TOSA device testing apparatus, system and method

Abstract

A TOSA device testing apparatus, comprising a test board and a flexible cable for connecting a TOSA device. A power supply circuit, a main control circuit, and an interface for connecting the flexible cable are arranged on the test board; the power supply circuit is used for supplying power to the test board; an I2C pin of the main control circuit is connected to an I2C pin of the interface; the main control circuit is used for receiving a mode switching signal, to perform powering mode switching; the main control circuit is provided with at least one IDAC output end; the main control circuit is configured to control, in a second powering mode, IDAC output ends of the main control circuit to output driving currents to LD powering pins of the interface, and control, in a first powering mode, the I2C pin of the main control circuit to output a control signal to the I2C pin of the interface, wherein the control signal is configured to control a Driver in a TOSA device under test to output a corresponding driving current. PIV testing and optical port coupling, lens coupling powering and MPD responsivity testing of various BOX-type TOSAs can be completed. The present invention further relates to a TOSA device testing system and method.

Description

TOSA device testing device, system and method Technical Field

[0001] The present invention belongs to the technical field of optical communications, and in particular relates to a TOSA device testing device, system and method. Background Art

[0002] The manufacturing process for high-speed optical devices (TOSA optical transmitter subassemblies) requires multiple production steps, such as PIV testing, MPD responsivity testing, lens coupling, and optical port coupling. Each of these production steps requires powering the TOSA device via a TOSA power board to complete the corresponding production process. During PIV testing, the current driving the laser is adjusted in steps, which synchronously generates a set of optical power values, forming a PIV curve. Analysis of the PIV curve allows calculation of the laser threshold current and KINK point, as well as the constant current optical power point (benchmarked with the module's optical power), to determine whether the TOSA device is qualified. Existing PIV testing software is provided by the manufacturer and requires the manufacturer's equipment. This is costly and inconvenient for secondary development. Both the equipment and software are highly packaged, making it difficult to analyze problems. When errors occur, it's impossible to determine whether they are caused by the manufacturer's equipment or the software.

[0003] At present, conventional PIV testing requires specialized testing instruments, and each testing instrument is equipped with a test software, which is not conducive to software compatibility. In addition, the interface content is rigid and not conducive to adapting to changes. When PIV requirements change, new models of PIV testing instruments need to be purchased, and the old PIV instruments will be idle, which is not conducive to equipment expansion.

[0004] In addition, when coupling lenses and optical ports, TOSA devices also need to be temperature controlled and powered on with a constant current. The coupling machine manufacturer provides the host computer software. In addition to controlling the coupling machine's dimming and coupling operations, it is also necessary to control the power-on board to control the TOSA device. The company currently has a variety of TOSA devices, such as the 100G LR4 Driver in solution, 100G LR4 Driver out solution, 100G ER / ZR EML solution, 200G / 400G series, 10G / 25G series, etc., all of which require a power-on board. The current situation is that one series of products uses one or two power-on boards, resulting in a variety of power-on boards on the production line, which consumes a lot of manpower for maintenance. In addition, when switching products, the coupling machine needs to switch the power-on board, which often causes abnormal positions and affects production efficiency.

[0005] During the MPD responsivity test, current must be applied to the TOSA device to keep its optical power fixed at a certain point. By sampling the MPD response current and calculating the responsivity, the MPD compliance can be determined. Existing MPD responsivity tests require custom test boards, which are labor-intensive to maintain.

[0006] Summary of the Invention

[0007] The present invention aims to overcome at least one defect in the prior art and provides a TOSA device testing apparatus, system and method.

[0008] The technical solution of the present invention is achieved as follows: The present invention discloses a TOSA device test device, comprising a test board and a flexible tape for connecting a TOSA device, wherein the test board is provided with a power supply circuit, a main control circuit and an interface for connecting the flexible tape, wherein the power supply circuit is used to supply power to the test board, and the main control circuit has an I 2 C pin interfaces with the I 2 The main control circuit is connected to the C pin, and is used to receive the mode switching signal to switch the power-on mode. The main control circuit has at least one IDAC output terminal. The main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and to control its I 2 C pin outputs the control signal to the interface’s I 2 C pin, this control signal is configured to control the corresponding drive current output by the internal Driver of the TOSA device.

[0009] Furthermore, the flexible tape for connecting the TOSA device includes at least multiple flexible tape combinations for connecting to different types of TOSA devices, the TOP surface of the test board is provided with a first interface for connecting the flexible tape, and the BOT surface of the test board is provided with a second interface for connecting the flexible tape. Each flexible tape combination includes two flexible tapes, and the two flexible tapes are connected to the first interface and the second interface respectively.

[0010] The flexible tape for connecting the TOSA device further includes a single flexible tape for connecting to the Driver-in-TOSA device, and the single flexible tape is connected to the first interface or the second interface.

[0011] Furthermore, a mode switching circuit is provided on the test board, and the mode switching circuit is connected to the main control circuit. The mode switching circuit is used to output a mode switching signal to the main control circuit according to a user instruction.

[0012] Furthermore, the mode switching circuit includes a switch, one end of the switch is grounded, and the other end of the switch is respectively connected to the first input end and the second voltage connection of the main control circuit.

[0013] Furthermore, the other end of the switch is connected to a second voltage (eg, 3.3V) via a resistor R56.

[0014] Furthermore, the switch is a dip switch.

[0015] Furthermore, the main control circuit has at least one first ADC pin for sampling and monitoring the laser drive current. The test board is also provided with a laser drive current monitoring circuit, which is used to monitor the drive current output by the IDAC output terminal of the main control circuit and transmit the monitored information to the first ADC pin of the main control circuit;

[0016] or / and,

[0017] The main control circuit has at least one VDAC output terminal, and the test board is further provided with an EA drive circuit, the input terminal of the EA drive circuit is connected to the VDAC output terminal of the main control circuit, and the output terminal of the EA drive circuit is connected to the EA pin of the interface;

[0018] or / and,

[0019] The main control circuit has at least one second ADC pin for sampling the optical power monitoring chip MPD inside the TOSA device. Each second ADC pin of the main control circuit is respectively connected to the MPD pin corresponding to the interface and one end of the second sampling resistor, and the other end of the second sampling resistor is grounded.

[0020] or / and,

[0021] The test board is also equipped with a TEC control circuit for driving the TEC inside the TOSA device. The TEC control circuit is connected to the main control circuit and some pins of the interface.

[0022] or / and,

[0023] The test board is also provided with a communication interface for connecting to a host computer.

[0024] Furthermore, the laser drive current monitoring circuit includes an amplifier circuit and a first sampling resistor connected in series between the IDAC output terminal of the main control circuit and the LD power pin of the interface, the amplifier circuit is used to amplify the voltage difference across the first sampling resistor, and the output terminal of the amplifier circuit is connected to the first ADC pin of the main control circuit;

[0025] or / and,

[0026] The EA driving circuit includes an operational amplifier, wherein the non-inverting input terminal of the operational amplifier is grounded via a resistor R36, the inverting input terminal of the operational amplifier is connected to the VDAC output terminal of the main control circuit via a resistor R32, the inverting input terminal of the operational amplifier is connected to the output terminal of the operational amplifier via a resistor R30 and a capacitor C50, the resistor R30 and the capacitor C50 are connected in parallel, the V+ pin of the operational amplifier is connected to a positive voltage; and the V- pin of the operational amplifier is connected to a negative voltage VSS;

[0027] or / and,

[0028] A first input terminal of the TEC control circuit is connected to the output pin TECON of the main control circuit, and the switch of the TEC control circuit is controlled by the TECON pin of the main control circuit. The TEC control output terminals TEC+ and TEC- of the TEC control circuit are connected to the corresponding pins of the interface and are connected to the TOSA device via a flexible tape connected to the interface, so as to provide current to the TEC inside the TOSA device and drive the TEC to operate. A second input terminal of the TEC control circuit is connected to the RTH pin of the interface, so as to receive the temperature sampled by the thermistor inside the TOSA device and convert it into a voltage for output to the third ADC pin of the main control circuit.

[0029] Furthermore, the power supply circuit includes a first DC-DC circuit for outputting a first voltage to power a driver inside the TOSA device, wherein an output terminal of the first DC-DC circuit is connected to a driver power supply pin of the interface, and an enable terminal of the first DC-DC circuit is connected to a first output terminal of a main control circuit; when in a first power-on mode, the main control circuit is used to control the first DC-DC circuit to output the first voltage to the driver power supply pin of the interface;

[0030] or / and,

[0031] The power supply circuit includes a second DC-DC circuit, wherein an output terminal of the second DC-DC circuit is connected to the main control circuit and is used to output a reference voltage to the main control circuit so that each IDAC output terminal of the main control circuit outputs a current, and an enable terminal of the second DC-DC circuit is connected to a second output terminal of the main control circuit;

[0032] or / and,

[0033] The power supply circuit includes a third DC-DC circuit, the output end of the third DC-DC circuit is connected to the EA drive circuit, and is used to output a negative voltage VSS to power the EA drive circuit. The enable end of the third DC-DC circuit is connected to the third output end of the main control circuit.

[0034] Furthermore, the power supply circuit includes a slow-start circuit, the input end of the slow-start circuit is connected to the input voltage, and the output end of the slow-start circuit outputs a second voltage. The input ends of the first DC-DC circuit, the second DC-DC circuit, and the third DC-DC circuit are connected to the second voltage.

[0035] Furthermore, the power supply circuit includes a power input interface, and the power input interface is connected to the input voltage.

[0036] Furthermore, a circuit for filtering power ripple is provided between the power input interface and the input voltage.

[0037] Furthermore, a capacitor and a magnetic bead L1 are provided between the power input interface and the input voltage terminal. One end of the magnetic bead L1 is respectively connected to one end of the capacitor C4 and the positive pole of the power input interface, and the other end of the capacitor C4 is grounded. The other end of the magnetic bead L1 is respectively connected to one end of the capacitor C1 and the input voltage terminal, and the other end of the capacitor C1 is grounded.

[0038] Furthermore, the power circuit includes an indicator light D1 , the positive pole of the indicator light D1 is connected to the positive pole of the power input interface, and the negative pole of the indicator light D1 is grounded directly or via a resistor.

[0039] The present invention also discloses a TOSA device testing system, comprising a power supply, a host computer, a power meter, and the TOSA device testing device as described above. The host computer is connected and communicates with a test board. The power supply is connected to the test board for powering the test board. The interface of the test board is connected to the TOSA device to be tested via a flexible tape. The optical port of the TOSA device to be tested is connected to the optical power meter via an optical fiber.

[0040] The present invention also discloses a TOSA device testing method, including a PIV testing step of the TOSA device, specifically comprising:

[0041] Power the test board and control the driver inside the TOSA device under test to output currents with different steps to power the laser. Alternatively, control the test board to output currents with different steps to power the laser inside the TOSA device under test, so that the TOSA device under test emits light with different powers and collects the corresponding optical power values.

[0042] Record the current and corresponding optical power values ​​of different steps, record the current and corresponding optical power values ​​of different steps, and calculate the threshold value and kink.

[0043] Furthermore, the current and corresponding optical power values ​​of different steps are recorded to calculate the threshold value, kink, which specifically includes:

[0044] Get current and power data;

[0045] Preprocessing of current and power data;

[0046] Derivative the power data to obtain the threshold value;

[0047] Fit the derivative result with the current data to obtain kink;

[0048] The power data is derived to obtain a threshold value, specifically including: performing the first-order and second-order derivatives of the power, where the current point corresponding to the maximum value of the second-order derivative is the threshold value ith;

[0049] The derivative result is fitted with the current data to obtain kink, specifically including: fitting the data of the first-order derivative of power with the current data to obtain a linear fitting value, and using the formula kink = Max(abs((calculated value of the first-order derivative of power - value after linear fitting) / value after linear fitting))*100% to obtain the kink value.

[0050] Furthermore, the TOSA device testing method of the present invention further includes an MPD responsivity testing step, specifically including:

[0051] By setting the fixed optical power, the PD will generate a corresponding current, sample the optical power monitoring chip MPD inside the TOSA device, and calculate the MPD responsivity.

[0052] Furthermore, the TOSA device testing method of the present invention further includes an optical port coupling step, specifically comprising: supplying power to the test board, controlling the driver inside the TOSA device to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device, and collecting a corresponding optical power value;

[0053] Adjust the optical port position until the optical power value reaches the target value, then stop and perform laser welding to weld the optical port and the TOSA device shell together to complete the optical port coupling operation.

[0054] Furthermore, the TOSA device testing method of the present invention further includes a lens coupling step, specifically comprising: supplying power to the test board, controlling the driver inside the TOSA device to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device, and collecting a corresponding optical power value;

[0055] Adjust the lens position until the optical power reaches the target value, then stop and glue the lens to complete the lens coupling operation.

[0056] This invention has at least the following beneficial effects: Through hardware circuit design, it integrates the power-on and temperature-control features of multiple device solutions onto a single test board. This board is then connected to the test board via a custom flexible tape. One end of the custom flexible tape connects to the test board's interface and the other to the TOSA device. This allows for power-on and temperature-control, MPD responsivity, and other tests on a variety of different devices. Switching between TOSA devices requires only selecting the mode and replacing the corresponding flexible tape, making operation convenient and simple.

[0057] The test board of the present invention can support simultaneous power-on of multiple channels and includes EA control function, real-time monitoring function of power-on current, and TEC control function. Therefore, the power-on board has a wide range of uses and powerful functions. It can be used for PIV testing of 10G, 25G, 100G, 200G, and 400G series BOX devices, as well as lens coupling and optical port coupling power-on and MPD responsivity testing.

[0058] This invention targets 100G LR4 Driver-in TOSAs. This type of TOSA differs from other TOSAs (without an internal driver) in its power-up method. This TOSA integrates an internal driver, requiring the laser to be powered by controlling the internal driver and providing the corresponding voltage to the driver. This multifunctional TOSA power-up test board is compatible with this TOSA and supports power-up and temperature-controlled testing of this TOSA.

[0059] This invention targets both driver-out DML and EML TOSAs. These TOSAs utilize essentially the same power-up method: the laser is driven by the driver output current on the test board. EML devices typically require an EA at the device end for optical port coupling to ensure consistent optical power alignment with the module end. This multifunctional TOSA power-up test board also incorporates this functionality.

[0060] The present invention addresses the two current power-up modes of driver-in and driver-out / EML TOSAs. This test board incorporates a switch and status indicator, enabling instant switching between the two power-up modes while ensuring that when one mode is powered on, the other is disabled. In the event of a mode switch error or incorrect use of the flexible tape, the TOSA device will not power on. Furthermore, after each power-up test, the host computer software disables the power-up board's current output to prevent short circuits caused by hot-swap TOSA components. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0062] FIG1 is a functional block diagram of a test board according to an embodiment of the present invention;

[0063] FIG2 is a functional block diagram of a TOSA device testing system according to an embodiment of the present invention;

[0064] FIG3 is a circuit diagram of a power supply circuit provided in an embodiment of the present invention;

[0065] FIG4 is a circuit diagram of a mode switching circuit provided by an embodiment of the present invention;

[0066] FIG5 is a circuit diagram of a communication interface provided by an embodiment of the present invention;

[0067] FIG6 is a circuit diagram of a test pin provided by an embodiment of the present invention;

[0068] FIG7 is a circuit diagram of an interface provided by an embodiment of the present invention;

[0069] FIG8 is a schematic diagram of a main control circuit provided by an embodiment of the present invention;

[0070] FIG9 is a schematic diagram of an EA driving circuit provided in an embodiment of the present invention;

[0071] FIG10 is a schematic diagram of a laser drive current monitoring circuit according to an embodiment of the present invention;

[0072] FIG11 is a schematic diagram of a TEC control circuit provided in an embodiment of the present invention;

[0073] FIG12 is a flow chart of PIV parameter calculation according to an embodiment of the present invention;

[0074] FIG13 is a schematic diagram of device-end pins of a first flexible tape provided in an embodiment of the present invention;

[0075] FIG14 is a schematic diagram of the test board pins of the first flexible tape provided in an embodiment of the present invention;

[0076] FIG15 is a schematic diagram of device-end pins of a second flexible strip provided in an embodiment of the present invention;

[0077] FIG16 is a schematic diagram of the test board pins of the second flexible tape provided in an embodiment of the present invention;

[0078] FIG17 is a schematic diagram of device-end pins of a third flexible strip provided in an embodiment of the present invention;

[0079] FIG18 is a schematic diagram of the test board pins of the third flexible tape provided in an embodiment of the present invention;

[0080] FIG19 is a schematic diagram of device-end pins of a fourth flexible strip provided in an embodiment of the present invention;

[0081] FIG20 is a schematic diagram of the test board end pins of the fourth flexible tape provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0082] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0083] In the description of the present invention, it should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention.

[0084] The terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Therefore, features specified as "first" or "second" may explicitly or implicitly include one or more of such features; in the description of the present invention, unless otherwise specified, "plurality" or "several" means two or more.

[0085] Example 1

[0086] Referring to Figures 1 to 11, an embodiment of the present invention provides a TOSA device testing device, including a test board. The test board is compatible with all 10G, 25G, 100G, 200G, and 400G series BOX devices. There are two power-on modes with significant differences, namely Driver in mode and Driver out & EML mode. The Driver in mode is only for Driver in devices. As the name implies, the Driver of the TOSA device is integrated inside the TOSA. Therefore, when powering on such a device, there is no need to use an external Driver output current to drive the laser. It is only necessary to supply the voltage required by the TOSA internal Driver and pass it through the I 2The C pin is connected to it, and the MCU controls its current output. Driver out & EML mode is the most commonly used mode, mainly used to power TOSA devices without a built-in driver.

[0087] The test board is provided with a power supply circuit, a main control circuit, and an interface for connecting a flexible tape. The power supply circuit is used to power the test board. The power supply circuit includes a first DC-DC circuit for outputting a first voltage to power a driver inside the TOSA device to be tested. The output end of the first DC-DC circuit is connected to the driver power supply pin of the interface, the enable end of the first DC-DC circuit is connected to the first output end of the main control circuit, and the I 2 C pin interfaces with the I 2 C pin is connected, the main control circuit is used to receive a mode switching signal and perform power-on mode switching, the main control circuit has at least one IDAC output terminal, and the main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and, when in the first power-on mode, control the first DC-DC circuit to output a first voltage to the Driver power supply pin of the interface, and control its I 2 C pin outputs the control signal to the interface I 2 Pin C: This control signal is configured to control the driver output of the TOSA device under test to output a corresponding drive current. When any flexible tape is connected to the interface, one end of the tape communicates with some of the pins of the interface, and the other end is connected to the corresponding TOSA device. The first power-on mode is Driver-in power-on mode. The second power-on mode is Driver-out power-on mode.

[0088] The flexible tape used to connect the TOSA device includes at least multiple flexible tape combinations for connecting to different types of driver-out TOSA devices. The TOP surface of the test board is provided with a first interface for connecting to the flexible tape, and the BOT surface of the test board is provided with a second interface for connecting to the flexible tape. Each flexible tape combination includes two flexible tapes, and the two flexible tapes are connected to the first interface and the second interface respectively.

[0089] The flexible tape for connecting the TOSA device further includes a single flexible tape for connecting to the Driver-in-TOSA device, and the single flexible tape is connected to the first interface or the second interface.

[0090] When any flexible tape is connected to the first interface or the second interface, one end of the flexible tape is connected to at least part of the pins of the first interface or the second interface, and the other end is used to connect to the corresponding TOSA device.

[0091] The pins of the interface are designed to be compatible with a variety of TOSA devices.

[0092] 13 to 20 , the multiple flexible tape combinations for connecting to different types of TOSA devices include at least a first flexible tape combination for matching (connecting) with a Driver-out DMLTOSA device and a second flexible tape combination for matching (connecting) with a Driver-out EMLTOSA device.

[0093] When the TOSA device under test is a Driver-in-TOSA device, the test board is connected to the Driver-in-TOSA device via a single flexible tape, namely a first flexible tape. The test board-side pins of the first flexible tape are used to connect to the first interface on the top surface of the test board, and the device-side pins of the first flexible tape are used to connect to the Driver-in-TOSA device.

[0094] When the TOSA device under test is a driver-out DMLTOSA device, the test board is connected to the driver-out DMLTOSA device via a first flexible tape assembly. The first flexible tape assembly includes a second flexible tape and a third flexible tape. The test board-side pins of the second flexible tape are connected to the first interface on the top surface of the test board, and the device-side pins of the second flexible tape are connected to the driver-out DMLTOSA device. The test board-side pins of the third flexible tape are connected to the second interface on the bottom surface of the test board, and the device-side pins of the second flexible tape are connected to the driver-out DMLTOSA device.

[0095] When the TOSA device under test is a driver-out EMLTOSA device, the test board is connected to the driver-out EMLTOSA device via a second flexible tape assembly. The second flexible tape assembly includes a third flexible tape and a fourth flexible tape. The test board-side pins of the fourth flexible tape are connected to the first interface on the top surface of the test board, and the device-side pins of the fourth flexible tape are connected to the driver-out EMLTOSA device. The test board-side pins of the third flexible tape are connected to the second interface on the bottom surface of the test board, and the device-side pins of the second flexible tape are connected to the driver-out EMLTOSA device.

[0096] The driver-in TOSA device only requires one flexible tape connection, as the pins used in this solution are all on one side of the test board. The driver-out and EMLTOSA devices require two flexible tape connections, as the pins used are distributed on both the top and bottom sides of the test board.

[0097] When the first flexible tape assembly is connected to the interface (including the first interface and the second interface), the first flexible tape assembly is at least connected to the Driver power supply pin, I 2When the second flexible tape assembly and the third flexible tape assembly are connected to the interface (including the first interface and the second interface), the second flexible tape assembly and the third flexible tape assembly are at least connected to the LD power pin of the interface.

[0098] In some embodiments, the main control circuit utilizes an MCU. The test board utilizes the MCU as the main control component. The MCU utilizes an ADUCM320I chip. This MCU not only performs the main control functions of the entire power-on test board but also, by connecting to VCC_252.5V as a reference voltage, provides four IDAC output currents for driving the TOSA device in Driver Out & EML mode. Multiple ADC pins on this microcontroller are connected to the TOSA device, such as the MPD1, MPD2, MPD3, and MPD4 pins. These pins can be used to sample the optical power monitoring chip MPD within the TOSA. By setting a fixed optical power, the PD generates a corresponding current. Sampling resistors R25, R26, R27, and R28 convert this current into sampled voltages MPD0, MPD1, MPD2, and MPD3, which the MCU reports to the host computer. The MPD responsivity can be calculated using a formula. By measuring this responsivity, the MPD within the TOSA device can be tested for compliance.

[0099] In some embodiments, the present invention utilizes an ADUCM320I MCU with four IDAC pins. Simply providing a 2.5V reference voltage allows for four constant current source outputs to drive the laser. The EML type requires an additional EA control function in Driver-out mode. This EA driver circuit controls the TOSA's internal EA modulator, completing a power-on test at a fixed EA voltage. This is primarily to test the EA functionality. Furthermore, using the module's conventional EA value for fixed-point coupling ensures accurate alignment of the optical power between the device and module, preventing excessive or insufficient light at the module end.

[0100] In some embodiments, two 24-pin pins are reserved on the TOP surface and the BOT surface of the test board, and two 24-pin card sockets are welded to serve as the interface.

[0101] In some embodiments, a mode switching circuit is provided on the test board, and the mode switching circuit is connected to the main control circuit. The mode switching circuit is used to output a mode switching signal to the main control circuit according to a user instruction.

[0102] In some embodiments, the mode switching circuit includes a switch, one end of which is grounded, and the other end of which is connected to a first input terminal and a second voltage terminal of the main control circuit, respectively. The present invention uses the switch to control switching between two modes: Driver-in mode and Driver-out mode. In either Driver-in or Driver-out mode, other circuits, such as the EA driver circuit, are controlled through software settings.

[0103] In some embodiments, the other end of the switch is connected to a second voltage (eg, 3.3V) via a resistor R56 .

[0104] In some embodiments, the switch is a dip switch.

[0105] As shown in Figure 4, U17 is the switching pin between the Driver in and Driver out & EML power-up modes. A pin is reserved on the test board and connected to an external DIP switch via a wire. In actual use, this DIP switch can be used to switch between the two power-up modes. D2 is a status indicator for the two power-up modes and is connected via a wire. When the DIP switch is closed, the Mode_SW pin is pulled low. This pin is connected to the MCU IO port P0.0. When P0.0 is low, the test board activates the Driver in power-up mode and indicator D2 is short-circuited, turning off the indicator. When the DIP switch is open, the Mode_SW pin is high, and P0.0 is also high, enabling the Driver out & EML power-up mode.

[0106] In some embodiments, referring to FIG6 , in order to facilitate firmware debugging after the first version of the circuit is completed, a plurality of test pins are reserved on the test board, and the master and slave I 2 C pin, four-way MCU output BIAS, and BIAS output by the sampling chip.

[0107] In some embodiments, the main control circuit has at least one first ADC pin for sampling and monitoring the laser drive current. The test board is also provided with a laser drive current monitoring circuit, which is used to monitor the drive current output by the IDAC output end of the main control circuit and transmit the monitored information to the first ADC pin of the main control circuit.

[0108] The laser drive current monitoring circuit is used to monitor the current on the powered laser in real time. Through monitoring, it can ensure that the current is accurately added to the laser.

[0109] The laser drive current monitoring circuit includes an amplifier circuit and a first sampling resistor connected in series between the IDAC output end of the main control circuit and the LD power pin of the interface. The amplifier circuit is used to amplify the voltage difference across the first sampling resistor. The output end of the amplifier circuit is connected to the first ADC pin of the main control circuit and is used to output voltages TXBIAS1, TXBIAS2, TXBIAS3, and TXBIAS4 to the ADC pins AIN3, AIN4, AIN5, and AIN6 of the main control circuit, thereby completing real-time sampling and monitoring of the laser drive current.

[0110] One end of the first sampling resistor is connected to the IDAC output end of the main control circuit, and the other end of the first sampling resistor is connected to the LD power-on pin corresponding to the interface.

[0111] In some embodiments, as shown in Figure 10, a laser drive current monitoring circuit utilizes a MAX9634 chip. Four sampling resistors, R16, R52, R20, R53, R21, R54, and R24, R55, are connected in series in the circuit, corresponding to four current channels. Four MAX9634 chips are connected in parallel across the sampling resistors, amplifying the voltage difference across them by a factor of 50. The output voltages TXBIAS1, TXBIAS2, TXBIAS3, and TXBIAS4 are connected to the MCU ADC pins AIN3, AIN4, AIN5, and AIN6, enabling real-time sampling and monitoring of the laser drive current.

[0112] In some embodiments, the main control circuit has at least one VDAC output terminal, and an EA driving circuit is also provided on the test board. The input terminal of the EA driving circuit is connected to the VDAC output terminal of the main control circuit, and the output terminal of the EA driving circuit is connected to the EA pin of the interface.

[0113] The EA drive circuit includes an op amp. Its non-inverting input is connected to ground via resistor R36. Its inverting input is connected to the VDAC output of the main control circuit via resistor R32. Its inverting input is connected to the output of the op amp via resistor R30 and capacitor C50. Resistor R30 and capacitor C50 are connected in parallel. The V+ pin of the op amp is connected to a positive voltage; the V- pin of the op amp is connected to a negative voltage (VSS). The V+ pin of the op amp is grounded via capacitor C54, and the V- pin of the op amp is grounded via capacitor C57. The positive voltage is a reference voltage.

[0114] The main control circuit is used to control the VDAC output end to output the EA setting voltage to the corresponding EA driver circuit. The EA driver circuit is used to receive the voltage output by the VDAC output end of the main control circuit and output the corresponding EA voltage to power the EA in the EML TOSA device. This can complete the EA function test and the EA optical power test in the EML TOSA device.

[0115] Figure 9 shows a four-channel EA driver circuit using the MAX4233 chip. The EASET1, EASET2, EASET3, and EASET4 pins are connected to the MCU DAC pins to set the EA voltage. The output EABIAS value is equal to -EASET. Setting the EA voltage is accomplished by adjusting the EASET pin voltage. The EA driver circuit is primarily used to power the EA in EML TOSA devices, enabling device EA functional testing and optical power testing with EA.

[0116] EML types require additional EA control in Driver-out mode. This EA driver circuit controls the TOSA's internal EA modulator, allowing power-on testing to be performed at a fixed EA voltage. This is primarily to verify proper EA functionality. Furthermore, using the module's standard EA value for fixed-point coupling ensures accurate alignment of optical power between the device and module, preventing overshoot or undershoot at the module end.

[0117] In some embodiments, the main control circuit has at least one second ADC pin for sampling the optical power monitoring chip MPD within the TOSA device. Each second ADC pin of the main control circuit is connected to a corresponding MPD pin of the interface and one end of a second sampling resistor. The other end of the second sampling resistor is grounded. A capacitor is connected in parallel across the second sampling resistor.

[0118] Multiple ADC pins of the microcontroller are connected to the TOSA device, such as the MPD1, MPD2, MPD3, and MPD4 pins, which can be used to sample the optical power monitoring chip MPD inside the TOSA. By setting the fixed-point optical power, the PD will generate a corresponding current, which the sampling resistors R25, R26, R27, and R28 convert into sampling voltages MPD0, MPD1, MPD2, and MPD3. The MCU reports it to the host computer. The MPD responsivity can be calculated through formula calculation. By measuring the responsivity, it can be tested whether the MPD inside the TOSA device is qualified.

[0119] In some embodiments, the test board is also provided with a TEC control circuit, making it compatible with power-on temperature control tests for various TOSA devices. The first input of the TEC control circuit is connected to the output pin TECON of the main control circuit. The TEC control circuit's on / off control is controlled via the TECON pin of the main control circuit. The TEC control outputs TEC+ and TEC- of the TEC control circuit are connected to corresponding pins of the interface and, via a flexible tape connected to the interface, to the TOSA device. This circuit is used to provide current to the TEC within the TOSA device, driving the TEC to operate. The second input of the TEC control circuit is connected to the RTH pin of the interface, receiving the temperature sampled by the internal thermistor of the TOSA device and converting it into a voltage for output to the third ADC pin of the main control circuit. The TEC drive circuit is primarily used to provide current to the TEC within the TOSA, driving the TEC to operate, while also coordinating with the internal thermistor of the TOSA for temperature sampling. The temperature point can be set via the MCU, and a PID algorithm can be used to maintain a stable TEC temperature.

[0120] Figure 11 shows the TEC driver circuit, which includes a TEC controller. TEC controller U14 uses the ADN8834 chip. Pin TECON of TEC controller U14 is connected to the MCU, enabling the TEC to be turned on and off. ITEC and VTEC are connected to the MCU ADC pins to monitor the TEC's operating current and voltage. RTH is connected to the power-on test board connector and connected to the thermistor inside the TOSA via a custom flexible tape. Temperature fluctuations cause the thermistor's resistance to change, causing the LTEMP voltage to change. LTEMP is connected to an MCU ADC pin, and by monitoring this voltage, the internal TOSA temperature can be monitored in real time. The TEC_SET pin is connected to an MCU DAC pin to set the TEC's temperature control temperature. The MCU monitors the real-time temperature and, using a PID algorithm, continuously adjusts the set temperature to keep the actual temperature close to the target, thereby maintaining a constant temperature.

[0121] In some embodiments, referring to FIG5 , the test board is further provided with a communication interface U2 for connecting to a host computer. U2 is the I 2 Pin C is used to connect an external USB communication box to a computer, enabling host computer control of the test board. When performing PIV testing on TOSA devices, an external programmable power supply and optical power meter are required, along with connection to the computer. The test board is connected to the TOSA device via a custom flexible tape, and the TOSA device's optical port is connected to the optical power meter via optical fiber.

[0122] In some embodiments, the power supply circuit is primarily used to convert an external 3.3V voltage into 3.7V, 2.5V, and -3V. The 3.7V voltage is primarily used to power the driver in Driver-in mode, the 2.5V voltage is primarily used as the reference voltage for the MCU's four current outputs, and the -3V voltage is primarily used to power the MAX4233 chip in the EA driver circuit.

[0123] In some embodiments, the first DC-DC circuit uses a DC-DC chip U4. The DC-DC chip U4 in this embodiment is a TPS6300 chip, which can boost the 3.3V voltage and output a 3.7V voltage for powering the TOSA internal driver in the test board's Driver in mode.

[0124] In some embodiments, the power supply circuit includes a second DC-DC circuit. The output of the second DC-DC circuit is connected to the main control circuit and is used to output a reference voltage to the main control circuit, causing each IDAC output terminal of the main control circuit to output current. The enable terminal of the second DC-DC circuit is connected to the second output terminal of the main control circuit. The second DC-DC circuit uses a DC-DC chip U5. The DC-DC chip U5 in this embodiment is an MPM3810 chip, which is used to output a 2.5V voltage, which is mainly used to supply the current reference voltage of the four IDACs of the MCU.

[0125] The power supply circuit includes a third DC-DC circuit. The output of the third DC-DC circuit is connected to the EA driver circuit, outputting a negative voltage (VSS) to power the EA driver circuit. The enable terminal of the third DC-DC circuit is connected to the third output terminal of the main control circuit. The third DC-DC circuit uses a negative voltage chip U18. Negative voltage chip U18 is used to convert a 3.3V voltage into a negative voltage of 3V for use in the EA driver circuit chip.

[0126] The power supply circuit includes a slow-start circuit, the input end of the slow-start circuit is connected to the input voltage, and the output end of the slow-start circuit outputs a second voltage. The input ends of the first DC-DC circuit, the second DC-DC circuit, and the third DC-DC circuit are connected to the second voltage.

[0127] The slow-start circuit uses chip U3. This embodiment uses the ADP196 chip from Analog Devices. This circuit can protect and reduce Inrush and protect the subsequent circuits.

[0128] The power supply circuit includes a power input interface U1 , and the power input interface U1 is connected to an input voltage VCC.

[0129] Preferably, a circuit for filtering power ripple is provided between the power input interface U1 and the input voltage VCC.

[0130] A capacitor and a ferrite bead L1 are installed between the power input interface U1 and the input voltage terminal VCC. One end of the ferrite bead L1 is connected to one end of capacitor C4 and the positive terminal of the power input interface, respectively. The other end of capacitor C4 is grounded. The other end of the ferrite bead L1 is connected to one end of capacitor C1 and the input voltage terminal, respectively. The other end of capacitor C1 is grounded. The capacitor and ferrite bead filter the power ripple.

[0131] The power supply circuit includes an indicator light D1 , wherein the positive pole of the indicator light D1 is connected to the positive pole of the power input interface, and the negative pole of the indicator light D1 is grounded directly or via a resistor.

[0132] The test board requires an external programmable power supply, which outputs 3.3V voltage to the power test board and is connected to the power test board through U1. D1 is the power indicator of the power test board.

[0133] This invention integrates the power-on and temperature-control capabilities of various device solutions onto a single test board through hardware circuit design. This board is then connected to the test board via a custom flexible tape. One end of the tape connects to the test board's interface and the other to the TOSA device. This allows for power-on and temperature-control, MPD responsivity, and other tests on a variety of different devices. Switching between TOSA devices requires only selecting the mode and replacing the corresponding flexible tape, making operation convenient and simple.

[0134] The test board of the present invention can support simultaneous power-on of up to 4 channels and includes EA control function, real-time monitoring function of power-on current, and TEC control function. Therefore, the power-on board has a wide range of uses and powerful functions. It can be used for PIV testing of 10G, 25G, 100G, 200G, and 400G series BOX devices, lens coupling and optical port coupling power-on, and MPD responsivity testing.

[0135] This test board is designed for 100G LR4 Driver-in TOSAs. Unlike other TOSAs (without an internal driver), this TOSA integrates an internal driver, requiring the laser to be powered by controlling the driver inside the TOSA and providing the appropriate voltage to the driver. This test board is compatible with this TOSA and supports power-on and temperature-controlled testing of this TOSA.

[0136] This invention targets both driver-out DML and EML TOSAs. These TOSAs utilize essentially the same power-up method: the laser is driven by the driver output current on the test board. EML devices typically require an EA at the device end for optical port coupling to ensure consistent optical power alignment with the module end. This test board also incorporates this functionality.

[0137] The present invention addresses the two current power-up modes of driver-in and driver-out / EML TOSAs. This test board incorporates a switch and status indicator, enabling instant switching between the two power-up modes while ensuring that when one mode is powered on, the other is disabled. In the event of a mode switch error or incorrect use of the flexible tape, the TOSA device will not power on. Furthermore, after each power-up test, the host computer software disables the power-up board's current output to prevent short circuits caused by hot-swap TOSA components.

[0138] Example 2

[0139] 1 to 11 , an embodiment of the present invention further discloses a TOSA device testing system, including a power supply, a host computer, a power meter, and the TOSA device testing apparatus described in Example 1. The host computer is connected to and communicates with a test board, the power supply is connected to the test board for powering the test board, the interface of the test board is connected to the TOSA device to be tested via a flexible tape, and the optical port of the TOSA device to be tested is connected to the optical power meter via an optical fiber.

[0140] When the TOSA device to be tested is a Driver-in-TOSA device, the test board is used to control the Driver inside the Driver-in-TOSA device to output currents with different steps to power the laser, so that the Driver-in-TOSA device emits light of different powers.

[0141] When the TOSA device to be tested is a Driver-out DMLTOSA device or a Driver-out EMLTOSA device, the test board is used to output currents with different steps to power a laser in the Driver-out DMLTOSA device or the Driver-out EMLTOSA device, so that the Driver-out DMLTOSA device or the Driver-out EMLTOSA device emits light of different powers;

[0142] The power meter is connected to the optical port of the Driver-in TOSA device, the Driver-out DMLTOSA device, or the Driver-out EMLTOSA device via an optical fiber, and is used to detect the optical power value of the Driver-in TOSA device, the Driver-out DMLTOSA device, or the Driver-out EMLTOSA device, and upload it to a host computer. The host computer is used to record the currents of different steps and the corresponding optical power values ​​to form a PIV curve.

[0143] The software control process of the present invention mainly includes the interface part, the execution part, data display, data upload, data storage, and sequence management. The interface part includes the device management interface, the data calibration interface, and the system parameter interface. The execution part adopts the class inheritance polymorphism idea, designs different execution steps into the same input and output, and completes the serialized scripted execution through the plug-in mode and the name execution of different method steps. The management of the execution steps is completed through the sequence management tool. Finally, the data execution results are displayed on the interface, uploaded to the MES, and stored on the server. When the hardware system is completed and the software can execute the steps normally, the temperature control and PIV curve collection work can be carried out according to the characteristics of different devices. The collected curve needs to undergo a series of filtering before it can be used again, and finally the threshold, kink and other parameters that reflect the performance of the device can be calculated.

[0144] During the PIV test, the host computer controls the programmable power supply to power the powered test board, then controls the TEC driver. According to the TEC temperature value set by the host computer, the TEC temperature is first kept stable (for TOSA devices with TEC). Then, the powered test board is controlled to control the internal driver output current of the TOSA (Driver in mode) or directly output current to drive the TOSA (Driver out & EML mode). The host computer continuously adjusts the output current in a certain step and simultaneously collects the optical power value of the optical power meter. The corresponding current I and optical power P are collected and recorded to form a PIV curve.

[0145] When coupling a TOSA lens or optical port, an external programmable power supply and the optical power meter included with the coupling machine are also required. The connection method is the same as for PIV testing: the programmable power supply and power board must be connected to the computer, and the coupling machine must be connected to the computer. During the coupling test, the manufacturer's host computer software first initializes (test specifications vary depending on the product, primarily regarding the number of channels, TEC temperature, and current). Then, the TEC temperature is controlled. Once the temperature stabilizes, power is applied, and the optical power meter detects the corresponding optical power value. During lens coupling, a robotic arm grasps the lens and adjusts its position using its algorithm. The software stops when it detects that the optical power reaches the target value. The lens can then be glued, completing the lens coupling operation. During optical port coupling, a robotic arm grasps the optical port and adjusts its position using its algorithm. When the software detects that the optical power reaches the target value, the coupling machine performs laser welding, joining the optical port to the BOX device housing, completing the optical port coupling operation.

[0146] Therefore, the test system of the present invention can complete PIV testing, optical port coupling, lens coupling power-up, and MPD responsivity testing of various BOX-type TOSAs.

[0147] Example 3

[0148] 1 to 12 , the present invention further discloses a TOSA device testing method, including a PIV testing step for a TOSA device, specifically comprising:

[0149] Power the test board, control the TEC drive circuit, set the TEC temperature value according to the host computer, and first keep the TEC temperature stable (for TOSA devices with TEC);

[0150] The host computer uses I 2 C controls the control board, which controls the driver inside the TOSA device under test to output currents with different steps to power the laser through the test board, or controls the test board to output currents with different steps to power the laser inside the TOSA device under test, so that the TOSA device under test emits light with different powers and collects corresponding optical power values;

[0151] The currents of different steps and the corresponding optical power values ​​are recorded to form a PIV curve. Through the software algorithm, the TOSA laser threshold current and KINK point can be calculated to determine whether the TOSA device under test is qualified.

[0152] Furthermore, the TOSA device testing method of the present invention further includes an MPD responsivity testing step, specifically including:

[0153] By setting the fixed optical power, the PD will generate a corresponding current, sample the optical power monitoring chip MPD inside the TOSA device, and calculate the MPD responsivity.

[0154] Furthermore, the TOSA device testing method of the present invention further includes an optical port coupling step, specifically comprising: supplying power to the test board, controlling the driver inside the TOSA device under test to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device under test, and collecting a corresponding optical power value;

[0155] Adjust the optical port position until the optical power value reaches the target value, then stop and perform laser welding to weld the optical port and the TOSA device shell together to complete the optical port coupling operation.

[0156] Furthermore, the TOSA device testing method of the present invention further includes a lens coupling step, specifically comprising: supplying power to the test board, controlling the driver inside the TOSA device under test to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device under test, and collecting a corresponding optical power value;

[0157] Adjust the lens position until the optical power reaches the target value, then stop and glue the lens to complete the lens coupling operation.

[0158] Furthermore, the calculation steps of threshold and kink include:

[0159] Step 1: Get current and power values;

[0160] Step 2: Preprocess the current and power data, specifically including: performing moving average processing of multiple points (such as 10 points) on the original power value to prevent data jitter.

[0161] Step 3: Perform the first-order derivative (first-order derivative) and second-order derivative (second-order derivative) of the power to obtain the calculated first-order derivative value P1 and the calculated second-order derivative value, respectively. The current point corresponding to the maximum value of the second-order derivative is the threshold value ith. In the third step, fit the data of the first-order derivative of power to the current data to obtain the linear fitting value P2.

[0162] The fourth step is to use the formula kink = Max(abs((P1-P2) / P2)*100% to obtain the kink value, where P1 is the calculated value of the first-order derivative of power and P2 is the value after linear fitting of power.

[0163] The present invention provides a test method for PIV of optical devices based on LabVIEW. By designing a hardware circuit board to change the current, reading the data on the power meter, and then using a certain filtering and fitting algorithm to obtain the corresponding PIV curve and the calculation points on the curve, the device performance is determined. The entire system is composed of four parts: device system construction, hardware driving circuit, software system, and algorithm analysis. The purpose of the device system part is to complete the hardware preparation work of scanning the PIV curve by combining hardware devices. The driving circuit board mainly realizes changing the driving current of the device so that the device outputs different power. The software system mainly realizes compatibility with different hardware devices and compatibility with different functions. The algorithm part mainly realizes the calculation of the PIV curve. The present invention can realize the effect of changing EA conditions to affect power, controlling TEC to achieve temperature control, and achieving the effect of affecting the power size by setting the BIAS bias current of the MCU control device. Therefore, it is very necessary for the present invention to build a flexible hardware system and software system and design a suitable calculation method.

[0164] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A TOSA device testing device, characterized in that: The invention comprises a test board and a soft belt for connecting a TOSA device, wherein the test board is provided with a power supply circuit, a main control circuit and an interface for connecting the soft belt, wherein the power supply circuit is used to supply power to the test board, and the I 2 C pin interfaces with the I 2 The main control circuit is connected to the C pin, the main control circuit is used to receive the mode switching signal and perform power-on mode switching, the main control circuit has at least one IDAC output terminal, and the main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and to control its I 2 C pin outputs control signals to the interface’s I 2 C pin, the control signal is configured to control the corresponding drive current of the Driver output inside the TOSA device.

2. The TOSA device testing device according to claim 1, wherein: The soft tape used to connect the TOSA device includes at least a plurality of soft tape combinations respectively used to connect with different types of TOSA devices. The TOP surface of the test board is provided with a first interface for connecting the soft tape, and the BOT surface of the test board is provided with a second interface for connecting the soft tape. Each soft tape combination includes two soft tapes, and the two soft tapes are respectively connected to the first interface and the second interface. The flexible tape for connecting the TOSA device also includes a single flexible tape for connecting with the Driver in TOSA device, and the single flexible tape is connected with the first interface or the second interface.

3. The TOSA device testing device according to claim 1, wherein: The test board is provided with a mode switching circuit, which is connected to the main control circuit. The mode switching circuit is used to output a mode switching signal to the main control circuit according to a user instruction.

4. The TOSA device testing device according to claim 3, wherein: The mode switching circuit includes a switching switch, one end of the switching switch is grounded, and the other end of the switching switch is respectively connected to the first input end and the second voltage connection of the main control circuit.

5. The TOSA device testing device according to claim 1, wherein: The main control circuit has at least one first ADC pin for sampling and monitoring the laser drive current. The test board is also provided with a laser drive current monitoring circuit, which is used to monitor the drive current output by the IDAC output terminal of the main control circuit and transmit the monitored information to the first ADC pin of the main control circuit; or / and, The main control circuit has at least one VDAC output terminal, and the test board is also provided with an EA drive circuit, the input terminal of the EA drive circuit is connected to the VDAC output terminal of the main control circuit, and the output terminal of the EA drive circuit is connected to the EA pin of the interface; or / and, The main control circuit has at least one second ADC pin for sampling the optical power monitoring chip MPD inside the TOSA device, each second ADC pin of the main control circuit is respectively connected to the MPD pin corresponding to the interface and one end of the second sampling resistor, and the other end of the second sampling resistor is grounded; or / and, The test board is also provided with a TEC control circuit for driving the TEC inside the TOSA device to work, and the TEC control circuit is respectively connected to the main control circuit and some pins of the interface; or / and, The test board is also provided with a communication interface for connecting to a host computer.

6. The TOSA device testing device according to claim 5, characterized in that: The laser driving current monitoring circuit comprises an amplifier circuit and a first sampling resistor connected in series between the IDAC output terminal of the main control circuit and the LD power-on pin of the interface, wherein the amplifier circuit is used to amplify the voltage difference between the two ends of the first sampling resistor, and the output terminal of the amplifier circuit is connected to the first ADC pin of the main control circuit; or / and, The EA driving circuit includes an operational amplifier, wherein the in-phase input terminal of the operational amplifier is grounded via a resistor R36, the inverting input terminal of the operational amplifier is connected to the VDAC output terminal of the main control circuit via a resistor R32, the inverting input terminal of the operational amplifier is connected to the output terminal of the operational amplifier via a resistor R30 and a capacitor C50, the resistor R30 and the capacitor C50 are connected in parallel, the V+ pin of the operational amplifier is connected to a positive voltage, and the V- pin of the operational amplifier is connected to a negative voltage VSS; or / and, The first input end of the TEC control circuit is connected to the output pin TECON of the main control circuit, and the switch of the TEC control circuit is controlled by the TECON pin of the main control circuit. The TEC control output ends TEC+ and TEC- of the TEC control circuit are connected to the corresponding pins of the interface, and are connected to the TOSA device via a soft tape connected to the interface, so as to provide current to the TEC inside the TOSA device and drive the TEC to work. The second input end of the TEC control circuit is connected to the RTH pin of the interface, so as to receive the temperature sampled by the thermistor inside the TOSA device, and convert it into a voltage and output it to the third ADC pin of the main control circuit.

7. The TOSA device testing device according to claim 1, wherein: The power supply circuit includes a first DC-DC circuit for outputting a first voltage to power a Driver inside the TOSA device, wherein an output end of the first DC-DC circuit is connected to a Driver power supply pin of the interface, and an enable end of the first DC-DC circuit is connected to a first output end of the main control circuit; when in a first power-on mode, the main control circuit is used to control the first DC-DC circuit to output a first voltage to the Driver power supply pin of the interface; or / and, The power supply circuit includes a second DC-DC circuit, the output end of the second DC-DC circuit is connected to the main control circuit, and is used to output a reference voltage to the main control circuit, so that each IDAC output end of the main control circuit outputs a current, and the enable end of the second DC-DC circuit is connected to the second output end of the main control circuit; or / and, The power supply circuit includes a third DC-DC circuit, the output end of the third DC-DC circuit is connected to the EA driving circuit, and is used to output a negative voltage VSS to power the EA driving circuit. The enable end of the third DC-DC circuit is connected to the third output end of the main control circuit.

8. A TOSA device testing system, characterized in that: The invention comprises a power supply, a host computer, a power meter and a TOSA device test device as described in any one of claims 1 to 7, wherein the host computer is connected and communicated with a test board, the power supply is connected with the test board to supply power to the test board, the interface of the test board is connected to the TOSA device to be tested through a soft tape, and the optical port of the TOSA device to be tested is connected to the optical power meter through an optical fiber.

9. A TOSA device testing method, characterized in that: The PIV test steps for TOSA devices include: Power the test board, and control the driver inside the TOSA device under test to output currents with different steps to power the laser through the test board, or control the test board to output currents with different steps to power the laser inside the TOSA device under test, so that the TOSA device under test emits light with different powers, and collects the corresponding optical power values; Record the current and corresponding optical power values ​​of different steps and calculate the threshold value and kink.

10. The TOSA device testing method according to claim 9, wherein: Record the current and corresponding optical power values ​​of different steps, and calculate the threshold and kink, including: Get current and power data; Preprocessing of current and power data; Derivative the power data to obtain the threshold value; Fit the derivative result with the current data to obtain kink; The power data is derived to obtain a threshold value, specifically including: taking the first-order and second-order derivatives of the power, where the value of the current point corresponding to the maximum value of the second-order derivative is the threshold value ith; The derivative result and the current data are fitted to obtain kink, specifically including: fitting the data of the first-order derivative of power and the current data to obtain a linear fitting value, and using the formula kink=Max(abs((the calculated value of the first-order derivative of power-the value after linear fitting) / the value after linear fitting))*100% to obtain the kink value.

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