Optical measurement device, optical measurement system, and gamma adjustment method

The optical measurement device optimizes gamma adjustment by acquiring light emission conditions and setting measurement parameters, addressing the time-consuming nature of low luminance measurements in complex display performance environments.

WO2025204654A1PCT designated stage Publication Date: 2025-10-02KONICA MINOLTA INC
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Patent Information

Application Number
PCT/JP2025/008069
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-03-28
Filing Date
2025-03-06
Publication Date
2025-10-02

AI Technical Summary

Technical Problem

The increasing complexity of display performance has led to longer measurement times for gamma adjustment due to the need for provisional measurements at low and high luminance levels, with low luminance measurements being particularly time-consuming.

Method used

An optical measurement device that acquires light emission conditions in advance and sets measurement conditions based on these conditions, including settings for target brightness, drive frequency, and the use of a light attenuation filter to optimize measurements, thereby reducing the time required for gamma adjustment.

Benefits of technology

The solution allows for faster and more accurate gamma value measurements by optimizing measurement conditions, reducing the time needed for low luminance measurements and improving the dynamic range of the device.

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Abstract

Provided are an optical measurement device, an optical measurement system, and a gamma adjustment method in which a measurement time is shortened.　The optical measurement device measures a light emission characteristic of a specimen, and comprises: a light emission condition acquisition unit that acquires a light emission condition of the specimen from the outside in advance; and a measurement condition setting unit that sets a measurement condition on the basis of the acquired light emission condition.
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Citation Information

Patent Citations

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    JP2003179834A

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    JP2008131562A

  • Information processor, method of predicting measurement time, program, and recording medium

    JP2008216203A

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    JP2008292680A

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    JP2009115631A

Cited By

  • Luminance measurement system, luminance measurement device, gamma adjustment system, luminance measurement method, gamma adjustment method, and program

    WO2026141004A1