Electrode sheet rolling and slitting system and method

Abstract

An electrode sheet rolling and slitting system (10), comprising: a slitting mechanism (11), a pre-slitting detection mechanism (12), a plurality of post-slitting detection mechanisms (13), a conveying mechanism (14), an encoder (15), a programmable logic controller (16), and a marking mechanism (17). The pre-slitting detection mechanism is configured to perform surface defect detection on a first electrode sheet before slitting. The plurality of post-slitting detection mechanisms are configured to perform surface defect detection and tab area size measurement on a plurality of second electrode sheets after slitting; and the plurality of post-slitting detection mechanisms are in one-to-one correspondence with the plurality of second electrode sheets. The pre-slitting detection mechanism and the post-slitting detection mechanisms each comprise a macro camera (121, 131), a superordinate computer (122, 132), and an acquisition card unit (123, 133). Also provided is an electrode sheet rolling and slitting method. The system can obtain clear, fine and distortionless detection images, thereby accurately determining surface defects of electrode sheets.

Description

Pole piece roller pressing and slitting system and method

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to Chinese patent application No. 202410199201.2, filed on February 22, 2024, entitled “Pole Sheet Rolling and Slitting System and Method,” the entire contents of which are incorporated herein by reference. Technical Field

[0003] The present application relates to the field of batteries, and in particular to a pole piece rolling and slitting system and method. Background Art

[0004] Battery pole sheets are a crucial component of battery cells. They are typically manufactured by rolling sheet metal and then slitting it. To improve manufacturing efficiency, current technologies primarily utilize integrated rolling and slitting machines for the processing of battery pole sheets.

[0005] During the manufacturing process of battery pole pieces, in order to improve the quality of pole pieces produced in the rolling and slitting process and enhance the safety and capacity consistency of battery cells, it is necessary to accurately detect surface defects on the pole pieces after rolling and slitting. In view of this, it is now necessary to provide a solution that can detect surface defects on pole pieces produced in the rolling and slitting process.

[0006] Summary of the Invention

[0007] The present application provides a pole piece rolling and slitting system and method, which can accurately detect defective areas on the pole piece surface and mark the defective areas.

[0008] In a first aspect, the present application provides a pole piece roller pressing and slitting system, comprising: a slitting mechanism, a pre-slitting detection mechanism, a plurality of post-slitting detection mechanisms, a conveying mechanism, an encoder, a programmable logic controller, and a marking mechanism;

[0009] The slitting mechanism is used to slit the first pole piece of the input system into a plurality of second pole pieces;

[0010] The conveying mechanism is used for conveying the first pole piece and the plurality of second pole pieces;

[0011] The pre-slitting detection mechanism is used to detect the first electrode before slitting;

[0012] The plurality of post-slitting detection mechanisms are used to detect the plurality of second electrode pieces after slitting, and the plurality of post-slitting detection mechanisms correspond one to one to the plurality of second electrode pieces;

[0013] The encoder is connected to the rotating shaft of the transmission mechanism and rotates with the rotating shaft; the encoder is used to output pulse signals to the pre-slitting detection mechanism, multiple post-slitting detection mechanisms and the programmable logic controller according to the rotation angle;

[0014] The pre-slitting detection mechanism includes a first macro camera, a first host computer and a first acquisition card unit, wherein the first macro camera is connected to the first host computer via the first acquisition card unit, and the first acquisition card unit includes a plurality of acquisition cards;

[0015] Each post-slitting detection mechanism includes a second macro camera, a second host computer, and a second acquisition card unit. The second macro camera is connected to the second host computer via the second acquisition card unit. The second acquisition card unit includes multiple acquisition cards.

[0016] a first acquisition card unit, configured to synchronously trigger the first macro camera to photograph the first surface of the first pole piece according to the frequency of the pulse signal, and synchronously transmit the image photographed by the first macro camera to the first host computer;

[0017] A first host computer is configured to stitch the images transmitted by the first acquisition card unit to obtain a first detection image of the first surface; perform surface defect detection on the first detection image to obtain a first detection result, the first detection result being used to indicate a defective area of ​​the first surface; and determine first marking information based on the first detection result;

[0018] a second acquisition card unit, configured to trigger a second macro camera to photograph the second surface of the second pole piece according to the frequency of the pulse signal, and transmit the image photographed by the second macro camera to a second host computer;

[0019] The second host computer is used to stitch the images transmitted by the second acquisition card unit to obtain a second detection image of the second surface; perform surface defect detection on the second detection image to obtain a second detection result, the second detection result being used to indicate a defective area on the second surface; and determine second marking information based on the second detection result;

[0020] A programmable logic controller, configured to control a marking mechanism to perform marking based on the first marking information and at least one of the plurality of second marking information;

[0021] The second detection image includes a tab area image corresponding to the tab area;

[0022] The second host computer is further used to identify the edge of the tab area image and determine the size of the tab area based on the edge;

[0023] The second host computer is used to generate edge points at the edge of the pole lug area image, eliminate discrete edge points from the edge points, obtain target edge points, perform straight line fitting on the target edge points, obtain two edge lines in the first direction, and determine the distance between the two edge lines as the size of the pole lug area. The first direction is perpendicular to the conveying direction of the second pole piece corresponding to the second host computer. In this way, a clear, delicate, and distortion-free detection image can be obtained by photographing the pole piece surface with a macro camera, so that the surface defects of the pole piece can be accurately determined based on the detection image. In addition, marking by a marking mechanism can facilitate the query and positioning of the surface defects of the pole piece. In addition, the size of the pole lug area in the second pole piece can also be determined by the second host computer.

[0024] As a possible implementation, the first host computer is configured to determine a first defect position in a first target electrode area based on the first detection result, where the first target electrode area is the electrode area captured by the first detection image; determine a first response distance of the marking mechanism based on the first defect position; determine a first number of pulses that the programmable logic controller needs to wait for based on the first response distance and the accuracy of the encoder; and use the first number of pulses as first marking information;

[0025] a programmable logic controller, configured to send a marking instruction to the marking mechanism when it is determined based on the first marking information that a number of first pulses have been waited;

[0026] The second host computer is configured to determine a second defect position in a second target pole piece region based on the second detection result, where the second target pole piece region is the pole piece region captured by the second detection image; determine a second response distance of the marking mechanism based on the second defect position; determine a second number of pulses that the programmable logic controller needs to wait for based on the second response distance and the accuracy of the encoder; and use the second number of pulses as second marking information;

[0027] The programmable logic controller is further configured to send a marking instruction to the marking mechanism when it is determined based on the second marking information that a second number of pulses has been waited;

[0028] The marking mechanism is used for marking based on a marking instruction.

[0029] In this way, the marking mechanism can accurately mark the defective area on the surface of the electrode.

[0030] As a possible implementation, any one of the first host computer and the plurality of second host computers is a master host computer, and the host computers other than the master host computer are slave host computers;

[0031] The system also includes a correction mechanism;

[0032] The slave host computer is also used to send the determined tab area size to the master host computer;

[0033] The main host computer is further used to determine the system correction value according to the acquired dimensions of the multiple tab areas and send the correction value to the correction mechanism;

[0034] The correction mechanism is used to correct the system based on the correction value.

[0035] In this way, the deviation of the pole piece rolling and slitting system can be corrected, and the product quality of the pole piece rolling and slitting system can be improved.

[0036] As a possible implementation method, the main host computer is used to determine the size difference of each pair of tab areas among multiple tab areas, where each pair of tab areas are two tab areas located on both sides of the same cutting position; and determine the correction value based on the size difference.

[0037] In this way, a correction value that can characterize the dimensional consistency of the tab area of ​​the second pole piece can be obtained.

[0038] As a possible implementation, the first host computer is configured to extract a first target image region corresponding to the target detection region from the first detection image; binarize the first target image region to obtain a first binary image of the first target detection region; filter out a first target region having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold from a foreground image of the first binary image; and determine a defect region of the first surface based on the first target region;

[0039] The second host computer is used to extract a second target image area corresponding to the target detection area from the second detection image; binarize the second target image area to obtain a second binary image of the second target detection area; filter out a second target area whose area is greater than or equal to the defect area threshold and whose width is greater than or equal to the defect width threshold from the foreground image of the second binary image; and determine the defect area of ​​the second surface based on the second target area.

[0040] In this way, defective areas in the first surface and the second surface that have an impact on the performance of the pole piece can be accurately detected.

[0041] As a possible implementation, the pre-slitting detection mechanism further includes a first light source and a first detection roller;

[0042] The first macro camera is arranged toward the first detection roller;

[0043] a first detection roller, configured to support the first pole piece so that the first surface of the first pole piece faces the first macro camera;

[0044] a first light source, for illuminating the first surface of the first pole piece;

[0045] a first macro camera, for photographing the first surface of the first pole piece after illumination;

[0046] The post-slitting detection mechanism further includes a second light source and a second detection roller;

[0047] The second macro camera is arranged toward the second detection roller;

[0048] a second detection roller, configured to support the second pole piece so that the second surface of the second pole piece faces the second macro camera;

[0049] a second light source, for illuminating the second surface of the second pole piece;

[0050] The second macro camera is used to photograph the second surface of the second pole piece after illumination.

[0051] In this way, defects on the electrode surface can be made more prominent in the inspection image.

[0052] In a second aspect, the present application provides a pole piece rolling and slitting method, comprising:

[0053] Cutting the first pole piece input into the pole piece rolling and cutting system into a plurality of second pole pieces by a cutting mechanism;

[0054] conveying the first pole piece and the plurality of second pole pieces by a conveying mechanism;

[0055] An encoder that rotates along with the shaft of the transmission mechanism outputs pulse signals to a pre-slitting detection mechanism, a plurality of post-slitting detection mechanisms, and a programmable logic controller according to the angle of rotation, wherein the plurality of post-slitting detection mechanisms correspond one to one to the plurality of second pole pieces;

[0056] triggering a first macro camera in the pre-slitting detection mechanism to photograph the first surface of the first pole piece according to the frequency of the pulse signal by a first acquisition card unit in the pre-slitting detection mechanism, and transmitting the image photographed by the first macro camera to a first host computer in the pre-slitting detection mechanism;

[0057] splicing the images transmitted by the first acquisition card unit through the first host computer to obtain a first detection image of the first surface;

[0058] Performing surface defect detection on the first detection image by a first host computer to obtain a first detection result, where the first detection result is used to indicate a defective area on the first surface;

[0059] Determining first marking information based on the first detection result by the first host computer;

[0060] For each post-slitting inspection mechanism, triggering a second macro camera in the post-slitting inspection mechanism by a second acquisition card unit in the post-slitting inspection mechanism to photograph the second surface of the corresponding second pole piece according to the frequency of the pulse signal, and transmitting the image photographed by the second macro camera to a second host computer in the post-slitting inspection mechanism;

[0061] splicing the images transmitted by the second acquisition card unit by the second host computer to obtain a second detection image of the second surface;

[0062] Performing surface defect detection on the second detection image by a second host computer to obtain a second detection result, where the second detection result is used to indicate a defect area on the second surface;

[0063] Determining second marking information based on the second detection result by the second host computer;

[0064] Controlling the marking mechanism to mark based on the first marking information and at least one of the plurality of second marking information by a programmable logic controller;

[0065] The second detection image includes a tab region image corresponding to the tab region, and the method further includes:

[0066] The second host computer identifies the edge of the tab area image and determines the size of the tab area based on the edge;

[0067] Determine the size of the tab area based on the edge, including:

[0068] Generate edge points at the edge;

[0069] Eliminate discrete edge points from the edge points to obtain the target edge points;

[0070] Performing straight line fitting on the target edge points to obtain two edge lines in a first direction, where the first direction is perpendicular to the conveying direction of the second electrode corresponding to the second host computer;

[0071] The distance between the two edge lines is determined as the size of the tab area.

[0072] In this way, using a macro camera to capture the electrode surface can produce a clear, detailed, and distortion-free inspection image, allowing accurate identification of surface defects in the electrode. Furthermore, marking with a marking mechanism facilitates the query and location of surface defects in the electrode. Furthermore, the second host computer can also be used to determine the size of the tab area in the second electrode.

[0073] As a possible implementation manner, determining the first marking information based on the first detection result by the first host computer includes:

[0074] Determining, by a first host computer, a first defect position in a first target pole piece region based on a first detection result, where the first target pole piece region is a pole piece region captured by a first detection image; determining a first response distance of a marking mechanism based on the first defect position; determining a first number of pulses that a programmable logic controller needs to wait for based on the first response distance and an accuracy of an encoder; and using the first number of pulses as first marking information;

[0075] Determining second marking information based on the second detection result by the second host computer includes:

[0076] Determining, by a second host computer, a second defect position in a second target pole piece region based on a second detection result, where the second target pole piece region is a pole piece region captured by the second detection image; determining a second response distance of the marking mechanism based on the second defect position; determining a second number of pulses that the programmable logic controller needs to wait for based on the second response distance and the accuracy of the encoder; and using the second number of pulses as second marking information;

[0077] Controlling a marking mechanism to mark based on the first marking information and at least one of the plurality of second marking information by a programmable logic controller includes:

[0078] The programmable logic controller sends a marking instruction to the marking mechanism when it is determined based on the first marking information that the first pulse number has been waited for and / or when it is determined based on any second marking information that the any second pulse number has been waited for, so that the marking mechanism performs marking based on the marking instruction.

[0079] In this way, the marking mechanism can accurately mark the defective area in the pole piece.

[0080] As a possible implementation, any one of the first host computer and the plurality of second host computers is a master host computer, and the host computers other than the master host computer are slave host computers. The method further includes:

[0081] By sending the determined tab area size from the host computer to the main host computer;

[0082] Obtaining the dimensions of multiple tab areas in multiple second pole pieces through a main host computer; determining a correction value of a pole piece rolling and slitting system based on the dimensions of the multiple tab areas;

[0083] The electrode roller pressing and slitting system is corrected based on the correction value through the correction mechanism.

[0084] In this way, the deviation of the pole piece rolling and slitting system can be corrected, and the product quality of the pole piece rolling and slitting system can be improved.

[0085] As a possible implementation method, the correction value of the pole sheet rolling and slitting system is determined based on the sizes of multiple pole tab areas, including:

[0086] Determining a size difference between each pair of tab regions among the plurality of tab regions, wherein each pair of tab regions is two tab regions located on both sides of a same cutting position;

[0087] The correction value is determined based on the size difference.

[0088] In this way, a correction value that can characterize the dimensional consistency of the tab areas of the plurality of second pole pieces can be obtained.

[0089] As a possible implementation manner, performing surface defect detection on the first detection image by the first host computer to obtain a first detection result includes:

[0090] Extracting, by a first host computer, a first target image region corresponding to a first target detection region of the first surface from the first detection image; binarizing the first target image region to obtain a first binary image of the first target detection region; screening out, from a foreground image of the first binary image, a first target region having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold; and determining a defect region of the first surface based on the first target region;

[0091] The second host computer performs surface defect detection on the second detection image to obtain a second detection result, including:

[0092] A second target image area corresponding to the second target detection area of ​​the second electrode is extracted from the second detection image by a second host computer; the second target image area is binarized to obtain a second binary image of the second target detection area; a second target area having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold is screened out from the foreground image of the second binary image; and the defect area of ​​the second surface is determined based on the second target area.

[0093] In this way, defective areas on the electrode surface that affect the electrode performance can be accurately detected. BRIEF DESCRIPTION OF THE DRAWINGS

[0094] The features, advantages and technical effects of exemplary embodiments of the present application will be described below with reference to the accompanying drawings.

[0095] FIG1 is a schematic diagram of a pole piece rolling and slitting system according to an embodiment of the present application;

[0096] FIG2 is a schematic diagram of the installation position of a detection mechanism according to an embodiment of the present application;

[0097] FIG3 is a schematic diagram of an image captured by a first macro camera according to an embodiment of the present application;

[0098] FIG4 is a schematic diagram of an image transmitted by a first acquisition card unit according to an embodiment of the present application;

[0099] FIG5 is a schematic diagram of marking logic according to an embodiment of the present application;

[0100] FIG6 is a schematic diagram showing the principle of determining the size of the tab area according to an embodiment of the present application;

[0101] FIG7 is a schematic diagram of a pole piece rolling and slitting system according to an embodiment of the present application;

[0102] FIG8 is a schematic diagram of a first pole piece according to an embodiment of the present application;

[0103] FIG9 is a schematic diagram of a second pole piece according to an embodiment of the present application;

[0104] FIG10 is a schematic diagram of a process for surface defect detection according to an embodiment of the present application;

[0105] FIG11 is a schematic structural diagram of a pre-slitting detection mechanism according to an embodiment of the present application;

[0106] FIG12 is a schematic structural diagram of a post-slitting detection mechanism according to an embodiment of the present application;

[0107] FIG13 is a schematic diagram of a detection image of an anode electrode according to an embodiment of the present application;

[0108] FIG14 is a schematic diagram of a detection image of a cathode electrode according to an embodiment of the present application;

[0109] FIG15 is a flow chart of a pole piece rolling and slitting method according to an embodiment of the present application. DETAILED DESCRIPTION

[0110] To make the purpose, technical solutions, and advantages of the embodiments of this application more clear, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0111] In order to realize surface defect detection of the pole pieces produced in the rolling and slitting process, the embodiment of the present application provides a pole piece rolling and slitting system and method. The pole piece rolling and slitting system provided by the embodiment of the present application is first described below.

[0112] The pole piece rolling and slitting system provided in this embodiment can be applied to the rolling and slitting process in the battery manufacturing process.

[0113] Refer to Figure 1, which is a schematic diagram of a pole piece rolling and slitting system provided in an embodiment of the present application. The pole piece rolling and slitting system 10 provided in this embodiment may include: a slitting mechanism 11 (not shown in Figure 1), a pre-slitting detection mechanism 12, multiple post-slitting detection mechanisms 13, a conveying mechanism 14, an encoder 15, a programmable logic controller 16 and a marking mechanism 17.

[0114] In some embodiments of the present application, as shown in Figure 1, the pre-slitting detection mechanism 12 and the multiple post-slitting detection mechanisms 13 can be respectively communicated with the programmable logic controller 16 through the switch 18, and the programmable logic controller 16 can be communicated with the marking mechanism 17.

[0115] In this embodiment, the cutting mechanism 11 is used to cut the first electrode piece of the input system 10 into a plurality of second electrode pieces.

[0116] The pre-slitting inspection mechanism 12 is used to capture images and perform defect detection on the first surface of the first electrode sheet before slitting. The multiple post-slitting inspection mechanisms 13 correspond one-to-one with the multiple second electrode sheets and are used to capture images and perform defect detection on the second surfaces of the multiple second electrode sheets obtained after slitting. Each electrode sheet has two surfaces in the thickness direction: the first surface refers to one surface of the electrode sheet in the thickness direction, and the second surface refers to the other surface of the electrode sheet in the thickness direction. For example, the first surface is the front surface of the electrode sheet and the second surface is the back surface of the electrode sheet, or the first surface is the back surface of the electrode sheet and the second surface is the front surface of the electrode sheet. Because the second electrode sheets are obtained by slitting from the first electrode sheet, the first surface of the first electrode sheet is actually the first surface of multiple second electrode sheets, and the second surfaces of multiple second electrode sheets can also constitute the second surface of the first electrode sheet. In this way, the pre-slitting inspection mechanism 12 and each post-slitting inspection mechanism 13 only need to capture one surface of the electrode sheet to obtain inspection images of the first and second surfaces of all electrode sheets in the system 10. Compared to the traditional method of capturing both surfaces of the electrode sheet before and after slitting, this embodiment requires fewer cameras and is less expensive.

[0117] It should be noted that the number of post-slicing detection mechanisms 13 in the system 10 can be determined according to the number of second pole pieces obtained after slicing. FIG1 only takes two post-slicing detection mechanisms 13 as an example, and does not constitute a limitation on the number of post-slicing detection mechanisms 13.

[0118] In some embodiments of the present application, taking the example that the slitting mechanism 11 can slit the first electrode into two second electrode pieces, as shown in Figure 2, the system 10 may include a pre-slitting detection mechanism 12 and two post-slitting detection mechanisms 13, wherein the pre-slitting detection mechanism 12 is arranged upstream of the slitting mechanism 11, and the two post-slitting detection mechanisms 13 are arranged downstream of the slitting mechanism 11, corresponding one-to-one to the two second electrode pieces obtained by slitting.

[0119] The conveying mechanism 14 is used to convey the first electrode piece and a plurality of second electrode pieces, wherein the conveying direction of the first electrode piece and each second electrode piece can be set according to actual conditions.

[0120] The encoder 15 is connected to the shaft of the conveying mechanism 14 and rotates with the shaft. The encoder 15 is used to output pulse signals to the pre-slitting detection mechanism 12, the plurality of post-slitting detection mechanisms 13 and the programmable logic controller 16 according to the rotation angle.

[0121] In some embodiments of the present application, the encoder 15 can synchronously output pulse signals to the pre-slitting detection mechanism 12, the plurality of post-slitting detection mechanisms 13 and the programmable logic controller 16 through a pulse distributor.

[0122] The encoder 15 outputs a pulse signal following the rotation of the conveying mechanism 14 shaft, which can make the shooting frequency of the electrode piece by the pre-slitting detection mechanism 12 and the multiple post-slitting detection mechanisms 13 consistent with the conveying speed of the electrode piece, thereby making the pre-slitting detection mechanism 12 and the multiple post-slitting detection mechanisms 13 able to capture a complete image of the electrode piece.

[0123] As shown in FIG1 , the pre-slitting detection mechanism 12 may include a first macro camera 121 , a first host computer 122 and a first acquisition card unit 123 . The first macro camera 121 is connected to the first host computer 122 via the first acquisition card unit 123 .

[0124] In some embodiments of the present application, the first acquisition card unit 123 can be connected to the first host computer 122 through a PCI-E X4 bus interface, and the first macro camera 121 and the first acquisition card unit can be connected through a CameraLink data cable.

[0125] The first acquisition card unit 123 is used to trigger the first macro camera 121 to photograph the first surface of the first pole piece according to the frequency of the pulse signal, and transmit the image photographed by the first macro camera 121 to the first host computer 122 .

[0126] In this embodiment, because the images captured by the first macro camera 121 are very large, a first capture card unit 123 is used to transmit the images captured by the first macro camera 121 to the first host computer 122 in a timely manner. The first capture card unit 123 includes multiple capture cards, and the number of capture cards included can be set according to the field of view of the first macro camera 121. Figure 1 only uses four capture cards 1-4 included in the first capture card unit 123 as an example.

[0127] In some embodiments of the present application, multiple acquisition cards in the first acquisition card unit 123 can be connected through an inter-board synchronization line. Based on this, the output signal of the encoder 15 can be connected to the IO port of any acquisition card in the first acquisition card unit 123. When the encoder 15 rotates, the pulse signal output by the encoder 15 can be transmitted to the acquisition card connected to it, and the acquisition card can synchronize the received pulse signal to other acquisition cards in the first acquisition card unit 123 through the inter-board synchronization line. In this way, the multiple acquisition cards in the first acquisition card unit 123 can synchronously trigger the first macro camera 121 to shoot the first surface of the first pole piece. The image captured by the first macro camera 121 is divided into multiple parts, and the multiple acquisition cards in the first acquisition card unit 123 synchronously transmit the multiple parts to the first host computer 122.

[0128] The first host computer 122 is configured to stitch the images transmitted by the first acquisition card unit 123 to obtain a first detection image of the first surface, wherein the first detection image is an image of the first surface of the first electrode piece captured by the first macro camera 121 based on the pulse signal.

[0129] In some examples, the photographing field of view of the first macro camera 121 can be 1550 mm, and the first acquisition card unit 123 includes four acquisition cards. When the first macro camera 121 photographs the first surface of the first pole piece based on the pulse signal, an image as shown in Figure 3 is obtained. When the image is transmitted to the first host computer 122, the image shown in Figure 3 is split into four sub-images a, b, c, and d as shown in Figure 4. The four acquisition cards in the first acquisition card unit 123 transmit the four sub-images a, b, c, and d to the first host computer 122. The first host computer 122 splices the four sub-images to obtain the image shown in Figure 3, and the spliced ​​image is used as the first detection image.

[0130] The first host computer 122 is further configured to perform surface defect detection on the first detection image to obtain a first detection result, where the first detection result is used to indicate a defective area on the first surface; and determine first marking information based on the first detection result.

[0131] In some embodiments of the present application, the first host computer 122 may be pre-configured with an algorithm for performing surface defect detection. The pre-set algorithm is used to detect the first detection image to obtain a first detection result, where surface defects of the electrode may include, but are not limited to, surface foil leakage, decarburization, white spots, bubbles, and other defects. After obtaining the first detection result, corresponding first marking information may be generated based on the first detection result.

[0132] Each post-slitting detection mechanism 13 includes a second macro camera 131 , a second host computer 132 and a second acquisition card unit 133 . The second macro camera 131 is connected to the second host computer 132 via the second acquisition card unit 133 . The second acquisition card unit 133 includes a plurality of acquisition cards.

[0133] The second acquisition card unit 133 is used to trigger the second macro camera 131 to capture the second surface of the second electrode according to the frequency of the pulse signal, and transmit the image captured by the second macro camera to the second host computer. The principle of this is the same as that of the first acquisition card unit 123, and will not be repeated here to avoid repetition.

[0134] The second host computer is used to stitch the images transmitted by the second acquisition card unit to obtain a second detection image of the second surface; perform surface defect detection on the second detection image to obtain a second detection result, which is used to indicate the defective area of ​​the second surface; and determine second marking information based on the second detection result.

[0135] The image acquisition principle and surface defect detection principle of the post-slitting detection mechanism 13 are the same as those of the pre-slitting detection mechanism 12, except that the corresponding pole pieces are different. Therefore, the working principles of each part of the post-slitting detection mechanism 13 can refer to the relevant description of the pre-slitting detection mechanism 12, and no further details will be given here to avoid repetition.

[0136] The programmable logic controller 16 is used to control the marking mechanism 17 to perform marking based on the first marking information and at least one of the plurality of second marking information.

[0137] In this way, using a macro camera to photograph the electrode surface can produce a clear, detailed, and distortion-free inspection image, allowing the accurate identification of surface defects in the electrode based on the inspection image. In addition, marking with a marking mechanism can facilitate the query and location of surface defects in the electrode.

[0138] In addition, the existing marking method usually requires the host computer to output a hardware frame signal to the marking mechanism through a hardware circuit such as an acquisition card, thereby controlling the marking mechanism to perform marking. However, this method requires the provision of a hardware circuit that supports the output of the hardware frame signal, which makes the system more complex and difficult to implement. In addition, the hardware frame signal has poor stability, resulting in inaccurate marking. In contrast, in this embodiment, the programmable logic controller 16 uses a pulse signal counting method to control the marking mechanism 17 to perform marking. There is no need for the first host computer 122 and the second host computer 132 to output a hardware frame signal to the marking mechanism 17. Therefore, there is no need to provide a hardware circuit, effectively reducing the system complexity, making it easier to implement, and the pulse signal is more stable. In this way, the marking mechanism 17 can accurately mark the defect position of the electrode.

[0139] In some embodiments, the first host computer 122 may determine the first marking information in the following manner:

[0140] Determining a first defect position in a first target electrode area based on the first detection result, where the first target electrode area is the electrode area captured by the first detection image; determining a first response distance of the marking mechanism 17 based on the first defect position; determining a first number of pulses that the programmable logic controller 16 needs to wait for based on the first response distance and the accuracy of the encoder 15; and using the first number of pulses as first marking information;

[0141] Similarly, the second host computer 132 can determine the second marking information in the following manner:

[0142] Based on the second detection result, the second defect position in the second target pole piece area is determined, and the second target pole piece area is the pole piece area captured by the second detection image; based on the second defect position, the second response distance of the marking mechanism 17 is determined; based on the second response distance and the accuracy of the encoder 15, the second number of pulses that the programmable logic controller 16 needs to wait for is determined; and the second number of pulses is used as the second marking information.

[0143] In this embodiment, the first response distance of the marking mechanism 17 refers to the distance between the marking mechanism 17 and the defect detected in the first inspection image when the first host computer 122 sends a first number of pulses to the programmable logic controller 16. The second response distance of the marking mechanism 17 refers to the distance between the marking mechanism 17 and the defect detected in the first inspection image when the second host computer 132 sends a second number of pulses to the programmable logic controller 16. Therefore, the first response distance and the second response distance can be accurately determined based on the first defect location and the second defect location.

[0144] In this embodiment, the accuracy of encoder 15 indicates the distance the pole piece moves in the conveying direction corresponding to one pulse output by encoder 15. Therefore, when determining the first number of pulses the programmable logic controller 16 needs to wait for based on the first response distance and the accuracy of encoder 15, the ratio of the first response distance to encoder 15 can be used as the first number of pulses. Similarly, when determining the second number of pulses the programmable logic controller 16 needs to wait for based on the second response distance and the accuracy of encoder 15, the ratio of the second response distance to encoder 15 can be used as the second number of pulses.

[0145] In some embodiments of the present application, the accuracy of the encoder 15 can be determined based on the distance the pole piece moves per rotation of the shaft connected to the encoder 15 and the number of pulses output by the encoder 15 per rotation. The ratio of the distance the pole piece moves per rotation of the shaft to the number of pulses output by the encoder 15 per rotation is used as the accuracy of the encoder 15, where the distance the pole piece moves per rotation of the shaft is a determined size, and once the encoder 15 is selected, the number of pulses output by the encoder 15 per rotation is also determined. It can be seen that after the encoder 15 is determined, the accuracy of the encoder 15 is fixed and does not change with the conveying speed of the pole piece. Based on this, after the encoder 15 is determined, the accuracy of the encoder 15 can be stored in the first host computer 122 and the second host computer 132 respectively, so that the first host computer 122 and the second host computer 132 can directly obtain the accuracy of the encoder 15 when they need to use it.

[0146] Accordingly, the programmable logic controller 16 controls the marking mechanism 17 to mark based on the first marking information and at least one of the plurality of second marking information, which may include:

[0147] The programmable logic controller 16 sends a marking instruction to the marking mechanism 17 when it is determined based on the first marking information that the first pulse number has been waited for, and / or when it is determined based on the second marking information that the second pulse number has been waited for.

[0148] In this embodiment, when the programmable logic controller 16 receives the first marking information, it can count the number of pulses received. When it determines that the first number of pulses has been received, it determines that the defect position determined based on the first detection image has reached the corresponding marking position in the marking mechanism 17, and thus outputs a marking instruction to the marking mechanism 17 to instruct the marking mechanism 17 to perform marking. Similarly, when the programmable logic controller 16 receives the second marking information, it can count the number of pulses received. When it determines that the second number of pulses has been received, it determines that the defect position determined based on the second detection image has reached the corresponding marking position in the marking mechanism 17, and thus outputs a marking instruction to the marking mechanism 17 to instruct the marking mechanism 17 to perform marking.

[0149] When receiving a marking instruction, the marking mechanism 17 performs marking based on the marking instruction.

[0150] In this way, the marking mechanism 17 can accurately mark the defective position of the electrode.

[0151] In some embodiments, the marking mechanism 17 is located downstream of the pre-slitting detection mechanism 12 and the post-slitting detection mechanism 13. The pre-slitting detection mechanism 12 and the post-slitting detection mechanism 13 use the same principle to determine the marking information. The principle of determining the second marking information is described below using the post-slitting detection mechanism 13 as an example.

[0152] The first distance between the post-slitting detection mechanism 13 and the marking mechanism 17 is set to the sum of the size of M+1 second detection images and the redundant distance, wherein the size of a single second detection image is the length of the electrode area captured in the second detection image in the conveying direction.

[0153] In some embodiments of the present application, the second host computer 132 takes a certain amount of time to perform surface defect detection on the second detection image. During the defect detection process, the conveying mechanism 14 continues to convey the electrode area captured in the second detection image along the conveying direction of the second electrode. Therefore, to avoid the marking mechanism 17 not responding in a timely manner, resulting in failure to mark the defect location, the sum of the size of the M+1 second detection images and the redundant distance can be used as the first distance.

[0154] The first distance between the post-slitting detection mechanism 13 and the marking mechanism 17 can be set according to the following formula (1):

[0155] L1=(M+1)*L0+L3 (1)

[0156] In formula (1), L1 represents the first distance, L0 represents the size of a single second detection image, and L3 represents the redundant distance. M can be a preset natural number greater than or equal to 1, and the redundant distance can be set according to actual conditions.

[0157] The reason for setting the redundant distance is that it takes a certain amount of time from the time the programmable logic controller 16 outputs the marking instruction to the time the marking mechanism 17 responds to the marking instruction to ensure that the target is met. During this period, the electrode is still moving toward the marking mechanism 17. Therefore, the redundant distance is set to ensure that the marking mechanism 17 can accurately mark the defect location. The redundant distance can be determined based on the time required from the time the programmable logic controller 16 outputs the marking instruction to the time the marking mechanism 17 responds to the marking instruction to ensure that the target is met, as well as the conveying speed of the electrode.

[0158] In some embodiments of the present application, the sum of the transmission time of the marking instruction and the response time of the marking mechanism 17 can be used as the time required from the programmable logic controller 16 outputting the marking instruction to the marking mechanism 17 making a standard-compliant response based on the marking instruction, and the product of this time and the maximum conveying speed of the electrode in the system 10 can be used as the redundant distance. Among them, the transmission time of the marking instruction refers to the time required for the marking instruction to be transmitted from the programmable logic controller 16 to the marking mechanism 17, and the response time of the marking mechanism 17 refers to the time from the marking mechanism 17 receiving the marking instruction to making a marking response.

[0159] The redundancy distance can be calculated according to the following formula (2):

[0160] L3=(T0+T1)*V max (2)

[0161] In formula (2), T0 represents the response time of the marking mechanism 17, T1 represents the transmission time of the marking instruction, and V max is the maximum conveying speed of the electrode in the system 10.

[0162] In some embodiments of the present application, in order to make the first distance between the marking mechanism 17 and the post-slitting detection mechanism 13 more reasonable, neither too long to waste design space nor too short to cause the marking mechanism 17 to fail to respond in time, the value of M can be set to 1.

[0163] In addition, in some embodiments of the present application, in order to prevent the distance reserved between the detection mechanism 13 and the marking mechanism 17 after slitting from being too extreme, the actual redundant distance can be calculated based on the theoretical value of the redundant distance plus 20% of the theoretical value.

[0164] Based on the above design, the second host computer 132 can determine the second response distance of the marking mechanism 17 in the following manner:

[0165] Determine a second distance between the defect determined based on the second detection image and the second edge of the target electrode area, the target electrode area includes a first edge and a second edge, the direction from the first edge to the second edge is the conveying direction of the second electrode, and the target electrode area is the electrode area captured by the second detection image; determine the sum of the second distance and the redundant distance as the response distance of the marking mechanism 17.

[0166] Correspondingly, the second host computer 132 may immediately send the second pulse number to the programmable logic controller 16 when determining that the second macro camera 131 has finished capturing the N+Mth detection image of the second pole piece.

[0167] In this embodiment, because the second macro camera 131 remains stationary when photographing the second electrode sheet, and the conveying mechanism 14 continues to transport the second electrode sheet along the conveying direction of the second electrode sheet, the size of a single second detection image captured by the second macro camera 131 can be understood as the distance the second electrode sheet moves toward the marking mechanism 17 during the period when the second macro camera 131 captures the second detection image. Based on this, the size of the M+1 images can be understood as the total distance the second electrode sheet moves toward the marking mechanism 17 from the time the second macro camera 131 starts capturing the Nth second detection image of the second electrode sheet to the time the N+Mth second detection image of the electrode sheet is captured. The first distance between the second macro camera 131 and the marking mechanism 17 is the sum of the size of the M+1 second detection images and the redundant distance. Therefore, when the second macro camera 131 captures the N+Mth second detection image of the electrode sheet, the distance between the second edge of the target electrode sheet region corresponding to the Nth second detection image and the marking mechanism 17 only remains the redundant distance. Considering that the defect position is not necessarily located at the second edge of the target electrode sheet region, in order to enable the marking mechanism 17 to accurately mark the defect position of the electrode sheet, the second distance between the defect position and the second edge of the target electrode sheet region is further determined, and the sum of the second distance and the redundant distance is used as the second response distance of the marking mechanism 17. After obtaining the second response distance, the second number of pulses required to wait from the time the second macro camera 131 captures the N+Mth second detection image of the second electrode sheet to the time the defect position determined based on the Nth second detection image moves to the position of the marking mechanism 17 is determined based on the second response distance and the accuracy of the encoder 15. The second number of pulses is sent as marking information to the programmable logic controller 16.

[0168] In some embodiments of the present application, in order to make the first distance between the marking mechanism 17 and the second macro camera 131 more reasonable, neither too long to waste design space nor too short to cause the marking mechanism 17 to respond in time, the value of M can be set to 1. Based on this, the first distance can be the sum of the size of the two images and the redundant distance. The first distance can be calculated according to the following formula (3):

[0169] L2=2*L0+L3 (3)

[0170] In some examples, taking M as 1 as an example, as shown in FIG5 , the marking logic can be modeled, including the second macro camera 131, the marking mechanism 17, and the size of the Nth second detection image and the size of the N+1th second detection image captured by the post-slitting detection mechanism 13. In this embodiment, the size of each second detection image is consistent, which is L0. The second distance is determined to be L2 based on the position of the defect in the target electrode area determined based on the Nth second detection image. The first distance between the second macro camera 131 and the marking mechanism 17 is L1, the redundant distance is L3, the accuracy of the encoder 15 is P0, and the maximum conveying speed of the electrode in the system 10 is V max The response time of the marking mechanism 17 is T0, and the transmission time of the marking instruction is T1. The units of L0|, L1, L2, L3 and P0 are consistent, which can be millimeters. The time units of T0 and T1 are consistent, which can be seconds. max The unit can be millimeter / second. Based on this, the second host computer 132 can use the sum of the size of the Nth second detection image and the size of the N+1th second detection image, that is, 2*L0, as the total distance that the target pole piece area captured by the Nth second detection image moves to the marking mechanism 17 during the period from the second macro camera 131 starting to shoot the Nth second detection image to the completion of shooting the N+1th second detection image, and use the first distance L1 to subtract the total distance 2*L0 that the pole piece moves to the marking mechanism 17 to obtain the redundant distance L3, and use the sum of the second distance L2 and the redundant distance L3 as the second response distance of the marking mechanism 17, and determine the ratio of the second response distance to the accuracy P0 of the encoder 15 as the second pulse number.

[0171] The second pulse number can be determined according to the following formula (4):

[0172] S=(L1-2*L0+L2) / P0 (4)

[0173] Through the above-mentioned method, precise control of the marking mechanism 17 can be achieved, so that the marking mechanism 17 can accurately mark the defect position in the electrode.

[0174] In some embodiments, the second detection image includes a tab region image corresponding to the tab region of the second pole piece.

[0175] Correspondingly, the second host computer 132 is further configured to identify the edge of the tab region image in the second detection image, and determine the size of the tab region based on the edge.

[0176] In this way, the size of the tab area in the second pole piece can be obtained.

[0177] In some embodiments of the present application, the second detection image can be a color image or a grayscale image. When the second detection image is a grayscale image, the second host computer 132 can directly identify the edge of the pole ear area image in the second detection image based on the grayscale value; when the second detection image is a color image, the second host computer 132 can first convert the second detection image into a grayscale image, and then identify the edge of the pole ear area image in the converted second detection image based on the grayscale value.

[0178] In some embodiments of the present application, the second electrode piece may include multiple areas. For example, when the second electrode piece is an anode electrode piece, the second electrode piece may include a lug area and a coating area. When the second electrode piece is a cathode electrode piece, the second electrode piece may include a lug area, a coating area and a ceramic area, also referred to as an AT area. Among them, the grayscale value intervals of the image areas corresponding to different areas in the second detection image are different. Based on this, the second host computer 132 can determine the edge of the lug area image in the second detection image through Blob analysis. Blob refers to a connected area in the image, also known as a connected domain. Blob analysis is a commonly used analysis tool in image processing and is widely used in object detection, recognition and tracking. The essence of Blob analysis is to group pixels with the same grayscale value range together based on different neighborhood types and regard them as the same detection object. In this way, the position where the grayscale value changes significantly can be determined, and the position where the grayscale value changes significantly is the edge of the regional image. Based on this, the edge of the lug area image can be determined based on the grayscale value interval corresponding to the lug area.

[0179] After identifying the edge of the tab region image, the second host computer 132 may determine the size of the tab region based on the edge in the following manner:

[0180] Generate a first edge point at the edge; eliminate discrete edge points in the first edge point to obtain a second edge point; perform straight line fitting on the second edge point to obtain two edge lines in a first direction, where the first direction is perpendicular to the conveying direction of the second electrode piece; and determine the distance between the two edge lines as the size of the electrode tab area.

[0181] In some embodiments of the present application, taking the second electrode as an anode electrode as an example, a partial area of ​​the second detection image is shown in FIG6 , wherein e represents the image area corresponding to other mechanisms outside the second electrode, such as the image area corresponding to the detection roller for supporting the second electrode, f represents the image area corresponding to the tab area in the second electrode, i.e., the tab area image, and g represents the image area corresponding to the coating area in the second electrode. The second host computer 132 can use a caliper tool to generate a fork edge point at the edge of the tab area image f, then filter out discrete abnormal edge points, and use the remaining edge points to fit two edge lines y1 and y2 in the first direction by straight line fitting, and obtain the distance d between the midpoints of the two edge lines to obtain the size of the tab area.

[0182] In this way, the size of the tab region in the first direction of the pole piece, that is, the width of the tab region, can be obtained.

[0183] In some embodiments, any one of the first host computer 122 and the plurality of second host computers 132 is a master host computer, and the other host computers except the master host computer are slave hosts. The system 10 may also include a correction mechanism 19. The correction mechanism 19 may be connected to the master host computer via a master device switch 20.

[0184] In some examples, as shown in FIG7 , a second host computer 132 may be used as a master host computer.

[0185] The slave host computer is also used to send the determined tab area size to the master host computer;

[0186] The main host computer is also used to determine the system correction value according to the acquired dimensions of the multiple tab areas, and send the correction value to the correction mechanism 19;

[0187] The correction mechanism 19 is used to correct the system 10 based on the correction value.

[0188] In an embodiment of the present application, correcting the system 10 may include adjusting the position of the first pole piece after the offset occurs so that the width of the tab region cut along the width direction when the slitting mechanism 11 slits the first pole piece can remain consistent. The correcting mechanism 19 may adjust the position of the first pole piece, including adjusting its angle in the system, its position in the width direction, etc., so that the cutter position of the slitting mechanism 11 is aligned with the central axis of the cutting position.

[0189] In this way, the deviation of the pole piece rolling and slitting system 10 can be corrected, thereby improving the product quality of the pole piece rolling and slitting system 10 .

[0190] In some embodiments, the master host computer may determine the deviation correction value of the system 10 in the following manner:

[0191] Determining a size difference between each pair of tab regions among the plurality of tab regions, wherein each pair of tab regions is two tab regions located on both sides of a same cutting position;

[0192] The correction value is determined based on the size difference.

[0193] In some embodiments of the present application, the slitting mechanism 11 can cut the first electrode piece at multiple slitting positions, so that multiple pairs of pole lug areas can be obtained. Based on this, when determining the correction value, the size difference of each pair of pole lug areas can be calculated separately, and then the average value of the size difference of multiple pairs of pole lug areas can be used as the correction value.

[0194] In some examples, the first electrode 810 is the anode electrode as shown in Figure 8, wherein the shaded area is the smear area, and the blank area is the electrode ear area. The first electrode 810 includes two cutting positions F and G. When the cutting mechanism 11 cuts the first electrode 810, it cuts at the F position and the G position respectively, thereby cutting to obtain the first second electrode 811-1, the second second electrode 811-2 and the third second electrode 811-3 as shown in Figure 9, wherein the right electrode ear area of ​​the first second electrode 811-1 and the left electrode ear area of ​​the second second electrode 811-2 correspond to the same cutting position F, so these two electrode ear areas can be used as a pair of electrode ear areas, and the right electrode ear area of ​​the second second electrode 811-2 and the left electrode ear area of ​​the third second electrode 811-3 correspond to the same cutting position G, so these two electrode ear areas can be used as a pair of electrode ear areas. Based on this, the main host computer can calculate the first size difference between the right side pole ear area of ​​the first second pole piece 811-1 and the left side pole ear area of ​​the second second pole piece 811-2, as well as the second size difference between the right side pole ear area of ​​the second second pole piece 811-2 and the left side pole ear area of ​​the third second pole piece 811-3, and use the average value of the first size difference and the second size difference as the correction value of the system 10.

[0195] The main host computer can calculate the correction value of the system 10 according to the following formula (5):

[0196] In formula (5), F represents the correction value, D1 represents the size of the right side tab area of ​​the second pole piece 811 ranked first, D2 represents the size of the left side tab area of ​​the second pole piece 811 ranked second, D3 represents the size of the right side tab area of ​​the second pole piece 811 ranked second, and D4 represents the size of the left side tab area of ​​the second pole piece 811 ranked third.

[0197] In the above manner, a correction value that can characterize the dimensional consistency of the tab area of ​​the second pole piece can be obtained, so that when the correction mechanism 19 corrects the pole piece rolling and slitting system 10 based on the correction value, the dimensional consistency of the multiple tab areas obtained by slitting can be improved.

[0198] In some embodiments, the first host computer 122 and the second host computer 132 use the same surface defect detection algorithm. The following uses the first host computer 122 as an example to illustrate the detection process of the surface detection algorithm.

[0199] 10 , the first host computer 122 may perform surface defect detection on the first detection image using the following steps S101 - S104:

[0200] S101. Extract a first target image region corresponding to a target detection area from a first detection image.

[0201] In some embodiments of the present application, the surface of the electrode generally includes multiple areas. For example, the surface of the anode electrode generally includes a tab area and a coating area, and the surface of the cathode electrode generally includes a tab area, a coating area, and a ceramic area. The target inspection area can be any area that requires surface defect inspection selected from the areas included in the electrode according to actual needs. For example, if the electrode in the system 10 is an anode electrode, the coating area in the electrode can be used as the target inspection area; if the electrode in the system 10 is a cathode electrode, the coating area and ceramic area in the electrode can be used as the target inspection area.

[0202] Different regions of the electrode sheet correspond to different grayscale value intervals in the image. Based on this, the first detection image can be segmented into multiple image regions based on the grayscale value intervals corresponding to each region, with each image region corresponding to each grayscale value interval. Then, the image region corresponding to the target grayscale value interval corresponding to the target detection area in the multiple image regions is used as the target image region.

[0203] In some embodiments of the present application, the first detection image may be a grayscale image or a color image. When the first detection image is a grayscale image, the target image area may be determined directly from the first detection image. When the first detection image is a color image, the first detection image may be converted into a grayscale image first, and then the target image area may be determined from the converted first detection image.

[0204] S102. Binarize the first target image area to obtain a first binary image of the first target detection area.

[0205] In some embodiments of the present application, a binarization threshold can be set according to the target grayscale value interval corresponding to the first target image area, and the first target image area can be binarized according to the binarization threshold to obtain a first binarized image of the surface of the first target detection area. The binarization threshold can include the upper limit and lower limit of the target grayscale value interval. In this way, the pixels in the first target image area that belong to the target grayscale value interval and the pixels that do not belong to the target grayscale value interval can be distinguished through the binarization process. The image corresponding to the pixels in the first binarized image that belong to the target grayscale value interval is used as the background image, and the image corresponding to the pixels in the first binarized image that do not belong to the target grayscale value interval is used as the foreground image. The foreground image is the image corresponding to the surface defects of the target detection area.

[0206] S103. Filter out a first target region whose area is greater than or equal to a defect area threshold and whose width is greater than or equal to a defect width threshold from the foreground image of the first binary image.

[0207] Considering that the effect of defects of smaller size on the performance of the electrode can be ignored, when detecting defective areas, only the defective areas that have an impact on the performance of the electrode can be detected.

[0208] In some embodiments of the present application, the connected domains of the foreground image in the first binary image can be marked through Blob analysis, and the area and width of each marked connected domain are calculated. The area of ​​each connected domain is compared with a preset defect area threshold. If the area of ​​the connected domain is greater than or equal to the defect area threshold, the width of the connected domain is further compared with a preset defect width threshold. If the width of the connected domain is greater than or equal to the defect width threshold, the connected domain is marked as the first target area.

[0209] S104 . Determine a defect area of ​​the first surface based on the first target area.

[0210] In this way, defective areas in the first surface that may affect the performance of the pole piece can be accurately detected.

[0211] Similarly, the second host computer can perform surface defect detection on the second inspection image in the following manner: extract a second target image region corresponding to the target inspection region from the second inspection image; binarize the second target image region to obtain a second binary image of the second target inspection region; filter out a second target region from the foreground image of the second binary image whose area is greater than or equal to the defect area threshold and whose width is greater than or equal to the defect width threshold; and determine the defect region of the second surface based on the second target region. The implementation of each step can be found in the description of steps S101-S104 and will not be repeated here.

[0212] In some embodiments, referring to FIG11 , the pre-slitting detection mechanism 12 may include a first light source 124 and a first detection roller 125. A first macro camera 121 is disposed toward the first detection roller 125; the first detection roller 125 is configured to support the first pole piece so that the first surface of the first pole piece faces the first macro camera 121; the first light source 124 is configured to illuminate the first surface of the first pole piece; and the first macro camera 121 is configured to photograph the illuminated first surface of the first pole piece.

[0213] Referring to Figure 12, the post-slitting detection mechanism 13 can also include a second light source 134 and a second detection roller 135. The second macro camera 131 in the post-slitting detection mechanism 13 is arranged toward the second detection roller 135; the second detection roller 135 is used to support the second pole piece so that the second surface of the second pole piece faces the second macro camera 131 in the post-slitting detection mechanism 13; the second light source 134 is used to illuminate the second surface of the second pole piece; and the second macro camera 131 is used to photograph the second surface of the second pole piece after illumination.

[0214] In this way, defects on the electrode surface can be made more prominent in the inspection image.

[0215] In some embodiments, the pole piece typically includes multiple regions, so the detection image of the pole piece includes image regions corresponding to the multiple regions, and the detection image may contain other content in addition to the image of the pole piece. In view of this, in order to facilitate the distinction between image regions corresponding to different regions in the detection image, the illumination angles of the first light source 124 and the second light source 134, as well as the shooting angles and shooting points of the first macro camera 121 and the second macro camera 131, can be set according to the grayscale value intervals corresponding to the set regions.

[0216] In addition, the working distance of the first macro camera 121 and the second macro camera 131 can also be set according to the focal length of the lens in the first macro camera 121 and the second macro camera 131. The working distance of the first macro camera 121 and the second macro camera 131 refers to the distance between the first macro camera 121 and the second macro camera 131 and the corresponding first detection roller 125 and the second detection roller 135. Generally, the smaller the focal length of the lens, the shorter the working distance of the camera.

[0217] In some examples, taking the pre-slitting detection mechanism 12 as an example, if the first electrode in the system 10 is an anode electrode, the current collector of the anode electrode is copper foil, and the material is carbon powder, in order to facilitate the distinction between the various areas in the first detection image, the grayscale value interval corresponding to the first detection roller 125 can be set to 0-10, the grayscale value interval corresponding to the tab area can be set to 255, and the grayscale value interval corresponding to the coating area can be set to 40-60. After setting the shooting angle of the first macro camera 121, the irradiation angle of the first light source 124, and the shooting point of the first macro camera 121 based on the above grayscale value intervals, the first surface of the first electrode is photographed by the first macro camera 121, and a first detection image as shown in Figure 13 can be obtained, where e represents the image area corresponding to the first detection roller 125, f represents the image area corresponding to the tab area in the anode electrode, and g represents the image area corresponding to the coating area in the anode electrode.

[0218] In some embodiments of the present application, taking the pre-slitting detection mechanism 12 as an example, if the first electrode piece in the system 10 is a cathode electrode piece, the material of the cathode electrode piece is aluminum foil, and there are ceramic areas on both sides of the coating area, when the grayscale value interval corresponding to the first detection roller 125 is set to 0-10, the grayscale value interval corresponding to the tab area is set to 255, the grayscale value interval corresponding to the coating area is set to 20-40, and the grayscale value interval corresponding to the ceramic area is set to 110-130, the shooting angle of the first macro camera 121, the illumination angle of the first light source 124, and the shooting point of the first macro camera 121 are set, the first surface of the first electrode piece is photographed by the first macro camera 121, and an image as shown in Figure 14 can be obtained, where e represents the image area corresponding to the first detection roller 125, f represents the image area corresponding to the tab area in the cathode electrode piece, h represents the image area corresponding to the ceramic area in the cathode electrode piece, and g represents the image area corresponding to the coating area in the cathode electrode piece.

[0219] In this way, the grayscale value intervals corresponding to different areas in the detection image can be different, which makes it easier to distinguish the image areas corresponding to different areas.

[0220] Based on the pole piece rolling and slitting system provided in the above embodiment, the present application also provides a specific implementation of a pole piece rolling and slitting method. Please refer to the following embodiment.

[0221] 15 is a flow chart of a pole piece rolling and slitting method according to an embodiment of the present application. As shown in FIG15 , the method may include the following steps S151 to S1512:

[0222] S151. The first pole piece of the input pole piece roller slitting system is cut into a plurality of second pole pieces by a slitting mechanism;

[0223] S152. The first electrode and the plurality of second electrode are conveyed by a conveying mechanism;

[0224] S153. The encoder rotates by following the shaft of the transmission mechanism according to the rotation angle to output a pulse signal to the pre-slitting detection mechanism, multiple post-slitting detection mechanisms and the programmable logic controller, and the multiple post-slitting detection mechanisms correspond one to one with the multiple second pole pieces;

[0225] S154. Triggering the first macro camera in the pre-slitting detection mechanism by the first acquisition card unit in the pre-slitting detection mechanism to capture the first surface of the first electrode piece according to the frequency of the pulse signal, and transmitting the image captured by the first macro camera to the first host computer in the pre-slitting detection mechanism;

[0226] S155. The image transmitted by the first acquisition card unit is stitched by the first host computer to obtain a first detection image of the first surface;

[0227] S156. Performing surface defect detection on the first detection image by the first host computer to obtain a first detection result, the first detection result being used to indicate a defective area on the first surface;

[0228] S157. Determine the first marking information based on the first detection result by the first host computer;

[0229] S158. For each post-slitting inspection mechanism, triggering a second macro camera in the post-slitting inspection mechanism by a second acquisition card unit in the post-slitting inspection mechanism to capture the second surface of the corresponding second electrode piece at the frequency of the pulse signal, and transmitting the image captured by the second macro camera to a second host computer in the post-slitting inspection mechanism;

[0230] S159. The second host computer stitches the image transmitted by the second acquisition card unit to obtain a second detection image of the second surface;

[0231] S1510. Performing surface defect detection on the second detection image by a second host computer to obtain a second detection result, the second detection result being used to indicate a defective area on the second surface;

[0232] S1511. Determine the second marking information based on the second detection result by the second host computer;

[0233] S1512. Control the marking mechanism to mark based on the first marking information and at least one of the plurality of second marking information through a programmable logic controller.

[0234] In this way, using a macro camera to photograph the electrode surface can produce a clear, detailed, and distortion-free inspection image, allowing the accurate determination of surface defects in the electrode based on the inspection image. In addition, marking with a marking mechanism can facilitate the query and location of surface defects in the electrode.

[0235] In some embodiments, determining the first marking information based on the first detection result by the first host computer may include:

[0236] Determining, by a first host computer, a first defect position in a first target pole piece region based on a first detection result, where the first target pole piece region is a pole piece region captured by a first detection image; determining a first response distance of a marking mechanism based on the first defect position; determining a first number of pulses that a programmable logic controller needs to wait for based on the first response distance and an accuracy of an encoder; and using the first number of pulses as first marking information;

[0237] Determining second marking information based on the second detection result by the second host computer includes:

[0238] Determining, by a second host computer, a second defect position in a second target pole piece region based on a second detection result, where the second target pole piece region is a pole piece region captured by the second detection image; determining a second response distance of the marking mechanism based on the second defect position; determining a second number of pulses that the programmable logic controller needs to wait for based on the second response distance and the accuracy of the encoder; and using the second number of pulses as second marking information;

[0239] Controlling a marking mechanism to mark based on the first marking information and at least one of the plurality of second marking information by a programmable logic controller includes:

[0240] The programmable logic controller sends a marking instruction to the marking mechanism when it is determined based on the first marking information that the first pulse number has been waited for and / or when it is determined based on any second marking information that the any second pulse number has been waited for, so that the marking mechanism performs marking based on the marking instruction.

[0241] In this way, the marking mechanism can accurately mark the defective area in the pole piece.

[0242] In some embodiments, the second detection image includes a tab region image corresponding to the tab region, and the method further includes:

[0243] The second host computer identifies the edge of the tab area image and determines the size of the tab area based on the edge.

[0244] In this way, the size of the tab area in the second pole piece can be determined.

[0245] In some embodiments, determining the size of the tab region based on the edge includes:

[0246] Generate edge points at the edge;

[0247] Eliminate discrete edge points from the edge points to obtain the target edge points;

[0248] Performing straight line fitting on the target edge points to obtain two edge lines in a first direction, where the first direction is perpendicular to the conveying direction of the second electrode corresponding to the second host computer;

[0249] The distance between the two edge lines is determined as the size of the tab area.

[0250] In this way, the size of the tab region of the second pole piece in the first direction can be determined.

[0251] In some embodiments, any one of the first host computer and the plurality of second host computers is a master host computer, and the host computers other than the master host computer are slave host computers, and the method further includes:

[0252] By sending the determined tab area size from the host computer to the main host computer;

[0253] Obtaining the dimensions of multiple tab areas in multiple second pole pieces through a main host computer; determining a correction value of a pole piece rolling and slitting system based on the dimensions of the multiple tab areas;

[0254] The electrode roller pressing and slitting system is corrected based on the correction value through the correction mechanism.

[0255] In this way, the deviation of the pole piece rolling and slitting system can be corrected, and the product quality of the pole piece rolling and slitting system can be improved.

[0256] In some embodiments, determining the deviation correction value of the pole piece rolling and slitting system based on the sizes of the plurality of pole tab regions includes:

[0257] Determining a size difference between each pair of tab regions among the plurality of tab regions, wherein each pair of tab regions is two tab regions located on both sides of a same cutting position;

[0258] The correction value is determined based on the size difference.

[0259] In this way, a correction value that can characterize the dimensional consistency of the tab areas of the plurality of second pole pieces can be obtained.

[0260] In some embodiments, performing surface defect detection on the first detection image by the first host computer to obtain a first detection result includes:

[0261] Extracting, by a first host computer, a first target image region corresponding to a first target detection region of the first surface from the first detection image; binarizing the first target image region to obtain a first binary image of the first target detection region; screening out, from a foreground image of the first binary image, a first target region having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold; and determining a defect region of the first surface based on the first target region;

[0262] The second host computer performs surface defect detection on the second detection image to obtain a second detection result, including:

[0263] A second target image area corresponding to the second target detection area of ​​the second electrode is extracted from the second detection image by a second host computer; the second target image area is binarized to obtain a second binary image of the second target detection area; a second target area having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold is screened out from the foreground image of the second binary image; and the defect area of ​​the second surface is determined based on the second target area.

[0264] In this way, defective areas on the electrode surface that affect the electrode performance can be accurately detected.

[0265] Although the present application has been described with reference to preferred embodiments, various modifications may be made thereto and components may be replaced with equivalents without departing from the scope of the present application. In particular, the various technical features described in the various embodiments may be combined in any manner as long as there are no structural conflicts. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions within the scope of the claims.

Claims

1. A pole piece rolling and slitting system, wherein: include: A slitting mechanism, a pre-slitting detection mechanism, multiple post-slitting detection mechanisms, a conveying mechanism, an encoder, a programmable logic controller, and a marking mechanism; The slitting mechanism is used to slit the first electrode piece input into the system into a plurality of second electrode pieces; The conveying mechanism is used to convey the first pole piece and the plurality of second pole pieces; The pre-slitting detection mechanism is used to detect the first electrode before slitting; A plurality of post-slicing detection mechanisms are used to detect the plurality of second electrode pieces after slicing, and the plurality of post-slicing detection mechanisms correspond one-to-one to the plurality of second electrode pieces; The encoder is connected to the rotating shaft of the transmission mechanism and rotates along with the rotating shaft; the encoder is used to output a pulse signal to the pre-slitting detection mechanism, the plurality of post-slitting detection mechanisms and the programmable logic controller according to the rotation angle; The pre-slitting detection mechanism includes a first macro camera, a first host computer and a first acquisition card unit, wherein the first macro camera is connected to the first host computer via the first acquisition card unit, and the first acquisition card unit includes a plurality of acquisition cards; Each of the post-slitting detection mechanisms includes a second macro camera, a second host computer, and a second acquisition card unit, wherein the second macro camera is connected to the second host computer via the second acquisition card unit, and the second acquisition card unit includes a plurality of acquisition cards; The first acquisition card unit is used to synchronously trigger the first macro camera to photograph the first surface of the first pole piece according to the frequency of the pulse signal, and synchronously transmit the image photographed by the first macro camera to the first host computer; The first host computer is used to splice the images transmitted by the first acquisition card unit to obtain a first detection image of the first surface; Performing surface defect detection on the first detection image to obtain a first detection result, where the first detection result is used to indicate a defect area of ​​the first surface; determining first marking information based on the first detection result; The second acquisition card unit is used to trigger the second macro camera to photograph the second surface of the second pole piece according to the frequency of the pulse signal, and transmit the image photographed by the second macro camera to the second host computer; The second host computer is used to splice the images transmitted by the second acquisition card unit to obtain a second detection image of the second surface; performing surface defect detection on the second detection image to obtain a second detection result, where the second detection result is used to indicate a defect area on the second surface; Determine based on the second detection result Second, marking information; The programmable logic controller is used to control the marking mechanism to mark based on the first marking information and at least one of the plurality of second marking information.

2. The system according to claim 1, wherein: The second detection image includes a tab area image corresponding to the tab area; The second host computer is further configured to identify edges of the tab region image and determine a size of the tab region based on the edges; The second host computer is used to generate edge points at the edge of the pole tab area image, eliminate discrete edge points among the edge points, obtain target edge points, perform straight line fitting on the target edge points, obtain two edge lines in a first direction, and determine the distance between the two edge lines as the size of the pole tab area. The first direction is perpendicular to the conveying direction of the second pole piece corresponding to the second host computer.

3. The system according to claim 1 or 2, wherein: The first host computer is configured to determine a first defect position in a first target pole piece region based on the first detection result, where the first target pole piece region is a pole piece region captured by the first detection image; Determining a first response distance of the marking mechanism based on the first defect position; determining a first number of pulses that the programmable logic controller needs to wait for based on the first response distance and the accuracy of the encoder; using the first pulse number as the first marking information; The programmable logic controller is configured to send a marking instruction to the marking mechanism when it is determined based on the first marking information that a number of pulses of the first pulse have been waited; The second host computer is used to determine a second defect position in a second target pole piece area based on the second detection result, where the second target pole piece area is the pole piece area captured by the second detection image; Determining a second response distance of the marking mechanism based on the second defect position; determining a second number of pulses that the programmable logic controller needs to wait for based on the second response distance and the accuracy of the encoder; using the second pulse number as second marking information; The programmable logic controller is further configured to send a marking instruction to the marking mechanism when it is determined based on the second marking information that a number of second pulses have been waited; The marking mechanism is used to perform marking based on the marking instruction.

4. The system according to claim 2 or 3, wherein: Any one of the first host computer and the plurality of second host computers is a master host computer, and the other host computers except the master host computer are slave host computers; The system also includes a correction mechanism; The slave host computer is further configured to send the determined size of the tab area to the master host computer; The main host computer is also used to determine the correction value of the system according to the acquired dimensions of the multiple tab areas. The correction value is sent to the correction mechanism; The correction mechanism is used to correct the system based on the correction value.

5. The system according to claim 4, wherein: The main host computer is used to determine the size difference of each pair of tab areas among the multiple tab areas, wherein each pair of tab areas is two tab areas located on both sides of the same cutting position; The correction value is determined based on the size difference.

6. The system according to any one of claims 1 to 5, wherein: The first host computer is used to extract a first target image area corresponding to the target detection area from the first detection image; Binarizing the first target image region to obtain a first binary image of the first target detection region; Screening out a first target region whose area is greater than or equal to a defect area threshold and whose width is greater than or equal to a defect width threshold from the foreground image of the first binary image; determining a defect area of ​​the first surface based on the first target area; The second host computer is used to extract a second target image area corresponding to the target detection area from the second detection image; Binarizing the second target image region to obtain a second binary image of the second target detection region; Screening out a second target region whose area is greater than or equal to a defect area threshold and whose width is greater than or equal to a defect width threshold from the foreground image of the second binary image; A defect area of ​​the second surface is determined based on the second target area.

7. The system according to any one of claims 1 to 6, wherein: The pre-slitting detection mechanism further includes a first light source and a first detection roller; The first macro camera is arranged toward the first detection roller; The first detection roller is used to support the first pole piece so that the first surface of the first pole piece faces the first macro camera; The first light source is used to illuminate the first surface of the first pole piece; The first macro camera is used to photograph the first surface of the first pole piece after illumination; The post-slitting detection mechanism further includes a second light source and a second detection roller; The second macro camera is arranged toward the second detection roller; The second detection roller is used to support the second pole piece so that the second surface of the second pole piece faces the second macro camera; The second light source is used to illuminate the second surface of the second pole piece; The second macro camera is used to photograph the second surface of the second pole piece after illumination.

8. The system according to claim 7, wherein: The illumination angle of the first light source and the shooting angle and shooting point of the first macro camera are set based on the grayscale value intervals corresponding to the respective areas in the first pole piece; The illumination angle of the second light source and the shooting angle and shooting point of the second macro camera are based on the first Grayscale value interval settings corresponding to each area in the diode.

9. The system according to claim 7 or 8, wherein: The first light source is located in a first direction of the first macro camera, and the first direction is a conveying direction of the first pole piece; The second light source is located in a second direction of the second macro camera, and the second direction is a conveying direction of the second pole piece.

10. The system according to any one of claims 7 to 9, wherein: When the pre-slitting detection mechanism determines that the first pole piece exists on the first detection roller, the pre-slitting detection mechanism controls the first light source through the first host computer to illuminate the first surface of the first pole piece; When the post-slitting detection mechanism determines that a second pole piece exists on the second detection roller, the post-slitting detection mechanism controls the second light source through the second host computer to illuminate the second surface of the second pole piece.

11. The system according to any one of claims 1 to 10, wherein: The pre-slitting detection mechanism is arranged upstream of the slitting mechanism, and the plurality of post-slitting detection mechanisms are arranged downstream of the slitting mechanism.

12. The system according to any one of claims 1 to 11, wherein: The pre-slitting detection mechanism and the plurality of post-slitting detection mechanisms are connected to the programmable logic controller via a switch.

13. A pole piece rolling and slitting method, wherein: include: Cutting the first pole piece input into the pole piece rolling and cutting system into a plurality of second pole pieces by a cutting mechanism; transporting the first pole piece and the plurality of second pole pieces by a conveying mechanism; An encoder that rotates along with the shaft of the transmission mechanism outputs a pulse signal to a pre-slitting detection mechanism, a plurality of post-slitting detection mechanisms, and a programmable logic controller according to the angle of rotation, wherein the plurality of post-slitting detection mechanisms correspond one to one to the plurality of second pole pieces; triggering, by the first acquisition card unit in the pre-slitting detection mechanism, a first macro camera in the pre-slitting detection mechanism to photograph the first surface of the first pole piece according to the frequency of the pulse signal, and transmitting the image photographed by the first macro camera to a first host computer in the pre-slitting detection mechanism; splicing the images transmitted by the first acquisition card unit by the first host computer to obtain a first detection image of the first surface; Performing surface defect detection on the first detection image by the first host computer to obtain a first detection result, where the first detection result is used to indicate a defect area on the first surface; Determining first marking information based on the first detection result by the first host computer; For each of the post-slitting detection mechanisms, the second acquisition card unit in the post-slitting detection mechanism is used to trigger the second macro camera in the post-slitting detection mechanism to shoot the second surface of the corresponding second electrode piece according to the frequency of the pulse signal, and transmit the second macro camera to the second host computer in the post-slitting detection mechanism. Images captured by the camera; splicing the images transmitted by the second acquisition card unit by the second host computer to obtain a second detection image of the second surface; performing surface defect detection on the second detection image by the second host computer to obtain a second detection result, where the second detection result is used to indicate a defect area on the second surface; Determining second marking information based on the second detection result by the second host computer; The programmable logic controller controls the marking mechanism to perform marking based on the first marking information and at least one of the plurality of second marking information.

14. The method according to claim 13, wherein The second detection image includes a tab region image corresponding to the tab region, and the method further includes: Identifying, by the second host computer, an edge of the tab region image, and determining a size of the tab region based on the edge; Determining the size of the tab region based on the edge includes: generating edge points at the edges; Eliminating discrete edge points from the edge points to obtain target edge points; Performing straight line fitting on the target edge points to obtain two edge lines in a first direction, where the first direction is perpendicular to a conveying direction of the second electrode corresponding to the second host computer; The distance between the two edge lines is determined as the size of the tab area.

15. The method according to claim 13 or 14, wherein: The determining, by the first host computer, first marking information based on the first detection result includes: Determining, by the first host computer, a first defect position in a first target pole piece area based on the first detection result, where the first target pole piece area is the pole piece area captured by the first detection image; determining a first response distance of the marking mechanism based on the first defect position; determining a first number of pulses that the programmable logic controller needs to wait for based on the first response distance and the accuracy of the encoder; and using the first number of pulses as the first marking information; The determining, by the second host computer, the second marking information based on the second detection result includes: Determining, by the second host computer, a second defect position in a second target pole piece area based on the second detection result, where the second target pole piece area is the pole piece area captured by the second detection image; determining a second response distance of the marking mechanism based on the second defect position; determining a second number of pulses that the programmable logic controller needs to wait for based on the second response distance and the accuracy of the encoder; and using the second number of pulses as second marking information; The controlling the marking mechanism to mark based on the first marking information and at least one of the plurality of second marking information by the programmable logic controller includes: The programmable logic controller sends a marking instruction to the marking mechanism when it is determined based on the first marking information that the first pulse number has been waited for and / or when it is determined based on any second marking information that the second pulse number has been waited for, so that the marking mechanism performs marking based on the marking instruction.

16. The method according to any one of claims 13 to 15, wherein: Any one of the first host computer and the plurality of second host computers is a master host computer, and the host computers other than the master host computer are slave host computers, and the method further includes: Sending the determined tab area size to the master host computer via the slave host computer; Acquiring, by the master host computer, the sizes of the plurality of tab areas in the plurality of second pole pieces; determining the deviation correction value of the pole piece rolling and slitting system based on the sizes of the plurality of tab areas; The pole piece rolling and slitting system is corrected based on the correction value by a correction mechanism.

17. The method according to claim 16, wherein The determining of the correction value of the pole piece rolling and slitting system based on the sizes of the plurality of pole tab areas includes: Determining a size difference between each pair of tab regions among the plurality of tab regions, wherein each pair of tab regions is two tab regions located on both sides of a same cutting position; The correction value is determined based on the size difference.

18. The method according to any one of claims 13 to 17, wherein: The performing surface defect detection on the first detection image by the first host computer to obtain a first detection result includes: Extracting a first target image region corresponding to a target detection region from the first detection image by the first host computer; binarizing the first target image region to obtain a first binary image of the first target detection region; screening a first target region having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold from a foreground image of the first binary image; and determining a defect region of the first surface based on the first target region; The performing surface defect detection on the second detection image by the second host computer to obtain a second detection result includes: A second target image area corresponding to the target detection area is extracted from the second detection image by the second host computer; the second target image area is binarized to obtain a second binary image of the second target detection area; a second target area having an area greater than or equal to a defect area threshold and a width greater than or equal to a defect width threshold is screened out from the foreground image of the second binary image; and the defect area of ​​the second surface is determined based on the second target area.

19. The method according to any one of claims 13 to 18, wherein: The method of triggering the first macro camera in the pre-slitting detection mechanism to photograph the first surface of the first pole piece according to the frequency of the pulse signal by the first acquisition card unit in the pre-slitting detection mechanism includes: Controlling the first light source in the pre-slitting detection mechanism by the first host computer in the pre-slitting detection mechanism to illuminate the first surface of the first pole piece; The first macro camera in the pre-slitting detection mechanism is triggered by the first acquisition card unit in the pre-slitting detection mechanism to photograph the first surface of the first pole piece after illumination according to the frequency of the pulse signal.

20. The method according to any one of claims 13 to 19, wherein: The method of triggering the second macro camera in the post-slitting detection mechanism by the second acquisition card unit in the post-slitting detection mechanism to photograph the second surface of the corresponding second pole piece according to the frequency of the pulse signal includes: Controlling the second light source in the post-slitting detection mechanism by the second host computer in the post-slitting detection mechanism to illuminate the second surface of the corresponding second electrode piece; The second macro camera in the post-slicing detection mechanism is triggered by the second acquisition card unit in the post-slicing detection mechanism to photograph the second surface of the corresponding second pole piece after illumination according to the frequency of the pulse signal.

Images