Force decay system and alignment apparatus for package leak detection

Abstract

A force decay leak testing system includes a top test chamber assembly that includes a measurement area including one or more sensors configured to perform force decay measurements on one or more packages. A bottom test chamber assembly includes an insert configured to hold the one or more packages. A test chamber that is at least partially formed by the top test chamber assembly and the bottom test chamber assembly. The insert includes a top frame and a bottom frame, wherein top frame is configured to receive the one or more packages. The insert includes one or more biasing components configured to provide a bias force pressing the insert towards the measurement area to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing.

Description

FORCE DECAY SYSTEM AND ALIGNMENT APPARATUS FOR PACKAGE LEAK DETECTIONCROSS REFERENCE TO RELATED APPLICATIONS

[0001] This application claims priority to U.S. Provisional Application No. 63 / 607,760 filed December 8, 2023, the entire contents of which are incorporated herein by reference.TECHNICAL FIELD

[0002] The present disclosure generally relates to systems and methods for leak testing a package package, and more specifically relates to an alignment apparatus for package leak detection.BACKGROUND

[0003] A force decay leak testing system is a defect detection machine that can test different package formats using force decay method. The force decay leak testing system uses a pressure sensor to determine if packages are defective. Packages with no defects inflate under vacuum and produce a force response. Packages with defects show a lower response, no response, or a decaying response.SUMMARY

[0004] An exemplary force decay leak testing system includes a top test chamber assembly that includes a measurement area including one or more sensors configured to perform force decay measurements on one or more packages. A bottom test chamber assembly includes an insert configured to hold the one or more packages. A test chamber that is at least partially formed by the top test chamber assembly and the bottom test chamber assembly. The insert includes a top frame and a bottom frame, wherein top frame is configured to receive the one or more packages. The insert includes one or more biasing components configured to provide a bias force pressing the insert towards the measurement area to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing.

[0005] An exemplary insert is configured to hold one or more packages during a force decay leak test. The insert includes a top frame and a bottom frame, wherein the top frame is configured to receive the one or more packages. The insert includes one or more biasing components configured to provide a bias force pressing the insert towards a force decay measurement area including oneor more sensors, to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing. The insert includes one or more spacers configured to maintain a defined gap between the insert and the one or more sensors during a force decay leak testing.

[0006] A method of manufacturing a force decay leak testing system includes assembling a top test chamber assembly including a measurement area that includes one or more sensors configured to perform force decay measurements on one or more packages. The method includes assembling a bottom test chamber assembly that includes an insert configured to hold the one or more packages. The method includes assembling the insert that includes a top frame and a bottom frame, wherein the top frame is configured to receive the one or more packages. The insert includes one or more biasing components configured to provide a bias force pressing the insert towards the measurement area to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing. The method includes coupling the top test chamber assembly and the bottom test chamber assembly such that a test chamber is at least partially formed by the top test chamber assembly and the bottom test chamber assembly.BRIEF DESCRIPTION OF DRAWINGS

[0007] The disclosure is better understood with reference to the following drawings and description. The elements in the figures are not necessarily to scale, emphasis instead being placed upon illustrating the principles of the disclosure. Moreover, in the figures, like-referenced numerals may designate to corresponding parts throughout the different views.

[0008] FIG. 1 shows illustrations of an exemplary insert configured to hold packages during a force decay leak test.

[0009] FIG. 2 shows bottom view illustrations of various biasing component configurations in the insert.

[0010] FIG. 3 is a block diagram of an exemplary force decay leak testing system including the insert of FIG. 1.

[0011] FIG. 4 shows an image of an exemplary force decay leak testing system including the insert of FIG. 1.

[0012] In one or more implementations, not all of the depicted components in each figure may be required, and one or more implementations may include additional components not shown in afigure. Variations in the arrangement and type of the components may be made without departing from the scope of the subject disclosure. Additional components, different components, or fewer components may be utilized within the scope of the subject disclosure.DETAILED DESCRIPTION

[0013] The detailed description set forth below is intended as a description of various implementations and is not intended to represent the only implementations in which the subject technology may be practiced. As those skilled in the art would realize, the described implementations may be modified in various different ways, all without departing from the scope of the present disclosure. Accordingly, the drawings and description are to be regarded as illustrative in nature and not restrictive.

[0014] A force decay leak testing system is a defect detection machine that can test different package formats using force decay method. The force decay leak testing system uses a sensor or sensors to determine if packages are defective. Packages with no defects inflate under vacuum and produce a force response. Packages with defects show a lower response, no response, or a decaying response. The sensor or sensors include, but are not limited to, one or more pressure sensors, one or more force sensitive resistors (FSRs), an array of FSRs, one or more load cells, and one or more force transducers, etc. Packages with no defects inflate under vacuum and produce a force response. Packages with defects show a lower response, no response, or a decaying response.

[0015] During force decay leak testing, many factors may lead to inconsistent and non-repeatable test results, including variations in gasket thickness, machining tolerances, tension and part variation, etc. Improper alignment of the packages may cause false positives and / or false negatives depending on the difference in parallelism (e.g., parallelism between the packages and the pressure sensor).

[0016] The present disclosure is directed to method and apparatus to maintain consistent distance (e.g., the distance between the packages and the pressure or force sensor) and positioning of packages in order to account for package variation and system tolerance. A consistent gap between the packages and the pressure or force sensor may be desired for reliability and repeatability of the test results.

[0017] The exemplary embodiments disclosed herein provide a bias force to a test insert (configured to hold the packages) allowing the test platform and the pressure or force sensor to maintain parallelism. The bias force is in the direction towards the force or pressure measurementarea (e.g., an area or a region where the force or pressure sensor is located). Additionally, the top of the test insert contains spacers that contact the pressure or force sensor and ensure the gap between the packages and the pressure or force sensor are known / pre-defmed. This reduces the tolerance stack-up between parts.

[0018] FIG. 1 shows illustrations of an example insert 100 configured to hold one or more packages during a force decay leak test. The insert 100 includes a test platform 102 configured to receive one or more packages to be tested. The test platform 102 may be a flat test platform or may include pockets, seats, or recessed spaces for receiving one or more packages. The insert 100 includes one or more spacers 104, e.g., standoffs, pads, or spacer-like components, fixed or disposed on or in a top frame 106 of the insert 100 to ensure the test platform 102 is at a specified distance to a force measurement area 108. The one or more spacers 104 may be at one or more corners of the top frame 106 and / or along one or more edges of the top frame 106.

[0019] An underside 110 of the insert 100 may have one or more biasing components 112. The biasing component 112 may be made of any material fixed or attached to a bottom frame 114 of the insert 100 to allow for a bias force exerting in a direction towards the force measurement area 108. Any material acting as a spring may be used as the biasing component 112. For example, the biasing component 112 may be a spring component made of any materials or a combination of materials (e.g., metals, alloys, polymers, etc.) and in any suitable forms, sizes, and shapes (e.g., wire, sponge, foam, pad, etc.) to achieve spring-like physical properties (e.g., strength properties, elasticity, modulus, etc ). Herein, “fixed” refers to “removably fixed / attached” or“non-removably fixed / attached.”

[0020] As shown in a side view illustration 120, during a force decay test, one or more packages 122 are positioned on the test platform 102 (on the top frame 106) of the insert 100. The one or more spacers 104 are disposed on or in the top frame 106 to create or hold a defined gap or space 124 between the test platform 102 (top frame 106) and the force measurement area 108. Herein, the force measurement area 108 refers to a region or area where one or more force or pressure sensors 126 are positioned. The one or more spacers 104 are configured for spacing function. The purpose of the one or more spacers 104 is to provide the defined gap 124. Maintaining the defined gap 124 allows for non-defective packages to exhibit the similar force response from package to package. For defective packages a known / pre-defmed gap provides less or no force response from the package. The one or more spacers 104 can be in any forms, sizes, and / or shapes. A height 125of the gap 124 may be designed depending on the size of the packages 122. In one embodiment, the height 125 may be greater than 0 centimeter (cm) and less about 0.64 cm, about 0.001 cm to about 0.64 cm, about 0.001 cm to about 0.5 cm, about 0.001 cm to about 0.4 cm, about 0.001 cm to about 0.3 cm, or about 0.001 cm to about 0.2 cm, or about 0.001 cm to about 0.1 cm.

[0021] The one or more biasing components 112 are at the underside 110 (e.g., in or on the bottom frame 114) of the insert 100. The biasing component 112 is configured to apply / maintain a bias force (pushing the test platform 102) in a direction 128 towards the force measurement area 108.

[0022] The biasing component 112 is configured for parallelism function. In one example, the biasing component 112 may be one or more springs fixed to the insert 100. The purpose of the biasing component 112 is to allow for parallelism between the force measurement area 108 and the test platform 102. The biasing component 112 is compressed under contact with bottom test chamber assembly 206, which maintains the parallelism in the force decay test system allowing for non-defective packages 122 to exhibit the same force response from package to package.

[0023] Although the biasing components 112, in the illustrated example in FIG. 1, are at the four bottom corners of the insert 100, the insert 100 may include any numbers of the biasing components 112 in any suitable distributions / configurations (e.g., along the bottom edges of the insert 100, distributed along the bottom plane of the insert 100, at any point on the bottom frame 114, at or close to the center on the bottom frame 114, etc.). FIG. 2 is a bottom view illustration of the one or more biasing components 112 attached to the bottom frame 114 of insert 100, show non-limiting examples of different biasing component distributions / configurations (a) - (d).

[0024] Although the one or more spacers 104, in the illustrated example in FIG. 1, are at top corners of the insert 100, the insert 100 may include any numbers of spacers 104 in any suitable distributions / configurations (e.g., along the top edges of the insert 100, at any points in the top plane of the insert 100, etc.).

[0025] The insert 100 disclosed herein may be used in any force decay leak test system. In one example, the insert 100 is used with a force decay test system illustrated in FIGS. 3 and 4.

[0026] FIG. 3 shows a block diagram of an exemplary force decay leak testing system 200 configured to test the one or more packages 122 using a force decay method. The force decay leak testing system 200 includes a test chamber assembly 202 that includes a top test chamber assembly 204 and a bottom test chamber assembly 206. The top test chamber assembly 204 is configured to perform force decay measurements on the one or more packages 122 (e.g., liquid and / or gasfilled packages such as blister packs, sachets, pouches with low headspace, etc ). The top test chamber assembly 204 includes a force decay tester 208 that includes systems and components necessary to perform force decay measurements. For example, the force decay tester 208 includes the force measurement area 108 and the one or more force or pressure sensors 126 positioned therein. The bottom test chamber assembly 206 is configured to hold the one or more packages 122. For example, the bottom test chamber assembly 206 includes the insert 100 to hold the one or more packages 122.

[0027] The top test chamber assembly 204 and the bottom test chamber assembly 206 are movable relative to one another to allow loading of the one or more packages 122 onto the insert 100 and to enclose the test chamber 210.

[0028] The force decay leak testing system 200 includes a vacuum pump or source 212 configured to draw vacuum from the test chamber 210, e g., through a conduit 214 connecting to the top test chamber assembly 204.

[0029] The force decay leak testing system 200 includes a controller 216 configured to control and coordinate operations of the various components and systems of the force decay leak testing system 200 to perform force decay leak tests. The controller 216 may be a computer or may include any suitable processer(s), microprocessor(s), transceiver(s), memory, a timer, analog-to- digital convertor(s) (ADC), programmable logic controller(s) (PLC), human machine interface(s) (HMI), etc. to enable its functions as disclosed and claimed. The controller 216 may further include any suitable user interface and / or display to allow output of the test results and allow a user to program or control the operation of the force decay leak testing system 200.

[0030] FIG. 4 shows another exemplary force decay leak testing system 200. In the illustrated example, the bottom test chamber assembly 206 is in a drawer-like configuration that can be slid out to allow loading of the one or more packages 122. Once the one or more packages 122 are loaded and disposed on the insert 100 the top test chamber assembly 204 and the bottom test chamber assembly 206 are brought into contact with each other to form a hermetic seal with the test chamber 210 enclosed in-between. The controller 216 includes a touch screen operator display 218.

[0031] As used herein, the term “or” may be construed in either an inclusive or exclusive sense. Moreover, the description of resources, operations, or structures in the singular shall not be read to exclude the plural. Conditional language, such as, among others, “can,” “could,” “might,” or“may,” unless specifically stated otherwise, or otherwise understood within the context as used, is generally intended to convey that certain embodiments include, while other embodiments do not include, certain features, elements and / or steps.

[0032] Terms and phrases used in this document, and variations thereof, unless otherwise expressly stated, should be construed as open ended as opposed to limiting. Adjectives such as “conventional,” “traditional,” “normal,” “standard,” “known,” and terms of similar meaning should not be construed as limiting the item described to a given time period or to an item available as of a given time, but instead should be read to encompass conventional, traditional, normal, or standard technologies that may be available or known now or at any time in the future. The presence of broadening words and phrases such as “one or more,” “at least,” “but not limited to” or other like phrases in some instances shall not be read to mean that the narrower case is intended or required in instances where such broadening phrases may be absent.

[0033] The foregoing description of the present disclosure has been provided for the purposes of illustration and description. It is not intended to be exhaustive or to limit the disclosure to the precise forms disclosed. The breadth and scope of the present disclosure should not be limited by any of the above-described exemplary embodiments. Many modifications and variations will be apparent to the practitioner skilled in the art. The modifications and variations include any relevant combination of the disclosed features. The embodiments were chosen and described in order to best explain the principles of the disclosure and its practical application, thereby enabling others skilled in the art to understand the disclosure for various embodiments and with various modifications that are suited to the particular use contemplated. It is intended that the scope of the disclosure be defined by the following claims and their equivalence.

[0034] In one aspect, a method may include an operation, an instruction, and / or a function and vice versa. In one aspect, a clause or a claim may be amended to include some or all of the words (e.g., instructions, operations, functions, or components) recited in other one or more clauses, one or more words, one or more sentences, one or more phrases, one or more paragraphs, and / or one or more claims.

[0035] To illustrate the interchangeability of hardware and software, items such as the various illustrative blocks, modules, components, methods, operations, instructions, and algorithms have been described generally in terms of their functionality. Whether such functionality is implemented as hardware, software or a combination of hardware and software depends upon theparticular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application.

[0036] The functions, acts or tasks illustrated in the Figures or described may be executed in a digital and / or analog domain and in response to one or more sets of logic or instructions stored in or on non-transitory computer readable medium or media or memory. The functions, acts or tasks are independent of the particular type of instructions set, storage media, processor or processing strategy and may be performed by software, hardware, integrated circuits, firmware, microcode and the like, operating alone or in combination. The memory may comprise a single device or multiple devices that may be disposed on one or more dedicated memory devices or disposed on a processor or other similar device. When functions, steps, etc. are said to be “responsive to” or occur “in response to” another function or step, etc., the functions or steps necessarily occur as a result of another function or step, etc. It is not sufficient that a function or act merely follow or occur subsequent to another. The term “substantially” or “about” encompasses a range that is largely (anywhere a range within or a discrete number within a range of ninety-five percent and one-hundred and five percent), but not necessarily wholly, that which is specified. It encompasses all but an insignificant amount.

[0037] As used herein, the phrase “at least one of’ preceding a series of items, with the terms “and” or “or” to separate any of the items, modifies the list as a whole, rather than each member of the list (e.g., each item). The phrase “at least one of’ does not require selection of at least one item; rather, the phrase allows a meaning that includes at least one of any one of the items, and / or at least one of any combination of the items, and / or at least one of each of the items. By way of example, the phrases “at least one of A, B, and C” or “at least one of A, B, or C” each refer to only A, only B, or only C; any combination of A, B, and C; and / or at least one of each of A, B, and C.

[0038] The word “exemplary” is used herein to mean “serving as an example, instance, or illustration.” Any embodiment described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments. Phrases such as an aspect, the aspect, another aspect, some aspects, one or more aspects, an implementation, the implementation, another implementation, some implementations, one or more implementations, an embodiment, the embodiment, another embodiment, some embodiments, one or more embodiments, a configuration, the configuration, another configuration, some configurations, one or more configurations, the subject technology, the disclosure, the present disclosure, other variationsthereof and alike are for convenience and do not imply that a disclosure relating to such phrase(s) is essential to the subject technology or that such disclosure applies to all configurations of the subject technology. A disclosure relating to such phrase(s) may apply to all configurations, or one or more configurations. A disclosure relating to such phrase(s) may provide one or more examples. A phrase such as an aspect or some aspects may refer to one or more aspects and vice versa, and this applies similarly to other foregoing phrases.

[0039] A reference to an element in the singular is not intended to mean “one and only one” unless specifically stated, but rather “one or more.” The term “some” refers to one or more. Underlined and / or italicized headings and subheadings are used for convenience only, do not limit the subject technology, and are not referred to in connection with the interpretation of the description of the subject technology. Relational terms such as first and second and the like may be used to distinguish one entity or action from another without necessarily requiring or implying any actual such relationship or order between such entities or actions. All structural and functional equivalents to the elements of the various configurations described throughout this disclosure that are known or later come to be known to those of ordinary skill in the art are expressly incorporated herein by reference and intended to be encompassed by the subject technology. Moreover, nothing disclosed herein is intended to be dedicated to the public regardless of whether such disclosure is explicitly recited in the above description. No claim element is to be construed under the provisions of 35 U.S.C. §112(f) unless the element is expressly recited using the phrase “means for” or, in the case of a method claim, the element is recited using the phrase “step for.”

[0040] While this specification contains many specifics, these should not be construed as limitations on the scope of what may be claimed, but rather as descriptions of particular implementations of the subject matter. Certain features that are described in this specification in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination. Moreover, although features may be described above as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can in some cases be excised from the combination, and the claimed combination may be directed to a subcombination or variation of a subcombination.

[0041] The subject matter of this specification has been described in terms of particular aspects, but other aspects can be implemented and are within the scope of the following claims. For example, while operations are depicted in the drawings in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. The actions recited in the claims can be performed in a different order and still achieve desirable results. As one example, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In certain circumstances, multitasking and parallel processing may be advantageous. Moreover, the separation of various system components in the aspects described above should not be understood as requiring such separation in all aspects, and it should be understood that the described program components and systems can generally be integrated together in a single software product or packaged into multiple software products.

[0042] The title, background, brief description of the drawings, abstract, and drawings are hereby incorporated into the disclosure and are provided as illustrative examples of the disclosure, not as restrictive descriptions. It is submitted with the understanding that they will not be used to limit the scope or meaning of the claims. In addition, in the detailed description, it can be seen that the description provides illustrative examples and the various features are grouped together in various implementations for the purpose of streamlining the disclosure. The method of disclosure is not to be interpreted as reflecting an intention that the claimed subject matter requires more features than are expressly recited in each claim. Rather, as the claims reflect, inventive subject matter lies in less than all features of a single disclosed configuration or operation. The claims are hereby incorporated into the detailed description, with each claim standing on its own as a separately claimed subject matter.

[0043] The claims are not intended to be limited to the aspects described herein, but are to be accorded the full scope consistent with the language claims and to encompass all legal equivalents. Notwithstanding, none of the claims are intended to embrace subject matter that fails to satisfy the requirements of the applicable patent law, nor should they be interpreted in such a way.

Claims

CLAIMS1. A force decay leak testing system, comprising: a top test chamber assembly comprising a measurement area comprising one or more sensors configured to perform force decay measurements on one or more packages; a bottom test chamber assembly comprising an insert configured to hold the one or more packages; and a test chamber at least partially formed by the top test chamber assembly and the bottom test chamber assembly, wherein the insert comprises: a top frame and a bottom frame, wherein the top frame is configured to receive the one or more packages; and one or more biasing components configured to provide a bias force pressing the insert towards the measurement area to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing.

2. The leak testing system of claim 1, wherein the insert comprises one or more spacers configured to maintain a defined gap between the insert and the one or more sensors during a force decay leak testing.

3. The leak testing system of claim 1, wherein the one or more biasing components are disposed in or on the bottom frame of the insert.

4. The leak testing system of claim 1, wherein the one or more biasing components are disposed at one or more corners of the bottom frame of the insert.

5. The leak testing system of claim 1, wherein the one or more biasing components are disposed along a bottom edge of the bottom frame of the insert.

6. The leak testing system of claim 1, wherein the one or more biasing components are disposed at or near a bottom center of the bottom frame of the insert.

7. The leak testing system of claim 2, wherein the one or more spacers are disposed in or on the top frame of the insert.

8. The leak testing system of claim 2, wherein the one or more spacers are disposed at one or more corners of the top frame of the insert.

9. The leak testing system of claim 2, wherein the one or more spacers are disposed along a top edge of the top frame of the insert.

10. An insert configured to hold one or more packages during a force decay leak test, the insert comprising: a top frame and a bottom frame, wherein the top frame is configured to receive the one or more packages; one or more biasing components configured to provide a bias force pressing the insert towards a force decay measurement area comprising one or more sensors, to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing; and one or more spacers configured to maintain a defined gap between the insert and the one or more sensors during a force decay leak testing.

11. The insert of claim 9, wherein the one or more biasing components are disposed in or on the bottom frame.

12. The insert of claim 9, wherein the one or more biasing components are disposed at one or more corners of the bottom frame.

13. The insert of claim 9, wherein the one or more biasing components are disposed along a bottom edge of the bottom frame.

14. The insert of claim 9, wherein the one or more biasing components are disposed at or near a bottom center of the bottom frame.

15. The insert of claim 9, wherein the one or more spacers are disposed in or on the top frame.

16. The insert of claim 9, wherein the one or more spacers are disposed at one or more corners of the top frame.

17. The insert of claim 9, wherein the one or more spacers are disposed along a top edge of the top frame.

18. A method of manufacturing a force decay leak testing system, comprising: assembling a top test chamber assembly comprising a measurement area comprising one or more sensors configured to perform force decay measurements on one or more packages; assembling a bottom test chamber assembly comprising an insert configured to hold the one or more packages; assembling the insert comprising: a top frame and a bottom frame, wherein the top frame is configured to receive the one or more packages; and one or more biasing components configured to provide a bias force pressing the insert towards the measurement area to maintain a parallelism between the one or more packages and the one or more sensors during a force decay leak testing; and coupling the top test chamber assembly and the bottom test chamber assembly such that a test chamber is at least partially formed by the top test chamber assembly and the bottom test chamber assembly.

19. The method of claim 18, comprising assembling the insert comprising one or more spacers configured to maintain a defined gap between the insert and the one or more sensors during a force decay leak testing.

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