Method and apparatus for testing aging performance of supercapacitor, device and storage medium

Abstract

Embodiments of the present application discloses a method and apparatus for testing aging performance of a supercapacitor, a device and a storage medium. The method comprises: acquiring a target supercapacitor; respectively carrying out capacity grading processing on the target supercapacitor on the basis of at least two preset capacity grading scenarios, and measuring open-circuit voltages of the supercapacitor having undergone capacity grading processing, to obtain at least two capacity grading open-circuit voltages; and determining a target aging performance test result of the target supercapacitor on the basis of a numerical change difference of the at least two capacity grading open-circuit voltages.

Description

Supercapacitor aging performance test method, device, equipment and storage medium

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on September 1, 2023, with application number 202311125839.3, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The embodiments of the present application relate to the technical field of supercapacitor preparation, for example, to a method, device, equipment and storage medium for testing the aging performance of a supercapacitor. Background Art

[0003] Supercapacitors, a new type of energy storage device between electric double-layer capacitors and lithium-ion batteries, have become a key research area for industrial development. After supercapacitors are produced, they are typically aged to increase their capacity and lifespan. Therefore, evaluating the advantages and disadvantages of different aging processes is of great significance. Currently, the aging effect of hybrid supercapacitors is mostly evaluated using cycle life testing. However, the lifespan of supercapacitors is longer than that of other energy storage devices, so cycle life testing is very long and has poor practicality.

[0004] Summary of the Invention

[0005] The embodiments of the present application provide a method, apparatus, device, and storage medium for testing the aging performance of a supercapacitor. The method can determine the target aging performance of the supercapacitor based on the difference in open-circuit voltage after multiple capacity division processes of the supercapacitor, shorten the test cycle of the supercapacitor aging performance, and improve the practicality of the test method.

[0006] In a first aspect, an embodiment of the present application provides a method for testing the aging performance of a supercapacitor, the method comprising:

[0007] Obtaining a target supercapacitor;

[0008] Performing capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detecting the open circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open circuit voltages;

[0009] Based on the difference in the numerical changes of the at least two divided-capacity open-circuit voltages, a target aging performance test result of the target supercapacitor is determined.

[0010] In a second aspect, an embodiment of the present application provides a supercapacitor aging performance testing device, the device comprising:

[0011] a supercapacitor acquisition module, configured to acquire a target supercapacitor;

[0012] A capacity division open circuit voltage acquisition module is configured to perform capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detect the open circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open circuit voltages;

[0013] The aging performance test module is configured to determine a target aging performance test result of the target supercapacitor based on a difference in numerical changes of the open-circuit voltages of the at least two divided capacities.

[0014] In a third aspect, an embodiment of the present application provides a computer device, the computer device comprising:

[0015] one or more processors;

[0016] a memory configured to store one or more programs;

[0017] When the one or more programs are executed by the one or more processors, the one or more processors implement the supercapacitor aging performance testing method described in any embodiment.

[0018] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method for testing the aging performance of a supercapacitor described in any embodiment is implemented. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] FIG1 is a flow chart of a method for testing the aging performance of a supercapacitor provided in an embodiment of the present application;

[0020] FIG2 is a flow chart of another method for testing the aging performance of a supercapacitor provided in an embodiment of the present application;

[0021] FIG3 is a flowchart of a process for performing an aging performance test of a supercapacitor according to an embodiment of the present application;

[0022] FIG4 is a schematic structural diagram of a supercapacitor aging performance testing device provided in an embodiment of the present application;

[0023] FIG5 is a schematic structural diagram of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0024] Figure 1 is a flow chart of a supercapacitor aging performance testing method provided in an embodiment of the present application. The embodiment of the present application can be applied to scenarios in which the aging performance of a supercapacitor is tested. The method can be performed by a supercapacitor aging performance testing device, which can be implemented by software and / or hardware.

[0025] As shown in Figure 1, the aging performance test method of supercapacitors includes the following steps:

[0026] S110: Obtain a target supercapacitor.

[0027] The target supercapacitor may be a supercapacitor whose aging performance needs to be tested. In the process of obtaining the target supercapacitor, an original supercapacitor that has not been subjected to aging treatment may be first obtained, and then the supercapacitor is subjected to aging treatment to obtain the target supercapacitor.

[0028] S120 , performing capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detecting the open circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open circuit voltages.

[0029] The preset capacity division scenario may be a scenario for performing capacity division on a supercapacitor. Capacity division may be a method for detecting a charge indicator during charging and discharging of a supercapacitor. For example, when performing capacity division on a target supercapacitor based on the preset capacity division scenario, the supercapacitor may first be divided at a preset capacity division temperature, and then the supercapacitor after capacity division may be cooled at room temperature for a period of time.

[0030] For example, aging is a natural phenomenon in which the performance of supercapacitors gradually declines over time. To better simulate the aging process of supercapacitors, the differences in the relevant indicators of multiple preset capacity division scenarios can be kept within a certain threshold to more realistically restore the aging process of supercapacitors. For example, corresponding thresholds can be set for the capacity division temperature, cooling temperature, and cooling time of the preset capacity division scenarios to ensure that the differences between the capacity division temperature, cooling temperature, and cooling time of different preset capacity division scenarios are kept within a certain threshold range, avoiding the impact of excessive differences in the relevant indicators on the authenticity of the restored supercapacitor aging process.

[0031] The capacity-divided open-circuit voltage may be the open-circuit voltage of the target supercapacitor after the capacity-divided process is performed in a preset capacity-divided scenario. For example, after the target supercapacitor is subjected to the capacity-divided process in the preset capacity-divided scenario, its open-circuit voltage may be detected to determine the capacity-divided open-circuit voltage of the target supercapacitor in the preset capacity-divided scenario. Similarly, the target supercapacitor may be subjected to capacity-divided processes in a plurality of different preset capacity-divided scenarios to determine the capacity-divided open-circuit voltage of the target supercapacitor in the plurality of preset capacity-divided scenarios.

[0032] S130: Determine a target aging performance test result of the target supercapacitor based on a difference in the numerical changes of the open-circuit voltages of the at least two divided-capacitors.

[0033] The target aging performance test result can be the aging test result of the target supercapacitor. During the actual development process, the applicant found that the closer the difference between two adjacent open-circuit voltages is to 0, the better the supercapacitor's reproducibility, stable performance, and subsequent long-term performance, that is, the better aging performance. Therefore, the aging performance of the target supercapacitor can be indirectly inferred based on the difference in the numerical changes in the open-circuit voltages of at least two sub-capacitors.

[0034] For example, the target aging performance test result may include two aging performance test results: qualified and unqualified. Taking the number of preset capacity division scenarios as two as an example, the open circuit voltage of the target supercapacitor in the two preset capacity division scenarios can be subtracted, and the difference is then compared with the preset reference difference voltage threshold, and the target aging performance test result is determined based on the comparison result. For example, when the open circuit voltage difference is less than the reference difference voltage threshold, it indicates that the target supercapacitor has a small energy storage change during use and a relatively stable performance. At this time, the target aging performance test result may be a qualified aging performance test; when the open circuit voltage difference is greater than the reference difference voltage threshold, it indicates that the target supercapacitor has a large energy storage change during use and the performance is not very stable. At this time, the target aging performance test result may be an unqualified aging performance test.

[0035] Furthermore, when there are more than two pre-set capacity division scenarios, the open-circuit voltages of two adjacent pre-set capacity division scenarios can be subtracted, based on the division order. These differences are then compared with corresponding reference thresholds, and the target aging performance test result is determined based on the comparison results. The number of pre-set capacity division scenarios and the criteria for determining the target aging performance test result based on the difference in the numerical changes in the open-circuit voltages of the divisions are not limited and can be set by the user as needed.

[0036] The technical solution provided in the embodiment of the present application obtains a target supercapacitor; performs capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detects the open-circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open-circuit voltages; and determines the target aging performance test result of the target supercapacitor based on the difference in the numerical changes of the at least two capacity division open-circuit voltages. The technical solution of the embodiment of the present application avoids the long test cycle and poor practicality of the related art when testing the aging performance of supercapacitors. The target aging performance of the supercapacitor can be determined based on the difference in the open-circuit voltage of the supercapacitor after multiple capacity division processing, shortening the test cycle of the supercapacitor aging performance and improving the practicality of the test method.

[0037] FIG2 is a flow chart of another method for testing the aging performance of a supercapacitor provided in an embodiment of the present application. The embodiment of the present application is applicable to scenarios in which the aging performance of a supercapacitor is tested. Based on the above embodiments, this embodiment describes how to obtain a target supercapacitor, how to perform capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and how to detect the open-circuit voltage of the supercapacitor after capacity division processing to obtain at least two capacity division open-circuit voltages, and how to determine the target aging performance test result of the target supercapacitor based on the difference in the numerical changes of the at least two capacity division open-circuit voltages. The device can be implemented by software and / or hardware and integrated into a computer device with application development capabilities.

[0038] As shown in FIG2 , the aging performance test method of a supercapacitor includes the following steps:

[0039] S210: Acquire an initial supercapacitor, and perform aging processing on the initial supercapacitor based on a preset aging scenario to obtain a target supercapacitor.

[0040] The initial supercapacitor may be a pristine supercapacitor that has not undergone aging. The preset aging scenario may be a preset scenario for aging the supercapacitor. In the preset aging scenario, the supercapacitor may be charged to a preset voltage and then aged in a high-temperature environment for a predetermined period of time. Subsequently, the high-temperature supercapacitor may be cooled in a room-temperature environment for a period of time to complete the supercapacitor aging process. The target supercapacitor may be a supercapacitor whose aging performance needs to be tested. For example, an initial supercapacitor may be obtained and then aged based on the preset aging scenario to obtain a target supercapacitor.

[0041] S220 , performing capacity division processing on the target supercapacitor based on a first preset capacity division scenario, and detecting an open-circuit voltage of the supercapacitor after the capacity division processing to obtain a first capacity division open-circuit voltage.

[0042] The first preset capacity division scenario may be a scenario for performing capacity division on a supercapacitor. For example, when performing capacity division on a target supercapacitor based on the first preset capacity division scenario, the supercapacitor may be first divided at a preset capacity division temperature, and then the supercapacitor after capacity division may be cooled at room temperature for a period of time. For example, the target supercapacitor may be divided at the first capacity division temperature; and the supercapacitor after capacity division may be cooled at a first static temperature for a first preset static time.

[0043] Among them, the first capacity division temperature can be the temperature at which the target supercapacitor is divided in the first preset capacity division scenario. The first resting temperature can be the temperature at which the target supercapacitor is left at rest in the first preset capacity division scenario. The first preset resting time can be the time during which the target supercapacitor is left at rest in the first preset capacity division scenario. For example, the first capacity division temperature, the first resting temperature and the first preset resting time can be preset manually, and the user can set the three parameters as needed. By setting parameters such as the capacity division temperature, resting temperature and resting time of the capacity division process, the relevant indicators of the capacity division scenario can be controlled, so as to facilitate the subsequent determination of the aging performance of the supercapacitor based on its capacity division performance in different capacity division scenarios.

[0044] For example, the first divided capacity open-circuit voltage may be the open-circuit voltage of the target supercapacitor after the target supercapacitor is divided based on the first preset divided capacity scenario. After the target supercapacitor is divided based on the first preset divided capacity scenario, the open-circuit voltage of the target supercapacitor after the divided capacity processing may be detected to obtain the first divided capacity open-circuit voltage.

[0045] S230: Perform capacity division processing on the target supercapacitor based on a second preset capacity division scenario, and detect the open circuit voltage of the supercapacitor after the capacity division processing to obtain a second capacity division open circuit voltage.

[0046] The second preset capacity division scenario may be a scenario where the supercapacitor is subjected to capacity division again. For example, when performing capacity division on the target supercapacitor based on the second preset capacity division scenario, the supercapacitor may be first divided at a preset capacity division temperature, and then the supercapacitor after capacity division may be cooled at room temperature for a period of time. For example, the target supercapacitor may be divided at the second capacity division temperature; and the supercapacitor after capacity division may be cooled at a second static temperature for a second preset static time.

[0047] The second capacity division temperature may be the temperature at which the target supercapacitor is divided in the second preset capacity division scenario. The second rest temperature may be the temperature at which the target supercapacitor is left at rest in the second preset capacity division scenario. The second preset rest duration may be the duration for which the target supercapacitor is left at rest in the second preset capacity division scenario. For example, the second capacity division temperature, the second rest temperature, and the second preset rest duration may also be manually preset, and the user may set these three parameters as needed.

[0048] For example, the second divided capacity open-circuit voltage may be the open-circuit voltage of the target supercapacitor after the divided capacity processing is performed in the second preset divided capacity scenario. After the divided capacity processing is performed on the target supercapacitor based on the second preset divided capacity scenario, the open-circuit voltage of the target supercapacitor after the divided capacity processing may be detected to obtain the second divided capacity open-circuit voltage.

[0049] In addition, aging is a natural phenomenon in which the performance of supercapacitors gradually decreases over time. In order to better simulate the aging process of supercapacitors, the difference between the relevant indicators of the first preset capacity division scenario and the second preset capacity division scenario can be kept within a certain threshold. For example, the difference between the capacity division temperature, the rest temperature, and the rest time in the two scenarios can be kept within a certain threshold. Exemplarily, the difference between the first capacity division temperature and the second capacity division temperature is less than the preset capacity division temperature threshold, the difference between the first rest temperature and the second rest temperature is less than the preset rest temperature threshold, and the difference between the first rest time and the second rest time is less than the preset rest time threshold.

[0050] The preset capacity separation temperature threshold may be a threshold set for the difference in capacity separation temperature between the two scenarios. The preset rest temperature threshold may be a threshold set for the difference in rest temperature between the two scenarios. The preset rest time threshold may be a threshold set for the difference in rest time between the two scenarios. By maintaining the difference in relevant indicators between the first preset capacity separation scenario and the second preset capacity separation scenario within a certain threshold, the two scenarios can be made approximately identical, avoiding the impact of excessive differences in relevant indicators on the authenticity of the restored supercapacitor aging process.

[0051] Exemplarily, when obtaining a target capacitor and performing two capacitance divisions on it, the following steps are included:

[0052] Step 1: After the supercapacitor is formed, it is charged to 3.0-4.2V, placed in a high temperature environment T1 for aging for 16-96 hours, then placed in a normal temperature environment T2 for cooling for 24 hours, and then placed in a normal temperature environment T3 for storage for 24-144 hours.

[0053] Step 2: Performing a first capacity split on the supercapacitor in a room temperature environment T3, and allowing it to stand for 4 to 6 days in a room temperature environment T4 for the first time, and measuring the open-circuit voltage OCV1 (open-circuit voltage 1) of the supercapacitor;

[0054] Step 3: Perform a second capacity division on the supercapacitor in step 2 at room temperature T5, place it at room temperature T6 for a second time for 4 to 6 days, and detect the open circuit voltage OCV2 of the supercapacitor.

[0055] Among them, the high temperature environment T1 is 40~65℃. The normal temperature environment T2 is 20~30℃. During the two capacity divisions, the supercapacitor is first discharged, then cycled and discharged twice, and then charged to 3.0~3.4V at a constant current of 1~10C. Finally, constant voltage charging is performed. The constant voltage charging cutoff condition is that the current is less than 0.02C or the time is 5min. The ambient temperature T3 of the first capacity division is 20~30℃, and the ambient temperature T5 of the second capacity division is 20~30℃. The difference between T3 and T5 does not exceed 3℃. The ambient temperature T4 of the first static state is 20~30℃, and the ambient temperature T6 of the second static state is 20~30℃. The difference between T4 and T6 does not exceed 1℃. The difference between the first static state time and the second static state time does not exceed 6h.

[0056] S240 , performing a difference processing on the first capacity division open-circuit voltage and the second capacity division open-circuit voltage to obtain an open-circuit voltage difference.

[0057] The open circuit voltage difference may be the difference in open circuit voltages of the supercapacitor after capacity division in different scenarios. For example, the open circuit voltage difference may be obtained by performing a difference process on the first capacity division open circuit voltage and the second capacity division open circuit voltage.

[0058] Since the open-circuit voltage difference is the difference in open-circuit voltage of the target supercapacitor after capacity division in different scenarios, it can indirectly reflect the performance of the target supercapacitor. In other words, the closer the open-circuit voltage difference is to 0, the smaller the change in energy storage during use, the more stable the performance, and the better the aging performance of the target supercapacitor.

[0059] S250: Compare the open circuit voltage difference with a preset reference difference voltage threshold, and determine the target aging performance test result according to the comparison result.

[0060] Among them, the preset reference difference voltage threshold can be a reference threshold set for the open circuit voltage difference. The target aging performance test result can be the aging test result of the target supercapacitor. The target aging performance test result can include two aging performance test results: qualified and unqualified. For example, the open circuit voltage difference can be compared with the preset reference difference voltage threshold, and the target aging performance test result is determined based on the comparison result. Exemplarily, when the open circuit voltage difference is less than the preset reference difference voltage threshold, it indicates that the energy storage of the target supercapacitor in use changes little and the performance is relatively stable. At this time, the target aging performance test result can be that the aging performance test is qualified; when the open circuit voltage difference is greater than the preset reference difference voltage threshold, it indicates that the energy storage of the target supercapacitor in use changes greatly and the performance is not very stable. At this time, the target aging performance test result can be that the aging performance test is unqualified.

[0061] For example, FIG3 is a flowchart of a supercapacitor aging performance test provided by an embodiment of the present application. As shown in FIG3, the workflow of the supercapacitor aging performance test is as follows: first, the supercapacitor is charged to 3.0-4.2V, aged for 16-96 hours in a high temperature environment T1, cooled for 24 hours in a normal temperature environment T2, and stored for 24-144 hours in a normal temperature environment T3 to complete the aging process; then, the first capacity division is performed in a normal temperature environment T3, the first standing for 4-6 days in a normal temperature environment T4, and OCV1 is measured; then, the second capacity division is performed in a normal temperature environment T5, the second standing for 4-6 days in a normal temperature environment T6, and OCV2 is measured. The difference between OCV1 and OCV2 is calculated, and finally, the aging performance test result is determined based on the difference.

[0062] In order to verify the effectiveness of the technical solution of the embodiment of the present application for detecting the aging performance of supercapacitors, the applicant conducted multiple sets of experiments. Among them, Example 1 includes the following steps:

[0063] Step 1: After the hybrid supercapacitor is formed, it is charged to 3.5V and placed in a high temperature environment of 55°C for aging for 48 hours. The hybrid supercapacitor is then placed in a room temperature environment of 25°C for cooling for 24 hours. The hybrid supercapacitor is then placed in a room temperature environment of 25°C for storage for 72 hours.

[0064] Step 2: Performing a first capacity split on the hybrid supercapacitor prepared in step 1 at a room temperature of 25° C., leaving the hybrid supercapacitor at room temperature of 25° C. for 5 days, and detecting the open circuit voltage OCV1 of the hybrid supercapacitor;

[0065] Step 3: performing a second capacity split on the hybrid supercapacitor in step 2 at a room temperature of 25° C., leaving it at a room temperature of 25° C. for a second time for 5 days, and measuring the open circuit voltage OCV2 of the hybrid supercapacitor;

[0066] Step 4: Calculate ΔOCV = OCV1 - OCV2, and compare the ΔOCV values ​​of different aging processes. If the absolute value of ΔOCV is less than 5mV, it means that the aging process has achieved the aging effect. The closer the absolute value of ΔOCV is to 0, the better the aging effect of the aging process.

[0067] The capacity division procedure is to discharge first, then cycle charge and discharge twice, then charge to 3.3V at a constant current of 5C, and finally charge at a constant voltage. The constant voltage charging cutoff condition is that the current is less than 0.02C or the time is 5 minutes.

[0068] For example, the validity of the above evaluation results can be tested by using a traditional cyclic charge and discharge test method. The cyclic test process is: 10C constant current charging to 4.2V, constant voltage charging for 1 minute, and then 10C constant current discharging to 2.5V, and cycling 3000 times.

[0069] In addition, compared with Example 1, the applicant also conducted multiple comparative examples:

[0070] Example 2

[0071] This embodiment includes most of the steps of embodiment 1, except that:

[0072] In step 1, the hybrid supercapacitor is charged to 3.3V after formation and then aged at a high temperature of 60°C for 60 hours.

[0073] Example 3

[0074] This embodiment includes most of the steps of embodiment 1, except that:

[0075] In step 1, the hybrid supercapacitor is charged to 3.7V after formation and then aged at a high temperature of 50°C for 72 hours.

[0076] Comparative Example 1

[0077] This embodiment includes most of the steps of embodiment 1, except that:

[0078] In step 1, the hybrid supercapacitor is charged to 3.3V after formation and then aged at 45°C for 4 hours.

[0079] Comparative Example 2

[0080] This embodiment includes most of the steps of embodiment 1, except that:

[0081] In step 2, the hybrid supercapacitor is left to stand for 5 days at a room temperature of 20° C. for the first time, and the open circuit voltage OCV1 of the hybrid supercapacitor is measured;

[0082] In step 3, the hybrid supercapacitor is left to stand for a second time at room temperature of 30° C. for 5 days to detect the open circuit voltage OCV2 of the hybrid supercapacitor.

[0083] Comparative Example 3

[0084] This embodiment includes most of the steps of embodiment 1, except that:

[0085] In step 2, the hybrid supercapacitor is subjected to a first capacity division at a room temperature of 30°C;

[0086] In step three, the hybrid supercapacitor is subjected to a second capacity division at room temperature (20° C.).

[0087] The test results of different embodiments are shown in Table 1:

[0088] Table 1 Aging test results of different embodiments

[0089] From the test results of the embodiment and comparative example 1 in Table 1, it can be seen that the closer the ΔOCV is to 0, the better the capacity retention rate after 3000 charge and discharge cycles. This shows that the technical solution of the embodiment of the present application has high accuracy in detecting the aging performance of supercapacitors.

[0090] The ΔOCV of Comparative Example 2 is larger than that of Example 1, but the lifespan of the supercapacitors is relatively similar. This is because the temperature difference between OCV1 and OCV2 is large, which leads to misjudgment of the aging effect.

[0091] The ΔOCV of Comparative Example 3 is much larger than that of Example 1, but the lifespan of the supercapacitors is relatively similar. This is because the temperature difference between the first and second capacitance divisions is large, which leads to a misjudgment of the aging effect.

[0092] From the above experiments, it can be concluded that compared with the cycle life test method, the method of the present application can conveniently and intuitively reflect the advantages and disadvantages of different aging processes of hybrid supercapacitors, greatly shortening the supercapacitor R&D cycle, thereby helping supercapacitor manufacturers to quickly screen out suitable aging processes.

[0093] The technical solution provided in the embodiment of the present application is to obtain an initial supercapacitor and perform an aging treatment on the initial supercapacitor based on a preset aging scenario to obtain a target supercapacitor; perform capacity division treatment on the target supercapacitor based on a first preset capacity division scenario, and detect the open circuit voltage of the supercapacitor after the capacity division treatment to obtain a first capacity division open circuit voltage; perform capacity division treatment on the target supercapacitor based on a second preset capacity division scenario, and detect the open circuit voltage of the supercapacitor after the capacity division treatment to obtain a second capacity division open circuit voltage; perform a difference treatment on the first capacity division open circuit voltage and the second capacity division open circuit voltage to obtain an open circuit voltage difference; compare the open circuit voltage difference with a preset reference difference voltage threshold, and determine the target aging performance test result based on the comparison result. The technical solution of the embodiment of the present application avoids the long test cycle and poor practicality of the related technology when testing the aging performance of the supercapacitor. The target aging performance of the supercapacitor can be determined based on the difference in the open circuit voltage after the supercapacitor has been subjected to multiple capacity division treatments, thereby shortening the test cycle of the supercapacitor aging performance and improving the practicality of the test method.

[0094] Figure 4 is a structural schematic diagram of a supercapacitor aging performance testing device provided in an embodiment of the present application. The embodiment of the present application can be applied to scenarios where the aging performance of supercapacitors is tested. The device can be implemented by software and / or hardware and integrated into a computer device with application development capabilities.

[0095] As shown in FIG4 , the supercapacitor aging performance testing device includes: a supercapacitor acquisition module 310 , a divided-capacitance open-circuit voltage acquisition module 320 and an aging performance testing module 330 .

[0096] Among them, the supercapacitor acquisition module 310 is configured to obtain a target supercapacitor; the capacity division open-circuit voltage acquisition module 320 is configured to perform capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detect the open-circuit voltage of the supercapacitor after capacity division processing to obtain at least two capacity division open-circuit voltages; the aging performance test module 330 is configured to determine the target aging performance test result of the target supercapacitor based on the difference in numerical changes of the at least two capacity division open-circuit voltages.

[0097] The technical solution provided in the embodiment of the present application obtains a target supercapacitor; performs capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detects the open-circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open-circuit voltages; and determines the target aging performance test result of the target supercapacitor based on the difference in the numerical changes of the at least two capacity division open-circuit voltages. The technical solution of the embodiment of the present application avoids the long test cycle and poor practicality of the related technology when testing the aging performance of supercapacitors. The target aging performance of the supercapacitor can be determined based on the difference in the open-circuit voltage after multiple capacity division processing of the supercapacitor, shortening the test cycle of the supercapacitor aging performance and improving the practicality of the test method.

[0098] For example, the capacity division open-circuit voltage acquisition module 320 is configured as follows: when the number of the preset capacity division scenarios is two, the target supercapacitor is capacity divided based on the first preset capacity division scenario, and the open-circuit voltage of the supercapacitor after the capacity division is detected to obtain a first capacity division open-circuit voltage; the target supercapacitor is capacity divided based on the second preset capacity division scenario, and the open-circuit voltage of the supercapacitor after the capacity division is detected to obtain a second capacity division open-circuit voltage.

[0099] For example, the aging performance test module 330 is configured to: perform differential processing on the first divided capacity open-circuit voltage and the second divided capacity open-circuit voltage to obtain an open-circuit voltage difference; compare the open-circuit voltage difference with a preset reference difference voltage threshold, and determine the target aging performance test result based on the comparison result.

[0100] For example, the capacity division open circuit voltage acquisition module 320 includes: a capacity division processing unit configured to: perform capacity division processing on the target supercapacitor based on a first capacity division temperature; and cool the supercapacitor after capacity division processing at a first static temperature for a first preset static time.

[0101] For example, the capacity division processing unit is further configured to: perform capacity division processing on the target supercapacitor based on a second capacity division temperature; and cool the supercapacitor after the capacity division processing at a second static temperature for a second preset static time.

[0102] For example, the difference between the first divided volume temperature and the second divided volume temperature is less than the preset divided volume temperature threshold, the difference between the first static temperature and the second static temperature is less than the preset static temperature threshold, and the difference between the first static time and the second static time is less than the preset static time threshold.

[0103] For example, the supercapacitor acquisition module 310 is configured to: acquire an initial supercapacitor; and perform aging processing on the initial supercapacitor based on a preset aging scenario to obtain the target supercapacitor.

[0104] The supercapacitor aging performance testing device provided in the embodiments of the present application can execute the supercapacitor aging performance testing method provided in any embodiment of the present application, and has the corresponding functional modules and beneficial effects of the execution method.

[0105] Figure 5 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application. Figure 5 shows a block diagram of an exemplary computer device 12 suitable for implementing the embodiments of the present application. The computer device 12 shown in Figure 5 is merely an example and should not limit the functionality and scope of use of the embodiments of the present application. The computer device 12 can be any terminal device with computing capabilities and can be configured in the supercapacitor aging performance test equipment.

[0106] 5 , computer device 12 is implemented as a general-purpose computing device. Components of computer device 12 may include, but are not limited to, one or more processors or processing units 16, system memory 28, and a bus 18 connecting various system components (including system memory 28 and processing units 16).

[0107] The bus 18 may be one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus architectures. Examples of these architectures include, but are not limited to, an Industry Standard Architecture (ISA) bus, a Micro Channel Architecture (MAC) bus, an Enhanced ISA bus, a Video Electronics Standards Association (VESA) local bus, and a Peripheral Component Interconnect (PCI) bus.

[0108] The computer device 12 typically includes a variety of computer system readable media. These media can be any available media that can be accessed by the computer device 12, including volatile and non-volatile media, removable and non-removable media.

[0109] The system memory 28 may include computer system readable media in the form of volatile memory, such as random access memory (RAM) 30 and / or cache 32. The computer device 12 may include other removable / non-removable, volatile / non-volatile computer system storage media. By way of example only, the storage system 34 may be used to read and write to non-removable, non-volatile magnetic media (not shown in FIG. 5 , commonly referred to as a “hard drive”). Although not shown in FIG. 5 , a magnetic disk drive for reading and writing to a removable non-volatile magnetic disk (e.g., a “floppy disk”) and an optical disk drive for reading and writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to the bus 18 via one or more data media interfaces. The system memory 28 may include at least one program product having a set (e.g., at least one) of program modules that are configured to perform the functions of various embodiments of the present application.

[0110] A program / utility 40 having a set (at least one) of program modules 42 may be stored, for example, in system memory 28. Such program modules 42 include, but are not limited to, an operating system, one or more application programs, other program modules, and program data, each of which, or some combination thereof, may include an implementation of a network environment. Program modules 42 generally implement the functions and / or methods of the embodiments described herein.

[0111] The computer device 12 can also communicate with one or more external devices 14 (e.g., a keyboard, pointing device, display 24, etc.), one or more devices that enable a user to interact with the computer device 12, and / or any device that enables the computer device 12 to communicate with one or more other computing devices (e.g., a network card, a modem, etc.). Such communication can occur via an input / output (I / O) interface 22. Furthermore, the computer device 12 can communicate with one or more networks (e.g., a local area network (LAN), a wide area network (WAN), and / or a public network such as the Internet) via a network adapter 20. As shown in FIG5 , the network adapter 20 communicates with the other modules of the computer device 12 via a bus 18. It should be understood that, although not shown in FIG5 , other hardware and / or software modules can be used in conjunction with the computer device 12, including but not limited to microcode, device drivers, redundant processing units, external disk drive arrays, redundant array of independent disks (RAID) systems, tape drives, and data backup storage systems.

[0112] The processing unit 16 executes various functional applications and data processing by running programs stored in the system memory 28, such as implementing the supercapacitor aging performance test method provided in the embodiment of the present invention, which includes:

[0113] Obtaining a target supercapacitor;

[0114] Performing capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detecting the open circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open circuit voltages;

[0115] Based on the difference in the numerical changes of the at least two divided-capacity open-circuit voltages, a target aging performance test result of the target supercapacitor is determined.

[0116] This embodiment provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for testing the aging performance of a supercapacitor provided in any embodiment of the present application is implemented, including:

[0117] Obtaining a target supercapacitor;

[0118] Performing capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detecting the open circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open circuit voltages;

[0119] Based on the difference in the numerical changes of the at least two divided-capacity open-circuit voltages, a target aging performance test result of the target supercapacitor is determined.

[0120] The computer storage medium of the embodiment of the present application can adopt any combination of one or more computer-readable media.Computer-readable media can be computer-readable signal media or computer-readable storage media.Computer-readable storage media can be, for example, but not limited to: electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or devices, or any combination of the above.More specific examples (non-exhaustive list) of computer-readable storage media include: electrical connection with one or more wires, portable computer disks, hard disks, random access memories (RAM), read-only memories (ROM), erasable programmable read-only memories (EPROM or flash memory), optical fibers, portable compact disk read-only memories (CD-ROMs), optical storage devices, magnetic storage devices, or any suitable combination of the above.In this document, computer-readable storage media can be any tangible medium containing or storing a program, which can be used by an instruction execution system, device or device or used in combination with it.Computer-readable storage media can be non-transient computer-readable storage media.

[0121] A computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, which carries computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can transmit, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0122] Program code embodied on a computer-readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, radio frequency (RF), etc., or any suitable combination of the foregoing.

[0123] The computer program code for performing the operations of the present application can be written in one or more programming languages ​​or combinations thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (e.g., using an Internet service provider to connect via the Internet).

[0124] Those skilled in the art will appreciate that the aforementioned multiple modules or steps of the present application can be implemented using a general-purpose computing device. They can be centralized on a single computing device or distributed across a network of multiple computing devices. For example, they can be implemented using program code executable by a computer device, which can then be stored in a storage device and executed by the computing device. Alternatively, they can be fabricated into multiple integrated circuit modules, or multiple modules or steps can be fabricated into a single integrated circuit module for implementation. Thus, the present application is not limited to any specific combination of hardware and software.

Claims

1. A method for testing the aging performance of a supercapacitor, comprising: Obtaining a target supercapacitor; Based on at least two preset capacity division scenarios, the target supercapacitor is respectively subjected to capacity division processing, and the open circuit voltage of the supercapacitor after the capacity division processing is detected to obtain at least two capacity division open circuit voltages; Based on the difference in the numerical changes of the at least two divided-capacity open-circuit voltages, a target aging performance test result of the target supercapacitor is determined.

2. The method according to claim 1, wherein: In the case where the number of the preset capacity division scenarios is two, the two preset capacity division scenarios include a first preset capacity division scenario and a second preset capacity division scenario, and the target supercapacitor is subjected to capacity division processing based on at least two preset capacity division scenarios respectively, and the open circuit voltage of the supercapacitor after the capacity division processing is detected to obtain at least two capacity division open circuit voltages, including: Based on the first preset capacity division scenario, the target supercapacitor is subjected to capacity division processing, and an open circuit voltage of the supercapacitor after the capacity division processing is detected to obtain a first capacity division open circuit voltage; Based on the second preset capacity division scenario, the target supercapacitor is subjected to capacity division processing, and the open circuit voltage of the supercapacitor after the capacity division processing is detected to obtain a second capacity division open circuit voltage.

3. The method according to claim 2, wherein: The step of determining a target aging performance test result of the target supercapacitor based on the difference in the value changes of the at least two divided-capacity open-circuit voltages comprises: Performing a difference processing on the first divided capacity open circuit voltage and the second divided capacity open circuit voltage to obtain an open circuit voltage difference; The open circuit voltage difference is compared with a preset reference difference voltage threshold, and the target aging performance test result is determined according to the comparison result.

4. The method according to claim 2, wherein: The performing capacity division processing on the target supercapacitor based on the first preset capacity division scenario includes: Performing a capacity division process on the target supercapacitor based on a first capacity division temperature; The supercapacitor after the capacity division process is cooled at a first static temperature for a first preset static time.

5. The method according to claim 4, wherein: The performing capacity division processing on the target supercapacitor based on the second preset capacity division scenario includes: Performing a capacity division process on the target supercapacitor based on a second capacity division temperature; The supercapacitor after the capacity division process is cooled at a second static temperature for a second preset static time.

6. The method according to claim 5, wherein: The difference between the first volume separation temperature and the second volume separation temperature is less than a preset volume separation temperature threshold, the difference between the first static temperature and the second static temperature is less than a preset static temperature threshold, and the difference between the first static time and the second static time is less than a preset static time threshold.

7. The method according to claim 1, wherein: The step of obtaining a target supercapacitor comprises: Obtaining an initial supercapacitor; The initial supercapacitor is aged based on a preset aging scenario to obtain the target supercapacitor.

8. A supercapacitor aging performance testing device, comprising: A supercapacitor acquisition module, configured to acquire a target supercapacitor; A capacity division open circuit voltage acquisition module, configured to perform capacity division processing on the target supercapacitor based on at least two preset capacity division scenarios, and detect the open circuit voltage of the supercapacitor after the capacity division processing to obtain at least two capacity division open circuit voltages; The aging performance test module is configured to determine a target aging performance test result of the target supercapacitor based on a difference in numerical changes of the at least two divided-capacity open-circuit voltages.

9. A computer device comprising: one or more processors; a memory configured to store one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the supercapacitor aging performance testing method as described in any one of claims 1-7.

10. A computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the supercapacitor aging performance test method according to any one of claims 1 to 7 is implemented.

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