Piezoelectric ceramic driving method and apparatus, device, and medium

By acquiring the target Gaussian waveform and sampling it based on the peak value, the target voltage waveform is obtained, which solves the problem that the voltage waveform cannot take into account both smoothness and strong vibration. It achieves the balance between comfortable vibration feedback and strong vibration of piezoelectric ceramics.

WO2025218666A1PCT designated stage Publication Date: 2025-10-23WEIFANG GOERTEK MICROELECTRONICS CO LTD
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Patent Information

Application Number
PCT/CN2025/089073
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-04-19
Filing Date
2025-04-15
Publication Date
2025-10-23

AI Technical Summary

Technical Problem

The existing voltage waveform cannot achieve both smoothness and strong vibration, resulting in the piezoelectric ceramics being unable to obtain comfortable vibration feedback and greater vibration at the same time.

Method used

Obtain the target Gaussian waveform and perform sampling based on the peak value according to the set sampling strategy to obtain the target voltage waveform and drive the piezoelectric ceramic.

Benefits of technology

Piezoelectric ceramics achieve both comfortable vibration feedback and greater vibration.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present disclosure provides a piezoelectric ceramic driving method and apparatus, a device, and a medium. The method comprises: acquiring a target Gaussian waveform; on the basis of a set sampling strategy, sampling the target Gaussian waveform to obtain a target voltage waveform, wherein the set sampling strategy at least comprises taking a peak value of the target Gaussian waveform as a sampling reference; and driving a piezoelectric ceramic on the basis of the target voltage waveform.
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Description

Piezoelectric ceramic driving method, device, equipment and medium TECHNICAL FIELD

[0001] Embodiments of the present disclosure relate to the technical field of piezoelectric ceramic driving, and more particularly, to a piezoelectric ceramic driving method, a piezoelectric ceramic driving device, an electronic device, and a computer-readable storage medium. BACKGROUND

[0002] In the related art, there is a mapping relationship between the vibration feedback of the piezoelectric ceramic and the voltage waveform. Generally, a smooth voltage waveform can make the piezoelectric ceramic obtain comfortable vibration feedback, and the voltage waveform needs to quickly reach the maximum voltage while being smooth, so that the piezoelectric ceramic obtains greater shock. However, the existing voltage waveform cannot balance smoothness and strong shock, so that the piezoelectric ceramic cannot obtain comfortable vibration feedback and greater shock at the same time. SUMMARY

[0003] An object of embodiments of the present disclosure is to provide a new technical solution for piezoelectric ceramic driving.

[0004] According to a first aspect of embodiments of the present disclosure, a piezoelectric ceramic driving method is provided, which comprises:

[0005] obtaining a target Gaussian waveform;

[0006] sampling the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein the set sampling strategy at least comprises taking a peak value of the target Gaussian waveform as a sampling reference;

[0007] driving a piezoelectric ceramic according to the target voltage waveform.

[0008] Optionally, the set sampling strategy further comprises that a sampling point is located in a first confidence interval of the target Gaussian waveform.

[0009] Optionally, the sampling of the target Gaussian waveform to obtain the target voltage waveform comprises:

[0010] determining a sampling point number of the target Gaussian waveform and a waveform parameter of the target Gaussian waveform;

[0011] determining a sampling parameter according to the sampling point number and the waveform parameter;

[0012] sampling the target Gaussian waveform according to the sampling parameter and the waveform parameter to obtain the target voltage waveform.

[0013] Optionally, the waveform parameter comprises a standard deviation and a voltage amplitude.

[0014] The sampling parameters include an eccentricity value, a sampling start point, a sampling end point, a left sampling point number, a right sampling point number, a left sampling interval, and a right sampling interval.

[0015] Optionally, the determining of the sampling parameters according to the sampling point number and the waveform parameter includes:

[0016] determining the eccentricity value according to the sampling point number;

[0017] determining the sampling start point and the sampling end point according to the eccentricity value and the standard deviation;

[0018] determining the left sampling point number and the right sampling point number according to the sampling point number;

[0019] determining the left sampling interval according to the left sampling point number, the eccentricity value, and the sampling start point, and determining the right sampling interval according to the right sampling point number, the eccentricity value, and the sampling end point.

[0020] Optionally, the sampling of the target Gaussian waveform according to the sampling parameters and the waveform parameter to obtain the target voltage waveform includes:

[0021] in a case where a current sampling point i is less than the left sampling point number, obtaining a corresponding first sampling voltage according to the voltage amplitude, the sampling start point, the left sampling interval, the eccentricity value, and the standard deviation; wherein i is greater than 0 and less than or equal to N;

[0022] in a case where the current sampling point i is greater than or equal to the left sampling point number, obtaining a corresponding second sampling voltage according to the voltage amplitude, the eccentricity value, the right sampling interval, and the standard deviation;

[0023] obtaining the target voltage waveform according to a plurality of the first sampling voltages and a plurality of the second sampling voltages.

[0024] According to a second aspect of the embodiments of the present disclosure, a piezoelectric ceramic driving device is provided, which includes:

[0025] an acquisition module configured to acquire a target Gaussian waveform;

[0026] a sampling module configured to sample the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein the set sampling strategy at least includes taking a peak value of the target Gaussian waveform as a sampling reference;

[0027] a driving module configured to drive a piezoelectric ceramic according to the target voltage waveform.

[0028] According to a third aspect of the embodiments of the present disclosure, an electronic device is provided, comprising: a memory for storing executable computer instructions; and a processor for executing the piezoelectric ceramic driving method according to the first aspect above under the control of the executable computer instructions.

[0029] According to a fourth aspect of the embodiments of the present disclosure, a computer readable storage medium is provided, having stored thereon computer instructions which, when executed by a processor, perform the piezoelectric ceramic driving method according to the first aspect above.

[0030] One beneficial effect of the embodiments of the present disclosure is that a target Gaussian waveform is obtained, and the target Gaussian waveform is sampled according to a set sampling strategy to obtain a target voltage waveform, wherein the set sampling strategy at least comprises taking a peak value of the target Gaussian waveform as a sampling reference, and then driving the piezoelectric ceramic according to the target voltage waveform. Since the target Gaussian waveform has a smooth characteristic, and at least the peak value of the target Gaussian waveform is taken as the sampling reference for sampling, the target voltage waveform obtained can take into account both smoothness and strong shock feeling, and can enable the piezoelectric ceramic to obtain both comfortable vibration feedback and greater shock feeling.

[0031] Other features of the present disclosure, and their advantages, will become apparent in the non-limiting examples of the present disclosure described below with reference to the drawings. BRIEF DESCRIPTION OF DRAWINGS

[0032] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0033] Fig. 1 is one of hardware configuration schematic diagrams of an electronic device according to an embodiment of the present disclosure;

[0034] Fig. 2 is a flow schematic diagram of a piezoelectric ceramic driving method according to an embodiment of the present disclosure;

[0035] Fig. 3 is a schematic diagram of a target Gaussian waveform and a sampling voltage according to an embodiment of the present disclosure;

[0036] Fig. 4 is a principle schematic diagram of a piezoelectric ceramic driving device according to an embodiment of the present disclosure;

[0037] Fig. 5 is another of hardware configuration schematic diagrams of an electronic device according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0038] Various exemplary embodiments of the embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. Note that the relative arrangement, numerical expressions, and numerical values of components and steps set forth in these embodiments are not limiting to the scope of the embodiments of the present disclosure, unless otherwise specifically stated.

[0039] The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the disclosure, its application, or uses.

[0040] Techniques, methods, and devices known to those of ordinary skill in the relevant art can not be discussed in detail herein. However, where appropriate, such techniques, methods, and devices can be considered part of the specification.

[0041] In all of the examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not as a limitation. Thus, other examples of exemplary embodiments can have different values.

[0042] It should be noted that like reference numerals and letters refer to like items throughout the attached drawings, and thus once an item is defined in one drawing, it is not necessary that it be further discussed in subsequent drawings.

[0043] <Hardware Configuration>

[0044] FIG. 1 is a block diagram of a hardware configuration of an electronic device 1000 according to an embodiment of the disclosure.

[0045] In one embodiment, the electronic device 1000 can be a server or a terminal device. The server can be a monolithic server or a distributed server across multiple computers or computer data centers. The terminal device can be a laptop computer, a desktop computer, a wearable device, etc., or any other device having a processor or other computing device and a memory or other storage device, which embodiments do not limit.

[0046] As shown in FIG. 1, the electronic device 1000 can include a processor 1100, a memory 1200, an interface device 1300, a communication device 1400, a display device 1500, an input device 1600, a speaker 1700, a microphone 1800, etc.

[0047] The processor 1100 can be a mobile version processor. The memory 1200 includes, for example, a ROM (Read Only Memory), a RAM (Random Access Memory), a nonvolatile memory such as a hard disk, and the like. The interface device 1300 includes, for example, a USB interface, a headphone interface, and the like. The communication device 1400 is capable of wired or wireless communication, for example, and can include a short-range communication device, such as any device that performs short-range wireless communication based on a Hilink protocol, a WiFi (IEEE 802.11 protocol), a Mesh, a Bluetooth, a ZigBee, a Thread, a Z-Wave, an NFC, a UWB, a LiFi, and the like, and can also include a long-range communication device, such as any device that performs WLAN, GPRS, 2G / 3G / 4G / 5G long-range communication. The display device 1500 is, for example, a liquid crystal display screen, a touch display screen, and the like. The input device 1600 can include, for example, a touch screen, a keyboard, and the like. The electronic device 1000 can output audio information through the speaker 1700 and can collect audio information through the microphone 1800.

[0048] Although a plurality of devices are shown in the electronic device 1000 in FIG. 1, the present disclosure can only involve some of the devices, for example, the electronic device 1000 can only involve the memory 1200 and the processor 1100.

[0049] In the embodiments of the present disclosure, the memory 1200 of the electronic device 1000 is configured to store instructions for controlling the processor 1100 to perform the piezoelectric ceramic driving method provided by the embodiments of the present disclosure.

[0050] In the above description, a skilled person can design instructions according to the schemes disclosed in the present disclosure. How the instructions control the processor to operate is well known in the art, and therefore will not be described in detail here.

[0051] <Method Embodiment>

[0052] FIG. 2 shows a piezoelectric ceramic driving method according to an embodiment of the present disclosure, which can be implemented by the electronic device shown in FIG. 1. As shown in FIG. 2, the piezoelectric ceramic driving method according to the embodiment can include the following steps S2100-S2300.

[0053] As shown in FIG. 2, the piezoelectric ceramic driving method according to the embodiment can include the following steps S2100-S2300.

[0054] In step S2100, a target Gaussian waveform is obtained.

[0055] Generally, a Gaussian function f(x) can be expressed as:

[0056] wherein, is the amplitude of the Gaussian function, u is the mean of the Gaussian function, and d is the standard deviation of the Gaussian function. The Gaussian function generally has the advantages of smooth waveform and inverted bell-shaped curve shape.

[0057] In this embodiment, the target Gaussian waveform can be obtained based on the Gaussian function first, and the target Gaussian waveform is sampled to obtain a sampling voltage to output a target voltage waveform, and then the piezoelectric ceramic is driven based on the target voltage waveform.

[0058] After the above step S2100 of obtaining the target Gaussian waveform, the following steps are performed:

[0059] In step S2200, the target Gaussian waveform is sampled according to a set sampling strategy to obtain a target voltage waveform.

[0060] It should be noted that if sampling is performed based on a fixed interval, the difference between the first point and the last point of sampling will be relatively large at different amplitudes, and it cannot be ensured that the peak value of the target Gaussian waveform can be sampled. Based on this, in this embodiment, the set sampling strategy at least includes taking the peak value of the target Gaussian waveform as the sampling reference, and preferably, the sampling points can be selected to sample at equal intervals on both sides of the peak value of the target Gaussian waveform, so that the peak value of the target Gaussian waveform can be sampled as much as possible.

[0061] It should be noted that, referring to the characteristics of Gaussian distribution in the application of Gaussian function in statistics, when deviating by 1.96 standard deviations, 95% of the distribution values can be covered, and when deviating by 2.58 standard deviations, 99% of the distribution values can be covered. In a more popular way, when the confidence interval fluctuates around the mean by 1.96 standard deviations, 95% of the distribution values can be covered, that is, the parameter estimation value based on sampling has a 95% probability of falling within this interval. Based on this, in this embodiment, the set sampling strategy can also include that the sampling points are located in the first confidence interval of the target Gaussian waveform, for example, the sampling points can be selected within the confidence interval of 99.9%, that is, within u±3*standard deviation.

[0062] In an optional embodiment, the step S2200 of sampling the target Gaussian waveform according to the set sampling strategy to obtain a target voltage waveform can further include the following steps S2210-S2230:

[0063] In step S2210, the number of sampling points of the target Gaussian waveform and the waveform parameters of the target Gaussian waveform are determined.

[0064] The waveform parameters can include the standard deviation and the voltage amplitude.

[0065] For example, the number of sampling points N, the standard deviation d, and the voltage amplitude Vm of the target Gaussian waveform are determined first.

[0066] At step S2220, sampling parameters are determined according to the sampling point number and the waveform parameters.

[0067] The sampling parameters can include an eccentricity value, a sampling start point, a sampling end point, a left sampling point number, a right sampling point number, a left sampling interval, and a right sampling interval.

[0068] Specifically, the determination of the sampling parameters according to the sampling point number and the waveform parameters at step S2220 can further include steps S2221-S2224 as follows:

[0069] At step S2221, the eccentricity value is determined according to the sampling point number.

[0070] The eccentricity value is usually the center position of the sampling, and can be the peak value of the target Gaussian waveform or other positions deviating from the peak value of the target Gaussian waveform, depending on the sampling point number N.

[0071] At step S2221, the eccentricity value O satisfies:

[0072] Wherein, N represents the sampling point number, and O is usually rounded down.

[0073] At step S2222, the sampling start point and the sampling end point are determined according to the eccentricity value and the standard deviation.

[0074] At step S2222, the sampling start point S satisfies: S=O-3*d

[0075] Wherein, O represents the eccentricity value, and d represents the standard deviation.

[0076] At step S2222, the sampling end point E satisfies: E=O+3*d

[0077] Wherein, O represents the eccentricity value, and d represents the standard deviation.

[0078] At step S2223, the left sampling point number and the right sampling point number are determined according to the sampling point number.

[0079] The left sampling point number is usually the sampling point number of the left sampling points centered on the eccentricity value O.

[0080] At step S2223, the left sampling point number P1 satisfies:

[0081] Wherein, N represents the sampling point number.

[0082] The right sampling point number is usually the sampling point number of the right sampling points centered on the eccentricity value O.

[0083] In this step S2223, the right sampling point number P2 satisfies: P2=N-P1

[0084] The above N represents the sampling point number, and the above P1 represents the left sampling point number.

[0085] In step S2224, the left sampling interval is determined according to the left sampling point number, the eccentricity value and the sampling starting point, and the right sampling interval is determined according to the right sampling point number, the eccentricity value and the sampling ending point.

[0086] The left sampling interval is generally the sampling interval between any two left sampling points centered on the eccentricity value O.

[0087] In this step S2224, the left sampling interval M1 satisfies:

[0088] The P1 represents the left sampling point number, O represents the eccentricity value, and S represents the sampling starting point.

[0089] The right sampling interval is generally the sampling interval between any two right sampling points centered on the eccentricity value O.

[0090] In this step S2224, the right sampling interval M2 satisfies:

[0091] The P2 represents the right sampling point number, O represents the eccentricity value, and E represents the sampling ending point.

[0092] According to the above steps S2221-S2224, the eccentricity value, the sampling starting point, the sampling ending point, the left sampling point number, the right sampling point number, the left sampling interval and the right sampling interval can be determined, and then the target voltage waveform can be obtained by sampling the target Gaussian waveform based on the eccentricity value, the sampling starting point, the sampling ending point, the left sampling point number, the right sampling point number, the left sampling interval and the right sampling interval.

[0093] In step S2230, the target voltage waveform is obtained by sampling the target Gaussian waveform according to the sampling parameters and the waveform parameters.

[0094] Specifically, the step S2230 of sampling the target Gaussian waveform according to the sampling parameters and the waveform parameters to obtain the target voltage waveform can further include the following steps S2231-S2233:

[0095] Step S2231, in a case that the current sampling point i is less than the left sampling point number, a corresponding first sampling voltage is obtained according to the voltage amplitude, the sampling starting point, the left sampling interval, the eccentricity value and the standard deviation.

[0096] Wherein, i is greater than 0 and less than or equal to N.

[0097] In this step S2231, in a case that i

[0098] Wherein, Vm represents the voltage amplitude, S represents the sampling starting point, M1 represents the left sampling interval, O represents the eccentricity value, and d represents the standard deviation.

[0099] Step S2232, in a case that the current sampling point i is greater than or equal to the left sampling point number, a corresponding second sampling voltage is obtained according to the voltage amplitude, the eccentricity value, the right sampling interval and the standard deviation.

[0100] In this step S2232, in a case that i

[0101] Wherein, Vm represents the voltage amplitude, M2 represents the right sampling interval, O represents the eccentricity value, and d represents the standard deviation.

[0102] Step S2233, the target voltage waveform is obtained according to the plurality of first sampling voltages and the plurality of second sampling voltages.

[0103] In this step S2233, after sampling a plurality of first sampling voltages and a plurality of second sampling voltages, the target voltage waveform can be output according to the plurality of first sampling voltages and the plurality of second sampling voltages. Referring to FIG. 3, the sampling voltage 32 is obtained by sampling the target Gaussian waveform 31, and the target voltage waveform is obtained based on the sampling voltage 32.

[0104] According to the above steps S2231-S2233, the target voltage waveform can be output based on the target Gaussian waveform, and then the piezoelectric ceramic is driven based on the target voltage waveform.

[0105] After performing the above step S2200 to sample the target Gaussian waveform according to the set sampling strategy to obtain the target voltage waveform, the following steps are entered:

[0106] Step S2300, the piezoelectric ceramic is driven according to the target voltage waveform.

[0107] In the embodiment, after the target voltage waveform is obtained, the piezoelectric ceramic can be driven according to the target voltage waveform. The target voltage waveform obtained can take into account both smoothness and strong shock feeling, and can make the piezoelectric ceramic obtain comfortable vibration feedback and greater shock feeling at the same time.

[0108] According to the embodiment of the present disclosure, a target Gaussian waveform is obtained, and the target Gaussian waveform is sampled according to a set sampling strategy to obtain a target voltage waveform. The set sampling strategy at least includes taking a peak value of the target Gaussian waveform as a sampling reference. Then, the piezoelectric ceramic is driven according to the target voltage waveform. Since the target Gaussian waveform has a smooth characteristic, and at least the sampling is performed by taking the peak value of the target Gaussian waveform as the sampling reference, the target voltage waveform obtained can take into account both smoothness and strong shock feeling, and can make the piezoelectric ceramic obtain comfortable vibration feedback and greater shock feeling at the same time.

[0109] <Example>

[0110] Next, referring to FIG. 3, a piezoelectric ceramic driving method is shown as an example. In this example, the piezoelectric ceramic driving method includes:

[0111] In step 301, a sampling point number N, a standard deviation d, and a voltage amplitude Vm are determined.

[0112] In step 302, an eccentricity value O is determined according to the sampling point number N, where O satisfies the downward rounding.

[0113] In step 303, a sampling starting point S = O - 3 * d is determined according to the sampling point number N and the standard deviation d, and a sampling ending point E = O + 3 * d is determined according to the sampling point number N and the standard deviation d.

[0114] In step 304, a left sampling point number P1 is determined according to the sampling point number N, where A right sampling point number P2 = N - P1 is determined according to the sampling point number N and the left sampling point number P1.

[0115] In step 305, a left sampling interval M1 = (S + O) / P1 is determined according to the left sampling point number P1, the eccentricity value O, and the sampling starting point S. A right sampling interval M2 = (O + E) / (N - P1) is determined according to the right sampling point number P2, the eccentricity value O, and the sampling ending point M.

[0116] In step 306, if i < P1, a sampling voltage V = Vm * exp(-((S + M1 * i) - O) ** 2 / 2 / d ** 2).

[0117] In step 307, if i >= P1, a sampling voltage V = Vm * exp(-((O + M2 * i) - O) ** 2 / 2 / d ** 2).

[0118] Step 308, output the sampling voltage V, and obtain the target voltage waveform.

[0119] <Device embodiment>

[0120] FIG. 4 is a structural schematic diagram of a piezoelectric ceramic driving device according to an embodiment. As shown in FIG. 4, the piezoelectric ceramic driving device 400 includes an acquisition module 410, a sampling module 420, and a driving module 430.

[0121] The acquisition module 410 is configured to acquire a target Gaussian waveform.

[0122] The sampling module 420 is configured to sample the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform, wherein the set sampling strategy at least includes taking a peak value of the target Gaussian waveform as a sampling reference.

[0123] The driving module 430 is configured to drive a piezoelectric ceramic according to the target voltage waveform.

[0124] In an embodiment, the set sampling strategy further includes that a sampling point is located in a first confidence interval of the target Gaussian waveform.

[0125] In an embodiment, the sampling module 420 is specifically configured to determine a sampling point number of the target Gaussian waveform and a waveform parameter of the target Gaussian waveform, determine a sampling parameter according to the sampling point number and the waveform parameter, and sample the target Gaussian waveform according to the sampling parameter and the waveform parameter to obtain the target voltage waveform.

[0126] In an embodiment, the waveform parameter includes a standard deviation and a voltage amplitude.

[0127] The sampling parameter includes an eccentricity value, a sampling start point, a sampling end point, a left sampling point number, a right sampling point number, a left sampling interval, and a right sampling interval.

[0128] In an embodiment, the sampling module 420 is specifically configured to determine the eccentricity value according to the sampling point number, determine the sampling start point and the sampling end point according to the eccentricity value and the standard deviation, determine the left sampling point number and the right sampling point number according to the sampling point number, determine the left sampling interval according to the left sampling point number, the eccentricity value, and the sampling start point, and determine the right sampling interval according to the right sampling point number, the eccentricity value, and the sampling end point.

[0129] In one embodiment, the sampling module 420 is specifically configured to, in a case that a current sampling point i is less than the left sampling point number, obtain a corresponding first sampling voltage according to the voltage amplitude, the sampling start point, the left sampling interval, the eccentric value and the standard deviation; wherein i is greater than 0 and less than or equal to N; in a case that the current sampling point i is greater than or equal to the left sampling point number, obtain a corresponding second sampling voltage according to the voltage amplitude, the eccentric value, the right sampling interval and the standard deviation; and obtain the target voltage waveform according to the plurality of first sampling voltages and the plurality of second sampling voltages.

[0130] According to the embodiments of the present disclosure, a target Gaussian waveform is obtained, and the target Gaussian waveform is sampled according to a set sampling strategy to obtain a target voltage waveform, wherein the set sampling strategy at least includes taking a peak value of the target Gaussian waveform as a sampling reference, and then driving a piezoelectric ceramic according to the target voltage waveform. Since the target Gaussian waveform has a smooth characteristic, and at least the sampling is performed by taking the peak value of the target Gaussian waveform as the sampling reference, the obtained target voltage waveform can balance smoothness and strong shock feeling, and can make the piezoelectric ceramic obtain comfortable vibration feedback and greater shock feeling at the same time.

[0131] <system embodiments>

[0132] FIG. 5 is a schematic diagram of a hardware structure of an electronic device according to one embodiment. As shown in FIG. 5, the electronic device 500 includes a processor 510 and a memory 520.

[0133] The memory 520 can be used to store executable computer instructions.

[0134] The processor 510 can be used to control the piezoelectric ceramic driving method according to the executable computer instructions.

[0135] The electronic device 500 can be the electronic device 1000 as shown in FIG. 1, and can also be a device with other hardware structures, which is not limited herein.

[0136] In another embodiment, the electronic device 500 can include the piezoelectric ceramic driving apparatus 400.

[0137] In one embodiment, each module of the piezoelectric ceramic driving apparatus 400 above can be implemented by the processor 410 running computer instructions stored in the memory 420. According to the embodiment of the present disclosure, a target Gaussian waveform is obtained, and the target Gaussian waveform is sampled according to a set sampling strategy to obtain a target voltage waveform, where the set sampling strategy at least includes taking the peak value of the target Gaussian waveform as a sampling reference, and then driving the piezoelectric ceramic according to the target voltage waveform. Since the target Gaussian waveform has a smooth characteristic, and is at least sampled by taking the peak value of the target Gaussian waveform as a sampling reference, the target voltage waveform obtained can give consideration to both smoothness and strong shock feeling, and can enable the piezoelectric ceramic to obtain both comfortable vibration feedback and greater shock feeling.

[0138] <Computer readable storage medium>

[0139] The embodiment of the present disclosure further provides a computer readable storage medium, which has computer instructions stored thereon, and the computer instructions are run by a processor to execute the piezoelectric ceramic driving method provided by the embodiment of the present disclosure.

[0140] The present disclosure can be a system, a method, and / or a computer program product. The computer program product can include a computer readable storage medium (or media) having computer readable program instructions thereon for causing a processor to carry out aspects of the present disclosure.

[0141] The computer readable storage medium can be a tangible device that can retain and store instructions for use by an instruction execution device. The computer readable storage medium can be, for example, but is not limited to, an electronic storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium include the following: a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), a static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanically encoded device such as punch-cards or punched tape, a magneto-optical or other optical medium, a portable (i.e., other than fixed into a device or station) computer-readable storage medium (e.g., a portable hard disk), or any suitable combination of the foregoing. A computer readable storage medium, as used herein, is not to be construed as being transitory signals per se, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through a waveguide or other transmission media (e.g., light pulses passing through a fiber-optic cable), or electrical signals transmitted through a wire.

[0142] Computer readable program instructions described herein can be downloaded to respective computing / processing devices from a computer readable storage medium or to an external computer or external storage device via a network, for example, the Internet, a local area network, a wide area network and / or a wireless network. The network can comprise copper transmission cables, optical transmission fibers, wireless transmission, routers, firewalls, switches, gateway computers and / or edge servers. A network adapter card or network interface in each computing / processing device receives computer readable program instructions from the network and forwards the computer readable program instructions for storage in a computer readable storage medium within the respective computing / processing device.

[0143] Computer readable program instructions for carrying out operations of the present disclosure can be assembler instructions, instruction-set-architecture (ISA) instructions, machine instructions, machine dependent instructions, microcode, firmware instructions, state-setting data, or either source code or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C++ or the like, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer readable program instructions can execute entirely on the user's computing device, partly on the user's computing device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device or entirely on the remote computing device or server. In the latter scenario, the remote computing device can be connected to the user's computing device through any kind of network, including a local area network (LAN) or a wide area network (WAN), or the connection can be made to an external computing device, for example, through the Internet using an Internet Service Provider. In some embodiments, electronic circuitry including, for example, programmable logic circuitry, field-programmable gate arrays (FPGA), or programmable logic arrays (PLA) can execute the computer readable program instructions by utilizing state information of the computer readable program instructions to personalize the electronic circuitry, in order to perform aspects of the present disclosure.

[0144] The computer readable program instructions can also be loaded onto a computing / processing device, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computing / processing device, other programmable apparatus or other device to produce a computer implemented process such that the instructions which execute on the computing / processing device, other programmable apparatus, or other device implement the functions / acts specified in the flowchart and / or block diagram block or blocks.

[0145] These computer readable program instructions can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions / acts specified in the flowchart and / or block diagram block or blocks. These computer readable program instructions can also be stored in a computer readable storage medium that can include a non-transitory computer readable storage medium that can be a computer- readable storage medium having no data, programs, program modules, e.g., instructions for operation, or digital content stored thereon or therein for a short time or not at all. The computer readable storage medium can also have instructions stored thereon or therein which may

[0146] The computer readable program instructions can also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable apparatus or other device to produce a computer implemented process, such that the instructions which execute on the computer, other programmable data processing apparatus, or other device implement the functions / acts specified in the flowchart and / or block diagram block or blocks.

[0147] The computer readable program instructions can also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable apparatus or other device to produce a computer implemented process, such that the instructions which execute on the computer, other programmable data processing apparatus, or other device implement the functions / acts specified in the flowchart and / or block diagram block or blocks.

[0148] Having described above several embodiments of the disclosure, any modifications and variations that fall within the scope of the described embodiments are also contemplated by the inventor(s). The foregoing description is exemplary rather than limiting in nature, and such variations as fall within the scope of the disclosed embodiments are intended to be covered by the following claims, appended hereto.

Claims

1. A piezoelectric ceramic driving method characterized by comprising: The method comprises: acquiring a target Gaussian waveform; sampling the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein the set sampling strategy at least comprises taking a peak value of the target Gaussian waveform as a sampling reference; driving a piezoelectric ceramic according to the target voltage waveform.

2. The method of claim 1, wherein, The set sampling strategy further comprises that a sampling point is located in a first confidence interval of the target Gaussian waveform.

3. The method according to claim 1 or 2, characterized in that, The sampling of the target Gaussian waveform to obtain a target voltage waveform comprises: determining a sampling point number of the target Gaussian waveform and a waveform parameter of the target Gaussian waveform; determining a sampling parameter according to the sampling point number and the waveform parameter; sampling the target Gaussian waveform according to the sampling parameter and the waveform parameter to obtain the target voltage waveform.

4. The method of claim 3, wherein, The waveform parameter comprises a standard deviation and a voltage amplitude; The sampling parameter comprises an eccentricity value, a sampling starting point, a sampling ending point, a left sampling point number, a right sampling point number, a left sampling interval and a right sampling interval.

5. The method of claim 4, wherein, The determination of the sampling parameter according to the sampling point number and the waveform parameter comprises: determining the eccentricity value according to the sampling point number; determining the sampling starting point and the sampling ending point according to the eccentricity value and the standard deviation; determining the left sampling point number and the right sampling point number according to the sampling point number; determining the left sampling interval according to the left sampling point number, the eccentricity value and the sampling starting point, and determining the right sampling interval according to the right sampling point number, the eccentricity value and the sampling ending point.

6. The method according to claim 4 or 5, characterized in that, The sampling of the target Gaussian waveform according to the sampling parameter and the waveform parameter to obtain the target voltage waveform comprises: in a case that a current sampling point i is less than the left sampling point number, obtaining a corresponding first sampling voltage according to the voltage amplitude, the sampling starting point, the left sampling interval, the eccentricity value and the standard deviation; wherein i is greater than 0 and less than or equal to N; in a case that the current sampling point i is greater than or equal to the left sampling point number, obtaining a corresponding second sampling voltage according to the voltage amplitude, the eccentricity value, the right sampling interval and the standard deviation; obtaining the target voltage waveform according to a plurality of the first sampling voltages and a plurality of the second sampling voltages.

7. A piezoelectric ceramic driving device characterized by comprising: The device comprises: an acquisition module configured to acquire a target Gaussian waveform; a sampling module configured to sample the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein the set sampling strategy at least comprises taking a peak value of the target Gaussian waveform as a sampling reference; a driving module configured to drive a piezoelectric ceramic according to the target voltage waveform.

8. The apparatus of claim 7, wherein, The set sampling strategy further comprises that a sampling voltage is located in a first confidence interval of the target Gaussian waveform.

9. An electronic device, comprising: comprise: a memory configured to store executable computer instructions; a processor configured to execute a piezoelectric ceramic driving method according to any one of claims 1-6 according to control of the executable computer instructions.

10. A computer readable storage medium having stored thereon computer instructions, which when executed by a processor perform the piezoceramic drive method of any one of claims 1-6.

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