TCR calibration method and apparatus, calibration device, and readable storage medium

Abstract

The present invention relates to the technical field of temperature calibration of heating bodies, and in particular to a temperature coefficient of resistance (TCR) calibration method and apparatus, a calibration device, and a readable storage medium. The TCR calibration method comprises: calibrating at least one first heating body to obtain a standard TCR of the first heating body; then heating the first heating body on the basis of a preset condition, and obtaining at least one standard temperature variable on the basis of the standard TCR; then heating at least one second heating body on the basis of the same preset condition to acquire obtain at least one test resistance variable of the second heating body; and finally obtaining the TCR of the at least one second heating body on the basis of the standard temperature variable and the test resistance variable. Therefore, the technical problems of a complex operation process and inaccurate calculation results in TCR calibration of heating bodies are solved.

Description

TCR calibration method, device, calibration equipment and readable storage medium Technical Field

[0001] The present invention relates to the technical field of temperature calibration of heating elements, and in particular to a TCR calibration method, device, calibration equipment and readable storage medium. Background Art

[0002] As users' health awareness continues to improve, electronic atomizing devices are gradually favored by the public. During the operation of electronic atomizing devices, the heating element of the atomizing component is used to heat and atomize the atomizing liquid / aerosol generating product to form an aerosol for users to inhale.

[0003] The temperature of the heating element in an electronic vaping device is determined by its temperature coefficient of resistance (TCR). The temperature coefficient of resistance (TCR) refers to the degree to which the resistance of a material or device changes with temperature and is typically used to describe the thermal sensitivity of metals or semiconductor materials. The unit of TCR is ppm / °C, which is the rate of change of resistance per degree Celsius of temperature change. For example, if a device has a TCR of 50ppm / °C, it means that for every 1 degree Celsius increase in temperature, the device's resistance increases by 50ppm (or 0.005 ohms). Therefore, the TCR is particularly important in the performance parameters of the heating element in electronic vaping devices.

[0004] Currently, during the TCR calibration of a heating element, it is necessary to use an infrared device for calibration when the heating element is not obstructed. When an infrared device measures the temperature of a heating element, the position and time of measurement are prone to deviations. Since the position and angle of the infrared device are different during the process of measuring the temperature of the heating element, the accuracy of the temperature actually measured by the infrared device will be affected, and even an incorrect temperature T may be obtained due to obstruction. In addition, since the surface temperature of the heating element is unevenly distributed during the heating process, this temperature difference will gradually decrease with continuous heating and the overall thermal equilibrium state of the heating element. During this process, the resistance of the heating element will also change. However, when to measure this resistance value is manual operation, there is a certain degree of arbitrariness, which leads to low consistency in this operation and inaccurate measurement results.

[0005] Therefore, when calibrating the TCR of the heating element using infrared equipment, there are clear and stringent requirements for the position and angle of the heating element. In addition, during the calibration process, the current temperature needs to be continuously fed back to the heating element until the temperature error between the TCR calculated and the temperature of the infrared equipment is within a certain range. Therefore, the operation process is cumbersome and the calculation results are inaccurate. Summary of the Invention

[0006] The present invention mainly solves the technical problems that the operation process is cumbersome and the calculation result is inaccurate during the TCR calibration of the heating element.

[0007] To solve the above technical problems, an embodiment of the present invention provides a TCR calibration method, including:

[0008] Calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element;

[0009] heating the first heating element based on a predetermined condition and obtaining at least one standard temperature variable according to a standard resistance temperature coefficient;

[0010] heating at least one second heating element based on the same predetermined conditions, and obtaining at least one test resistance variable of the second heating element;

[0011] Obtain the resistance temperature coefficient of at least one second heating element based on the standard temperature variable and the test resistance variable.

[0012] An embodiment of the present invention further provides a TCR calibration device, comprising:

[0013] a standard machine calibration module, the standard machine calibration module being used to calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element;

[0014] a standard temperature variable acquisition module, configured to heat the first heating element based on a predetermined condition and acquire at least one standard temperature variable according to a standard resistance temperature coefficient;

[0015] a test resistance variable acquisition module, the test resistance variable acquisition module being used to heat at least one second heating element based on the same predetermined conditions and acquire at least one test resistance variable of the second heating element;

[0016] A test machine calibration module is used to obtain the resistance temperature coefficient of at least one second heating element based on a standard temperature variable and a test resistance variable.

[0017] An embodiment of the present invention further provides a calibration device, comprising a communication bus, a memory, and a processor;

[0018] The communication bus is used to realize the connection and communication between the processor and the memory;

[0019] The memory is used to store programs;

[0020] The processor is configured to implement the TCR calibration method described above by executing the program stored in the memory.

[0021] An embodiment of the present invention further provides a computer-readable storage medium, which stores one or more computer programs. The one or more computer programs can be executed by one or more processors to implement the TCR calibration method as described above.

[0022] According to the TCR calibration method, device, calibration equipment and readable storage medium of the above-mentioned embodiment, a first heating element is selected as a standard machine, and the standard resistance temperature coefficient of the standard machine is obtained through a series of precise measurements. The power is input to the standard machine according to the specified power to obtain the standard temperature. Since the temperature curves of different heating elements are highly consistent when the power is consistent, the resistance temperature coefficient TCR of the second heating element can be obtained by detecting the resistance values ​​of multiple second heating elements only by calibrating the standard machine once. The calibration operation is simplified, the calibration efficiency is improved, and the influencing factors during temperature detection are avoided, thereby improving the accuracy of the calculation results. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] FIG1 is a flow chart (I) of a TCR calibration method provided by an embodiment of the present application;

[0024] FIG2 is a flow chart (II) of a TCR calibration method provided by an embodiment of the present application;

[0025] FIG3 is a flowchart (III) of a TCR calibration method provided by an embodiment of the present application;

[0026] FIG4 is a flowchart (four) of a TCR calibration method provided by an embodiment of the present application;

[0027] FIG5 is a flowchart (V) of a TCR calibration method provided by an embodiment of the present application;

[0028] FIG6 is a schematic structural diagram of a TCR calibration device provided in an embodiment of the present application.

[0029] Reference numerals: 61, standard machine calibration module; 62, standard temperature variable acquisition module; 63, test resistance variable acquisition module; 64, test machine calibration module. DETAILED DESCRIPTION

[0030] The present invention will be further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core portion of the present application being overwhelmed by excessive descriptions, and for those skilled in the art, it is not necessary to describe these related operations in detail. They will fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0031] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various embodiments. Furthermore, the steps or actions in the method description may be reordered or adjusted in a manner readily apparent to those skilled in the art. Therefore, the various sequences in the specification and drawings are provided solely for the purpose of clearly describing a particular embodiment and are not intended to be mandatory, unless otherwise specified.

[0032] Component numbers used herein, such as "first" and "second," are used solely to distinguish the components being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings).

[0033] In this context, TCR, or temperature coefficient of resistance, refers to the degree to which the resistance of a material or device changes with temperature. It is typically used to describe the thermal sensitivity of metals or semiconductor materials. TCR is a physical quantity related to the material itself, and different materials have different TCR values. The unit of TCR is typically ppm / °C, which is the rate of change of resistance per degree Celsius of temperature change. For example, if a device has a TCR of 50ppm / °C, it means that for every 1°C increase in temperature, the device's resistance increases by 50ppm (or 0.005 ohms).

[0034] In an embodiment of the present invention, the first heating element and the second heating element are heating elements of the same specifications, have the same structure and materials, and are produced and processed by the same process. First, select at least one first heating element, calibrate it, and obtain its standard TCR value; then heat the first heating element to a specified time according to a specified power, and calculate the standard temperature based on the resistance of the first heating element when it is in thermal equilibrium; take the second heating element as the calibrated object, and heat it to the same time according to the same specified power as the first heating element. Since the temperature curves of different heating elements are highly consistent when the power is consistent, the standard temperature is regarded as its test temperature, and the TCR value of the second heating element is calculated based on its test resistance; repeat multiple times to obtain the TCR values ​​of multiple different second heating elements.

[0035] In an embodiment of the present invention, the thermal equilibrium state of the first heating element and the second heating element can both be a state at a stable normal temperature and pressure. Of course, it also includes the state where the first heating element and the second heating element are at any stable temperature and any stable pressure. It can be understood that: when the heat absorbed by the first heating element or the second heating element and the heat dissipated reach a balance, it is considered that the first heating element or the second heating element has reached a thermal equilibrium state.

[0036] In the embodiment of the present invention, normal temperature and pressure refer to the external ambient temperature and pressure of the first heating element or the second heating element, and the thermal equilibrium state under normal temperature and pressure refers to the state in which the temperature of the first heating element or the second heating element is consistent with the external ambient temperature.

[0037] Example 1:

[0038] Referring to FIG1 , in order to solve the technical problems in the prior art of TCR calibration of heating elements, such as the cumbersome calibration process, multiple and strict control parameters, and inaccurate calculation results, this embodiment provides a TCR calibration method, including the following steps:

[0039] Step S101: calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element.

[0040] In this embodiment, a first heating element is first calibrated. When the first heating element can provide a stable temperature change and thermal equilibrium state when heated, or when the first heating element is a normal and qualified product, there is no need to select other first heating elements. When the performance of the first selected first heating element is unstable or a stable standard resistance temperature coefficient cannot be obtained, another first heating element is selected for calibration until the standard resistance temperature coefficient can be stably measured.

[0041] A heating element is similar to a resistance wire; it generates heat when voltage is applied across its two ends. As the temperature changes, the resistance of the heating element also changes. When calibrating the first heating element, infrared rays representing the temperature are received through the lens of the infrared thermal imager. The wavelength of the infrared rays is directly related to the temperature. The temperature T of the first heating element is measured using an infrared device, and this temperature is fed back to a calibration device, such as a computer. The standard TCR value is then calculated based on this value. Of course, the first heating element can also be calibrated using a thermocouple or other methods.

[0042] For example, during the heating process of the first heating element, at a certain moment, the initial temperature of the first heating element is T0 and the initial resistance is R0; after a period of heating, the temperature of the first heating element is T and the resistance is R, then TCR=(R-R0) / [R0(T-T0)]. TCR represents the relationship between the resistance and temperature of the heating element. Therefore, based on TCR, by obtaining the resistance R of the first heating element at any moment, the current temperature T corresponding to the resistance R can be calculated. The calibration process of the first heating element is the process of calculating the standard TCR value of the first heating element.

[0043] Step S102: heating the first heating element based on a predetermined condition, and obtaining at least one standard temperature variable according to a standard resistance temperature coefficient.

[0044] In this embodiment, the predetermined conditions may be a certain power and a certain time, and the determined values ​​of the power and time are obtained. By providing a certain amount of power to the first heating element for a certain period of time, the temperature of the first heating element gradually increases to a certain temperature until it cannot rise any further. At this point, the first heating element reaches a thermal equilibrium state, i.e., the energy absorbed by the first heating element and the energy dissipated to the outside world are balanced, and the temperature of the first heating element is therefore stable. The temperature of the first heating element at the thermal equilibrium state is obtained by calculation or direct measurement as the standard temperature.

[0045] To obtain the temperature of the first heating element in a thermal equilibrium state by calculation, it is necessary to utilize the standard TCR value of the first heating element obtained in step S101, that is, the standard resistance temperature coefficient of the first heating element; in addition, when the first heating element is in a thermal equilibrium state, by obtaining the voltage across the first heating element, under the condition of known input power, the current resistance value of the first heating element in a thermal equilibrium state is calculated by the formula P=U*U / R; the predetermined conditions are changed and the calculation method of this step is repeated to obtain at least two current resistance values ​​of the first heating element in two different thermal equilibrium states, and at least one current resistance variable is obtained based on the two current resistance values; the standard temperature variable of the first heating element is obtained based on the current resistance variable and the standard resistance temperature coefficient.

[0046] The temperature of the first heating element at thermal equilibrium is obtained by measurement, using infrared, thermocouple, or other temperature measurement methods to directly measure the temperature of the first heating element at thermal equilibrium. The measurement method of this step is repeated by varying predetermined conditions to obtain at least two current temperatures of the first heating element at two different thermal equilibrium states, and at least one standard temperature variable of the first heating element is obtained based on the at least two current temperatures. Manual measurement results in greater error than calculation.

[0047] Step S103: heating at least one second heating element based on the same predetermined conditions, and obtaining at least one test resistance variable of the second heating element.

[0048] In this embodiment, the second heating element is heated using the same predetermined conditions as the first heating element, that is, the second heating element is provided with the same power of a certain magnitude as the first heating element, and the power is continued for the same certain time as the first heating element. The temperature of the second heating element will gradually increase to the same temperature as the first heating element. At this time, the second heating element reaches the same thermal equilibrium state as the first heating element, that is, the energy absorbed by the second heating element and the energy dissipated to the outside are balanced, so the temperature of the second heating element is stable. The above-mentioned heating principle of the second heating element is based on the theoretical basis that the temperature curves of different heating elements are highly consistent when the power is consistent. When the second heating element is in thermal equilibrium, the voltage across the second heating element can be obtained. When the input power is known, the test resistance of the second heating element in thermal equilibrium can be calculated using the formula P=U*U / R.

[0049] Change the same predetermined conditions as the first heating element and repeat the calculation method of this step to obtain at least two test resistance values ​​of the second heating element in at least two different thermal equilibrium states, and obtain at least one test resistance variable based on the two test resistance values.

[0050] Step S104: Obtain the resistance temperature coefficient of at least one second heating element according to the standard temperature variable and the test resistance variable.

[0051] In this embodiment, the standard temperature variable is ΔT, and the test resistance variable is ΔR, where ΔR=R2-R1, R1 and R2 are two test resistance values ​​of the second heating element in two different thermal equilibrium states, and the resistance temperature coefficient of the second heating element is calculated according to the formula TCR=ΔR / (R1*ΔT).

[0052] The above steps are performed on multiple second heating elements respectively, so as to obtain the resistance temperature coefficient of each second heating element, thereby achieving rapid and accurate calibration of a large number of heating elements.

[0053] Example 2:

[0054] Referring to FIG. 2 , in order to solve the technical problems in the prior art of TCR calibration of heating elements, such as the cumbersome calibration process, multiple and strict control parameters, and inaccurate calculation results, this embodiment provides a simpler TCR calibration method compared to the first embodiment, including the following steps:

[0055] Step S201: calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element.

[0056] In this embodiment, the first heating element can be calibrated according to the calibration method of embodiment 1, or the following method can be used: first, the initial temperature and initial resistance of the first heating element are obtained, and the initial temperature and initial resistance can be the temperature and resistance of the first heating element at normal temperature and pressure; second, the first heating element is heated to any equilibrium state, that is, the temperature is stable and maintained for a certain period of time, ensuring that the temperature of the first heating element is evenly distributed on its surface, and the temperature and resistance of the first heating element in this state are obtained; finally, the standard TCR value of the first heating element is calculated based on the initial temperature, initial resistance, temperature and resistance in the thermal equilibrium state. Furthermore, as a preference, the above steps are repeated multiple times to obtain multiple standard TCR values, and the average value of the multiple standard TCR values ​​is calculated, and the average value is used as the final standard TCR value to make the result more accurate.

[0057] For example, the initial temperature of the first heating element at room temperature and pressure is T0, and the initial resistance is R0. After heating for a period of time (60 seconds), the temperature of the first heating element is T and the resistance is R, then TCR = (R-R0) / [R0(T-T0)]. The calibration process of the first heating element is the process of calculating the standard TCR value of the first heating element.

[0058] Step S202: heating the first heating element based on a predetermined condition, and obtaining at least one standard temperature according to a standard resistance temperature coefficient.

[0059] The predetermined conditions of this embodiment are the same as those of the first embodiment. First, the initial temperature T0 and initial resistance R0 of the first heating element at room temperature and pressure are measured and obtained. Based on the initial temperature T0 and initial resistance R0, the first heating element is heated once according to the predetermined conditions to obtain a standard resistance R3 at thermal equilibrium. A standard resistance variable is obtained based on the difference between the standard resistance R3 and the initial resistance R0. A standard temperature variable is calculated based on the standard resistance variable and the standard TCR value. A standard temperature T3 is calculated based on the standard temperature variable and the initial temperature.

[0060] Alternatively, the standard temperature of the first heating element at thermal equilibrium can be obtained by measuring the temperature using infrared, thermocouple, or other temperature measurement methods. Manual measurement can result in greater errors than calculation.

[0061] Step S103: heating at least one second heating element based on the same predetermined conditions, and obtaining at least one test resistance value of the second heating element.

[0062] The predetermined conditions of this embodiment are the same concept as the predetermined conditions of Example 1. The second heating element is heated using the same predetermined conditions as the first heating element, that is, the second heating element is provided with the same power of a certain magnitude as the first heating element, and the power is continued for the same certain time as the first heating element. The temperature of the second heating element will gradually increase to a certain temperature that is the same as that of the first heating element. At this time, the second heating element reaches the same thermal equilibrium state as the first heating element, that is, the energy absorbed by the second heating element is balanced with the energy dissipated to the outside world, so the temperature of the second heating element is stable.

[0063] First, measure and obtain the initial temperature T0 and initial resistance R0 of the second heating element at normal temperature and pressure. Since the second heating element and the first heating element are products of the same specifications, under the same environment, the initial temperature and initial resistance of the second heating element are the same as the initial temperature and initial resistance of the first heating element; based on the initial temperature T0 and the initial resistance R0, the second heating element is heated once according to predetermined conditions to obtain the test resistance R4 in the thermal equilibrium state; the test resistance variable is obtained according to the difference between the test resistance R4 and the initial resistance R0.

[0064] Step S204: Obtain the resistance temperature coefficient of at least one second heating element according to the standard temperature and the test resistance value.

[0065] In this embodiment, the standard temperature is T3 and the test resistance is R4, so the formula for calculating the resistance temperature coefficient of the second heating element is TCR=(R4-R0) / [R0(T3-T0)].

[0066] The above steps are performed on multiple second heating elements respectively to obtain the resistance temperature coefficient of each second heating element, which can simultaneously achieve rapid and accurate calibration of a large number of heating elements. Compared with Example 1, the method steps of this embodiment are simpler in operation.

[0067] Example 3:

[0068] Referring to FIG. 3 , in order to accurately obtain the standard TCR value of the first heating element, based on the above embodiment, step S101 of calibrating at least one first heating element to obtain the standard temperature coefficient of resistance of the first heating element includes the following steps:

[0069] Step S301: heating the first heating element.

[0070] In this embodiment, the first heating element can be selected from a plurality of heating elements of the same specifications. If the first heating element can provide a stable temperature change and thermal equilibrium state when heated, or if the first heating element is a normal and qualified product, there is no need to select another first heating element. The first heating element is heated by applying a voltage to both ends of the first heating element, so that the first heating element can generate heat at its own resistance value, similar to a resistance wire.

[0071] Step S302: During the temperature change process of the first heating element, obtain the resistance variable and the temperature variable of the first heating element.

[0072] In this embodiment, the process of obtaining the resistance variable and temperature variable of the first heating element is as follows: during the temperature change process of the first heating element, at least two thermal equilibrium states are obtained; the first resistance and the second resistance of the first heating element in the two thermal equilibrium states are obtained respectively; the first temperature and the second temperature of the first heating element in the two thermal equilibrium states are obtained respectively; the resistance variable is obtained according to the first resistance and the second resistance, and the temperature variable is obtained according to the first temperature and the second temperature.

[0073] During the temperature change process, the first heating element is input with different powers to achieve at least two thermal equilibrium states. A first resistance value and a second resistance value, and a first temperature and a second temperature of the first heating element are obtained in the two thermal equilibrium states, respectively. The difference between the first resistance value and the second resistance value is the resistance variable, and the difference between the first temperature and the second temperature is the temperature variable.

[0074] The method for obtaining the first resistance value and the second resistance value is:

[0075] The voltages across the first heating element are obtained respectively when the first heating element is in two thermal equilibrium states. When the input power is known, the first resistance and the second resistance of the first heating element in the two thermal equilibrium states are calculated by the formula P=U*U / R.

[0076] The method for obtaining the first temperature and the second temperature is:

[0077] When the first heating element is in two thermal equilibrium states, the first temperature and the second temperature of the first heating element in the two thermal equilibrium states are directly measured by using infrared, thermocouple or other temperature measurement methods respectively; it is worth noting that when measuring the temperature twice, the temperature measurement conditions should be kept consistent, that is, the measuring position and time of the infrared, thermocouple or other temperature measurement methods on the first heating element are kept the same, that is, the temperature is measured at the same position on the first heating element when measuring the temperature twice, and when measuring the temperature, it is ensured that both measurements reach a thermal equilibrium state and maintain the equilibrium state for the same time.

[0078] Step S303: Obtain the standard resistance temperature coefficient of the first heating element according to the resistance variable and the temperature variable.

[0079] In this embodiment, the standard temperature coefficient of resistance of the first heating element, i.e., the standard TCR value, is calculated according to the formula TCR=ΔR / (R*ΔT), where the standard temperature variable is ΔT, the test resistance variable is ΔR, and R is the first resistance value or the second resistance value.

[0080] When ΔR≥0, R is the smaller value between the first resistance value and the second resistance value; when ΔR<0, R is the larger value between the first resistance value and the second resistance value.

[0081] In this embodiment, preferably, the thermal equilibrium state of the first heating element may include the state of the first heating element at normal temperature and pressure, that is, at normal temperature and pressure, the temperature and resistance of the first heating element are fixed, and it is in a temperature equilibrium state, which is also a thermal equilibrium state.

[0082] That is, the thermal equilibrium states of the first heating element and the second heating element can both be states at normal temperature and pressure.

[0083] Example 4:

[0084] Referring to FIG4 , in order to simplify the process of obtaining the resistance temperature coefficient of the second heating element and improve calibration efficiency, based on the above embodiment, step S102, heating the first heating element based on predetermined conditions and obtaining at least one standard temperature variable according to the standard resistance temperature coefficient, includes the following steps:

[0085] Step S401: Determine at least two different designated powers, where the at least two different designated powers include a first power and a second power.

[0086] In this embodiment, two different specified powers are selected to heat the first heating element. These two different specified powers are labeled as a first power Pa and a second power Pb, respectively. The power used to heat the first heating element is controlled by PWM, or pulse width modulation. By changing the duty cycle of PWM, the input power to the first heating element is changed, thereby achieving a change or switching between the first power and the second power.

[0087] It is worth noting that the first power or the second power can be zero power, that is, there is no power input at both ends of the first heating element. At this time, if the temperature of the first heating element is stable, it is in a thermal equilibrium state at normal temperature and pressure.

[0088] Preferably, the first power and the second power can be two different power curves. The power curve refers to a curve that controls the power of the first heating element to change with time, and is used to adjust the heating power of the first heating element, thereby controlling the temperature of the first heating element; the two power curves enable the first heating element to reach two different thermal equilibrium states.

[0089] Preferably, one of the first power and the second power is a power curve, and the first power and the second power enable the first heating element to reach two different thermal equilibrium states.

[0090] Preferably, all or one of the first power and the second power is a point value on a certain power curve, and the first power and the second power enable the first heating element to reach two different thermal equilibrium states.

[0091] Step S402: inputting a first power to the first heating element for a first specified time, so that the first heating element reaches a first thermal equilibrium state.

[0092] In this embodiment, the first power is input to the first heating element by adjusting the duty cycle of PWM. After the first power input lasts for a first specified time, the first heating element reaches a first thermal equilibrium state, that is, the temperature of the first heating element is stable.

[0093] It is worth noting that when the first power is zero power, the first thermal equilibrium state is a thermal equilibrium state at normal temperature and pressure, and the first designated time may be 0.

[0094] Step S403: inputting a second power to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state.

[0095] In this embodiment, the second power is input to the first heating element by adjusting the duty cycle of PWM. After the second power input continues for a second specified time, the first heating element reaches a second thermal equilibrium state, that is, the temperature of the first heating element is stable.

[0096] It is worth noting that when the second power is zero power, the second thermal equilibrium state is a thermal equilibrium state at normal temperature and pressure, and the second designated time may be 0.

[0097] Step S404 : obtaining a first standard resistance value of the first heating element in a first thermal equilibrium state and a second standard resistance value of the first heating element in a second thermal equilibrium state respectively.

[0098] In this embodiment, a first standard voltage Ua at both ends of the first heating element in a first thermal equilibrium state and a second standard voltage Ub at a second thermal equilibrium state are obtained by measurement or according to PWM;

[0099] Calculate the first standard resistance value Ra=Ua*Ua / Pa, and calculate the second standard resistance value Rb=Ub*Ub / Pb.

[0100] Step S405: Obtain a standard resistance variable according to the first standard resistance and the second standard resistance.

[0101] In this embodiment, it is known that the first standard resistance is Ra and the second standard resistance is Rb. Therefore, the standard resistance variable dR is calculated as dR = Rb - Ra.

[0102] Step S406: Obtain a standard temperature variable according to the standard resistance variable and the standard resistance temperature coefficient.

[0103] In this embodiment, the standard resistance variable dR and the standard temperature coefficient of resistance TCR are known. Therefore, the standard temperature variable dT is calculated as dR / (Ra*TCR).

[0104] Referring to FIG. 5 , based on the above embodiment, step S103 of heating at least one second heating element based on the same predetermined conditions to obtain at least one test resistance variable of the second heating element includes the following steps:

[0105] Step S501: inputting a first power to a second heating element for a first specified time, so that the second heating element reaches a third thermal equilibrium state.

[0106] In this embodiment, the same first power as that of the first heating element is input to the second heating element by adjusting the PWM duty cycle. After the first power input continues for the same first specified time as that of the first heating element, the second heating element reaches a third thermal equilibrium state. The third thermal equilibrium state is the same as the first thermal equilibrium state.

[0107] Step S502: inputting a second power to the second heating element for a second specified time, so that the second heating element reaches a fourth thermal equilibrium state.

[0108] In this embodiment, the second heating element is supplied with a second power equal to that of the first heating element by adjusting the PWM duty cycle. After the second power is supplied for the same second specified time as that of the first heating element, the second heating element reaches a fourth thermal equilibrium state. The fourth thermal equilibrium state is the same as the second thermal equilibrium state.

[0109] Step S503 , respectively obtaining a first test resistance value of the second heating element in the third thermal equilibrium state and a second test resistance value of the second heating element in the fourth thermal equilibrium state.

[0110] In this embodiment, a first test voltage Uc at both ends of the second heating element in the third thermal equilibrium state and a second test voltage Ud at the fourth thermal equilibrium state are obtained by measurement or according to PWM;

[0111] Calculate the first test resistance Rc=Uc*Uc / Pa, and calculate the second test resistance Rd=Ud*Ud / Pb.

[0112] Step S504: Obtain a test resistance variable according to the first test resistance and the second test resistance.

[0113] In this embodiment, the first test resistance Rc and the second test resistance Rd are known. Therefore, the test resistance variable is calculated as Rd-Rc.

[0114] According to the above embodiment, in step S104, the resistance temperature coefficient of at least one second heating element is obtained according to the standard temperature variable and the test resistance variable, and the standard temperature variable dT and the test resistance variable dR' are known.

[0115] Therefore, the temperature coefficient of resistance TCR'=dR' / (Rc*dT) of the second heating element is finally calculated.

[0116] The TCR calibration method of the present invention simplifies the overall calibration operation and improves the calibration efficiency by simplifying the step of obtaining the test temperature of the second heating element; and avoids the influencing factors during temperature detection, thereby improving the accuracy of the calculation result.

[0117] Embodiment 5:

[0118] Referring to FIG6 , this embodiment provides a TCR calibration device, including:

[0119] A standard machine calibration module 61, the standard machine calibration module 61 is used to calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element;

[0120] a standard temperature variable acquisition module 62, configured to heat the first heating element based on a predetermined condition and acquire at least one standard temperature variable according to a standard resistance temperature coefficient;

[0121] a test resistance variable acquisition module 63, configured to heat at least one second heating element based on the same predetermined conditions and acquire at least one test resistance variable of the second heating element;

[0122] The test machine calibration module 64 is used to obtain the resistance temperature coefficient of at least one second heating element according to the standard temperature variable and the test resistance variable.

[0123] In some embodiments, the standard machine calibration module 61 also includes: a calibration heating module, used to heat the first heating element during calibration; a calibration variable acquisition module, used to obtain the resistance variable and temperature variable of the first heating element during the temperature change process of the first heating element during calibration; a standard resistance temperature coefficient acquisition module, used to obtain the standard resistance temperature coefficient of the first heating element based on the resistance variable and the temperature variable.

[0124] In which, the calibration variable acquisition module also includes: a calibration thermal equilibrium state acquisition module, which is used to obtain at least two thermal equilibrium states during the temperature change process of the first heating element during calibration; a calibration resistance value acquisition module, which is used to obtain the first resistance and the second resistance of the first heating element in the two thermal equilibrium states during calibration; a calibration temperature acquisition module, which is used to obtain the first temperature and the second temperature of the first heating element in the two thermal equilibrium states during calibration; a calibration temperature variable calculation module, which is used to obtain the resistance variable according to the first resistance value and the second resistance value, and obtain the temperature variable according to the first temperature and the second temperature.

[0125] In some embodiments, the standard temperature variable acquisition module 62 also includes: a power determination module, used to determine at least two different specified powers, the at least two different specified powers including a first power and a second power; a first heating module, used to input the first power to the first heating element for a first specified time, so that the first heating element reaches a first thermal equilibrium state; a second heating module, used to input the second power to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state; a standard resistance acquisition module, used to respectively obtain the first standard resistance of the first heating element in the first thermal equilibrium state and the second standard resistance in the second thermal equilibrium state; a standard resistance variable acquisition module, used to obtain a standard resistance variable based on the first standard resistance and the second standard resistance; a standard temperature variable acquisition module, used to obtain a standard temperature variable based on the standard resistance variable and the standard resistance temperature coefficient.

[0126] In some embodiments, the test resistance variable acquisition module 63 also includes: a third heating module, used to input the first power to the second heating element for a first specified time, so that the second heating element reaches a third thermal equilibrium state; a fourth heating module, used to input the second power to the second heating element for a second specified time, so that the second heating element reaches a fourth thermal equilibrium state; a test resistance acquisition module, used to respectively obtain the first test resistance of the second heating element in the third thermal equilibrium state and the second test resistance of the second heating element in the fourth thermal equilibrium state; and a test resistance variable acquisition module, used to obtain the test resistance variable based on the first test resistance and the second test resistance.

[0127] Example 6:

[0128] This embodiment further provides a calibration device, including a communication bus, a memory, and a processor; the communication bus is used to realize connection and communication between the processor and the memory; the memory is used to store a program; the processor is used to implement the TCR calibration method described above by executing the program stored in the memory. This embodiment will not be described in detail here.

[0129] Embodiment seven:

[0130] This embodiment further provides a computer-readable storage medium, which stores one or more computer programs. The one or more computer programs can be executed by one or more processors to implement the TCR calibration method as described above. This embodiment will not be described in detail here.

[0131] Those skilled in the art will appreciate that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer program. When all or part of the functions in the above embodiments are implemented by computer program, the program can be stored in a computer-readable storage medium, and the storage medium can include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to implement the above functions. For example, the program is stored in the memory of the device, and when the program in the memory is executed by the processor, all or part of the above functions can be implemented. In addition, when all or part of the functions in the above embodiments are implemented by computer program, the program can also be stored in a storage medium such as a server, another computer, disk, optical disk, flash disk or mobile hard disk, and saved in the memory of the local device by downloading or copying, or the system of the local device is updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be implemented.

[0132] The above examples are used to illustrate the present invention, which are only used to help understand the present invention and are not intended to limit the present invention. Those skilled in the art can make several simple deductions, modifications or substitutions based on the concept of the present invention.

Claims

1. A TCR calibration method, characterized in that include: Calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element; heating the first heating element based on a predetermined condition and obtaining at least one standard temperature variable according to a standard resistance temperature coefficient; heating at least one second heating element based on the same predetermined condition, and obtaining at least one test resistance variable of the second heating element; According to the standard temperature variable and the test resistance variable, the resistance temperature coefficient of at least one second heating element is obtained.

2. The TCR calibration method according to claim 1, wherein: The step of calibrating at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element includes: heating the first heating element; During the temperature change process of the first heating element, obtaining the resistance variable and the temperature variable of the first heating element; According to the resistance variable and the temperature variable, the standard resistance temperature coefficient of the first heating element is obtained.

3. The TCR calibration method according to claim 2, characterized in that: In the process of the first heating element changing temperature, obtaining the resistance variable and the temperature variable of the first heating element includes: During the temperature change process of the first heating element, at least two thermal equilibrium states are obtained; Respectively obtain a first resistance value and a second resistance value of the first heating element in two thermal equilibrium states; respectively obtaining a first temperature and a second temperature of the first heating element in two thermal equilibrium states; A resistance variable is obtained according to the first resistance value and the second resistance value, and a temperature variable is obtained according to the first temperature and the second temperature.

4. The TCR calibration method according to claim 1, wherein: The step of heating the first heating element based on a predetermined condition comprises: determining at least two different specified powers, the at least two different specified powers comprising a first power and a second power; Inputting a first power to the first heating element for a first specified time, so that the first heating element reaches a first thermal equilibrium state; A second power is input to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state.

5. The TCR calibration method according to claim 4, characterized in that: The step of obtaining at least one standard temperature variable according to the standard resistance temperature coefficient comprises: Respectively obtaining a first standard resistance value of the first heating element in a first thermal equilibrium state and a second standard resistance value of the first heating element in a second thermal equilibrium state; Obtaining a standard resistance value variable according to the first standard resistance value and the second standard resistance value; The standard temperature variable is obtained according to the standard resistance variable and the standard resistance temperature coefficient.

6. The TCR calibration method according to claim 4, characterized in that: The step of heating at least one second heating element based on the same predetermined condition comprises: Inputting a first power to the second heating element for a first specified time, so that the second heating element reaches a third thermal equilibrium state; A second power is input to the second heating element for a second specified time, so that the second heating element reaches a fourth thermal equilibrium state.

7. The TCR calibration method according to claim 6, characterized in that: The obtaining of at least one test resistance variable of at least one second heating element comprises: Respectively obtaining a first test resistance value of the second heating element in a third thermal equilibrium state and a second test resistance value of the second heating element in a fourth thermal equilibrium state; A test resistance variable is obtained according to the first test resistance value and the second test resistance value.

8. A TCR calibration device, characterized in that include: A standard machine calibration module, the standard machine calibration module is used to calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element; A standard temperature variable acquisition module, the standard temperature variable acquisition module is used to heat the first heating element based on a predetermined condition and acquire at least one standard temperature variable according to a standard resistance temperature coefficient; A test resistance variable acquisition module, the test resistance variable acquisition module is used to heat at least one second heating element based on the same predetermined condition to acquire at least one test resistance variable of the second heating element; A test machine calibration module, wherein the test machine calibration module is used to obtain the resistance temperature coefficient of at least one second heating element according to a standard temperature variable and a test resistance variable.

9. The TCR calibration device according to claim 8, characterized in that: The standard machine calibration module includes: A calibration heating module, used for heating the first heating element during calibration; A calibration variable acquisition module, used to acquire the resistance variable and the temperature variable of the first heating element during the temperature change process of the first heating element during calibration; The standard resistance temperature coefficient acquisition module is used to obtain the standard resistance temperature coefficient of the first heating element according to the resistance variable and the temperature variable.

10. The TCR calibration device according to claim 9, characterized in that: The calibration variable acquisition module comprises: A calibration thermal equilibrium state acquisition module, used for acquiring at least two thermal equilibrium states during the temperature change process of the first heating element during calibration; A calibration resistance value acquisition module, used for respectively acquiring a first resistance value and a second resistance value of the first heating element in two thermal equilibrium states during calibration; A calibration temperature acquisition module, used for respectively acquiring a first temperature and a second temperature of the first heating element in two thermal equilibrium states during calibration; The calibration temperature variable calculation module is used to obtain the resistance variable according to the first resistance value and the second resistance value, and to obtain the temperature variable according to the first temperature and the second temperature.

11. The TCR calibration device according to claim 8, characterized in that: The standard temperature variable acquisition module also includes: A power determination module, configured to determine at least two different specified powers, wherein the at least two different specified powers include a first power and a second power; A first heating module is used to input a first power to the first heating element for a first specified time so that the first heating element reaches a first thermal equilibrium state; The second heating module is used to input a second power to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state.

12. The TCR calibration device according to claim 11, characterized in that: The standard temperature variable acquisition module also includes: A standard resistance value acquisition module, used to respectively acquire a first standard resistance value of the first heating element in a first thermal equilibrium state and a second standard resistance value of the first heating element in a second thermal equilibrium state; A standard resistance variable acquisition module, used for acquiring a standard resistance variable according to a first standard resistance and a second standard resistance; The standard temperature variable acquisition module is used to obtain the standard temperature variable according to the standard resistance value variable and the standard resistance temperature coefficient.

13. The TCR calibration device according to claim 11, characterized in that: The test resistance variable acquisition module includes: A third heating module is used to input a first power to the second heating element for a first specified time, so that the second heating element reaches a third thermal equilibrium state; The fourth heating module is used to input a second power to the second heating element for a second specified time, so that the second heating element reaches a fourth thermal equilibrium state.

14. The TCR calibration device according to claim 13, characterized in that: The test resistance variable acquisition module includes: A test resistance acquisition module, used to respectively acquire a first test resistance value of the second heating element when it is in a third thermal equilibrium state and a second test resistance value of the second heating element when it is in a fourth thermal equilibrium state; The test resistance variable acquisition module is used to acquire the test resistance variable according to the first test resistance and the second test resistance.

15. A calibration device, characterized in that: including a communication bus, a memory and a processor; The communication bus is used to realize the connection and communication between the processor and the memory; The memory is used to store programs; The processor is configured to implement the TCR calibration method according to any one of claims 1 to 7 by executing the program stored in the memory.

16. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores one or more computer programs, and the one or more computer programs can be executed by one or more processors to implement the TCR calibration method according to any one of claims 1 to 7.

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