Apparatus for drop test, and method therefor

Abstract

An apparatus for a drop test of a sample is presented. The apparatus comprises: a sample input reverse aligner for rotating an input sample or aligning same with a reference position; a robot arm for lifting and dropping the sample at a drop height and at a drop angle according to a drop test scenario; a vision sensor for obtaining an image of the sample; and a controller for controlling the sample input reverse aligner and the robot arm or processing the image obtained from the vision sensor, wherein the controller can compare the position of the sample lifted by the robot arm against the drop preparation position defined in the drop test scenario.

Description

Apparatus for drop testing and method therefor

[0001] The present invention relates to a device for a drop test of a sample and a method therefor.

[0002] Product packaging is designed to protect the product from external shocks and impacts like drops. Prior testing is required to verify the packaging's ability to safely protect the product. Drop testing is required for this purpose. Drop tests from various directions and positions are conducted to ensure the product and its packaging are safely protected.

[0003] Figure 1 depicts a conventional drop test process. Referring to Figure 1(a), a box, the sample for the drop test, is placed on the drop tester lift and raised to the drop height. Then, the tester manually visualizes the direction and location of the sample's fall in front of the drop tester. This drop test scenario corresponds to a scenario where the box is dropped with its corner facing the floor, as shown in Figure 1(a).

[0004] Then, another inspector, not shown in Fig. 1, operates the control button that causes the drop tester to drop the sample, causing the sample to fall. Fig. 1(b) shows the dropped sample.

[0005] Drop tests using the examiner's hands pose a physical burden on the examiner and pose a risk of injury, and can also pose a safety risk. Although not shown in Figure 1, Figure 1(a) requires the examiner to quickly move out of the test area simultaneously with the drop control operation of the drop tester.

[0006] In addition, since the drop direction of the test corresponding to the required distribution environment must be estimated by eye, the accuracy of the drop direction may decrease, and thus, deviations in the results of the drop test may occur.

[0007] The present invention proposes a method to overcome the limitations of such existing drop tests.

[0008] The present invention relates to an automatic drop test device and a method therefor that can overcome the problems of existing drop tests.

[0009] A device for a drop test of a sample is proposed, comprising: a sample loading inversion aligner for rotating or aligning an input sample to a reference position; a robot arm for lifting and dropping the sample at a drop height and a drop angle according to a drop test scenario; a vision sensor for obtaining an image of the sample; and a controller for controlling the sample loading inversion aligner and the robot arm or for processing an image obtained from the vision sensor; wherein the controller can compare a position of the sample lifted by the robot arm with a drop preparation position according to the drop test scenario.

[0010] A method for a drop test of a sample is proposed, the method being performed by a drop test device, and may include the steps of rotating or aligning an introduced sample to a reference position; lifting the sample at a drop height and a drop angle according to a drop test scenario; comparing the position of the lifted sample with a drop preparation position according to the drop test scenario; and dropping the sample from the drop preparation position.

[0011] The above problem solving methods are only some of the embodiments of the present invention, and various embodiments reflecting the technical features of the present invention can be derived and understood by a person having ordinary knowledge in the relevant technical field based on the detailed description of the present invention described below.

[0012] The present invention has the following effects.

[0013] According to the present invention, a drop test corresponding to a required distribution environment can be uniformly performed according to the test requirements.

[0014] According to the present invention, the deviation in the results of the drop test is reduced.

[0015] The effects that can be obtained from the present invention are not limited to the effects mentioned above, and other effects not mentioned can be clearly understood by a person having ordinary skill in the art to which the present invention belongs from the description below.

[0016] The accompanying drawings, which are included as part of the detailed description to aid in understanding the present invention, provide embodiments of the present invention and, together with the detailed description, explain the technical idea of ​​the present invention.

[0017] Figure 1 illustrates a scene of a conventional drop test.

[0018] Figure 2 illustrates a device or system for a drop test according to the present invention.

[0019] Figure 3 shows the drop position and drop angle of the sample according to the present invention.

[0020] Figure 4 shows the drop position and drop angle of the sample according to the present invention.

[0021] Figure 5 shows a flow chart of a drop test according to the present invention.

[0022] Figure 6 shows a flow chart of a drop test according to the present invention.

[0023] Figure 7 illustrates several drop test scenarios according to the present invention.

[0024] Figure 8 shows a flow chart of a drop test according to the present invention.

[0025] Figure 9 shows a block diagram of a drop test device according to the present invention.

[0026] Hereinafter, embodiments disclosed in this specification will be described in detail with reference to the attached drawings. Regardless of the drawing numbers, identical or similar components will be given the same reference numbers and redundant descriptions thereof will be omitted. The suffixes "module" and "part" used for components in the following description are assigned or used interchangeably only for the convenience of writing the specification, and do not in themselves have distinct meanings or roles. In addition, when describing the embodiments disclosed in this specification, if it is determined that a specific description of a related known technology may obscure the gist of the embodiments disclosed in this specification, a detailed description thereof will be omitted. In addition, the attached drawings are only intended to facilitate easy understanding of the embodiments disclosed in this specification, and the technical ideas disclosed in this specification are not limited by the attached drawings, and should be understood to include all modifications, equivalents, and substitutes included in the spirit and technical scope of the present invention.

[0027] Terms that include ordinal numbers, such as first, second, etc., may be used to describe various components, but the components are not limited by these terms. These terms are used solely to distinguish one component from another.

[0028] When a component is referred to as being "connected" or "connected" to another component, it should be understood that it may be directly connected or connected to that other component, but that there may be other components intervening. Conversely, when a component is referred to as being "directly connected" or "connected" to another component, it should be understood that there are no other components intervening.

[0029] Singular expressions include plural expressions unless the context clearly indicates otherwise.

[0030] In this application, terms such as “include” or “have” are intended to specify the presence of a feature, number, step, operation, component, part or combination thereof described in the specification, but should be understood not to exclude in advance the possibility of the presence or addition of one or more other features, numbers, steps, operations, components, parts or combinations thereof.

[0031]

[0032] Figure 2 illustrates a device or system (100) for a drop test according to the present invention.

[0033] The drop test device (100) includes a robot arm (110) for lifting or dropping a sample, a vision sensor (121, 122, 123) for detecting a sample or the position or state of the sample, a controller (130) for controlling the robot arm (110) and the vision sensor (121, 122, 123), and the remaining configuration of the drop test device (100). The controller (130) can control the operation of components of the device (100) for a drop test according to the present invention, perform necessary calculations, process images acquired from the vision sensor, detect objects, etc.

[0034] The robot arm (110) can be connected to its end with a tool (111) for lifting a sample. The tool shown is a suction tool, but as will be described later, the present invention is not limited thereto.

[0035] The vision sensor may be configured as, but is not limited to, a camera module. Additionally, at least one of the vision sensors may be installed at the distal end of the robot arm (110) to acquire an image captured at the distal end of the robot arm.

[0036] When a sample is input into the sample input area (S_input, not shown), the vision sensor can detect the sample, the position, state, etc. of the sample. Although the “vision sensor” is expressed as detecting the sample, the position, state, etc. of the sample, the “vision sensor” acquires an image of the sample being detected, and the controller of the vision sensor or the controller (130) can detect the sample, the position, state, etc. of the sample from the acquired image. However, for simplicity of explanation, the following will be expressed as the vision sensor detecting the sample, the position, etc. of the sample. For example, the vision sensor can detect which side of the sample is facing the ceiling of the test space or which side is touching the floor of the test space.

[0037] If the sample's absorption or gripping position corresponding to the drop test type (hereinafter, "drop test scenario") is not exposed, the sample must be flipped or rotated. Furthermore, the sample may need to be aligned and prepared to a reference position for ease of absorption or gripping. Accordingly, the drop test device (100) may include a sample input inversion aligner (140) for flipping or rotating the inserted sample, or aligning it to an alignment reference point (K).

[0038] Depending on the drop test scenario, for example, a display device may need to be dropped with the display panel facing the floor or the opposite side facing the floor. In these cases, the opposite side of the dropped sample needs to be lifted after being absorbed or gripped.

[0039] When the sample needs to be flipped or rotated, or when alignment to a reference position is required, the robot arm (110) can suck up or grip the sample based on the position of the sample detected by the vision sensor and lift it to move it to the sample input inversion alignment device (140).

[0040] The sample input inversion aligner (140) can flip or rotate the sample, or align one corner of the sample to a reference position, once the sample is placed at the alignment position. The sample can be rotated or flipped by the sample input inversion aligner (140), and then absorbed or gripped and transferred by the robot arm (110) to be placed in the sample input area.

[0041] When an adsorption position or a gripping position corresponding to a drop test scenario is exposed, the robot arm (110) can detect the adsorption position or gripping position and adsorb or grip a sample at the adsorption position or gripping position.

[0042] Additionally, the robot arm (110) or controller (130) can calculate the drop height and drop angle corresponding to the drop test scenario. The robot arm (110) can lift the sample above the drop test area (S_test) and maintain the lift state according to the drop height and drop angle.

[0043] Meanwhile, the lifted height and angle of the sample may differ from the calculated drop height and drop angle. Accordingly, the robot arm (110) or the controller (130) may detect the lifted height and angle of the sample using a vision sensor. For this purpose, multiple vision sensors may be used. Alternatively, the robot arm (110) or the controller (130) may calculate the difference between the detected lifted height and angle of the sample and the drop height and drop angle. The robot arm (110) may perform height correction and / or angle correction of the sample to eliminate the calculated difference.

[0044] Then, the robot arm (110) can drop the sample into the drop test area.

[0045] In addition, the drop test device (100) may include a drop sample position aligner (150) for aligning a dropped sample. The drop sample position aligner (150) is for aligning a sample dropped in the drop test area (S_test) to a position for recovery. The drop sample position aligner (150) aligns the dropped sample to a preset position, for example, the center of the drop test area. The drop sample position aligner (150) includes a first guide that moves in one axis (for example, the x-axis) direction on a two-dimensional plane and a second guide that moves in the other axis (for example, the y-axis) direction, and moves the dropped sample according to the movement of the first guide and the second guide, and positions it in a preset position.

[0046] Additionally, the drop test device (100) may include an injector (160) for injecting a sample, which may be configured as a conveyor type, but is not limited thereto.

[0047] In addition, the drop test device (100) may include an ejector (170) for ejecting a sample that has completed a drop test, which may be configured as a conveyor type, but is not limited thereto.

[0048] As previously mentioned, the robotic arm absorbs or grips the sample for lifting, rotating, transporting, and dropping. In the following description, "absorption" will be used for simplicity, but the present invention does not impose any limitations on the method by which the robotic arm grasps the sample for lifting, rotating, transporting, or dropping.

[0049]

[0050] Figure 3 shows the drop height and drop angle of a sample according to the present invention.

[0051] The sample (S) must be lifted to a drop height (h) at a drop angle (θ). The drop height (h) can be determined from the drop test type or from a preset height (h) depending on the drop test type.

[0052]

[0053] The robot arm (110) can align the sample in an alignment posture (S1' in FIG. 3) after adsorption, and then lift it to a drop height (h) (S2' in FIG. 3). Then, the robot arm (110) can rotate the sample at a drop angle (θ) or a 90-drop angle (θ).

[0054] The alignment reference point (K) is the reference point to which the sample is aligned before being sucked by the robot arm. Since the sample size may vary, the robot arm may not be able to center the sample. Therefore, the alignment reference point (K) is set to a relative position of the sample, such as the lower left corner, and the sample is sucked according to the suction tool of the robot arm based on the alignment reference point (K).

[0055] In Fig. 3 (a), the drop angle (θ) can be determined as the inverse tangent value of the vertical (H) and horizontal (W) lengths of the sample.

[0056]

[0057] The drop angle (θ) can be determined based on the drop test scenario in addition to the values ​​determined by the length and width of the sample.

[0058] In addition, the robot arm (110) can compensate for the height of the sample by the drop height (h). As illustrated in FIG. 3, if a rotation is performed after lifting the sample, the reference point (L) after implementing the posture will have a height of h'. ​​Therefore, the sample must be lifted further by a height corresponding to γ. That is, the drop height (h) and the drop angle (θ) are calculated by the robot arm (110) or the controller of the robot arm (110), and it is necessary to ensure that these values ​​are actually implemented by the robot arm (110). In other words, the actual sample height (h') due to the rotation and lifting operations of the robot arm (110), that is, the height of the reference point (L) after implementing the posture, may be different from the drop height (h). In addition, the height of the reference point (L) after implementing the posture may be different from the drop height (h) for another reason. For example, the sample packaging box may be damaged due to repeated drop tests.

[0059] In case of (a) of Fig. 3, the correction height (γ) is determined as follows.

[0060]

[0061] In the case of (b) of Fig. 3, the falling angle (θ) is determined as follows.

[0062]

[0063] Additionally, the correction height (γ) can be determined as follows.

[0064]

[0065] Accordingly, the robot arm (110) or the controller of the robot arm (110) can compare the drop height (h), the drop angle (θ) and the reference point (L) of the actual sample to determine whether position correction is necessary. To detect the drop height (h) and the drop angle (θ), a vision sensor can be used, and preferably, two or more vision sensors can be used.

[0066] Depending on whether position correction is necessary, the robot arm (110) or the controller of the robot arm (110) can calculate a correction value for the drop height or drop angle. The robot arm (110) or the controller of the robot arm (110) can move the sample according to the calculated correction value, and after implementing the actual sample posture, align the reference point (L) with the drop height (h).

[0067] As explained above, the robot arm (110) lifts the sample to the drop height and then rotates it to the drop angle, but the order of rotation and lifting can be reversed.

[0068] Additionally, the rotation and lifting of the sample can be done in three dimensions as in Fig. 4 in a drop test scenario to apply impact to a specific corner of the sample.

[0069] In this case, the correction height (γ) and drop angle (θ) can be determined as follows.

[0070]

[0071]

[0072] The specific mathematical formulas for the drop angle and compensation height described above may vary depending on the drop test scenario.

[0073]

[0074] Fig. 5 illustrates a procedure for a drop test according to the present invention. The procedure illustrated in Fig. 5 is performed by the drop test device (100) or one of the components (110, 120, 130, 140, 150, 160, 170) included therein, but for convenience of explanation, it will be described as being performed by the drop test device (100).

[0075] The drop test device (100) performs drop test initialization (S510). Drop test initialization includes a setup process for a drop test of a sample, such as sample introduction, alignment, etc.

[0076] Then, the drop test device (100) performs a drop test (S520). The drop test is performed by dropping the sample from the drop preparation position. More specifically, the drop test device (100) uses a robot arm to absorb the sample, lift it to the drop height, and, if necessary, rotate it at a drop angle to prepare the sample for the drop preparation position. Then, the drop test device (100) manipulates the absorption tool attached to the robot arm to cause the sample to fall freely.

[0077] The drop test device (100) discharges the dropped sample (S530). If necessary, the drop test device can perform a drop test initialization again on the dropped sample. If multiple drop test scenarios need to be repeated, the dropped sample undergoes the drop test initialization process again. When all tests for the scheduled drop test scenarios are completed, the drop test device (100) discharges the dropped sample (S530).

[0078] The drop test device (100) can discharge a dropped sample placed in the drop test area (S_test) out of the drop test device. At this time, the position of the sample placed in the drop test area (S_test) can be aligned through the drop sample position aligner (130). Meanwhile, before the sample is discharged, if there are remaining drop test scenarios to be performed on the sample, the sample can be moved back to the sample input area (S_input) to perform tests for the remaining drop test scenarios. In this case, the procedures corresponding to S510 to S530 are repeated again. The procedures corresponding to S510 to S530 are repeated until the drop test is completed for all input drop test types.

[0079]

[0080] Figure 6 describes the drop test initialization (S510) in more detail.

[0081] The drop test device (100) acquires sample information and drop test information (S511). The sample information may include the type of sample, model number, size information (width, length, height), etc. The drop test information may include information about a drop test scenario, the order of the drop test scenarios (if multiple drop test scenarios are to be tested), etc. Information about the drop test scenario may include a drop preparation position (drop height). In addition, information about the drop test scenario may include information about the drop surface, drop edge, or drop edge of the sample.

[0082] Sample information or drop test information can be entered through a user input interface such as a touch panel or keypad. Additionally, sample information or drop test information can be entered by recognizing a QR code, barcode, or other mark that has been pre-processed, such as by printing or affixing, through a vision sensor of the drop test device (100) or a corresponding means.

[0083] The drop test device (100) inserts a sample (S512).

[0084] The drop test device (100) can call a drop test scenario based on the input information (i.e., sample information and drop test information) and initialize each configuration of the drop test device (100) (S513).

[0085] Calling a drop test scenario refers to the process of retrieving information about the drop test scenario. For example, the drop test device (100) can retrieve information about the drop height and drop angle according to the drop test scenario. In addition, information about the drop test scenario may include information about which surface, which edge, or which edge of the sample the drop test is performed on. Referring to Fig. 7, (a) to (c), and (f) represent drop test scenarios that specify a drop surface, (d) represents a drop test scenario that specifies a drop edge, and (e) represents a drop test scenario that specifies a drop edge.

[0086] At this time, the robot arm (110) may perform a preparation procedure to adsorb the sample by approaching the sample input area (S_input). The drop test scenario call may be performed automatically when drop test information is input, and in this case, S513 may be omitted.

[0087] The drop test device can align the sample (S514).

[0088] The drop test device (100) can flip or rotate the sample through the sample input inversion aligner (140), or align it based on the alignment reference point (K). If necessary, the drop test device (100) can transfer the sample to the sample input inversion aligner (140) through the robot arm (110), align the sample by flipping or rotating it, and then place the sample back into the sample input area (S_input). Alignment with the alignment reference point (K) is for the purpose of facilitating identification of the absorption area where the robot arm will absorb the sample using the absorption tool.

[0089] Meanwhile, S512 may be integrated with S514. Additionally, S513 may be performed before S512 integrated with S512 or S514.

[0090]

[0091] Figure 8 describes the drop test performance (S520) in more detail.

[0092] The drop test device (100) can detect a sample and confirm the location and shape of the sample (S531). The drop test device (100) can detect an adsorption area on the surface of the sample corresponding to the input drop test scenario.

[0093] The drop test device (100) moves the sample to the drop test area (S_test) (S532). The drop test device (100) can absorb the absorption area of ​​the sample using the absorption tool of the robot arm.

[0094] Then, the drop test device (100) can lift and rotate the sample at a drop height (h) and a drop angle (θ) (S533). The drop test device (100) can set up the sample based on the alignment reference point (K), then lift it and rotate it in the lifted state.

[0095] S532 and S533 may be combined into one procedure.

[0096] The drop test device (100) can prepare a test jig if one is required. If the test jig needs to be attached to the robot arm (100) for a drop test, the drop test device (100) can insert the test jig at the beginning of the drop test execution (S520) or during the drop test initialization (S510) process.

[0097] The drop test device (100) determines whether position correction of the sample is required (S534).

[0098] This procedure verifies whether the position of the lifted sample corresponds to the calculated drop height and drop angle. The drop test scenario specifies the drop height and drop angle of the sample, and the sample must be positioned at the corresponding "drop preparation position" before being dropped.

[0099] To this end, the drop test device (100) determines whether the current position of the sample corresponds to the drop preparation position. The drop test device (100) calls up the drop test information and extracts information on the drop preparation position therefrom (S534). The drop test device (100) can detect the position information of the sample using a two-dimensional or three-dimensional vision sensor (121, 122, 123), etc. The position information may include the height of the sample and the rotational state (i.e., the rotation angle). Instead of the two-dimensional or three-dimensional vision sensor, a laser level may be used. If the current position of the sample does not correspond to the drop preparation position, the drop test device determines that the position of the sample requires correction.

[0100] As position correction is required, the drop test device (100) can correct the position of the sample based on the position correction value (S535). The position correction includes height correction and / or rotation angle correction. This positions the sample in the drop-ready position. Refer to FIG. 3 or FIG. 4, described above, for sample position correction.

[0101] As needed for position correction, the drop test device (100) can calculate a position correction value. A vision sensor is used for position correction, and the vision sensor can acquire an image of the lifted sample. The drop test device (100) can process the acquired image to obtain a position correction value, i.e., the difference between the drop preparation position and the current position of the sample. Based on the position correction, the sample can be positioned at the drop preparation position. The position correction value can include a correction value for not only the height but also the rotation angle.

[0102] Then, the drop test device (100) can drop the sample at the drop preparation position (S536).

[0103] Additionally, the drop test device (100) can acquire images of the dropped state of a sample and process the acquired images to determine whether the dropped sample has passed the drop test. Of course, whether the sample has passed the drop test based on image processing can be determined based on the external state of the sample, which is one of the requirements for passing the drop test.

[0104] The drop test device (100) detects the dropped sample using a vision sensor (S537) and determines whether the sample can be discharged. If the sample is not in a position where it can be discharged, the drop test device (100) can align the sample to a specific area (e.g., the central area) of the drop test area (S_test) using a drop sample position aligner (150). This is necessary as a preparatory work to facilitate the recovery or discharge of the sample, as the drop test device (100) must lift the dropped sample again.

[0105] The drop test device (100) can lift the dropped sample again and, if there are any remaining drop test scenarios, move the sample to the sample input area (S_input, not shown) or the drop test area (S_test). If there are no remaining drop test scenarios, the drop test device (100) can move the sample to the discharger (170). Thereafter, the sample can be discharged through the discharger (170).

[0106] When the drop test device (100) lifts the dropped sample again, the height of the sample can be calculated or estimated using a two-dimensional or three-dimensional vision sensor. In particular, in the case of the absorption method, information regarding the height of the dropped sample from the floor must be obtained in order to absorb the dropped sample.

[0107]

[0108] Figure 9 shows a block diagram of a drop test device according to the present invention.

[0109] The drop test device (100) includes a robot arm (110), a vision sensor (120), a controller (130), and a sample input reversal aligner (140). The configuration of the drop test device (100) will be described in accordance with the sequence of the drop test procedure.

[0110] The controller (130) controls the robot arm (110), the vision sensor (120), or the sample input reversal aligner (140). In addition, the controller (130) can obtain information about the sample or information about the drop test scenario. Information about the drop test scenario can include information about the drop surface, drop edge, or drop edge of the sample.

[0111] The sample input inversion aligner (140) rotates the input sample or aligns it to a reference position. The robot arm (110) can transfer the input sample to the sample input inversion aligner. Before lifting the sample to the drop preparation position, the robot arm (110) can transfer the sample to the sample input inversion aligner (140) as needed to invert the sample or align it to a reference position depending on the drop test scenario.

[0112] The robot arm (110) lifts the sample at a drop height and drop angle according to the drop test scenario.

[0113] The controller (130) compares the position of the sample lifted by the robot arm with the drop preparation position according to the drop test scenario. If there is a difference between the position of the currently lifted sample and the drop preparation position, the controller (130) can calculate a position correction value for the sample. In addition, the controller (130) can process the image acquired from the vision sensor (120) to detect the position of the sample, and calculate a position correction value for the sample based on the difference between the detected position of the sample and the drop preparation position. The position correction value may include a correction value for the drop height or the drop angle. The vision sensor (120) may include a two-dimensional (2D) vision sensor and a three-dimensional (3D) vision sensor.

[0114] To detect the position of a lifted sample, an image of the sample acquired by a vision sensor (120) is used. The controller (130) can process the image acquired from the vision sensor (120) to acquire position information.

[0115] The robot arm (110) drops the sample from the drop preparation position.

[0116] The controller (130) can obtain information about the height of the dropped sample from the floor and control the robot arm (110) to catch the dropped sample based on the obtained height. This is to discharge the sample or move it back to the sample input area (S_input) for a drop test. Alternatively, the sample can be directly transferred to the sample input reversal aligner (140) in a dropped state.

[0117] Before the dropped sample is moved by the robot arm (110), the dropped sample can be aligned to a position for retrieving the dropped sample. For this purpose, a dropped sample position aligner (150) can be included in the drop test device (100).

[0118] The controller (130) can control the test jig to enter the area for the drop test as required according to the drop test scenario.

[0119]

[0120] In addition, as another aspect of the present invention, the operation of the proposal or invention described above may be implemented, performed or executed by a “computer” (a comprehensive concept including a system on chip (SoC) or a (micro) processor, etc.), or may be provided as a code or a computer-readable storage medium storing or including the code or a computer program product, and the scope of the present invention may be extended to the code or the computer-readable storage medium storing or including the code or the computer program product.

[0121]

[0122] The detailed description of the preferred embodiments of the present invention disclosed above has been provided to enable those skilled in the art to implement and practice the present invention. While the above description has been made with reference to preferred embodiments of the present invention, those skilled in the art will appreciate that various modifications and variations of the present invention, as defined by the following claims, are possible. Accordingly, the present invention is not intended to be limited to the embodiments disclosed herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. As a device for dropping test of samples, A sample inversion aligner for rotating the introduced sample or aligning it to a reference position; A robotic arm that lifts and drops the above sample at a drop height and drop angle according to a drop test scenario; A vision sensor for acquiring an image of the above sample; and A controller for controlling the sample input reversal sorter and the robot arm or for processing an image obtained from the vision sensor; The above controller is a device that compares the position of the sample lifted by the robot arm with the drop preparation position according to the drop test scenario.

2. In paragraph 1, The above controller: A device that processes an image acquired from the vision sensor to detect the position of the sample, and calculates a position correction value for the sample based on the difference between the detected position of the sample and the drop preparation position.

3. A device in the second paragraph, wherein the position correction value includes a correction value for the drop height or the drop angle.

4. In the second paragraph, the controller controls the robot arm to correct the position of the sample according to the position correction value.

5. In paragraph 1, A device wherein the controller obtains information about the height of the dropped sample from the floor, and controls the robot arm to catch the dropped sample based on the obtained height.

6. In paragraph 1, A device wherein the above vision sensor includes a two-dimensional (2D) vision sensor and a three-dimensional (3D) vision sensor.

7. In paragraph 1, A device wherein the controller controls the test jig to enter the area for the drop test as required according to the drop test scenario.

8. In paragraph 1, A device comprising a dropped sample position aligner for aligning the sample to a position for recovery of the dropped sample.

9. In paragraph 1, the controller: A device that controls the robot arm to transfer the sample to the sample input inversion aligner according to the drop test scenario, prior to lifting the sample to the drop preparation position, so that the sample is flipped or aligned to a reference position.

10. In paragraph 1, the controller: A device for obtaining information about said sample or information about said drop test scenario.

11. In the 10th paragraph, the device, wherein the drop test scenario includes information about the drop surface, drop edge or drop edge of the sample.

12. A method for a drop test of a sample, wherein the method is performed by a drop test device, A step of rotating the inserted sample or aligning it to a reference position; A step of lifting the above sample at a drop height and drop angle according to a drop test scenario; A step of comparing the position of the above lifted sample with the position prepared for dropping according to the above drop test scenario; and A method comprising the step of dropping the sample from the drop preparation position.

13. In paragraph 11, A method comprising the steps of processing an image acquired from a vision sensor to detect a position of the sample, and calculating a position correction value for the sample based on a difference between the detected position of the sample and the drop preparation position.

14. A method according to claim 13, comprising a step of controlling the robot arm to correct the position of the sample according to the position correction value.

15. In paragraph 11, A method comprising the step of inverting or aligning the sample to a reference position according to the drop test scenario prior to lifting the sample to the drop preparation position.

16. A method according to claim 11, comprising the step of obtaining information about the sample or information about the drop test scenario.

17. A computer-readable medium storing a computer program for performing a method according to any one of claims 12 to 16.

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