of sight may be provided. Image stabilization utilizing translation of the array relative to the image sensor combined with rotation of the beam deflection means may also be provided. Z-direction focusing / stabilization devices may be provided, preferably implemented so that they are no larger than the extension of the multi-aperture imaging device in the z-direction specified by the optical system described with respect to the imaginary rectangular parallelepiped of the relevant planes 63a and 63b. Channel-specific adaptation of the image, particularly the focus position, may be performed by adaptive lenses. This means that the optical system of at least one optical channel includes an adaptive lens, while the multi-aperture imaging device comprises lens control means configured to adjust the optical properties of the adaptive lens. For example, this includes the focal length, the wavelength range of wavelengths transmitted or filtered out, the refractive index, etc.

[0178] Embodiments allow for a reduced number of channels, resulting in lower manufacturing costs and smaller footprint space requirements in the x / y directions, while also enabling high quality imaging.

[0179] In particular, embodiments can be used in the field of multi-aperture imaging systems in mobile means of smartphones, but also in the automotive field or machine imaging (machine segmentation).

[0180] While some aspects are described in the context of a device, it will be understood that the aspects also represent a description of a corresponding method, such that a block or structural element of a device should also be understood as a corresponding method step or feature of a method step. Similarly, an aspect described in the context of a method step also represents a description of a corresponding block or detail or feature of a corresponding device.

[0181] The above-described embodiments merely represent illustrative of the principles of the present invention. It is understood that others skilled in the art will appreciate any modifications and variations of the arrangements and details described herein. Therefore, it is intended that the present invention be limited only by the scope of the following claims and not by the specific details presented herein using the description and discussion of the embodiments.

Claims

1. an image sensor means (12) having a plurality of image sensor areas (44); a plurality of optical channels (42), each optical channel (42) including an optical system (41) for imaging at least a partial field of view (64) of a total field of view (60) onto an image sensor area (44) of the image sensor means (12) associated with said optical channel (42); A multi-aperture imaging device comprising: collectively, the plurality of optical channels (42) are configured to completely image the entire field of view (60); A multi-aperture imaging device, wherein a first subfield of view (64a) of the overall field of view (60) is captured by a first number of optical channels (42), and a second subfield of view (64b) of the overall field of view is captured by a second number of optical channels (42), the first number and the second number being different from each other.

2. a means (78) for image evaluation configured to acquire image information based on images of the plurality of partial fields of view (64) from the plurality of image sensor areas (44), and to combine corresponding partial images to acquire an overall image of the overall field of view (60), such that the overall image is based on different numbers of partial images in different overall image areas. The multi-aperture imaging device of claim 1 further comprising:

3. 3. The multi-aperture imaging device of claim 2, wherein the means (78) for image evaluation is configured to acquire first image information based on a combination of a first image of the first partial field of view (64a) and a second image of the first partial field of view (64a), and to acquire the overall image based on aligning the first image information with second image information, in order to acquire depth information regarding the first partial field of view (64a), wherein the second image information is acquired using an individual optical channel.

4. 4. The multi-aperture imaging device of claim 1, further comprising three optical channels configured to completely image the entire field of view (60) as a first entire field of view using the first partial field of view (64a) and the second partial field of view (64b), and at least one additional optical channel configured to completely image a second entire field of view, the second entire field of view at least partially overlapping the first entire field of view.

5. 5. The multi-aperture imaging device of claim 1, wherein the plurality of optical channels includes a first group of optical channels and a second group having at least one optical channel, the first group configured to completely capture the entire field of view (60) and the second group configured to not completely capture the entire field of view (60).

6. The multi-aperture imaging device of claim 5 , wherein the first group has a different number of channels compared to the second group.

7. 7. The multi-aperture imaging device of claim 6, wherein the first group of optical channels are implemented such that the optical channels are directed to match partial fields of view when compared to the optical channels of the second group of optical channels.

8. The multi-aperture imaging device of claim 6 , wherein the first group of optical channels and the second group of optical channels are configured to capture at least the entire field of view stereoscopically.

9. 9. The multi-aperture imaging device of claim 8, wherein at least one of the sub-fields of view is captured with a smaller number of optical channels (42) when compared to another sub-field of view.

10. 10. A multi-aperture imaging device as described in any one of claims 1 to 9, wherein the first partial field of view (64a) is imaged by exactly two optical channels (42a, 42c) and the second partial field of view (64b) is imaged by a single optical channel (42b).

11. 11. A multi-aperture imaging device as described in any one of claims 1 to 10, wherein the plurality of optical channels are arranged adjacently in an array (14) of optical channels (42), and an optical channel (42b) for imaging the second entire field of view (64b) is arranged between two optical channels (42a, 42c) for imaging the first partial field of view (64a) in the array (14).

12. a first optical system (41 b) of a first optical channel (42 b) for imaging the second partial field of view (64 b) is arranged opposite a second optical system (41 a) of a second optical channel (42 a) for imaging the first entire field of view (64 a) and a third optical system (41 c) of a third optical channel (42 c); 12. The multi-aperture imaging device of claim 1, further comprising a beam deflection means (18) for deflecting the optical paths (22) of the first optical channel, the second optical channel, and the third optical channel (42), the means being positioned between the first optical system on the one hand and the second and third optical systems on the other hand.

13. 4. A multi-aperture imaging device as described in any one of claims 1 to 3, wherein the optical channel for imaging the first partial field of view (64a) is arranged adjacent to and spaced apart from the optical channel (42b) for imaging the second partial field of view (64b).

14. 4. A multi-aperture imaging device as described in any one of claims 1 to 3, wherein the optical channel (42) for imaging the first partial field of view (64a) is arranged adjacent to and opposite the optical channel (42b) for imaging the second partial field of view (64b).

15. The overall field of view (60) is a first overall field of view (60 1 ), and the plurality of optical channels are arranged to provide a second overall field of view (60 2 and at least one optical channel (42d) for imaging a third partial field of view (64c) of said second full field of view (60). 2 and at least one optical channel (42e) for imaging a fourth partial field of view (64d) of said second full field of view (60). 2 ) is the first overall field of view (60 1 15. The multi-aperture imaging device of claim 1, including an overlap with

16. The second overall field of view (60 2 ) is the first overall field of view (60 1 ) or a section of said first field of view (60 1 ) is the second overall field of view (60 2 16. The multi-aperture imaging device of claim 15, wherein the aperture is one section of the aperture.

17. acquiring image information based on images of the plurality of partial fields of view (64) from the plurality of image sensor areas (44); 1 and using image information acquired by an image sensor area (44) associated with an optical channel for imaging the second partial field of view (60). 2 17. A multi-aperture imaging device according to claim 15 or 16, comprising means (78) for image evaluation configured to create a complete image of the

18. The first overall field of view (60 1 ) and the second overall field of view (60 2 18. A multi-aperture imaging device according to any one of claims 15 to 17, wherein the optical channels for imaging (a) and (b) are arranged in a mutually linear array (14) of optical channels.

19. The second overall field of view (60 2 The optical channel for capturing the first overall field of view (60 1 20. The multi-aperture imaging device of claim 18, wherein the at least one optical channel is spaced apart from at least one optical channel for capturing a light component.

20. The first overall field of view (60 1 ) are optical channels for imaging a first linear array of optical channels (14 1 ) and the second overall field of view (60 2 ) are optical channels for imaging the second linear array of optical channels (14 2 ) and the first array (14 1 ) and said second array (14 2 18. A multi-aperture imaging device according to claim 15, wherein the first and second apertures are arranged opposite each other.

21. 21. The multi-aperture imaging device of claim 1, wherein at least one first optical channel and a second optical channel of the plurality of optical channels are arranged adjacent to each other in a mutual array (14) of optical channels.

22. 22. The multi-aperture imaging device of claim 21, wherein the array comprises a mutual carrier (39), at least a portion of the optical systems (41) of the first optical channel and the second optical channel are mechanically fixed thereto, and the optical channels extend through the carrier (39).

23. 23. A multi-aperture imaging device as described in any one of claims 1 to 22, wherein the first partial field of view (64a) and the second partial field of view (64b) are arranged adjacent to each other within the overall field of view (60) and partially overlap each other.

24. the plurality of optical channels are arranged in plane with one another in at least one line extending along a first direction (y); 24. A multi-aperture imaging device as described in any one of claims 1 to 23, wherein the centers of the plurality of sub-fields of view are adjacent in a second direction to form a one-dimensional array and are arranged perpendicular to the first direction.

25. 25. A multi-aperture imaging device according to any one of the preceding claims, comprising beam deflection means (18) for deflecting the optical paths (22) of the plurality of optical channels (42).

26. 26. The multi-aperture imaging device of claim 25, wherein the beam deflection means (18) is formed in an array of facets, one asset associated with each optical channel (42), each of the facets comprising a first beam deflection region and a second beam deflection region, and the facets are formed as mirrors reflecting on both sides.

27. 27. The multi-aperture imaging device of claim 26, configured to deflect the plurality of optical channels in a first direction at a first major surface in a first state and to deflect the plurality of optical channels in a second direction at a second major surface in a second state, the beam deflection means (18) being rotatably movable between the first state and the second state.

28. 28. A multi-aperture imaging device as described in any one of claims 1 to 27, wherein at least one optical channel is part of an imaging module comprising combined means including the optical system (41) of the optical channel and the associated image sensor area (44).

29. 29. A multi-aperture imaging device according to claim 28, wherein one module comprises at least two optical channels, and the image sensor areas (44) and / or the optics (41) of the optical channels comprise mutual substrates.

30. beam deflection means (18) for deflecting the optical path (22) of said optical channel (42); an optical image stabilization device configured to generate a relative movement between the image sensor means (12), the optical system (41) of the optical channel and the beam deflection means based on a translational movement between the image sensor means and the optical system, parallel or non-parallel to a line extension direction (y) in which the optical system is arranged, and / or based on a rotation of the beam deflection means (18) around a rotation axis, in order to enable optical image stabilization; 30. A multi-aperture imaging device according to any one of claims 1 to 29, comprising:

31. 31. The multi-aperture imaging device of claim 30, wherein the image stabilization device includes at least one actuator and is positioned so as to be at least partially located between two planes (63a, 63b) spanned by sides of a rectangular prism, the sides of which are aligned parallel to each other and to a line extension direction (y) of the array of optical channels and to a portion of the optical path of the optical channel between the image sensor means and the beam deflection means (18), and whose volume is as small as possible while still including the image sensor means, the array (14), and the beam deflection means.

32. 32. A multi-aperture imaging device according to any one of claims 1 to 31, comprising focusing means including an actuator for providing relative movement between an optical system (41) of one of the optical channels and the image sensor means (12).

33. beam deflection means (18) for deflecting the optical path (22) of the optical channel (42); 33. The multi-aperture imaging device of claim 32, wherein the focusing means comprises at least one actuator for adjusting the focus of the multi-aperture imaging device, and the focusing means is arranged so as to be at least partially positioned between two planes (63a, 63b) spanned by sides of a rectangular prism, the sides of which are aligned parallel to each other and to the line extension direction (y) of the array of optical channels (42) and to a portion of the optical path (22) of the optical channel between the image sensor means (12) and the beam deflection means (18), and whose volume is as small as possible while still including the image sensor means, the array (14) and the beam deflection means (18).

34. 34. A multi-aperture imaging device according to any one of claims 1 to 33, wherein the optical system (41) of at least one optical channel includes an adaptive lens, and the multi-aperture imaging device comprises lens control means configured to adjust the optical properties of the adaptive lens.

35. the plurality of optical channels includes a first group of optical channels and a second group having at least one optical channel, the first group configured to completely capture the entire field of view (60), and the second group configured to partially capture the entire field of view (60); 2. The multi-aperture imaging device of claim 1, wherein the plurality of optical channels are arranged adjacently in an array (14) of optical channels (42), and an optical channel (42b) for imaging the second entire field of view (64b) is arranged between two optical channels (42a, 42c) for imaging the first partial field of view (64a) in the array (14).

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